CN111337052B - Y waveguide parameter measuring instrument, measuring system and measuring method - Google Patents
Y waveguide parameter measuring instrument, measuring system and measuring method Download PDFInfo
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- 238000000691 measurement method Methods 0.000 claims abstract description 4
- 230000010287 polarization Effects 0.000 claims description 64
- 239000013307 optical fiber Substances 0.000 claims description 48
- 230000008033 biological extinction Effects 0.000 claims description 22
- 230000005540 biological transmission Effects 0.000 claims description 18
- 238000012360 testing method Methods 0.000 description 27
- 230000008569 process Effects 0.000 description 13
- 239000000835 fiber Substances 0.000 description 11
- 230000028161 membrane depolarization Effects 0.000 description 8
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- 230000003068 static effect Effects 0.000 description 2
- 229910013641 LiNbO 3 Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 229910001413 alkali metal ion Inorganic materials 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
- G01C25/005—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass initial alignment, calibration or starting-up of inertial devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/264—Optical coupling means with optical elements between opposed fibre ends which perform a function other than beam splitting
- G02B6/266—Optical coupling means with optical elements between opposed fibre ends which perform a function other than beam splitting the optical element being an attenuator
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/27—Optical coupling means with polarisation selective and adjusting means
- G02B6/2746—Optical coupling means with polarisation selective and adjusting means comprising non-reciprocal devices, e.g. isolators, FRM, circulators, quasi-isolators
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/27—Optical coupling means with polarisation selective and adjusting means
- G02B6/2753—Optical coupling means with polarisation selective and adjusting means characterised by their function or use, i.e. of the complete device
- G02B6/276—Removing selected polarisation component of light, i.e. polarizers
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/27—Optical coupling means with polarisation selective and adjusting means
- G02B6/2753—Optical coupling means with polarisation selective and adjusting means characterised by their function or use, i.e. of the complete device
- G02B6/2773—Polarisation splitting or combining
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Abstract
The invention relates to a Y waveguide parameter measuring instrument, a measuring system and a measuring method. The Y waveguide parameter measuring instrument comprises: the device comprises a light source, an adjustable optical attenuator, a circulator, a light detector, an optical path conversion device and an upper computer. The output end of the light source is connected with the input end of the adjustable optical attenuator, and the output end of the adjustable optical attenuator is connected with the first port of the annular device; the second port of the circulator is connected with one end of a trunk of the Y waveguide to be tested; the other end of the trunk is connected with one end of a first bifurcation of the Y waveguide to be tested and one end of a second bifurcation of the Y waveguide to be tested; the other end of the first branch is connected with a first port of the optical path conversion device; the other end of the second branch is connected with a second port of the optical path conversion device; the third port of the circulator is connected with the input end of the optical detector; the output end of the optical detector is connected with the upper computer. The invention realizes multi-parameter measurement based on the traditional Sagnac interferometer measurement method, and has simple measurement steps, low cost and one-key full-automatic measurement.
Description
Technical Field
The invention relates to the field of measurement, in particular to a Y waveguide parameter measuring instrument, a measuring system and a measuring method.
Background
The Y-branch optical modulator, also called Y waveguide phase modulator, is called Y waveguide for short, is a special modulation device for optical fiber gyro, and has wide application in optical fiber sensing and photoelectric signal processing fields. The principle of the Y waveguide is that an external voltage signal generates a modulation electric field through electrodes on two sides of the Y waveguide, so that the effective refractive index of the waveguide is changed, and phase modulation of a transmission optical signal is realized. Key parameters of the Y waveguide include half-wave voltage, waveform slope, split ratio, extinction ratio, insertion loss, etc.
The half-wave voltage is the amount of change in the bias voltage required to cause a phase delay of pi, i.e., the modulation voltage required to cause a phase delay of pi is the half-wave voltage. The magnitude of the half-wave voltage is closely related to the central wavelength of the light source and the ambient temperature, and the larger the wavelength is, the larger the half-wave voltage value is, the higher the ambient temperature is, and the smaller the half-wave voltage value is besides the parameters of the Y waveguide, such as the photoelectric coefficient, the extraordinary light refractive index, the width of the modulation electrode and the like. Therefore, the drift of the center wavelength of the light source and the change of the ambient temperature directly affect the stability and accuracy of the half-wave voltage test result of the Y waveguide.
The waveform inclination is also called direct current phase drift, and refers to the normalized value of the direct current drift amount of the output phase difference of the direct current waveguide under the action of a low-frequency or static modulation electric field. This phenomenon is caused by LiNbO after an applied voltage is applied to the Y waveguide electrode 3 SiO between crystal and electrode 2 The film is extremely easy to be subjected to OH in the preparation process of the device - And contamination with alkali metal ions, in SiO 2 A large amount of movable charges are formed in the film, and the charges move under the action of an external electric field and are in LiNbO 3 An induced electric field is generated in the crystal, which is superimposed with the externally applied modulated electric field to cause dryingThe waveform distortion of the response output of the system causes the phenomenon of DC drift at the static working point of the interference output.
The splitting ratio is a parameter for representing the Y waveguide splitting function, and the splitting ratio close to 1:1 can reduce equivalent phase error caused by shot noise and improve the signal to noise ratio of the system. The measurement of the spectral ratio can be realized by calculating the ratio of the light intensities of the two light beams output by the Y waveguide.
At present, due to the limitations of a measuring method and devices, the measuring process is extremely easily influenced by the temperature, the magnetic field, the vibration and the like of the external environment, and the scheme and the equipment for measuring various parameters of the Y waveguide mainly stay in a research stage and a starting stage. Because of imperfect and immature functions of the equipment, the measuring efficiency is low, errors caused by human factors are not negligible, so that the actual measured value and the true value are large in difference, the accuracy, stability and reliability of the measured result are generally low, and meanwhile, the existing waveguide tester is complex in testing process, single in measured parameter and high in price.
Disclosure of Invention
The invention aims to provide a Y waveguide parameter measuring instrument, a measuring system and a measuring method, so as to realize multi-parameter measurement.
In order to achieve the above object, the present invention provides the following solutions:
a Y-waveguide parameter measurement instrument, comprising: the device comprises a light source, an adjustable optical attenuator, a circulator, a light detector, an optical path conversion device and an upper computer;
the output end of the light source is connected with the input end of the adjustable optical attenuator, and the output end of the adjustable optical attenuator is connected with the first port of the circulator; the second port of the circulator is connected with one end of a trunk of the Y waveguide to be tested; the other end of the trunk is respectively connected with one end of a first bifurcation of the Y waveguide to be tested and one end of a second bifurcation of the Y waveguide to be tested; the other end of the first bifurcation is connected with a first port of the optical path conversion device; the other end of the second bifurcation is connected with a second port of the optical path conversion device; the third port of the circulator is connected with the input end of the optical detector; the output end of the optical detector is connected with the upper computer;
the adjustable optical attenuator is used for adjusting the power of the light input by the light source to obtain light power adjusting light; the circulator is used for transmitting the optical power adjusting light to the Y waveguide to be tested; the Y waveguide to be measured is used for dividing the optical power adjusting light into a first light beam and a second light beam; the optical path conversion device is used for changing the propagation directions of the first light beam and the second light beam; the Y waveguide to be tested is also used for receiving the first light beam after the light path is changed and the second light beam after the light path is changed, and forming a beam of combined light beam; the circulator is further configured to transmit the combined beam to the photodetector; the optical detector is used for sending the detected combined beam to the upper computer.
Optionally, the optical path conversion device is a single-mode optical fiber sensing ring; the other end of the first bifurcation is connected with a first port of the single-mode fiber sensing ring; the other end of the second bifurcation is connected with a second port of the single-mode fiber sensing ring.
Optionally, the method further comprises: the first depolarizer, the second depolarizer and the third depolarizer; the first port of the first depolarizer is connected with the second port of the circulator; the second port of the first depolarizer is connected with one end of the trunk; the first port of the second depolarizer is connected with the other end of the first bifurcation; the second port of the second depolarizer is connected with the first port of the light path conversion device; the first port of the third depolarizer is connected with the other end of the second bifurcation; and the second port of the third depolarizer is connected with the second port of the optical path conversion device.
Optionally, the method further comprises: the device comprises a first dual-channel optical power meter, a first coupler and a second coupler, wherein the split ratio of the first coupler and the second coupler is the same;
the other end of the first bifurcation is connected with a first port of the first coupler, and a second port of the first coupler is connected with a first port of the optical path conversion device; the third port of the first coupler is connected with the first input end of the first two-channel optical power meter; the other end of the second branch is connected with the first port of the second coupler, and the second port of the second coupler is connected with the second port of the optical path conversion device; and the third port of the second coupler is connected with the second input end of the first dual-channel optical power meter.
Optionally, the method further comprises: the system comprises a first polarization beam splitter, a second double-channel optical power meter and a double-channel extinction ratio measuring instrument;
the first port of the first polarization beam splitter is connected with the other end of the first bifurcation, the second port of the first polarization beam splitter is connected with the first port of the optical path conversion device, the third port of the first polarization beam splitter is connected with the first input end of the second dual-channel optical power meter, and the fourth port of the first polarization beam splitter is connected with the first input end of the dual-channel extinction ratio measuring instrument; the first port of the second polarization beam splitter is connected with the other end of the second bifurcation, and the second port of the second polarization beam splitter is connected with the second port of the optical path conversion device; the third port of the second polarization beam splitter is connected with the second input end of the second double-channel optical power meter, and the fourth port of the second polarization beam splitter is connected with the second input end of the double-channel extinction ratio measuring instrument.
Optionally, the method further comprises: a PBC-PBS polarization beam combiner, a beam splitter and a wave plate;
the first end of the PBC-PBS polarization beam combiner and the first end of the beam splitter are welded with the other end of the first bifurcation, the second end of the PBC-PBS polarization beam combiner and the second end of the beam splitter are welded with the other end of the second bifurcation, the third end of the PBC-PBS polarization beam combiner and the third end of the beam splitter are welded with one end of the wave plate, and the other end of the wave plate is connected with the optical path conversion device.
Optionally, the optical path conversion device consists of a low-birefringence optical fiber and an optical fiber reflecting mirror; one end of the low-birefringent optical fiber is connected with the other end of the wave plate, and the optical fiber reflector is arranged at the other end of the low-birefringent optical fiber and is used for reflecting light transmitted from one end of the low-birefringent optical fiber back to the wave plate.
A Y-waveguide parameter measurement system comprising: the optical system comprises a first multichannel optical switch, a second multichannel optical switch, an optical path conversion device, an upper computer and a plurality of optical path transmission circuits; the optical path transmission circuit includes: a light source, a tunable optical attenuator, a circulator and a photodetector;
the first output end of the optical path transmission circuit is connected with the upper computer, the second output end of the optical path transmission circuit is connected with one end of a trunk of the Y waveguide to be tested, and the other end of the trunk is respectively connected with one end of a first bifurcation and one end of a second bifurcation of the Y waveguide to be tested; the other end of the first bifurcation is connected with a first port of the first multichannel optical switch, and a second port of the first multichannel optical switch is connected with a first port of the optical path conversion device; the other end of the second bifurcation is connected with a first port of the second multichannel optical switch; a second port of the second multichannel optical switch is connected with a second port of the optical path conversion device;
The output end of the light source is connected with the input end of the adjustable optical attenuator, and the output end of the adjustable optical attenuator is connected with the first port of the circulator; the second port of the circulator is connected with one end of the trunk; the third port of the circulator is connected with the input end of the optical detector; the output end of the optical detector is connected with the upper computer;
the adjustable optical attenuator is used for adjusting the power of the light input by the light source to obtain light power adjusting light; the circulator is used for transmitting the optical power adjusting light to the Y waveguide to be tested; the Y waveguide to be measured is used for dividing the optical power adjusting light into a first light beam and a second light beam; the first multi-channel switch is used for transmitting the first light beam to the light path conversion device; the second multi-channel switch is used for transmitting the second light beam to the light path conversion device; the optical path conversion device is used for changing the propagation directions of the first light beam and the second light beam; the first multi-channel switch and the second multi-channel switch are also used for transmitting the first light beam with the changed light path and the second light beam with the changed light path to the Y waveguide to be tested; the Y waveguide to be measured is also used for forming a beam of combined beam by the changed first beam and the second beam with the changed light path; the circulator is further configured to transmit the combined beam to the photodetector; the optical detector is used for sending the detected combined beam to the upper computer.
Optionally, the optical path transmission device further includes: the first depolarizer, the second depolarizer and the third depolarizer;
the first port of the first depolarizer is connected with the second port of the circulator; the second port of the first depolarizer is connected with one end of the trunk; the first port of the second depolarizer is connected with the other end of the first bifurcation; the second port of the second depolarizer is connected with the first port of the first multichannel optical switch; the first port of the third depolarizer is connected with the other end of the second bifurcation; and the second port of the third depolarizer is connected with the first port of the second multichannel optical switch.
The Y waveguide parameter measuring method is applied to any Y waveguide parameter measuring instrument;
forming a sawtooth wave with a 4 tau period according to the optical signal detected by the optical detector, wherein tau is the transit time of the Y waveguide parameter measuring instrument;
adjusting the amplitude of the sawtooth wave to enable the optical signal in the tau time period and the optical signal in the 3 tau time period to be dynamically stable, obtaining the adjusted amplitude of the sawtooth wave, and obtaining half-wave voltage according to the adjusted amplitude of the sawtooth wave;
Measuring the adjusted saw tooth amplitude over a period of 3τ;
generating a square wave signal according to the half-wave voltage;
measuring the amplitude of the square wave signal, wherein the amplitude of the square wave signal is half of the half-wave voltage value, and the period is 4τ;
and calculating the waveform inclination according to the amplitude of the square wave signal and the adjusted sawtooth wave amplitude.
According to the specific embodiment provided by the invention, the invention discloses the following technical effects: according to the invention, the adjustable optical attenuator, the circulator, the optical path conversion device and the upper computer are arranged, so that the multi-parameter measurement is realized based on the measurement method of the traditional Sagnac interferometer, the measurement steps are simple, the cost is greatly low, and the one-key full-automatic measurement is realized.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions of the prior art, the drawings that are needed in the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a Y-waveguide parameter measurement apparatus according to embodiment 1 of the present invention;
FIG. 2 is a schematic diagram of the structure of a Y-waveguide parameter measurement apparatus according to embodiment 2 of the present invention;
FIG. 3 is a schematic diagram of the Y-waveguide parameter measurement apparatus according to embodiment 3 of the present invention;
FIG. 4 is a schematic diagram of the structure of a Y-waveguide parameter measurement apparatus according to embodiment 4 of the present invention;
FIG. 5 is a schematic diagram of a Y-waveguide parameter measurement system according to embodiment 5 of the present invention;
FIG. 6 is a flow chart of a method for measuring Y waveguide parameters according to embodiment 6 of the present invention;
FIG. 7 is a schematic diagram of a Y-waveguide parameter measuring instrument and measuring system according to the present invention.
Symbol description:
the optical fiber power system comprises an I-power module, an II-photoelectric component driving circuit, an III-test light path, an IV-test platform, a V-host computer system, an VI-automatic test software module, an VII-device to be tested, a 1-light source, a 2-adjustable optical attenuator, a 3-circulator, a 4-first depolarizer, a 5-Y waveguide to be tested, a 6-second depolarizer, a 7-third depolarizer, an 8-single mode fiber sensing ring, a 9-photodetector, a 10-data acquisition circuit, an 11-host computer, a 12-1-first dual-channel optical power meter, a 12-2-second dual-channel optical power meter, a 13-1-first coupler, a 13-2-second coupler, a 14-1-first polarization beam splitter, a 14-2-second polarization beam splitter, a 15-dual-channel extinction ratio measuring instrument, a 16-first channel, a 17-second channel, a 18-channel N, a 19-first Y waveguide to be tested, a 20-second Y waveguide to be tested, a 21-Nth Y waveguide, a 22-first multi-channel optical switch, a 23-second multi-channel PBC 24-PBS, a shared optical switch, a 24-PBS, a shared optical fiber reflection optical splitter, a 25-B, a low-reflection optical fiber, a 0-shared optical path, a 0-reflection optical fiber B, and a shared optical fiber.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The invention aims to provide a Y waveguide parameter measuring instrument, a measuring system and a measuring method. According to the invention, the adjustable optical attenuator, the circulator, the optical path conversion device and the upper computer with the frequency tracking and temperature compensation functions are arranged, so that the multi-parameter measurement is realized based on the measurement method of the traditional Sagnac interferometer, the measurement steps are simple, the cost is greatly low, and the one-key full-automatic measurement is realized.
In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description.
Example 1
As shown in fig. 1, the Y waveguide parameter measuring apparatus of the present embodiment includes: a light source 1, an adjustable optical attenuator 2, a circulator 3, a light detector 9, an optical path conversion device and an upper computer 11.
The output end of the light source 1 is connected with the input end of the adjustable optical attenuator 2, and the output end of the adjustable optical attenuator 2 is connected with the first port of the circulator 3; the second port of the circulator 3 is connected with one end of a trunk of the Y waveguide 5 to be tested; the other end of the trunk is respectively connected with one end of a first bifurcation of the Y waveguide 5 to be tested and one end of a second bifurcation of the Y waveguide 5 to be tested; the other end of the first bifurcation is connected with a first port of the optical path conversion device; the other end of the second bifurcation is connected with a second port of the optical path conversion device; the third port of the circulator 3 is connected with the input end of the photodetector 9; the output end of the photodetector 9 is connected with the upper computer 11 through a data acquisition circuit 10, and the upper computer software in the upper computer 11 is provided with a frequency tracking and temperature compensation system, and the stability and accuracy of a measurement result of the half-wave voltage parameter of the Y waveguide to be measured are directly affected by the drift of the center wavelength of the light source and the change of the ambient temperature, so that the stability and the anti-interference capability of a light path can be further enhanced and the accuracy of the measurement result can be improved by using the upper computer with the temperature compensation function and the frequency tracking function.
The adjustable optical attenuator 2 is used for adjusting the power of the light input by the light source 1 to obtain light power adjusting light; the circulator 3 is used for transmitting the optical power adjustment light to the Y waveguide 5 to be tested; the Y waveguide 5 to be measured is used for dividing the optical power adjusting light into a first light beam and a second light beam; the optical path conversion device is used for changing the propagation directions of the first light beam and the second light beam; the Y waveguide 5 to be measured is also used for receiving the first light beam after the light path is changed and the second light beam after the light path is changed, and forming a beam of combined light beam; the circulator 3 is also used for transmitting the combined beam to the photodetector 9; the optical detector 9 is configured to send the detected combined beam to the data acquisition circuit 10, the data acquisition circuit 10 converts the combined beam into an electrical signal and sends the electrical signal to the host computer 11, and the host computer 11 is configured to obtain a half-wave voltage parameter and a waveform gradient parameter of the Y waveguide 5 to be tested according to the electrical signal.
The optical path conversion device can be a single-mode optical fiber sensing ring 8; the other end of the first bifurcation is connected with a first port of the single-mode fiber sensing ring 8; the other end of the second bifurcation is connected to a second port of the single-mode fiber sensing ring 8.
The light source 1 may be a superluminescent light emitting diode.
The single mode fiber sensing ring 8 may be a 500m single mode fiber sensing ring.
As an alternative embodiment, the Y waveguide parameter measuring apparatus further includes: a first depolarizer 4, a second depolarizer 6, and a third depolarizer 7; the first port of the first depolarizer 4 is connected with the second port of the circulator 3; the second port of the first depolarizer 4 is connected with one end of the trunk; the first port of the second depolarizer 6 is connected with the other end of the first bifurcation; the second port of the second depolarizer 6 is connected with the first port of the optical path conversion device; the first port of the third depolarizer 7 is connected with the other end of the second bifurcation; the second port of the third depolarizer 7 is connected to the second port of the optical path conversion device.
The measurement principle of this embodiment is:
the light source 1 provides an optical carrier wave for generating signals, the optical carrier wave enters the circulator 3 through the adjustable optical attenuator 2, the output end of the circulator 3 is connected with the first depolarizer 4, the light emitted by the light source 1 is subjected to decorrelation treatment, the light is introduced into the input end of the Y waveguide 5 to be tested, the Y waveguide integrates functions of polarization (detection), beam splitting and phase modulation, a transmission optical signal forms polarized light through the Y waveguide 5 to be tested, two output ends of the Y waveguide 5 to be tested are respectively connected with the second depolarizer 6 and the third depolarizer 7, and two paths of output polarized light of the Y waveguide 5 to be tested are subjected to decorrelation treatment again and are propagated in the opposite direction in the single-mode optical fiber sensing ring 8. Because of the beam combination and polarization of the Y waveguide 5 to be tested, the optical signals which are oppositely transmitted through the single-mode optical fiber sensing ring 8 meet at the Y waveguide to form interference waves, and the parasitic optical signals are removed at the first depolarizer 4 again to perform decorrelation processing, because of the specificity of the internal structure of the optical fiber circulator 3, the optical signals of the output port connected with one end of the light source 1 are blocked, the optical signals are completely output by the other end of the circulator 3 and transmitted into the detector 9, the detector 9 is used for detecting the interference optical signals, and meanwhile, the interference optical signals are converted into electric signals, and the electric signals converted by the detector are further transmitted to the data acquisition circuit 10 to be acquired and processed and transmitted to the upper computer 11.
The upper computer 11 is an important content of the whole test system, and the data acquisition and calculation method is a core part in the data processing process, mainly because the accuracy of measurement accuracy mainly depends on the judgment and extraction of data in the calculation process, and the higher the accuracy of effective data acquisition, the higher the reliability of the measured result.
According to the measuring method based on the traditional Sagnac interferometer, a depolarizer is added to form a depolarized light path, a circulator is connected in series to realize the beam splitting and isolation functions, the influence of a return light signal on a light source is reduced, a tunable optical attenuator is connected in series to realize the self-adjustment of the optical power of the system, the frequency tracking and temperature compensation system of upper computer software is combined, the influence of coupling and birefringence in an optical fiber loop can be greatly reduced, the self-adjustment of the optical power, the central wavelength of a stable light path and the like are realized, the stability and the anti-interference capability of a measuring light path are greatly improved, the measuring errors caused by light power jump, central wavelength drift and frequency change caused by external environment factors in the measuring process are reduced, the accuracy, the stability and the reliability of a measuring result are improved, and the measurement of waveform inclination and half-wave voltage is realized.
Example 2
As shown in fig. 2, this embodiment is different from the above embodiment in that this embodiment further includes: the optical power meter comprises a first two-channel optical power meter 12-1, a first coupler 13-1 and a second coupler 13-2, wherein the split ratio of the first coupler 13-1 and the second coupler 13-2 is the same.
The other end of the first branch is connected with a first port of the first coupler 13-1, and a second port of the first coupler 13-1 is connected with a first port of the optical path conversion device; the third port of the first coupler 13-1 is connected with the first input end of the first dual-channel optical power meter 12-1; the other end of the second branch is connected with a first port of the second coupler 13-2, and a second port of the second coupler 13-2 is connected with a second port of the optical path conversion device; the third port of the second coupler 13-2 is connected to the second input of the first dual-channel optical power meter 12-1.
The first coupler 13-1 and the second coupler 13-2 are 2 x 2 couplers.
The test principle of this embodiment is: after the optical signals are split, polarized and modulated by the Y waveguide 5 to be tested to form two polarized lights (1) and (8), the two polarized lights are used for removing parasitic interference optical signals by the second depolarizer 6 and the third depolarizer 7 to form optical signals (4) and (5), the optical signals are welded with two ends of the single-mode optical fiber sensing ring 8, the optical signals enter the single-mode optical fiber sensing ring 8 to propagate oppositely and enter the 2 x 2 coupler 13 again by the second depolarizer 6 and the third depolarizer 7 to be split, the two optical signals (2) and (7) enter the first dual-channel optical power meter 12-1 to make contribution for realizing the measurement of the split ratio, and the two optical signals entering the first dual-channel optical power meter 12-1 can accurately reflect the split ratio of the two output lights (1) and (8) after passing through the Y waveguide 5 to be tested, and the main reason is that the two output optical signals (1) and (8) enter the first common optical path A, the two optical signals enter the second polarization optical path 7 again by the second depolarizer 6 and the third depolarizer 7 to be split, and the two optical signals can be accurately coupled by the optical paths (1) and the two optical paths (8) to be split and the two optical paths can be accurately coupled by the optical paths (2). Compared with the input optical signals (1) and (8), the two returned optical signals (1) and (8) keep the propagation characteristics of the input optical signals, only the attenuation of the optical power is realized, and because of the existence of a self-adjusting system of the optical power in the half-wave voltage and waveform slope test system of the waveguide tester, the small-range floating of the optical power of the system can not influence the measurement results of the half-wave voltage and the waveform slope of the Y waveguide, so that the returned optical signals (1) and (8) continuously propagate from the circulator 3 to the detector 9, the demodulation and the processing of the signals are realized through the data acquisition circuit 10 and the upper computer 11, and finally the testing of parameters such as the half-wave voltage, the waveform slope and the spectral ratio of the Y waveguide 5 to be tested is realized.
The embodiment adds the function of measuring the spectral ratio parameters on the basis of the embodiment, so that the measured parameters are more.
Example 3
As shown in fig. 3, this embodiment is different from the above embodiment in that this embodiment further includes: a first polarizing beam splitter 14-1, a second polarizing beam splitter 14-2, a second dual channel optical power meter 12-2, and a dual channel extinction ratio measurement instrument 15.
The first port of the first polarization beam splitter 14-1 is connected to the other end of the first branch, the second port of the first polarization beam splitter 14-1 is connected to the first port of the optical path conversion device, the third port of the first polarization beam splitter 14-1 is connected to the first input end of the second dual-channel optical power meter 12-2, and the fourth port of the first polarization beam splitter 14-1 is connected to the first input end of the dual-channel extinction ratio measuring instrument 15; the first port of the second polarization beam splitter 14-2 is connected to the other end of the second branch, and the second port of the second polarization beam splitter 14-2 is connected to the second port of the optical path conversion device; the third port of the second polarization beam splitter 14-2 is connected to the second input end of the second dual-channel optical power meter 12-2, and the fourth port of the second polarization beam splitter 14-2 is connected to the second input end of the dual-channel extinction ratio measuring instrument 15.
The first polarizing beam splitter 14-1 and the second polarizing beam splitter 14-2 are both high extinction ratio 2 x 2 polarizing beam splitters.
The test principle of this embodiment is: based on the depolarization light path scheme, the existing polarization maintaining light path scheme is optimized and innovated, because the Y waveguide integrates the functions of a polarizer, a beam splitter and a phase modulator, the beam splitting, polarization and modulation of an input optical signal can be realized, the optical signal output by the Y waveguide 5 to be tested enters the first polarization beam splitter 14-1 and the second polarization beam splitter 14-2 through (1) and (8) and is respectively divided into (3) and (4), (5) and (6), wherein (3) and (6) enter the dual-channel extinction ratio measuring instrument 15 to detect the extinction ratio of the Y waveguide, the (4) and (5) enter the 500m single-mode optical fiber sensing ring 8 to propagate oppositely, and when the two high extinction ratio 2 x 2 polarization beam splitters 14 are passed again, (4) are divided into (7) and (8), (5) optical beams are divided into (1) and (2), the (2) enter the dual-channel optical power meter 12 to detect the extinction ratio of the Y waveguide, the returned (1) and (8) optical signals enter the Y waveguide 5 to be tested to perform original path return through the Y waveguide 5, enter the ring detector 3 and enter the half-wave circuit 10 to enter the half-wave circuit 11 to be tested, and the final wave signal is processed, and the wave-state wave circuit is realized, and the wave-state parameters and the like are processed, and the wave-state parameters are finally, and the wave-state parameters are tested. The two polarization beam splitters in the embodiment have high extinction ratio, low polarization crosstalk and the same light splitting ratio, can ensure that the extinction ratio output by the Y waveguide 5 to be tested is not degraded and attenuated, and the extinction ratio measured by the double-channel extinction ratio measuring instrument 15 can accurately reflect the extinction ratio at the two ends (1) and (8) after passing through the Y waveguide 5 to be tested; the optical powers (2) and (7) measured by the second dual-channel optical power meter 12-2 can accurately reflect the light splitting at the two ends of (1) and (8) after passing through the Y waveguide 5 to be measured, and the main reason is that two light signals of (1) and (8) enter the second shared optical path B, the optical paths of the two light signals are identical, the optical fiber insertion loss is identical, and then the light splitting is performed through the two polarization beam splitters, so that the optical powers of (2) and (7) can be accurately measured, and the light splitting ratio at the two ends of (1) and (8) can be accurately measured; the returned (1) and (8) optical signals maintain the propagation characteristics of the input optical signals compared with the input (1) and (8) optical signals, only the attenuation of the optical power is realized, and the small-range floating of the optical power of the system can not influence the measurement result of the half-wave voltage and the waveform slope of the Y waveguide due to the existence of a self-adjusting system of the optical power in the half-wave voltage and waveform slope test system of the waveguide tester.
The present embodiment can measure half-wave voltage, waveform slope, spectral ratio and extinction ratio simultaneously.
Example 4
As shown in fig. 4, this embodiment is different from the above embodiment in that this embodiment further includes: a PBC-PBS polarizing beam combiner and splitter 24 and a waveplate 25.
The first end of the PBC-PBS polarization beam combiner and beam splitter 24 is welded to the other end of the first bifurcation, the second end of the PBC-PBS polarization beam combiner and beam splitter 24 is welded to the other end of the second bifurcation, the third end of the PBC-PBS polarization beam combiner and beam splitter 24 is welded to one end of the wave plate 25, two output ends of the Y waveguide 5 to be tested are respectively welded to the PBC-PBS polarization beam combiner and beam splitter 24 at 0-degree melting point 28 and at 90-degree melting point 29 at 90-degree melting point, and the other end of the wave plate 25 is connected with the optical path conversion device.
The optical path changing device may be composed of a low-birefringent optical fiber 26 and an optical fiber mirror 27; one end of the low-birefringent optical fiber 26 is connected to the other end of the wave plate 25, and the optical fiber mirror 27 is disposed at the other end of the low-birefringent optical fiber 26, and the optical fiber mirror 27 is configured to reflect light incoming from the one end of the low-birefringent optical fiber 26 back to the wave plate 25.
The waveplate 25 may be a lambda/4 waveplate with a 45 fusion splice to one end of the low birefringence fiber 26.
The low-birefringent optical fiber 26 is a 250m low-birefringent optical fiber.
The embodiment provides a reflective type guide tester, so as to realize a testing scheme with strong anti-interference capability and lower cost, the optical signal of the embodiment is split and polarized and modulated by the Y waveguide 5 to be tested to form polarized light, but the Y waveguide chip only works in one polarization mode, after being respectively welded by 0 DEG and 90 DEG with the PBC-PBS polarization beam combiner and the beam splitter 24, two orthogonal polarization modes enter the PBC-PBS polarization beam combiner and the beam splitter 24, meanwhile, two orthogonal linear polarized lights are combined into one beam, and the two orthogonal polarization modes enter a 250m low-birefringent optical fiber through a lambda/4 wave plate welded by 45 DEG, when the optical signal propagates to the optical fiber reflector 27, the optical signal returns along an original path due to the reflecting action of the optical fiber reflector 27, the optical signal is again transmitted by a lambda/4 wave plate welded by 45 DEG, the circularly polarized light signal propagated by the 250m low-birefringent optical fiber 26 is converted into linear polarized light, the linear polarized light is transmitted into two orthogonal polarization modes of the PBC-PBS polarization beam combiner and the beam splitter 24, and enters two input ends of the Y waveguide, the two orthogonal polarization modes are transmitted into two input ends of the linear polarization modes, and the two linear polarization modes enter the ring detector 10, and enter the ring detector 10 to enter the half-wave filter to be tested to be processed by the ring-shaped optical fiber reflector 10, and finally enter the wave detector to be tested to realize the voltage-type signal acquisition circuit, and the voltage acquisition circuit is realized, and the voltage acquisition parameters is realized, and the voltage acquisition is realized.
The embodiment can realize the measurement of the half-wave voltage parameter and the waveform inclination parameter, and has strong anti-interference capability and lower cost.
Example 5
As shown in fig. 5, the Y-waveguide parameter measurement system includes: a first multi-channel optical switch 22, a second multi-channel optical switch 23, an optical path conversion device, an upper computer 11 and a plurality of optical path transmission circuits; the optical path transmission circuit includes: a light source 1, a tunable optical attenuator 2, a circulator 3 and a light detector 9.
The first output end of the optical path transmission circuit is connected with the upper computer 11, the second output end of the optical path transmission circuit is connected with one end of a trunk of the Y waveguide 5 to be tested, and the other end of the trunk is respectively connected with one end of a first bifurcation and one end of a second bifurcation of the Y waveguide 5 to be tested; the other end of the first branch is connected with a first port of the first multi-channel optical switch 22, and a second port of the first multi-channel optical switch 22 is connected with a first port of the optical path conversion device; the other end of the second branch is connected with a first port of the second multichannel optical switch 23; a second port of the second multichannel optical switch 23 is connected to a second port of the optical path changing device.
The output end of the light source 1 is connected with the input end of the adjustable optical attenuator 2, and the output end of the adjustable optical attenuator 2 is connected with the first port of the circulator 3; a second port of the circulator 3 is connected with one end of the trunk; the third port of the circulator 3 is connected with the input end of the photodetector 9; the output end of the optical detector 9 is connected with the upper computer 11 through a data acquisition circuit 10.
The adjustable optical attenuator 2 is used for adjusting the power of the light input by the light source 1 to obtain light power adjusting light; the circulator 3 is used for transmitting the optical power adjustment light to the Y waveguide 5 to be tested; the Y waveguide 5 to be measured is used for dividing the optical power adjusting light into a first light beam and a second light beam; the first multi-channel switch is used for transmitting the first light beam to the light path conversion device; the second multi-channel switch is used for transmitting the second light beam to the light path conversion device; the optical path conversion device is used for changing the propagation directions of the first light beam and the second light beam; the first multi-channel switch and the second multi-channel switch are further configured to transmit the first light beam with the changed light path and the second light beam with the changed light path to the Y waveguide 5 to be tested; the Y waveguide 5 to be measured is further configured to form a combined beam from the changed first beam and the second beam with the changed optical path; the circulator 3 is also used for transmitting the combined beam to the photodetector 9; the photodetector 9 is configured to send the detected combined beam to the data acquisition circuit 10, where the data acquisition circuit 10 converts the combined beam into an electrical signal and sends the electrical signal to the host computer 11; the upper computer 11 is used for obtaining half-wave voltage parameters and waveform inclination parameters of the Y waveguide 5 to be tested according to the electric signals.
The single mode fiber sensing ring 8 may be a 500m single mode fiber sensing ring.
As an optional embodiment, the optical path transmission device in the Y-waveguide parameter measurement system further includes: a first depolarizer 4, a second depolarizer 6 and a third depolarizer 7.
The first port of the first depolarizer 4 is connected with the second port of the circulator 3; the second port of the first depolarizer 4 is connected with one end of the trunk; the first port of the second depolarizer 6 is connected with the other end of the first bifurcation; the second port of the second depolarizer 6 is connected with the first port of the first multichannel optical switch 22; the first port of the third depolarizer 7 is connected with the other end of the second bifurcation; the second port of the third depolarizer 7 is connected to the first port of the second multichannel optical switch 23.
The multi-channel waveguide test parameter measurement system provided by the embodiment realizes the quick and efficient measurement process, the multi-channel waveguide tester shares a set of optical fiber sensing ring, a signal acquisition circuit and an upper computer 11 system, the light source 1, the adjustable optical attenuator 2, the circulator 3, the first depolarizer 4, the second depolarizer 6, the third depolarizer 7 and the photodetector 9 of each channel are mutually independent, the multi-channel waveguide tester de-correlates the two output ends of each Y waveguide 5 to be tested through the depolarizer and then respectively connects with the first multi-channel optical switch 22 and the second multi-channel optical switch 23, the two outputs of the multi-channel optical switch are respectively welded with the two ends of the single-mode optical fiber sensing ring 8, due to the switching function of the multi-channel optical switch, the light of each channel can enter the shared single-mode sensing ring 24 in sequence to be transmitted in opposite directions, and return to each input channel through the multi-channel optical switch again, the light signal returns through the original channel circulator 3 to enter the detector 9, enter the data acquisition circuit 10 and the upper computer 11, so as to realize the demodulation and processing of the signals, and finally realize the testing of the parameters such as the half-wave waveform of each channel and the Y voltage and the wave waveform to be tested.
The measurement system of the embodiment adds the depolarizer into the traditional optical interferometer ring structure to form a depolarization light path, and the depolarization light path is connected in series into the circulator 3 to realize the beam splitting and isolation functions, so that the influence of a return light signal on the light source 1 is reduced, the light power of the system is connected in series into the adjustable light attenuator 2 to realize the self-adjustment of the light power of the system, meanwhile, the stability of the light power of the light path is realized by combining the frequency tracking and temperature compensation system, the anti-interference capability of the light power is enhanced, the measurement error caused by light power jump, center wavelength drift and frequency change caused by external environment factors in the measurement process is reduced, the accuracy, the stability and the reliability of a measurement result are improved, and a plurality of Y waveguides to be measured can be measured simultaneously by utilizing the multichannel optical switch.
Example 6
As shown in fig. 6, the present embodiment provides a method for measuring a Y waveguide parameter:
s1: the system transit time τ is tested.
S2: and outputting waveform self-diagnosis.
And judging whether the waveform of the optical signal detected by the optical detector is abnormal or not.
S3: if the test is abnormal, stopping the test, and giving an 'abnormal' alarm by the upper computer software.
S4: if normal, a sawtooth wave of 4τ period is generated, and the process advances to S5.
S5: and adjusting the amplitude of the sawtooth wave to align the output voltage stabilization point in the tau time period with the output voltage stabilization point in the 3 tau time period, namely dynamically stabilizing the optical signal in the tau time period and the optical signal in the 3 tau time period.
S6: and calculating the half-wave voltage at the moment, measuring the sawtooth wave amplitude v2 in the 3 tau time period, carrying out data caching, and entering S10.
S7: and generating a square wave signal according to the half-wave voltage.
S8: and measuring the amplitude v1 of the square wave signal at the moment, wherein the amplitude of the square wave signal is half of the half-wave voltage, and the period is 4τ.
S9: waveform slope is calculated according to v1 and v2, and data buffering is performed, proceeding to S10.
S10: data optimization proceeds to S11.
S11: and displaying and storing.
According to the embodiment, the waveform of the optical signal detected by the optical detector is adjusted to be the sawtooth wave, and the amplitude v2 of the sawtooth wave in the half-wave voltage and 3τ time period and the amplitude v1 of the square wave signal are calculated, so that the simultaneous measurement of the half-wave voltage and the waveform inclination can be realized.
The technical scheme adopted by the invention is a waveguide tester based on a depolarization circuit scheme. Fig. 7 is a schematic diagram of the composition of the Y waveguide parameter measuring instrument and the measuring system of the present invention, and as shown in fig. 7, the present invention mainly includes a power module i, a photoelectric component driving circuit ii, a test light path iii, a test platform iv, an upper computer v, and an automatic test software vi. The power module I supplies power to the testing system, the light source control circuit II realizes constant current control of light source driving current and constant temperature control of working temperature, the testing light path III and the device to be tested are welded to form an optical interferometer, the testing platform IV realizes original acquisition of output voltage of the detector in the light path, simultaneously applies a modulation signal to the device to be tested, and one-key full-automatic measurement of the Y waveguide device to be tested is realized through the upper computer system V and the automatic testing software module VI.
The Y waveguide tester based on the depolarization light path is used for connecting the Y waveguide into a connecting port, starting equipment, clicking a starting key in an upper computer system, sending an instruction by the upper computer system, controlling a signal acquisition circuit to complete modulation, judgment and acquisition of signals, transmitting the signals to an automatic testing software to further complete a data processing process, and outputting parameters such as the transit time, half-wave voltage, waveform gradient and the like of the Y waveguide to be tested together to complete a full-automatic testing process of waveguide testing, wherein the testing process is convenient, simple and easy to operate.
The invention has the following innovation points:
innovation point 1: in the traditional optical interferometer structure, the polarization error can be effectively restrained by combining the depolarization circuit, and compared with the existing polarization maintaining circuit test scheme, the polarization maintaining circuit test scheme has the advantages that the problem that the original optical path tail fiber needs to be subjected to extension treatment after being used for multiple times in the test process is solved, the test process is convenient, and the operation steps are simple.
Innovation point 2: an adjustable optical attenuator is connected in series in the depolarization light path to realize the self adjustment of the optical power, stabilize the optical power of the light path and stabilize the central wavelength, and prevent the drift of the central wavelength of the light source from causing measurement errors.
Innovation point 3: and a circulator is connected in the depolarization light path in series to isolate the influence of the returned light in the transmission process on the central wavelength of the light source.
Innovation point 4: the frequency tracking and temperature compensation functions are added into the upper computer system, so that real-time monitoring and calibration of various parameters are realized, the stability and anti-interference capability of an optical path are further enhanced, and the accuracy of a measurement result is improved.
Innovation point 5: on the basis of the existing half-wave voltage measurement function of the waveguide tester, the functions of measuring the waveform inclination and the light splitting ratio are added, and the multifunctional, high-efficiency, low-cost and one-key full-automatic measurement of the waveguide tester is realized.
In the present specification, each embodiment is described in a progressive manner, and each embodiment is mainly described in a different point from other embodiments, and identical and similar parts between the embodiments are all enough to refer to each other.
The principles and embodiments of the present invention have been described herein with reference to specific examples, the description of which is intended only to assist in understanding the methods of the present invention and the core ideas thereof; also, it is within the scope of the present invention to be modified by those of ordinary skill in the art in light of the present teachings. In view of the foregoing, this description should not be construed as limiting the invention.
Claims (3)
1. A Y-waveguide parameter measurement instrument, comprising: the device comprises a light source, an adjustable optical attenuator, a circulator, a light detector, an optical path conversion device and an upper computer;
The output end of the light source is connected with the input end of the adjustable optical attenuator, and the output end of the adjustable optical attenuator is connected with the first port of the circulator; the second port of the circulator is connected with one end of a trunk of the Y waveguide to be tested; the other end of the trunk is respectively connected with one end of a first bifurcation of the Y waveguide to be tested and one end of a second bifurcation of the Y waveguide to be tested; the other end of the first bifurcation is connected with a first port of the optical path conversion device; the other end of the second bifurcation is connected with a second port of the optical path conversion device; the third port of the circulator is connected with the input end of the optical detector; the output end of the optical detector is connected with the upper computer;
the adjustable optical attenuator is used for adjusting the power of the light input by the light source to obtain light power adjusting light; the circulator is used for transmitting the optical power adjusting light to the Y waveguide to be tested; the Y waveguide to be measured is used for dividing the optical power adjusting light into a first light beam and a second light beam; the optical path conversion device is used for changing the propagation directions of the first light beam and the second light beam; the Y waveguide to be tested is also used for receiving the first light beam after the light path is changed and the second light beam after the light path is changed, and forming a beam of combined light beam; the circulator is further configured to transmit the combined beam to the photodetector; the optical detector is used for sending the detected combined beam to the upper computer;
Further comprises: the first depolarizer, the second depolarizer and the third depolarizer; the first port of the first depolarizer is connected with the second port of the circulator; the second port of the first depolarizer is connected with one end of the trunk; the first port of the second depolarizer is connected with the other end of the first bifurcation; the second port of the second depolarizer is connected with the first port of the light path conversion device; the first port of the third depolarizer is connected with the other end of the second bifurcation; the second port of the third depolarizer is connected with the second port of the optical path conversion device; the optical path conversion device is a single-mode optical fiber sensing ring;
or further comprising: the device comprises a first dual-channel optical power meter, a first coupler and a second coupler, wherein the split ratio of the first coupler and the second coupler is the same;
the other end of the first bifurcation is connected with a first port of the first coupler, and a second port of the first coupler is connected with a first port of the optical path conversion device; the third port of the first coupler is connected with the first input end of the first two-channel optical power meter; the other end of the second branch is connected with the first port of the second coupler, and the second port of the second coupler is connected with the second port of the optical path conversion device; the third port of the second coupler is connected with the second input end of the first dual-channel optical power meter; the optical path conversion device is a single-mode optical fiber sensing ring;
Or further comprising: the system comprises a first polarization beam splitter, a second double-channel optical power meter and a double-channel extinction ratio measuring instrument;
the first port of the first polarization beam splitter is connected with the other end of the first bifurcation, the second port of the first polarization beam splitter is connected with the first port of the optical path conversion device, the third port of the first polarization beam splitter is connected with the first input end of the second dual-channel optical power meter, and the fourth port of the first polarization beam splitter is connected with the first input end of the dual-channel extinction ratio measuring instrument; the first port of the second polarization beam splitter is connected with the other end of the second bifurcation, and the second port of the second polarization beam splitter is connected with the second port of the optical path conversion device; the third port of the second polarization beam splitter is connected with the second input end of the second double-channel optical power meter, and the fourth port of the second polarization beam splitter is connected with the second input end of the double-channel extinction ratio measuring instrument; the optical path conversion device is a single-mode optical fiber sensing ring;
or further comprising: a PBC-PBS polarization beam combiner, a beam splitter and a wave plate;
the first end of the PBC-PBS polarization beam combiner and the first end of the beam splitter are welded with the other end of the first bifurcation, the second end of the PBC-PBS polarization beam combiner and the second end of the beam splitter are welded with the other end of the second bifurcation, the third end of the PBC-PBS polarization beam combiner and the third end of the beam splitter are welded with one end of the wave plate, and the other end of the wave plate is connected with the optical path conversion device; the optical path conversion device consists of a low-birefringence optical fiber and an optical fiber reflecting mirror; one end of the low-birefringent optical fiber is connected with the other end of the wave plate, and the optical fiber reflector is arranged at the other end of the low-birefringent optical fiber and is used for reflecting light transmitted from one end of the low-birefringent optical fiber back to the wave plate.
2. A Y-waveguide parameter measurement system, comprising: the optical system comprises a first multichannel optical switch, a second multichannel optical switch, an optical path conversion device, an upper computer and a plurality of optical path transmission circuits; the optical path transmission circuit includes: a light source, a tunable optical attenuator, a circulator and a photodetector;
the first output end of the optical path transmission circuit is connected with the upper computer, the second output end of the optical path transmission circuit is connected with one end of a trunk of the Y waveguide to be tested, and the other end of the trunk is respectively connected with one end of a first bifurcation and one end of a second bifurcation of the Y waveguide to be tested; the other end of the first bifurcation is connected with a first port of the first multichannel optical switch, and a second port of the first multichannel optical switch is connected with a first port of the optical path conversion device; the other end of the second bifurcation is connected with a first port of the second multichannel optical switch; a second port of the second multichannel optical switch is connected with a second port of the optical path conversion device;
the output end of the light source is connected with the input end of the adjustable optical attenuator, and the output end of the adjustable optical attenuator is connected with the first port of the circulator; the second port of the circulator is connected with one end of the trunk; the third port of the circulator is connected with the input end of the optical detector; the output end of the optical detector is connected with the upper computer;
The adjustable optical attenuator is used for adjusting the power of the light input by the light source to obtain light power adjusting light; the circulator is used for transmitting the optical power adjusting light to the Y waveguide to be tested; the Y waveguide to be measured is used for dividing the optical power adjusting light into a first light beam and a second light beam; the first multichannel optical switch is used for transmitting the first light beam to the light path conversion device; the second multichannel optical switch is used for transmitting the second light beam to the light path conversion device; the optical path conversion device is used for changing the propagation directions of the first light beam and the second light beam; the first multi-channel optical switch and the second multi-channel optical switch are also used for transmitting the first light beam with the changed light path and the second light beam with the changed light path to the Y waveguide to be tested; the Y waveguide to be measured is also used for forming a beam of combined beam by the changed first beam and the second beam with the changed light path; the circulator is further configured to transmit the combined beam to the photodetector; the optical detector is used for sending the detected combined beam to the upper computer;
the optical path transmission circuit further includes: the first depolarizer, the second depolarizer and the third depolarizer;
The first port of the first depolarizer is connected with the second port of the circulator; the second port of the first depolarizer is connected with one end of the trunk; the first port of the second depolarizer is connected with the other end of the first bifurcation; the second port of the second depolarizer is connected with the first port of the first multichannel optical switch; the first port of the third depolarizer is connected with the other end of the second bifurcation; and the second port of the third depolarizer is connected with the first port of the second multichannel optical switch.
3. A Y waveguide parameter measurement method, characterized by being applied to the Y waveguide parameter measurement apparatus according to claim 1;
forming a sawtooth wave with a 4 tau period according to the optical signal detected by the optical detector, wherein tau is the transit time of the Y waveguide parameter measuring instrument;
adjusting the amplitude of the sawtooth wave to enable the optical signal in the tau time period and the optical signal in the 3 tau time period to be dynamically stable, obtaining the adjusted amplitude of the sawtooth wave, and obtaining half-wave voltage according to the adjusted amplitude of the sawtooth wave;
measuring the adjusted saw tooth amplitude over a period of 3τ;
generating a square wave signal according to the half-wave voltage;
Measuring the amplitude of the square wave signal, wherein the amplitude of the square wave signal is half of the half-wave voltage, and the period is 4τ;
and calculating the waveform inclination according to the amplitude of the square wave signal and the adjusted sawtooth amplitude in the 3 tau time period.
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