CN111208408A - Integrated circuit test feedback system based on cloud server - Google Patents

Integrated circuit test feedback system based on cloud server Download PDF

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Publication number
CN111208408A
CN111208408A CN201811394226.9A CN201811394226A CN111208408A CN 111208408 A CN111208408 A CN 111208408A CN 201811394226 A CN201811394226 A CN 201811394226A CN 111208408 A CN111208408 A CN 111208408A
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China
Prior art keywords
test
unit
cloud server
integrated circuit
manual operation
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Pending
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CN201811394226.9A
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Chinese (zh)
Inventor
杨晶晶
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Shanghai Chunshang Electronic Technology Co Ltd
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Shanghai Chunshang Electronic Technology Co Ltd
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Priority to CN201811394226.9A priority Critical patent/CN111208408A/en
Publication of CN111208408A publication Critical patent/CN111208408A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)

Abstract

The invention discloses an integrated circuit test feedback system based on a cloud server in the technical field of integrated circuit test, which comprises the cloud server, a test unit and a manual operation platform, wherein the cloud server is connected with the test unit; the number of the test units is at least one, and the test units are used for outputting test data to be detected; the testing unit is connected with the testing unit and used for detecting the testing data in the testing unit, the cloud server can send instructions to the testing unit at regular time by utilizing the connection established between the cloud server and the testing unit and acts on different testing units to achieve the regular detection work on the testing unit, and the result detected by the testing unit is fed back to the alarm system again to give out a warning through the alarm system, so that a worker can conveniently realize the manual repair work through the manual operation platform.

Description

Integrated circuit test feedback system based on cloud server
Technical Field
The invention relates to the technical field of integrated circuit testing, in particular to an integrated circuit testing feedback system based on a cloud server.
Background
An integrated circuit is a microelectronic device or component. The transistor, the resistor, the capacitor, the inductor and other elements and wires required in a circuit are interconnected together by adopting a certain process, are manufactured on a small or a plurality of small semiconductor wafers or medium substrates, and are then packaged in a tube shell to form a micro structure with the required circuit function; all the elements are structurally integrated, so that the electronic elements are greatly miniaturized, low in power consumption, intelligent and high in reliability. The existing integrated circuit is in the process of detection, and the detection work can be carried out on the integrated circuit only after the fault happens in a single direction through a detection instrument, so that the integrated circuit cannot be detected at regular time when in use, and when the fault occurs in a part of the position of the integrated circuit, the integrated circuit cannot be conveniently known and repaired, and the unit is easy to have the fault which is difficult to repair when in use.
Based on the above, the invention designs an integrated circuit test feedback system based on a cloud server to solve the above problems.
Disclosure of Invention
The invention aims to provide an integrated circuit test feedback system based on a cloud server, which aims to solve the problems that in the detection process of the conventional integrated circuit in the background art, the integrated circuit can only be detected after a fault occurs in a single direction through a detection instrument, so that the integrated circuit cannot be detected at regular time when in use, and when part of the integrated circuit has a fault, the integrated circuit cannot be known and repaired conveniently, so that the fault which is difficult to repair is easy to occur when a unit is used.
In order to achieve the purpose, the invention provides the following technical scheme: a cloud server-based integrated circuit test feedback system comprises a cloud server, a test unit and a manual operation platform; the number of the test units is at least one, and the test units are used for outputting test data to be detected; the test unit is connected with the test unit and is used for detecting the test data in the test unit; the cloud server is used for feeding back data of the test unit; the manual operation platform is used for controlling the cloud server.
Preferably, the test unit comprises a processor, and the processor is connected with a signal receiving unit; the cloud server comprises a test probe which is connected with a signal to send and receive the analog signal of the signal receiving unit.
Preferably, the cloud server further comprises an alarm system, the cloud server is connected with the alarm system through a signal feedback unit, and the alarm system is used for feeding back the detection signal sent by the test unit in time.
Preferably, the terminal of the alarm system is connected with the manual operation platform through an analog/digital (A/D) conversion unit, and the manual operation platform is provided with an alarm operation module corresponding to the alarm system.
Preferably, the manual operation platform comprises a probe action time interval setting and an alarm content setting, the manual operation platform controls the alarm system through the alarm content setting, and the manual operation platform controls the test probe through the probe action time interval setting.
Preferably, the test unit is connected to the test unit through a data integration and analysis unit, and the data integration and analysis unit is configured to integrate test data of a plurality of test units.
Compared with the prior art, the invention has the beneficial effects that: according to the invention, by utilizing the connection established between the cloud server and the test unit, the cloud server can send instructions to the test unit at regular time and act on different test units, so that the regular detection work of the test units is achieved, and the result detected by the test unit is fed back again to act on the alarm system, and the alarm system gives out an alarm, so that the manual repair work of workers through the manual operation platform is conveniently realized.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a block diagram of a structural system of the present invention;
FIG. 2 is a block diagram of a manually operated platform control system according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-2, the present invention provides a technical solution: a cloud server-based integrated circuit test feedback system comprises a cloud server, a test unit and a manual operation platform; the number of the test units is at least one, and the test units are used for outputting test data to be detected; the test unit is connected with the test unit and is used for detecting the test data in the test unit; the cloud server is used for feeding back data of the test unit; the manual operation platform is used for controlling the cloud server.
It should be noted that, when the detection is performed, the cloud server can be controlled through the manual operation platform, and then the signal sent by the signal connection test unit through the cloud server is used for multiple groups of test units, and the test data in the test units are fed back through the detection test units.
In a further embodiment, the test unit includes a processor, and the processor is connected with a signal receiving unit; the cloud server comprises a test probe which is connected with a signal to send and receive an analog signal of the signal receiving unit;
the testing unit is controlled by the processor to detect the testing unit, and after the testing unit receives testing data from the testing unit, the integrated data can be transmitted to the cloud server again through the testing probe.
In a further embodiment, the cloud server further comprises an alarm system, the cloud server is connected with the alarm system through a signal feedback unit, and the alarm system is used for feeding back the detection signal sent by the test unit in time;
after the cloud server detects the test data, the test data can directly act on the signal feedback unit, and when the test data is detected to have a problem, the test data can act on the alarm system through the signal feedback unit, and the alarm system informs workers of the problem.
In a further embodiment, the terminal of the alarm system is connected with the manual operation platform through an analog/digital (A/D) conversion unit, and the manual operation platform is provided with an alarm operation module corresponding to the alarm system;
after the test data with problems are found, the alarm system gives an alarm, the alarm system converts the signals into digital signals through the A/D analog signal conversion unit and puts the digital signals on the manual operation platform, and then the manual operation platform is operated to solve the problems of the test data in a manual mode.
In a further embodiment, the manual operation platform comprises a probe action time interval setting and an alarm content setting, the manual operation platform controls the alarm system through the alarm content setting, and the manual operation platform controls the test probe through the probe action time interval setting;
before testing, the manual operation platform is required to be utilized to reasonably regulate and control the action time interval of the probe, problematic test data are fed back in time through intermittent detection, and alarm content needing alarming is compiled into the cloud server through the manual operation platform in the testing process, so that the test data with problems can be reflected quickly, and the alarm content can be problematic test positions, test conditions, test data types and the like.
In a further embodiment, the test unit is connected to the test unit through a data integration and analysis unit, and the data integration and analysis unit is used for integrating a plurality of test data sets of the test unit;
in order to facilitate the realization of the common test work of a plurality of groups of test units, the test data on each group of test units can be integrated in a data integration and analysis mode, the integrated test data are uniformly fed back to the test unit, the integrated test data are fed back to the cloud server again through the test unit, and the corresponding test units are found out through the manual operation platform.
In the description herein, references to the description of "one embodiment," "an example," "a specific example" or the like are intended to mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The preferred embodiments of the invention disclosed above are intended to be illustrative only. The preferred embodiments are not intended to be exhaustive or to limit the invention to the precise embodiments disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best utilize the invention. The invention is limited only by the claims and their full scope and equivalents.

Claims (6)

1. The utility model provides an integrated circuit test feedback system based on high in clouds server which characterized in that: the system comprises a cloud server, a test unit and a manual operation platform;
the number of the test units is at least one, and the test units are used for outputting test data to be detected;
the test unit is connected with the test unit and is used for detecting the test data in the test unit;
the cloud server is used for feeding back data of the test unit;
the manual operation platform is used for controlling the cloud server.
2. The cloud server-based integrated circuit test feedback system of claim 1, wherein: the test unit comprises a processor, and the processor is connected with a signal receiving unit; the cloud server comprises a test probe which is connected with a signal to send and receive the analog signal of the signal receiving unit.
3. The cloud server-based integrated circuit test feedback system of claim 1, wherein: the cloud server further comprises an alarm system, the cloud server is connected with the alarm system through a signal feedback unit, and the alarm system is used for feeding back detection signals sent by the test unit in time.
4. The cloud server-based integrated circuit test feedback system of claim 3, wherein: and the terminal of the alarm system is connected with the manual operation platform through an analog/digital (A/D) conversion unit, and the manual operation platform is provided with an alarm operation module corresponding to the alarm system.
5. The cloud server-based integrated circuit test feedback system of claim 4, wherein: the manual operation platform comprises a probe action time interval setting unit and an alarm content setting unit, the manual operation platform controls the alarm system through the alarm content setting unit, and the manual operation platform controls the test probes through the probe action time interval setting unit.
6. The cloud server-based integrated circuit test feedback system of claim 1, wherein: the test unit is connected with the test unit through a data integration and analysis unit, and the data integration and analysis unit is used for integrating a plurality of groups of test data of the test unit.
CN201811394226.9A 2018-11-21 2018-11-21 Integrated circuit test feedback system based on cloud server Pending CN111208408A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811394226.9A CN111208408A (en) 2018-11-21 2018-11-21 Integrated circuit test feedback system based on cloud server

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1588857A (en) * 2004-09-28 2005-03-02 中国电子产品可靠性与环境试验研究所 Integrated circuit remote detecting system and its detecting method
CN102890752A (en) * 2012-10-08 2013-01-23 盛煜光 Telemedicine service system based on cloud technology
CN103123159A (en) * 2013-01-24 2013-05-29 广东志高空调有限公司 Air conditioner sleeping function control method based on cloud computing technology
US20130345855A1 (en) * 2012-06-25 2013-12-26 Delta Electronics, Inc. Plastic product manufacturing method and all-electric injection-molding machine
CN104734363A (en) * 2015-04-14 2015-06-24 合肥工业大学 Internet of things based high- and low-voltage switchgear system
US20150253379A1 (en) * 2014-03-05 2015-09-10 Unigen Corporation System and method for cloud testing and remote monitoring of integrated circuit devices
CN106210013A (en) * 2016-07-04 2016-12-07 上海华岭集成电路技术股份有限公司 A kind of integrated circuit testing information integration based on high in the clouds analyzes system and method

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1588857A (en) * 2004-09-28 2005-03-02 中国电子产品可靠性与环境试验研究所 Integrated circuit remote detecting system and its detecting method
US20130345855A1 (en) * 2012-06-25 2013-12-26 Delta Electronics, Inc. Plastic product manufacturing method and all-electric injection-molding machine
CN102890752A (en) * 2012-10-08 2013-01-23 盛煜光 Telemedicine service system based on cloud technology
CN103123159A (en) * 2013-01-24 2013-05-29 广东志高空调有限公司 Air conditioner sleeping function control method based on cloud computing technology
US20150253379A1 (en) * 2014-03-05 2015-09-10 Unigen Corporation System and method for cloud testing and remote monitoring of integrated circuit devices
CN104734363A (en) * 2015-04-14 2015-06-24 合肥工业大学 Internet of things based high- and low-voltage switchgear system
CN106210013A (en) * 2016-07-04 2016-12-07 上海华岭集成电路技术股份有限公司 A kind of integrated circuit testing information integration based on high in the clouds analyzes system and method

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