CN110850255B - Test method for multiple lightning strike impulse discharge current - Google Patents
Test method for multiple lightning strike impulse discharge current Download PDFInfo
- Publication number
- CN110850255B CN110850255B CN201911172128.5A CN201911172128A CN110850255B CN 110850255 B CN110850255 B CN 110850255B CN 201911172128 A CN201911172128 A CN 201911172128A CN 110850255 B CN110850255 B CN 110850255B
- Authority
- CN
- China
- Prior art keywords
- voltage
- discharge current
- test
- multiple lightning
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/18—Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The application relates to a test method of multiple lightning stroke impact discharge current, which comprises the following steps: obtaining a test article to be tested and obtaining an application environment of the test article to be tested; selecting a test parameter of the multiple lightning stroke impact discharge current according to an application environment; according to the test parameters, applying positive multiple lightning stroke impact discharge current and negative multiple lightning stroke impact discharge current to the test sample to be tested respectively, and measuring the voltage at two ends of the test sample to be tested and the current passing through the test sample to be tested, wherein the multiple lightning stroke impact discharge current comprises a plurality of pulses; and after the positive polarity multiple lightning stroke impact discharge current and the negative polarity multiple lightning stroke impact discharge current are applied to the to-be-tested sample respectively, judging whether the to-be-tested sample is qualified. The test article prepared by the test method can realize effective protection under different lightning behaviors, and the protection effect of the test article is improved.
Description
Technical Field
The application relates to the technical field of lightning protection, in particular to a test method for multiple lightning stroke impact discharge current.
Background
With the rapid development of economic construction, the application of electronic information equipment has been deepened into various fields of national economy, national defense construction and people's life, and various electronic and microelectronic equipment has been largely used in various industries. Due to the low high voltage capability of these systems and devices, the electromagnetic and thermal effects generated when high voltage of direct or induced lightning and the penetration of lightning electromagnetic pulses cause interference or permanent damage to the systems and devices.
In order to avoid and reduce the loss caused by lightning disasters, various lightning protection and surge protection devices appear in the market, and the performance of the lightning protection devices needs to be tested after production so as to check whether the lightning protection devices meet the use standard or not. The impulse discharge current test is a test method for testing the performance of the lightning protection equipment. The traditional impulse discharge current test method only adopts single pulse to test the lightning protection equipment. However, even if the lightning protection device passes the test, impact aging damage often occurs in practical use, and the purpose of effective protection cannot be achieved.
Therefore, the lightning protection equipment is tested by adopting the traditional impulse discharge current test method, and the protection effect is poor.
Disclosure of Invention
Therefore, it is necessary to provide a test method for multiple lightning strike impulse discharge current for the technical problem that the lightning protection device is tested by adopting the traditional impulse discharge current test method and the protection effect is poor.
A method of testing multiple lightning strike surge discharge current, the method comprising:
acquiring a to-be-tested sample and acquiring an application environment of the to-be-tested sample;
selecting a test parameter of the multiple lightning stroke impact discharge current according to the application environment;
according to the test parameters, applying positive multiple lightning strike impact discharge current and negative multiple lightning strike impact discharge current to the to-be-tested sample respectively, and measuring voltage at two ends of the to-be-tested sample and current passing through the to-be-tested sample, wherein the multiple lightning strike impact discharge current comprises a plurality of pulses;
and after the positive polarity multiple lightning stroke impact discharge current and the negative polarity multiple lightning stroke impact discharge current are applied to the to-be-tested sample respectively, judging whether the to-be-tested sample is qualified.
In one embodiment, the test parameters of the multiple lightning strike surge discharge current are selected according to the application environment, and the test parameters comprise:
determining the protection grade of the to-be-tested sample according to the application environment;
and selecting test parameters of the multiple lightning strike impact discharge current according to the protection grade.
In one embodiment, the test parameters include one or more of the number of pulses included in the multiple lightning strike discharge current, the current amplitude of the multiple lightning strike discharge current at different pulse impacts, the time interval of the multiple lightning strike discharge current at different pulse impacts, and continuous current parameters.
In one embodiment, the selecting the test parameters of the multiple lightning strike surge discharge current according to the protection grade comprises the following steps:
selecting a test parameter of the multiple lightning strike impact discharge current in the following table according to the protection grade;
in one embodiment, the test sample includes a voltage-limiting test sample, a voltage-switching test sample, or a composite test sample, wherein the voltage-limiting test sample includes a voltage-limiting element, the voltage-switching test sample includes a voltage-switching element, and the composite test sample includes a voltage-switching element and a voltage-limiting element.
In one embodiment, the voltage-limiting test sample comprises a voltage-limiting surge protector or a voltage-limiting multi-pulse surge protector, the voltage-switching test sample comprises a voltage-switching surge protector or a voltage-switching multi-pulse surge protector, and the composite test sample comprises a composite surge protector or a composite multi-pulse surge protector.
In one embodiment, if the test object is a voltage-limiting test object;
after the positive polarity multiple lightning strike impulse discharge current and the negative polarity multiple lightning strike impulse discharge current are respectively applied to the to-be-tested sample, whether the to-be-tested sample is qualified or not is judged, and the method comprises the following steps:
after the voltage-limited test sample is respectively applied with positive polarity multiple lightning strike impulse discharge current and negative polarity multiple lightning strike impulse discharge current, cooling the voltage-limited test sample, and measuring initial voltage-sensitive voltage corresponding to the beginning of cooling the voltage-limited test sample;
measuring a final voltage-dependent voltage of the voltage-limited test article when the temperature of the voltage-limited test article is cooled to an ambient temperature;
applying 8/20 impact current once to the voltage-limited sample if the rate of change of the final voltage-sensitive voltage relative to the initial voltage-sensitive voltage is less than or equal to 10%, wherein the peak value of the 8/20 impact current is equal to the nominal discharge current I declared by the manufacturernOr Iimp；
And if no voltage-limiting test piece is visibly damaged after the 8/20 impact current is applied once, judging that the voltage-limiting test piece is qualified.
In one embodiment, the method further comprises:
and if the change rate of the final voltage-sensitive voltage relative to the initial voltage-sensitive voltage is greater than a preset threshold value, if so, determining that the voltage-limited test article is unqualified.
In one embodiment, if the test object is a voltage switch type test object;
after the positive polarity multiple lightning strike impulse discharge current and the negative polarity multiple lightning strike impulse discharge current are respectively applied to the to-be-tested sample, whether the to-be-tested sample is qualified or not is judged, and the method comprises the following steps:
after the voltage switch type test sample is respectively applied with positive polarity multiple lightning strike impulse discharge current and negative polarity multiple lightning strike impulse discharge current, respectively applying 5 times of positive polarity 1.2/50 impulse voltage and 5 times of negative polarity 1.2/50 impulse voltage to the voltage switch type test sample to obtain the limiting voltage at two ends of the voltage switch type test sample;
and if the limiting voltage is less than or equal to the declared voltage protection level of the voltage switch type test article, judging that the voltage switch type test article is qualified.
In one embodiment, applying a positive polarity multiple lightning strike impulse discharge current and a negative polarity multiple lightning strike impulse discharge current to the sample to be tested according to the test parameters includes:
applying positive multiple lightning stroke impact discharge current to the to-be-tested sample according to the test parameters;
after the multiple lightning strike impulse discharge current is applied, waiting according to preset waiting time so as to cool the to-be-tested sample;
after waiting for the end according to the preset waiting time, applying multiple lightning strike impact discharge current with negative polarity to the to-be-tested sample;
or the like, or, alternatively,
applying multiple lightning strike impulse discharge current with negative polarity to the to-be-tested sample according to the test parameters;
after the multiple lightning strike impulse discharge current is applied, waiting according to preset waiting time so as to cool the to-be-tested sample;
and after waiting according to preset waiting time, applying positive multiple lightning stroke impact discharge current to the to-be-tested sample.
According to the test method of the multiple lightning stroke impact discharge current, on one hand, the test parameters of the multiple lightning stroke impact discharge current are selected according to the application environment of the to-be-tested sample, so that the simulated test environment is closer to the actual lightning environment. On the other hand, the positive multi-lightning stroke impact discharge current containing a plurality of pulses and the negative multi-lightning stroke impact discharge current containing a plurality of pulses are respectively applied to the to-be-tested sample, and the tolerance performance of the to-be-tested sample can be tested more comprehensively by applying pulses with different polarities for a plurality of times to the to-be-tested sample, so that the sample passing through the test method can realize effective protection under different lightning stroke behaviors, and the protection effect of the sample is improved.
Drawings
FIG. 1 is a schematic flow chart of a method for testing multiple lightning strike surge current in one embodiment;
FIG. 2 is a schematic diagram illustrating a process of determining the qualification of a voltage-limited test sample according to an embodiment;
FIG. 3 is a schematic flow chart illustrating the qualification of the voltage switch type test sample or the composite test sample according to an embodiment;
FIG. 4 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
In order to more clearly describe the technical solutions of the embodiments of the present application, some technical terms related to the embodiments of the present application are explained herein:
the voltage limiting type test piece is a protector having a high impedance when there is no surge, but the impedance thereof is continuously decreased as the surge current increases to limit the voltage across the protector. Alternatively, the voltage-limiting type test piece may be a voltage-limiting type surge protector or a voltage-limiting type multi-pulse surge protector. Voltage-limiting test articles include voltage-limiting components, wherein the commonly used voltage-limiting components are nonlinear components including voltage dependent resistors and suppressor diodes, which are sometimes referred to as "voltage-clamped" components.
The voltage switch type test piece is a protector which has high impedance when no surge occurs and can suddenly change into low impedance when the surge responds so as to greatly reduce the voltage at two ends of the protector. Alternatively, the voltage switching type test piece may be a voltage switching type surge protector or a voltage switching type multi-pulse surge protector. Voltage switching type test articles include voltage switching type devices, among which the commonly used ones are discharge gaps, gas discharge tubes, thyristors (thyristors) and triacs, sometimes referred to as "crowbar type" devices.
The composite test article is a protector composed of a voltage switch type element and a voltage limiting type element. Optionally, the composite sample may be a composite surge protector or a composite multi-pulse surge protector. The characteristics of the composite sample with the applied voltage may be represented by a voltage switching type, a voltage limiting type, or both.
The residual voltage is a voltage peak generated between terminals of the protector when a discharge current flows through the protector. Wherein, the protector can be a surge protector, a multi-pulse surge protector, and the like. Surge protectors are electrical devices capable of withstanding the surge current of multiple lightning strikes and comprise at least one non-linear impedance element. The multi-pulse surge protector refers to a surge protector capable of resisting surge overvoltage generated by multiple lightning strokes. In the embodiment of the application, under the action of a group of multiple lightning strike impulse discharge currents, the voltage value of the to-be-tested sample under each lightning strike impulse discharge current is measured, and the maximum voltage value is determined as the residual voltage of the to-be-tested sample under the multiple lightning strike impulse discharge current test.
The limit voltage is a maximum voltage peak value measured between the terminals of the protector when an impact current of a predetermined waveform and amplitude is applied.
In one embodiment, referring to fig. 1, a method for testing multiple lightning strike surge discharge current is provided, the method comprising the steps of:
s202, acquiring a to-be-tested sample and acquiring an application environment of the to-be-tested sample;
the to-be-tested object is equipment for preventing lightning or electric surge. The tested product can be an electric appliance with the performances of discharging current and clamping voltage, such as a surge protector, a multi-pulse surge protector and the like. Optionally, the sample to be tested includes a voltage-limiting sample, a voltage-switching sample or a composite sample. The voltage-limiting test sample comprises a voltage-limiting element, the voltage-switching test sample comprises a voltage-switching element, and the composite test sample comprises a voltage-switching element and a voltage-limiting element. Optionally, the voltage-limiting test article comprises a voltage-limiting multi-pulse surge protector or a voltage-limiting surge protector; the voltage switch type test article comprises a voltage switch type multi-pulse surge protector or a voltage switch type surge protector; the composite test sample comprises a composite multi-pulse surge protector or a composite surge protector.
The application environment of the to-be-tested sample refers to the adaptable use environment of the to-be-tested sample. Alternatively, the application environment of the test article to be tested may be an ascending lightning impulse discharge current which may contain a continuous current in a high-exposure area, or an electromagnetic interference environment caused by lightning.
By way of illustration, an upward lightning strike comprises first-hit, subsequent and superimposed lightning strikes, typically occurring in exposed and tall buildings and the like, comprising a relatively high number of lightning strike components but of relatively low magnitude. The amplitude of the first-hit current wave is the largest, and the amplitude of the subsequent impact-back wave is 1/2 of the amplitude of the first-hit wave. The number of the lightning stroke components is 4-10, the interval time is 10-100ms, and the interval time of the last back-striking waveform is 200ms at most. The typical value of the persistent current component in an uplightning flash is 200A, with a duration of 15 ms. Upward lightning current value TUIn kA. In addition, the downstream lightning stroke comprises first-hit lightning strokes, subsequent lightning strokes, superposition lightning strokes and the like, generally occurs in flat ground, low buildings and the like, and comprises a few lightning stroke components with high amplitude. The amplitude of the first-hit current wave is the largest, and the amplitude of the subsequent impact-back wave is 1/2 of the amplitude of the first-hit wave. The number of lightning stroke components is 4-20, and the interval time is 50-100 ms. Down lightning current value TDIn kA.
And S204, selecting test parameters of the multiple lightning stroke impact discharge current according to the application environment.
The multiple lightning strokes refer to the phenomenon that more than two lightning strokes occur on the same object on the ground in a short time. The multiple lightning strike impulse discharge current is the impulse discharge current which simulates the multiple lightning strike phenomenon and contains a plurality of pulses and is applied to the same object at least once. Optionally, the test parameters include one or more of a number of pulses included in the multiple lightning strike discharge current, a current amplitude of the multiple lightning strike discharge current at different pulse strikes, a time interval of the multiple lightning strike discharge current at different pulse strikes, and a continuous current parameter.
The application environment of the to-be-tested object and the testing parameters of the multiple lightning strike impulse discharge current are in a corresponding relation in advance.
Specifically, after obtaining the application environment of the test article to be tested, the test parameters of the multiple lightning strike impulse discharge current are selected according to the application environment and the preset corresponding relation. Alternatively, the test parameters of the multiple lightning strike surge discharge currents may be pre-stored in the memory.
And S206, respectively applying positive polarity multiple lightning stroke impact discharge current and negative polarity multiple lightning stroke impact discharge current to the to-be-tested sample according to the test parameters, and measuring the voltage at two ends of the to-be-tested sample and the current passing through the to-be-tested sample, wherein the multiple lightning stroke impact discharge current comprises a plurality of pulses.
Optionally, the multiple lightning strike surge discharge current is discharged by a surge current testing device. The impulse current test equipment for test is generally generated by a special impulse current generator, a direct current power supply charges a plurality of or a plurality of groups of large-capacity capacitors in parallel, and then the impulse current test equipment is connected with a loop of a to-be-tested product in series for discharging through a discharging gap. The load capacity requirement of the impact current generator is large enough, and the output waveform meeting the waveform requirement after the test sample to be tested is accessed can be met.
Specifically, after obtaining test parameters of the multiple lightning strike impulse discharge current, the impulse current test equipment is used for applying at least one positive multiple lightning strike impulse discharge current and at least one negative multiple lightning strike impulse discharge current to the to-be-tested sample, and a multi-channel digital oscilloscope is used for measuring and recording the voltage at two ends of the to-be-tested sample and the current passing through the to-be-tested sample. Wherein the one-time multiple lightning strike surge discharge current comprises a plurality of pulses. Alternatively, the multiple lightning strike surge current may employ an 10/350 current waveform and/or a 8/20 current waveform.
Alternatively, when a multi-channel digital oscilloscope is used for impulse voltage and current measurement, impulse voltage measurement is generally performed by using a differential measurement loop of two measurement channels. It is also possible to use one oscilloscope to measure the surge voltage and another oscilloscope to measure the surge current, but this operation enables the synchronization of the voltage and current measurements.
Further, the maximum voltage peak value measured by the multi-channel digital oscilloscope in the same channel is determined as the residual voltage of the to-be-tested sample. And then the measured residual voltage can be compared with the declared voltage protection level of the to-be-tested sample, and if the measured residual voltage is less than or equal to the declared voltage protection level, the to-be-tested sample is judged to pass the test.
And S208, after the positive polarity multiple lightning stroke impact discharge current and the negative polarity multiple lightning stroke impact discharge current are applied to the to-be-tested sample respectively, judging whether the to-be-tested sample is qualified.
Specifically, after the positive polarity multiple lightning strike impulse discharge current and the negative polarity multiple lightning strike impulse discharge current are applied to the test sample, whether the test sample is qualified or not needs to be judged. Alternatively, for the voltage limiting type test piece, whether the voltage limiting type test piece is qualified or not may be judged according to the rate of change of the voltage-sensitive voltage. For the voltage switch type test sample, whether the voltage switch type test sample is qualified or not can be judged according to the limit voltage of the voltage switch type test sample. And for the composite sample, whether the composite sample is qualified or not can be judged according to the residual pressure of the composite sample.
According to the test method of the multiple lightning stroke impact discharge current, on one hand, the test parameters of the multiple lightning stroke impact discharge current are selected according to the application environment of the to-be-tested sample, so that the simulated test environment is closer to the actual lightning environment. On the other hand, the positive multi-lightning stroke impact discharge current containing a plurality of pulses and the negative multi-lightning stroke impact discharge current containing a plurality of pulses are respectively applied to the to-be-tested sample, and the tolerance performance of the to-be-tested sample can be tested more comprehensively by applying pulses with different polarities for a plurality of times to the to-be-tested sample, so that the sample passing through the test method can realize effective protection under different lightning stroke behaviors, and the protection effect of the sample is improved.
Alternatively, in one embodiment, if the type of the test sample cannot be determined before the test, i.e., it cannot be determined whether the test sample is a voltage-limiting test sample, a voltage-switching test sample or a composite test sample, 8/20 impulse currents with positive polarity and negative polarity are applied to the test sample before S202, and the current amplitude of the impulse currents is the nominal value indicated by the manufacturerDischarge current value InOr IpeakAnd simultaneously measuring the voltages at the two ends of the sample to be tested to obtain the corresponding voltage waveform. If the voltage waveform does not show sudden drop, determining that the sample to be tested is a voltage-limited sample; and if the voltage waveform shows a sudden drop, determining that the sample to be tested comprises a voltage switch type element, further, if the voltage drops to zero, determining that the sample is a voltage switch type sample, and otherwise, determining that the sample is a composite type sample.
Generally, a manufacturer will set the type of the test object at a specific location, such as the surface of the test object, in the form of an identifier. Alternatively, the type of the test article to be tested may be obtained by identifying the identification information thereof.
Alternatively, if the manufacturer states that an external detacher is to be used, the test should be performed by connecting the external detacher to the test piece.
The embodiment of the application also relates to a specific process for determining the voltage protection level of the to-be-tested sample. Optionally, in an embodiment, after the type of the test sample can be determined, if the test sample is a voltage-limited test sample or a composite test sample, the residual voltage at two ends of the test sample is obtained according to the voltage waveform corresponding to the test sample to which the 8/20 impulse current is applied. Further, if the sample to be tested is a voltage-limiting sample, it is required to be tested according to the DC reference voltage U1mATo which a voltage was applied, and the voltage-sensitive voltage of the voltage-limiting type test piece was measured. In this embodiment, by measuring the residual voltage and the voltage-dependent voltage, it can be checked whether the voltage protection level or other parameter values declared by the manufacturer are correct, and the quality requirement of the test sample is strictly controlled.
Alternatively, in one embodiment, after the type of the test piece can be determined, if the test piece is a voltage switching type test piece, the generator open output voltage is set to 6kV, so that a 1.2/50 surge voltage of positive polarity is applied 5 times and a 1.2/50 surge voltage of negative polarity is applied 5 times to the voltage switching type test piece, and the voltage across the voltage switching type test piece is measured, wherein the time interval between the application of the 1.2/50 surge voltage of positive polarity and the application of the 1.2/50 surge voltage of negative polarity is such that the voltage switching type test piece is cooled to the ambient temperature. The maximum discharge voltage obtained by 10 times of 1.2/50 impulse voltage in the embodiment is determined as residual voltage, and the residual voltage is the voltage protection level of the voltage switch type test article.
Further, in one embodiment, if there is one time when the wavefront discharge is not observed when the above-mentioned 10 times of 1.2/50 surge voltage are applied, the generator open-circuit output voltage is set to 10kV, and thus 5 times of the 1.2/50 surge voltage of positive polarity and 5 times of the 1.2/50 surge voltage of negative polarity are applied again to the voltage switching type specimen, and the voltage across the voltage switching type specimen is measured, wherein the time interval between the application of the 1.2/50 surge voltage of positive polarity and the application of the 1.2/50 surge voltage of negative polarity should be such that the voltage switching type specimen is cooled to the ambient temperature. The maximum discharge voltage obtained by 10 times of 1.2/50 impulse voltage in the embodiment is determined as residual voltage, and the residual voltage is the voltage protection level of the voltage switch type test article. The residual voltage, i.e. the measured voltage protection level, can be used to check whether the declared value of the manufacturing plant is correct or not, and to stop the counterfeiting behavior.
In one embodiment, the method relates to a possible implementation process of selecting test parameters of multiple lightning impulse discharge current according to application environment. On the basis of the above embodiment, S204 includes the steps of:
determining the protection grade of the to-be-tested sample according to the application environment; and selecting test parameters of the multiple lightning strike impact discharge current according to the protection grade.
Generally, the application environment of the test article to be tested is various, the application environment can be classified according to the severity of the application environment, the test article to be tested is classified according to the application environment, the protection grade of the test article to be tested is obtained, and then the test parameters of the multiple lightning stroke impact discharge current are set according to the protection grade.
Specifically, according to the protection grade, a test parameter of the multiple lightning strike impact discharge current can be selected from the following table;
note a: and the protection grade A is mainly used for the test waveform of the ascending lightning impulse discharge current containing the continuous current in the high-exposure area. According to the observation data statistics result, the protection level A area is more in positive flash. Protection class level B and C areas are more negative flashes.
B, note: for a multi-pulse surge protector used in a high exposure area, a class I surge current test waveform 10/350 should be used for the first lightning strike.
C, note: protection class D, the electromagnetic interference environment caused by lightning, should use standard current waveform 8/20.
As can be seen from the above comments, different protection levels correspond to different application environments, respectively. The protection level comprises an A level, a B level, a C level and a D level, and the application environments corresponding to the A level and the B level of the protection level are mainly test waveforms of the uplink lightning surge discharge current containing the continuous current in a high exposure area and a strong electromagnetic induction area. The protection level class a areas are more in positive flash, and the protection level class B and class C areas are more in negative flash. The application environment corresponding to the protection level D is mainly the electromagnetic interference environment caused by thunder and lightning.
For example, if the protection level of the test sample is level a, the selected test parameters may be: the discharge current of one multiple lightning strike impact comprises 5 pulses, the current amplitude of the first pulse impact is 25kA, the current amplitude of the subsequent pulse impact is more than or equal to 25kA, such as 50kA, preferably, the current amplitude of the last pulse impact is more than or equal to 30kA, such as 50kA, the time interval between the subsequent pulse impacts is 50ms, the time interval between the last pulse impact and the previous pulse impact is 50ms, the total duration is not more than 1.2 seconds, (if continuous current exists), the amplitude of the continuous current is 50-500A, such as a typical value of 200A, and the duration of the continuous current is 15 ms. Of course, the value of the test parameter corresponding to the level a may also be other values in the above table as long as the value range in the above table is satisfied. It can be understood that for different protection levels, the values of the corresponding test parameters only need to satisfy the value ranges in the above table.
The embodiment of the application also relates to various possible implementation processes for applying positive polarity multiple lightning stroke impact discharge current and negative polarity multiple lightning stroke impact discharge current to the to-be-tested sample respectively according to the test parameters, and the following implementation processes are listed:
in one embodiment, S206 includes the steps of:
s2062, applying positive multiple lightning stroke impact discharge current to the test article to be tested according to the test parameters;
s2064, after the multiple lightning strike impact discharge current is applied, waiting according to preset waiting time so as to cool the to-be-tested sample;
s2066, after waiting for the end according to the preset waiting time, applying multiple lightning strike impulse discharge current with negative polarity to the sample to be tested.
Specifically, after the test parameters are obtained, a positive polarity multiple lightning strike impact discharge current is applied to the to-be-tested sample, then waiting is carried out according to a preset waiting time, during the waiting period, the temperature of the to-be-tested sample can be cooled slowly, and after the waiting is finished, a negative polarity multiple lightning strike impact discharge current is applied to the to-be-tested sample.
Further, the preset waiting time may be determined based on a number of experiments for different time periods during which different test articles can be cooled to ambient temperature, and thus determined according to the different time periods. In order to ensure that the sample to be tested can reach the ambient temperature after waiting for the preset waiting time, the preset waiting time needs to be longer than the maximum time length of different time lengths. That is, the time interval between the application of the multiple lightning strike impulse discharge current with the positive polarity and the application of the multiple lightning strike impulse discharge current with the negative polarity can cool the sample to be tested to the ambient temperature. Alternatively, the preset waiting time may be set to 30 minutes or more, that is, the preset waiting time may be 30 minutes, 40 minutes, or 45 minutes, or the like.
As another embodiment, the temperature sensor may measure the temperature of the surface of the sample to be tested in real time to determine whether the sample to be tested reaches the environmental temperature. Specifically, if the temperature of the surface of the sample to be tested is the same as the ambient temperature, it is determined that the sample to be tested reaches the ambient temperature. Alternatively, the temperature sensor may be an infrared thermometer.
In another embodiment, S206 includes the steps of:
s206a, applying multiple lightning strike impulse discharge current with negative polarity to the test sample to be tested according to the test parameters;
s206b, after the multiple lightning strike impact discharge current is applied, waiting according to a preset waiting time to cool the test article to be tested;
and S206c, after the waiting is finished according to the preset waiting time, applying positive polarity multiple lightning stroke impact discharge current to the sample to be tested.
The multiple lightning strike impulse discharge current can be represented in the form of a multi-pulse waveform, that is, a current waveform consisting of a plurality of pulses.
Specifically, after the test parameters are obtained, a negative polarity multiple lightning strike impulse discharge current is applied to the to-be-tested sample, then waiting is carried out according to a preset waiting time, during the waiting period, the temperature of the to-be-tested sample can be cooled slowly, and after the waiting period is finished, a positive polarity multiple lightning strike impulse discharge current is applied to the to-be-tested sample. Further, voltage peak values of two ends of the to-be-tested sample under different pulses are measured and recorded, and the maximum voltage peak value is determined as the voltage protection level of the to-be-tested sample under the multi-pulse waveform.
In one embodiment, the method further comprises: visually observing whether the to-be-tested sample has obvious damage or not, and if so, continuing the test; if not, the test is terminated.
In one embodiment, please refer to fig. 2, which relates to a specific process of qualification determination of the voltage-limited test sample. On the basis of the above embodiment, S208 includes the steps of:
s2082, after the positive polarity multiple lightning stroke impact discharge current and the negative polarity multiple lightning stroke impact discharge current are applied to the voltage-limited sample respectively, cooling the voltage-limited sample, and measuring the initial voltage-sensitive voltage corresponding to the beginning of cooling the voltage-limited sample;
s2084, measuring the final voltage-dependent voltage of the voltage-limited test sample when the temperature of the voltage-limited test sample is cooled to the ambient temperature;
s2086, if the final voltage is voltage-sensitiveApplying 8/20 impact current once to the voltage-limited sample when the voltage variation rate relative to the initial voltage-sensitive voltage is less than or equal to 10%, wherein the peak value of the 8/20 impact current is equal to the nominal discharge current I declared by the manufacturernOr Iimp；
S2088, if no damage is visible to the voltage limiting test piece after the 8/20 rush current is applied once, determining that the voltage limiting test piece is acceptable.
Wherein, the voltage-dependent voltage is the voltage corresponding to the current of the voltage-dependent resistor of 1mA, and is used as the standard of the voltage magnitude of the voltage that the I rapidly rises along with the U, and the voltage is U1mAAnd (4) showing.
Specifically, after the voltage-limited test piece is applied with the positive polarity multiple lightning strike impulse discharge current and the negative polarity multiple lightning strike impulse discharge current, respectively, the test piece to be tested should be cooled to an ambient temperature, and the voltage-dependent voltage of the test piece to be tested is measured. More specifically, during the cooling of the test piece to be tested, the initial voltage-sensitive voltage corresponding to the beginning of the cooling of the voltage-limited test piece, for example, 20V, is measured, and then the final voltage-sensitive voltage of the voltage-limited test piece, for example, 18V, is measured, at this time, the rate of change of the calculated final voltage-sensitive voltage with respect to the initial voltage-sensitive voltage is 10%, and then 8/20 impulse current is applied once to the voltage-limited test piece, and if the voltage-limited test piece has no visible damage, the test piece is determined to be qualified.
In another embodiment, the method further comprises the steps of:
and S2087, if the change rate of the final voltage-dependent voltage relative to the initial voltage-dependent voltage is greater than a preset threshold value, determining that the voltage-limited test article is unqualified. Alternatively, the preset threshold may be set to 10%.
In one embodiment, if the sample to be tested is a voltage switch type sample, in order to further determine that the performance thereof is normal, the following steps should be performed:
s212, loading voltage equal to the maximum continuous working voltage on two ends of the voltage switch type test article
Short-circuit current capable of being output by test equipmentExpected power frequency short-circuit current I declared by manufacturerpShould be greater than or equal to 1.5kA, power factor
And determining whether the voltage switch type test article has follow current generation or not, and if the follow current is generated, cutting off the follow current in 10 ms.
S214, 8/20 surge current is used for triggering follow current, and the current peak value is equal to nominal discharge current I declared by a manufacturernOr Iimp. Wherein 8/20 surge current is applied at 8/20 surge current after 10 degrees of delay from the front 30 degrees of the peak value of the power frequency voltage, and the polarity of the surge current is the same as that of the half-wave of the power frequency voltage when the surge current is generated so as to determine whether follow current is generated.
And S216, in the test process, measuring and recording key performance parameters such as power frequency voltage waveform, follow current peak value, follow current duration and the like.
S218, in the test process, enough safety measures are needed in a laboratory to ensure that when a test sample cannot cut off follow current, the hazards of use environment, system faults, combustion and the like caused by the generation of follow current are avoided; otherwise, the test is terminated. Meanwhile, the visual inspection sample cannot have violent combustion and explosion phenomena; otherwise, the test is terminated.
In one embodiment, please refer to fig. 3, which relates to a specific process of determining the qualification of the voltage switch type test sample or the composite test sample. On the basis of the above embodiment, S208 includes the steps of:
s208a, after the positive polarity multiple lightning stroke impact discharge current and the negative polarity multiple lightning stroke impact discharge current are respectively applied to the voltage switch type test sample or the composite test sample, respectively applying 5 times of 1.2/50 impact voltage with positive polarity and 5 times of 1.2/50 impact voltage with negative polarity to the voltage switch type test sample or the composite test sample to obtain the limiting voltage at two ends of the voltage switch type test sample or the composite test sample;
s208b, if the limit voltage is less than or equal to the voltage protection level declared by the voltage switch type test piece or the composite type test piece, the voltage switch type test piece or the composite type test piece is judged to be qualified.
Specifically, after a positive polarity multiple lightning strike impulse discharge current and a negative polarity multiple lightning strike impulse discharge current are applied to a voltage switch type sample or a composite type sample, the open-circuit output voltage of a generator is set to 6kV, 5 times of positive 1.2/50 impulse voltage and 5 times of negative 1.2/50 impulse voltage are applied to the voltage switch type sample or the composite type sample, and voltages at two ends of the voltage switch type sample or the composite type sample are measured, wherein a time interval between the application of the positive 1.2/50 impulse voltage and the application of the negative 1.2/50 impulse voltage is required to cool the voltage switch type sample or the composite type sample to an ambient temperature. Determining the maximum discharge voltage obtained by 10 times of 1.2/50 impulse voltage as a limiting voltage, and if the limiting voltage is less than or equal to the declared voltage protection level of the voltage switch type test article or the composite type test article, judging that the voltage switch type test article or the composite type test article is qualified; and otherwise, if the limiting voltage is greater than the claimed voltage protection level of the voltage switch type test article or the composite test article, judging that the voltage switch type test article or the composite test article is unqualified.
Further, when the 1.2/50 surge voltage was applied 10 times and no wavefront discharge was observed once, the generator open circuit output voltage was set to 10kV, and 5 times of the 1.2/50 surge voltage of positive polarity and 5 times of the 1.2/50 surge voltage of negative polarity were applied to the voltage switching type sample, and the voltages at both ends of the voltage switching type sample were measured to determine the limit voltage of the voltage switching type sample.
In order to test a higher quality test article, in one embodiment, whether the test article is qualified is determined by combining a plurality of qualification determination conditions. Wherein the plurality of qualification conditions include: firstly, whether a sample to be tested has breakdown and flashover phenomena or not is judged; secondly, whether the sample to be tested has visible damage or not and whether the trace of combustion exists or not; thirdly, whether the to-be-tested sample generates explosion or other dangers to related personnel or related equipment or not is judged; the qualification determination conditions in the above embodiments, for example, the qualification determination is performed by a voltage-sensitive voltage or a limit voltage.
Specifically, when the to-be-tested sample has no breakdown and flashover phenomena, and the to-be-tested sample has no visible damage and no trace of combustion, and the to-be-tested sample has no explosion or other danger to related personnel or related equipment, and the to-be-tested sample is qualified as in the above voltage-limiting type sample qualification determination mode, or the voltage-switching type sample or the composite type sample qualification determination mode, the to-be-tested sample is judged to be qualified. Otherwise, judging that the test article to be tested is unqualified.
It should be understood that although the various steps in the flow charts of fig. 1-3 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 1-3 may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performance of the sub-steps or stages is not necessarily sequential, but may be performed in turn or alternating with other steps or at least some of the sub-steps or stages of other steps.
In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as shown in fig. 4. The computer device includes a processor, a memory, a network interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a method of object tracking. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.
Those skilled in the art will appreciate that the architecture shown in fig. 4 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor implementing the following steps when executing the computer program:
obtaining a test article to be tested and obtaining an application environment of the test article to be tested;
selecting a test parameter of the multiple lightning stroke impact discharge current according to an application environment;
according to the test parameters, applying positive multiple lightning stroke impact discharge current and negative multiple lightning stroke impact discharge current to the test sample to be tested respectively, and measuring the voltage at two ends of the test sample to be tested and the current passing through the test sample to be tested, wherein the multiple lightning stroke impact discharge current comprises a plurality of pulses;
and after the positive polarity multiple lightning stroke impact discharge current and the negative polarity multiple lightning stroke impact discharge current are applied to the to-be-tested sample respectively, judging whether the to-be-tested sample is qualified.
According to the computer equipment, on one hand, the test parameters of the multiple lightning stroke impact discharge current are selected according to the application environment of the to-be-tested object, so that the simulated test environment is closer to the actual lightning environment. On the other hand, the positive multi-lightning stroke impact discharge current containing a plurality of pulses and the negative multi-lightning stroke impact discharge current containing a plurality of pulses are respectively applied to the to-be-tested sample, and the tolerance performance of the to-be-tested sample can be tested more comprehensively by applying pulses with different polarities for a plurality of times to the to-be-tested sample, so that the sample passing through the test method can realize effective protection under different lightning stroke behaviors, and the protection effect of the sample is improved.
In one embodiment, a computer-readable storage medium is provided, having a computer program stored thereon, which when executed by a processor, performs the steps of:
obtaining a test article to be tested and obtaining an application environment of the test article to be tested;
selecting a test parameter of the multiple lightning stroke impact discharge current according to an application environment;
according to the test parameters, applying positive multiple lightning stroke impact discharge current and negative multiple lightning stroke impact discharge current to the test sample to be tested respectively, and measuring the voltage at two ends of the test sample to be tested and the current passing through the test sample to be tested, wherein the multiple lightning stroke impact discharge current comprises a plurality of pulses;
and after the positive polarity multiple lightning stroke impact discharge current and the negative polarity multiple lightning stroke impact discharge current are applied to the to-be-tested sample respectively, judging whether the to-be-tested sample is qualified.
On one hand, the computer readable storage medium selects the test parameters of the multiple lightning stroke impact discharge current according to the application environment of the to-be-tested object, so that the simulated test environment is closer to the actual lightning environment. On the other hand, the positive multi-lightning stroke impact discharge current containing a plurality of pulses and the negative multi-lightning stroke impact discharge current containing a plurality of pulses are respectively applied to the to-be-tested sample, and the tolerance performance of the to-be-tested sample can be tested more comprehensively by applying pulses with different polarities for a plurality of times to the to-be-tested sample, so that the sample passing through the test method can realize effective protection under different lightning stroke behaviors, and the protection effect of the sample is improved.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application.
Claims (10)
1. A method for testing multiple lightning strike surge discharge current, the method comprising:
acquiring a to-be-tested sample and acquiring an application environment of the to-be-tested sample;
selecting a test parameter of the multiple lightning stroke impact discharge current according to the application environment;
according to the test parameters, applying positive multiple lightning strike impact discharge current and negative multiple lightning strike impact discharge current to the to-be-tested sample respectively, and measuring voltage at two ends of the to-be-tested sample and current passing through the to-be-tested sample, wherein the multiple lightning strike impact discharge current comprises a plurality of pulses;
after the positive polarity multiple lightning strike impulse discharge current and the negative polarity multiple lightning strike impulse discharge current are respectively applied to the to-be-tested sample, whether the to-be-tested sample is qualified or not is judged, and the method comprises the following steps: if the test article to be tested is a voltage-limiting test article; after the voltage-limited test sample is respectively applied with positive polarity multiple lightning strike impulse discharge current and negative polarity multiple lightning strike impulse discharge current, cooling the voltage-limited test sample, and measuring initial voltage-sensitive voltage corresponding to the beginning of cooling the voltage-limited test sample; measuring a final voltage-dependent voltage of the voltage-limited test article when the temperature of the voltage-limited test article is cooled to an ambient temperature; applying 8/20 surge current once to the voltage-limited test article if the rate of change of the final voltage-sensitive voltage with respect to the initial voltage-sensitive voltage is less than or equal to 10%, wherein the peak value of the 8/20 surge current is equal to the nominal discharge current claimed by the manufacturer; and if no voltage-limiting test piece is visibly damaged after the 8/20 impact current is applied once, judging that the voltage-limiting test piece is qualified.
2. The method of claim 1, wherein selecting test parameters of multiple lightning strike surge discharge current according to the application environment comprises:
determining the protection grade of the to-be-tested sample according to the application environment;
and selecting test parameters of the multiple lightning strike impact discharge current according to the protection grade.
3. The method of claim 2, wherein the test parameters include a number of pulses included in the multiple lightning strike surge current, a current amplitude of the multiple lightning strike surge current at different pulse strikes, a time interval of the multiple lightning strike surge current at different pulse strikes, and a continuous current parameter.
4. The method of claim 3, wherein selecting the test parameters of the multiple lightning strike surge current according to the protection level comprises:
selecting a test parameter of the multiple lightning strike impact discharge current in the following table according to the protection grade;
5. the method of claim 1, wherein the test article comprises a voltage-limiting test article, a voltage-switching test article, or a composite test article, wherein the voltage-limiting test article comprises a voltage-limiting element, the voltage-switching test article comprises a voltage-switching element, and the composite test article comprises a voltage-switching element and a voltage-limiting element.
6. The method of claim 5, wherein the voltage-limiting test article comprises a voltage-limiting surge protector or a voltage-limiting multi-pulse surge protector, the voltage-switching test article comprises a voltage-switching surge protector or a voltage-switching multi-pulse surge protector, and the composite test article comprises a composite surge protector or a composite multi-pulse surge protector.
7. The method according to claim 1, wherein the voltage-dependent voltage is a voltage corresponding to a current of the voltage-dependent resistor of 1mA, and is used as a standard for a voltage level at which the current rapidly increases with the voltage.
8. The method of claim 7, further comprising:
and if the change rate of the final voltage-sensitive voltage relative to the initial voltage-sensitive voltage is greater than a preset threshold value, determining that the voltage-limited test article is unqualified.
9. The method of claim 5, wherein if the test article is a voltage switch type test article;
after the positive polarity multiple lightning strike impulse discharge current and the negative polarity multiple lightning strike impulse discharge current are respectively applied to the to-be-tested sample, whether the to-be-tested sample is qualified or not is judged, and the method comprises the following steps:
after the voltage switch type test sample is respectively applied with positive polarity multiple lightning strike impulse discharge current and negative polarity multiple lightning strike impulse discharge current, respectively applying 5 times of positive polarity 1.2/50 impulse voltage and 5 times of negative polarity 1.2/50 impulse voltage to the voltage switch type test sample to obtain the limiting voltage at two ends of the voltage switch type test sample;
and if the limiting voltage is less than or equal to the declared voltage protection level of the voltage switch type test article, judging that the voltage switch type test article is qualified.
10. The method of claim 7, wherein applying a positive polarity multiple lightning strike surge discharge current and a negative polarity multiple lightning strike surge discharge current to the test sample according to the test parameters comprises:
applying positive multiple lightning stroke impact discharge current to the to-be-tested sample according to the test parameters;
after the positive polarity multiple lightning stroke impact discharge current is applied, waiting according to preset waiting time so as to cool the to-be-tested sample;
after waiting for the end according to the preset waiting time, applying multiple lightning strike impact discharge current with negative polarity to the to-be-tested sample;
or the like, or, alternatively,
applying multiple lightning strike impulse discharge current with negative polarity to the to-be-tested sample according to the test parameters;
after the application of the negative polarity multiple lightning stroke impact discharge current is finished, waiting according to preset waiting time so as to cool the to-be-tested sample;
and after waiting according to preset waiting time, applying positive multiple lightning stroke impact discharge current to the to-be-tested sample.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911172128.5A CN110850255B (en) | 2019-11-26 | 2019-11-26 | Test method for multiple lightning strike impulse discharge current |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911172128.5A CN110850255B (en) | 2019-11-26 | 2019-11-26 | Test method for multiple lightning strike impulse discharge current |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110850255A CN110850255A (en) | 2020-02-28 |
| CN110850255B true CN110850255B (en) | 2022-04-26 |
Family
ID=69604389
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911172128.5A Active CN110850255B (en) | 2019-11-26 | 2019-11-26 | Test method for multiple lightning strike impulse discharge current |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110850255B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113391171A (en) * | 2021-05-27 | 2021-09-14 | 深圳深爱半导体股份有限公司 | Method and device for testing immunity to surge voltage |
| CN113848523B (en) * | 2021-10-21 | 2023-07-07 | 山东省计量科学研究院 | Calibration method and calibration device of pulse type lightning protection element tester |
| CN115542087B (en) * | 2022-12-05 | 2023-03-10 | 昆明理工大学 | Multiple lightning stroke identification method suitable for traveling wave recording integrated equipment |
| CN116247636B (en) * | 2023-02-27 | 2023-11-14 | 深圳市天盾雷电技术有限公司 | High-power multi-pulse surge protector |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102162829A (en) * | 2011-03-18 | 2011-08-24 | 武汉大学 | Experimental device for multiple lightning current return strokes of surge protection device (SPD) |
| KR20150059076A (en) * | 2013-11-21 | 2015-05-29 | 주식회사 한국서지연구소 | Surge Protective Device With Noise Filter |
| CN106443385A (en) * | 2016-10-17 | 2017-02-22 | 南京信息工程大学 | Multi-stage SPD simulation and actual impact test method based on PSPICE and system thereof |
| CN107728016A (en) * | 2017-09-05 | 2018-02-23 | 国网上海市电力公司 | A kind of multiple lightning current operating duty cycle test method of Surge Protector |
| CN108196100A (en) * | 2018-03-06 | 2018-06-22 | 北京华天机电研究所有限公司 | The multiple counterattack wave impact current feedback circuit realized using vacuum switch |
-
2019
- 2019-11-26 CN CN201911172128.5A patent/CN110850255B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102162829A (en) * | 2011-03-18 | 2011-08-24 | 武汉大学 | Experimental device for multiple lightning current return strokes of surge protection device (SPD) |
| KR20150059076A (en) * | 2013-11-21 | 2015-05-29 | 주식회사 한국서지연구소 | Surge Protective Device With Noise Filter |
| CN106443385A (en) * | 2016-10-17 | 2017-02-22 | 南京信息工程大学 | Multi-stage SPD simulation and actual impact test method based on PSPICE and system thereof |
| CN107728016A (en) * | 2017-09-05 | 2018-02-23 | 国网上海市电力公司 | A kind of multiple lightning current operating duty cycle test method of Surge Protector |
| CN108196100A (en) * | 2018-03-06 | 2018-06-22 | 北京华天机电研究所有限公司 | The multiple counterattack wave impact current feedback circuit realized using vacuum switch |
Non-Patent Citations (1)
| Title |
|---|
| 电涌保护器的性能与试验方法研究;卢燕;《中国优秀硕士学位论文全文数据库 工程科技II辑》;20080915(第09期);第C042-178页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110850255A (en) | 2020-02-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110850255B (en) | Test method for multiple lightning strike impulse discharge current | |
| CN107728016B (en) | surge protector multiple lightning current action load test method | |
| Lee et al. | Properties of ZnO varistor blocks under multiple lightning impulse voltages | |
| He et al. | MOV failure modes and microstructural characteristics under operating duty tests with multiwaveform multipulse currents | |
| DE102010038208A1 (en) | Overvoltage protection device has overvoltage arrester and positive temperature coefficient thermistor or negative temperature coefficient thermistor for detecting temperature of overvoltage arrester | |
| Wen et al. | A new method to evaluate the effectiveness of impulse voltage for detecting insulation defects in GIS equipment | |
| Kim | Failure prediction of metal oxide varistor using nonlinear surge look-up table based on experimental data | |
| Bezerra et al. | Evaluation of surge arrester models for overvoltage studies | |
| Siegert et al. | Selection of varistor for surge protection purposes based on their voltage-current characteristic | |
| Rousseau et al. | Multiple shots on SPDs—Additional tests | |
| Eloch | Performance of surge arrestors under single and multiple lightning impulses | |
| Mashaba et al. | Deducing metal oxide varistor life span from pulse rating curves for surges of different magnitudes | |
| He et al. | Investigation of the effects of multi-waveform multi-pulse impulse currents on MOV for class I SPD through operating duty tests | |
| He et al. | Experimental validation of MOA simulation models for energy absorption estimation under different impulse currents | |
| Rakholiya et al. | Analysis of MOV Surge Arrester Models byusing Alternative Transient Program ATP/EMTP | |
| Mori et al. | Response of a surge arrester with a series gap for 6.6-kV distribution lines to steep-front transients | |
| Bhuyan et al. | Simulations of lightning impulse residual voltage test of surge arresters in matlab-simulink | |
| Edirisinghe et al. | Performance comparison of varistor models under high current derivative impulses | |
| Mardira et al. | A simplified lightning model for metal oxide surge arrester | |
| Chuayin et al. | Study of asymmetrical leakage currents of metal oxide surge arrester due to multiple current impulses | |
| Yadavari et al. | Effects of ZnO varistor degradation on the overvoltage protection mechanism of electronic boards | |
| de Salles et al. | Surge ageing of metal oxide varistors | |
| Nunoo et al. | Analysis of Lightning-Caused Distribution Transformer Failures in Ghana | |
| CN110988637A (en) | Direct current-impact combined pressurization test loop for power transmission line | |
| Montaño et al. | Varistor models-a comparison between theory and practice |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |