CN110923663A - Method for growing large-area single-layer or multi-layer molybdenum ditelluride structure through secondary reaction - Google Patents

Method for growing large-area single-layer or multi-layer molybdenum ditelluride structure through secondary reaction Download PDF

Info

Publication number
CN110923663A
CN110923663A CN201911093705.1A CN201911093705A CN110923663A CN 110923663 A CN110923663 A CN 110923663A CN 201911093705 A CN201911093705 A CN 201911093705A CN 110923663 A CN110923663 A CN 110923663A
Authority
CN
China
Prior art keywords
layer
molybdenum
substrate
reaction
ditelluride
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201911093705.1A
Other languages
Chinese (zh)
Inventor
袁梦辉
陈鑫
孙艳
戴宁
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Institute of Technical Physics of CAS
Original Assignee
Shanghai Institute of Technical Physics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Institute of Technical Physics of CAS filed Critical Shanghai Institute of Technical Physics of CAS
Priority to CN201911093705.1A priority Critical patent/CN110923663A/en
Publication of CN110923663A publication Critical patent/CN110923663A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/305Sulfides, selenides, or tellurides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]

Abstract

The invention discloses a method for growing a large-area single-layer or multi-layer molybdenum ditelluride structure by secondary reaction. The method comprises the steps of firstly depositing a molybdenum telluride nano film on a substrate in an atomic layer deposition mode, and then carrying out high-temperature secondary reaction on the substrate on which the molybdenum telluride nano film is deposited and elemental tellurium by taking inert gas or hydrogen as carrier gas to obtain a large-area single-layer or multi-layer molybdenum ditelluride structure on the substrate. The invention has the advantages that: good controllability and simple operation, and can realize large-area preparation of single-layer or multi-layer molybdenum ditelluride. The molybdenum ditelluride structure prepared by the method has wide application prospect in the aspects of optical materials, storage materials, catalytic materials, semiconductor photoelectric materials and the like.

Description

Method for growing large-area single-layer or multi-layer molybdenum ditelluride structure through secondary reaction
Technical Field
The invention belongs to the field of material preparation, relates to a vapor deposition technology, and particularly relates to a method for growing a large-area single-layer or multi-layer molybdenum ditelluride structure through secondary reaction.
Background
Since Novoseov and Geim and their co-workers successfully used adhesive tapes to strip graphene from graphite in 2004, research on two-dimensional materials has entered a period of rapid development, and at the same time, graphene and graphene-like materials have further enriched families of two-dimensional materials, such as two-dimensional transition metal chalcogenides, particularly molybdenum ditelluride, and have a wide application prospect in the aspects of optical materials, storage materials, catalytic materials, semiconductor photoelectric materials and the like due to their excellent electrical, optical and mechanical properties.
Although two-dimensional nanomaterials show attractive prospects, the bottleneck that restricts the development of the nanomaterials is how to prepare high-quality large-area two-dimensional materials on a large scale. The preparation methods of the two-dimensional nano materials commonly used at present can be classified into two main types: a top-down stripping method and a bottom-up synthesis method. The top-down peeling method is the most traditional method for preparing two-dimensional materials, the preparation method is simple, the obtained samples have few defects, but the yield is low, and the method is not suitable for large-area production. The bottom-up synthesis method is mainly characterized in that a molybdenum ditelluride film is generated on a substrate through the reaction of a molybdenum source and tellurium vapor at high temperature. The method is the most effective method for preparing large-area high-crystallization-quality molybdenum ditelluride, has advantages in the aspects of size, layer number and physical property control, but the current preparation process is not mature. The biggest current problem limiting the practical application of ultra-thin two-dimensional layered materials is the acquisition of high quality wafer-level materials. The method for obtaining the large-area single-layer or multi-layer molybdenum ditelluride material by a simple and easy-to-operate and control mode has great significance and is one of the key challenges of the application.
Disclosure of Invention
The invention aims to provide a method for growing a large-area single-layer or multi-layer molybdenum ditelluride structure by secondary reaction. The method is simple to operate and good in controllability, the growth area and the number of layers of the molybdenum ditelluride are controlled by controlling the reaction temperature and the reaction time, and a large-area single-layer or multi-layer molybdenum ditelluride structure can be prepared on a substrate of 100 square centimeters.
The invention relates to a method for growing a large-area single-layer or multi-layer molybdenum ditelluride structure by secondary reaction, which comprises the following steps:
depositing a molybdenum telluride nano film on a silicon wafer, a sapphire wafer, a quartz wafer, aluminum oxide or silicon dioxide substrate with the size of 1-100 square centimeters by using an atomic layer deposition mode, wherein the deposition temperature is 100-500 ℃, and the deposition time is 10 minutes-5 hours; and then carrying out high-temperature secondary reaction on the substrate deposited with the molybdenum telluride nano film and elemental tellurium by taking inert gas or hydrogen as carrier gas, controlling the flow rate of the carrier gas to be 1-500 cubic centimeters per second, the reaction pressure to be 10-300 torr, the reaction temperature to be 600-1000 ℃, and the reaction time to be 1-10 minutes, thus obtaining a large-area single-layer or multi-layer molybdenum ditelluride structure on the substrate.
The invention has the advantages that: good controllability and simple operation, and can realize large-area preparation of molybdenum ditelluride. The single-layer or multi-layer molybdenum ditelluride structure prepared by the invention has wide application prospect in the aspects of optical materials, storage materials, catalytic materials, semiconductor photoelectric materials and the like.
Detailed Description
Example 1
Depositing a molybdenum telluride nano film on a silicon substrate with the size of 100 square centimeters by using atomic layer deposition, wherein the deposition temperature is 500 ℃, and the deposition time is 10 minutes; and then carrying out high-temperature secondary reaction on the substrate deposited with the molybdenum telluride nano film and elemental tellurium in an argon atmosphere at the reaction temperature of 1000 ℃, the reaction pressure of 80 torr and the reaction time of 1 minute to obtain a large-area single-layer molybdenum ditelluride structure.
Example 2
Depositing a molybdenum telluride nano film on a sapphire sheet substrate with the size of 66 square centimeters by using atomic layer deposition, wherein the deposition temperature is 380 ℃, and the deposition time is 5 hours; and then carrying out high-temperature secondary reaction on the substrate deposited with the molybdenum telluride nano film and elemental tellurium in an argon atmosphere, wherein the reaction temperature is 710 ℃, the reaction pressure is 170 torr, and the reaction time is 3 minutes, so that the large-area multilayer molybdenum ditelluride structure is obtained.
Example 3
Depositing a molybdenum telluride nano film on an aluminum oxide substrate with the size of 4 square centimeters by using atomic layer deposition, wherein the deposition temperature is 100 ℃, and the deposition time is 150 minutes; and then carrying out high-temperature secondary reaction on the substrate deposited with the molybdenum telluride nano film and elemental tellurium in an argon atmosphere at the reaction temperature of 600 ℃, the reaction pressure of 230 torr and the reaction time of 7 minutes to obtain the large-area multilayer molybdenum ditelluride structure.
Example 4
Firstly, depositing a molybdenum telluride nano film on a silicon dioxide substrate with the size of 25 square centimeters by using atomic layer deposition, wherein the deposition temperature is 230 ℃, and the deposition time is 30 minutes; and then carrying out high-temperature secondary reaction on the substrate deposited with the molybdenum telluride nano film and elemental tellurium in a hydrogen atmosphere, wherein the reaction temperature is 860 ℃, the reaction pressure is 50 torr, and the reaction time is 10 minutes, so that a large-area single-layer molybdenum ditelluride structure is obtained.

Claims (3)

1. A method for growing a large-area single-layer or multi-layer molybdenum ditelluride structure by secondary reaction is characterized by comprising the following steps:
firstly, molybdenum hexacarbonyl and diethyl tellurium are used as precursors, and a molybdenum telluride nano film is deposited on a substrate through atomic layer deposition; and then carrying out high-temperature secondary reaction on the substrate deposited with the molybdenum telluride nano film and elemental tellurium by taking inert gas or hydrogen as carrier gas, controlling the flow rate of the carrier gas to be 1-500 cubic centimeters per second, the reaction pressure to be 10-300 torr, the reaction temperature to be 600-1000 ℃, and the reaction time to be 10 seconds-10 minutes, thus obtaining a large-area single-layer or multi-layer molybdenum ditelluride structure on the substrate.
2. The method of claim 1, wherein the second reaction is carried out to grow a large-area single-layer or multi-layer molybdenum ditelluride structure: the substrate in the step 1 is a silicon wafer, a sapphire wafer, a quartz wafer, aluminum oxide or silicon dioxide, and the size of the substrate is 1-100 square centimeters.
3. The method of claim 1, wherein the second reaction is carried out to grow a large-area single-layer or multi-layer molybdenum ditelluride structure: the temperature of the atomic layer deposition molybdenum telluride nano film in the step 1 is 100 ℃ to 500 ℃, and the time is 10 minutes to 10 hours.
CN201911093705.1A 2019-11-11 2019-11-11 Method for growing large-area single-layer or multi-layer molybdenum ditelluride structure through secondary reaction Pending CN110923663A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201911093705.1A CN110923663A (en) 2019-11-11 2019-11-11 Method for growing large-area single-layer or multi-layer molybdenum ditelluride structure through secondary reaction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201911093705.1A CN110923663A (en) 2019-11-11 2019-11-11 Method for growing large-area single-layer or multi-layer molybdenum ditelluride structure through secondary reaction

Publications (1)

Publication Number Publication Date
CN110923663A true CN110923663A (en) 2020-03-27

Family

ID=69853720

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201911093705.1A Pending CN110923663A (en) 2019-11-11 2019-11-11 Method for growing large-area single-layer or multi-layer molybdenum ditelluride structure through secondary reaction

Country Status (1)

Country Link
CN (1) CN110923663A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113839044A (en) * 2021-11-29 2021-12-24 广东工业大学 Lithium-sulfur battery positive electrode, preparation method thereof and lithium-sulfur battery
CN114807848A (en) * 2022-04-20 2022-07-29 南京大学 Large-area PLD (pulsed laser deposition) preparation method of molybdenum ditelluride

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103757602A (en) * 2014-01-13 2014-04-30 清华大学 Method for preparing single-layer molybdenum disulfide film
CN105800566A (en) * 2016-04-15 2016-07-27 中国科学院上海技术物理研究所 Method for growing single-layer and multi-layer transition metal sulfides through alternating injection of reactants
CN105887015A (en) * 2016-04-15 2016-08-24 中国科学院上海技术物理研究所 Step-by-step gas phase method for preparing large-area single-layer tungsten disulfide and molybdenum disulfide structures
CN107937884A (en) * 2017-09-19 2018-04-20 云南师范大学 A kind of atomic layer deposition preparation method of large area molybdenum disulfide film
CN108389779A (en) * 2018-02-13 2018-08-10 江南大学 A kind of preparation method of the half-metallic telluride molybdenum based on mild hydrogen gas plasma

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103757602A (en) * 2014-01-13 2014-04-30 清华大学 Method for preparing single-layer molybdenum disulfide film
CN105800566A (en) * 2016-04-15 2016-07-27 中国科学院上海技术物理研究所 Method for growing single-layer and multi-layer transition metal sulfides through alternating injection of reactants
CN105887015A (en) * 2016-04-15 2016-08-24 中国科学院上海技术物理研究所 Step-by-step gas phase method for preparing large-area single-layer tungsten disulfide and molybdenum disulfide structures
CN107937884A (en) * 2017-09-19 2018-04-20 云南师范大学 A kind of atomic layer deposition preparation method of large area molybdenum disulfide film
CN108389779A (en) * 2018-02-13 2018-08-10 江南大学 A kind of preparation method of the half-metallic telluride molybdenum based on mild hydrogen gas plasma

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113839044A (en) * 2021-11-29 2021-12-24 广东工业大学 Lithium-sulfur battery positive electrode, preparation method thereof and lithium-sulfur battery
CN114807848A (en) * 2022-04-20 2022-07-29 南京大学 Large-area PLD (pulsed laser deposition) preparation method of molybdenum ditelluride

Similar Documents

Publication Publication Date Title
CN109809372B (en) Method for preparing single-layer tungsten diselenide nanobelt based on space confinement strategy
CN105463580A (en) Preparation method of cadmium selenide or cadmium sulfide two-dimensional monocrystal nanosheet
CN103456603B (en) Gallium system heterogeneous semiconductor substrate is prepared method and the gallium oxide film of gallium oxide film
CN106868469B (en) A method of non-metal catalyst prepares graphene in silicon substrate
CN109868454B (en) Preparation method of two-dimensional chromium sulfide material
CN104313684A (en) Method for preparing hexagonal boron nitride (h-BN) two-dimensional atomic crystal
CN102774065B (en) Amorphous carbon film with graphene structure and preparation method thereof
CN104495829A (en) Method for preparing graphene film on low-temperature substrate
CN113832432B (en) Preparation method of two-dimensional compound semiconductor film
CN104211054B (en) A kind of controlled method of preparing Graphene
CN105887015A (en) Step-by-step gas phase method for preparing large-area single-layer tungsten disulfide and molybdenum disulfide structures
CN110923663A (en) Method for growing large-area single-layer or multi-layer molybdenum ditelluride structure through secondary reaction
CN108666358B (en) Preparation method of transition metal chalcogenide and boron nitride or graphene heterojunction
CN112695381A (en) Method for rapidly growing ultrathin large-size single crystal transition metal sulfur/selenide
CN113564699B (en) Method for growing single-layer single crystal graphene based on Cu2O dielectric layer
CN109179388B (en) Method for preparing graphene from carbon monoxide
CN113410287B (en) Two-dimensional SnSe-SnSe 2 P-n heterojunction and preparation method thereof
CN205188486U (en) Two dimension nanometer film preparation device
CN110639557A (en) Van der Waals heterojunction and preparation method thereof, anode material and field effect transistor
CN107244666B (en) Method for growing large-domain graphene by taking hexagonal boron nitride as point seed crystal
CN114162809B (en) Method for preparing graphene by two-step chemical vapor deposition method
CN107988629A (en) A kind of preparation method of low resistivity p-type cuprous oxide epitaxial film
CN103060907A (en) A method of preparing single-crystal graphene on insulating materials
CN110863189A (en) Method for growing single-layer telluride doped structure by pulse type injection of reactant
CN110846621A (en) Two-step gas phase method for preparing large-area single-layer vanadium ditelluride material

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20200327

WD01 Invention patent application deemed withdrawn after publication