CN111312040A - Circuit analysis experiment box with detection device and use method - Google Patents

Abstract

The utility model provides a take detection device's circuit analysis experimental box, including experimental box and detection device, experimental box one side is equipped with the detection interface who is connected with the incasement by the survey component, detection device passes through the detection interface connection of data line with the experimental box, detection device includes VXI bus host computer case and VXI instrument module, VXI bus host computer case is used for providing VXI bus backplate and working power supply to VXI instrument module, VXI instrument module is used for detecting it to the incasement by survey component transmission testing signal, and show the testing result. The use method of the experimental box comprises the steps of inserting the VXI instrument module into a backboard groove of the main box, connecting the detection device with the experimental box, downloading measurement, calculating parameters, displaying programs, connecting the detection device with a display, testing, and calculating, processing and judging measurement results. The experiment box can meet the requirements of circuit analysis experiments, can efficiently detect electronic elements in the box, ensures the accuracy of the experiments, and has low cost and high efficiency.

Description

Circuit analysis experiment box with detection device and use method

Technical Field

The invention relates to a circuit analysis experimental box in electrician teaching, in particular to a DJ-DL8 circuit analysis experimental box with a detection device and a using method thereof.

Background

The existing DJ-DL8 circuit analysis experiment box is special experimental equipment for students to learn the course of circuit analysis foundation, and is used for carrying out course related experiments, a circuit diagram for experiments is printed on the front side of the experiment box, an independent resistor, an inductor, a capacitor and a power supply are arranged on the back side of the experiment box, and students can use electronic elements in the box to carry out related circuit analysis experiments according to the circuit diagram; the existing DJ-DL8 circuit analysis experimental box has the following defects:

(1) the experimental box only has the function of performing circuit analysis course experiments, does not have the function of detecting the performance of electronic elements in the experimental box, does not have special equipment and special software at present, and performs efficient detection on all electronic devices in the experimental box;

(2) the experiment box is not provided with an interface with an automatic detection device, so that the electronic element in the experiment box can not be detected by using general detection equipment with a detection function, and the examination and the maintenance are not facilitated;

(3) the experiment box has large quantity of electronic elements (80 independent resistors, inductors, capacitors and power supplies), and has large workload and low efficiency if the electronic elements are detected one by using the traditional method.

Disclosure of Invention

The invention aims to provide a circuit analysis experiment box with a detection device and a using method thereof, so as to overcome the defects of the prior art.

The technical scheme adopted by the invention is as follows:

a circuit analysis experiment box with a detection device comprises an experiment box, wherein an electronic element for experiment is arranged in the experiment box, the electronic element comprises a resistor, a capacitor and an inductor, one side of the experiment box is provided with a detection interface connected with the electronic element in the box, the detection interface comprises a common port and a detection port, the common port is grounded, the detection port comprises resistor detection ports R1, R2, R3 … RM, capacitor detection ports C1, C2, C3 … CN and inductor detection ports L1, L2 and L3 … LP, the resistor common end in the experiment box is grounded, the other ends of the resistor common end in the experiment box are respectively connected with resistor detection ports R1, R2 and R3 … RM, the capacitor common end in the experiment box is grounded, the other ends of the capacitor common end in the experiment box are respectively connected with capacitor detection ports C1, C2 and C3 … CN, the inductor common end in the experiment box is grounded, and the other ends of the inductor detection ports L1, L2 and L3 …;

the circuit analysis experiment box is also provided with a detection device which is a separated detection device, and the separated detection device is connected with a detection interface of the experiment box through a data line;

the detection device comprises a VXI bus main case and a VXI instrument module, wherein the VXI bus main case is provided with a backboard slot and a VXI bus, the VXI bus main case is used for providing a VXI bus backboard and a required working power supply for the VXI instrument module, and the VXI instrument module is used for sending detection signals to a resistor, a capacitor and an inductor in the case to detect the VXI instrument and displaying a detection result;

the VXI instrument module comprises a VXI test control machine module, a VXI signal source module, a VXI digital multimeter module and a VXI relay matrix switch module, the VXI test control machine module, the VXI signal source module, the VXI digital multimeter module and the VXI relay matrix switch module are respectively inserted on the back plate groove and are connected through a VXI bus on the back plate groove, and the VXI relay matrix switch module is connected with a detection port of the experimental box through a data line;

the VXI test controller module is a VXI embedded test controller module, and is compatible with VXI bus, has general computer capability and VXI bus system resource management capability, and supports VXI bus word serial communication protocol; the function is as follows:

(1) providing a system with shared resources including a system clock and module identification lines, and logical configuration and management services of the system including identifying all VXI bus devices in the system, managing system self-test and diagnostic sequences, configuring an address space of the system, configuring commander and follower hierarchies of the system, allocating IQR lines of the VME system, and initiating normal system operation;

(2) interactively communicating with a VXI signal source module, a VXI digital multimeter module and a VXI relay matrix switch module through a VXI bus, and transferring the resources of the modules to finish the test work;

the VXI signal source module is used for generating sine wave signals with wave amplitudes of 2V and 100Hz and is used as an excitation source applied to the electronic element to be detected in the detection process;

the VXI digital multimeter module is used for measuring the values of alternating current and direct current voltage and current, resistance, capacitance and inductance;

and the VXI relay matrix switch module is used for connecting the tested element in the experimental box with a VXI bus.

The further technical scheme is as follows:

the VXI bus main case adopts an HPE8401A case, a standard power supply and an air cooling system are arranged on the VXI bus main case, a display is configured on the VXI bus main case, the VXI signal source module is an HPE1445A arbitrary waveform generator, the VXI digital multimeter module is an HPE1410A digital multimeter, the VXI relay matrix switch module adopts an HPE1466 matrix switch module, and the resistance detection ports R1, R2, R3 … RM, the capacitance detection ports C1, C2, C3 … CN, the inductance detection ports L1, L2 and L3 … LP adopt jacks matched with D-type plugs of the HPE1466 matrix switch module.

Further: the VXI bus on the VXI case bus backboard comprises: the system comprises a VME computer bus, a trigger bus, an addition bus, a clock and synchronization line, a module identification line, a star line, a power distribution bus and a local bus;

the VME computer bus comprises a data transmission bus DTB, a DTB arbitration bus, a priority interrupt bus and a public bus: the trigger bus comprises 8 TTL trigger lines and 6 ECL trigger lines; the addition bus is used for adding the analog signals to a single line and adding the output signals of at most 3 independent waveform generators to obtain a composite synthetic signal as an excitation source of another module; the clock and synchronous bus is used for providing synchronous signals of two clocks and one clock; the module identification bus is used for detecting whether a module in the backboard slot exists or not; the STAR bus includes two lines, STAR X and STAR Y; the power distribution bus is used for providing voltage for each module, and comprises: seven direct current voltages of + 2V, -2V, + 5V, -5V, + 12V, + 24V, -24V, the highest power is 268W; the local bus is used to enable communication between two adjacent modules.

The other technical scheme is as follows:

the method for using the circuit analysis experiment box with the detection device comprises the following steps:

the first step is as follows: directly inserting a VXI test control machine module, a VXI signal source module, a VXI digital multimeter module and a VXI relay matrix switch module into a back plate groove of a VXI bus main case;

the second step is that: connecting a D-type plug on a VXI relay matrix switch module, namely an HPE1466 matrix switch module, with a corresponding detection port on the experimental box, so as to ensure that all electronic elements to be tested on the experimental box can be reliably connected with the relay matrix switch module, and thus, a VXI bus can be sent through the relay matrix switch module to be tested;

the third step: the USB interface of the VXI bus main case is connected with the standby computer through a data line, and the program set in the standby computer is downloaded to the VXI test controller，Measuring, parameter calculating and displaying programs;

the fourth step: after the case is electrified, the display is connected with a display interface on the VXI test control machine module through a data line so as to display a test result;

the fifth step: the VXI test control machine module runs a program to start testing:

(1) controlling a VXI relay matrix switch, and sending the electronic element to be tested to a bus;

(2) calling a signal source module as an excitation source, and sending a test signal to the electronic element through a bus;

(3) calling a VXI digital multimeter module to measure the electronic element, if the electronic element is a resistor, measuring the resistance value of the electronic element, if the electronic element is a capacitor, measuring the capacitance value of the electronic element, if the electronic element is an inductor, measuring the inductance value of the electronic element, and measuring each electronic element 10 times;

and a sixth step: and (3) calculating and judging the measurement result: calculating the average value and the variance of the 10 times of measurement results, comparing the average value with the value of the electronic element on the experimental box, judging that the electronic element is good when the average value is less than a certain range and the variance is less than 5%, and displaying the test and judgment results on a display if the electronic element is bad.

Due to the adoption of the technical scheme, the circuit analysis experiment box with the detection device and the using method have the following beneficial effects:

1. the circuit analysis experiment box not only can meet the function of circuit analysis course experiments in teaching, but also has the function of detecting the performance of electronic elements in the experiment box, is convenient for monitoring and maintaining electronic devices in the experiment box, and ensures the accuracy of the experiments;

2. the VXI instrument modules of the circuit analysis experiment box detection device are in interactive communication with VXI buses and data lines, all electronic devices in the experiment box can be efficiently detected, the system is accurate in operation, high in automation degree, high in detection precision and low in cost, and resources are saved, so that the original conditions that the maintenance work is heavy, time and labor are wasted are overcome;

3. the circuit analysis experiment box is provided with a separated detection device, the experiment box is provided with a detection port connected with an element in the box, the detection device is connected with the detection port through a data line, the detection device comprises a VXI bus main machine box and a VXI instrument module, the VXI instrument module can be directly inserted into a back plate groove of the VXI bus main machine box, and all the installation, maintenance and replacement are convenient;

4. the automatic detection device part of the experimental box can be separated from the experimental box, so that all experimental boxes with detection interfaces can be sequentially detected, the utilization rate of the automatic detection machine box is improved, the cost is reduced, and the automatic detection device has good economy.

The technical features of a circuit analysis experimental box with a detection device and a using method thereof according to the present invention will be further described with reference to the accompanying drawings and embodiments.

Drawings

FIG. 1 is a schematic diagram of a circuit analysis experimental box with a detection device;

fig. 2 is a schematic diagram of a VXI instrument module connection;

fig. 3 is a schematic structural diagram of a power supply system of a VXI instrument module;

FIG. 4 is a schematic diagram of a circuit analysis experimental box system with a detection device;

in the figure:

1-experimental box, 2-data line, 3-detection device, 301-VXI test control machine module, 302-VXI signal source module, 303-VXI digital multimeter module and 304-VXI relay matrix switch module.

Detailed Description

Example one

A circuit analysis experiment box with a detection device comprises an experiment box, wherein an electronic element for experiment is arranged in the experiment box, the electronic element comprises a resistor, a capacitor and an inductor, one side of the experiment box is provided with a detection interface connected with the electronic element in the box, the detection interface comprises a common port and a detection port, the common port is grounded, the detection port comprises resistor detection ports R1, R2, R3 … RM, capacitor detection ports C1, C2, C3 … CN and inductor detection ports L1, L2 and L3 … LP, the resistor common end in the experiment box is grounded, the other ends of the resistor common end in the experiment box are respectively connected with resistor detection ports R1, R2 and R3 … RM, the capacitor common end in the experiment box is grounded, the other ends of the capacitor common end in the experiment box are respectively connected with capacitor detection ports C1, C2 and C3 … CN, the inductor common end in the experiment box is grounded, and the other ends of the inductor detection ports L1, L2 and L3 …;

the circuit analysis experiment box is also provided with a detection device which is a separated detection device, and the separated detection device is connected with a detection interface of the experiment box through a data line;

the detection device comprises a VXI bus main case and a VXI instrument module, wherein the VXI bus main case is provided with a backboard slot and a VXI bus, the VXI bus main case is used for providing a VXI bus backboard and a required working power supply for the VXI instrument module, and the VXI instrument module is used for sending detection signals to a resistor, a capacitor and an inductor in the case to detect the VXI instrument and displaying a detection result;

the VXI instrument module comprises a VXI test control machine module, a VXI signal source module, a VXI digital multimeter module and a VXI relay matrix switch module, the VXI test control machine module, the VXI signal source module, the VXI digital multimeter module and the VXI relay matrix switch module are respectively inserted on the back plate groove and are connected through a VXI bus on the back plate groove, and the VXI relay matrix switch module is connected with a detection port of the experimental box through a D-shaped plug and a data line of an HPE1466 matrix switch; the VXI test control machine module is a VXI embedded test control machine module which is compatible with VXI bus, has general computer capability and VXI bus system resource management capability (see attached notes) and supports VXI bus word serial communication protocol; the function is as follows:

(1) providing common resources (such as system clock, module identification line) and logical configuration and management services of the system to the system at the physical connection layer, wherein the management services comprise identifying all VXI bus devices in the system, managing system self-test and diagnosis sequences, configuring address space of the system, configuring commander and follower levels of the system, distributing IQR lines of the VME system and starting normal system operation;

(2) interactively communicating with a VXI signal source module, a VXI digital multimeter module and a VXI relay matrix switch module through a VXI bus, and transferring the resources of the modules to finish the test work;

the VXI signal source module is used for generating sine wave signals with wave amplitudes of 2V and 100Hz and used as an excitation source applied to the electronic element to be tested in the detection process, the VXI digital multi-purpose meter module is used for measuring the values of alternating current and direct current voltage and current, resistance, capacitance and inductance, and the VXI relay matrix switch module is used for connecting the element to be tested in the experiment box with a VXI bus.

The VXI bus main case adopts an HPE8401A case, a standard power supply and an air cooling system are arranged on the VXI bus main case, a display is configured on the VXI bus main case, so as to provide a public power supply suitable for the working requirements of instruments, a cooling environment and an electromagnetic shielding environment (the working requirements of the instruments refer to the temperature of less than 45 ℃ and no electromagnetic radiation interference), the VXI signal source module is an HPE1445A arbitrary waveform generator compatible with the VXI bus, the VXI digital multimeter module is an HPE 4831410 5 digital multimeter compatible with the VXI bus, the VXI relay matrix switch module is an HPE1466 matrix switch module, the HPE1466 matrix switch module is provided with 2D-type plugs, each D-type plug 64 pin has 128 pins, the resistance detection ports R1, R2, R3 … RM, capacitance detection ports C1, C2, C3 … CN and an inductance detection port L1, The L2, L3 … LP use sockets that mate with the D-plugs of the HPE1466 matrix switch module to facilitate connection to the VXI matrix switch module of the test device via data lines and the VXI relay matrix switch D-plugs.

The VXI bus on the VXI case bus back plate comprises a VME computer bus, a trigger bus, an addition bus, a clock and synchronization line, a module identification line, a star-shaped line, a power distribution bus and a local bus; the VME computer bus comprises a data transmission bus DTB, a DTB arbitration bus, a priority interrupt bus and a public bus:

(1) the data transmission bus DTB is controlled by a bus main module (i.e. a module initiating information transmission on the bus, namely a test control machine module) and is used for transmitting data and state information between the master module and the slave module of the VXI instrument module,

(2) the DTB arbitration bus is used for solving the problem that a plurality of main modules compete for the DTB bus use right in a VME system with a plurality of main modules and preventing bus conflict;

(3) the priority interrupt bus is used for carrying out interrupt request and interrupt approval between an interrupter (a device for providing interrupt request) and an interrupt processor (a device for managing and processing the interrupt request) of the VME bus system;

(4) the public bus provides a clock for the system, and the system is initialized and fault detection is carried out;

the trigger bus is composed of 8 TTL trigger lines and 6 ECL trigger lines, the trigger lines are usually used in communication inside the modules, each module, including zero-slot operation, can drive the trigger lines or receive signals from the trigger lines, and the trigger bus can be used for triggering, handshaking, timing or sending data; the addition bus is used for adding the analog signals to a single line and adding the output signals of at most 3 independent waveform generators to obtain a composite synthetic signal as an excitation source of another module; the clock and synchronous bus provides two clocks and a clock synchronous signal (the two clocks and the clock synchronous signal are sent from the test control machine module and are respectively sent to each module after being buffered by the bottom plate); the module identification bus is used for detecting whether a module exists in the slot, identifying the physical position of a specific module or the number of the slot so as to indicate the actual physical position of the module; the STAR bus comprises two lines, STAR X and STAR Y (two lines connect between each module slot and a zero slot, the zero slot being the center of a STAR with 12 feet, each module being located at the end of each isometric foot); the power distribution bus is used for providing voltage for each module, and comprises: seven direct current voltages of + 2V, -2V, + 5V, -5V, + 12V, + 24V, -24V, the highest power is 268W; the local bus slave module is used for realizing communication between two adjacent modules;

the buses are the components of the VXI bus, and the VXI bus is the core for connecting each module of the detection device and is an important guarantee that each part can work in a coordinated mode.

Example two

A method for using a circuit analysis experiment box with a detection device, which is the method for using the circuit analysis experiment box with the detection device described in the first embodiment, comprising the following steps:

the first step is as follows: directly inserting a VXI test control machine module, a VXI signal source module, a VXI digital multimeter module and a VXI relay matrix switch module into a back plate groove of a VXI bus main case;

the second step is that: connecting a D-type plug on a VXI relay matrix switch module, namely an HPE1466 matrix switch module, with a corresponding detection port on the experimental box, so as to ensure that all electronic elements to be tested on the experimental box can be reliably connected with the relay matrix switch module, and thus, a VXI bus can be sent through the relay matrix switch module to be tested;

the third step: the USB interface of the VXI bus main case is connected with the standby computer by a data line, and the program designed in the standby computer is downloaded to the VXI test controller，The program comprises a measuring program, a parameter calculating program and a display program;

the fourth step: after the case is electrified, the display is connected with a display interface on the VXI test control machine module through a data line so as to display a test result;

the fifth step: the VXI test control machine module runs a program to start testing:

(1) controlling VXI relay matrix switch, sending the electronic element to be tested to the bus,

(2) calling a signal source module as an excitation source, and sending a test signal to the electronic element through a bus;

(3) calling a VXI digital multimeter module to measure the electronic element, if the electronic element is a resistor, measuring the resistance value of the electronic element, if the electronic element is a capacitor, measuring the capacitance value of the electronic element, if the electronic element is an inductor, measuring the inductance value of the electronic element, and measuring each electronic element 10 times;

and a sixth step: and (3) calculating and judging the measurement result: calculating the average value and the variance of the 10 times of measurement results, comparing the average value with the value of the electronic element on the experimental box, judging that the electronic element is good when the average value is less than a certain range and the variance is less than 5%, and displaying the test and judgment results on a display if the electronic element is bad.

And (4) supplementary notes: the VXI bus system resource management capability is characterized in that a physical connection layer provides common resources for the system, such as a system clock, a module identification line, and a logic configuration and management service of the system, the management service comprises all VXI bus devices in the system, a management system self-test and diagnosis sequence, an address space for configuring the system, a commander and follower level for configuring the system, an IQR line for distributing a VME system and a zero slot controller for starting normal system operation, and the zero slot controller for completing the logic configuration has the condition of automatic test.

Claims (4)

1. A circuit analysis experimental box with a detection device comprises an experimental box, electronic elements used for experiments are arranged in the experimental box, and the electronic elements comprise a resistor, a capacitor and an inductor, and the circuit analysis experimental box is characterized in that:

one side of the experiment box is provided with a detection interface connected with electronic elements in the box, the detection interface comprises a common port and a detection port, the common port is grounded, the detection port comprises resistance detection ports R1, R2, R3 … RM, capacitance detection ports C1, C2, C3 … CN and inductance detection ports L1, L2 and L3 … LP, the resistance common end in the experiment box is grounded, the other ends of the resistance detection ports R1, R2 and R3 … RM are respectively connected with the resistance detection ports, the capacitance common end in the experiment box is grounded, the other ends of the capacitance common end in the experiment box are respectively connected with capacitance detection ports C1, C2 and C3 … CN, the inductance common end in the experiment box is grounded, and the other ends of the inductance detection ports L1, L2 and L3 … LP are respectively connected with the inductance detection ports;

the circuit analysis experiment box is also provided with a detection device which is a separated detection device, and the separated detection device is connected with a detection interface of the experiment box through a data line;

the detection device comprises a VXI bus main case and a VXI instrument module; the VXI bus mainframe box is provided with a backboard slot and a VXI bus, the VXI bus mainframe box is used for providing a VXI bus backboard and a required working power supply for the VXI instrument module, and the VXI instrument module is used for sending detection signals to a resistor, a capacitor and an inductor in the VXI instrument module to detect the VXI instrument module and display a detection result;

the VXI instrument module comprises a VXI test control machine module, a VXI signal source module, a VXI digital multimeter module and a VXI relay matrix switch module, the VXI test control machine module, the VXI signal source module, the VXI digital multimeter module and the VXI relay matrix switch module are respectively inserted on the back plate groove and are connected through a VXI bus on the back plate groove, and the VXI relay matrix switch module is connected with a detection port of the experimental box through a D-shaped plug and a data line of an HPE1466 matrix switch;

the VXI test controller module is a VXI embedded test controller module, is compatible with VXI bus, has general computer capability and VXI bus system resource management capability, supports VXI bus word serial communication protocol, and has the following functions:

(1) providing a system with shared resources including a system clock and module identification lines, and logical configuration and management services of the system including identifying all VXI bus devices in the system, managing system self-test and diagnostic sequences, configuring an address space of the system, configuring commander and follower hierarchies of the system, allocating IQR lines of the VME system, and initiating normal system operation;

(2) interactively communicating with a VXI signal source module, a VXI digital multimeter module and a VXI relay matrix switch module through a VXI bus, and transferring the resources of the modules to finish the test work;

the VXI signal source module is used for generating sine wave signals with wave amplitudes of 2V and 100Hz and is used as an excitation source applied to the electronic element to be detected in the detection process; the VXI digital multimeter module is used for measuring the values of alternating current and direct current voltage and current, resistance, capacitance and inductance; and the VXI relay matrix switch module is used for connecting the tested element in the experimental box with a VXI bus.

2. The circuit analysis experiment box with detection device according to claim 1, characterized in that:

the VXI bus main case adopts an HPE8401A case, a standard power supply and an air cooling system are arranged on the VXI bus main case, a display is configured on the VXI bus main case, the VXI signal source module is an HPE1445A arbitrary waveform generator, the VXI digital multimeter module is an HPE1410A digital multimeter, the VXI relay matrix switch module adopts an HPE1466 matrix switch module, and the resistance detection ports R1, R2, R3 … RM, the capacitance detection ports C1, C2, C3 … CN, the inductance detection ports L1, L2 and L3 … LP adopt jacks matched with D-type plugs of the HPE1466 matrix switch module.

3. The circuit analysis experiment box with detection device according to claim 2, characterized in that: the VXI bus on the VXI case bus backboard comprises: the system comprises a VME computer bus, a trigger bus, an addition bus, a clock and synchronization line, a module identification line, a star line, a power distribution bus and a local bus;

the VME computer bus comprises a data transmission bus DTB, a DTB arbitration bus, a priority interrupt bus and a public bus: the trigger bus comprises 8 TTL trigger lines and 6 ECL trigger lines; the addition bus is used for adding the analog signals to a single line and adding the output signals of at most 3 independent waveform generators to obtain a composite synthetic signal as an excitation source of another module; the clock and synchronous bus is used for providing synchronous signals of two clocks and one clock; the module identification bus is used for detecting whether a module in the backboard slot exists or not; the STAR bus includes two lines, STAR X and STAR Y; the power distribution bus is used for providing voltage for each module, and comprises: seven direct current voltages of + 2V, -2V, + 5V, -5V, + 12V, + 24V, -24V, the highest power is 268W; the local bus is used to enable communication between two adjacent modules.

4. A use method of a circuit analysis experiment box with a detection device is characterized in that: the method is the use method of the circuit analysis experiment box with the detection device, which comprises the following steps:

the first step is as follows: directly inserting a VXI test control machine module, a VXI signal source module, a VXI digital multimeter module and a VXI relay matrix switch module into a back plate groove of a VXI bus main case;

the second step is that: connecting a D-type plug on a VXI relay matrix switch module, namely an HPE1466 matrix switch module, with a corresponding detection port on the experimental box, so as to ensure that all electronic elements to be tested on the experimental box can be reliably connected with the relay matrix switch module, and thus, a VXI bus can be sent through the relay matrix switch module to be tested;

the third step: the USB interface of the VXI bus main case is connected with the standby computer through a data line, and the program set in the standby computer is downloaded to the VXI test controller，Measuring, parameter calculating and displaying programs;

the fourth step: after the case is electrified, the display is connected with a display interface on the VXI test control machine module through a data line so as to display a test result;

the fifth step: the VXI test control machine module runs a program to start testing:

(1) controlling a VXI relay matrix switch, and sending the electronic element to be tested to a bus;

(2) calling a signal source module as an excitation source, and sending a test signal to the electronic element through a bus;

(3) calling a VXI digital multimeter module to measure the electronic element, if the electronic element is a resistor, measuring the resistance value of the electronic element, if the electronic element is a capacitor, measuring the capacitance value of the electronic element, if the electronic element is an inductor, measuring the inductance value of the electronic element, and measuring each electronic element 10 times;

and a sixth step: and (3) calculating and judging the measurement result: calculating the average value and the variance of the 10 times of measurement results, comparing the average value with the value of the electronic element on the experimental box, judging that the electronic element is good when the average value is less than a certain range and the variance is less than 5%, and displaying the test and judgment results on a display if the electronic element is bad.

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