CN111141771B - Suspension wire optical well bracket of X-ray diffractometer and use method thereof - Google Patents
Suspension wire optical well bracket of X-ray diffractometer and use method thereof Download PDFInfo
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- CN111141771B CN111141771B CN202010040663.1A CN202010040663A CN111141771B CN 111141771 B CN111141771 B CN 111141771B CN 202010040663 A CN202010040663 A CN 202010040663A CN 111141771 B CN111141771 B CN 111141771B
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- 239000000725 suspension Substances 0.000 title claims abstract description 91
- 230000003287 optical effect Effects 0.000 title claims abstract description 87
- 238000000034 method Methods 0.000 title claims abstract description 15
- 238000006073 displacement reaction Methods 0.000 claims abstract description 19
- 230000003068 static effect Effects 0.000 claims description 5
- 230000005484 gravity Effects 0.000 claims description 3
- 239000002861 polymer material Substances 0.000 claims description 3
- 230000001681 protective effect Effects 0.000 claims description 2
- 238000012795 verification Methods 0.000 claims description 2
- 239000000463 material Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 238000005517 mercerization Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
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- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
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- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention discloses a suspension wire optical well bracket of an X-ray diffractometer and a use method thereof, wherein the suspension wire optical well comprises a suspension wire and a pendant tied at the bottom end of the suspension wire, and the bracket comprises a lockable magnetic base, a triaxial translational fine tuning holder, a sliding device and a limiter positioned below the suspension wire optical well; the upper end of the lockable magnetic base is connected with a triaxial translational fine tuning cradle head, and the lower end of the lockable magnetic base is adsorbed on the detector protection cover; a magnetic knob switch is arranged on the magnetic device; the sliding device comprises a sliding rail cantilever and a sliding block mechanism, and one end of the sliding rail cantilever is fixed on the top surface of the Z-axis vertical displacement table; the sliding block mechanism comprises a sliding block arranged on the sliding rail cantilever, and a horizontal direction rotating mechanism with angle scales arranged in the center of the sliding block and a suspension wire fixing button; the upper end of the suspension wire is connected with a horizontal direction rotating mechanism. The invention is convenient to assemble and disassemble, accurate in positioning, and capable of being flexibly adjusted in an electrodeless manner, and forms a direct light shielding angle which can be freely selected.
Description
Technical Field
The invention relates to an X-ray diffractometer suspension wire optical well bracket and a use method thereof, belonging to the technical field of X-ray diffractometers.
Background
Optical well: an original used on some types of X-ray diffractometers is used to block incident X-rays directed to the detector to protect the detector from direct radiation.
The existing component is used for a RAPID II type X-ray diffractometer of Japan Physics company, adopts a portal bracket, one section of the bracket is connected with a collimator tube of equipment, and the other end is attached with an optical well. The beam splitter is connected to the collimator tube of the device, the collimator tube is a replaceable component, and when different collimator tubes are replaced, if the collimator tube cannot be connected again due to omission of the component in the prior art, the detector component of the device can be damaged by direct radiation when the radiation is started.
In the prior art, when the device is connected to the collimator tube of the device, the portal bracket structure can form a certain degree of shielding for the sample table, so that the sample replacement is difficult, the bracket is easy to be touched by mistake when the sample is replaced, the position of the optical well is possibly deviated when the sample is replaced, the shielding effect is poor, the collimator tube is possibly deviated when the sample is heavy, the device precision is directly influenced, and even the device is damaged; the portal frame structure in the prior art shields a part of the detector, and can partially block diffraction signals, so that certain loss is caused to the signal acquisition range of equipment; the structural material in the prior art is a stainless steel sheet, the rigidity of the material is insufficient, the material is easy to bend in the use process, the position of the optical well is deviated, and the shading effect is influenced.
Disclosure of Invention
Aiming at the defects existing in the prior art, the invention aims to provide the suspension wire optical well bracket of the X-ray diffractometer and the use method thereof, which are convenient to assemble and disassemble, accurate in positioning, and capable of being flexibly adjusted in an electrodeless manner to form a direct light shielding angle capable of being freely selected.
In order to achieve the above object, the present invention is realized by the following technical scheme:
The invention relates to an X-ray diffractometer suspension wire optical well bracket, which comprises a suspension wire fixed at the gravity center of an optical well and a pendant tied at the bottom end of the suspension wire, wherein the bracket comprises a lockable magnetic base for providing stable support for the optical well bracket, a triaxial translational fine tuning holder, a sliding device and a limiter positioned below the suspension wire optical well and used for enabling the suspension wire optical well to quickly reach stable and static in the debugging process; the upper end of the lockable magnetic base is connected with a triaxial translational fine tuning cradle head, and the lower end of the lockable magnetic base is adsorbed on the detector protection cover through a magnetic device; a magnetic knob switch capable of controlling the magnetic force is arranged on the magnetic device; the three-axis translational fine tuning cradle head comprises an upper section and a lower section, wherein the lower section is an X-axis and Y-axis orthogonal horizontal displacement platform, and the upper section is a Z-axis vertical displacement platform; the sliding device comprises a sliding rail cantilever and a sliding block mechanism, wherein one end of the sliding rail cantilever is fixed on the top surface of the Z-axis vertical displacement platform; the sliding block mechanism comprises a sliding block arranged on a sliding rail cantilever, a horizontal direction rotating mechanism with angle scales and arranged in the center of the sliding block, and a suspension wire fixing button capable of rotating along a vertical direction rotating shaft without limit; the upper end of the suspension wire is connected with a horizontal direction rotating mechanism and is used for controlling the horizontal orientation of the wellhead of the suspension mercerized well.
The limiter adopts a tuning fork-shaped structure, two arms which are close to each other are arranged in the horizontal direction of the limiter, a limiter slit is formed between the two arms, a suspension wire of the suspension wire optical well passes through the limiter slit and is connected with the pendant, horizontal scales are arranged at the limiter slit, and the angle range shielded by the suspension wire optical well can be directly read according to the suspension wire position.
The three-axis translational fine adjustment holder is used for providing displacement distances of 10mm in three orthogonal directions, and is manually driven by a micrometer.
The material of the suspension wire is a high polymer material with high transparency to X rays and is used for equipment signal acquisition.
The upper end of the lockable magnetic base is mounted on the X-axis and Y-axis orthogonal horizontal displacement table through countersunk screws convenient to disassemble and assemble, and the sliding rail cantilever is fixed on the top surface of the Z-axis vertical displacement table through the two countersunk screws.
The sliding rail cantilever provides a horizontal stroke of 100mm for the upper sliding block.
The suspension wire optical well is a lead optical well.
The application method of the suspension wire optical well bracket of the X-ray diffractometer comprises the following steps:
Step 1: assembling the lockable magnetic force base, the triaxial translational fine tuning holder and the sliding rail cantilever into a bracket assembly;
Step 2: setting the magnetic knob switch to be closed, placing the bracket assembly on a detector protection cover, and moving the position of the bracket assembly to enable the Y axis of the three-axis translational fine tuning holder to fall in a vertical plane where direct X rays of equipment are located; setting the magnetic knob switch to be on, so that the lockable magnetic base is attracted to the detector protection cover;
step 3: the pre-assembled suspension mercerizing well passes through a suspension wire fixing button in the middle of an upper sliding block of a sliding rail cantilever, and then a suspension wire is inserted into the suspension wire fixing button;
Step 4: moving a sliding block on the sliding rail cantilever, placing the suspension wire optical well in a travel range near a target position, and locking the suspension wire; installing the limiter to enable the lower end of the suspension wire to pass through a slit of the limiter;
Step 5: the X axis, the Y axis, the Z axis and the suspension wire fixing button on the triaxial translational fine tuning holder are adjusted, and the limiter is adjusted, so that the suspension wire passes through the slit of the limiter and is not contacted with the slit arm when the suspension wire optical well is static; detecting the position of the optical well by using low-power direct X-rays; repeating the steps until the suspension wire optical well falls into a required position; and locking the X axis, the Y axis and the Z axis on the triaxial translational fine tuning holder.
When the optical path calibration operation is carried out, the bottom end of the suspension wire optical well is required to be moved out of the slit opening of the limiter.
When the suspension wire optical well is moved to the shading position again from the deviated optical path position, if the suspension wire optical well is moved out of the optical path to operate properly, the bottom end of the suspension wire is only required to be moved into the slit of the limiter slightly when the suspension wire optical well is reset, and if the optical path is verified to find that the optical well position is inaccurate, the operation steps of the steps are repeated.
The invention is specially used for blocking the X-rays emitted by the diffractometer from being directly incident into the ray detector so as to protect the detector from being damaged by the rays. Compared with a portal light well, the invention has the advantages that:
The invention adopts a suspension wire design, is directly arranged in front of the equipment detector and is completely separated from the equipment collimator part, so that the two parts can not interfere with each other.
The invention eliminates the portal frame, eliminates the shielding problem of the sample table, and is convenient for sample placement and replacement.
The invention uses the suspension wire design, and the suspension wire material is a high polymer material with higher transparency to X-rays, thereby being beneficial to equipment signal acquisition.
The position of the optical well can be flexibly adjusted, and a direct light shielding angle which can be freely selected is formed.
When the optical well is subjected to accidental touch with low intensity, the optical well can be automatically and rapidly reset, debugging is not needed, and the risk of misoperation of equipment is effectively avoided.
The invention is convenient to assemble and disassemble, accurate in positioning, capable of improving experimental efficiency and effectively guaranteeing experimental data quality.
Drawings
Fig. 1 is a schematic structural diagram of a suspension optical well bracket of an X-ray diffractometer.
The reference numerals in the drawings: the magnetic force base 1, the X-axis and Y-axis orthogonal horizontal displacement table 2, the Z-axis vertical displacement table 3, the sliding rail cantilever 4, the detector protection cover 5, the suspension wire 6, the pendant 7 and the sliding block 8 can be locked.
Detailed Description
The invention is further described in connection with the following detailed description, in order to make the technical means, the creation characteristics, the achievement of the purpose and the effect of the invention easy to understand.
Referring to fig. 1, the x-ray diffractometer suspended mercerization well stand can be divided into five components.
The magnetic base can be locked, the cradle head is finely adjusted, the cradle head is fixed by screws, the detector protection cover 5 is connected below the cradle head, and the cradle head is fixed by magnetic attraction. The base is provided with a knob switch, and the magnetic force can be controlled.
The three-axis translational fine tuning cradle head is divided into an upper section and a lower section, wherein the lower section is an X-axis and Y-axis orthogonal horizontal displacement platform, and the upper section is a Z-axis vertical displacement platform. The cradle head can provide displacement distances of about 10mm in three orthogonal directions, and the displacement precision can reach the micron level by adopting micrometer propulsion.
The slide rail cantilever 4 can provide a horizontal stroke of about 100mm for the upper slider 8 thereof. The sliding block 8 is provided with a horizontal direction rotating mechanism (the rotating angle is unlimited) with an angle scale at the center and is used for connecting the upper end suspension wire 6 of the optical well.
The lead-made optical well with the suspension wire 6, the upper end of the suspension wire 6 is connected with a rotating mechanism to control the horizontal orientation of the wellhead of the optical well. The lower end of the suspension wire 6 is connected with a gravity weight 7. The weight 7 provides a pull down force to allow the well to be easily stabilized.
The suspension wire 6 between the optical well and the pendant 7 passes through the slit (the width of the slit is 2 mm) on the limiter, so that the optical well can quickly reach a static and stable state in the process of installation and debugging. The slit of the limiter is provided with scales for marking the shielding angles of the light emitting well on the straight rays at different positions.
The component use workflow is as follows:
Step 1: and (5) assembling and integrating the parts. As shown in fig. 1, the lockable magnetic base, the three-axis translational fine tuning cradle head and the slide rail cantilever 4 with the slide rail of the device are assembled by fastening screws and integrated into a complete bracket assembly.
Step 2: and (5) mounting a bracket assembly. The lockable magnetic foot switch in the carriage assembly is confirmed to be in an "off" (closed) position, when the foot is in a low magnetic state for movement. And placing the assembly on a top plate of a protective cover 5 of the equipment detector, moving and adjusting the position of the assembly, and trying to enable the Y axis of the triaxial holder of the assembly to fall in a vertical plane where direct X rays of the equipment are located. After the adjustment is completed, the lockable magnetic base switch is turned to an on (open) position, and the base generates strong magnetic force and is attracted to the top plate of the detector protection cover 5.
Step 3: installing a suspension mercerization well: and (3) penetrating the preassembled lead optical well through a hole in the middle of the sliding block 8 on the sliding rail cantilever 4 with the sliding rail, and then inserting a knob at the top end of the suspension wire 6 into a rotating hole of the sliding block 8.
Step 4: coarse adjustment: and moving the sliding block 8 on the sliding rail cantilever 4 with the sliding rail, placing the optical well in a fine adjustment travel range near the target position, and locking and fixing the sliding block 8. The limiter is installed so that the lower end of the suspension wire 6 passes through the slit of the limiter.
Step 5: fine tuning: three translation shafts on the cradle head and a rotary knob at the top end of the suspension wire 6 are synchronously adjusted, and the limiter is matched and adjusted, so that the suspension wire 6 passes through a slit of the limiter and is not contacted with a slit arm when the optical well is static. The optical well location is detected with low power direct X-rays. The fine tuning process is repeated until the optical well falls into the desired position. And locking the tripod head X, Y, Z triaxial fixing button.
The apparatus performs an optical path calibration operation, sometimes requiring removal from the optical well. And (5) slightly moving the bottom end of the suspension wire 6 of the optical well out of the slit opening of the limiter, and moving the optical well out of the optical path. Care should be taken to avoid touching the slit so that the stopper is offset and to avoid pulling the well suspension wire so that the suspension wire 6 is deformed or the stent position is offset. If the operation is proper in this step, only the bottom end of the suspension wire of the optical well needs to be moved into the slit of the limiter slightly when the optical well is reset, and the limiter is required to be shifted because the slit arm is not touched. If the optical path verification finds that the position of the optical well is inaccurate, the fine tuning operation process in the step 5 is required to be repeated. After finishing fine tuning, the optical well is moved from the deviated optical path position to the shading position again.
The foregoing has shown and described the basic principles and main features of the present invention and the advantages of the present invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, and that the above embodiments and descriptions are merely illustrative of the principles of the present invention, and various changes and modifications may be made without departing from the spirit and scope of the invention, which is defined in the appended claims. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (10)
1. The suspension wire optical well bracket of the X-ray diffractometer comprises a suspension wire (6) fixed at the center of gravity of the optical well and a pendant (7) tied at the bottom end of the suspension wire (6), and is characterized in that the bracket comprises a lockable magnetic base (1) for providing stable support for the optical well bracket, a triaxial translational fine tuning cradle head, a sliding device and a limiter positioned below the suspension wire optical well for enabling the suspension wire optical well to quickly reach stable and static in the debugging process;
the upper end of the lockable magnetic base (1) is connected with a triaxial translational fine tuning cradle head, and the lower end of the lockable magnetic base is adsorbed on a detector protective cover (5) through a magnetic device; a magnetic knob switch capable of controlling the magnetic force is arranged on the magnetic device;
The three-axis translational fine tuning cradle head comprises an upper section and a lower section, wherein the lower section is an X-axis and Y-axis orthogonal horizontal displacement platform (2), and the upper section is a Z-axis vertical displacement platform (3);
The sliding device comprises a sliding rail cantilever (4) and a sliding block mechanism, wherein one end of the sliding rail cantilever (4) is fixed on the top surface of the Z-axis vertical displacement table (3); the sliding block mechanism comprises a sliding block (8) arranged on the sliding rail cantilever (4), a horizontal direction rotating mechanism with angle scales and arranged in the center of the sliding block (8) and a suspension wire fixing button capable of rotating along a vertical direction rotating shaft without limit; the upper end of the suspension wire (6) is connected with a horizontal direction rotating mechanism and is used for controlling the horizontal direction of the wellhead of the suspension mercerized well.
2. The suspension wire optical well bracket of the X-ray diffractometer according to claim 1, wherein the limiter adopts a tuning fork-shaped structure, two arms which are close to each other are arranged in the horizontal direction of the limiter, a limiter slit is formed between the two arms, a suspension wire (6) of the suspension wire optical well passes through the limiter slit and is connected with the pendant (7), a horizontal scale is arranged at the limiter slit, and the angle range shielded by the suspension wire optical well can be directly read according to the position of the suspension wire (6).
3. The X-ray diffractometer suspended wire optical well bracket of claim 1, wherein the triaxial translational fine tuning cradle head is used for providing displacement distances of 10mm in three mutually orthogonal directions, and is manually driven by a micrometer.
4. The suspension wire optical well bracket of the X-ray diffractometer according to claim 1, wherein the suspension wire (6) is made of a high polymer material with high transparency to X-rays and is used for equipment signal acquisition.
5. The suspension wire optical well bracket of the X-ray diffractometer according to claim 1, wherein the upper end of the lockable magnetic base (1) is arranged on an X-axis and Y-axis orthogonal horizontal displacement table (2) through countersunk head screws which are convenient to disassemble and assemble, and the sliding rail cantilever (4) is fixed on the top surface of a Z-axis vertical displacement table (3) through two countersunk head screws.
6. An X-ray diffractometer suspended light well bracket according to claim 1, characterized in that the sliding rail cantilever (4) provides a horizontal stroke of 100mm for its upper slider (8).
7. The X-ray diffractometer suspended light well bracket of claim 1, wherein the suspended light well is a lead light well.
8. The method of using an X-ray diffractometer suspended wire optical well bracket according to claim 1, comprising the steps of:
Step 1: assembling the lockable magnetic base (1), the triaxial translational fine tuning cradle head and the sliding rail cantilever (4) into a bracket assembly;
Step 2: the magnetic knob switch is set to be closed, the bracket component is placed on the detector protection cover (5), and the position of the bracket component is moved, so that the Y axis of the three-axis translational fine tuning holder falls in a vertical plane where direct X rays of the equipment are located; setting the magnetic knob switch to be on, so that the lockable magnetic base (1) is attracted to the detector protection cover (5);
Step 3: the pre-assembled suspension wire optical well passes through a suspension wire fixing button in the middle of a sliding block (8) on a sliding rail cantilever (4), and then a suspension wire (6) is inserted into the suspension wire fixing button;
Step 4: moving a sliding block (8) on the sliding rail cantilever (4), placing the suspension wire optical well in a travel range near a target position, and locking the suspension wire (6); installing the limiter to enable the lower end of the suspension wire (6) to pass through a slit of the limiter;
Step 5: adjusting an X axis, a Y axis, a Z axis and a suspension wire fixing button on the triaxial translational fine tuning holder, and adjusting the limiter to enable the suspension wire (6) to pass through a slit of the limiter and not contact with a slit arm when the suspension wire optical well is stationary; detecting the position of the optical well by using low-power direct X-rays; repeating the steps until the suspension wire optical well falls into a required position; and locking the X axis, the Y axis and the Z axis on the triaxial translational fine tuning holder.
9. The method for using the suspension wire optical well bracket of the X-ray diffractometer according to claim 8, wherein the bottom end of the suspension wire (6) of the suspension wire optical well is required to be moved out of the slit opening of the limiter when the optical path calibration operation is carried out.
10. The method of using an X-ray diffractometer suspended wire optical well bracket according to claim 9, wherein when the suspended wire optical well is moved from the deviated optical path position to the shading position again, if the suspended wire optical well is properly operated when being moved out of the optical path, the bottom end of the suspended wire (6) is only required to be moved into the slit of the limiter slightly when the suspended wire optical well is reset, and if the optical path verification finds that the optical well position is inaccurate, the operation step of step 5 is repeated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010040663.1A CN111141771B (en) | 2020-01-15 | 2020-01-15 | Suspension wire optical well bracket of X-ray diffractometer and use method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010040663.1A CN111141771B (en) | 2020-01-15 | 2020-01-15 | Suspension wire optical well bracket of X-ray diffractometer and use method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111141771A CN111141771A (en) | 2020-05-12 |
| CN111141771B true CN111141771B (en) | 2024-05-17 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202010040663.1A Active CN111141771B (en) | 2020-01-15 | 2020-01-15 | Suspension wire optical well bracket of X-ray diffractometer and use method thereof |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112361969B (en) * | 2020-11-20 | 2022-03-29 | 中国航空工业集团公司北京长城计量测试技术研究所 | Detection apparatus for suspension wire angularity for acceleration sensor |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2241340Y (en) * | 1995-07-30 | 1996-11-27 | 谈良知 | Optical fiber bicolor liquid level meter |
| GB201219021D0 (en) * | 2011-11-11 | 2012-12-05 | Rigaku Denki Co Ltd | X-Ray intensity correction method and x-ray diffractometer |
| CN105510366A (en) * | 2016-02-03 | 2016-04-20 | 中国工程物理研究院材料研究所 | Portable X-ray diffractometer |
| RU2617560C1 (en) * | 2016-04-04 | 2017-04-25 | Акционерное общество "Научно-производственное предприятие "Буревестник" | Method of adjusting samples in x-ray diffractometer |
| CN106932419A (en) * | 2017-04-19 | 2017-07-07 | 南京大学 | X-ray diffractometer capillary sample tube rack and its application method |
| CN108872279A (en) * | 2018-05-08 | 2018-11-23 | 苏州矩阵光电有限公司 | A kind of the light path calibration method and calibrating installation of four brilliant monochromators |
| CN211955275U (en) * | 2020-01-15 | 2020-11-17 | 南京大学 | X-ray diffractometer suspension wire light well support |
-
2020
- 2020-01-15 CN CN202010040663.1A patent/CN111141771B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2241340Y (en) * | 1995-07-30 | 1996-11-27 | 谈良知 | Optical fiber bicolor liquid level meter |
| GB201219021D0 (en) * | 2011-11-11 | 2012-12-05 | Rigaku Denki Co Ltd | X-Ray intensity correction method and x-ray diffractometer |
| CN105510366A (en) * | 2016-02-03 | 2016-04-20 | 中国工程物理研究院材料研究所 | Portable X-ray diffractometer |
| RU2617560C1 (en) * | 2016-04-04 | 2017-04-25 | Акционерное общество "Научно-производственное предприятие "Буревестник" | Method of adjusting samples in x-ray diffractometer |
| CN106932419A (en) * | 2017-04-19 | 2017-07-07 | 南京大学 | X-ray diffractometer capillary sample tube rack and its application method |
| CN108872279A (en) * | 2018-05-08 | 2018-11-23 | 苏州矩阵光电有限公司 | A kind of the light path calibration method and calibrating installation of four brilliant monochromators |
| CN211955275U (en) * | 2020-01-15 | 2020-11-17 | 南京大学 | X-ray diffractometer suspension wire light well support |
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| CN111141771A (en) | 2020-05-12 |
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