CN111142787A - Storage-layered data exchange testing method, system, terminal and storage medium - Google Patents
Storage-layered data exchange testing method, system, terminal and storage medium Download PDFInfo
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- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
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Abstract
The invention provides a storage-layered data exchange testing method, a system, a terminal and a storage medium, comprising the following steps: creating an advanced disk array in a test storage pool, and occupying all storage resources of the advanced disk array; creating a low-level disk array in a test storage pool, and creating a first storage volume on the low-level disk array; IO reading and writing are carried out on the first storage volume to manufacture hotspot data; and monitoring whether the hot spot data is exchanged from the low-level disk array to the high-level disk array, and judging that the test is passed if the hot spot data is exchanged from the low-level disk array to the high-level disk array. The invention can save test time and human resources, can better simulate cold and hot data exchange scenes, and has high test result accuracy.
Description
Technical Field
The invention relates to the technical field of storage equipment testing, in particular to a storage-layered data exchange testing method, a storage-layered data exchange testing system, a storage-layered data exchange testing terminal and a storage medium.
Background
With the arrival of the big data era, data is rapidly expanding and getting bigger, and a plurality of types of application environments exist, and the storage product automatic layering function can automatically optimize the storage positions of data generated by different application programs, so that the storage achieves the optimal use effect.
The automatic layering function of the storage product is to automatically and intelligently distribute data with different read-write heat degrees in different storage layers; the storage device divides storage into two or more layers according to different types of hard disk read-write speeds in the device, hot data with high read-write access times are migrated to a storage layer with higher read-write speed and higher priority, and cold data with low read-write times are migrated to a storage layer with low read-write speed.
The data exchange (swap) function is that when the upper storage space is full, the upper read-write heat degree reduced data is migrated downwards to exchange data in the process of migrating the hot data to the upper layer; in the scene, the same data is frequently accessed to manufacture hot spot data to fill up the upper storage space, then the hot spot data is not accessed any more, so that the heat degree is reduced, meanwhile, another data is frequently accessed to change the hot spot data into hot data to migrate to the upper layer, and then the data exchange with the cold data on the upper layer is carried out.
Disclosure of Invention
In view of the above-mentioned deficiencies of the prior art, the present invention provides a storage-layered data exchange testing method, system, terminal and storage medium, so as to solve the above-mentioned technical problems.
In a first aspect, the present invention provides a storage-layered data exchange testing method, including:
creating an advanced disk array in a test storage pool, and occupying all storage resources of the advanced disk array;
creating a low-level disk array in a test storage pool, and creating a first storage volume on the low-level disk array;
IO reading and writing are carried out on the first storage volume to manufacture hotspot data;
and monitoring whether the hot spot data is exchanged from the low-level disk array to the high-level disk array, and judging that the test is passed if the hot spot data is exchanged from the low-level disk array to the high-level disk array.
Further, the creating an advanced disk array in the test storage pool and fully occupying storage resources of the advanced disk array includes:
creating a high-level disk array by using an SSD (solid State disk) and adding the high-level disk array to the test storage pool, wherein the automatic layering function of the test storage pool is in an open state;
creating a second storage volume in the storage pool, wherein the size of the second storage volume is the same as that of the high-level disk array space;
writing the second storage volume to full using a data read-write tool;
and acquiring the spare capacity information of the high-level disk array to ensure that the high-level disk array has no spare capacity.
Further, creating a lower level disk array in the test storage pool and creating a first storage volume on the lower level disk array includes:
creating a low-level disk array with a SAS HDD and adding the low-level disk array to the test storage pool;
a first storage volume is created on the low-level disk array and an automatic tiering function of the first storage volume is turned on.
Further, the monitoring whether the hotspot data is exchanged from the low-level disk array to the high-level disk array comprises:
acquiring the hotspot data storage position;
if the storage position of the hotspot data is switched from the low-level disk array to the high-level disk array, reading the storage data of the low-level disk array;
and comparing the storage data with the hot spot data, and if the storage data and the hot spot data are not consistent, judging that the hot spot data is exchanged from the low-level disk array to the high-level disk array.
In a second aspect, the present invention provides a storage-layered data exchange testing system, including:
the high-level storage creating unit is configured to create a high-level disk array in a test storage pool and fully occupy the storage resources of the high-level disk array;
the storage system comprises a low-level storage creating unit, a storage management unit and a storage management unit, wherein the low-level storage creating unit is configured to create a low-level disk array in a test storage pool and create a first storage volume on the low-level disk array;
the hot spot data manufacturing unit is configured to perform IO read-write manufacturing on the first storage volume to manufacture hot spot data;
and the data exchange monitoring unit is configured to monitor whether the hot spot data is exchanged from the low-level disk array to the high-level disk array, and if so, the test is judged to be passed.
Further, the advanced storage creation unit includes:
the high-level storage creating module is used for creating a high-level disk array by utilizing an SSD (solid State disk) and adding the high-level disk array to the test storage pool, and the automatic layering function of the test storage pool is in an open state;
a second storage volume creation module configured to create a second storage volume in the storage pool that is the same size as the senior disk array space;
the storage space writing-full module is configured to write the second storage volume to be full by using a data reading and writing tool;
and the spare capacity checking module is configured to acquire the spare capacity information of the high-level disk array and ensure that the high-level disk array has no spare capacity.
Further, the low-level storage creation unit includes:
a low-level storage creation module configured to create a low-level disk array using a SAS HDD and add the low-level disk array to the test storage pool;
a first storage volume creation module configured to create a first storage volume on the low-level disk array and to enable an automatic tiering function of the first storage volume.
Further, the data exchange monitoring unit includes:
the position acquisition module is configured to acquire the hotspot data storage position;
the data storage module is configured to read the storage data of the low-level disk array if the hotspot data storage position is switched from the low-level disk array to the high-level disk array;
and the data comparison module is configured to compare the storage data with the hotspot data, and if the storage data and the hotspot data are not consistent, the hotspot data is judged to be exchanged from the low-level disk array to the high-level disk array.
In a third aspect, a terminal is provided, including:
a processor, a memory, wherein,
the memory is used for storing a computer program which,
the processor is used for calling and running the computer program from the memory so as to make the terminal execute the method of the terminal.
In a fourth aspect, a computer storage medium is provided having stored therein instructions that, when executed on a computer, cause the computer to perform the method of the above aspects.
The beneficial effect of the invention is that,
according to the method, the system, the terminal and the storage medium for testing the data exchange of the storage hierarchy, provided by the invention, the two layers of storage spaces are created, the high-level storage space is filled, the hot data are manufactured in the low-level storage space through the storage volume, and the automatic test of the function of the data exchange of the storage hierarchy of the storage equipment can be realized by monitoring the change of the storage position of the hot data. Compared with the prior art, the data exchange testing method for the storage hierarchy is simple and easy to implement, saves testing time and human resources, can better simulate cold and hot data exchange scenes, and is high in testing result accuracy.
In addition, the invention has reliable design principle, simple structure and very wide application prospect.
Drawings
In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present invention, the drawings used in the description of the embodiments or prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the invention.
FIG. 2 is a schematic block diagram of a system of one embodiment of the present invention.
Fig. 3 is a schematic structural diagram of a terminal according to an embodiment of the present invention.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The following explains key terms appearing in the present invention.
A Solid State Drive (SSD), commonly called Solid State Disk, is a hard Disk made of an array of Solid State electronic memory chips, and has excellent performance of high-speed reading and writing.
Sas (Serial Attached SCSI), which is a Serial Attached SCSI, is a new generation of SCSI technology, and like the currently popular Serial ATA (SATA) hard disk, Serial technology is used to achieve higher transmission speed, improve internal space by shortening connection lines, and so on. The SAS HDD belongs to a mechanical hard disk, and the read-write speed is lower than that of the SSD.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the invention. The execution subject in fig. 1 may be a storage-layered data exchange test system.
As shown in fig. 1, the method 100 includes:
creating a low-level disk array in a test storage pool, and creating a first storage volume on the low-level disk array;
IO reading and writing are carried out on the first storage volume to manufacture hotspot data;
and monitoring whether the hot spot data is exchanged from the low-level disk array to the high-level disk array, and judging that the test is passed if the hot spot data is exchanged from the low-level disk array to the high-level disk array.
In order to facilitate understanding of the present invention, the storage-layered data exchange testing method provided by the present invention is further described below with reference to the principle of the storage-layered data exchange testing method of the present invention and the process of testing the storage-layered data exchange function in the embodiment.
Example 1
The embodiment provides a storage-layered data exchange testing method, and specifically, the storage-layered data exchange testing method includes the following steps:
and S1, activating the automatic layering function of the storage device. The method comprises the steps of creating a storage pool, starting an automatic layering function of the storage pool, creating a RAID (disk array) by using an SSD (solid State disk) hard disk and adding the RAID into the storage pool, creating a volume with the same size as the space of the RAID by the SSD under the storage pool, starting the automatic layering function of the volume, wherein the storage has only one layer, all the spaces are used by the volume, and writing data into the volume by a data reading and writing tool to fill the volume space.
S2, using SAS HDD to create RAID in the same storage pool, at this time, the storage pool is divided into two layers, respectively: a high-level disk array of a first layer SSD hard disk and a low-level disk array of a second layer SAS HDD. A volume is newly created under the storage pool, the automatic layering function of the volume is started, and the newly created volume is on the second layer. The newly created volume is subjected to IO read-write manufacturing hot spot data, and then the hot data is migrated to the first layer, because the first layer is filled in step S1 and the data stored in the first layer is not accessed for a long time and is changed into cold data, after the hot data is migrated to the first layer, the cold data stored in the first layer is migrated to the second layer, so that a cold-hot data exchange scenario can be simulated. Therefore, after the hot spot data is manufactured in the second layer, the data states of the first layer and the second layer are monitored, if the storage position of the hot spot data is changed into the first layer and the data stored in the second layer is inconsistent with the hot spot data, the first layer and the second layer complete data exchange, and the storage device has a normal storage hierarchical data exchange function.
Example 2
The embodiment provides a storage-layered data exchange testing method, which comprises the following steps:
s1, using SSD hard disk to create high-level disk array in storage pool, using SAS HDD to create low-level disk array in storage pool. And simultaneously, a first storage volume is created on the low-level disk array, and a second storage volume is created on the high-level disk array, wherein the second storage volume and the high-level disk array have the same space size. And starting the automatic layering function of the first storage volume.
And S2, writing data into the second storage volume, checking the spare capacity of the advanced disk array, and stopping data writing operation when the spare capacity is 0. In another mode of the present invention, the higher-level disk array may be filled with data written to the higher-level disk array before the higher-level disk array is added to the storage pool, and then the higher-level disk array is added to the storage pool.
And S3, performing repeated IO read-write operation on the first storage volume for multiple times to manufacture hot spot data. And then monitoring whether the data exchange between the high-level disk array and the low-level disk array occurs, wherein the monitoring method is the same as that of the embodiment 1.
As shown in fig. 2, the system 200 includes:
the advanced storage creating unit 210 is configured to create an advanced disk array in a test storage pool, and fully occupy storage resources of the advanced disk array;
a low-level storage creating unit 220 configured to create a low-level disk array in a test storage pool and create a first storage volume on the low-level disk array;
a hot spot data manufacturing unit 230 configured to perform IO read-write manufacturing of hot spot data on the first storage volume;
and the data exchange monitoring unit 240 is configured to monitor whether hot spot data is exchanged from the low-level disk array to the high-level disk array, and if so, determine that the test is passed.
Optionally, as an embodiment of the present invention, the advanced storage creating unit includes:
the high-level storage creating module is used for creating a high-level disk array by utilizing an SSD (solid State disk) and adding the high-level disk array to the test storage pool, and the automatic layering function of the test storage pool is in an open state;
a second storage volume creation module configured to create a second storage volume in the storage pool that is the same size as the senior disk array space;
the storage space writing-full module is configured to write the second storage volume to be full by using a data reading and writing tool;
and the spare capacity checking module is configured to acquire the spare capacity information of the high-level disk array and ensure that the high-level disk array has no spare capacity.
Optionally, as an embodiment of the present invention, the low-level storage creating unit includes:
a low-level storage creation module configured to create a low-level disk array using a SAS HDD and add the low-level disk array to the test storage pool;
a first storage volume creation module configured to create a first storage volume on the low-level disk array and to enable an automatic tiering function of the first storage volume.
Optionally, as an embodiment of the present invention, the data exchange monitoring unit includes:
the position acquisition module is configured to acquire the hotspot data storage position;
the data storage module is configured to read the storage data of the low-level disk array if the hotspot data storage position is switched from the low-level disk array to the high-level disk array;
and the data comparison module is configured to compare the storage data with the hotspot data, and if the storage data and the hotspot data are not consistent, the hotspot data is judged to be exchanged from the low-level disk array to the high-level disk array.
Fig. 3 is a schematic structural diagram of a terminal system 300 according to an embodiment of the present invention, where the terminal system 300 may be used to execute the storage-layered data exchange testing method according to the embodiment of the present invention.
The terminal system 300 may include: a processor 310, a memory 320, and a communication unit 330. The components communicate via one or more buses, and those skilled in the art will appreciate that the architecture of the servers shown in the figures is not intended to be limiting, and may be a bus architecture, a star architecture, a combination of more or less components than those shown, or a different arrangement of components.
The memory 320 may be used for storing instructions executed by the processor 310, and the memory 320 may be implemented by any type of volatile or non-volatile storage terminal or combination thereof, such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk. The executable instructions in memory 320, when executed by processor 310, enable terminal 300 to perform some or all of the steps in the method embodiments described below.
The processor 310 is a control center of the storage terminal, connects various parts of the entire electronic terminal using various interfaces and lines, and performs various functions of the electronic terminal and/or processes data by operating or executing software programs and/or modules stored in the memory 320 and calling data stored in the memory. The processor may be composed of an Integrated Circuit (IC), for example, a single packaged IC, or a plurality of packaged ICs connected with the same or different functions. For example, the processor 310 may include only a Central Processing Unit (CPU). In the embodiment of the present invention, the CPU may be a single operation core, or may include multiple operation cores.
A communication unit 330, configured to establish a communication channel so that the storage terminal can communicate with other terminals. And receiving user data sent by other terminals or sending the user data to other terminals.
The present invention also provides a computer storage medium, wherein the computer storage medium may store a program, and the program may include some or all of the steps in the embodiments provided by the present invention when executed. The storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM) or a Random Access Memory (RAM).
Therefore, the invention can realize the automatic test of the hierarchical storage data exchange function of the storage equipment by establishing two layers of storage spaces, filling the high-level storage space, manufacturing the hot data in the low-level storage space through the storage volume and monitoring the storage position change of the hot data. Compared with the prior art, the storage-layered data exchange testing method provided by the invention is simple and feasible, saves testing time and human resources, can better simulate cold and hot data exchange scenes, and has high accuracy of testing results.
Those skilled in the art will readily appreciate that the techniques of the embodiments of the present invention may be implemented as software plus a required general purpose hardware platform. Based on such understanding, the technical solutions in the embodiments of the present invention may be embodied in the form of a software product, where the computer software product is stored in a storage medium, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and the like, and the storage medium can store program codes, and includes instructions for enabling a computer terminal (which may be a personal computer, a server, or a second terminal, a network terminal, and the like) to perform all or part of the steps of the method in the embodiments of the present invention.
The same and similar parts in the various embodiments in this specification may be referred to each other. Especially, for the terminal embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant points can be referred to the description in the method embodiment.
In the embodiments provided in the present invention, it should be understood that the disclosed system and method can be implemented in other ways. For example, the above-described system embodiments are merely illustrative, and for example, the division of the units is only one logical functional division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, systems or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
Although the present invention has been described in detail by referring to the drawings in connection with the preferred embodiments, the present invention is not limited thereto. Various equivalent modifications or substitutions can be made on the embodiments of the present invention by those skilled in the art without departing from the spirit and scope of the present invention, and these modifications or substitutions are within the scope of the present invention/any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. A storage-layered data exchange testing method is characterized by comprising the following steps:
creating an advanced disk array in a test storage pool, and occupying all storage resources of the advanced disk array;
creating a low-level disk array in a test storage pool, and creating a first storage volume on the low-level disk array;
IO reading and writing are carried out on the first storage volume to manufacture hotspot data;
and monitoring whether the hot spot data is exchanged from the low-level disk array to the high-level disk array, and judging that the test is passed if the hot spot data is exchanged from the low-level disk array to the high-level disk array.
2. The method of claim 1, wherein creating an advanced disk array in the test storage pool and fully occupying storage resources of the advanced disk array comprises:
creating a high-level disk array by using an SSD (solid State disk) and adding the high-level disk array to the test storage pool, wherein the automatic layering function of the test storage pool is in an open state;
creating a second storage volume in the storage pool, wherein the size of the second storage volume is the same as that of the high-level disk array space;
writing the second storage volume to full using a data read-write tool;
and acquiring the spare capacity information of the high-level disk array to ensure that the high-level disk array has no spare capacity.
3. The method of claim 1, wherein creating a lower level disk array in a test storage pool and creating a first storage volume on the lower level disk array comprises:
creating a low-level disk array with a SAS HDD and adding the low-level disk array to the test storage pool;
a first storage volume is created on the low-level disk array and an automatic tiering function of the first storage volume is turned on.
4. The method of claim 1, wherein monitoring whether hotspot data is swapped from a low-level disk array to a high-level disk array comprises:
acquiring the hotspot data storage position;
if the storage position of the hotspot data is switched from the low-level disk array to the high-level disk array, reading the storage data of the low-level disk array;
and comparing the storage data with the hot spot data, and if the storage data and the hot spot data are not consistent, judging that the hot spot data is exchanged from the low-level disk array to the high-level disk array.
5. A storage-tiered data exchange testing system, comprising:
the high-level storage creating unit is configured to create a high-level disk array in a test storage pool and fully occupy the storage resources of the high-level disk array;
the storage system comprises a low-level storage creating unit, a storage management unit and a storage management unit, wherein the low-level storage creating unit is configured to create a low-level disk array in a test storage pool and create a first storage volume on the low-level disk array;
the hot spot data manufacturing unit is configured to perform IO read-write manufacturing on the first storage volume to manufacture hot spot data;
and the data exchange monitoring unit is configured to monitor whether the hot spot data is exchanged from the low-level disk array to the high-level disk array, and if so, the test is judged to be passed.
6. The system of claim 5, wherein the advanced storage creation unit comprises:
the high-level storage creating module is used for creating a high-level disk array by utilizing an SSD (solid State disk) and adding the high-level disk array to the test storage pool, and the automatic layering function of the test storage pool is in an open state;
a second storage volume creation module configured to create a second storage volume in the storage pool that is the same size as the senior disk array space;
the storage space writing-full module is configured to write the second storage volume to be full by using a data reading and writing tool;
and the spare capacity checking module is configured to acquire the spare capacity information of the high-level disk array and ensure that the high-level disk array has no spare capacity.
7. The system of claim 5, wherein the low level storage creation unit comprises:
a low-level storage creation module configured to create a low-level disk array using a SAS HDD and add the low-level disk array to the test storage pool;
a first storage volume creation module configured to create a first storage volume on the low-level disk array and to enable an automatic tiering function of the first storage volume.
8. The system of claim 5, wherein the data exchange monitoring unit comprises:
the position acquisition module is configured to acquire the hotspot data storage position;
the data storage module is configured to read the storage data of the low-level disk array if the hotspot data storage position is switched from the low-level disk array to the high-level disk array;
and the data comparison module is configured to compare the storage data with the hotspot data, and if the storage data and the hotspot data are not consistent, the hotspot data is judged to be exchanged from the low-level disk array to the high-level disk array.
9. A terminal, comprising:
a processor;
a memory for storing instructions for execution by the processor;
wherein the processor is configured to perform the method of any one of claims 1-4.
10. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1-4.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111752979A (en) * | 2020-06-29 | 2020-10-09 | 苏州浪潮智能科技有限公司 | Method, system and device for checking capacity of storage pool |
| CN111949414A (en) * | 2020-09-25 | 2020-11-17 | 苏州浪潮智能科技有限公司 | Method, system, terminal and storage medium for optimizing performance of storage controller |
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2019
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111752979A (en) * | 2020-06-29 | 2020-10-09 | 苏州浪潮智能科技有限公司 | Method, system and device for checking capacity of storage pool |
| CN111752979B (en) * | 2020-06-29 | 2023-01-10 | 苏州浪潮智能科技有限公司 | Method, system and device for checking capacity of storage pool |
| CN111949414A (en) * | 2020-09-25 | 2020-11-17 | 苏州浪潮智能科技有限公司 | Method, system, terminal and storage medium for optimizing performance of storage controller |
| CN111949414B (en) * | 2020-09-25 | 2022-08-05 | 苏州浪潮智能科技有限公司 | Method, system, terminal and storage medium for optimizing performance of storage controller |
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Application publication date: 20200512 |