CN111157807A - Phase difference type high-voltage switch cabinet secondary nuclear phase tester - Google Patents
Phase difference type high-voltage switch cabinet secondary nuclear phase tester Download PDFInfo
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- CN111157807A CN111157807A CN202010012154.8A CN202010012154A CN111157807A CN 111157807 A CN111157807 A CN 111157807A CN 202010012154 A CN202010012154 A CN 202010012154A CN 111157807 A CN111157807 A CN 111157807A
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- crossing comparator
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/18—Indicating phase sequence; Indicating synchronism
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/145—Indicating the presence of current or voltage
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
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- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention discloses a phase difference type high-voltage switch cabinet secondary nuclear phase tester which comprises a microprocessor, a signal wiring, a zero-crossing comparator, a non-gate circuit, an AND gate circuit, a public ground wiring, a working state indicating circuit and a power supply unit, wherein the signal wiring comprises a first signal wiring and a second signal wiring, and the zero-crossing comparator comprises a first zero-crossing comparator and a second zero-crossing comparator; the signal transforms and processes the sine wave into square wave through a zero comparison circuit, then two paths of rectangular wave signals are input into corresponding detection circuits to obtain phase difference pulse signals, the phase difference can be obtained by measuring the duty ratio of the pulse signals, and the detection of the duty ratio only needs to measure the high level width of the rectangular wave; the phase sequence relation between the corresponding phases of the two switch cabinets is judged by using a phase difference method, so that the nuclear phase test is more accurate; has certain universality; has the function of electroscopy.
Description
Technical Field
The invention relates to a secondary nuclear phase tester for a high-voltage switch cabinet, in particular to a phase difference type secondary nuclear phase tester for the high-voltage switch cabinet.
Background
Before the high-voltage switch equipment is subjected to power failure maintenance or new equipment is put into operation, whether the phase sequence is correct or not needs to be checked, and the switch-on operation can be carried out only if the phase sequence completely meets the requirements correctly. The phase sequence is checked by adopting a voltage difference method during the existing nuclear phase test, the voltage difference is considered to be zero, namely, the phase is in the same phase, the indicator lamp is not turned on due to the absence of the voltage difference, the phase is out of phase when the voltage difference is large, the indicator lamp is turned on due to the existence of a certain voltage difference, the principle that the nuclear phase hole on the electrified display acquires the voltage signal is that the voltage signal is acquired by utilizing the capacitance voltage division principle, but the nuclear phase device inevitably requires that the capacitance voltage division parameters of the two switch cabinets are completely consistent, but the complete consistency is difficult to realize in the actual production process, and the main problem brought by the method is that the nuclear phase. Therefore, a phase difference type high-voltage switch cabinet secondary nuclear phase tester becomes a problem to be solved urgently.
Disclosure of Invention
The invention aims to solve the technical problems that in the prior art, the two switch cabinets are required to have completely consistent capacitance voltage division parameters, but the complete consistency is difficult to achieve in the actual production process and the like.
In order to solve the technical problems, the technical scheme provided by the invention is as follows: the utility model provides a phase difference formula high tension switchgear secondary nuclear phase tester, includes microprocessor, signal connection, crosses zero comparator, not gate circuit, AND gate circuit, wiring, operating condition indicating circuit and electrical unit publicly, its characterized in that: the signal wiring comprises a first signal wiring and a second signal wiring, and the zero-crossing comparator comprises a first zero-crossing comparator and a second zero-crossing comparator;
one end of the first signal connection wire is connected with the high-voltage switch cabinet, the other end of the first signal connection wire is connected with the in-phase input end of the first zero-crossing comparator, the inverted end of the first zero-crossing comparator is connected with a power ground, the output end of the first zero-crossing comparator is connected with the input end of the NOT-gate circuit, one path of the output end of the NOT-gate circuit is connected with the input end of the AND-gate circuit, and the other path of the output end of the NOT-gate circuit;
one end of the second signal wire is connected with the other high-voltage switch cabinet, the other end of the second signal wire is connected with the homodromous input end of the second zero-crossing comparator, the inverting end of the second zero-crossing comparator is connected with a power ground, one path of the output end of the second zero-crossing comparator is connected with the input end of the AND circuit, the other path of the output end of the second zero-crossing comparator is connected with the input end I/O port of the microprocessor, and the output end of the AND circuit is connected with the input end I/O port of the microprocessor;
one end of the common ground connection wire is connected with the ground, and the other end of the common ground connection wire is connected with the ground end of the microprocessor; the output end of the power supply unit is connected with a power supply end corresponding to the microprocessor, and an I/O port of the output end of the microprocessor is connected with the input end of the working state indicating circuit;
the signal is converted into square wave by a zero comparison circuit, then two paths of rectangular wave signals are input into corresponding detection circuits to obtain phase difference pulse signals, the phase difference can be obtained by measuring the duty ratio of the pulse signals, and the duty ratio can be detected only by measuring the high level width of the rectangular wave.
Further, the first zero-crossing comparator and the second zero-crossing comparator both adopt an LM393 comparator.
Further, the not gate circuit adopts a 74LS04 chip.
Further, the AND gate circuit adopts a 7408TTL chip.
Furthermore, the common ground connection wire adopts a 3-5 m black strand rubber single-core wire, one end of the common ground connection wire is a lantern plug, and the other end of the common ground connection wire is an alligator clip.
Furthermore, the first signal wiring and the second signal wiring are both 3-5 m red strand rubber single-core wires, and both ends of the first signal wiring and the second signal wiring are lantern plugs.
Further, the microprocessor employs an STM32 microprocessor chip.
Further, the power supply unit adopts a 3.6V rechargeable lithium battery.
Further, the working state indicating circuit comprises a first nuclear phase electrified indicating lamp, a second nuclear phase electrified indicating lamp, an in-phase indicating lamp, an out-phase indicating lamp and a power supply electrified indicating lamp, wherein the first nuclear phase electrified indicating lamp, the second nuclear phase electrified indicating lamp, the in-phase indicating lamp, the out-phase indicating lamp and the power supply electrified indicating lamp are all light emitting diodes.
Compared with the prior art, the invention has the advantages that: according to the invention, a sine wave signal is converted into a square wave signal by using the waveform conversion circuit, and the phase sequence relation between corresponding phases of two switch cabinets is judged by using a phase difference method, so that a phase checking test is more accurate; the phase difference type high-voltage switch cabinet secondary phase-checking tester can perform phase-checking tests on high-voltage switch cabinets of the same voltage level and can also perform phase-checking tests on high-voltage switch cabinets of different levels, and has certain universality; the phase difference type high-voltage switch cabinet secondary nuclear phase tester judges whether the square wave is electrified or not according to the existence of the square wave waveform, the square wave is generated by electrification, no square wave signal is output when the square wave is not electrified, and the phase difference type high-voltage switch cabinet secondary nuclear phase tester has an electricity testing function; the invention has reasonable design and is worth popularizing.
Drawings
FIG. 1 is a schematic block diagram of a phase difference type high voltage switch cabinet secondary nuclear phase tester;
FIG. 2 is a schematic diagram of a zero crossing method;
FIG. 3 is a schematic diagram of a waveform transformation method;
FIG. 4 is a schematic diagram of the acquisition of the voltage phase difference of the high voltage line;
FIG. 5 is a circuit diagram of gate phase detection;
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
The present invention will be described in detail with reference to the accompanying fig. 1 to 5.
The invention provides a phase difference type high-voltage switch cabinet secondary nuclear phase tester in specific implementation, which comprises a microprocessor, a signal wiring, a zero-crossing comparator, a non-gate circuit, an AND-gate circuit, a public ground wiring, a working state indicating circuit and a power supply unit, wherein the signal wiring comprises a first signal wiring and a second signal wiring, and the zero-crossing comparator comprises a first zero-crossing comparator and a second zero-crossing comparator;
one end of the first signal connection wire is connected with the high-voltage switch cabinet, the other end of the first signal connection wire is connected with the in-phase input end of the first zero-crossing comparator, the inverted end of the first zero-crossing comparator is connected with a power ground, the output end of the first zero-crossing comparator is connected with the input end of the NOT-gate circuit, one path of the output end of the NOT-gate circuit is connected with the input end of the AND-gate circuit, and the other path of the output end of the NOT-gate circuit;
one end of the second signal wire is connected with the other high-voltage switch cabinet, the other end of the second signal wire is connected with the homodromous input end of the second zero-crossing comparator, the inverting end of the second zero-crossing comparator is connected with a power ground, one path of the output end of the second zero-crossing comparator is connected with the input end of the AND circuit, the other path of the output end of the second zero-crossing comparator is connected with the input end I/O port of the microprocessor, and the output end of the AND circuit is connected with the input end I/O port of the microprocessor;
one end of the common ground connection wire is connected with the ground, and the other end of the common ground connection wire is connected with the ground end of the microprocessor; the output end of the power supply unit is connected with a power supply end corresponding to the microprocessor, and an I/O port of the output end of the microprocessor is connected with the input end of the working state indicating circuit;
the signal passes through a zero circuit to convert a sine wave into a square wave, then two paths of rectangular wave signals are input into corresponding detection circuits to obtain a phase difference pulse signal, the phase difference can be obtained by measuring the duty ratio of the pulse signal, and the duty ratio can be detected only by measuring the high level width of the rectangular wave.
The invention relates to a specific working principle of a phase difference type high-voltage switch cabinet secondary nuclear phase tester and an implementation process thereof, wherein the working principle comprises the following steps:
basic principle of zero-crossing method: by calculating the zero-crossing time difference of two or more same-frequency signals and converting the time difference into a phase difference, as shown in fig. 2, the time interval τ between the zero-crossing time T1 and T2 of the two signals is judged, the time difference is converted into the phase difference, the signal acquisition period is τ, n is the number of sampling points between the zero-crossing time T1 and T2 of the two signals, the signal period is T, and the calculation formula of the phase difference is as follows: p is 2 n tau/T;
the waveform transformation method considers the distortion of the power grid voltage due to the nonlinear factor, the signal needs to be filtered so that the sampling signal is close to a sine wave, then the signal is transformed into a rectangular wave through a zero-crossing comparator, if the two rectangular waves are subjected to XOR processing, the pulse width is output to correspond to the phase difference, and as shown in FIG. 3, the corresponding phase difference can be obtained by measuring the pulse width;
the principle of collecting voltage phase difference is as follows: when the high-voltage switch cabinet is in phase checking, two electrodes are respectively contacted with the output end of a capacitance sensor of a tested high-voltage line circuit, a voltage signal with phase relation frequency as power frequency is arranged at the output end of the capacitance sensor, a voltage waveform signal with the phase relation is taken out through an amplitude limiting circuit and sent to a zero-crossing comparator for shaping, and meanwhile, the voltage waveform signal is sent to the zero-crossing comparator circuit to obtain the phase difference phi of two measured lines, namely a pulse signal, as shown in fig. 4: if the two signals are in the same phase, namely the phase difference is within the range of +/-12 degrees, the voltage obtained by the integrating circuit is correspondingly lower, and the zero-crossing comparator outputs low level; if the two signals are out of phase, namely the phase difference is within the range of +/-30 degrees, the obtained voltage is correspondingly higher, and the zero-crossing comparator outputs high level;
as shown in fig. 5, the signal 1 and the signal 2 are two same-frequency signals with a phase difference of Φ, and a phase difference signal can be obtained by inverting a certain signal and performing and operation with the other signal.
According to the invention, a sine wave signal is converted into a square wave signal by using the waveform conversion circuit, and the phase sequence relation between corresponding phases of two switch cabinets is judged by using a phase difference method, so that a phase checking test is more accurate; the phase difference type high-voltage switch cabinet secondary phase-checking tester can perform phase-checking tests on high-voltage switch cabinets of the same voltage level and can also perform phase-checking tests on high-voltage switch cabinets of different levels, and has certain universality; the phase difference type high-voltage switch cabinet secondary nuclear phase tester judges whether the square wave is electrified or not according to the existence of the square wave waveform, the square wave is generated by electrification, no square wave signal is output when the square wave is not electrified, and the phase difference type high-voltage switch cabinet secondary nuclear phase tester has an electricity testing function; the invention has reasonable design and is worth popularizing.
The present invention and its embodiments have been described above, but the description is not limitative, and the actual structure is not limited thereto. In summary, those skilled in the art should appreciate that they can readily use the disclosed conception and specific embodiments as a basis for designing or modifying other structures for carrying out the same purposes of the present invention without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (9)
1. The utility model provides a phase difference formula high tension switchgear secondary nuclear phase tester, includes microprocessor, signal connection, crosses zero comparator, not gate circuit, AND gate circuit, wiring, operating condition indicating circuit and electrical unit publicly, its characterized in that: the signal wiring comprises a first signal wiring and a second signal wiring, and the zero-crossing comparator comprises a first zero-crossing comparator and a second zero-crossing comparator;
one end of the first signal connection wire is connected with the high-voltage switch cabinet, the other end of the first signal connection wire is connected with the in-phase input end of the first zero-crossing comparator, the inverted end of the first zero-crossing comparator is connected with a power ground, the output end of the first zero-crossing comparator is connected with the input end of the NOT-gate circuit, one path of the output end of the NOT-gate circuit is connected with the input end of the AND-gate circuit, and the other path of the output end of the NOT-gate circuit;
one end of the second signal wire is connected with the other high-voltage switch cabinet, the other end of the second signal wire is connected with the homodromous input end of the second zero-crossing comparator, the inverting end of the second zero-crossing comparator is connected with a power ground, one path of the output end of the second zero-crossing comparator is connected with the input end of the AND circuit, the other path of the output end of the second zero-crossing comparator is connected with the input end I/O port of the microprocessor, and the output end of the AND circuit is connected with the input end I/O port of the microprocessor;
one end of the common ground connection wire is connected with the ground, and the other end of the common ground connection wire is connected with the ground end of the microprocessor; the output end of the power supply unit is connected with a power supply end corresponding to the microprocessor, and an I/O port of the output end of the microprocessor is connected with the input end of the working state indicating circuit;
the signal passes through a zero circuit to convert a sine wave into a square wave, then two paths of rectangular wave signals are input into corresponding detection circuits to obtain a phase difference pulse signal, the phase difference can be obtained by measuring the duty ratio of the pulse signal, and the duty ratio can be detected only by measuring the high level width of the rectangular wave.
2. The phase difference type high-voltage switch cabinet secondary nuclear phase tester of claim 1, which is characterized in that: the first zero-crossing comparator and the second zero-crossing comparator both adopt LM393 comparators.
3. The phase difference type high-voltage switch cabinet secondary nuclear phase tester of claim 1, which is characterized in that: the NOT gate circuit adopts a 74LS04 chip.
4. The phase difference type high-voltage switch cabinet secondary nuclear phase tester of claim 1, which is characterized in that: the AND gate circuit adopts a 7408TTL chip.
5. The phase difference type high-voltage switch cabinet secondary nuclear phase tester of claim 1, which is characterized in that: the public ground connection wire is a 3-5 m black strand rubber single-core wire, one end of the public ground connection wire is a lantern plug, and the other end of the public ground connection wire is an alligator clip.
6. The phase difference type high-voltage switch cabinet secondary nuclear phase tester of claim 1, which is characterized in that: the first signal wiring and the second signal wiring are both 3-5 m red strand rubber single-core wires, and both ends of the first signal wiring and the second signal wiring are lantern plugs.
7. The phase difference type high-voltage switch cabinet secondary nuclear phase tester of claim 1, which is characterized in that: the microprocessor employs an STM32 microprocessor chip.
8. The phase difference type high-voltage switch cabinet secondary nuclear phase tester of claim 1, which is characterized in that: the power supply unit adopts a 3.6V rechargeable lithium battery.
9. The phase difference type high-voltage switch cabinet secondary nuclear phase tester of claim 1, which is characterized in that: the working state indicating circuit comprises a first nuclear phase electrified indicating lamp, a second nuclear phase electrified indicating lamp, an in-phase indicating lamp, an out-phase indicating lamp and a power supply electrified indicating lamp, wherein the first nuclear phase electrified indicating lamp, the second nuclear phase electrified indicating lamp, the in-phase indicating lamp, the out-phase indicating lamp and the power supply electrified indicating lamp are all light emitting diodes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202010012154.8A CN111157807A (en) | 2020-01-07 | 2020-01-07 | Phase difference type high-voltage switch cabinet secondary nuclear phase tester |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010012154.8A CN111157807A (en) | 2020-01-07 | 2020-01-07 | Phase difference type high-voltage switch cabinet secondary nuclear phase tester |
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| CN111157807A true CN111157807A (en) | 2020-05-15 |
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| CN202010012154.8A Pending CN111157807A (en) | 2020-01-07 | 2020-01-07 | Phase difference type high-voltage switch cabinet secondary nuclear phase tester |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112394225A (en) * | 2020-09-30 | 2021-02-23 | 深圳供电局有限公司 | Phase angle detection device and method |
| CN112946513A (en) * | 2021-02-03 | 2021-06-11 | 山东钢铁股份有限公司 | Phase checking method for power supply of transformer substation |
| WO2021237976A1 (en) * | 2020-05-25 | 2021-12-02 | 威胜信息技术股份有限公司 | Method for automatically adjusting phase sequence of power distribution network, and monitoring unit and monitoring system |
| CN116449122A (en) * | 2023-06-16 | 2023-07-18 | 创辉科技有限公司 | Fault detection circuit of power supply system |
| CN117990982A (en) * | 2024-04-02 | 2024-05-07 | 成都金诺信高科技有限公司 | Same-frequency signal phase measuring circuit, chip and device based on trigger |
-
2020
- 2020-01-07 CN CN202010012154.8A patent/CN111157807A/en active Pending
Non-Patent Citations (1)
| Title |
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| 陈玉辉等: "基于相位差式高压开关柜核相装置的研究与设计", 《华东电力》 * |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021237976A1 (en) * | 2020-05-25 | 2021-12-02 | 威胜信息技术股份有限公司 | Method for automatically adjusting phase sequence of power distribution network, and monitoring unit and monitoring system |
| CN112394225A (en) * | 2020-09-30 | 2021-02-23 | 深圳供电局有限公司 | Phase angle detection device and method |
| CN112394225B (en) * | 2020-09-30 | 2024-01-30 | 深圳供电局有限公司 | Phase angle detection device and method |
| CN112946513A (en) * | 2021-02-03 | 2021-06-11 | 山东钢铁股份有限公司 | Phase checking method for power supply of transformer substation |
| CN116449122A (en) * | 2023-06-16 | 2023-07-18 | 创辉科技有限公司 | Fault detection circuit of power supply system |
| CN116449122B (en) * | 2023-06-16 | 2023-08-18 | 创辉科技有限公司 | Fault detection circuit of power supply system |
| CN117990982A (en) * | 2024-04-02 | 2024-05-07 | 成都金诺信高科技有限公司 | Same-frequency signal phase measuring circuit, chip and device based on trigger |
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Application publication date: 20200515 |