CN110916693A - Imaging method, imaging device, detector and X-ray camera system - Google Patents

Imaging method, imaging device, detector and X-ray camera system Download PDF

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CN110916693A
CN110916693A CN201911060494.1A CN201911060494A CN110916693A CN 110916693 A CN110916693 A CN 110916693A CN 201911060494 A CN201911060494 A CN 201911060494A CN 110916693 A CN110916693 A CN 110916693A
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exposure
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CN110916693B (en
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李天华
李海春
刘玉东
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Neusoft Medical Systems Co Ltd
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Abstract

The application provides an imaging method, an imaging device, a detector and an X-ray camera system. The method comprises the following steps: setting exposure parameters during pre-exposure according to a detected body, and controlling the radioactive source to emit X rays according to the exposure parameters during the pre-exposure; acquiring a first signal of a detector by using the control unit, and determining an exposure parameter during formal exposure according to the first signal and the exposure parameter during pre-exposure, wherein the detector receives the X-ray; controlling the radioactive source to emit X rays according to the exposure parameters during the formal exposure; and acquiring a second signal of the detector by using the control unit, and imaging according to the second signal. According to the method and the device, the exposure parameters during formal exposure are determined according to the signals and the exposure parameters received during pre-exposure, and the imaging quality is improved.

Description

Imaging method, imaging device, detector and X-ray camera system
Technical Field
The present disclosure relates to the field of medical equipment technologies, and in particular, to an imaging method, an imaging device, a detector, and an X-ray imaging system.
Background
Digital Radiography (DR) systems are widely used because of their advantages such as low radiation dose, high quality of impact, and the like. In order to obtain a desired image quality, it is necessary to set appropriate exposure parameters for the DR system.
Currently, the Exposure parameter adjustment method is usually used as AEC (Automatic Exposure Control), which uses the feedback signal of the ionization chamber to make the irradiation dose of the flat panel detector constant to achieve stable image quality. The AEC method has higher requirements on the positioning and the selection of an interested region, an operator needs to accurately align a part to be shot with a field where an ionization chamber is located, and if deviation exists, the image quality is reduced due to insufficient dose; and AEC methods are highly system demanding, require ionization chamber devices, and are not conducive to mobile DR or portable DR applications.
Disclosure of Invention
In order to overcome the problems in the related art, the present specification provides an imaging method, an imaging device, a detector and an X-ray imaging system.
Specifically, the method is realized through the following technical scheme:
in a first aspect, an imaging method is provided, which is applied to a workstation of an X-ray imaging system, the system further includes a radiation source and a detector, wherein the detector is configured with a control unit, and the method includes: setting exposure parameters during pre-exposure according to a detected body, and controlling the radioactive source to emit X rays according to the exposure parameters during the pre-exposure; acquiring a first signal of a detector by using the control unit, and determining an exposure parameter during formal exposure according to the first signal and the exposure parameter during pre-exposure, wherein the X-ray is received; controlling the radioactive source to emit X rays according to the exposure parameters during the formal exposure; and acquiring a second signal of the detector by using the control unit, and imaging according to the second signal.
Optionally, the detector comprises a plurality of detection regions; the acquiring a first signal of a detector by the control unit includes: reading the first signal of the designated detection area at a set distance in the row direction and/or the column direction, wherein the detector receives the X-ray.
Optionally, the determining, according to the first signal and the exposure parameter during pre-exposure, the exposure parameter during formal exposure includes: carrying out weighted average on data corresponding to the first signal in a local area to obtain sampling data; performing dark field correction and gain correction on the sampled data by using the control unit to obtain corrected sampled data; obtaining a corrected pre-exposure image according to the corrected sampling data; and determining exposure parameters during formal exposure according to the corrected pre-exposure image.
Optionally, the exposure parameters include tube voltage and exposure dose; the determining exposure parameters during formal exposure according to the corrected pre-exposure image comprises: acquiring the equivalent thickness of the region of interest of the detected body according to the exposure parameters during the pre-exposure and the corrected pre-exposure image; determining the tube voltage corresponding to the equivalent thickness during formal exposure according to the parameter relationship between the equivalent thickness and the tube voltage; obtaining the unit gray scale during formal exposure according to the parameter relationship among the equivalent thickness, the tube voltage and the unit gray scale; the exposure dose in the main exposure is obtained from the unit gray scale and the desired gray scale in the main exposure.
Optionally, the acquiring an equivalent thickness of the object according to the exposure parameter during the pre-exposure and the corrected pre-exposure image includes: acquiring a thickness distribution map of the detected body according to the exposure parameters during the pre-exposure and the corrected pre-exposure image; determining an interested area of the detector according to the thickness distribution map and the current shooting part; obtaining a region of interest of the subject corresponding to the region of interest of the detector; an equivalent thickness of a region of interest of the subject is obtained.
Optionally, the method further includes: and normalizing the gray value of the corrected pre-exposure image according to the relationship between the exposure dose and the source image distance and the relationship between the exposure dose and the gray value.
Optionally, the detector is further configured with a storage unit, and the method further includes: generating a dark field correction file and a gain correction file; sending the dark field correction file and the gain correction file to the storage unit; the dark field correction and the gain correction of the sampled data by the control unit include: the control unit obtains the dark field correction file and the gain correction file from the storage unit, and performs dark field correction and gain correction on the sampled data using the dark field correction file and the gain correction file.
Optionally, the method further includes: acquiring a parameter relation between the equivalent thickness and the tube voltage, and generating a first parameter relation file; acquiring the parameter relationship among the equivalent thickness, the tube voltage and the unit gray scale, and generating a second parameter relationship file; sending the first parameter relation file and the second parameter relation to the storage unit; determining the tube voltage corresponding to the equivalent thickness during formal exposure according to the parameter relationship between the equivalent thickness and the tube voltage, wherein the determining comprises the following steps: the control unit reads the first parameter relation file from the storage unit and determines the tube voltage during formal exposure according to the equivalent thickness; the obtaining the unit gray scale during formal exposure according to the parameter relationship among the equivalent thickness, the tube voltage and the unit gray scale comprises: and the control unit reads the second parameter relation file from the storage unit and determines the unit gray scale during formal exposure according to the equivalent thickness and the tube voltage during formal exposure.
Optionally, the acquiring, by the control unit, the first signal of the detector further includes: reading first signals of adjacent rows in response to the acquired detector row signals being abnormal; marking the abnormal row; the acquiring, with the control unit, a second signal of the detector includes: and reading the line signals which are not marked with the abnormity in the detector.
In a second aspect, an imaging device is provided for a workstation of an X-ray imaging system, the system further comprising a radiation source and a detector, wherein the detector is provided with a control unit, the device comprising: the pre-exposure unit is used for setting exposure parameters during pre-exposure according to the detected object and controlling the radioactive source to emit X rays according to the exposure parameters during pre-exposure; the determining unit is used for acquiring a first signal of a detector by using the control unit and determining an exposure parameter during formal exposure according to the first signal and the exposure parameter during pre-exposure, wherein the detector receives the X-ray; the formal exposure unit is used for controlling the radioactive source to emit X rays according to the exposure parameters during the formal exposure; and the imaging unit is used for acquiring second signals of all detection areas of the detector by using the control unit and imaging according to the second signals.
In a third aspect, a detector is provided, which is applied to an X-ray imaging system, the system further includes a radioactive source, wherein, in a pre-exposure stage, the radioactive source emits X-rays according to exposure parameters during pre-exposure, and the exposure parameters during pre-exposure are set according to a detected body; in the formal exposure stage, the radioactive source emits X rays according to exposure parameters during the formal exposure; the detector includes: the photosensitive layer is used for converting the X-rays emitted by the radioactive source into visible light in a pre-exposure stage and a formal exposure stage; a conversion layer for converting the visible light output from the photosensitive layer into an electrical signal; and the control unit is used for acquiring the electric signal output by the conversion layer in a pre-exposure stage, determining an exposure parameter in formal exposure according to the signal and the exposure parameter in the pre-exposure stage, acquiring the electric signal output by the conversion layer in the formal exposure stage, and imaging according to the signal.
In a fourth aspect, there is provided a workstation comprising a memory for storing computer instructions executable on a processor, the processor being configured to implement the imaging method described above when executing the computer instructions.
In a fifth aspect, an X-ray imaging system is provided, said system comprising a radiation source, a detector provided with a control unit, and a workstation as described above.
According to the method and the device, the exposure parameters during formal exposure are determined according to the signals received during pre-exposure and the exposure parameters, the radioactive source is controlled to emit X rays according to the exposure parameters during formal exposure, imaging is carried out according to the signals received during timing exposure, and the imaging quality is improved; and the control unit of the detector is used for calculating formal exposure parameters, so that the imaging speed and efficiency are improved.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the specification.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present specification and together with the description, serve to explain the principles of the specification.
Fig. 1 is a schematic structural diagram of an X-ray imaging system according to at least one embodiment of the present application;
FIG. 2 is a flow chart of an imaging method in accordance with at least one embodiment of the present application;
FIG. 3 is a schematic diagram of a reading mode of a detector according to at least one embodiment of the present disclosure;
FIG. 4 is a schematic diagram of a detection region of a detector according to at least one embodiment of the present application;
FIG. 5 is a flowchart of an exposure process according to at least one embodiment of the present application;
FIG. 6 is a flowchart of a method for determining exposure parameters during a formal exposure according to at least one embodiment of the present application;
FIG. 7 is a flowchart of a method for determining exposure parameters during a formal exposure based on a corrected pre-exposure image according to at least one embodiment of the present application;
FIG. 8 is a schematic view of an X-ray imaging system architecture according to at least one embodiment of the present application;
FIG. 9 is a schematic view of an imaging device in accordance with at least one embodiment of the present application;
fig. 10 is a schematic structural diagram of a workstation according to at least one embodiment of the present application.
Detailed Description
Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present specification. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the specification, as detailed in the appended claims.
Fig. 1 is a schematic structural diagram of an X-ray imaging system according to at least one embodiment of the present application. The system may include a workstation 11, a radiation source 12, and a detector 13. Wherein the radiation source 12 may include a high voltage generator 121 and a bulb 122, the detector 13 may be, for example, a digital flat panel detector, and the main body of the detector 13 includes a photosensitive layer 131 and a photoelectric conversion layer 132. Among them, the photosensitive layer 131 may be a scintillator layer or a phosphor layer for converting X-ray photons into visible light; the photoelectric conversion layer 132 may be an array of photodiodes, or may be an amorphous silicon array having a photodiode function for converting visible light into an electrical signal. The detector 13 further comprises a control unit 133 and a storage unit 134, the control unit 133 is connected to the photoelectric conversion layer 132 for processing the converted electrical signal, and the storage unit 134 is connected to the control unit 133 for storing the processing result. Wherein the control unit 133 may be a microcontroller MCU, a digital signal processor DSP, a field programmable gate array FPGA, etc., and it should be understood by those skilled in the art that the control unit 133 may be a suitable type of processor, which is not limited by the present disclosure.
As shown in fig. 1, the workstation 11 may be configured to generate exposure parameters such as a tube voltage (kv), an exposure dose (mAs), and a filtering parameter (a filtering material, a thickness, etc. provided at a front end of the bulb), and send the exposure parameters to the high voltage generator 121, and the high voltage generator 121 controls the bulb 122 to emit an exposure ray (e.g., an X-ray) according to the exposure parameters. The exposure radiation passes through the subject 14 and is received by the detector 13. The workstation 11 may generate an exposure image of the subject 14 from the radiation received by the detector 13, which may be used for medical diagnosis of the subject 14. The exposure parameters generated by the workstation 11 directly affect the quality of the subsequent exposure image, and the quality of the exposure image can be adjusted by adjusting the exposure parameters, such as tube voltage, exposure dose, and the like.
The imaging method comprises two stages of pre-exposure and formal exposure, wherein an exposure parameter can be preset according to experience during pre-exposure, an object to be detected is exposed through the preset exposure parameter, and the formal exposure parameter is determined according to a signal and the exposure parameter received by a detector in the pre-exposure process; and then exposing the object according to the formal exposure parameters to obtain an exposure image of the object. The determined exposure parameters during the formal exposure are more accurate than those during the pre-exposure, so that the quality of the image obtained by the formal exposure is improved.
The imaging method of the embodiment of the present disclosure is described in detail below with reference to the X-ray imaging system shown in fig. 1.
FIG. 2 is a flowchart of an imaging method according to at least one embodiment of the present disclosure, as shown in FIG. 2, the method is applicable to a workstation of an X-ray imaging system, and may include steps 201 to 204:
in step 201, exposure parameters at the time of pre-exposure are set according to a subject, and the radiation source is controlled to emit X-rays according to the exposure parameters at the time of pre-exposure.
The exposure parameters at the time of pre-exposure (pre-exposure parameters) may include tube voltage, exposure dose, filtering parameters, and the like. In the scanning process, the pre-exposure parameter is too small, and the feedback gray scale of the detector is too low, so that the calculation precision and the imaging quality are reduced; too large a pre-exposure parameter may cause additional injury to the patient. Therefore, it is necessary to determine the pre-exposure parameters according to the body thickness based on the body thickness range of the photographed (APR) part or by obtaining the body thickness of the patient by means of external measurement. The pre-exposure parameters may be set empirically from the subject.
The radiation source is controlled to emit X-rays according to the pre-exposure parameters, which may be sent to a high voltage generator in the radiation source, for example, which controls the bulb to emit X-rays according to the exposure parameters.
In step 202, a control unit is used to acquire a first signal of a detector, and an exposure parameter during formal exposure is determined according to the first signal and the exposure parameter during pre-exposure, where the detector receives the X-ray, and the control unit is a control unit configured for the detector.
The imaging method in the embodiment of the present disclosure is different from the conventional imaging method, and instead of acquiring the signal of the detector by using the workstation, the signal of the detector is acquired by using the control unit configured to the detector, and the exposure parameter (formal exposure parameter) during the formal exposure is calculated by using the detector. For the purpose of distinguishing from the signal of the detector during the main exposure phase, the signal of the detector acquired during the pre-exposure phase may be referred to as a first signal.
The control unit of the detector is utilized to directly acquire and calculate the signals of the detector, so that the process of transmitting the signals to a workstation is omitted, time is saved, efficient data processing is realized, and the integrity and accuracy of the signal data are also ensured.
In the embodiment of the present disclosure, the control unit determines the exposure parameter during the formal exposure according to the acquired first signal and the exposure parameter during the pre-exposure. The specific method for determining the formal exposure parameters will be described in detail later.
In step 203, the radiation source is controlled to emit X-rays according to the exposure parameters during the formal exposure.
The exposure process of controlling the radioactive source to emit X-rays according to the formal exposure parameters is similar to that of the pre-exposure stage, and is not described herein again.
In step 204, a second signal of the detector is acquired by the control unit and imaging is performed according to the second signal.
Similar to the pre-exposure stage, the control unit configured for the detector is used for directly acquiring the signal of the detector, and the workstation images according to the acquired signal, namely, a formal exposure image is obtained. For the purpose of distinguishing from the pre-exposure phase, the signal of the detector acquired during the main exposure phase is referred to as a second signal.
In the embodiment of the disclosure, the exposure parameters during formal exposure are determined according to the signals received during pre-exposure and the exposure parameters, the radiation source is controlled to emit X-rays according to the exposure parameters during formal exposure, and imaging is performed according to the signals received during timing exposure, so that the imaging quality is improved; and the control unit of the detector is used for calculating formal exposure parameters, so that the imaging speed and efficiency are improved.
Fig. 3 is a flowchart of an exposure timing sequence according to at least one embodiment of the present application, which shows an exposure timing sequence flow taking a soft trigger mode as an example, and specifically includes:
after setting the exposure parameters (tube voltage kv _ pre and exposure dose mAs _ pre) during pre-exposure, the workstation WS triggers a preparation command to the high voltage generator, starts the rotating anode, and feeds back a ready signal to the workstation WS after waiting for the rotating anode to be ready.
After receiving the ready signal from the high voltage generator, the workstation WS sends a pre-exposure request command to the detector, and after receiving the request, the detector executes a preparation command, including clearing dark current and opening a pre-exposure acquisition window. After the detector opens the exposure window, a ready signal is fed back to the workstation WS.
And after receiving a ready signal from the detector, the workstation WS triggers an X-ray (X ray On) emitting command to control the high-voltage generator to emit X-rays.
In the X-ray emission process, the detector synchronously accumulates rays, when the rays stop, the detector executes an automatic exposure calculation process, and according to the acquired signals and the exposure parameters in the pre-exposure process, the exposure parameters in the formal exposure process are calculated: the tube voltage kv and the exposure dose mAs, and the kv and mAs values are fed back to the workstation.
And the workstation sends kv and mAs values to the high-voltage generator, sends a formal exposure request signal to the detector after receiving a ready signal from the high-voltage generator again, and the detector executes a preparation command including clearing and dimming current, opening an exposure acquisition window and feeding back the ready signal to the workstation after the ready.
The workstation triggers an X-ray emission (X ray On) command again, and controls the high-voltage generator to emit X-rays. And the detector synchronously accumulates rays, reads data after the exposure window is finished, executes a correction process, and obtains exposure image data through the corrected read data. The detector can send the corrected read data to the workstation WS, and the workstation WS carries out imaging; or the detector may image and send the resulting exposure image to the workstation WS.
In order to make the parameter adjustment more accurate, the exposure parameter adjustment method provided in the embodiment of the present application includes two parts, namely, a correction part and an application part, where the correction part mainly establishes a parameter relationship model that is needed in the exposure parameter adjustment through sampling data, for example, the model may include a relationship between an exposure parameter and an image gray scale of an exposure image, and the model may be applied to the application part, that is, the application part starts to formally perform exposure scanning on a subject (e.g., a patient). In both calibration and application, pre-exposure and main exposure are included, respectively.
In the correction process, a die body can be used, corresponding exposure parameters, die body thickness and gray image parameters of an image are respectively obtained by pre-exposing and formal exposing the die body, and a relation model between the three parameters under the conditions of pre-exposing and formal exposing is respectively established.
It should be noted that the relationship model during pre-exposure and the relationship model during main exposure are related by "equivalent thickness", because the equivalent thickness is a constant factor during both pre-exposure and main exposure. The 'equivalent thickness' is the thickness of the die body when the die body made of a specific material is used for simulating a human body with a specific composition, and the die body and the human body with the same equivalent thickness can realize the approximate function of energy spectrum attenuation. The actual body thickness can be converted to an equivalent thickness for the corresponding phantom.
The pre-exposure process and the main exposure process are further described below.
In the pre-exposure process, when a detector receives a pre-exposure request, a control unit performs emptying image processing on the detector. The clear image processing means clearing the charges accumulated by the dark current, reducing image noise. The purge process is similar to the data read process and requires scanning of the detector panel.
The detection area for performing the emptying image processing according to the exposure target requirement may be the whole detector or a designated detection area. In some embodiments, to speed up the reading process, only the designated detection region may be cleared and the first signal of the designated detection region read. The designated detection area is one or more of a plurality of detection areas comprised by the detector.
Fig. 4 is a schematic diagram of a pixel unit of a detector according to at least one embodiment of the present application. As shown in fig. 4, each pixel cell of the detector is mainly composed of a photodiode 401 having photosensitivity and a switching diode 402, a row driving line 403 and a column readout line 404, which are not sensitive to light. The row driving lines of all the pixel units in the same row are connected, that is, the on/off of the switching diodes 402 in the same row are controlled uniformly, and the column readout lines of all the pixel units in the same column are connected. With the switching diode 402 turned off, the current generated by the visible light exciting the photodiode 401 is stored in the capacitance of the photodiode itself, and the amount of charge stored per pixel unit is in direct proportion to the intensity of the incident X-ray. When the switching diode 402 is turned on, the accumulated electric charges are read out. It should be noted that since the switching diodes 402 of all pixel cells in the same row are controlled in unison, all pixel cells in the same row are read out simultaneously. Further, the charge amount stored by each pixel unit, that is, the size of the X-ray incident to the pixel unit, is determined according to the column where the pixel unit is located.
The control unit of the detector can control the on-off of the switch diodes of each row, so that the reading of row signals is realized. The diode switches can be controlled to be conducted line by line to realize line-by-line reading; the diode switches of the set row can also be controlled to be conducted to read the signals of the set row. The column signal is determined according to the position of the pixel unit.
In case the detector comprises a plurality of detection areas, each detection area may comprise a set number of rows and columns. As shown in fig. 5, the detector comprises D x D detection zones, wherein the grey detection zones represent the designated detection zones. It will be appreciated by those skilled in the art that D x D is merely an example and that the detector may comprise other numbers of detection zones.
In order to speed up the reading process, the first signals of the detectors can also be read at set distances apart in the row direction and/or in the column direction. For example, the reading can be performed at intervals of 1 to 5 mm. For a region requiring a large visual field such as a chest radiograph and lumbar vertebra, for example, a scan interval of 5mm may be selected for reading, and for a small region such as a hand, a sufficient region, and a nose, for example, a scan interval of 1mm may be set. Since small region projection is usually performed to reduce patient exposure, a beam light is used to block tissue outside the examination region, which usually specifies the scan region range.
Because the detector may have a bad line, in the scanning process, in response to the acquired detector row signal abnormality, that is, the line is bad, the row signal of the adjacent row is read, and the abnormal row is marked, that is, the position of the abnormal row is recorded. During formal exposure, only row signals which are not marked with abnormity are read without reading signals of bad lines.
Fig. 6 is a flowchart of a method for determining exposure parameters during a main exposure according to at least one embodiment of the present application. As shown in FIG. 6, the method includes steps 601-604.
In step 601, the data corresponding to the first signal is weighted-averaged in the local area to obtain the sample data.
Referring to the exposure process shown in fig. 3, after the pre-exposure acquisition window is finished, the control unit of the detector reads the first signal of the detector, and performs weighted average on data corresponding to the first signal in a local area to obtain sampling data. The size of the local area is also the sampling interval.
For example, for a single row of data, the local region may be a region comprising N rows and N columns, and the specific value of N may be obtained by dividing the scan interval by the pixel size as described above. The sample data may be obtained according to the following equation:
Figure BDA0002257807580000111
wherein m and n are respectively the coordinates of column and row directions for marking the sampling image, and m is xi//N,n=y。
For consecutive rows of data, a local region may be a region comprising M rows and N columns, the specific value of N may be obtained by dividing the scan interval by the pixel size as described above,
Figure BDA0002257807580000112
where density represents the grid density and resolution represents the pixel size. The sample data may be obtained according to the following equation:
Figure BDA0002257807580000113
wherein m and n are respectively the coordinates of column and row directions for marking the sampling image, and m is xi//N,b=yj//M。
In DR applications, a low-density grid is used, and when the distribution direction of the scanning lines is consistent with the direction of the grid stripes, the pixels may have signal differences, which results in a decrease in the final control accuracy. This problem can be overcome by performing a weighted average in a local area.
In step 602, dark field correction and gain correction are performed on the sampled data by the control unit to obtain corrected sampled data.
In this step, the detector is subjected to dark positive correction and gain correction by the control unit to correct different response characteristics of each pixel of the detector.
The dark field correction can be expressed by the following formula:
IB(x,y)=I(x,y,T)-B(x,y,T) (3)
wherein, IB(x, y) represents sampling data after dark field correction, I (x, y, T) represents a bright field image corresponding to an exposure window T, B (x, y, T) is a dark field image with the same exposure window T, the bright field image is an image read when rays exist in the exposure process, and the dark field image represents that no rays exist in the exposure windowThe image read by the ray.
The gain correction can be expressed by the following equation:
IC(x,y)=(I(x,y,T)-B(x,y,T))×G(x,y) (4)
wherein, IC(x, y) represents the gain-corrected sampled data,
Figure BDA0002257807580000123
wherein S represents a target gray scale, may be based on
Figure BDA0002257807580000121
All the pixels are averaged to obtain the average value,
Figure BDA0002257807580000122
mean multiple acquisitions of averaged dark field corrected data.
In some embodiments, the method further comprises: a workstation generates a dark field correction file and a gain correction file off line; sending the dark field correction file and the gain correction file to a storage unit of the detector; the control unit obtains the dark field correction file and the gain correction file from the storage unit, and performs dark field correction and gain correction on the sampled data using the dark field correction file and the gain correction file.
The dark field correction file may include a pre-exposure dark field correction file, which is a correction file based on sampling data, and a full-size dark field correction file, which may be used for dark field correction at the time of the formal exposure. The gain correction file may include a pre-exposure gain correction file that is a correction file based on sample data and a full-size gain correction file that may be used for gain correction at the time of formal exposure. The dark field correction file and the gain correction file are generated by a workstation in an off-line mode and are sent to a storage unit of the detector to be stored. The storage unit also stores a dead pixel file for pre-exposing the detector.
In step 603, a corrected pre-exposure image is obtained based on the corrected sample data.
In step 604, exposure parameters at the time of the formal exposure are determined from the corrected pre-exposure image.
Fig. 7 is a flowchart of a method for determining exposure parameters during a formal exposure according to a corrected pre-exposure image according to at least one embodiment of the present application. As shown in FIG. 7, the method includes steps 701-704.
In step 701, an equivalent thickness of a region of interest of the subject is acquired according to the exposure parameters at the time of the pre-exposure and the corrected pre-exposure image.
In some embodiments, the equivalent thickness of the subject may be obtained by:
first, a thickness distribution map of the subject is acquired based on the exposure parameters at the time of the pre-exposure and the corrected pre-exposure image.
In one example, the exposure parameters at the time of the pre-exposure and the corrected pre-exposure image may be input into a thickness model file, and a thickness distribution map of the object may be obtained. The thickness model file stores the relation data between the equivalent thickness and the image gray scale parameter.
In one example, the thickness model file may be generated by:
obtaining the relation between the thickness of the phantom and the image gray level (average gray level) under the determined filtration type, tube voltage and exposure dose:
thick=fthick(log(gray1)) (5)
according to the determined exposure setting (kv)pre,filterpre,mAspre) And acquiring data of the corrected phantom, and extracting corresponding combinations of equivalent thickness and gray scale from the phantom image, such as { (thick1, gray1), (thick2, gray2), (thick3, gray3), … …, (thick N, gray N) }, so that the relation between the equivalent thickness and the gray scale can be obtained through data fitting. For example, a polynomial fit is used, as shown in the following equation:
Figure BDA0002257807580000131
where n is an integer, for example, 5. Wherein gray1、…grayNThe normalized gray values are represented, for example, by subtracting the gray reference value from the gray values and dividing by the exposure dose.
When a phantom is exposed according to a certain exposure parameter, the gray scale parameter of the exposure image corresponding to the exposure parameter can be determined according to the exposure image obtained by exposure. For example, when the die body is pre-exposed by the tube voltage kv-1 and the exposure dose mAs-1, the image gray scale parameter of the pre-exposed image of the die body can be obtained, and when the die body is formally exposed by the tube voltage kv-2 and the exposure dose mAs-2, the image gray scale parameter of the formally exposed image of the die body can be obtained.
According to the exposure parameters during pre-exposure and the corrected pre-exposure image, the corresponding gray scale parameters of the corrected pre-exposure image can be obtained, and according to the relation between the equivalent thickness and the gray scale stored in the thickness model, the thickness distribution map of the detected body can be obtained.
And then, determining the region of interest of the detector according to the thickness distribution map and the current shooting part.
In one example, high-density or low-density pixels of abnormal human tissue outside the thickness range may be excluded in conjunction with the thickness range [ T1, T2] of the photographing site. Then, in the thickness distribution map, the interested region of the detector is determined by combining the current shooting part.
Next, a region of interest of the object corresponding to the region of interest of the probe is obtained.
Finally, an equivalent thickness of a region of interest of the subject is obtained.
After obtaining the equivalent thickness of the region of interest of the object, step 702 is performed.
In step 702, a tube voltage at the time of formal exposure corresponding to the equivalent thickness is determined according to a parameter relationship between the equivalent thickness and the tube voltage.
Assuming that, under the condition that the pre-exposure parameters are kv-1 and mAs-1, the average gray scale of the exposure image after pre-exposure is gray-1 at the position corresponding to the equivalent thickness thick-1 in the phantom, and similarly, the average gray scale of the exposure image after pre-exposure is gray-2 at the position corresponding to the equivalent thickness thick-2 in the phantom, and so on, the corresponding sample data of multiple groups of equivalent thicknesses and gray scales are obtained. When the voltage of an exposure parameter tube of pre-exposure is changed to kv-2 and the exposure dose is mAs-2, the model is exposed, and a corresponding exposure image can be obtained, at this time, the average gray scale of the image will change. The following table 1 illustrates sample data acquired in a pre-exposure, in which only part of the data is illustrated:
TABLE 1 Pre-exposure sample data Collection
Figure BDA0002257807580000141
As can be seen from table 1, in the pre-exposure sample data, the equivalent thickness of the phantom is not changed, and the gray scale parameter of the exposure image is changed when the exposure parameter is changed; similarly, when the mold body is subjected to main exposure, sample data similar to those in table 1 can be obtained and are not listed. That is, in this step, a sample of a plurality of sets of exposure parameters, equivalent thicknesses, and gray-scale parameters at the time of pre-exposure is obtained, and a plurality of sets of parameters at the time of main exposure can be obtained in the same manner. These parameters can be used in subsequent steps to establish a relationship between the parameters under pre-exposure and main exposure, respectively.
The acquisition of the exposure parameter tube voltage kv during the formal exposure can be realized by the following method: a mapping relation lookup table between the equivalent thickness and the tube voltage kv can be established in advance according to experience, and the mapping relation between any equivalent thickness and the tube voltage kv of the formal exposure can be determined by an interpolation method according to the mapping relation lookup table. Thus, after the equivalent thickness is obtained in the subsequent application, the tube voltage kv of the formal exposure can be obtained according to the mapping relation. The mapping relation lookup table can be obtained by performing a clinical test or a test on a human body simulation model body, calculating the equivalent thickness according to a large number of tests, observing the image quality, and selecting the tube voltage kv with better image quality for the given equivalent thickness.
In step 703, obtaining a unit gray level during formal exposure according to the parameter relationship among the equivalent thickness, the tube voltage, and the unit gray level;
in one example, a parametric relationship between the equivalent thickness and the tube voltage kv, unit gray scale can be established under pre-exposure, as shown in equation (7) below:
ugray=fgray(kv,thick) (7)
wherein, the ugray is unit gray. The unit gray can be calculated according to equation (8):
Ugray=gray/mAs (8)
under formal exposure, the parameter relation between the unit gray scale, the tube voltage kv and the equivalent thickness can be obtained.
Through the above-mentioned correction process, the parameter relationship of the pre-exposure and the parameter relationship of the formal exposure can be respectively established, and the effective thickness thick in the two formulas is the same. That is, in the pre-exposure, the equivalent thickness of the object (e.g., phantom) can be obtained according to the exposure parameters in the pre-exposure and the gray-scale parameters of the pre-exposure image; however, the equivalent thickness is kept constant during the main exposure, and the unit gray scale of the exposure image during the main exposure can be calculated based on the calculated equivalent thickness and the exposure parameter tube voltage kv during the main exposure.
In step 704, an exposure dose in the main exposure is obtained from the unit gray scale and the desired gray scale in the main exposure.
After the unit gradation of the exposure image at the time of the main exposure is obtained, the mAs at the time of the main exposure is obtained from the unit gradation and the desired gradation by combining equation (7):
Figure BDA0002257807580000161
wherein, graytargetExpressing a desired gray (target gray), and Graybase expressing grayA reference value.
The relationship between the equivalent thickness, the tube voltage and the parametric relationship between the equivalent thickness, the tube voltage and the unit gray scale are stored as a dose model file. The relationship between the equivalent thickness, the tube voltage and the unit gray in the dose model file also needs to be extracted from the phantom image to obtain the corresponding combination of the thickness and the gray, and then the kv setting is changed, for example:
{(kv1,thick1,gray1),(kv1,thick2,gray2),……,(kv1,thickN,grayN);
(kv2,thick1,grayN+1),(kv2,thick2,grayN+2),……,(kv2,thickN,grayN+N); (10)
……
(kvM,thick1,gray(M-1)*N+1),(kvM,thick1,gray(M-1)*N+2),……,(kvM,thickN,grayM*N)}
polynomial fitting is performed by equation (11):
Figure BDA0002257807580000162
in one example, the appropriate filtering can also be selected based on the equivalent thickness, so the dose model then becomes:
gray=fgray(kv,thick,kilter)
in one example, the gray scale values of the corrected pre-exposure map may be normalized according to the relationship of exposure dose to source image distance and the relationship of exposure dose to gray scale.
In some embodiments, the workstation may generate and transmit the thickness model file and the dose model file to the storage unit. The control unit acquires the thickness model file and the dose model file from the storage unit, determines equivalent filtering of the region of interest of the detected object according to the thickness model file, and determines exposure parameters including tube voltage and exposure dose during formal exposure according to the equivalent thickness and the dose model file.
The dose model file comprises a first parameter relation file, namely a parameter relation between the equivalent thickness and the tube voltage, and a second parameter relation file, namely a parameter relation between the equivalent thickness, the tube voltage and the unit gray level. The control unit reads the first parameter relation file from the storage unit, determines the tube voltage during formal exposure according to the equivalent thickness, reads the second parameter relation file from the storage unit, and determines the unit gray scale during the formal exposure according to the equivalent thickness and the tube voltage during the formal exposure.
In some embodiments, the offline APR parameter file may be stored in a storage unit of the detector, and the tube voltage kv and the filtering during the formal exposure may be obtained through a lookup table according to the equivalent thickness value.
Fig. 8 is a schematic diagram of an X-ray imaging system architecture according to at least one embodiment of the present application. As shown in fig. 8, the workstation includes an image correction module, a thickness correction module, and a dose correction module, wherein the image correction module is configured to generate an image correction file, specifically including a dark field correction file, a gain correction file, and a dead pixel correction file, the thickness correction module is configured to generate a thickness model file, and the dose correction file is configured to generate a dose model file. The detector is provided with a storage unit and a control unit, wherein the storage unit receives and stores an image correction file, a thickness model file and a dose model file from a workstation, and meanwhile, an offline APR parameter file is also stored in the storage unit. The control unit comprises a data acquisition module, an image correction module, a thickness correction module, a dose calculation module and an ROI analysis module. The data acquisition module is used for acquiring signals of the detector, the image correction module is used for performing field calibration correction, gain correction and dead pixel correction, the thickness calculation module is used for calculating the equivalent thickness of the region of interest of the object to be detected, the dose calculation module is used for calculating exposure parameters including tube voltage and exposure dose during formal exposure, and the ROI analysis module is used for determining the region of interest of the object to be detected.
The region of interest of the object corresponds to the region of interest of the detector. Determining the region of interest of the detector includes manual and automatic means. The manual mode refers to a feedback position designated according to an exposure protocol or a feedback position adjusted by a user as required. In the manual mode, the output of interest is the selected region.
For the automatic mode, the number of effective pixels in the thickness map is detected first, if the detection requirement is not met, the interested output is specified according to the protocol, and if the identification requirement is met, the identification of the feedback signal can be carried out according to the number of the shooting part (APR D).
In one example, the region of interest of the detector may be determined according to the following scheme: performing histogram statistics on the thickness map of the effective tissue; and setting an accumulator, starting scanning from the histogram minimum channel, updating the number of the scanned channels to the accumulator, and calculating the ratio of the value of the accumulator to the total number. When the ratio reaches a predefined scale factor, the scanning is stopped, and the corresponding thickness of the channel is output as the region of interest.
The execution sequence of each step in the flowcharts shown in fig. 2, 6 and 7 is not limited to the sequence in the flowcharts. Furthermore, the description of each step may be implemented in software, hardware or a combination thereof, for example, a person skilled in the art may implement it in the form of software code, and may be a computer executable instruction capable of implementing the corresponding logical function of the step. When implemented in software, the executable instructions may be stored in a memory and executed by a processor in the system.
The present disclosure also provides embodiments of an imaging apparatus, a detector, a workstation and an X-ray imaging system corresponding to the embodiments of the imaging method described above.
Referring to fig. 9, a schematic structural diagram of an imaging apparatus provided in at least one embodiment of the present disclosure is shown. The device is applied to the workstation of X ray camera system, the system still includes radiation source, detector, wherein, the detector disposes the control unit, the device includes: a pre-exposure unit 901, configured to set exposure parameters during pre-exposure according to a subject, and control the radiation source to emit X-rays according to the exposure parameters during pre-exposure; a determining unit 902, configured to acquire a first signal of a detector by using the control unit, and determine an exposure parameter during formal exposure according to the first signal and the exposure parameter during pre-exposure, where the detector receives the X-ray; a formal exposure unit 903, configured to control the radiation source to emit X-rays according to exposure parameters during the formal exposure; an imaging unit 904, configured to acquire a second signal of each detection region of the detector by using the control unit, and perform imaging according to the second signal.
The present disclosure also provides a detector, in a pre-exposure stage, a radioactive source emits X-rays according to exposure parameters during pre-exposure, the exposure parameters during pre-exposure being set according to a subject; in the formal exposure stage, the radioactive source emits X rays according to exposure parameters during the formal exposure; the detector includes: the photosensitive layer is used for converting the X-rays emitted by the radioactive source into visible light in a pre-exposure stage and a formal exposure stage; a conversion layer for converting the visible light output from the photosensitive layer into an electrical signal; and the control unit is used for acquiring the electric signal output by the conversion layer in a pre-exposure stage, determining an exposure parameter in formal exposure according to the signal and the exposure parameter in the pre-exposure stage, acquiring the electric signal output by the conversion layer in the formal exposure stage, and imaging according to the signal.
Referring to fig. 10, a schematic structural diagram of a workstation according to at least one embodiment of the present disclosure is provided, where the workstation includes a memory and a controller, the memory unit is used for storing computer instructions executable on a processor, and the processor is used for implementing the imaging method according to any embodiment of the present disclosure when executing the computer instructions.
In the embodiments of the present application, the computer readable storage medium may be in various forms, such as, in different examples: a RAM (random Access Memory), a volatile Memory, a non-volatile Memory, a flash Memory, a storage drive (e.g., a hard drive), a solid state drive, any type of storage disk (e.g., an optical disk, a dvd, etc.), or similar storage medium, or a combination thereof. In particular, the computer readable medium may be paper or another suitable medium upon which the program is printed. Using these media, the programs can be electronically captured (e.g., optically scanned), compiled, interpreted, and processed in a suitable manner, and then stored in a computer medium.
The above description is only exemplary of the present application and should not be taken as limiting the present application, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present application should be included in the scope of protection of the present application.

Claims (13)

1. An imaging method, applied to a workstation of an X-ray imaging system, the system further comprising a radiation source, a detector, wherein the detector is provided with a control unit, the method comprising:
setting exposure parameters during pre-exposure according to a detected body, and controlling the radioactive source to emit X rays according to the exposure parameters during the pre-exposure;
acquiring a first signal of a detector by using the control unit, and determining an exposure parameter during formal exposure according to the first signal and the exposure parameter during pre-exposure, wherein the detector receives the X-ray;
controlling the radioactive source to emit X rays according to the exposure parameters during the formal exposure;
and acquiring a second signal of the detector by using the control unit, and imaging according to the second signal.
2. The method of claim 1, wherein said acquiring a first signal of a detector with said control unit comprises:
the first signals of the detectors are read at set distances in the row direction and/or in the column direction.
3. The method of claim 2, wherein determining the exposure parameters during the main exposure according to the first signal and the exposure parameters during the pre-exposure comprises:
carrying out weighted average on data corresponding to the first signal in a local area to obtain sampling data;
performing dark field correction and gain correction on the sampled data by using the control unit to obtain corrected sampled data;
obtaining a corrected pre-exposure image according to the corrected sampling data;
and determining exposure parameters during formal exposure according to the corrected pre-exposure image.
4. The method of claim 3, wherein the exposure parameters include tube voltage and exposure dose;
the determining exposure parameters during formal exposure according to the corrected pre-exposure image comprises:
acquiring the equivalent thickness of the region of interest of the detected body according to the exposure parameters during the pre-exposure and the corrected pre-exposure image;
determining the tube voltage corresponding to the equivalent thickness during formal exposure according to the parameter relationship between the equivalent thickness and the tube voltage;
obtaining the unit gray scale during formal exposure according to the parameter relationship among the equivalent thickness, the tube voltage and the unit gray scale;
the exposure dose in the main exposure is obtained from the unit gray scale and the desired gray scale in the main exposure.
5. The method according to claim 4, wherein the acquiring an equivalent thickness of the object from the exposure parameter at the time of the pre-exposure and the corrected pre-exposure image comprises:
acquiring a thickness distribution map of the detected body according to the exposure parameters during the pre-exposure and the corrected pre-exposure image;
determining an interested area of the detector according to the thickness distribution map and the current shooting part;
obtaining a region of interest of the subject corresponding to the region of interest of the detector;
an equivalent thickness of a region of interest of the subject is obtained.
6. The method according to any one of claims 1 to 5, further comprising:
and normalizing the gray value of the corrected pre-exposure image according to the relationship between the exposure dose and the source image distance and the relationship between the exposure dose and the gray value.
7. A method according to any of claims 3 to 5, wherein the probe is further provided with a storage unit,
the method further comprises the following steps:
generating a dark field correction file and a gain correction file;
sending the dark field correction file and the gain correction file to the storage unit;
the dark field correction and the gain correction of the sampled data by the control unit include:
the control unit obtains the dark field correction file and the gain correction file from the storage unit, and performs dark field correction and gain correction on the sampled data using the dark field correction file and the gain correction file.
8. The method according to claim 4 or 5, characterized in that the method further comprises:
acquiring a parameter relation between the equivalent thickness and the tube voltage, and generating a first parameter relation file;
acquiring the parameter relationship among the equivalent thickness, the tube voltage and the unit gray scale, and generating a second parameter relationship file;
sending the first parameter relation file and the second parameter relation to the storage unit;
determining the tube voltage corresponding to the equivalent thickness during formal exposure according to the parameter relationship between the equivalent thickness and the tube voltage, wherein the determining comprises the following steps:
the control unit reads the first parameter relation file from the storage unit and determines the tube voltage during formal exposure according to the equivalent thickness;
the obtaining the unit gray scale during formal exposure according to the parameter relationship among the equivalent thickness, the tube voltage and the unit gray scale comprises:
and the control unit reads the second parameter relation file from the storage unit and determines the unit gray scale during formal exposure according to the equivalent thickness and the tube voltage during formal exposure.
9. The method of any one of claims 1 to 5, wherein said acquiring a first signal of a detector with said control unit further comprises:
reading first signals of adjacent rows in response to the acquired detector row signals being abnormal;
marking the abnormal row;
the acquiring, with the control unit, a second signal of the detector includes:
and reading the line signals which are not marked with the abnormity in the detector.
10. An imaging apparatus, characterized in that it is applied to a workstation of an X-ray imaging system, said system further comprising a radiation source, a detector, wherein said detector is provided with a control unit, said apparatus comprising:
the pre-exposure unit is used for setting exposure parameters during pre-exposure according to the detected object and controlling the radioactive source to emit X rays according to the exposure parameters during pre-exposure;
the determining unit is used for acquiring a first signal of a detector by using the control unit and determining an exposure parameter during formal exposure according to the first signal and the exposure parameter during pre-exposure, wherein the detector receives the X-ray;
the formal exposure unit is used for controlling the radioactive source to emit X rays according to the exposure parameters during the formal exposure;
and the imaging unit is used for acquiring second signals of all detection areas of the detector by using the control unit and imaging according to the second signals.
11. A detector is characterized by being applied to an X-ray camera system, and the system also comprises a radioactive source, wherein in a pre-exposure stage, the radioactive source emits X rays according to exposure parameters in the pre-exposure, and the exposure parameters in the pre-exposure are set according to a detected body; in the formal exposure stage, the radioactive source emits X rays according to exposure parameters during the formal exposure;
the detector includes:
the photosensitive layer is used for converting the X-rays emitted by the radioactive source into visible light in a pre-exposure stage and a formal exposure stage;
a conversion layer for converting the visible light output from the photosensitive layer into an electrical signal;
and the control unit is used for acquiring the electric signal output by the conversion layer in a pre-exposure stage, determining an exposure parameter in formal exposure according to the signal and the exposure parameter in the pre-exposure stage, acquiring the electric signal output by the conversion layer in the formal exposure stage, and imaging according to the signal.
12. A workstation comprising a memory for storing computer instructions executable on a processor, the processor being configured to implement the method of any one of claims 1 to 9 when executing the computer instructions.
13. An X-ray camera system, characterized in that the system comprises a radiation source, a detector provided with a control unit, and a workstation according to claim 11.
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