CN111257814A - Straight-through-short circuit calibration method of vector network analyzer - Google Patents

Straight-through-short circuit calibration method of vector network analyzer Download PDF

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CN111257814A
CN111257814A CN202010148419.7A CN202010148419A CN111257814A CN 111257814 A CN111257814 A CN 111257814A CN 202010148419 A CN202010148419 A CN 202010148419A CN 111257814 A CN111257814 A CN 111257814A
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calibration
short
circuit
network analyzer
vector network
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吴昌英
刘育杰
高峰
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Northwestern Polytechnical University
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Abstract

The invention relates to a straight-through-short-circuit calibration method of a vector network analyzer, belonging to the field of vector network analyzer calibration; the method comprises the following steps in sequence: the LSS calibration method of the invention completes one-time straight-through calibration by utilizing the fixed distance between the clamps at two ends of the instrument, avoids the step that the clamps at two ends are butted in the straight-through calibration in the TRL calibration method, not only ensures the operation to be simpler and more convenient, but also avoids the influence caused by friction in the aligning and butting process.

Description

Straight-through-short circuit calibration method of vector network analyzer
Technical Field
The invention belongs to the field of vector network analyzer calibration, and particularly relates to a direct connection-short circuit calibration method of a vector network analyzer.
Background
In the analysis of radio frequency microwave circuits and systems, the parameters of the components themselves must be known to perform various designs. Scattering parameters, i.e., S-parameters, are commonly used to characterize the components during the design process. The basic method of S-parameter measurement has been developed decades ago, and the most typical S-parameter measurement instrument is a vector network analyzer. The vector network analyzer can measure the scattering parameters and can be conveniently converted into characteristic parameters in other forms, so that the network analyzer greatly expands the microwave measurement function, improves the working efficiency and rapidly develops the network analyzer. In actual life, the vector network analyzer is widely applied to the fields of aerospace, satellite communication, radar monitoring and the like, and plays a vital role in the field of microwave measurement.
As a very precise instrument, the calibration process and error correction process of the vector network analyzer are vital parts. Since any measuring device may not be ideal, and especially network analyzers typically operate in a frequency range of tens of MHz to tens of GHz, the measuring device may not have ideal performance and good consistency over such a wide frequency range, and these non-idealities and non-consistencies in performance may result in measurement errors. While the improvement on the hardware performance is pursued, on one hand, the design difficulty is greatly increased, and on the other hand, the cost of the instrument is also obviously increased. Thus, a reasonable solution is to allow direct measurements to be made with errors, and to obtain accurate measurements by obtaining the errors and correcting the measurements by appropriate methods.
In a specific calibration experiment process, if a vector network analyzer or other precise instruments need to be calibrated, a mature and perfect straight-through-reflection-transmission line (TRL) calibration method or a short-circuit-open-load-straight-through (salt) calibration method is generally selected for calibration, and as mentioned in the reference [1] Chenting, Yangchuntao, Chengmei, Zhang, China, the principle of the TRL calibration method and the application of the [ J ] metering technology, 2007(07):46-50, when the straight-through calibration (T) is performed, clamps at two ends of the instrument need to be moved, so that the clamps at the two ends are butted to complete the straight-through calibration; secondly, when the reflection calibration (R) is carried out, the clamps at the two ends of the instrument are separated, and a reflection calibration piece is connected into the clamps to finish the reflection calibration; and finally, when the transmission line calibration (L) is carried out, the reflection calibration piece needs to be taken down firstly, and the transmission line calibration piece is accessed to finish the transmission line calibration. In the whole process of calibrating the instrument by using the TRL calibration method, clamps at two ends of the vector network analyzer need to be moved continuously, so that the small clamp is easy to operate, but if the clamps at two ends of the instrument are too large or are not suitable to move, the operation is hindered firstly when the TRL calibration method is used; secondly, when the straight calibration is carried out, the clamps at the two ends of the instrument need to be aligned and butted, friction is easily generated between the clamps at the two ends in the process, and the final calibration result is also influenced.
Disclosure of Invention
The technical problem to be solved is as follows:
in order to avoid the defects of the prior art, the invention provides a through-short calibration method of a vector network analyzer.
The technical scheme of the invention is as follows: a direct connection-short circuit calibration method of a vector network analyzer is characterized by comprising the following specific steps:
the method comprises the following steps: straight-through calibration;
connecting components of the tested device and two ends of the vector network analyzer as clamps at two sides of the vector network analyzer, and selecting a position between the central position of the tested device and the left clamp of the vector network analyzer as a left reference surface; correspondingly, another reference surface is taken from the corresponding position on the right side of the central position of the tested device and is used as a right reference surface;
let the distance between the left reference surface and the right reference surface be l0Carrying out direct connection calibration, and obtaining a measured value T of the direct connection calibration by measuring with a vector network analyzerm；
Step two: calibrating short circuit for the first time;
selecting a thickness d1The first short-circuit piece is used as a short-circuit calibration piece and placed in clamps at two ends of a vector network analyzer, and the distance from a left reference surface to the left side of the first short-circuit piece is l1The distance from the right reference surface to the right side of the first short circuit sheet is l2Satisfy l1+l2+d1＝l0Performing a first short circuit calibration, and obtaining a measurement value M of the first short circuit calibration by the measurement of the vector network analyzer1、M2；
Step three: calibrating the short circuit for the second time;
selecting a thickness d2Second shorting tab ofAs a short circuit calibration piece, the short circuit calibration piece is placed at the same position as the first short circuit piece during the first short circuit calibration; the thickness difference between the first short circuit sheet and the second short circuit sheet is
Figure 1
Wavelength, i.e. guarantee
Figure BDA0002401577660000022
Figure BDA0002401577660000023
Wherein λ is the medium wavelength;
or with a thickness d1The first short-circuit piece is used as a short-circuit calibration piece, and the position of the first short-circuit piece is adjusted to ensure that the distance difference of the first short-circuit piece at the positions of the first short-circuit calibration and the second short-circuit calibration is as follows
Figure 2
A wavelength;
selecting the second method to adopt the first short circuit sheet same as the second method, wherein the distance from the left side of the first short circuit sheet to the left reference surface is l3The distance from the right side of the first short-circuit piece to the right reference surface is l4And satisfy
Figure BDA0002401577660000032
Figure BDA0002401577660000033
Performing second short circuit calibration, and measuring with vector network analyzer to obtain measurement value M3、M4：
Step four: completing calibration;
the measured value T obtained by the first step, the second step and the third stepm、M1、M2、M3、M 48 errors a, b, c, d, f, g, x for vector network analyzer22、y22And respectively calculating to finish calibration, wherein the formula is as follows:
Figure BDA0002401577660000034
Figure BDA0002401577660000035
Figure BDA0002401577660000036
Figure BDA0002401577660000037
Figure BDA0002401577660000038
。
advantageous effects
The invention has the beneficial effects that: in the whole calibration process, the clamps at the two ends of the vector network analyzer are always fixed without any other operation, and for small clamps, compared with the TRL calibration method, the LSS calibration method has no difference in operation difficulty and accuracy of calibration results; however, for large-scale clamps or clamps which are not suitable to move, because the clamps at the two ends of the instrument are fixed, the LSS calibration method of the invention completes one-time straight-through calibration by using the fixed distance between the clamps at the two ends of the instrument, thereby avoiding the step that the clamps at the two ends are butted in the straight-through calibration in the TRL calibration method, not only leading the operation to be simpler and more convenient, but also avoiding the influence caused by friction in the aligning and butting process. In the two short circuit calibration processes, the LSS calibration method of the invention can carry out two short circuit calibrations after changing the position of the same short circuit piece between the two end clamps or changing the thickness of the short circuit piece at the same position under the condition that the two end clamps of the instrument are fixed, and compared with the reflection calibration method of the TRL calibration method, the operation is simpler and more convenient in the same way because the two end clamps are moved and the reflection calibration piece is connected.
Drawings
FIG. 1 is a schematic diagram of a through calibration of a free space method test apparatus;
FIG. 2 is a schematic diagram of a first short circuit calibration of a free space method test apparatus;
FIG. 3 is a schematic diagram of a second short calibration of a free space method test apparatus;
FIG. 4 is a schematic illustration of a waveguide test apparatus straight through calibration;
FIG. 5 is a schematic diagram of a first short circuit calibration of a waveguide test apparatus;
FIG. 6 is a schematic diagram of a second short circuit calibration of the waveguide test apparatus;
description of reference numerals: 1-vector network analyzer, 2-horn antenna, 3-dielectric lens, 4-bracket, 5-reference surface, 6-thin short-circuit sheet, 7-thick short-circuit sheet, 8-coaxial waveguide converter, 9-flange, 10-screw, 11-rectangular straight waveguide, 12-choking flange, 13-middle rectangular straight waveguide, 14-left reference surface, 15-right reference surface, 16-left rectangular straight waveguide, and 17-right rectangular straight waveguide.
Detailed Description
The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the invention and are not to be construed as limiting the invention.
The invention relates to a direct connection-short circuit calibration method based on a vector network analyzer, which completes the final calibration by utilizing one-time direct connection calibration and two-time short circuit calibration;
based on an 8-term error model of the vector network analyzer, a reference surface is taken from any position between the center position of the whole tested device and a left clamp of the vector network analyzer as a left reference surface, a reference surface is taken from a corresponding position on the right side as a right reference surface, and a left T matrix of all parts needing to be calibrated of the left reference surface is set as [ TX]Setting the T matrix of all parts needing calibration to the right of the right reference surface as [ TY]；
Is provided with
Figure BDA0002401577660000041
Is provided with
Figure BDA0002401577660000051
Wherein, a, b, c, d, f, g, x22、y22Is 8 error terms that need to be calibrated, and x is further analyzed22、y22It is not necessary to separately calculate the product x of the two22y22That is, there are 7 error terms that need to be calibrated;
a pass-through calibration is first performed. Let the distance between the left reference surface and the right reference surface be l0When the direct calibration is performed, the measured value T can be obtainedm：
Figure BDA0002401577660000052
Where T is a T matrix of the portion between the left and right reference surfaces, TmFor the measured value of the direct calibration, γ is the propagation constant;
γ＝βi (4)
wherein β is a phase constant, i is an imaginary unit;
Figure BDA0002401577660000053
wherein λ is the medium wavelength;
a first short calibration is performed. Selecting a short circuit sheet as a short circuit calibration piece, and putting a thickness d into clamps at two ends of a vector network analyzer1The distance from the left reference surface to the left side of the shorting strip is l1The distance from the right reference surface to the right side of the short-circuit piece is l2Satisfy l1+l2+d1＝l0Performing a first short circuit calibration to obtain a measurement value M1、 M2：
Figure BDA0002401577660000054
Figure BDA0002401577660000055
Wherein Γ is the reflection coefficient of the shorting plate, i.e., -1, M1、M2A measurement value calibrated for a first short circuit;
and finally, carrying out second short circuit calibration. There are two methods:
another short-circuit piece with different thickness is placed at the same position during the first short-circuit calibration; but it is necessary to ensure that the difference in thickness between the two shorting bars is
Figure 3
Wavelength, i.e. when the thickness of the second shorting plate is d2When it is necessary to ensure
Figure BDA0002401577660000057
The same short-circuit piece is placed at different positions; but it is necessary to ensure that the two positions differ by a distance of
Figure 4
A wavelength;
here, the second method is chosen, that is, the same shorting strip is used to change the placement position of the shorting strip: at this time, the distance from the left side of the shorting strip to the left reference surface is l3The distance from the right side of the short-circuit piece to the right reference surface is l4And satisfy
Figure BDA0002401577660000062
Performing a second short circuit calibration to obtain a measured value M3、M4：
Figure BDA0002401577660000063
Figure BDA0002401577660000064
Wherein M is3、M4A measurement value calibrated for a second short circuit;
the combined type (3), (6) and (8) can obtain:
D1cf+E1c+F1f+G1＝0 (10)
wherein the content of the first and second substances,
Figure BDA0002401577660000065
Figure BDA0002401577660000066
Figure BDA0002401577660000067
Figure BDA0002401577660000068
Figure BDA0002401577660000069
the united type (3), (7) and (9) can obtain:
D2cf+E2c+F2f+G2＝0 (16)
wherein the content of the first and second substances,
Figure BDA00024015776600000610
Figure BDA00024015776600000611
Figure BDA00024015776600000612
Figure BDA00024015776600000613
Figure BDA00024015776600000614
comparing the formulas (10) and (16), finding that the two-dimensional quadratic equation of c and f can obtain the values of c and f by simultaneous two formulas,
Figure BDA0002401577660000071
Figure BDA0002401577660000076
where c is a value whose absolute value is closer to 0.
Since other unknowns can be represented by c and f, the other 5 error terms can be obtained by equations (22) and (23), and the calibration is completed.
Example 1:
as shown in fig. 1, the schematic diagram of the free space method testing device is shown, a vector network analyzer 1, a horn antenna 2 and a dielectric lens 3 are used for measuring a to-be-tested object, and the whole device includes the vector network analyzer 1, two identical horn antennas 2, two identical dielectric lenses 3, a support 4, and the support 4 is used for fixing the to-be-tested object. Now, the whole device needs to be calibrated, because the horn antenna 2 is large and not easy to move, the TSS calibration method studied by the invention is used for calibration. Selecting two medium lenses 3 from the middle position as a reference surface 5, wherein the left reference surface and the right reference surface are the same reference surface, and l00. A through calibration can be done by taking measurements according to the position shown in fig. 1.
As shown in FIG. 2, a thickness d is placed between two dielectric lenses 3 at a position spaced apart from the middle position, i.e., the reference plane 51The thin shorting strip 6, a first short calibration measurement is made, at this point,
Figure BDA0002401577660000072
as shown in fig. 3, the removed thickness is d1A thin short-circuit plate 6 of thickness d is placed at the same position2The thickness difference between the thin short-circuit piece 6 and the thick short-circuit piece 7 of (2) is required to be
Figure 5
Wavelength, i.e.
Figure BDA0002401577660000074
A second short circuit calibration measurement is completed and, at this point,
Figure BDA0002401577660000075
after the three times of calibration measurement are completed, all parts including the vector network analyzer 1, the horn antenna 2, the dielectric lens 3 and the joint of the two parts can be calibrated by using the measured values and the formula (1) -the formula (23); in the whole calibration process, the horn antenna and the dielectric lens are not moved, and only the short circuit pieces with different thicknesses are required to be placed on the reference surface 5, so that the operation is simple and convenient.
Example 2:
as shown in fig. 4, the waveguide method test apparatus includes a vector network analyzer 1, two identical coaxial waveguide converters 8, two identical rectangular straight waveguides 11, four identical flanges 9, and a plurality of screws 10, wherein each rectangular straight waveguide 11 is fixed by the flange 9, the rectangular straight waveguides 11 and the coaxial waveguide converters 8 are fixedly connected by the screws 10, and devices are connected as shown in fig. 4. Placing the straight-through calibration piece between clamps at two ends of the vector network analyzer to carry out straight-through calibration; the straight-through alignment member being of length l5Is a rectangular straight waveguide 13 and is composed of two waveguides with width of l6The choke flange 12 is fixed, and the straight-through calibration piece can not be connected with a clamp due to the existence of the choke flange 12, and air gaps are reserved on the left side and the right side of the straight-through calibration piece. Because the air cavity also needs calibration, a left reference surface 14 is chosen near the left air cavity position and a right reference surface 15 is chosen on the right side symmetrically between the left air cavity and the center of the rectangular straight waveguide 13.
As shown in fig. 5, a first short circuit calibration piece is placed in the clamps at the two ends of the vector network analyzer for first short circuit calibration; the first short circuit calibration piece is composed of a length l7A rectangular straight waveguide 16 of length l8A rectangular straight waveguide 17 having a thickness d1A thin shorting strip 6, two flanges 9, two widths l6Choke flange 12, several screws 10. Since the wave propagates in the rectangular straight waveguide in the present embodiment, the required length l is7A rectangular straight waveguide 16 and a length l8The length difference of the rectangular straight waveguide 17 is about
Figure BDA0002401577660000081
A wave guide wavelength of and satisfies l7+l8+d1＝l5The rectangular straight waveguide 16 is fixed by one flange 9 and one choke flange 12, the rectangular straight waveguide 17 is fixed by the other flange 9 and the other choke flange 12 in the same way, and the devices are connected according to the connection mode shown in fig. 5, so that the first short circuit calibration is completed.
As shown in fig. 6, a second short circuit calibration piece is placed in the clamps at the two ends of the vector network analyzer for second short circuit calibration; and taking out the first short circuit calibration piece, and turning over to obtain a second short circuit calibration piece.
Assuming that the length of the wide side of the inner wall of the rectangular straight wave guide port is a, since the wave propagates in the rectangular straight wave guide in this embodiment, λ in the formula (5) should be the waveguide wavelength λgFrom equation (5), we can obtain:
Figure BDA0002401577660000091
Figure BDA0002401577660000092
wherein λ is still the medium wavelength;
after the three times of calibration measurement are completed, all parts including the vector network analyzer 1, the rectangular straight waveguide 11, the coaxial waveguide converter 8, the flange 9 and the air gap can be calibrated by using the measured values and the formula (1) -the formula (25); in the whole calibration process, the clamps at the two ends of the vector network analyzer are always fixed and do not need to be moved.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made in the above embodiments by those of ordinary skill in the art without departing from the principle and spirit of the present invention.

Claims (1)

1. A direct connection-short circuit calibration method of a vector network analyzer is characterized by comprising the following specific steps:
the method comprises the following steps: straight-through calibration;
connecting components of the tested device and two ends of the vector network analyzer as clamps at two sides of the vector network analyzer, and selecting a position between the central position of the tested device and the left clamp of the vector network analyzer as a left reference surface; correspondingly, another reference surface is taken from the corresponding position on the right side of the central position of the tested device and is used as a right reference surface;
let the distance between the left reference surface and the right reference surface be l0Carrying out direct connection calibration, and obtaining a measured value T of the direct connection calibration by measuring with a vector network analyzerm；
Step two: calibrating short circuit for the first time;
selecting a thickness d1The first short-circuit piece is used as a short-circuit calibration piece and placed in clamps at two ends of a vector network analyzer, and the distance from a left reference surface to the left side of the first short-circuit piece is l1The distance from the right reference surface to the right side of the first short circuit sheet is l2Satisfy l1+l2+d1＝l0Performing a first short circuit calibration, and obtaining a measurement value M of the first short circuit calibration by the measurement of the vector network analyzer1、M2；
Step three: calibrating the short circuit for the second time;
selecting a thickness d2The second short-circuit piece is used as a short-circuit calibration piece and is placed at the same position as the first short-circuit piece during the first short-circuit calibration; the thickness difference between the first short circuit sheet and the second short circuit sheet is
Figure FDA0002401577650000011
Wavelength, i.e. guaranteed | d1-d2|＝
Figure FDA0002401577650000012
Wherein λ is the medium wavelength;
or with a thickness d1The first short-circuit piece is used as a short-circuit calibration piece, and the position of the first short-circuit piece is adjusted to ensure that the distance difference of the first short-circuit piece at the positions of the first short-circuit calibration and the second short-circuit calibration is as follows
Figure FDA0002401577650000013
A wavelength;
selecting the second method to adopt the first short circuit sheet same as the second method, wherein the distance from the left side of the first short circuit sheet to the left reference surface is l3The distance from the right side of the first short-circuit piece to the right reference surface is l4And satisfy
Figure FDA0002401577650000014
Figure FDA0002401577650000015
Performing second short circuit calibration, and measuring with vector network analyzer to obtain measurement value M3、M4：
Step four: completing calibration;
the measured value T obtained by the first step, the second step and the third stepm、M1、M2、M3、M48 errors a, b, c, d, f, g, x for vector network analyzer22、y22And respectively calculating to finish calibration, wherein the formula is as follows:
Figure FDA0002401577650000021
Figure FDA0002401577650000022
Figure FDA0002401577650000023
Figure FDA0002401577650000024
Figure FDA0002401577650000025
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WO2007147511A2 (en) * 2006-06-21 2007-12-27 Rohde & Schwarz Gmbh & Co. Kg Method and device for calibrating a network analyzer used for measurements on differential terminals
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023019935A1 (en) * 2021-08-16 2023-02-23 中国电子科技集团公司第十三研究所 Crosstalk error correction method for on-chip s parameter measurement system and electronic device

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Application publication date: 20200609