CN111289536A - Defect detection device of electronic equipment screen - Google Patents
Defect detection device of electronic equipment screen Download PDFInfo
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- CN111289536A CN111289536A CN202010264115.7A CN202010264115A CN111289536A CN 111289536 A CN111289536 A CN 111289536A CN 202010264115 A CN202010264115 A CN 202010264115A CN 111289536 A CN111289536 A CN 111289536A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The application discloses defect detection device of electronic equipment screen, including mainstream waterline and test terminal, it detects the station to have set gradually first detection station and second along the direction of transmission on the mainstream waterline, all be provided with image acquisition mechanism on first detection station and the second detection station, the direction of shooing of image acquisition mechanism is just to mainstream waterline, thereby can shoot the electronic equipment's of transmission on the mainstream waterline screen, in order to obtain electronic equipment's screen photo, then test terminal carries out the defect detection to electronic equipment's screen according to the screen photo, therefore, through the mode mentioned above, can realize the automated inspection of screen defect, be favorable to improving detection efficiency and the accuracy that detects, reduce the erroneous judgement.
Description
Technical Field
The application relates to the technical field of assembly lines, in particular to a defect detection device for a screen of electronic equipment.
Background
Electronic equipment such as mobile phones, tablets, notebooks and the like generally need to be subjected to quality detection in the production or recycling process, for example, quality detection during production can ensure the delivery quality of the electronic equipment, and quality detection during the recycling process is helpful for value evaluation of the recycled electronic equipment. The quality of the screen of the electronic device is an important factor affecting the quality of the electronic device, so that the screen of the electronic device needs to be detected for defects.
In the prior art, the screen defects are usually detected in a manual mode, whether scratches, cracks and the like exist on the screen or not is observed manually, however, the manual mode is low in efficiency, and the detecting personnel are easy to fatigue after long-time detection operation, so that the conditions of missing detection or inaccurate detection are easily caused, and misjudgment is caused.
Disclosure of Invention
The technical problem that this application mainly solved provides a defect detecting device of electronic equipment screen, can improve detection efficiency and the accuracy that detects, reduces the erroneous judgement.
The embodiment of the application provides a defect detection device of an electronic equipment screen, which is characterized by comprising a main assembly line and a detection terminal;
the main assembly line is sequentially provided with a first detection station and a second detection station along the transmission direction; the first detection station comprises a camera bellows, a first image acquisition mechanism and a light source, the main assembly line penetrates through the camera bellows, the first image acquisition mechanism and the light source are positioned in the camera bellows and above the main assembly line, the second detection station comprises a second image acquisition mechanism which is exposed in ambient light and above the main assembly line, and the photographing directions of the first image acquisition mechanism and the second image acquisition mechanism are both right opposite to the main assembly line so as to obtain a screen photo of electronic equipment on the main assembly line;
the detection terminal is connected with the first image acquisition mechanism and the second image acquisition mechanism so as to detect the defects of the screen of the electronic equipment according to the screen photos acquired by the first image acquisition mechanism and the second image acquisition mechanism.
The camera bellows is characterized in that a transparent reflecting plate is further arranged in the camera bellows, a first image acquisition mechanism, the reflecting plate and a light source are sequentially arranged from top to bottom in the camera bellows, and the light emitting direction of the light source is arranged towards the reflecting plate.
And an included angle between the light emitting direction of the light source and the reflecting plate is 45-50 degrees.
The light guide plate is arranged in the dark box and is positioned below the light source.
The camera bellows comprises a support table and shading cloth surrounding the support table, the support table comprises a plurality of stand columns and a plurality of cross rods, the cross rods are respectively connected with the stand columns to form an upper support and a lower support on the stand columns, the reflecting plate is installed on the upper support, and the light guide plate and the light source are installed on the lower support.
The supporting table further comprises a mounting rod arranged on the upper layer support, and the first image acquisition mechanism is fixed on the mounting rod.
Wherein, the upper bracket and the lower bracket are both square brackets.
Wherein the reflecting plate is a diffuse reflecting plate.
Wherein the light source is a bar light source.
The main assembly line is also provided with a third detection station, the third detection station is positioned on the first detection station and the second detection station bracket, and the third detection station and the first detection station have the same structure.
The first detection station, the second detection station and the third detection station form a main body station, the main body station is used for an automatic detection assembly line of the electronic equipment, or the first detection station, the second detection station and the third detection station are single stations.
The utility model provides an among the defect detection assembly line of electronic equipment screen, including main assembly line and test terminal, first detection station and second detection station have set gradually along the direction of transmission on the main assembly line, all be provided with image acquisition mechanism on first detection station and the second detection station, image acquisition mechanism's the direction of shooing is just to main assembly line, thereby can shoot the electronic equipment's of transmission on main assembly line screen, with the screen photo that obtains electronic equipment, then test terminal carries out the defect detection to electronic equipment's screen according to the screen photo, therefore, through the mode mentioned above, can realize the automated inspection of screen defect, be favorable to improving detection efficiency and the accuracy that detects, reduce erroneous judgement.
Drawings
FIG. 1 is a schematic structural diagram of a defect detection pipeline of an electronic device screen according to an embodiment of the present disclosure;
FIG. 2 is a schematic diagram of another structure of a defect detection pipeline of an electronic device screen according to an embodiment of the present application;
FIG. 3 is a schematic structural diagram of a first inspection station provided in an embodiment of the present application;
FIG. 4 is a schematic diagram of another structure of a defect detection pipeline of an electronic device screen according to an embodiment of the present application;
fig. 5 is a schematic diagram illustrating transmission of screen shots in a defect detection pipeline of a screen of an electronic device according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The defect detection assembly line of the electronic equipment screen of the embodiment of the application is mainly used for carrying out automatic defect detection on the screen of the electronic equipment, and comprises the steps of detecting whether the screen is cracked, scratched and the like. The electronic device may be, for example, a mobile phone, a tablet or a notebook computer, etc.
As shown in fig. 1, the defect detection pipeline of the electronic device screen of the embodiment of the present application includes a main pipeline 11 and a detection terminal 12. The main pipeline 11 is used for transmission of the electronic device 20, and the detection terminal 12 may be, for example, a mobile phone, a tablet, a notebook computer, a personal computer, or the like.
Wherein, the main assembly line 11 is provided with a first detection station 13 and a second detection station 14 in sequence along the propagation direction AB, and the first detection station 13 comprises a dark box 131, a first image acquisition mechanism 132 and a light source 133. The main pipeline 11 passes through the dark box 131, and the first image capturing mechanism 132 and the light source 133 are located in the dark box 131 and above the main pipeline 11. The second inspection station 14 includes a second image capturing mechanism 141 exposed to ambient light and positioned above the main pipeline 11. The first image capturing mechanism 132 and the second image capturing mechanism 141 may be, for example, cameras, and the photographing directions of the cameras are both opposite to the main flow line 11, so as to respectively obtain screen photographs of the electronic device 20 passing through the first detection station 13 and the second detection station 14 on the main flow line 11.
In some embodiments, the electronic device 20 may be manually placed on the main pipeline 11 to enable the electronic device 20 to be transported on the main pipeline 11, or the electronic device 20 may be placed on the main pipeline 11 by an automatic feeder. The screen of the electronic device 20 faces the upper side of the main pipeline 11.
The light source 133 serves as an auxiliary light source for providing light when the first image capturing mechanism 132 takes a picture, and may be a light source having a relatively high light intensity. In this embodiment, the light emitting direction of the light source 133 is toward the main flow line 11, and further, the light emitting direction of the light source 133 may be inclined with respect to the main flow line 11, that is, the light source 133 may be inclined with respect to the main flow line 11, and an included angle between the two may be an acute angle.
The detection terminal 12 is connected to the first image capturing mechanism 132 and the second image capturing mechanism 141, so as to detect defects on the screen of the electronic device 20 according to the screen photos acquired by the two image capturing mechanisms 132 and 141. In some embodiments, the detection terminal 12 may detect the defect by detecting a contrast of the screen photo, specifically, if a crack or a scratch occurs on the screen, the contrast of a position on the screen photo corresponding to the crack or the scratch is significantly different from the contrast of other regions, and the region where the screen is located in the screen photo may be determined by an image recognition technology, and then the contrast of the region where the screen is located in the screen photo is calculated, so as to identify whether the crack or the scratch exists on the screen.
In other embodiments, it is also possible to previously store a plurality of sets of image data of different screen photographs, such as image data of a normal screen, image data of screens with different degrees of fragmentation, and image data with different scratch strengths, and then compare the image data of the screen photographs acquired by the first image acquisition mechanism 132 and the second image acquisition mechanism 141 with the plurality of sets of image data stored in advance, and if there is consistent or close image data as a result of the comparison, determine a defect state of the screen of the electronic device 20 according to a defect state of the screen corresponding to the matched image data, and if the image data of the acquired screen photographs is consistent or close to the image data of the normal screen stored in advance, determine that the screen of the electronic device 20 is normal and has no defect. In the above manner, the detection terminal 12 can detect defects on the screen of the electronic device 20.
Further, the detection terminal 12 is configured to detect a severe crack or a scratch on the screen according to the screen shot acquired by the first image acquisition mechanism 132, that is, the screen shot acquired by the first image acquisition mechanism 132 is mainly used to detect whether the screen of the electronic device 20 has a severe crack or a scratch. In the embodiment of the present application, the light source 133 is disposed in the dark environment provided by the dark box 131, so that the light source 133 emits light toward the main assembly line 11, and thus the strong light can be converged on the screen of the electronic device 20 on the main assembly line 11, if there is a crack or scratch on the screen, the contrast of the crack or scratch can be enhanced by the strong light irradiation, and the crack or scratch on the screen can be detected more easily.
In addition, the detecting terminal 12 is configured to detect a slight crack or scratch on the screen according to the screen photo captured by the second image capturing mechanism 141, that is, the screen photo captured by the second image capturing mechanism 141 is mainly used to detect whether the screen of the electronic device 20 has the slight crack or scratch. If there is a slight crack or scratch on the screen, the screen may reflect strong light when the screen is in a strong light environment, so that the slight crack or scratch on the acquired screen photograph may appear very lightly or even not displayed on the screen photograph, and if the screen is in a weak or natural light, the slight crack or scratch of the screen may appear more clearly on the screen photograph. Therefore, the dark box is not disposed on the second detection station 14, but the second detection station 14 is exposed to the ambient light, that is, the natural light, so that the second image capturing mechanism 141 photographs the electronic device 20 passing through the second detection station 14 under the ambient light to obtain the screen picture, thereby being more beneficial to correctly determining whether the screen has the defect.
Therefore, in the embodiment of the application, the screen photo of the electronic equipment is acquired by setting the image acquisition mechanism, then the defect detection of the screen of the electronic equipment is realized through the detection terminal according to the screen photo, the automatic detection of the screen defect can be realized, the detection efficiency and the detection accuracy are favorably improved, and the misjudgment is reduced.
Referring to fig. 2, in the embodiment of the present application, a transparent reflective plate 134 may be further disposed in the dark box 131, and the first image capturing mechanism 132, the reflective plate 134 and the light source 133 in the dark box 131 are sequentially disposed from top to bottom, that is, the reflective plate 134 is located between the first image capturing mechanism 132 and the light source 133, and the light emitting direction of the light source 133 is disposed toward the reflective plate 134.
The reflective plate 134 may be a diffuse reflective plate for reflecting the light of the light source 133. Since the light intensity of the light source 133 in the irradiation range is not uniform, the light reaching the screen is not uniform, and misjudgment is easily caused, so that the light of the light source 133 is reflected onto the screen by the reflection plate 134, the uniformity of the light intensity can be improved, and particularly for the diffuse reflection plate, the uniformity of the light intensity is more favorably improved, so that the detection accuracy is favorably improved.
In the above embodiment, since the reflective plate 134 is a transparent reflective plate, a part of the light may be emitted from the reflective plate 134, resulting in light loss, and reducing the illumination intensity in the dark box 131, a plurality of light sources 133 may be disposed in the dark box 131 to increase the illumination intensity. Further, the light emitting direction of the light source 133 may be inclined with respect to the reflective plate 134, for example, an included angle between the light emitting direction of the light source 133 and the reflective plate 134 may be an acute angle, such as 45-50 degrees.
Still referring to fig. 2, a light guide plate 135 is disposed in the dark box 131, and the light guide plate 135 is located below the light source 133 and is used for guiding the light reflected by the reflective plate 134 to the electronic device 20. It should be noted that the reflective plate 134 and the light guide plate 135 are transparent plates, so that the first image capturing mechanism 132 can take a picture of the screen of the electronic device 20.
Referring to fig. 3, in the embodiment of the present application, the dark box 131 includes a support stage 31 and a shade cloth (not shown) surrounding the support stage 31. Wherein, the support table 31 comprises a plurality of columns 311 and a plurality of cross bars 312, and the cross bars 312 are respectively connected with the columns 311 to form the upper layer support 301 and the lower layer support 302 on the columns 311. The upper rack 301 and the lower rack 302 may be, for example, square racks formed by connecting four cross bars 312, or may also be triangular racks or pentagonal racks, which is not limited to this. The main water line 11 passes below the lower rack 302.
The reflection plate 134 is mounted on the upper bracket 301, and covers an area surrounded by the four cross bars 312 of the upper bracket 301. The light guide plate 135 and the light sources 133 are mounted on the lower frame 302, the light guide plate 135 covers the area enclosed by the four bars 312 of the lower frame 302, and the light sources 133 are mounted on the bars 312 of the lower frame 302, specifically on the side of the bars 312 facing the upper frame 301, for example, the light guide plate 135 may be connected to the inner side of the bars 312, the light sources 133 may be mounted on the upper top surface of the bars 312 facing the upper frame 301, and the light sources 133 are inclined toward the reflective plate 134.
The light source 133 may be a bar-shaped light source, and a length direction of the bar-shaped light source extends along a length direction of the cross bar 133, so that the light intensity and the uniformity of light can be improved.
The support table 31 further includes a mounting rod 313 disposed on the upper support 301, and the first image capturing mechanism 132 is fixed to the mounting rod 313.
In this embodiment, as shown in fig. 4, a third detection station 15 may be further disposed on the main flow line 11, where the third detection station 15 has the same structure as the first detection station, that is, the third detection station 15 may also include a dark box, an image capturing mechanism, and a light source, and the arrangement manner of the image capturing mechanism and the light source in the dark box is the same as the arrangement manner of the image capturing mechanism and the light source in the first detection station in the dark box. According to the embodiment of the application, the two detection stations with the same structure are arranged to obtain the picture of the screen of the electronic equipment, so that the situation that the detection terminal 12 makes wrong judgment due to the fact that one detection station is abnormal can be prevented. Further, the detection terminal 12 may compare the screen photos obtained from the first and third detection stations, and if the difference between the comparison results is large, it indicates that one of the detection stations may be abnormal and obtain an incorrect photo, and at this time, an alarm may be sent to prompt a worker to check the image, and if the difference between the comparison results is small, it indicates that both the detection stations are normal, and at this time, normal detection may be performed.
As shown in fig. 4, the first detection station 13, the second detection station 14 and the third detection station 15 form a main station, that is, the main station is formed by a detection station 13, a second detection station 14 and a third detection station 15, and the main station can be regarded as a whole, when the main assembly line is combined and disassembled, the whole process is performed, the process is simplified, and the efficiency is improved, further, the forming sequence of the first detection station 13, the second detection station 14 and the third detection station 15 can be randomly sequenced, so that the independence of a single station can be ensured, when any station has a problem, the maintenance is convenient, however, the main station and the split station can be used for the automatic detection assembly line of the electronic equipment, another embodiment can use the first detection station 13, the second detection station 14 and the third detection station 15 as a single station, according to different terminal requirements, two groups of detection stations can be combined at will to form a station group.
As shown in fig. 5, in the embodiment of the present application, the detection terminal 12 may be, for example, a personal computer with a relatively high computing capability, and in order to facilitate the transmission of the photos to the detection terminal 12, the image capturing mechanisms at the three detection stations 13, 14, and 15 may upload the obtained photos to a portable terminal 50 (e.g., a mobile phone), and then combine the received screen photos through the portable terminal, for example, combine the three photos into one photo, and then transmit the photo to the detection terminal 12, and the detection terminal 12 performs image recognition analysis on the photo, thereby implementing defect detection on the screen.
The above description is only for the purpose of illustrating embodiments of the present application and is not intended to limit the scope of the present application, and all modifications of equivalent structures and equivalent processes, which are made by the contents of the specification and the drawings of the present application or are directly or indirectly applied to other related technical fields, are also included in the scope of the present application.
Claims (10)
1. A defect detection device of an electronic equipment screen is characterized by comprising a main assembly line and a detection terminal;
the main assembly line is sequentially provided with a first detection station and a second detection station along the transmission direction; the first detection station comprises a camera bellows, a first image acquisition mechanism and a light source, the main assembly line penetrates through the camera bellows, the first image acquisition mechanism and the light source are positioned in the camera bellows and above the main assembly line, the second detection station comprises a second image acquisition mechanism which is exposed in ambient light and above the main assembly line, and the photographing directions of the first image acquisition mechanism and the second image acquisition mechanism are both right opposite to the main assembly line so as to obtain a screen photo of electronic equipment on the main assembly line;
the detection terminal is connected with the first image acquisition mechanism and the second image acquisition mechanism so as to detect the defects of the screen of the electronic equipment according to the screen photos acquired by the first image acquisition mechanism and the second image acquisition mechanism.
2. The detection device according to claim 1, wherein a transparent reflection plate is further disposed in the dark box, the first image capturing mechanism, the reflection plate and the light source are sequentially disposed from top to bottom in the dark box, and the light emitting direction of the light source is disposed toward the reflection plate.
3. The detecting device for detecting the rotation of the motor rotor according to the claim 2, wherein an included angle between the light emitting direction of the light source and the reflecting plate is 45-50 degrees.
4. The detecting device for detecting the rotation of a motor rotor as claimed in claim 2, wherein a light guide plate is further arranged in the dark box and is positioned below the light source.
5. The detecting device for detecting the rotation of a motor rotor according to claim 4, wherein the camera bellows comprises a supporting platform and a shading cloth surrounding the supporting platform, the supporting platform comprises a plurality of vertical columns and a plurality of cross bars, the cross bars are respectively connected with the vertical columns to form an upper layer bracket and a lower layer bracket on the vertical columns, the reflecting plate is installed on the upper layer bracket, and the light guide plate and the light source are installed on the lower layer bracket.
6. The inspection device of claim 5, wherein the support platform further comprises a mounting bar disposed on the upper support, the first image capturing mechanism being secured to the mounting bar.
7. The detecting device for detecting the rotation of a motor rotor as claimed in claim 5, wherein the upper bracket and the lower bracket are both square brackets.
8. The detection device of claim 2, wherein the reflective plate is a diffuse reflective plate.
9. The detection device of claim 1, wherein the light source is a bar light source.
10. The detection device according to any one of claims 1 to 9, wherein a third detection station is further arranged on the main assembly line, the third detection station is positioned on the first detection station and the second detection station bracket, and the third detection station has the same structure as the first detection station; the first detection station, the second detection station and the third detection station form a main station, the main station is used for an automatic detection assembly line of the electronic equipment, or the first detection station, the second detection station and the third detection station are single stations.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010264115.7A CN111289536B (en) | 2020-04-07 | 2020-04-07 | Defect detection device of electronic equipment screen |
| PCT/CN2020/120253 WO2021203650A1 (en) | 2020-04-07 | 2020-10-11 | Defect detection apparatus for screen of electronic device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010264115.7A CN111289536B (en) | 2020-04-07 | 2020-04-07 | Defect detection device of electronic equipment screen |
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| CN111289536A true CN111289536A (en) | 2020-06-16 |
| CN111289536B CN111289536B (en) | 2021-10-26 |
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| WO2021203650A1 (en) * | 2020-04-07 | 2021-10-14 | 深圳回收宝科技有限公司 | Defect detection apparatus for screen of electronic device |
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| CN116253012B (en) * | 2023-03-02 | 2023-12-15 | 四川京龙光电科技有限公司 | Full-automatic electronic screen detection and packaging integrated machine and detection and packaging method |
| CN117830320A (en) * | 2024-03-06 | 2024-04-05 | 深圳市善之能科技有限公司 | Display screen display abnormality detection method and system based on image recognition |
| CN117830320B (en) * | 2024-03-06 | 2024-05-31 | 深圳市善之能科技有限公司 | Display screen display abnormality detection method and system based on image recognition |
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| WO2021203650A1 (en) | 2021-10-14 |
| CN111289536B (en) | 2021-10-26 |
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