CN110940288A - 晶圆边缘轮廓的检测方法 - Google Patents
晶圆边缘轮廓的检测方法 Download PDFInfo
- Publication number
- CN110940288A CN110940288A CN201911036983.3A CN201911036983A CN110940288A CN 110940288 A CN110940288 A CN 110940288A CN 201911036983 A CN201911036983 A CN 201911036983A CN 110940288 A CN110940288 A CN 110940288A
- Authority
- CN
- China
- Prior art keywords
- wafer
- edge
- ruler
- detecting
- clamping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 21
- 238000005096 rolling process Methods 0.000 claims abstract description 11
- 238000013499 data model Methods 0.000 claims abstract description 8
- 238000001514 detection method Methods 0.000 claims abstract description 7
- 238000003825 pressing Methods 0.000 claims abstract description 5
- 239000003795 chemical substances by application Substances 0.000 claims description 17
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 claims description 6
- 239000011248 coating agent Substances 0.000 claims description 5
- 238000000576 coating method Methods 0.000 claims description 5
- 239000004743 Polypropylene Substances 0.000 claims description 4
- -1 polypropylene Polymers 0.000 claims description 4
- 229920001155 polypropylene Polymers 0.000 claims description 4
- 150000001875 compounds Chemical class 0.000 claims description 3
- 238000005520 cutting process Methods 0.000 claims description 3
- 229920001971 elastomer Polymers 0.000 claims description 3
- 229920002379 silicone rubber Polymers 0.000 claims description 3
- 238000000465 moulding Methods 0.000 claims description 2
- 238000007493 shaping process Methods 0.000 claims description 2
- 239000004945 silicone rubber Substances 0.000 claims description 2
- 238000005516 engineering process Methods 0.000 abstract description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 2
- BGPVFRJUHWVFKM-UHFFFAOYSA-N N1=C2C=CC=CC2=[N+]([O-])C1(CC1)CCC21N=C1C=CC=CC1=[N+]2[O-] Chemical compound N1=C2C=CC=CC2=[N+]([O-])C1(CC1)CCC21N=C1C=CC=CC1=[N+]2[O-] BGPVFRJUHWVFKM-UHFFFAOYSA-N 0.000 description 3
- 239000000428 dust Substances 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000003708 edge detection Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000001846 repelling effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (12)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201911036983.3A CN110940288B (zh) | 2019-10-29 | 2019-10-29 | 晶圆边缘轮廓的检测方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201911036983.3A CN110940288B (zh) | 2019-10-29 | 2019-10-29 | 晶圆边缘轮廓的检测方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN110940288A true CN110940288A (zh) | 2020-03-31 |
CN110940288B CN110940288B (zh) | 2023-06-20 |
Family
ID=69906483
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201911036983.3A Active CN110940288B (zh) | 2019-10-29 | 2019-10-29 | 晶圆边缘轮廓的检测方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN110940288B (zh) |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5422724A (en) * | 1992-05-20 | 1995-06-06 | Applied Materials, Inc. | Multiple-scan method for wafer particle analysis |
JP2003148945A (ja) * | 2001-11-13 | 2003-05-21 | Hitachi High-Technologies Corp | 微細パターンの3次元形状測定システム、及び3次元形状測定方法 |
US20080144006A1 (en) * | 2004-05-17 | 2008-06-19 | Schott Ag | Method for Measuring Topographic Structures on Devices |
CN104061857A (zh) * | 2014-06-16 | 2014-09-24 | 江西赛维Ldk太阳能高科技有限公司 | 导轮结构参数检测方法 |
US20150125657A1 (en) * | 2012-04-12 | 2015-05-07 | Maha-Aip Gmbh & Co. Kg | Road surface covering elements for a chassis dynamometer |
CN106486406A (zh) * | 2016-10-21 | 2017-03-08 | 杭州长川科技股份有限公司 | 集成电路晶圆预对位装置及预对位方法 |
US20170372988A1 (en) * | 2016-06-23 | 2017-12-28 | Nxp B.V. | Wafer level chip scale semiconductor package |
CN110034062A (zh) * | 2019-04-19 | 2019-07-19 | 德淮半导体有限公司 | 晶圆夹持装置及卡盘 |
-
2019
- 2019-10-29 CN CN201911036983.3A patent/CN110940288B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5422724A (en) * | 1992-05-20 | 1995-06-06 | Applied Materials, Inc. | Multiple-scan method for wafer particle analysis |
JP2003148945A (ja) * | 2001-11-13 | 2003-05-21 | Hitachi High-Technologies Corp | 微細パターンの3次元形状測定システム、及び3次元形状測定方法 |
US20080144006A1 (en) * | 2004-05-17 | 2008-06-19 | Schott Ag | Method for Measuring Topographic Structures on Devices |
US20150125657A1 (en) * | 2012-04-12 | 2015-05-07 | Maha-Aip Gmbh & Co. Kg | Road surface covering elements for a chassis dynamometer |
CN104061857A (zh) * | 2014-06-16 | 2014-09-24 | 江西赛维Ldk太阳能高科技有限公司 | 导轮结构参数检测方法 |
US20170372988A1 (en) * | 2016-06-23 | 2017-12-28 | Nxp B.V. | Wafer level chip scale semiconductor package |
CN106486406A (zh) * | 2016-10-21 | 2017-03-08 | 杭州长川科技股份有限公司 | 集成电路晶圆预对位装置及预对位方法 |
CN110034062A (zh) * | 2019-04-19 | 2019-07-19 | 德淮半导体有限公司 | 晶圆夹持装置及卡盘 |
Also Published As
Publication number | Publication date |
---|---|
CN110940288B (zh) | 2023-06-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7417748B2 (en) | Method and apparatus for measuring dimensional changes in transparent substrates | |
CN106098540B (zh) | 压印设备、基板运送设备、压印方法以及物品制造方法 | |
US10068782B2 (en) | Device and method for scribing a bottom-side of a substrate while viewing the top side | |
WO2019205499A1 (zh) | 一种玻璃面板检测设备及检测图像拼接方法 | |
TW201811483A (zh) | 工作夾台、多孔陶瓷吸引板的製造方法及吸引保持系統 | |
WO1993006432A1 (en) | Precision measuring apparatus | |
CN109579713A (zh) | 测量设备及测量方法 | |
TW202000331A (zh) | 能夠轉動工件之衝壓模具裝置及使用其所進行之衝壓方法 | |
CN110836641A (zh) | 一种零件异形表面微结构三维尺寸的检测方法及检测设备 | |
CN110940288A (zh) | 晶圆边缘轮廓的检测方法 | |
JP5186114B2 (ja) | 転写装置および転写方法 | |
US2781096A (en) | Adjustable punching device | |
CN102917845A (zh) | 叠层体膜的切割装置及叠层体膜的切割方法 | |
JP2004061274A (ja) | フェルール偏芯量測定装置 | |
US10137528B2 (en) | Blank etching fixture | |
JP3368139B2 (ja) | 電子ビーム描画装置用試料ステージ | |
JP2008171873A (ja) | 位置決め装置、位置決め方法、加工装置及び加工方法 | |
CN208459293U (zh) | 一种精密器件的3d视觉检测装置 | |
TW202028732A (zh) | 玻璃板測定裝置 | |
JPH0524005Y2 (zh) | ||
CN218994212U (zh) | 晶片定位装置 | |
CN113539877B (zh) | 半导体结构的测量装置及测量方法 | |
CN213633980U (zh) | 一种载玻片定位用标尺*** | |
CN215327731U (zh) | 异形裁切玻璃基板的分割缘检查装置 | |
CN215338275U (zh) | 检测装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20200720 Address after: 1205, floor 12, building 3, No. 11, Changchun Bridge Road, Haidian District, Beijing 100089 Applicant after: GUOHONG HUAYE INVESTMENT Co.,Ltd. Address before: 100081 building 4, floor 8, No. 9, Haidian District meteorological Road, Beijing City, 418 Applicant before: CISRI ENERGY SAVING TECHNOLOGY Co.,Ltd. |
|
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20210112 Address after: 100089 1204, 12 / F, building 3, 11 Changchun Bridge Road, Haidian District, Beijing Applicant after: Guohong Zhongyu Technology Development Co.,Ltd. Address before: 1205, 12 / F, building 3, No. 11, Changchun Bridge Road, Haidian District, Beijing 100089 Applicant before: GUOHONG HUAYE INVESTMENT Co.,Ltd. |
|
TA01 | Transfer of patent application right | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20221018 Address after: 102502 Room 301, Building 1, No. 14, Liushui Industrial Zone, Yanshan District, Beijing Applicant after: Beijing Huikun New Materials Co.,Ltd. Address before: 100089 1204, 12 / F, building 3, 11 Changchun Bridge Road, Haidian District, Beijing Applicant before: Guohong Zhongyu Technology Development Co.,Ltd. |
|
TA01 | Transfer of patent application right | ||
CB02 | Change of applicant information |
Address after: Room 301, Building 1, No. 14, Liushui Industrial Zone, Yanshan District, Beijing 102500 Applicant after: Beijing Yuehai Gold Semiconductor Technology Co.,Ltd. Address before: 102502 Room 301, Building 1, No. 14, Liushui Industrial Zone, Yanshan District, Beijing Applicant before: Beijing Huikun New Materials Co.,Ltd. |
|
CB02 | Change of applicant information | ||
GR01 | Patent grant | ||
GR01 | Patent grant |