CN110795297B - Electronic equipment testing method and device - Google Patents
Electronic equipment testing method and device Download PDFInfo
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- CN110795297B CN110795297B CN201911051742.6A CN201911051742A CN110795297B CN 110795297 B CN110795297 B CN 110795297B CN 201911051742 A CN201911051742 A CN 201911051742A CN 110795297 B CN110795297 B CN 110795297B
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract
The application provides a method and a device for testing electronic equipment. According to the method and the device, the common test item library is used for storing the corresponding relation between the common test item labels and the common test items, and when the simplified test script is executed to test the electronic equipment, the test equipment calls the common test items in the common test item library based on the common test item labels so as to complete the test of the common functions of the electronic equipment. On one hand, the common test item labels are recorded in the simplified test script instead of the common test items, so that less data are stored in the simplified test script, and the storage pressure is reduced; on the other hand, when the common function of the electronic equipment is changed, compared with the existing common test items in all test scripts, the method and the device only need to modify the common test items corresponding to the changed function in the common test item library, so that the efficiency of changing the common test items can be greatly improved.
Description
Technical Field
The present disclosure relates to the field of testing, and in particular, to a method and an apparatus for testing electronic devices.
Background
The testing of the electronic device refers to that the testing device is connected with the electronic device to be tested in a serial port, telnet and other modes, and then test items are executed aiming at the function to be tested of the electronic device, so that whether the function of the electronic device is normal or not is judged according to a result returned by the electronic device. Currently, testers often use an automated testing method to test electronic devices. In the automatic test, the test equipment acquires a preset test script corresponding to the electronic equipment to be tested, and tests the function to be tested of the electronic equipment by executing test items in the test script so as to automatically identify whether the function is normal or not according to a result returned by the electronic equipment.
Generally, each model of electronic device corresponds to a test script containing a plurality of test items, wherein each test item is used for testing a function of the model of electronic device. In the prior art, test scripts generally include test items corresponding to all functions of the electronic device.
However, electronic devices of different models also have common functions, and common test items corresponding to the common functions are the same, which brings about a certain disadvantage. On one hand, a large number of test scripts contain the same common test items, so that redundant data of the test scripts are more, and storage pressure is high; on the other hand, when the common function of the electronic equipment is changed, the common test items in all the test scripts need to be correspondingly updated, so that the changing efficiency of the common test items is greatly reduced.
Disclosure of Invention
Aiming at the technical problems, the application provides a test method and a test device for electronic equipment, which can effectively reduce the data volume of a test script and improve the update efficiency of the test script.
According to a first aspect of the present application, there is provided a method for testing an electronic device, the method comprising:
reading a simplified test script corresponding to target electronic equipment to be tested, wherein the simplified test script comprises a target public test item label and a target independent test item;
searching a target public test item indicated by the target public test item label in a preset public test item library;
testing the target electronic device based on the target independent test item and the target common test item;
the target public test item is used for testing functions shared by the target electronic equipment and other electronic equipment; the target independent test item is used for testing the unique function of the target electronic device.
According to a second aspect of the present application, there is provided a test apparatus for an electronic device, the apparatus comprising:
the device comprises a reading unit, a testing unit and a testing unit, wherein the reading unit is used for reading a simplified test script corresponding to target electronic equipment to be tested, and the simplified test script comprises a target public test item label and a target independent test item;
the searching unit is used for searching the target public test item indicated by the target public test item label in a preset public test item library;
a test unit for testing the target electronic device based on the target independent test item and the target common test item; the target public test item is used for testing functions shared by the target electronic equipment and other electronic equipment; the target independent test item is used for testing the unique function of the target electronic device.
According to a third aspect of the present application, there is provided an apparatus comprising a processor and a machine-readable storage medium;
the machine-readable storage medium stores machine-executable instructions executable by the processor;
the processor is caused by the machine-executable instructions to perform the method as described above.
According to a fourth aspect of the present application, there is provided a machine-readable storage medium;
the machine-readable storage medium stores machine-executable instructions that, when invoked and executed by a processor, cause the processor to perform the method as described above.
In the application, a common test item library is maintained on the test equipment, common test items for testing all common functions of each electronic equipment are stored in the common test item library, and labels of the common test items are recorded by the simplified test scripts corresponding to each electronic equipment. When the simplified test script is executed to test the electronic equipment, the test equipment can call the public test items in the public test item library based on the public test item labels recorded in the simplified test script to complete the test of the common functions of the electronic equipment.
On one hand, the common test item labels are recorded in the simplified test script instead of the common test items, so that less data are stored in the simplified test script, and the storage pressure is reduced; on the other hand, when the common function of the electronic equipment is changed, compared with the existing common test items in all test scripts, the method and the device only need to modify the common test items corresponding to the changed function in the common test item library, so that the efficiency of updating the common test items can be greatly improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following description will briefly introduce the drawings that are required to be used in the embodiments or the description of the prior art, and it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings may also be obtained according to these drawings for a person having ordinary skill in the art.
FIG. 1 is a schematic illustration of an application scenario in accordance with an exemplary embodiment of the present application;
FIG. 2 is a flow chart of a method of testing an electronic device according to an exemplary embodiment of the present application;
FIG. 3 is a flow chart of another method of testing electronic devices, as shown in an exemplary embodiment of the present application;
FIG. 4 is a hardware block diagram of a test apparatus according to an exemplary embodiment of the present application;
fig. 5 is a block diagram of an electronic device testing apparatus according to an exemplary embodiment of the present application.
Detailed Description
In order for those skilled in the art to better understand the technical solutions in the embodiments of the present specification, the technical solutions in the embodiments of the present specification will be described in detail below with reference to the drawings in the embodiments of the present specification, and it is apparent that the described embodiments are only some embodiments of the present specification, not all embodiments. All other embodiments obtained by a person skilled in the art based on the embodiments in the present specification shall fall within the scope of protection.
Referring to fig. 1, fig. 1 is a schematic diagram of an application scenario, which includes a test device and an electronic device, according to an exemplary embodiment of the present application.
The test device is a device which contains test software and uses the test software to test the electronic device. The test device may be a PC or a server, or may be the electronic device itself to be tested, which is not particularly limited herein. The test equipment is connected with the electronic equipment to be tested in a serial port mode, a Telnet mode and the like. As shown in fig. 1, the test device is connected with three different types of electronic devices, namely an electronic device 1, an electronic device 2 and an electronic device 3.
Assuming that the electronic device to be tested is the electronic device 1, a test script 1 of the electronic device 1 is preset in the test device. Assuming that the electronic device 1 has a function a and a function B, the test script 1 includes a test item a for testing the function a and a test item B for testing the function B.
When the test device tests the electronic device 1, it is first necessary to connect the electronic device 1, then acquire the test script 1, and then execute the test item a and the test item B in the test script 1, respectively.
Existing test scripts typically include a plurality of test items for testing all functions of the electronic device. The test equipment can test the electronic equipment by executing the test items in the test script one by one. For example, in fig. 1, a test item a corresponding to a function a and a test item B corresponding to a function B are included in a test script 1 of an electronic device 1; the electronic device 2 has a function a and a function C, and the test script 2 of the electronic device 2 includes a test item a corresponding to the function a and a test item C corresponding to the function C.
However, electronic devices of different models also have common functions, and common test items corresponding to the common functions are the same, which brings about a certain disadvantage. On one hand, a large number of test scripts contain the same common test items, so that redundant data of the test scripts are more, and storage pressure is high; on the other hand, when the common function of the electronic device is changed, the common test items in all the test scripts need to be correspondingly updated, and the change efficiency of the common test items is low.
For example, the electronic device in fig. 1, since the electronic device 1 and the electronic device 2 have the common function a, the test script 1 and the test script 2 contain the same common test item a. Saving the same common test item in the two test scripts so that the test script data are redundant, and unnecessary pressure is caused to the storage; in addition, if the function a is changed, both the test script 1 and the test script 2 need to update the test item a in the respective test scripts, and the update efficiency of the test scripts is low.
In view of this, the present application proposes a new testing method for electronic devices. In the application, a common test item library is maintained on the test equipment, common test items for testing all common functions of each electronic equipment are stored in the common test item library, and labels of the common test items are recorded by the simplified test scripts corresponding to each electronic equipment. When the simplified test script is executed to test the electronic equipment, the test equipment can call the public test items in the public test item library based on the public test item labels recorded in the simplified test script to complete the test of the common functions of the electronic equipment. On one hand, the common test item labels are recorded in the simplified test script instead of the common test items, so that less data are stored in the simplified test script, and the storage pressure is reduced; on the other hand, when the common function of the electronic equipment is changed, compared with the existing common test items in all test scripts, the method and the device only need to modify the common test items corresponding to the changed function in the common test item library, so that the efficiency of changing the common test items can be greatly improved.
In this application, specific concepts will be used and, for convenience of description, these concepts will be explained below:
1. test item
A test item refers to a set of test commands that test the functionality of an electronic device.
Test items can be functionally divided into two categories. One type is a common test item for testing functions shared between electronic devices; the other is an independent test item for testing a function unique to the electronic device.
Alternatively, the format of the test item may include a test item name and a test item command.
For example, the content of test item a is: test item name: a, test item command: a. it will be appreciated that each test item in the test script may include a test type, a test item view, a test value size, etc., according to actual requirements, in addition to the test item name and the test item command. The content contained in the test item is only described here by way of example, and is not particularly limited.
2. Simplified test script
The simplified test script comprises public test item labels and independent test items, wherein the public test item labels are in one-to-one correspondence with the public test items, and the correspondence is stored in a public test item library.
For example, the correspondence between the public test label a and the public test item a is recorded in the public test item library in the form of key value pairs, and the correspondence is as follows:
{ Label_A: "test item name: a, test item command: a "}.
3. Current test script
The current test script contains both common test items and independent test items.
For example, the electronic device 1 comprises a common function a and an independent function B, and the current test script of the electronic device 1 is as follows:
{ test item name: a, test item command: a (common test item a for testing common function a);
test item name: b, test item command: b (independent test item B for testing independent function B) }
Referring to fig. 2, fig. 2 is a flowchart illustrating a method for testing an electronic device according to an exemplary embodiment of the present application.
As shown in fig. 2, the method comprises the following steps:
step S201: the test equipment reads a simplified test script corresponding to the target electronic equipment to be tested, wherein the simplified test script comprises a target public test item label and a target independent test item.
In the embodiment of the application, the correspondence between the electronic device identifier and the reduced test script is pre-configured, and when the reduced test script corresponding to the target electronic device to be tested is read, the electronic device can search the reduced test script corresponding to the target electronic device in the correspondence between the electronic device identifier and the reduced test script. The simplified test script comprises a target public test item label and a target independent test item.
Step S202: and the test equipment searches the target public test item indicated by the target public test item label in a preset public test item library.
In the application, the test equipment reads a preset public test item library, and optionally, the public test item library records public test item labels and the corresponding relation of the public test items. The test device searches the public test item library for the public test item corresponding to the public test item label according to the public test item label read in step S201.
For example, the correspondence between the public test label a and the public test item a is recorded in the public test item library in the form of key value pairs, and the correspondence is as follows:
{ Label_A: "test item name: a, test item command: a "}.
After the test device reads the common test item a (i.e. "Label_a") in step S201, the target common test item found in the common test item library is "test item name: a, test item command: a).
Step S203: the test equipment tests the target electronic equipment based on the target independent test item and the target public test item; the target public test item is used for testing functions shared by the target electronic equipment and other electronic equipment; the target independent test item is used for testing the unique function of the target electronic device.
The target independent test items are read in step S201, and the target common test items are queried in step S202.
The test equipment executes the target independent test item to realize the test of the unique function of the target electronic equipment; and executing the target public test item to realize the test of the common function of the target electronic equipment and other electronic equipment.
As an embodiment, the step of the test device executing the target independent test item and the target common test item may include:
firstly, replacing a target public test item label corresponding to the target public test item in the simplified test script by the searched target public test item.
In step S202, a target common test item corresponding to the target common test item tag has been found, and in the reduced test script, the target common test item tag is replaced with the target common test item tag, so as to form a new reduced test script.
It should be noted that the replacing operation just performs temporary replacement in the current test process, and does not cover the simplified test script after the replacing operation with the original simplified test script. For example, the test equipment may cache the new reduced test script after the replacement operation.
And then, executing the simplified test script after the replacement operation to test the target electronic equipment.
The new simplified test script after the replacing operation comprises test items corresponding to all functions of the target electronic equipment, and optionally, each test item comprises a test item name and a test item command.
And executing all test item commands in the new simplified test script to complete the test of all functions of the target electronic equipment. After execution is complete, the test equipment may delete the cached new reduced test script.
Thus, the flow shown in fig. 2 is completed.
As can be seen from the flow shown in fig. 2, the present application stores the correspondence between the common test item labels and the common test items by using the common test item library, and when the simplified test script is executed to test the electronic device, the test device calls the common test items in the common test item library based on the common test item labels, so as to complete the test of the common functions of the electronic device. On one hand, the common test item labels are recorded in the simplified test script instead of the common test items, so that less data are stored in the simplified test script, and the storage pressure is reduced; on the other hand, when the common function of the electronic equipment is changed, compared with the existing common test items in all test scripts, the method and the device only need to modify the common test items corresponding to the changed function in the common test item library, so that the efficiency of changing the common test items can be greatly improved.
The method shown in fig. 2 is described below in one specific embodiment.
Taking fig. 1 as an example, assume that a target electronic device to be tested is an electronic device 1, a function a shared by the electronic device 1 and other electronic devices is a function a, and a common test item Label for testing the function a is Label_a; the function unique to the electronic apparatus 1 is a function B, and the independent test items for testing the function B are: test item name: b, test item command: b.
the method of testing the electronic device 1 by the test device is as follows:
the first step: the test equipment searches the corresponding simplified test script 1 according to the label of the electronic equipment 1, and reads the content of the simplified test script 1 as follows:
{ Label_A (common test item Label);
test item name: b, test item command: b (independent test item).
And a second step of: the test equipment reads a preset public test item library as follows:
{ Label_A: "test item name: a, test item command: a "}.
And a third step of: the test equipment searches the common test item with the label_A in the common test item library according to the common test item Label (namely the label_A) searched in the first step, and the following result is obtained:
{ test item name: a, test item command: a }.
Fourth step: the test equipment adopts the searched test item name: a, test item command: a "replace" Label_A ", and cache the new reduced test script new1 after the replacement operation, the new reduced test script new1 is as follows:
{ test item name: a, test item command: a, a;
test item name: b, test item command: b }
Fifth step: the test equipment executes the test item command a and the test item command b in the new simplified test script respectively.
Sixth step: the test equipment clears the new reduced test script.
To this end, the test device completes the test of the electronic device 1.
As an alternative embodiment, in this application, if the electronic device to be tested does not have a reduced test script, the reduced test script may be generated by using the existing test script according to the method shown in fig. 3, and the specific steps are as follows.
Step S301: the testing equipment acquires the current testing script of the target electronic equipment; the active test script includes a target common test item and a target independent test item of the target electronic device.
The test equipment acquires the current test script of the electronic equipment through the tag of the electronic equipment, wherein the current test script comprises common test items and independent test items. For convenience of description, the common test item and the individual test items are collectively referred to as test items hereinafter.
For example, if the electronic device 1 includes a common function a and an independent function B, the current test script 1 of the electronic device 1 is as follows:
{ test item name: a, test item command: a (test item a for test function a);
test item name: b, test item command: b (test item B for test function B) }
Step S302: and the test equipment adopts a target public test item label to replace a target public test item in the current test script, and the current test script subjected to replacement operation is used as a simplified test script of the target electronic equipment.
Step S302 is described in detail below by step S3021 to step S3022.
Step S3021: the test equipment may determine a target common test item tag corresponding to the target common test item.
When the target common test item tag is determined, the common test item tag and the correspondence of the common test item are stored in the common test item library, as in step S202 in fig. 2.
And the test equipment determines a public test item label corresponding to the test item in the public test item library according to the test item in the current test script acquired in the step S301.
It can be understood that, during the searching, a part of test items in the current test script can successfully find out the test item label, for example, the test item A, the part of test items are public test items, and the corresponding test item label is a public test item label; if another part of test items cannot successfully find the test item label, such as test item B, the part of test items are independent test items.
Step S3022: the test equipment can adopt the target public test item label to replace the public test item corresponding to the test item label in the current test script, and save the current test script after the replacement operation as the simplified test script of the electronic equipment.
For example, assume that the current test script 1 of the electronic device 1 is as follows:
{ test item name: a, test item command: a (test item a for test function a);
test item name: b, test item command: b (test item B for test function B) }
Assume that a common test item library is shown in table 1.
| Public test item name | Common test item command | Public test item tags |
| A | a | Label A |
TABLE 1
The generation of a reduced test script for the electronic device 1 based on the current test script 1 is described below.
The first step: "test item names" are determined in the common test item library as shown in table 1: a, test item command: a "(i.e., test item a) corresponds to the common test item Label, and the result obtained is" label_a ".
And a second step of: determining a test item name in a common test item library: b, test item command: b "(i.e. test item B) corresponding to the common test item tag, no corresponding common test item tag is found. Since "test item name" is not found: b, test item command: b "corresponding common test item label, the electronic device can determine" test item name: b, test item command: b "is an independent test item and maintains the independent test item.
And a third step of: substituting "Label_A" for "test item name" in the current test script: a, test item command: a ", a reduced test script of the electronic device 1 is formed.
The resulting reduced test script is shown below:
{Label_A；
test item name: b, test item command: b }
The test equipment thus completes the process of generating a reduced test script using the current test script. Thus, the flow shown in fig. 3 is completed.
As can be seen from the flow shown in fig. 3, in the present application, if the electronic device already has a corresponding current test script but does not have a corresponding reduced test script, the common test item tag in the common test item library may be used to replace the common test item in the current test script, so as to obtain the reduced test script and cover the original current test script. On one hand, the common test item labels are recorded in the simplified test script instead of the common test items, so that the stored data are fewer than those of the existing test script, and the storage pressure is reduced; on the other hand, when the common function of the electronic equipment is changed, only the public test item library is required to be modified, and the simplified test script is not required to be modified, so that the updating efficiency of the test script is higher than that of the existing test script.
As an alternative embodiment, in the present application, the reduced test script may be user-preset.
Specifically, the test equipment receives a target public test item label and a target independent test item which are input by a user and are aimed at the target electronic equipment, generates a simplified test script corresponding to the target electronic equipment, and stores the simplified test script.
Referring to fig. 4, fig. 4 is a hardware configuration diagram of a test apparatus according to an exemplary embodiment of the present application.
The test device includes a communication interface 401, a processor 402, a machine readable storage medium 403 and a bus 404; wherein the communication interface 401, the processor 402 and the machine readable storage medium 403 perform communication with each other via a bus 404. The processor 402 may perform the traffic scheduling method described above by reading and executing machine-executable instructions in the machine-readable storage medium 403 corresponding to the traffic scheduling control logic.
The machine-readable storage medium 403 referred to herein may be any electronic, magnetic, optical, or other physical storage device that may contain or store information, such as executable instructions, data, or the like. For example, a machine-readable storage medium may be: volatile memory, nonvolatile memory, or similar storage medium. In particular, the machine-readable storage medium 403 may be RAM (Radom Access Memory, random access memory), flash memory, a storage drive (e.g., hard drive), a solid state drive, any type of storage disk (e.g., optical disk, DVD, etc.), or a similar storage medium, or a combination thereof.
The methods provided herein are described above. The apparatus provided in this application is described below:
referring to fig. 5, fig. 5 is a block diagram of an electronic device testing apparatus according to an exemplary embodiment of the present application. The apparatus may be applied to the test device shown in fig. 4, and the apparatus may include:
a reading unit 501, configured to read a reduced test script corresponding to a target electronic device to be tested, where the reduced test script includes a target public test item tag and a target independent test item;
the searching unit 502 is configured to search, in a preset public test item library, a target public test item indicated by the target public test item tag;
a test unit 503, configured to test the target electronic device based on the target independent test item and the target common test item; the target public test item is used for testing functions shared by the target electronic equipment and other electronic equipment; the target independent test item is used for testing the unique function of the target electronic device.
Optionally, the test unit further comprises:
a replacing subunit, configured to replace a target public test item tag corresponding to the target public test item in the simplified test script with the searched target public test item;
and the execution subunit is used for executing the simplified test script after the replacement operation to test the target electronic equipment.
Optionally, the apparatus further comprises:
the first generation unit is specifically configured to:
acquiring the current test script of the target electronic equipment; the current test script comprises a target public test item and a target independent test item of the target electronic equipment;
and replacing the target public test item in the current test script by using the target public test item label, and taking the current test script subjected to replacement operation as a simplified test script of the target electronic equipment.
Optionally, the apparatus further comprises:
the second generating unit is specifically configured to:
and receiving target public test item labels and target independent test items which are input by a user and are aimed at target electronic equipment, and generating a simplified test script corresponding to the target electronic equipment.
The block diagram of the apparatus shown in fig. 5 is thus completed.
The present application also provides a test apparatus comprising a processor and a machine-readable storage medium storing machine-executable instructions executable by the processor to cause the execution of the method of testing an electronic apparatus described above.
The present application also provides a machine-readable storage medium storing machine-executable instructions that, when invoked and executed by a processor, cause the processor to perform the method of testing an electronic device described above.
The foregoing description of the preferred embodiments of the present invention is not intended to limit the invention to the precise form disclosed, and any modifications, equivalents, improvements and alternatives falling within the spirit and principles of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. A method for testing an electronic device, the method comprising:
reading a simplified test script corresponding to target electronic equipment to be tested, wherein the simplified test script comprises a target public test item label and a target independent test item;
searching a target public test item indicated by the target public test item label in a preset public test item library;
testing the target electronic device based on the target independent test item and the target common test item;
the target public test item is used for testing functions shared by the target electronic equipment and other electronic equipment; the target independent test item is used for testing the unique function of the target electronic device.
2. The method of claim 1, wherein the testing the target electronic device based on the target independent test item and the target common test item comprises:
replacing a target public test item label corresponding to the target public test item in the simplified test script by the searched target public test item;
and executing the simplified test script after the replacement operation to test the target electronic equipment.
3. The method of claim 1, wherein the method of generating the reduced test script comprises:
acquiring the current test script of the target electronic equipment; the current test script comprises a target public test item and a target independent test item of the target electronic equipment;
and replacing the target public test item in the current test script by using the target public test item label, and taking the current test script subjected to replacement operation as a simplified test script of the target electronic equipment.
4. The method of claim 1, wherein the method of generating the reduced test script comprises:
and receiving target public test item labels and target independent test items which are input by a user and are aimed at target electronic equipment, and generating a simplified test script corresponding to the target electronic equipment.
5. A test apparatus for an electronic device, the apparatus being applied to a test device, the apparatus comprising:
the device comprises a reading unit, a testing unit and a testing unit, wherein the reading unit is used for reading a simplified test script corresponding to target electronic equipment to be tested, and the simplified test script comprises a target public test item label and a target independent test item;
the searching unit is used for searching the target public test item indicated by the target public test item label in a preset public test item library;
a test unit for testing the target electronic device based on the target independent test item and the target common test item; the target public test item is used for testing functions shared by the target electronic equipment and other electronic equipment; the target independent test item is used for testing the unique function of the target electronic device.
6. The apparatus of claim 5, wherein the test unit further comprises:
a replacing subunit, configured to replace a target public test item tag corresponding to the target public test item in the simplified test script with the searched target public test item;
and the execution subunit is used for executing the simplified test script after the replacement operation to test the target electronic equipment.
7. The apparatus of claim 5, wherein the apparatus further comprises:
the first generation unit is specifically configured to:
acquiring the current test script of the target electronic equipment; the current test script comprises a target public test item and a target independent test item of the target electronic equipment;
and replacing the target public test item in the current test script by using the target public test item label, and taking the current test script subjected to replacement operation as a simplified test script of the target electronic equipment.
8. The apparatus of claim 5, wherein the apparatus further comprises:
the second generation unit is specifically configured to:
and receiving target public test item labels and target independent test items which are input by a user and are aimed at target electronic equipment, and generating a simplified test script corresponding to the target electronic equipment.
9. A test device comprising a processor and a machine-readable storage medium storing machine-executable instructions executable by the processor to cause the method of any one of claims 1 to 4 to be performed.
10. A machine-readable storage medium storing machine-executable instructions which, when invoked and executed by a processor, cause the processor to perform the method of any one of claims 1 to 4.
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104407971A (en) * | 2014-11-18 | 2015-03-11 | 中国电子科技集团公司第十研究所 | Method for automatically testing embedded software |
| CN105760296A (en) * | 2016-01-21 | 2016-07-13 | 深圳市同创国芯电子有限公司 | Automation testing control method, device and terminal |
| CN106547654A (en) * | 2015-09-21 | 2017-03-29 | 中兴通讯股份有限公司 | A kind of automated testing method and device |
| CN108415846A (en) * | 2018-04-19 | 2018-08-17 | 挖财网络技术有限公司 | A kind of method and apparatus generating minimal automation test use cases |
| CN109408309A (en) * | 2018-10-18 | 2019-03-01 | 北京海泰方圆科技股份有限公司 | The test method and device of multiple terminals |
| US10430318B1 (en) * | 2017-07-11 | 2019-10-01 | Juniper Networks, Inc | Systems and methods for efficiently performing regression testing on software updates |
| CN110389890A (en) * | 2018-04-20 | 2019-10-29 | 杭州海康威视数字技术股份有限公司 | A kind of the updating maintenance method, apparatus and computer equipment in public use-case library |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9015666B2 (en) * | 2012-07-11 | 2015-04-21 | International Business Machines Corporation | Updating product documentation using automated test scripts |
-
2019
- 2019-10-31 CN CN201911051742.6A patent/CN110795297B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104407971A (en) * | 2014-11-18 | 2015-03-11 | 中国电子科技集团公司第十研究所 | Method for automatically testing embedded software |
| CN106547654A (en) * | 2015-09-21 | 2017-03-29 | 中兴通讯股份有限公司 | A kind of automated testing method and device |
| CN105760296A (en) * | 2016-01-21 | 2016-07-13 | 深圳市同创国芯电子有限公司 | Automation testing control method, device and terminal |
| US10430318B1 (en) * | 2017-07-11 | 2019-10-01 | Juniper Networks, Inc | Systems and methods for efficiently performing regression testing on software updates |
| CN108415846A (en) * | 2018-04-19 | 2018-08-17 | 挖财网络技术有限公司 | A kind of method and apparatus generating minimal automation test use cases |
| CN110389890A (en) * | 2018-04-20 | 2019-10-29 | 杭州海康威视数字技术股份有限公司 | A kind of the updating maintenance method, apparatus and computer equipment in public use-case library |
| CN109408309A (en) * | 2018-10-18 | 2019-03-01 | 北京海泰方圆科技股份有限公司 | The test method and device of multiple terminals |
Non-Patent Citations (1)
| Title |
|---|
| 张娟 ; 童维勤 ; 蔡立志 ; .基于Z规格说明的可复用测试用例形式化描述.计算机工程.2012,(16),全文. * |
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