CN111308148A - System and method for setting parameters of test instrument - Google Patents
System and method for setting parameters of test instrument Download PDFInfo
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- CN111308148A CN111308148A CN202010019266.6A CN202010019266A CN111308148A CN 111308148 A CN111308148 A CN 111308148A CN 202010019266 A CN202010019266 A CN 202010019266A CN 111308148 A CN111308148 A CN 111308148A
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- 238000012360 testing method Methods 0.000 title claims abstract description 23
- 238000000034 method Methods 0.000 title claims abstract description 11
- 238000012790 confirmation Methods 0.000 claims abstract description 16
- 230000000694 effects Effects 0.000 claims abstract description 14
- 238000012545 processing Methods 0.000 claims description 3
- 230000003247 decreasing effect Effects 0.000 abstract description 3
- 238000010200 validation analysis Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 101100120298 Rattus norvegicus Flot1 gene Proteins 0.000 description 3
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- 101100412403 Rattus norvegicus Reg3b gene Proteins 0.000 description 3
- 102100023882 Endoribonuclease ZC3H12A Human genes 0.000 description 2
- 101710112715 Endoribonuclease ZC3H12A Proteins 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/08—Circuits for altering the measuring range
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Abstract
The invention provides a system for setting parameters of a test instrument, which comprises: a function key for setting parameters; the knob is used for adjusting the parameter value of the function key setting parameter; the parameter value has two effective modes, one is effective directly after the value is increased or decreased according to the knob, and the other is effective after the value is increased or decreased according to the knob and the confirmation is carried out. The method aims to realize multiple modes of directly taking effect by directly rotating a knob or only taking effect by pressing a confirmation key, and realizes a quick switching method between directly taking effect and taking effect by the confirmation key through a certain function key.
Description
Technical Field
The invention relates to the field of test measurement electronic instruments, in particular to a system and a method for setting parameters of a test instrument.
Background
When a power electronic test instrument is used for setting test parameters, some knobs for adjusting parameter values are arranged on a front panel, and when a set value is changed through the knobs, two effective modes are mainly adopted, namely, the mode a is directly realized after the set value is modified through rotating the knobs. One is that the knob modifies the set point and then is validated by the enter key (e.g., mode b).
The specific principle is that the time sequence and the phase relation of an angle code disc of the rotary encoder are converted through two photosensitive receiving tubes inside the rotary encoder, the increase (positive direction) or the decrease (negative direction) of the angle displacement of the angle code disc is obtained, and then a corresponding stepping value is obtained.
At present, most manufacturers on the market only support one mode, namely a and b. If only a is supported, the step from one value to another cannot be realized, especially when the time slope is formed, the output is distributed in a step mode, and if only b is supported, the step is not convenient when a is finely adjusted or the step is not concerned by a user.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a system and a method for setting parameters of a test instrument, aiming at realizing a quick switching method between direct validation and validation through a confirmation key by a certain function key. The knob is rotated directly to increase or decrease the set value and then to take effect directly. And by rotating the knob, the corresponding value is increased or decreased, and then the key is pressed to be effective.
A test instrument parameter setting system, comprising:
a function key for setting parameters;
the knob is used for adjusting the parameter value of the function key setting parameter;
the method is characterized in that: the parameter value adjusted by the knob has two effective modes of directly taking effect after the value is increased or reduced according to the knob and taking effect only after the value is increased or reduced according to the knob and confirmed.
Further, the system includes an arithmetic processing unit including:
a first register for storing a setting mode;
a second register for storing an update value;
a third register for storing the current valid value;
the current effective value stored in the third register is equal to the updated value stored in the second register in real time according to the setting mode stored in the first register or is equal to the updated value stored in the second register after confirmation.
Further, the function key is also used for setting mode switching, so that the parameter value adjusted by the knob is switched between two effective modes of direct effect and effective after confirmation.
Furthermore, the device also comprises a display screen for displaying the parameter setting and the parameter value.
The system also comprises a confirmation key, and when the parameter adjusted by the knob is in an effective mode after confirmation, the confirmation key is used for confirming that the parameter value adjusted by the knob is the current effective value.
The invention also discloses a method for setting the parameters of the test instrument, which is characterized by comprising the following steps:
firstly, setting an effective mode of parameters through a function key, and rotating a knob to adjust parameter values in one effective mode; in another mode, the knob is rotated to adjust the parameter value and then the enter key is pressed.
The beneficial technical effects of the invention are as follows:
the setting system of the test instrument parameter is used for actually setting the effective value of the parameter value and has two effective modes, the use performance and the operation convenience of the system are improved, and the setting system is specifically a mode which directly rotates through a knob, increases or decreases a set value, then directly takes effect, and increases or decreases a corresponding value through adjusting the angle of the knob, and then takes effect through pressing a confirmation key.
Meanwhile, when the mode is switched, the function key for setting the parameters is used instead of adding the function key for switching the mode, and the same function key simultaneously realizes the functions of setting the parameters and quickly switching the mode, thereby saving system resources.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a system for setting parameters of a test instrument according to an embodiment of the present invention.
Fig. 2 is a schematic diagram of mode switching for setting parameters of a test instrument according to an embodiment of the present invention.
Fig. 3 is a schematic block diagram of a first mode of setting parameters of a test instrument according to an embodiment of the present invention.
Fig. 4 is a schematic block diagram of setting parameters of a test instrument in a second mode according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, the parameter setting system of the present invention includes at least one main function key, a knob and a display screen. The main function keys are used for setting parameter functions, and such function keys may include corresponding setting keys for voltage V, current I, power P, resistance R, and the like. The knob is used for setting parameter SET values corresponding to the function keys and displaying the SET values on the display screen in real time, wherein V _ SET is a voltage SET value, P _ SET is a power SET value, an I _ SET current SET value, an R _ SET resistance SET value and the like.
As shown in fig. 2 to 4, the principle of the switching and operation of the test system of the present invention in two setting modes is schematically shown.
The program in this embodiment may record the currently active setting mode m through a register Reg1, a register Reg2 to record the update value update _ val after the knob (new update value = (old update value +/-step value)), and a register Reg3 to record the current active value activate _ val.
If the current operation is in the a (m = = a) mode, when the knob is rotated, a new update value update _ val is obtained, and the current valid value is activate _ val = update _ val.
When the main function key (e.g., V _ SET) is pressed at this time, the current setting mode becomes b (m = b). At this time, the knob is rotated, the update value update _ val (new update value = (old update value +/-step value)) is changed all the time, the displayed setting value is changed all the time, but the current valid value is not changed, and when the validation key is pressed again, the validation is performed, and the current valid value is equal to the update value (activate _ val = update _ val).
In the b mode, if the main function key (e.g., V _ SET) is pressed again, the operation mode returns to a again.
The working principle is as follows:
specifically, the register Reg1 stores a currently active setting mode m, where m = a or m = b, m = a represents that an a mode is active, m = b represents that a b mode is active, and then it is determined whether there is a mode switching input, in this embodiment, the mode is switched by the main function key, and if it is determined that there is a mode switching input, the mode in the register 1 is switched from the a mode to the b mode or from the b mode to the a mode, that is, if m = = a- > m = b, and if m = = b- > m = a. If no mode switching output is judged, the mode data stored in the register 1 is not changed.
When the controller works in the a mode, the updating value stored in the register Reg2 is assigned to the current generating value stored in the register Reg3 in real time; when the device works in the b mode, the updated value stored in the register Reg2 is assigned to the register Reg3 according to whether validation is effective, and validation input is performed through a validation key in the embodiment.
The following introduces the interface display style of two modes of real-time effect of the set value and after-effect confirmation when the main function key is set for voltage, so that the user can conveniently distinguish which mode the test instrument is in, and the display screen can display different formats on the UI interface, for example
Display interfaces in a-mode, for example: voltage measurement 30.000V, current measurement 0.000A, voltage setting 20.000V, current setting 20.000A;
display interfaces in b-mode, for example: voltage measurement 30.000V, current measurement 0.000A, voltage setting V _ SET = 20.000V.
The above description is only for the preferred embodiment of the present invention and should not be construed as limiting the present invention, and any modifications, equivalents, improvements, etc. made within the spirit and principle of the present invention, such as replacing the key with the touch key, replacing the identification key name with other names having identification function, should be included in the protection scope of the present invention.
Claims (6)
1. A test instrument parameter setting system, comprising:
a function key for setting parameters;
the knob is used for adjusting the parameter value of the function key setting parameter;
the method is characterized in that: the parameter value adjusted by the knob has two effective modes of directly taking effect after the value is increased or reduced according to the knob and taking effect only after the value is increased or reduced according to the knob and confirmed.
2. The setting system of test instrument parameters of claim 1, wherein said system comprises an arithmetic processing unit, said arithmetic processing unit comprising:
a first register for storing a setting mode;
a second register for storing an update value;
a third register for storing the current valid value;
the current effective value stored in the third register is equal to the updated value stored in the second register in real time according to the setting mode stored in the first register or is equal to the updated value stored in the second register after confirmation.
3. The test instrument parameter setting system according to claim 1 or 2, characterized in that:
the function key is also used for setting mode switching, so that the parameter value adjusted by the knob is switched between two effective modes of direct effective and effective after confirmation.
4. The test instrument parameter setting system according to claim 3, wherein:
the device also comprises a display screen for displaying the parameter setting and the parameter value.
5. The test instrument parameter setting system according to claim 4, wherein:
the system also comprises a confirmation key, and when the parameter adjusted by the knob is in an effective mode after confirmation, the confirmation key is used for confirming that the parameter value adjusted by the knob is the current effective value.
6. A method for setting parameters of a test instrument is characterized by comprising the following steps:
firstly, setting an effective mode of parameters through a function key, and rotating a knob to adjust parameter values in one effective mode; in another mode, the knob is rotated to adjust the parameter value and then the enter key is pressed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010019266.6A CN111308148A (en) | 2020-01-08 | 2020-01-08 | System and method for setting parameters of test instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010019266.6A CN111308148A (en) | 2020-01-08 | 2020-01-08 | System and method for setting parameters of test instrument |
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| Publication Number | Publication Date |
|---|---|
| CN111308148A true CN111308148A (en) | 2020-06-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010019266.6A Pending CN111308148A (en) | 2020-01-08 | 2020-01-08 | System and method for setting parameters of test instrument |
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| CN (1) | CN111308148A (en) |
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2020
- 2020-01-08 CN CN202010019266.6A patent/CN111308148A/en active Pending
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Application publication date: 20200619 |
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