CN111104309B - Method for quickly realizing comprehensive test flow - Google Patents
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- CN111104309B CN111104309B CN201911121325.4A CN201911121325A CN111104309B CN 111104309 B CN111104309 B CN 111104309B CN 201911121325 A CN201911121325 A CN 201911121325A CN 111104309 B CN111104309 B CN 111104309B
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Abstract
The invention relates to a method for quickly realizing a comprehensive test flow, which comprises the following steps: performing test function class division according to the type of the hardware interface of the system to be tested; designing a test function unit for each test function class; all the test functional units adopt unified interface parameters; designing a test configuration information interface, and establishing a mapping relation between configuration information and a test functional unit; establishing a corresponding relation between test flow requirements and test flow configuration information, wherein the test configuration information is stored in a configuration file, and one row of the file corresponds to one test item; and sequentially reading each piece of configuration information from the configuration file, analyzing, judging the type of the test function and the corresponding test function unit, transmitting the configuration information to interface parameters of the test function unit, completing the execution of the current test item by the test function unit, and outputting a test result through the interface parameters until all the test items are executed to complete the test flow.
Description
Technical Field
The project belongs to the field of ground comprehensive test, and provides a method for rapidly realizing a comprehensive test flow of a measurement and control system.
Background
Each test function of the comprehensive test system mainly sends control instructions to the tested system through different hardware function boards such as analog, digital and communication, meanwhile, various state indication information of the system is collected and displayed, data communication is carried out according to the requirements of a communication protocol, and validity judgment of the data is carried out. The diversity and complexity of the equipment are continuously improved, higher requirements are put forward on a ground comprehensive test system, and the current situation that the test flow is easy to change and the test flows in different test states are greatly different in the current comprehensive test process includes the problems that the design and the coding of test projects, test criteria and the like are required to be redesigned, the repeated design, the low development efficiency, the high maintenance cost and the like are easily caused by the traditional comprehensive test flow design and development mode.
Disclosure of Invention
The invention solves the technical problems that: the method for quickly realizing the comprehensive test flow is provided, the test flow is quickly responded to the test flow demand, the test flow is realized by codes as few as possible, the model development period is shortened, and the development cost is reduced.
The solution of the invention is as follows: the method for rapidly realizing the comprehensive test flow is realized by the following steps:
performing test function class division according to the type of the hardware interface of the system to be tested;
designing test function units for each test function class according to the divided test function classes; all the test functional units adopt unified interface parameters;
designing a test configuration information interface according to the designed test function unit and the unified interface parameters, and establishing a mapping relation between configuration information and the test function unit;
aiming at the test flow demand, carrying out test flow configuration according to a test configuration information interface, and establishing a corresponding relation between the test flow demand and the test flow configuration information by adopting a configuration information form for all test items in the same test flow, wherein the test configuration information is stored in a configuration file, and one row of the file corresponds to one test item;
and sequentially reading each piece of configuration information from the configuration file, analyzing, judging the type of the test function and the corresponding test function unit, transmitting the configuration information to interface parameters of the test function unit, completing the execution of the current test item by the test function unit, and outputting a test result through the interface parameters until all the test items are executed to complete the test flow.
Preferably, aiming at the system to be tested in the measurement and control class, the class division of the test function comprises AD test, DI test, DO test, 1553B test and serial port test.
Preferably, each test function class corresponds to one or more test function units, and the test function units are obtained by packaging different types of test board card drive interface functions and are stable test function units verified at present;
the AD test function class at least comprises a single-channel voltage acquisition and interpretation function unit, the DI test function class at least comprises a single-channel digital input and interpretation function unit, the DO test function class at least comprises a single-channel switching value output function unit, the 1553B test function class at least comprises a single message instruction output and feedback interpretation function unit, and the serial port test function class at least comprises a single frame instruction output and feedback interpretation function unit.
Preferably, the unified interface parameters include an input parameter, an output parameter and a return value; the input parameters comprise a test function category, a test item name, a test parameter name and a test function unit association parameter; the output parameters comprise test item names, test parameter names, required values, actual measurement values and conclusions; the return value identifies the normal/abnormal state of test execution.
Preferably, the configuration information includes a test function category, a test item name, a test parameter name, a test function unit identifier, and a test function unit association parameter according to input parameters of the test function unit, and each configuration information establishes a unique corresponding relationship with the test function unit through the test function unit identifier.
Preferably, the test function unit association parameter comprises one or more parameter items, which are uniquely determined by a specific test function unit;
the related parameters of the AD test function single-channel voltage acquisition and interpretation function unit comprise an AD board card identifier, a channel number and an AD criterion; the related parameters of the DI test function type single-channel digital input and interpretation function unit comprise DI board card identification, channel number and DI criterion; the DO test function single-channel switching value output function unit association parameters comprise DO board card identification, channel number and output value; the 1553B test function class single message instruction output and loop interpretation function unit associated parameters comprise BC write RT message address, BC write RT data, delay, BC read RT message address and criteria; the serial port test single frame instruction output and loop interpretation function unit association parameters comprise a transmission serial port ID, transmission serial port data, delay, a reception serial port ID and a criterion.
Preferably, the configuration information is stored by using a CSV format file, and each row of configuration information in the file corresponds to one test item;
the configuration information format expresses different parameters in a mode of regular character strings, the expression rules of the same parameters are consistent, the character strings are separated by commas, and the character strings do not contain commas; the configuration parameters represent the test function category, the test item name, the test parameter name, the function unit identification and the function unit association parameters in the column order.
Preferably, when configuring a test flow, a CSV format file is opened for configuration in an Excel table mode, firstly, a test function class and a test function unit are compared, a test item required by the test flow is mapped to a corresponding test function unit to serve as an independent test item, and flow configuration is carried out according to a test flow configuration information format to form a test flow configuration file consistent with the test flow requirement.
Preferably, the analysis of the test flow is accomplished by:
firstly, sequentially reading a piece of configuration information of a configuration file in a character string mode, performing parameter segmentation by adopting comma separators, completing one-time analysis and extraction of function unit identifiers, and entering corresponding function units according to the function unit identifiers;
and then, establishing a regular expression corresponding to each functional unit association parameter expression rule in the configuration information in the test functional unit, and performing secondary analysis by adopting a regular matching method to extract the functional unit association parameters.
Preferably, after the configuration information is analyzed, the parameters are transmitted to the corresponding functional units for processing, and after the processing is completed, output parameters including test item names, test parameter names, required values, actual measurement values and conclusions are formed.
Compared with the prior art, the invention has the beneficial effects that:
in order to quickly realize the comprehensive test flow of the system, the invention combines the test characteristics of the measurement and control system, separates the test flow from the program, and completes the quick realization of the test flow by means of configuration files, thereby improving the realization efficiency of the test flow.
Compared with the mode that most of the prior art is realized by code-by-code each test item of the test flow in a multi-aspect specific test application mode, the invention fully utilizes the advantages of modular multiplexing of test function units based on hardware interface type division and efficient processing of configuration file form information, realizes the test flow in a form configuration mode, only needs to write basic test function unit module programs, and greatly reduces the realization time of the test flow in a form information editing mode, and has obvious effect especially on test application scenes with long test flow sequences, test items, test parameters and changeable criteria. The rapid implementation method of the test flow based on the configuration file can be well applied to the comprehensive test flow of the multi-state system under different models, reduces the design and test workload and is convenient for transplanting and popularization.
Drawings
FIG. 1 is a schematic diagram of a test flow configuration file according to the present invention;
FIG. 2 is a schematic diagram illustrating a test flow according to the present invention;
FIG. 3 is a flow chart of the present invention for performing a test based on a configuration file.
Detailed Description
The invention is further illustrated below with reference to examples.
The invention combines the test characteristics of the test control system, writes the variable part information of the test flow into the configuration file, reserves a relatively stable test function unit module in the software program, and designs an independent test flow configuration file for each test flow. According to the test flow requirement, the test items are decomposed, the test function types are divided, the flow configuration is carried out by adopting a unified flow test item configuration interface, and the comprehensive test flow is rapidly realized through the configuration of the test flow.
a) Test flow requirements
And according to the system task input, analyzing the system test requirement, wherein the detailed information comprises the interface type, the test item and the like to form the specific requirement of a test flow, and part of the test flow is shown in a table 1.
Table 1 test flow requirements
| Sequence number | Test item | Test parameters | Demand value |
| 1 | AI measurement | IN0 | 28±3V |
| 2 | DI measurement | I1 | 1 |
| 3 | AI measurement | CH1 | 5±1V |
| 4 | DI measurement | I34 | 1 |
| 5 | DI measurement | I35 | 1 |
| 6 | DO output | COM1 | |
| 7 | AI measurement | IN1 | 28±3V |
| 8 | DI measurement | I2 | 1 |
| 9 | AI measurement | CH2 | 5±1V |
| 10 | DO output | COM2 | |
| 11 | AI measurement | IN2 | 28±3V |
| 12 | DI measurement | I3 | 1 |
b) Test flow configuration and deployment
The test flow requirements are analyzed, the test requirements are corresponding to the configuration file interface, the test items, the test types, the test channels/addresses, the test criteria and the like are configured, and a test flow configuration file is formed as shown in fig. 1.
c) Test flow execution
The test execution can be started after the test flow configuration is completed, and the software test flow execution process is shown in fig. 2. The test information list displays the current test item information, wherein the test item identifies the name of the current test item, the test parameter is the data to be tested, the software displays the required value and the actual measured value and automatically judges whether the test result is qualified or not.
The method for quickly realizing the comprehensive test flow based on the configuration file can be well applied to multi-state system tests under different models, and can be compatible with equivalent checking, unit test, bulk test, matching test and assembly test flows under the multi-state.
Examples
The invention relates to a method for realizing a comprehensive test flow fast, which mainly comprises the steps of test function category division, test function unit design, configuration information format design, test flow configuration, configuration information analysis and test execution, and a specific implementation is illustrated by taking a certain system test flow as an example.
a) Test function class classification
The comprehensive test generally comprises the steps of simulating a control command through a switching value board card, carrying out voltage acquisition through an AD board card, monitoring a digital DI state, carrying out communication command test through 1553B or a serial port, and dividing each test item of a test flow into AD test, DI test, DO test, 1553B test and serial port test according to the types of test hardware interfaces according to the requirements of the test flow because the hardware interfaces are relatively stable and the test flow has large change.
b) Test function unit design
And respectively designing test function units according to the test types and specific test items, and packaging different types of test board card drive interface functions to complete the basic functions of the test function units, wherein each function adopts uniform interface parameters, and the parameter interface comprises input parameters, output parameters and return values. The input parameters comprise test function types, test item names, test parameter names and functional unit association parameters, the output parameters comprise test item names, test parameter names, required values, actual measurement values and conclusions, and the return values identify normal/abnormal states of test execution. The design content of each test type functional unit of the AD test, the DI test, the DO test, the 1553B test and the serial port test is shown in the following table 2.
Table 2 test function unit design
c) Configuration information format design
And (3) distinguishing different test items of the same test type in the test flow by adopting a configuration information form, and respectively designing parameter configuration formats of an AD single-channel voltage acquisition and interpretation unit, a DI single-channel digital input and interpretation unit, a DO single-channel switching value output unit, a 1553B single-message instruction and loop interpretation unit and a serial port single-frame instruction transmission and loop interpretation unit according to interface parameters of the test function unit. The configuration information is stored in a CSV file mode, the configuration content comprises a test function category, a test item name, a test parameter name, a function unit identifier, a function unit associated parameter and different function unit configuration information formats are specifically designed and described in Table 3 according to input parameters of the test function unit.
The test functional unit association parameters comprise one or more parameter items, which are uniquely determined by the specific test functional unit; the related parameters of the AD test function single-channel voltage acquisition and interpretation function unit comprise an AD board card identifier, a channel number and an AD criterion; the related parameters of the DI test function type single-channel digital input and interpretation function unit comprise DI board card identification, channel number and DI criterion; the DO test function single-channel switching value output function unit association parameters comprise DO board card identification, channel number and output value; the 1553B test function class single message instruction output and loop interpretation function unit associated parameters comprise BC write RT message address, BC write RT data, delay, BC read RT message address and criteria; the serial port test type single frame instruction output and loop interpretation function unit related parameters comprise a transmitting serial port ID, transmitting serial port data, delaying time, receiving serial port ID and criteria
Table 3 configuration information interface format
For other test types and functional units, the device can be re-identified according to a) strip and b) strip and independently implemented, and the parameter configuration interface identification corresponding to the device is provided.
d) Test flow configuration
When the test flow is configured, a CSV configuration file is opened for configuration in an Excel table mode, each row of configuration information in the table corresponds to one test item, configuration parameters represent different parameter types in a column sequence and respectively comprise a test function category, a test item name, a test parameter name, a function unit identifier and a function unit associated parameter, and each piece of test item configuration information is configured according to the rule (shown in figure 1);
first, the test function class and the test function unit (shown in table 2) are compared, according to the test flow requirement (shown in table 1), the test item of the test flow requirement is mapped to the corresponding test function unit as an independent test item, and the flow configuration is performed according to the test flow configuration information format (shown in table 3), so as to form a test flow configuration file (shown in fig. 1) consistent with the test flow requirement.
e) Configuration information parsing and test execution
The execution of the test flows is driven by a flow configuration file, when a plurality of test flows are executed, an independent flow configuration file is set for each test flow, each row of configuration information in the configuration file corresponds to one test item, when the test is executed, one piece of test item configuration information in the configuration file is sequentially read in a character string mode, parameter segmentation is carried out by comma separators, and one-time analysis and extraction of functional unit identification is completed.
Judging to enter corresponding functional unit processing branches through the functional unit identification parameters to establish regular expressions corresponding to different functional unit association parameters, and carrying out secondary analysis by adopting a regular matching method to extract the functional unit association parameters. The related parameters of the transfer test unit respectively execute AD voltage acquisition and interpretation, DI digital input and interpretation, DO switching value output, 1553B instruction test and serial port instruction test operation, and output parameters comprising test item names, test parameter names, required values, actual measurement values and conclusions are formed after the processing is completed. After execution is completed, the next test is entered, all test item execution is completed, the automatic test flow is exited, and the test execution flow is shown in fig. 3.
Specifically, for the AD test function single-channel voltage acquisition and interpretation function unit, acquiring the voltage (measured value) of a corresponding board designated channel according to the board identification and the channel number, and then comparing the voltage value with a voltage criterion (required value) to judge and obtain a conclusion (qualification/disqualification);
for the DI test function single-channel digital input and interpretation function unit, collecting a DI value (measured value) of a corresponding board designated channel according to the board identification and the channel number, and then comparing the DI value with a DI criterion (required value) to judge and obtain a conclusion (pass/fail);
for the DO test function single-channel switching value output functional unit, according to the card identification, the channel number and the output value, DO is output to the corresponding card designated channel;
for the 1553B test function class single message instruction output and return instruction interpretation function unit, sending appointed data according to the BC write RT message address, reading the data (actual measurement value) from the BC read RT message address after waiting for delay time, and comparing with a criterion (requirement value) to judge and obtain a conclusion (qualification/disqualification);
and for the serial port test single-frame instruction output and feedback interpretation functional unit, sending data through a sending serial port, waiting for delay, and then reading back the data (measured value) from a receiving serial port, and comparing and judging with a criterion (required value) to obtain a conclusion (qualification/disqualification).
Through the five steps a) -e), the configuration of the test flow is completed, the configuration deployment, the automatic execution and the interpretation and the processing of the test result of the test flow are rapidly realized, the test flow requirement of the measurement and control system is met, and the test execution effect is shown in figure 2.
The invention is not described in detail in part as being common general knowledge to a person skilled in the art.
Claims (7)
1. The method for rapidly realizing the comprehensive test flow is characterized by comprising the following steps of:
performing test function class division according to the type of the hardware interface of the system to be tested; aiming at the system to be tested in the measurement and control class, the class division of the test function comprises AD test, DI test, DO test, 1553B test and serial port test;
designing test function units for each test function class according to the divided test function classes; all the test functional units adopt unified interface parameters;
designing a test configuration information interface according to the designed test function unit and the unified interface parameters, and establishing a mapping relation between configuration information and the test function unit;
aiming at the test flow demand, carrying out test flow configuration according to a test configuration information interface, and establishing a corresponding relation between the test flow demand and the test flow configuration information by adopting a configuration information form for all test items in the same test flow, wherein the test configuration information is stored in a configuration file, and one row of the file corresponds to one test item;
sequentially reading each piece of configuration information from the configuration file, analyzing, judging the type of the test function and the corresponding test function unit, transmitting the configuration information to interface parameters of the test function unit, completing the execution of the current test item by the test function unit, and outputting a test result through the interface parameters until all the test items are executed to complete the test flow;
each test function class corresponds to one or more test function units, wherein the test function units are obtained by packaging different types of test board card driving interface functions and are stable test function units verified at present;
the AD test function class at least comprises a single-channel voltage acquisition and interpretation function unit, the DI test function class at least comprises a single-channel digital input and interpretation function unit, the DO test function class at least comprises a single-channel switching value output function unit, the 1553B test function class at least comprises a single message instruction output and feedback interpretation function unit, and the serial port test function class at least comprises a single frame instruction output and feedback interpretation function unit;
the configuration information comprises a test function category, a test item name, a test parameter name, a test function unit identifier and a test function unit association parameter according to the input parameters of the test function unit, and each configuration information establishes a unique corresponding relation with the test function unit through the test function unit identifier.
2. The method according to claim 1, characterized in that: the unified interface parameters comprise input parameters, output parameters and return values; the input parameters comprise a test function category, a test item name, a test parameter name and a test function unit association parameter; the output parameters comprise test item names, test parameter names, required values, actual measurement values and conclusions; the return value identifies the normal/abnormal state of test execution.
3. The method according to claim 1, characterized in that: the test function unit association parameters comprise one or more parameter items which are uniquely determined by a specific test function unit;
the related parameters of the AD test function single-channel voltage acquisition and interpretation function unit comprise an AD board card identifier, a channel number and an AD criterion; the related parameters of the DI test function type single-channel digital input and interpretation function unit comprise DI board card identification, channel number and DI criterion; the DO test function single-channel switching value output function unit association parameters comprise DO board card identification, channel number and output value; the 1553B test function class single message instruction output and loop interpretation function unit associated parameters comprise BC write RT message address, BC write RT data, delay, BC read RT message address and criteria; the serial port test single frame instruction output and loop interpretation function unit association parameters comprise a transmission serial port ID, transmission serial port data, delay, a reception serial port ID and a criterion.
4. The method according to claim 1, characterized in that: the configuration information is stored by adopting a CSV format file, and each row of configuration information in the file corresponds to one test item;
the configuration information format expresses different parameters in a mode of regular character strings, the expression rules of the same parameters are consistent, the character strings are separated by commas, and the character strings do not contain commas; the configuration parameters represent the test function category, the test item name, the test parameter name, the function unit identification and the function unit association parameters in the column order.
5. The method according to claim 4, wherein: when the test flow is configured, a CSV format file is opened for configuration in an Excel table mode, firstly, test function types and test function units are compared, test items required by the test flow are mapped to corresponding test function units to serve as independent test items, flow configuration is conducted according to a test flow configuration information format, and a test flow configuration file consistent with the test flow requirements is formed.
6. The method according to claim 5, wherein: the test flow analysis is completed by the following steps:
firstly, sequentially reading a piece of configuration information of a configuration file in a character string mode, performing parameter segmentation by adopting comma separators, completing one-time analysis and extraction of function unit identifiers, and entering corresponding function units according to the function unit identifiers;
and then, establishing a regular expression corresponding to each functional unit association parameter expression rule in the configuration information in the test functional unit, and performing secondary analysis by adopting a regular matching method to extract the functional unit association parameters.
7. The method according to claim 1, characterized in that: after the configuration information is analyzed, the parameters are transmitted to the corresponding functional units for processing, and output parameters comprising test item names, test parameter names, required values, actual measurement values and conclusions are formed after the processing is completed.
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