CN110780193A - Coaxial electromechanical switch reliability testing device and method based on contact resistance measurement - Google Patents
Coaxial electromechanical switch reliability testing device and method based on contact resistance measurement Download PDFInfo
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- CN110780193A CN110780193A CN201911146817.9A CN201911146817A CN110780193A CN 110780193 A CN110780193 A CN 110780193A CN 201911146817 A CN201911146817 A CN 201911146817A CN 110780193 A CN110780193 A CN 110780193A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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Abstract
The invention belongs to the technical field of switch testing, and relates to a device and a method for testing the reliability of a coaxial electromechanical switch. The device includes: the measuring unit is used for testing the resistance value of a certain path of the coaxial electromechanical switch; and the logic control unit is used for realizing the conduction of different paths of the coaxial electromechanical switch and the measuring unit through a control signal. The test method comprises the following steps: the logic control unit enables four leads of a Kelvin four-wire method of the measuring unit to be connected into a certain channel of the coaxial electromechanical switch through a control signal; the measuring unit tests the resistance value of the tested resistor connected to the access; and judging whether the access can be normally switched on or off through the abnormal resistance value, and evaluating the reliability of the access. The device and the method of the invention represent the main electrical performance index of the coaxial electromechanical switch based on the measurement of the four-wire system contact resistance by a proportional method; the four-wire system is combined with channel selection, and the high potential application line HS is shared to realize discrimination that a previous test channel cannot be normally shut off, so that detection of switching effectiveness is realized.
Description
Technical Field
The invention belongs to the technical field of switch testing, and relates to a device and a method for testing the reliability of a coaxial electromechanical switch.
Background
The coaxial electromechanical switch is widely applied to radio frequency microwave measuring instruments such as a vector network analyzer, a spectrum analyzer and the like, and can also be used in a system which needs to carry out channel topology on microwave radio frequency signals. The reliability of which has a decisive influence on the stable operation of the system. The prior advanced scheme is a device and a method for testing the service life of a coaxial electromechanical switch disclosed in Chinese patent '201610599647. X', the patent discloses a testing device consisting of a signal generation device, a signal detection device, a digital IO device and a data acquisition device and a corresponding testing method thereof, and the device realizes switch control, data acquisition and processing by upper computer software operated by an industrial control computer based on a signal path of the signal generation device, the signal detection device after passing through a tested piece and the voltage acquisition device.
The reliability of the whole process of a plurality of sets of switches can be automatically tested and recorded. Its advantages are automatic test of service life of switch, saving labour and real-time monitoring of switch switching effectiveness. Compared with an earlier test scheme, the method has the advantages that electrical performance is usually sampled and checked in the switching process, the on-off of a single path of the switch is manually controlled, and indexes such as insertion loss and the like are tested by using a vector network analyzer, so that the method has obvious innovativeness and advancement.
However, the above patent discloses a solution in which the linear range of the detector chip is required to be high, the unit price of the detector chip is required to be high, and the number of system requirements is also large. In addition, the digital IO equipment and the data acquisition equipment generally adopt corresponding USB or PCIE board cards, and are expensive. Therefore, the whole device has the defects of complex structure, higher cost and incapability of being separated from the independent use of the industrial control computer, and has certain resistance in the production test layout of a product line.
Disclosure of Invention
The invention provides a switch reliability testing device and method based on contact resistance measurement, aiming at the problems in the prior art, the device and method greatly reduce the cost and the device volume, have a program control mode and a manual independent working mode, and are more suitable for production testing of a product line.
The technical scheme adopted by the invention for solving the technical problems is as follows: a coaxial electromechanical switch reliability testing device based on contact resistance measurement, comprising:
the measuring unit is used for testing the resistance value of a certain path of the coaxial electromechanical switch;
and the logic control unit is used for realizing the conduction of different paths of the coaxial electromechanical switch and the test unit through control logic.
The measuring unit comprises: the measuring unit comprises: the device comprises a voltage stabilizing chip, a standard resistor, a tested resistor and an AD conversion chip; the voltage stabilizing chip provides current for a standard resistor and a tested resistor which are connected in series, the voltage at two ends of the standard resistor is used as reference to be provided for a reference voltage pin of the AD conversion chip, and the voltage at two ends of the tested resistor is used as acquisition analog quantity to be input to a signal acquisition pin of the AD conversion chip; the high potential applying line, the low potential applying line and the collecting line at two ends of the tested resistor form four lead wires of the Kelvin four-wire method.
As a preferred embodiment of the present invention, the logic control unit includes a plurality of switch modules, and the switch modules are used to select the test unit to be connected with different branch ports of the coaxial electromechanical switch, so as to implement resistance measurement of different paths.
The switch module is connected between the port of the coaxial electromechanical switch branch circuit and the high-potential applying line and/or the high-potential voltage collecting line; the common port is normally connected with the low potential applying line and the collecting line thereof.
As a further improvement of the invention, the switch module is connected between the branch port of the coaxial electromechanical switch and the acquisition line of the high potential voltage; the high potential applying line is normally communicated with a branch port of the coaxial electromechanical switch, and the common port is normally communicated with the low potential applying line and the collecting line thereof.
The high potential applying line and the collecting line thereof are connected with the port of the coaxial electromechanical switch through a coaxial cable, the low potential applying line and the collecting line thereof are connected with the common port of the coaxial electromechanical switch, and the logic control unit controls the conduction of different branch ports and the common port of the coaxial electromechanical switch to realize the resistance measurement of different paths.
The logic control unit comprises an MCU and a power supply module; an IO output port of the MCU provides a control signal; and the power supply module provides working voltage for the MCU and the tested coaxial electromechanical switch.
As a further improvement of the invention, the logic control unit further comprises a liquid crystal display module, and the liquid crystal display module is connected with the MCU and used for displaying the measurement information.
As a further improvement of the invention, the MCU is connected with the industrial control computer through a serial port and is controlled by upper computer testing software.
As a further improvement of the invention, the logic control unit further comprises a key, and the key is connected with the MCU and provides a manual control function.
The invention also provides a method for testing the reliability of the coaxial electromechanical switch based on contact resistance measurement, which comprises the following steps: the logic control unit enables four leads of a Kelvin four-wire method of the measuring unit to be connected into a certain channel of the coaxial electromechanical switch through a control signal; the measuring unit tests the resistance value of the tested resistor of the path; and judging whether the passage can be normally switched on or off through the abnormal resistance value, thereby evaluating the reliability of the passage.
Compared with the prior art, the device and the method for testing the reliability of the coaxial electromechanical switch based on contact resistance measurement have the following beneficial effects:
(1) the main electrical performance index of the coaxial electromechanical switch is represented based on the measurement of the four-wire system contact resistance by a proportional method.
(2) The device has the advantages of extremely low reliability testing device cost, simple structure, small volume, program control mode and manual independent working mode.
(3) The switch module with the optocoupler relay as the core forms a test access selection unit, so that the service life is long and the reliability is high.
(4) The four-wire system is combined with channel selection, and the high potential application line HS is shared to realize discrimination that a previous test channel cannot be normally shut off, so that detection of switching effectiveness is realized.
Drawings
FIG. 1 is a circuit diagram of a measurement unit according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of the structure of a logic control unit according to embodiment 1;
FIG. 3 is a block diagram of a switch module;
FIG. 4 is a schematic diagram of the structure of a logic control unit according to embodiment 2;
fig. 5 is a schematic diagram of the structure of the logic control unit according to embodiment 3.
Detailed Description
In order to facilitate an understanding of the invention, the invention is described in more detail below with reference to the accompanying drawings and specific examples. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
The circuit connection of the measuring unit is shown in fig. 1, and includes a voltage stabilizing chip U11, a standard resistor Rs, a measured resistor Rx, and an AD conversion chip U12.
The voltage stabilizing chip U11 provides 2.5V standard voltage, provides current for the standard resistor Rs and the resistor Rx to be tested which are connected in series, and provides the voltage at the two ends of the Rs as reference to the reference voltage pin Vref +, Vref-of the AD conversion chip U12. Rx is connected in series with a small resistor Rm for raising the potential to the ground, and the voltage at two ends of Rx is input to signal acquisition pins S + and S-of an AD conversion chip U12 as acquisition analog quantity, and a high potential application line HS and a low potential application line LS and S + and S-form four lead wires of a Kelvin four-wire method.
To increase the input impedance of the signal acquisition part, an operational amplifier U13 plus voltage follower circuit can be used between the acquisition voltage and the U12 signal acquisition pin. When the circuit is working, because the current passing through Rs and Rx is equal, the ratio of maximum digital quantity Dmax (16 bits, 65535) and Rs of the AD conversion chip U12 is equal to the ratio of digital quantity Din and Rx of analog-digital conversion, Dmax/Rs is Din/Rx, when the AD conversion chip U12 sets a certain program control gain Ap, Dmax/Rs is Din/(Rx Ap), thereby the resistance value of the resistor Rx to be measured can be converted. The test accuracy of Rx is determined by the standard resistor Rs, and the test resolution depends on the bit number and the programmed gain Ap of the AD conversion chip U12. When Rs is 24 Ω and Ap is 16, Rx has test range of 1500m Ω and theoretical resolution of 0.02m Ω. An AD conversion chip suitable for the present invention may be a 16-bit AD7705 with an internal PGA; the standard resistor Rs can be selected from 24 omega, 1/2W and 0.01% precision RX70 wire-wound resistor; the voltage stabilizing chip U11 can be selected from HT 7325; the voltage following may use a rail-to-rail OP 279.
Four lead wires HS, LS, S + and S-of the Kelvin four-wire method resistance measurement are led out from the measurement unit, and a certain passage of the coaxial electromechanical switch is selected to be connected with the measurement unit through the control of the logic control unit. Due to the need to select different paths, the coaxial electromechanical switch requires a control logic of up to 14 IO paths, which may be consistent with the control logic of path selection.
In this embodiment, the structure principle of the logic control unit is shown in fig. 2, and the main components are an industrial control computer, an MCU, a key, a liquid crystal module, a buffer, a power module, and a plurality of switch modules. The switch modules K1, K2 … … and the like are connected between the port Pt of the coaxial electromechanical switch path and the high-potential application line HS and the acquisition line S +, and path selection is achieved.
The structure of the switch module is shown in fig. 3, and the switch module includes a PNP transistor T1, resistors Ra and Rb, an optical device L1, a light sensing device, and a CMOS transistor T2. Taking K1 as an example, when the control signal is at high level, the PNP transistor switch T1 is turned on, current flows from the emitter, the light emitting diode L1 in the optocoupler relay connected between the emitter and VCC emits light, the sensing device is controlled to turn on the CMOS T2, and K1_1 and K1_2 are turned on. Resistors Ra, Rb limit the base and emitter currents. The turning on of K1 connects the high potential application line HS to the port Pt1 of the coaxial electromechanical switch circuit 1. The control signal provides control logic for a designated passage of the coaxial electromechanical switch at the same time, so that the port Pt1 of the passage 1 is communicated with the common port COM, the low-potential applying line LS and the collecting line S-are normally communicated with the common port COM, the measuring unit is communicated with the passage 1 of the coaxial electromechanical switch, and the reliability of the passage 1 is screened by measuring the resistance value of the measured resistor.
14 IO output ports of the MCU provide control signals S1-S14 through the isolation of the buffer U1, and switching selection is carried out in 14 paths of the coaxial electromechanical switch.
The power supply module provides working voltage for chips such as the MCU and the like and the tested coaxial electromechanical switch.
The MCU is connected with the LCD1602 liquid crystal module to display the measurement information.
The MCU is connected with the industrial control computer through a serial port and is controlled by upper computer testing software. The MCU can also be controlled by manual control functions provided by the keys Ka and Kb.
The optocoupler relay can adopt AQW212EH, the standard value of the on-resistance Ron of the optocoupler relay is 0.85 omega, Ron is smaller than Rs, and the reference voltage provided for the AD conversion chip at two ends of Rs meets the requirement, so the measurement influence of a comparative example method is small. A suitable buffer U1 may be 74HC245D and the MCU may be STC89C 52.
The reliability of the single-pole six-throw switch is tested by adopting the device for testing the reliability of the coaxial electromechanical switch based on contact resistance measurement, and the process is as follows:
(1) the MCU receives a setting message provided by the industrial personal computer or the operation key Ka, so that the control signal S1 is set to be an effective level, and the rest control signals output low levels. The single-pole six-throw switch is switched to a channel 1 by a group of control logics from S1 to S6, and Pt1 is in contact conduction with a common port of a COM end of the switch; meanwhile, the switch modules K1 and K2 of the testing device are controlled to be switched on by S1-S6, the switch modules K3 and K4 and the other switch modules omitted in the figure are switched off, so that the HS and the acquisition line S + are connected to Pt1, and the COM end is normally connected with the low-potential applying line LS and the acquisition line S-. Therefore, four signal wires of the Kelvin four-wire method are connected into the single-pole six-throw switch circuit 1, and resistance value information measured by the contact resistance measuring unit is sent to the liquid crystal module by the MCU and provides query for the industrial personal computer.
(2) The MCU receives a control signal shift message provided by the industrial personal computer or the operation key Kb, so that the effective positions of the control logic groups S1-S6 are shifted to the left, S2 is set as an effective level, the other control signals output low levels, the single-pole six-throw switch is switched to the channel 2, the switch modules K3 and K4 of the testing device are switched on, and the contact resistance measuring unit measures the resistance value of the channel 2.
(3) And (3) repeating the step (2) to finish the measurement of all the paths of the single-pole six-throw switch. And (4) returning to the step (1) to perform the next test period. The omitted parts of FIG. 2 are Pt 3-Pt 6 and switch modules K5-K12.
Since each path electromagnetic driving component of the coaxial electromechanical switch is independent, the path switching effectiveness needs to be examined, and when the current switched path is tested, the on-off conditions of the rest paths need to be detected. When the channel selection unit tests the resistance Rx2 of the channel 2, the switch module isolates Rx1 of the channel 1, and the on-off of the switch module is irrelevant to the current measurement result.
Thus, the present invention provides an embodiment 2 in which the structural principle of the logic control unit is as shown in fig. 4. Taking a single-pole six-throw switch as an example, the branch ports Pt1 and Pt2 of the single-pole six-throw switch and the unillustrated Pt3 to Pt6 are normally open to the high potential application line HS, and the switch module is connected between the high potential signal collection line S + and the branch ports Pt1 to Pt6 of the single-pole six-throw switch, and is used only for selecting S +. The low potential applying line LS and the collecting line S-are normally connected with the common port COM. It is easy to know that the control process is similar to the above scheme, and when the single-pole six-throw switch is switched from the path 1 to the path 2, if Rx1 is normally turned off, the measurement result of Rx2 is not affected. If the passage 1 of the coaxial switch is abnormal in control or the reed is deformed to cause abnormal turn-off, namely normally on, the resistance value measured at present is the result that the lead resistor of the high-potential applying line HS is connected with Rx1 in series and then is connected with Rx2 in parallel, the resistance value is abnormally smaller than a standard value, and the measured values of the follow-up ports Pt 3-Pt 6 and the COM end are equivalent to the abnormal value, so that the coaxial switch can be discriminated.
The invention also provides an embodiment 3, which is suitable for the characteristics of low requirements on repeatability and accuracy of resistance values of all paths of the single-pole six-throw switch. In this embodiment, the structure principle of the logic control unit is shown in fig. 5, and the structure removes the path selection mode formed by the switch modules. The high potential application line HS and the collection line S + lead are connected to the ports Pt 1-Pt 6 of the single-pole six-throw switch through PCB wiring and coaxial cables (shown by thick lines in FIG. 5) with equal length, and the low potential application line LS and the collection line S-are connected with the common port COM. It is easy to know that the kelvin four-wire method is implemented by the resistance value of the tested via contact resistor Rx in series connection with the PCB wiring and the coaxial cable, and it is necessary to obtain the approximate tested via contact resistors Rx1, Rx2, etc. by measurement and compensation. The structure can also discriminate the path which is not normally closed through the characteristics of abnormal measured values, and basically can realize reliability measurement.
The reliability test process of the device adopting the embodiment, taking a single-pole six-throw switch as an example, is as follows:
1. and connecting the common end of the switch to be tested and the branch ports Pt 1-Pt 6 into the testing device according to corresponding labels.
2. Test type selection is carried out on upper computer test software of the industrial personal computer, an SP6T switch is selected for testing, and parameters such as single switching time, control pulse width, total switching cycle number and test threshold value are input. Clicking starts the test. The manual mode of operation does not have this step.
3. The test software controls the SP6T switch to set and reads the test value of the record path 1 resistance. And clicking a Ka key in a manual operation mode to read the display of the liquid crystal module.
4. The test software sends a shift message to control the SP6T switch to path 2, reading and recording the path 2 resistance test value. And clicking a Kb key in a manual operation mode to read the liquid crystal display.
5. And repeating the step 4 for 4 times, recording the resistance values of the SP6T switch paths 3-6, and completing a test period.
6. And repeating the steps 3-5 until the set test cycle number is completed. The manual mode of operation may observe several cycles according to actual demand.
7. Data recording and fault judgment: the test value read by switching the switch each time is written into a report form in real time according to the field of the periodicity, the channel name, the test value and the repeatability, and the report form structure is shown in table 1.
8. And outputting a data report form of summary analysis after the test is finished.
Table 1 report structure
| Number of cycles | Vias | Test value | Repeatability of | |
| 1 | 1 | Rx1 | / | |
| 1 | 2 | Rx2 | / | |
| 1 | 3 | Rx3 | / | |
| … | … | … | … | |
| 2 | 1 | | △Rx1 | |
| 2 | 2 | | △Rx2 | |
| 2 | 3 | Rx3 | △Rx3 | |
| … | … | … | … |
Based on the test values in table 1, the main test failures are shown in table 2, for example, with a typical value for the switch path contact resistance being Rsd and the full scale resistance value being Rol.
TABLE 2 test failure cases
Claims (12)
1. A coaxial electromechanical switch reliability testing device based on contact resistance measurement is characterized by comprising:
the measuring unit is used for testing the resistance value of a certain path of the coaxial electromechanical switch;
and the logic control unit is used for realizing the conduction of different paths of the coaxial electromechanical switch and the measuring unit through a control signal.
2. The device for testing the reliability of a coaxial electromechanical switch based on contact resistance measurement as claimed in claim 1, wherein the measuring unit comprises: the device comprises a voltage stabilizing chip, a standard resistor, a tested resistor and an AD conversion chip; the voltage stabilizing chip provides current for a standard resistor and a tested resistor which are connected in series, the voltage at two ends of the standard resistor is used as reference to be provided for a reference voltage pin of the AD conversion chip, and the voltage at two ends of the tested resistor is used as acquisition analog quantity to be input to a signal acquisition pin of the AD conversion chip; the high potential applying line, the low potential applying line and the collecting line at two ends of the tested resistor form four lead wires of the Kelvin four-wire method.
3. The device for testing the reliability of the coaxial electromechanical switch based on the contact resistance measurement as claimed in claim 2, wherein the logic control unit comprises a plurality of switch modules, the switch modules are used for selecting the measurement unit to be connected with different branch ports of the coaxial electromechanical switch, and the corresponding ports are connected with a common port, so as to realize the resistance measurement of different paths.
4. The device for testing the reliability of the coaxial electromechanical switch based on the contact resistance measurement as claimed in claim 3, wherein the switch module is connected between a branch port of the coaxial electromechanical switch and a high potential applying line and/or a high potential voltage collecting line; the common port is normally connected with the low potential applying line and the collecting line thereof.
5. The device for testing the reliability of the coaxial electromechanical switch based on the contact resistance measurement as claimed in claim 4, wherein the switch module is connected between a branch port of the coaxial electromechanical switch and a high-potential voltage acquisition line; the high potential applying line is normally communicated with a branch port of the coaxial electromechanical switch, and the common port is normally communicated with the low potential applying line and the collecting line thereof.
6. The device for testing the reliability of the coaxial electromechanical switch based on the contact resistance measurement as recited in claim 2, wherein the high potential applying line and the collecting line thereof are connected to the branch ports of the coaxial electromechanical switch through a coaxial cable, the low potential applying line and the collecting line thereof are connected to the common port of the coaxial electromechanical switch, and the logic control unit controls the conduction of different branch ports and the common port of the coaxial electromechanical switch to realize the resistance measurement of different paths.
7. The device for testing the reliability of the coaxial electromechanical switch based on the contact resistance measurement according to any one of claims 1 to 6, wherein the logic control unit comprises an MCU, and an IO output port of the MCU provides a control signal.
8. The device for testing the reliability of the coaxial electromechanical switch based on the contact resistance measurement as recited in claim 7, wherein the logic control unit comprises a power supply module, and the power supply module provides an operating voltage for the MCU and the tested coaxial electromechanical switch.
9. The device for testing the reliability of the coaxial electromechanical switch based on the contact resistance measurement as recited in claim 7, wherein the logic control unit further comprises a liquid crystal display module, and the liquid crystal display module is connected with the MCU and displays the measurement information.
10. The device for testing the reliability of the coaxial electromechanical switch based on the contact resistance measurement as recited in claim 7, wherein the MCU is connected to the industrial control computer via a serial port and controlled by the testing software of the upper computer.
11. The contact resistance measurement based coaxial electromechanical switch reliability testing device according to claim 7, wherein said MCU is connected to a key, said key providing a manual control function.
12. A coaxial electromechanical switch reliability testing method based on contact resistance measurement is characterized by comprising the following steps: the logic control unit enables four leads of a Kelvin four-wire method of the measuring unit to be connected into a certain channel of the coaxial electromechanical switch through a control signal; the measuring unit tests the resistance value of the tested resistor connected to the access; and judging whether the access can be normally switched on or off through the abnormal resistance value, and evaluating the reliability of the access.
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Application publication date: 20200211 |