CN110849407A

CN110849407A - Sensor testing method and device, storage medium and electronic equipment

Info

Publication number: CN110849407A
Application number: CN201911323609.1A
Authority: CN
Inventors: 俞斌
Original assignee: JRD Communication Shenzhen Ltd
Current assignee: Shenzhen Huaxi Investment Co ltd
Priority date: 2019-12-20
Filing date: 2019-12-20
Publication date: 2020-02-28
Anticipated expiration: 2039-12-20
Also published as: CN110849407B

Abstract

The invention relates to the technical field of testing, and discloses a sensor testing method, a sensor testing device, a storage medium and electronic equipment, wherein the sensor testing method is applied to the electronic equipment, the electronic equipment comprises a sensor, and the method comprises the following steps: connecting the electronic equipment with a clamp for bearing the electronic equipment; sending a sensor test sequence from the electronic device to the fixture, the sensor test sequence including instructions or instruction sets that may be invoked by all of the fixtures; and sending codes representing the corresponding instructions in the sensor test sequence to the clamp, so that the clamp calls the corresponding instructions in the sensor test sequence according to the codes to test the sensor. According to the method, the sensor test sequence and the codes are stored in the electronic equipment and then are sequentially sent to the clamp, so that the test based on the self condition of the electronic equipment is realized, the test process of the sensor is accelerated, and the production efficiency of the electronic equipment is improved.

Description

Sensor testing method and device, storage medium and electronic equipment

Technical Field

The invention relates to the technical field of testing, in particular to a sensor testing method and device, a storage medium and electronic equipment.

Background

Sensors are a common and important class of devices that sense a specified measured quantity and regularly convert it into a useful signal.

A photosensor is an important sensor that converts an optical signal into an electrical signal. The photoelectric sensor has the characteristics of non-contact, quick response, reliable performance and the like, so the photoelectric sensor is widely applied to mobile terminals. In the production process of the mobile terminals, due to the large number of the mobile terminals, the time for testing the photoelectric sensors in the production process of each mobile terminal is as short as possible, so that the production efficiency is improved.

At present, the test of the photoelectric sensor of the mobile terminal is generally carried out in a mode of sending an instruction by a fixture, the adaptability adjustment can not be carried out according to the self condition of each mobile terminal, and the photoelectric sensor needs to be tested in various light environments, so that the consumed time is long, the production efficiency is influenced, and the bottleneck of producing the mobile terminal is formed. Therefore, how to accelerate the test process and avoid the mobile terminal from being clamped in the test link of the photoelectric sensor during production is urgent to be improved and developed.

Disclosure of Invention

In order to solve the technical problems, the invention provides a sensor testing method, a sensor testing device, a storage medium and electronic equipment.

The invention provides a sensor testing method, which is applied to electronic equipment, wherein the electronic equipment comprises a sensor, and the sensor testing method comprises the following steps:

connecting the electronic equipment with a clamp bearing the electronic equipment;

sending the sensor test sequence from the electronic device to the fixture, the sensor test sequence including instructions or sets of instructions that may be invoked by all of the fixtures;

and sending codes representing corresponding instructions in the sensor test sequence to the clamp, so that the clamp calls the corresponding instructions in the sensor test sequence according to the codes to test the sensor.

Further preferably, the connection of the electronic device to the clip includes:

the electronic equipment is connected with the clamp through an interface, and the interface comprises at least one of a USB interface, a universal asynchronous receiver-transmitter interface or a wireless interface.

Further preferably, the sensor test sequence is sent from the electronic device to the clamp, and the sensor test sequence is pre-stored in the electronic device.

Further preferably, the sensor test sequence is sent from the electronic device to the fixture, the sensor test sequence is composed of a plurality of instruction files or instruction set files, and the file name of each file is the code of the instruction or instruction set.

Further preferably, the instruction set is a combination of several instructions.

Further preferably, in the code for sending the corresponding instruction in the sensor test sequence to the jig, a plurality of codes are sent at the same time.

Further preferably, the code includes codes corresponding to a plurality of instructions in the instruction set.

The invention also provides a sensor testing device, which is applied to electronic equipment, wherein the electronic equipment comprises a sensor, and the sensor testing device comprises:

the connecting module is used for connecting the electronic equipment with the clamp;

the sensor test sequence module is used for sending a sensor test sequence to the clamp;

and the instruction transceiving module is used for sending codes representing corresponding instructions in the sensor testing sequence to the clamp, so that the clamp calls the corresponding instructions in the sensor testing sequence according to the codes to test the sensor.

The present invention also provides a computer readable storage medium having stored therein a plurality of instructions adapted to be loaded by a processor to perform the sensor testing method described above.

The invention also provides an electronic device, which comprises a processor and a memory, wherein the processor is electrically connected with the memory, the memory is used for storing instructions and data, and the processor is used for executing the steps in the sensor testing method.

Has the advantages that: in the sensor testing method, the sensor testing device, the storage medium and the electronic equipment, the sensor testing sequence and the codes of the corresponding instructions in the sensor testing sequence are pre-stored in the electronic equipment, the sensor testing sequence is sent to the clamp from the electronic equipment after the electronic equipment is connected with the clamp, the codes are sent to the clamp after the clamp receives the sensor testing sequence, the clamp calls the corresponding instructions according to the codes to test the sensors in the electronic equipment, and the codes can be sent simultaneously, so that the testing based on the self condition of the sensors in the electronic equipment is realized, the testing process of the sensors is accelerated, and the production efficiency of the electronic equipment is improved.

Drawings

In order to illustrate the embodiments or the technical solutions in the prior art more clearly, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the invention, and it is obvious for a person skilled in the art that other drawings can be obtained according to these drawings without creative efforts.

FIG. 1 is a schematic flow chart of a sensor testing method according to a first embodiment of the present invention;

FIG. 2 is a schematic structural diagram of a sensor testing device according to a second embodiment of the present invention;

fig. 3 is a schematic structural diagram of an electronic device according to a third embodiment of the present invention;

fig. 4 is another schematic structural diagram of an electronic device according to a third embodiment of the present invention.

Detailed Description

The following description of the various embodiments refers to the accompanying drawings that illustrate specific embodiments in which the invention may be practiced. The directional terms mentioned in the present invention, such as [ upper ], [ lower ], [ front ], [ rear ], [ left ], [ right ], [ inner ], [ outer ], [ side ], are only referring to the directions of the attached drawings. Accordingly, the directional terms used are used for explanation and understanding of the present invention, and are not used for limiting the present invention. In the drawings, elements having similar structures are denoted by the same reference numerals. The terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated.

The invention aims at solving the problem that the sensor test in the existing electronic equipment is generally carried out in a mode of sending an instruction by a clamp, but the test cannot be carried out based on the self condition of the sensor in the electronic equipment, so that the test process is slow, and the production efficiency of the electronic equipment is further influenced.

The embodiment of the invention provides a sensor testing method and device, a storage medium and electronic equipment. The sensor testing device provided by the embodiment of the invention can be integrated in electronic equipment, and the electronic equipment can comprise electronic equipment such as a smart phone, a tablet computer and a personal computer.

The sensor is a detection device, can sense the measured information, and can convert the sensed information into an electric signal or other information in a required form according to a certain rule to output so as to meet the requirements of information transmission, processing, storage, display, recording, control and the like. The sensors commonly used include photoelectric sensors, weighing sensors, displacement sensors, pressure sensors, temperature sensors and the like. In the test of the sensor, especially the test of the photoelectric sensor, the test needs to be carried out under various light environments, the various light environments for the test need to be set by a plurality of instructions, so that the test consumes a long time, and the test of other sensors does not need to be set for various light environments, so that the test process is faster compared with the test process of the photoelectric sensor. In the sensor testing method, the sensor testing device, the storage medium and the electronic equipment provided by the embodiment of the invention, during the sensor testing process, the testing can be carried out based on the self condition of the sensor in the electronic equipment, so that the testing process is not completely repeated mechanically, and the light environment of the photoelectric sensor to be tested can be adjusted adaptively according to the production data or the statistical result of the detection data of the sensor in the electronic equipment within a certain time period, thereby accelerating the testing process, saving the testing time, avoiding the electronic equipment from being clamped on the sensor testing link during the production, particularly the testing of the photoelectric sensor, and further improving the production efficiency of the electronic equipment.

The sensor in the embodiment of the present invention is preferably a photoelectric sensor, and therefore the sensor referred to below is a photoelectric sensor.

As shown in fig. 1, fig. 1 is a schematic flow chart of a sensor testing method provided in a first embodiment of the present invention, and is applied to an electronic device, where the electronic device includes a sensor, and a specific flow chart of the sensor testing method is as follows:

and S101, connecting the electronic equipment with a clamp bearing the electronic equipment.

Specifically, the electronic device is connected to the clamp through an interface, where the interface includes at least one of a USB interface, a Universal Asynchronous Receiver/Transmitter (UART) interface, or a wireless interface, where the wireless interface may be a bluetooth interface, a WiFi interface, or an infrared transmission interface, or the like.

After the electronic device is connected with the clamp in a wireless mode or a wired mode, the clamp can receive the sensor test sequence and the test signal from the electronic device.

Step S102, sending the sensor test sequence from the electronic device to the fixture, wherein the sensor test sequence comprises all instructions or instruction sets which may be called by the fixture.

In a conventional method for testing a photoelectric sensor, a photoelectric sensor test sequence is directly stored in the fixture, and after each electronic device arrives at a test station, the test sequence sent by the fixture is identical, but parameters and other information of the sensor of each electronic device are different, so that the test based on the condition of the sensor in each electronic device cannot be realized.

In an embodiment of the invention, the sensor test sequence is pre-stored in the electronic device. Specifically, each electronic device stores the sensor test sequence to be tested in the electronic device in advance in a previous station of the sensor test station, and after the electronic device reaches the test station, the pre-stored sensor test sequence is sent to the fixture, and the fixture performs the photoelectric sensor test according to the received sensor test sequence from each electronic device, instead of storing a set of test sequence in the fixture in advance, so that the test of each electronic device is completely repeated mechanically, which results in long time consumption.

Further, the sensor test sequence is composed of a plurality of instruction files or instruction set files, and the file name of each file is the code of the instructions or instruction sets. The code corresponds one-to-one to the instruction or set of instructions. The instructions or set of instructions may be understood simply as a setting method or set of setting methods for a variety of different light environments.

The instruction set is a combination of a plurality of instructions, and the plurality of instructions are instruction sequences which can be executed with high probability in a sequential relationship. For example, the sensor test sequence includes N instruction sets, each instruction set corresponds to an instruction sequence combination in one light environment, for example, the instruction sequence combination in a red light environment, a yellow light environment, a green light environment, a blue light environment, and the like, where each light environment of different colors may include several different degrees, for example, the red light may be divided into multiple levels according to the brightness, and thus may correspond to several light environments in a red light environment, and so on. Therefore, the instructions in a certain instruction set correspond to several light environments in a certain color system, and the test in the several light environments is not necessary, and the test sequence may differ according to the difference of each electronic device, so that the execution sequence and the execution probability of the corresponding instructions may also differ. Since the electronic device is typically used in a visible light environment, the probability of testing in a visible light environment is high, so the several instructions contained in the visible light corresponding instruction set are instructions that are likely to have a high probability of execution.

In a subsequent step, the fixture will invoke the instruction or the set of instructions in the sensor test sequence to set up different light environments for testing, so that the sensor test sequence includes all of the instructions or sets of instructions that the fixture may invoke.

The instructions for setting a plurality of light environments in the same color system are used as an instruction set, so that the colored light can be prevented from jumping greatly when the light environments are set, the time for setting the light environments is saved, and the test progress of the photoelectric sensor is improved.

And S103, sending codes representing corresponding instructions in the sensor test sequence to the clamp, so that the clamp calls the corresponding instructions in the sensor test sequence according to the codes to test the sensor.

Specifically, after the fixture receives the photosensor test sequence, the fixture may start to receive a test signal from the electronic device, where the manner in which the fixture receives the test signal may be menu reception or automatic reception. When the electronic equipment needs to send a test signal to the clamp, sending the code of the corresponding instruction in the sensor test sequence to the clamp; and when the electronic equipment needs to send a plurality of test signals to the clamp, the codes of a plurality of corresponding instructions in the sensor test sequence are sent to the clamp.

Further, a plurality of the codes may be sent simultaneously, the codes including codes corresponding to a plurality of instructions in the instruction set.

The codes are simultaneously transmitted, so that the electronic equipment can simultaneously transmit a plurality of test signals with small data, and the aim of rapidly transmitting and receiving the test signals is fulfilled.

The codes can be sent simultaneously, and can also be sent for multiple times according to different test light environments.

And after the clamp receives the test signal from the electronic equipment, namely the code is received, the corresponding instruction or instruction set is called according to the one-to-one correspondence relationship between the code and the instruction or instruction set, and different light environments are set to test the sensor.

Specifically, after the fixture receives the code, a corresponding test sequence in the sensor test sequence is called to perform a package test on the electronic device. Specifically, the fixture calls a corresponding test sequence, that is, an instruction or an instruction set, to perform corresponding light environment setting, and after the light environment setting is completed, the electronic device is placed in the light environment to detect a light parameter value of the light environment, for example, detect Crgb (average color value) and the like in the light environment. Comparing the light parameter value detected by the electronic equipment with the set light parameter value of the light environment, if the difference is too large, the electronic equipment is abnormal, and the electronic equipment is a defective product, and special analysis is needed to search for the reason of the abnormality after the test is finished.

Further, when the clamp receives a plurality of codes at the same time, the clamp can store the plurality of codes and then sequentially call the instructions corresponding to the plurality of codes to test the photoelectric sensor.

The sensor test sequence and the code are stored in the electronic equipment in advance and are sequentially sent to the clamp when the test is needed, so that the clamp can obtain the test sequence and the test signal according to different electronic equipment, and the adaptability of the clamp is improved.

In the method described in the first embodiment of the present invention, the sensor test sequence and the code to be tested of each electronic device are stored in the electronic device in advance, so that the test is performed based on the self condition of each electronic device, the repeated mechanical test is avoided, the test process is accelerated, and the production efficiency of the electronic device is improved.

According to the method described in the first embodiment, the second embodiment of the present invention will be further described from the perspective of a sensor testing device, which may be implemented as a stand-alone entity or integrated in an electronic device, such as a mobile phone or a tablet computer.

As shown in fig. 2, fig. 2 specifically illustrates a sensor testing device provided by a second embodiment of the present invention, which is applied to an electronic device, and the sensor testing device may include: a connection module 201, a sensor test sequence module 202 and an instruction transceiving module 203, wherein:

the connecting module 201 is used for connecting the electronic equipment with a clamp;

a sensor test sequence module 202, configured to send the sensor test sequence of the previous embodiment to the fixture;

and the instruction transceiver module 203 is configured to send a code representing a corresponding instruction in the sensor test sequence to the fixture, so that the fixture calls the corresponding instruction in the sensor test sequence according to the code to test the sensor.

Specifically, the connection module 201 is configured to connect the electronic device and the clamp in a wired manner or a wireless manner, for example, the connection module may be a USB connection, a UART connection, a bluetooth connection, a WiFi connection, or an infrared transmission connection.

And the sensor test sequence module 202 is configured to send the sensor test sequence pre-stored in the electronic device to the fixture, so as to implement a test based on the self condition of the sensor in the electronic device.

And the instruction transceiver module 203 is configured to, after the fixture receives the code from the electronic device, call a corresponding instruction or instruction set in the sensor test sequence according to the code, and set a corresponding light environment to test the photoelectric sensor.

In a specific implementation, each of the modules and/or units may be implemented as an independent entity, or may be implemented as one or several entities by being combined at will, and the specific implementation of each of the modules and/or units may refer to the foregoing method embodiment, and specific achievable beneficial effects also refer to the beneficial effects in the foregoing first embodiment, which are not described herein again.

In addition, the third embodiment of the present invention further provides an electronic device, which may be a mobile terminal such as a smart phone and a tablet computer. As shown in fig. 3, fig. 3 is a schematic structural diagram of an electronic device according to an embodiment of the present invention, where the electronic device 300 includes a processor 301 and a memory 302. The processor 301 is electrically connected to the memory 302.

The processor 301 is a control center of the electronic device 300, connects various parts of the whole electronic device by using various interfaces and lines, and executes various functions of the electronic device and processes data by running or loading an application program stored in the memory 302 and calling data stored in the memory 302, thereby performing overall monitoring of the electronic device.

In this embodiment, the processor 301 in the electronic device 300 loads instructions corresponding to processes of one or more application programs into the memory 302, and the processor 301 runs the application programs stored in the memory 302 according to the following steps, so as to implement various functions:

sending the sensor test sequence of the first embodiment from the electronic device to the fixture, the sensor test sequence including instructions or sets of instructions that the fixture may invoke;

The electronic device 300 can implement any step of the sensor testing method provided in the first embodiment of the present invention, and therefore, the beneficial effects that can be achieved by the sensor testing method provided in the first embodiment of the present invention can be achieved, which are detailed in the foregoing embodiments and will not be described herein again.

Fig. 4 shows another schematic structural diagram of an electronic device provided in a third embodiment of the invention, and the electronic device 400 may be used to implement the sensor testing method provided in the first embodiment of the invention. The electronic device 400 may be a mobile terminal such as a smart phone or a notebook computer.

The RF circuit 410 is used for receiving and transmitting electromagnetic waves, and implementing interconversion between the electromagnetic waves and electrical signals, thereby communicating with a communication network or other devices. RF circuitry 410 may include various existing circuit elements for performing these functions, such as an antenna, a radio frequency transceiver, a digital signal processor, an encryption/decryption chip, a Subscriber Identity Module (SIM) card, memory, and so forth. The RF circuit 410 may communicate with various networks such as the internet, an intranet, a wireless network, or with other devices over a wireless network. The wireless network may comprise a cellular telephone network, a wireless local area network, or a metropolitan area network. The Wireless network may use various Communication standards, protocols and technologies, including but not limited to Global System for Mobile Communication (GSM), Enhanced Mobile Communication (EDGE), Wideband Code Division Multiple Access (WCDMA), Code Division Multiple Access (CDMA), Time Division Multiple Access (TDMA), Wireless Fidelity (Wi-Fi) (e.g., IEEE802.11a, IEEE802.11 b, IEEE802.11g and/or IEEE802.11 n), Voice over Internet Protocol (VoIP), world wide Microwave Access (Microwave for Wireless), Max-1, and other short message protocols, as well as any other suitable communication protocols, and may even include those that have not yet been developed.

The memory 420 may be configured to store software programs and modules, such as program instructions/modules corresponding to the sensor testing method in the foregoing embodiments, and the processor 480 executes various functional applications and data processing by running the software programs and modules stored in the memory 420, so as to obtain frequencies of information transmission signals transmitted by the electronic device. Generating interference signals, and the like. The memory 420 may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, memory 420 may further include memory located remotely from processor 480, which may be connected to electronic device 400 via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.

The input unit 430 may be used to receive input numeric or character information and generate keyboard, mouse, joystick, optical or trackball signal inputs related to user settings and function control. In particular, the input unit 430 may include a touch-sensitive surface 431 as well as other input devices 432. The touch-sensitive surface 431, also referred to as a touch display screen or a touch pad, may collect touch operations by a user on or near the touch-sensitive surface 431 (e.g., operations by a user on or near the touch-sensitive surface 431 using any suitable object or attachment such as a finger, a stylus, etc.) and drive the corresponding connection device according to a predetermined program. Alternatively, the touch sensitive surface 431 may comprise both a touch detection device and a touch controller. The touch detection device detects the touch direction of a user, detects a signal brought by touch operation and transmits the signal to the touch controller; the touch controller receives touch information from the touch sensing device, converts the touch information into touch point coordinates, sends the touch point coordinates to the processor 480, and receives and executes commands sent from the processor 480. In addition, the touch-sensitive surface 431 may be implemented in various types, such as resistive, capacitive, infrared, and surface acoustic wave. The input unit 430 may include other input devices 432 in addition to the touch-sensitive surface 431. In particular, other input devices 432 may include, but are not limited to, one or more of a physical keyboard, function keys (such as volume control keys, switch keys, etc.), a trackball, a mouse, a joystick, and the like.

The display unit 440 may be used to display information input by or provided to the user and various graphical user interfaces of the mobile terminal 400, which may be made up of graphics, text, icons, video, and any combination thereof. The Display unit 440 may include a Display panel 441, and optionally, the Display panel 441 may be configured in the form of an LCD (Liquid Crystal Display), an OLED (Organic Light-Emitting Diode), or the like. Further, the touch-sensitive surface 631 may overlay the display panel 441, and when a touch operation is detected on or near the touch-sensitive surface 431, the touch operation is transmitted to the processor 480 to determine the type of touch event, and then the processor 480 provides a corresponding visual output on the display panel 441 according to the type of touch event. Although the touch-sensitive surface 431 and the display panel 441 are shown as two separate components to implement input and output functions, in some embodiments, the touch-sensitive surface 431 and the display panel 441 may be integrated to implement input and output functions.

The electronic device 400 may also include at least one sensor 450, such as the photoelectric sensor, motion sensor, and other sensors mentioned in the first embodiment of the invention that perform the test. Specifically, the photo sensor may include an ambient light sensor that may adjust the brightness of the display panel 441 according to the brightness of ambient light, and a proximity sensor that may generate an interrupt when the folder is closed or closed. As one of the motion sensors, the gravity acceleration sensor can detect the magnitude of acceleration in each direction (generally, three axes), can detect the magnitude and direction of gravity when the mobile phone is stationary, and can be used for applications of recognizing the posture of the mobile phone (such as horizontal and vertical screen switching, related games, magnetometer posture calibration), vibration recognition related functions (such as pedometer and tapping), and the like; as for other sensors such as a gyroscope, a barometer, a hygrometer, a thermometer, and an infrared sensor, which may be further configured to the electronic device 400, detailed descriptions thereof are omitted.

The audio circuit 460, speaker 461, microphone 462 may provide an audio interface between a user and the electronic device 400. The audio circuit 460 may transmit the electrical signal converted from the received audio data to the speaker 461, and convert the electrical signal into a sound signal for output by the speaker 461; on the other hand, the microphone 462 converts the collected sound signal into an electric signal, which is received by the audio circuit 460 and converted into audio data, which is then processed by the audio data output processor 480, and then transmitted to, for example, another terminal via the RF circuit 410, or output to the memory 420 for further processing. The audio circuit 460 may also include an earbud jack to provide communication of peripheral headphones with the electronic device 400.

The electronic device 400, through the transmission module 470 (e.g., Wi-Fi module), may assist the user in receiving requests, sending information, etc., which provides the user with wireless broadband internet access. Although the transmission module 470 is shown in the drawing, it is understood that it does not belong to the essential constitution of the electronic device 400 and may be omitted entirely as needed within the scope not changing the essence of the invention.

The processor 480 is a control center of the electronic device 400, connects various parts of the entire cellular phone using various interfaces and lines, and performs various functions of the electronic device 400 and processes data by operating or executing software programs and/or modules stored in the memory 420 and calling data stored in the memory 420, thereby integrally monitoring the electronic device. Optionally, processor 480 may include one or more processing cores; in some embodiments, processor 480 may integrate an application processor, which primarily handles operating systems, user interfaces, applications, etc., and a modem processor, which primarily handles wireless communications. It will be appreciated that the modem processor described above may not be integrated into processor 480.

Electronic device 400 also includes a power supply 490 (e.g., a battery) that powers various components and, in some embodiments, may be logically coupled to processor 480 via a power management system to manage charging, discharging, and power consumption management functions via the power management system. The power supply 490 may also include one or more dc or ac power sources, recharging systems, power failure detection circuitry, power converters or inverters, power status indicators, and any like components.

Although not shown, the electronic device 400 further includes a camera (e.g., a front camera, a rear camera), a bluetooth module, and the like, which are not described in detail herein. Specifically, in this embodiment, the display unit of the electronic device is a touch screen display, the electronic device further includes a memory, and one or more programs, where the one or more programs are stored in the memory and configured to be executed by the one or more processors, and the one or more programs include instructions for:

sending the sensor test sequence from the electronic device to the fixture, the sensor test sequence including instructions or sets of instructions that the fixture may invoke;

In specific implementation, the above modules may be implemented as independent entities, or may be combined arbitrarily to be implemented as the same or several entities, and specific implementation of the above modules may refer to the foregoing method embodiments, which are not described herein again.

It will be understood by those skilled in the art that all or part of the steps of the methods of the above embodiments may be performed by instructions or by associated hardware controlled by the instructions, which may be stored in a computer readable storage medium and loaded and executed by a processor. To this end, a fourth embodiment of the present invention provides a storage medium having a plurality of instructions stored therein, where the instructions can be loaded by a processor to execute any one of the steps of the sensor testing method provided in the first embodiment of the present invention.

Wherein the storage medium may include: read Only Memory (ROM), Random Access Memory (RAM), magnetic or optical disks, and the like.

Since the instructions stored in the storage medium can execute any step of the sensor testing method provided in the first embodiment of the present invention, the beneficial effects that can be achieved by any sensor testing method provided in the first embodiment of the present invention can be achieved, for details, see the foregoing first embodiment, and are not described herein again.

The above embodiments describe a sensor testing method, a sensor testing device, a storage medium, and an electronic device provided by the present invention in detail, and a specific example is applied in the present disclosure to explain the principle and the implementation of the present application, and the description of the above embodiments is only used to help understand the method and the core idea of the present application; meanwhile, for those skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.

Claims

1. A sensor testing method is applied to electronic equipment, the electronic equipment comprises a sensor, and the sensor testing method is characterized by comprising the following steps:

2. The sensor testing method of claim 1, wherein the coupling of the electronic device to the fixture comprises:

3. The sensor testing method of claim 1, wherein the sensor testing sequence is sent from the electronic device to the fixture, the sensor testing sequence being pre-stored in the electronic device.

4. The method of claim 1, wherein the sensor test sequence is sent from the electronic device to the fixture, wherein the sensor test sequence is composed of a number of instruction files or instruction set files, and wherein each file has a file name of the code of the instruction or instruction set.

5. The sensor testing method of claim 4, wherein the instruction set is a combination of instructions.

6. The sensor testing method of claim 1, wherein the code corresponding to the command in the sensor testing sequence is sent to the fixture, and a plurality of the codes are sent simultaneously.

7. The method according to claim 6, wherein the code comprises a code corresponding to a plurality of instructions in an instruction set.

8. A sensor testing device applied to an electronic apparatus including a sensor, the sensor testing device comprising:

9. A computer-readable storage medium having stored thereon a plurality of instructions adapted to be loaded by a processor to perform the sensor testing method of any one of claims 1-7.

10. An electronic device comprising a processor electrically connected to a memory, the memory storing instructions and data, and a memory for performing the steps of the sensor testing method of any one of claims 1-7.