CN110737577A - test defect data storage method and device - Google Patents

test defect data storage method and device Download PDF

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CN110737577A
CN110737577A CN201810803274.2A CN201810803274A CN110737577A CN 110737577 A CN110737577 A CN 110737577A CN 201810803274 A CN201810803274 A CN 201810803274A CN 110737577 A CN110737577 A CN 110737577A
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test
level
defect
mapping relation
storage system
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CN110737577B (en
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史雯婷
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Beijing Qihoo Technology Co Ltd
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Beijing Qihoo Technology Co Ltd
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3684—Test management for test design, e.g. generating new test cases
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3692—Test management for test results analysis

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  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
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  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The invention discloses test defect data storage methods, devices, electronic equipment and computer storage media.

Description

test defect data storage method and device
Technical Field
The invention relates to the technical field of computers, in particular to test defect data storage methods and devices, electronic equipment and a computer storage medium.
Background
When applications develop a new version or add a new function, before the new version application or the new function is released, a test is needed to make a developer know the running state of the new version application or the new function, defect data are obtained during the test, and in order for the developer to call or analyze the defect data, generally stores the defect data obtained during the test, for example, the defect data are stored in a defect storage system of special , but the defect storage system of special has a directory hierarchy, and when the defect storage is performed, the defect data need to be stored according to the directory hierarchy of the defect storage system, when the service hierarchy of the defect data does not meet the service hierarchy, the defect data cannot be stored, for example, the service hierarchy corresponding to the defect data may be three levels, and the directory hierarchy of the defect storage system is two levels, so that the storage of the defect data is not friendly, and the storage efficiency is low.
Disclosure of Invention
In view of the above, the present invention has been developed to provide test defect data storage methods, apparatuses, electronic devices, and computer storage media that overcome or at least partially address the above-mentioned problems.
According to aspects of the present invention, there are provided test defect data storage methods, wherein the method comprises:
receiving a test order for making a test request;
establishing a mapping relation between a service level corresponding to the test order and a directory level of the defect storage system;
acquiring defect data obtained by testing corresponding to the test sheet;
and storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
Optionally, the method further includes:
creating a mapping relation table;
storing the established mapping relation between the service level of the test order and the directory level of the defect storage system into the mapping relation table;
when an acquisition request of the defect data of a specified test order is received, inquiring the mapping relation table, and determining a directory hierarchy of the defect storage system which has a mapping relation with the service hierarchy of the specified test order;
and acquiring the defect data corresponding to the specified test list from the storage file under the determined directory hierarchy of the defect storage system.
Optionally, the method further includes:
and generating a corresponding test report according to the acquired defect data corresponding to the specified test list.
Optionally, the establishing a mapping relationship between a service level corresponding to the upgrade sheet and a directory level of the defect storage system includes:
acquiring a service level corresponding to the sampling list;
and establishing a mapping relation between the service level corresponding to the test list and the directory level of the defect storage system according to the acquired service level.
Optionally, the obtaining of the service level corresponding to the test ticket includes:
directly acquiring a corresponding service level from the test list;
alternatively, the first and second electrodes may be,
providing a business level input interface, and receiving the business level corresponding to the test order through the interface;
alternatively, the first and second electrodes may be,
when the test order is received, acquiring a service level corresponding to the test order from a specified database; and the specified database stores the service level corresponding to the test sheet.
Optionally, the directory hierarchy of the defect storage system comprises th hierarchy and second hierarchy, wherein th hierarchy comprises or more second hierarchies;
the establishing of the mapping relationship between the service level corresponding to the test order and the directory level of the defect storage system comprises:
according to the service line information in the service hierarchy, establishing a mapping relation between the service line corresponding to the sampling list and the th hierarchy of the directory hierarchy of the defect storage system;
and establishing a mapping relation between the test identification information corresponding to the test order and a second level of the defect storage system under the th level according to the test identification information in the service level.
Optionally, before the establishing a mapping relationship between a service level corresponding to the upgrade ticket and a directory level of the defective memory system, the method further includes:
inquiring a mapping relation table, and judging whether a mapping relation corresponding to the service level of the test order exists in the mapping relation table; the mapping relation table stores the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system;
if the directory hierarchy does not exist, a new directory hierarchy is created in the defect storage system, and a mapping relation between the service hierarchy corresponding to the test sheet and the created new directory hierarchy is established;
and if so, directly storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
Optionally, the defect storage system comprises th level and second level, wherein th level comprises or more second levels;
the creating of a new directory hierarchy in the defect storage system, and the establishing of the mapping relationship between the service hierarchy corresponding to the test ticket and the created new directory hierarchy includes:
inquiring whether a mapping relation corresponding to the service line information of the service level corresponding to the extraction list exists in the mapping relation table;
if the business line information exists, a new second level is created under the th level which has a mapping relation with the business line information, and the mapping relation between the test identification information of the business level corresponding to the test list and the created second level is established;
if not, a new th level is created in the defect storage system, a new second level is created under the created th level, the mapping relation between the service line information of the service level corresponding to the test list and the created th level is established, and the mapping relation between the test identification information of the service level corresponding to the test list and the created second level is established.
Optionally, the defect storage system is referred to as a defect tracking system bugzilla.
According to another aspect of the present invention, there is provided test defect data storage devices, wherein the devices comprise:
the test order receiving unit is suitable for receiving a test order for making a test request;
the mapping relation establishing unit is suitable for establishing the mapping relation between the service level corresponding to the test list and the directory level of the defect storage system;
the defect data acquisition unit is suitable for acquiring the defect data obtained by the test corresponding to the test order;
and the defect data storage unit is suitable for storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
Optionally, the apparatus further comprises:
the mapping relation storage unit is suitable for creating a mapping relation table; storing the established mapping relation between the service level of the test order and the directory level of the defect storage system into the mapping relation table;
the defect data determining unit is suitable for inquiring the mapping relation table and determining a directory hierarchy of the defect storage system which has a mapping relation with the service hierarchy of the specified test order when an acquisition request of the defect data of the specified test order is received; and acquiring the defect data corresponding to the specified test list from the storage file under the determined directory hierarchy of the defect storage system.
Optionally, the apparatus further comprises:
and the test report generating unit is suitable for generating a corresponding test report according to the acquired defect data corresponding to the specified test list.
Alternatively,
the mapping relation establishing unit is suitable for acquiring a service level corresponding to the test order; and establishing a mapping relation between the service level corresponding to the test list and the directory level of the defect storage system according to the acquired service level.
Alternatively,
the mapping relation establishing unit is suitable for directly acquiring a corresponding service level from the extracting and testing list; or, providing a service level input interface, and receiving a service level corresponding to the sampling list through the interface; or when the test order is received, acquiring a service level corresponding to the test order from a specified database; and the specified database stores the service level corresponding to the test sheet.
Optionally, the directory hierarchy of the defect storage system comprises th hierarchy and second hierarchy, wherein th hierarchy comprises or more second hierarchies;
the mapping relation establishing unit is suitable for establishing a mapping relation between a service line corresponding to the test list and the th level of the directory level of the defect storage system according to service line information in the service level, and establishing a mapping relation between test identification information corresponding to the test list and the second level of the th level of the defect storage system according to test identification information in the service level.
Optionally, the apparatus further comprises:
the mapping relation query unit is suitable for querying a mapping relation table before establishing the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system, and judging whether the mapping relation corresponding to the service level of the test order exists in the mapping relation table or not; the mapping relation table stores the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system; if the directory hierarchy does not exist, a new directory hierarchy is created in the defect storage system, and a mapping relation between the service hierarchy corresponding to the test sheet and the created new directory hierarchy is established; and if so, directly storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
Optionally, the defect storage system comprises th level and second level, wherein th level comprises or more second levels;
the mapping relation query unit is suitable for querying whether a mapping relation corresponding to the service line information of the service level corresponding to the test order exists in the mapping relation table, if so, creating a new second level under th level having the mapping relation with the service line information, establishing a mapping relation between the test identification information of the service level corresponding to the test order and the created second level, if not, creating a new th level in the defect storage system, creating a new second level under the created th level, establishing a mapping relation between the service line information of the service level corresponding to the test order and the created th level, and establishing a mapping relation between the test identification information of the service level corresponding to the test order and the created second level.
Optionally, the defect storage system is referred to as a defect tracking system bugzilla.
According to a further aspect of the invention, there is provided electronic devices, wherein the electronic devices comprise:
a processor; and the number of the first and second groups,
a memory arranged to store computer executable instructions that, when executed, cause the processor to perform a method according to the foregoing.
According to a further aspect of the present invention, computer readable storage media are provided, wherein the computer readable storage media store or more programs, which or more programs, when executed by a processor, implement the aforementioned methods.
According to the technical scheme of the invention, a test order for providing a test request is received; establishing a mapping relation between a service level corresponding to the test order and a directory level of the defect storage system; acquiring defect data obtained by testing corresponding to the test sheet; and storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation. According to the technical scheme, the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system is established, a tester can submit the test order according to own requirements, then the defect data obtained through testing is automatically stored in the defect storage system, the defect data can be stored without the directory level of the defect storage system, the storage efficiency is improved, the storage of the defect data is more humanized, and the use experience of a user is enhanced.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a flow chart illustrating a method for testing defective data storage according to embodiments of the present invention;
FIG. 2 illustrates a schematic structural diagram of a test defect data storage device according to embodiments of the present invention;
FIG. 3 shows a schematic structural diagram of an electronic device according to embodiments of the invention;
fig. 4 shows a schematic structural diagram of embodiments of the computer-readable storage medium according to the invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
FIG. 1 shows a flow chart of a method for testing defect data storage according to embodiments of the present invention, as shown in FIG. 1, the method includes:
step S110, receiving a test order for making a test request.
In this embodiment, a mode of providing an interface may be adopted, and a test order that a user makes a test request is received through the interface. The tester can input the corresponding test sheet according to the requirement or the habit of the tester, and whether the service level of the test sheet accords with the directory level of the defect storage system or not does not need to be considered.
And step S120, establishing a mapping relation between the service level corresponding to the test list and the directory level of the defect storage system.
Step S130, defect data obtained by the test corresponding to the test order is acquired.
Step S140, storing the acquired defect data into a storage file in the corresponding directory hierarchy in the defect storage system according to the mapping relationship.
After the test personnel submits the test order, corresponding tests are carried out according to the test order, defect data can be obtained in the test process, and in order to realize the storage of the defect data, the scheme of the embodiment can be adopted, and the defect data can be directly stored according to the mapping relation without considering the problem whether the corresponding business level and directory level are .
In addition, the defect data storage system is independent systems, and for the test with fixed procedures, the defect data storage system is not related to other procedures of the test, and a tester needs to perform a specific defect data storage operation to store the defect data.
Through the embodiment, the defect storage system is associated with the whole test flow, so that only a test order needs to be submitted by a tester, defect data can be stored without separate operation, and the use experience of a user is further improved .
In embodiments of the present invention, the method shown in fig. 1 further includes creating a mapping table, storing the established mapping relationship between the service level of the test ticket and the directory level of the defective memory system in the mapping table, when receiving an acquisition request of the defect data of the specified test ticket, querying the mapping table, determining the directory level of the defective memory system having a mapping relationship with the service level of the specified test ticket, and acquiring the defect data corresponding to the specified test ticket from the storage file under the directory level of the determined defective memory system.
In consideration of the lack of association between the defect storage system and other testing processes in the prior art, when reading defect data, an operator is also required to count directory level information of the defect system and information corresponding to the read defect data. Therefore, the scheme of the present embodiment is proposed.
Through the scheme of this embodiment, in the aspect of , the defect storage system may be associated with other processes for testing, flexible reading of defect data may also be achieved, and corresponding defect data may be acquired only according to the test order information (e.g., identification information).
, the method of FIG. 1 further includes generating a test report corresponding to the defect data corresponding to the obtained specified test ticket.
Through the embodiment, test procedures such as test order submission, testing, defect data storage, defect data reading, test report generation and the like in the test process are integrated into , so that the operation of testers is facilitated , and the use experience of users is improved.
In embodiments of the present invention, the establishing of the mapping relationship between the service level corresponding to the test ticket and the directory level of the defect storage system in step S120 shown in fig. 1 includes acquiring the service level corresponding to the test ticket, and establishing the mapping relationship between the service level corresponding to the test ticket and the directory level of the defect storage system according to the acquired service level.
In this embodiment, in order to establish a mapping relationship between the service level corresponding to the test ticket and the directory level of the defect storage system, the service level corresponding to the test ticket needs to be acquired first.
Preferably, the service level corresponding to the test ticket includes service line information, project information or test identification information.
, the obtaining the service level corresponding to the test order includes directly obtaining the corresponding service level from the test order, or providing a service level input interface to receive the service level corresponding to the test order through the interface, or obtaining the service level corresponding to the test order from a specified database when the test order is received, where the specified database stores the service level corresponding to the test order.
In this embodiment, the service level corresponding to the test ticket may be obtained through three ways. If the received test list has the corresponding service level, the corresponding service level can be directly obtained from the test list; an interface for inputting the service level can also be provided, and a user inputs the service level corresponding to the test order through the interface, namely the service level corresponding to the test order is obtained through the interface; if the tester stores the relevant information of the test order in the designated database, when the test order is received, the corresponding service level is obtained from the designated database, for example, the identification information and the service level of the test order are correspondingly stored in the designated database, and the corresponding service level can be obtained from the designated database through the identification information of the test order.
In embodiments of the present invention, the directory hierarchy of the defective memory system in the method shown in fig. 1 includes a th hierarchy and a second hierarchy, wherein the th hierarchy includes or more second hierarchies.
The step S120 of the method shown in fig. 1 of establishing a mapping relationship between the service level corresponding to the test ticket and the directory level of the defect storage system includes establishing a mapping relationship between the service line corresponding to the test ticket and th level of the directory level of the defect storage system according to the service line information in the service level, and establishing a mapping relationship between the test identification information corresponding to the test ticket and a second level below th level of the defect storage system according to the test identification information in the service level.
In the invention, the directory hierarchy of the defect storage system comprises two hierarchies, and then the service line information and the test identification information of the test list are respectively mapped with the two hierarchies of the defect storage system, wherein the test identification information can be identification codes only or test names defined by testers.
For example, if the directory hierarchy of the defect storage system includes a product hierarchy and a component hierarchy, the service line information of the test order is related to the product hierarchy, and the test identification information of the test order is related to the component hierarchy.
In specific examples, the defect storage system comprises a product level and a component level, wherein the service level of the test sheet 1 is service line information 1 and a test identifier 1, the service level of the test sheet 2 is service line information 2 and a test identifier 2, the service level of the test sheet 3 is service line information 1 and a test identifier 3, when the mapping relation is established, the service line information 1 of the test sheet 1 and the product level 1 of the defect storage system are mapped, the test identifier information 1 of the test sheet 1 and the component level 1 of the defect storage system are mapped, the service line information 2 of the test sheet 2 and the product level 2 of the defect storage system are mapped, the test identifier information 2 of the test sheet 2 and the component level 2 of the defect storage system are mapped, the service line information 1 of the test sheet 3 and the product level 1 of the defect storage system are mapped, and the test identifier information 3 of the test sheet 3 and the component level 3 of the defect storage system are mapped.
When the defect data is stored, storing the defect data 1 corresponding to the test list 1 into a storage file under the component level 1 under the product level 1; storing the defect data 2 corresponding to the test list 2 into a storage file under the component level 2 under the product level 2; and storing the defect data 3 corresponding to the test sheet 3 into a storage file under the component level 3 under the product level 1.
The above embodiment is described for the case where the defective memory system has two hierarchies, and if the defective memory system has more than two hierarchies, the present invention can also be implemented.
In embodiments of the present invention, if the directory hierarchy of the defect storage system has three levels, establishing a mapping relationship between the service level corresponding to the test ticket and the directory hierarchy of the defect storage system includes establishing a mapping relationship between the service line corresponding to the test ticket and the th level of the directory hierarchy of the defect storage system according to the service line information in the service level, establishing a mapping relationship between the item information corresponding to the test ticket and the second level of the th level of the defect storage system according to the item information in the service level, and establishing a mapping relationship between the test identification information corresponding to the test ticket and the third level of the second level of the th level of the defect storage system according to the test identification information in the service level.
In specific examples, the defect storage system comprises a product level, a version level and a component level, wherein the service level of the test sheet 1 is service line information 1, project information 1 and test identification 1, the service level of the test sheet 2 is service line information 2, project information 2 and test identification 2, and the service level of the test sheet 3 is service line information 1, project information 1 and test identification 3. when the mapping relation is established, the service line information 1 of the test sheet 1 and the product level 1 of the defect storage system are mapped, the project information 1 of the test sheet 1 and the version level 1 of the defect storage system are mapped, the test identification information 1 of the test sheet 1 and the component level 1 of the defect storage system are mapped, the service line information 2 of the test sheet 2 and the product level 2 of the defect storage system are mapped, the project information 2 of the test sheet 2 and the version level 2 of the defect storage system are mapped, the test identification information 2 of the test sheet 2 and the component level 2 of the defect storage system are mapped, the mapping relation of the project information 1 of the test sheet 2 and the component level 2 of the defect storage system is established, the mapping relation of the test sheet information 1 and the component level 1 of the test sheet 3 is mapped, and the test information 1 of the test sheet 1 and the test information of the test sheet 1 of the defect storage system is mapped.
When the defect data is stored, storing the defect data 1 corresponding to the test list 1 into a storage file under the component level 1 of the version level 1 of the product level 1; the defect data 2 corresponding to the test ticket 2 is stored in a storage file under the component level 2 of the version level 2 of the product level 2; and storing the defect data 3 corresponding to the test ticket 3 into a storage file under the component level 3 of the version level 1 of the product level 1.
That is to say, when the mapping relationship is established in the present technical solution, the number of layers of the directory hierarchy of the defect storage system is not limited, and any method implemented according to the idea of establishing the mapping relationship in the present technical solution is included in the present technical solution.
In embodiments of the present invention, before the mapping relationship between the service level corresponding to the test ticket and the directory level of the defect storage system is established in step S120 of the method shown in fig. 1, the method further includes querying a mapping relationship table, and determining whether a mapping relationship corresponding to the service level of the test ticket exists in the mapping relationship table, where the mapping relationship table stores the mapping relationship between the service level corresponding to the test ticket and the directory level of the defect storage system, if not, creating a new directory level in the defect storage system, establishing a mapping relationship between the service level corresponding to the test ticket and the created new directory level, and if so, directly storing the obtained defect data into a storage file under the corresponding directory level in the defect storage system according to the mapping relationship.
When the test order is accepted again, firstly, whether the mapping relation corresponding to the service level of the test order exists in the mapping relation table is inquired, if so, the mapping relation is not required to be reestablished, but the defect data obtained by testing the same test order is directly stored according to the existing mapping relation, and the defect data is stored in the same storage file.
For example, in the mapping relationship table, the mapping relationship between the service line information 1 of the test ticket 1 and the product level 1 and the mapping relationship between the test identification information 1 of the test ticket 1 and the component level 1 of the product level 1 are stored, and then the defect data obtained by the test of the test ticket 1 is stored in the storage file under the component level 1 of the product level 1. If not, the component level 1 and/or the product level 1 which have no mapping relation with the business level of the bill of lading 1 are/is indicated, a new directory level needs to be created, and the mapping relation between the business level corresponding to the bill of lading and the created new directory level is established.
, the defect storage system comprises a level and a second level, wherein the level comprises or more second levels.
Creating a new directory hierarchy in the defect storage system, and establishing a mapping relationship between the service hierarchy corresponding to the test ticket and the created new directory hierarchy, as described above, includes querying whether a mapping relationship corresponding to the service line information of the service hierarchy corresponding to the test ticket exists in the mapping relationship table, if so, creating a new second hierarchy under th hierarchy having a mapping relationship with the service line information, establishing a mapping relationship between the test identification information of the service hierarchy corresponding to the test ticket and the created second hierarchy, if not, creating a new th hierarchy in the defect storage system, and creating a new second hierarchy under th hierarchy created, establishing a mapping relationship between the service line information of the service hierarchy corresponding to the test ticket and the created th hierarchy, and establishing a mapping relationship between the test identification information of the service hierarchy corresponding to the test ticket and the created second hierarchy.
Considering that the testing requirements of the tester are tests for different contents under the same service line, the defect data of the tests need to be stored under the same directory level of the defect storage system corresponding to the service line information.
Specifically, whether a mapping relation corresponding to the service line information of the service hierarchy of the test list exists in the mapping relation table is inquired, if so, it is required to establish the second hierarchy, and if not, it is required to establish the new second hierarchy and also required to establish the new hierarchy.
For example, after receiving the test ticket 1, obtaining the service line information 1 and the test identification information 1 of the service level of the test ticket 1, querying the mapping relationship table, if the mapping relationship between the service line information 1 of the test ticket 1 and the product level 1 is stored, but the mapping relationship between the test identification information 1 of the test ticket 1 and the component level 1 of the product level 1 does not exist, creating a new component x under the product level 1, creating the mapping relationship between the service line information 1 of the service level of the test ticket 1 and the product level 1, creating the mapping relationship between the test identification information 1 and the component x, and storing the defect data obtained by the test of the test ticket 1 in the storage file under the component x of the product level 1. If the mapping relation corresponding to the service line information 1 of the test sheet 1 does not exist, and the mapping relation corresponding to the test identification information 1 of the test sheet 1 does not exist, a new product x is created, a new component y is created under the product x, the mapping relation between the service line information 1 of the service level of the test sheet 1 and the product x is established, the mapping relation between the test identification information 1 and the component y is established, and the defect data obtained by the test of the test sheet 1 is stored in a storage file under the component y of the product x.
In embodiments of the present invention, the defective memory system in the method described in FIG. 1 is referred to as the defect tracking system bugzilla.
The bugzilla is independent systems, and the association between the bug system and other test processes can be realized by applying the technical scheme of the invention to a scene using bugzilla to store defect data.
Fig. 2 illustrates a schematic structural diagram of a test defect data storage device according to embodiments of the present invention, as shown in fig. 2, the test defect data storage device 200 includes:
the test order receiving unit 210 is adapted to receive a test order for making a test request.
In this embodiment, a mode of providing an interface may be adopted, and a test order that a user makes a test request is received through the interface. The tester can input the corresponding test sheet according to the requirement or the habit of the tester, and whether the service level of the test sheet accords with the directory level of the defect storage system or not does not need to be considered.
The mapping relationship establishing unit 220 is adapted to establish a mapping relationship between a service level corresponding to the test order and a directory level of the defect storage system.
The defect data acquiring unit 230 is adapted to acquire defect data obtained by a test corresponding to the test ticket.
And the defect data storage unit 240 is adapted to store the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relationship.
After the test personnel submits the test order, corresponding tests are carried out according to the test order, defect data can be obtained in the test process, and in order to realize the storage of the defect data, the scheme of the embodiment can be adopted, and the defect data can be directly stored according to the mapping relation without considering the problem whether the corresponding business level and directory level are .
In addition, the defect data storage system is independent systems, and for the test with fixed procedures, the defect data storage system is not related to other procedures of the test, and a tester needs to perform a specific defect data storage operation to store the defect data.
Through the embodiment, the defect storage system is associated with the whole test flow, so that only a test order needs to be submitted by a tester, defect data can be stored without separate operation, and the use experience of a user is further improved .
In embodiments of the present invention, the apparatus shown in FIG. 2 further comprises step :
the mapping relation storage unit is suitable for creating a mapping relation table; and storing the established mapping relation between the service level of the test list and the directory level of the defect storage system into a mapping relation table.
The defect data determining unit is suitable for inquiring the mapping relation table and determining the directory hierarchy of the defect storage system which has the mapping relation with the service hierarchy of the specified test order when receiving the acquisition request of the defect data of the specified test order; and acquiring the defect data corresponding to the specified test list from the storage file under the determined directory hierarchy of the defect storage system.
In consideration of the lack of association between the defect storage system and other testing processes in the prior art, when reading defect data, an operator is also required to count directory level information of the defect system and information corresponding to the read defect data. Therefore, the scheme of the present embodiment is proposed.
Through the scheme of this embodiment, in the aspect of , the defect storage system may be associated with other processes for testing, flexible reading of defect data may also be achieved, and corresponding defect data may be acquired only according to the test order information (e.g., identification information).
In embodiments of the present invention, the apparatus shown in FIG. 2 further comprises step :
and the test report generating unit is suitable for generating a corresponding test report according to the acquired defect data corresponding to the specified test list.
Through the embodiment, test procedures such as test order submission, testing, defect data storage, defect data reading, test report generation and the like in the test process are integrated into , so that the operation of testers is facilitated , and the use experience of users is improved.
In embodiments of the present invention, the mapping relationship establishing unit 220 shown in fig. 2 is adapted to obtain a service level corresponding to the test ticket, and establish a mapping relationship between the service level corresponding to the test ticket and a directory level of the defect storage system according to the obtained service level.
In this embodiment, in order to establish a mapping relationship between the service level corresponding to the test ticket and the directory level of the defect storage system, the service level corresponding to the test ticket needs to be acquired first.
Preferably, the service level corresponding to the test ticket includes service line information, project information or test identification information.
, the mapping relationship establishing unit 220 is adapted to obtain the corresponding service level directly from the test order, or provide a service level input interface to receive the service level corresponding to the test order through the interface, or obtain the service level corresponding to the test order from a specified database when the test order is received, where the specified database stores the service level corresponding to the test order.
In this embodiment, the service level corresponding to the test ticket may be obtained through three ways. If the received test list has the corresponding service level, the corresponding service level can be directly obtained from the test list; an interface for inputting the service level can also be provided, and a user inputs the service level corresponding to the test order through the interface, namely the service level corresponding to the test order is obtained through the interface; if the tester stores the relevant information of the test order in the designated database, when the test order is received, the corresponding service level is obtained from the designated database, for example, the identification information and the service level of the test order are correspondingly stored in the designated database, and the corresponding service level can be obtained from the designated database through the identification information of the test order.
In embodiments of the present invention, the directory hierarchy of the above-mentioned defect storage system includes levels and second levels, wherein the level includes or more second levels.
The mapping relationship establishing unit 220 shown in fig. 2 is adapted to establish a mapping relationship between the service line corresponding to the test ticket and the th level of the directory level of the defect storage system according to the service line information in the service level, and establish a mapping relationship between the test identification information corresponding to the test ticket and the second level below the th level of the defect storage system according to the test identification information in the service level.
In the invention, the directory hierarchy of the defect storage system comprises two hierarchies, and then the service line information and the test identification information of the test list are respectively mapped with the two hierarchies of the defect storage system, wherein the test identification information can be identification codes only or test names defined by testers.
For example, if the directory hierarchy of the defect storage system includes a product hierarchy and a component hierarchy, the service line information of the test order is related to the product hierarchy, and the test identification information of the test order is related to the component hierarchy.
In specific examples, the defect storage system comprises a product level and a component level, wherein the service level of the test sheet 1 is service line information 1 and a test identifier 1, the service level of the test sheet 2 is service line information 2 and a test identifier 2, the service level of the test sheet 3 is service line information 1 and a test identifier 3, when the mapping relation is established, the service line information 1 of the test sheet 1 and the product level 1 of the defect storage system are mapped, the test identifier information 1 of the test sheet 1 and the component level 1 of the defect storage system are mapped, the service line information 2 of the test sheet 2 and the product level 2 of the defect storage system are mapped, the test identifier information 2 of the test sheet 2 and the component level 2 of the defect storage system are mapped, the service line information 1 of the test sheet 3 and the product level 1 of the defect storage system are mapped, and the test identifier information 3 of the test sheet 3 and the component level 3 of the defect storage system are mapped.
When the defect data is stored, storing the defect data 1 corresponding to the test list 1 into a storage file under the component level 1 under the product level 1; storing the defect data 2 corresponding to the test list 2 into a storage file under the component level 2 under the product level 2; and storing the defect data 3 corresponding to the test sheet 3 into a storage file under the component level 3 under the product level 1.
The above embodiment is described for the case where the defective memory system has two hierarchies, and if the defective memory system has more than two hierarchies, the present invention can also be implemented.
In embodiments of the present invention, if the directory hierarchy of the defect storage system has three levels, the mapping relationship establishing unit 220 is adapted to establish a mapping relationship between the service line corresponding to the test ticket and the th level of the directory hierarchy of the defect storage system according to the service line information in the service hierarchy, establish a mapping relationship between the item information corresponding to the test ticket and the second level of the defect storage system at the th level according to the item information in the service hierarchy, and establish a mapping relationship between the test identification information corresponding to the test ticket and the third level of the second level of the defect storage system at the th level according to the test identification information in the service hierarchy.
In specific examples, the defect storage system comprises a product level, a version level and a component level, wherein the service level of the test sheet 1 is service line information 1, project information 1 and test identification 1, the service level of the test sheet 2 is service line information 2, project information 2 and test identification 2, and the service level of the test sheet 3 is service line information 1, project information 1 and test identification 3. when the mapping relation is established, the service line information 1 of the test sheet 1 and the product level 1 of the defect storage system are mapped, the project information 1 of the test sheet 1 and the version level 1 of the defect storage system are mapped, the test identification information 1 of the test sheet 1 and the component level 1 of the defect storage system are mapped, the service line information 2 of the test sheet 2 and the product level 2 of the defect storage system are mapped, the project information 2 of the test sheet 2 and the version level 2 of the defect storage system are mapped, the test identification information 2 of the test sheet 2 and the component level 2 of the defect storage system are mapped, the mapping relation of the project information 1 of the test sheet 2 and the component level 2 of the defect storage system is established, the mapping relation of the test sheet information 1 and the component level 1 of the test sheet 3 is mapped, and the test information 1 of the test sheet 1 and the test information of the test sheet 1 of the defect storage system is mapped.
When the defect data is stored, storing the defect data 1 corresponding to the test list 1 into a storage file under the component level 1 of the version level 1 of the product level 1; the defect data 2 corresponding to the test ticket 2 is stored in a storage file under the component level 2 of the version level 2 of the product level 2; and storing the defect data 3 corresponding to the test ticket 3 into a storage file under the component level 3 of the version level 1 of the product level 1.
That is to say, when the mapping relationship is established in the present technical solution, the number of layers of the directory hierarchy of the defect storage system is not limited, and any method implemented according to the idea of establishing the mapping relationship in the present technical solution is included in the present technical solution.
In embodiments of the present invention, the apparatus shown in FIG. 2 further comprises step :
the mapping relation query unit is suitable for querying a mapping relation table before establishing the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system, and judging whether the mapping relation corresponding to the service level of the test order exists in the mapping relation table or not; the mapping relation table stores the mapping relation between the service level corresponding to the test list and the directory level of the defect storage system; if the directory hierarchy does not exist, a new directory hierarchy is created in the defect storage system, and a mapping relation between the service hierarchy corresponding to the test order and the created new directory hierarchy is established; and if so, directly storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
When the test order is accepted again, firstly, whether the mapping relation corresponding to the service level of the test order exists in the mapping relation table is inquired, if so, the mapping relation is not required to be reestablished, but the defect data obtained by testing the same test order is directly stored according to the existing mapping relation, and the defect data is stored in the same storage file.
For example, in the mapping relationship table, the mapping relationship between the service line information 1 of the test ticket 1 and the product level 1 and the mapping relationship between the test identification information 1 of the test ticket 1 and the component level 1 of the product level 1 are stored, and then the defect data obtained by the test of the test ticket 1 is stored in the storage file under the component level 1 of the product level 1. If not, the component level 1 and/or the product level 1 which have no mapping relation with the business level of the bill of lading 1 are/is indicated, a new directory level needs to be created, and the mapping relation between the business level corresponding to the bill of lading and the created new directory level is established.
, the defect storage system comprises a level and a second level, wherein the level comprises or more second levels;
the mapping relation query unit is adapted to query whether a mapping relation corresponding to the service line information of the service level corresponding to the test ticket exists in the mapping relation table, if so, create a new second level under the th level having the mapping relation with the service line information, establish a mapping relation between the test identification information of the service level corresponding to the test ticket and the created second level, if not, create a new th level in the defect storage system, create a new second level under the created th level, establish a mapping relation between the service line information of the service level corresponding to the test ticket and the created th level, and establish a mapping relation between the test identification information of the service level corresponding to the test ticket and the created second level.
Considering that the testing requirements of the tester are tests for different contents under the same service line, the defect data of the tests need to be stored under the same directory level of the defect storage system corresponding to the service line information.
Specifically, whether a mapping relation corresponding to the service line information of the service hierarchy of the test list exists in the mapping relation table is inquired, if so, it is required to establish the second hierarchy, and if not, it is required to establish the new second hierarchy and also required to establish the new hierarchy.
For example, after receiving the test ticket 1, obtaining the service line information 1 and the test identification information 1 of the service level of the test ticket 1, querying the mapping relationship table, if the mapping relationship between the service line information 1 of the test ticket 1 and the product level 1 is stored, but the mapping relationship between the test identification information 1 of the test ticket 1 and the component level 1 of the product level 1 does not exist, creating a new component x under the product level 1, creating the mapping relationship between the service line information 1 of the service level of the test ticket 1 and the product level 1, creating the mapping relationship between the test identification information 1 and the component x, and storing the defect data obtained by the test of the test ticket 1 in the storage file under the component x of the product level 1. If the mapping relation corresponding to the service line information 1 of the test sheet 1 does not exist, and the mapping relation corresponding to the test identification information 1 of the test sheet 1 does not exist, a new product x is created, a new component y is created under the product x, the mapping relation between the service line information 1 of the service level of the test sheet 1 and the product x is established, the mapping relation between the test identification information 1 and the component y is established, and the defect data obtained by the test of the test sheet 1 is stored in a storage file under the component y of the product x.
In embodiments of the present invention, the above-mentioned defect storage system is referred to as the defect tracking system bugzilla.
The bugzilla is independent systems, and the association between the bug system and other test processes can be realized by applying the technical scheme of the invention to a scene using bugzilla to store defect data.
In summary, according to the technical solution of the present invention, a test order for providing a test request is received; establishing a mapping relation between a service level corresponding to the test order and a directory level of the defect storage system; acquiring defect data obtained by testing corresponding to the test sheet; and storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation. According to the technical scheme, the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system is established, a tester can submit the test order according to own requirements, then the defect data obtained through testing is automatically stored in the defect storage system, the defect data can be stored without the directory level of the defect storage system, the storage efficiency is improved, the storage of the defect data is more humanized, and the use experience of a user is enhanced.
It should be noted that:
the algorithms and displays presented herein are not inherently related to any particular computer, virtual machine, or other apparatus, various general purpose devices may also be used with the teachings based thereon, the required structure for constructing such devices is readily apparent from the above description.
However, it is understood that embodiments of the invention may be practiced without these specific details, and that examples well-known methods, structures, and techniques have not been shown in detail in order not to obscure the understanding of this description.
Similarly, it should be appreciated that in the foregoing description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together by in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of the various inventive aspects, however, the disclosed method is not intended to be interpreted as reflecting an intention that the claimed invention requires more features than are expressly recited in each claim.
It will be understood by those skilled in the art that modules in the apparatus of the embodiments may be adaptively changed and arranged in or more apparatuses different from the embodiments, that modules or units or components in the embodiments may be combined into modules or units or components, and further, that they may be divided into sub-modules or sub-units or sub-components, that all features disclosed in this specification (including the accompanying claims, abstract and drawings), and all processes or units of any method or apparatus so disclosed, may be combined in any combination, except at least of such features and/or processes or units are mutually exclusive, unless expressly stated otherwise, each feature disclosed in this specification (including the accompanying claims, abstract and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose.
Furthermore, those of skill in the art will appreciate that while the embodiments described herein include some features included in other embodiments, not others, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments.
It will be appreciated by those skilled in the art that , some or all of the functions of in a test defect data storage, electronic device, and computer storage medium according to embodiments of the present invention may be implemented in practice using a microprocessor or Digital Signal Processor (DSP). The present invention may also be implemented as a device or apparatus program (e.g., computer program and computer program product) for performing part or all of the methods described herein . such a program implementing the present invention may be stored on a computer readable medium or may be in the form of or more signals.
For example, FIG. 3 shows a schematic block diagram of an electronic device according to embodiments of the invention, the electronic device 300 conventionally comprising a processor 310 and a memory 320 arranged to store computer executable instructions (program code), the memory 320 may be an electronic memory such as a flash memory, an EEPROM (electrically erasable programmable read Only memory), an EPROM, a hard disk or a ROM, the memory 320 having a storage space 330 storing program code 340 for performing the steps of the method shown in FIG. 1 and in the embodiments, for example, the storage space 330 for the program code may comprise respective program code 340 for implementing the various steps in the above method, respectively, the program code may be read from or written to or more computer program products, the computer program products may comprise program code carriers such as a hard disk, a Compact Disk (CD), a memory card or a floppy disk, such computer program products are generally computer readable storage media 400 as described in FIG. 4, the computer readable storage media 400 may have a storage space similar to that the memory 320 in the electronic device of FIG. 3 may have stored program code when the steps described, the method executed by the electronic device may generally cause the electronic device to perform the steps described, e.g. when the method executed by the electronic device 310.
The invention may be embodied by means of hardware comprising several distinct elements, and by means of a suitably programmed computer, in a unit claim enumerating several means, several of these means may be embodied by one and the same item of hardware, the use of the words , second, third, etc. may indicate any sequence.
The invention discloses a method for storing A1 and test defect data, wherein the method comprises the following steps:
receiving a test order for making a test request;
establishing a mapping relation between a service level corresponding to the test order and a directory level of the defect storage system;
acquiring defect data obtained by testing corresponding to the test sheet;
and storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
A2, the method of a1, wherein the method further comprises:
creating a mapping relation table;
storing the established mapping relation between the service level of the test order and the directory level of the defect storage system into the mapping relation table;
when an acquisition request of the defect data of a specified test order is received, inquiring the mapping relation table, and determining a directory hierarchy of the defect storage system which has a mapping relation with the service hierarchy of the specified test order;
and acquiring the defect data corresponding to the specified test list from the storage file under the determined directory hierarchy of the defect storage system.
A3, the method of a2, wherein the method further comprises:
and generating a corresponding test report according to the acquired defect data corresponding to the specified test list.
A4, the method as in A1, wherein the establishing a mapping relationship between a service level corresponding to the test ticket and a directory level of a defect storage system includes:
acquiring a service level corresponding to the sampling list;
and establishing a mapping relation between the service level corresponding to the test list and the directory level of the defect storage system according to the acquired service level.
A5, the method as in A4, wherein the obtaining the service level corresponding to the bill of lading comprises:
directly acquiring a corresponding service level from the test list;
alternatively, the first and second electrodes may be,
providing a business level input interface, and receiving the business level corresponding to the test order through the interface;
alternatively, the first and second electrodes may be,
when the test order is received, acquiring a service level corresponding to the test order from a specified database; and the specified database stores the service level corresponding to the test sheet.
A6, the method as in a1, wherein the directory hierarchy of the defective memory system includes a th hierarchy and a second hierarchy, wherein a th hierarchy includes or more second hierarchies;
the establishing of the mapping relationship between the service level corresponding to the test order and the directory level of the defect storage system comprises:
according to the service line information in the service hierarchy, establishing a mapping relation between the service line corresponding to the sampling list and the th hierarchy of the directory hierarchy of the defect storage system;
and establishing a mapping relation between the test identification information corresponding to the test order and a second level of the defect storage system under the th level according to the test identification information in the service level.
A7, the method as in a1, wherein before the establishing a mapping relationship between a service level corresponding to the test ticket and a directory level of the defect storage system, the method further includes:
inquiring a mapping relation table, and judging whether a mapping relation corresponding to the service level of the test order exists in the mapping relation table; the mapping relation table stores the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system;
if the directory hierarchy does not exist, a new directory hierarchy is created in the defect storage system, and a mapping relation between the service hierarchy corresponding to the test sheet and the created new directory hierarchy is established;
and if so, directly storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
A8, the method as recited in a7, wherein the defective memory system includes levels and second levels, wherein levels includes or more second levels;
the creating of a new directory hierarchy in the defect storage system, and the establishing of the mapping relationship between the service hierarchy corresponding to the test ticket and the created new directory hierarchy includes:
inquiring whether a mapping relation corresponding to the service line information of the service level corresponding to the extraction list exists in the mapping relation table;
if the business line information exists, a new second level is created under the th level which has a mapping relation with the business line information, and the mapping relation between the test identification information of the business level corresponding to the test list and the created second level is established;
if not, a new th level is created in the defect storage system, a new second level is created under the created th level, the mapping relation between the service line information of the service level corresponding to the test list and the created th level is established, and the mapping relation between the test identification information of the service level corresponding to the test list and the created second level is established.
A9, the method of any of A1-A8, wherein the defect storage system is a defect tracking system bugzilla.
The invention also discloses a B10 and test defect data storage device, wherein the device comprises:
the test order receiving unit is suitable for receiving a test order for making a test request;
the mapping relation establishing unit is suitable for establishing the mapping relation between the service level corresponding to the test list and the directory level of the defect storage system;
the defect data acquisition unit is suitable for acquiring the defect data obtained by the test corresponding to the test order;
and the defect data storage unit is suitable for storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
B11, the device of B10, wherein the device further comprises:
the mapping relation storage unit is suitable for creating a mapping relation table; storing the established mapping relation between the service level of the test order and the directory level of the defect storage system into the mapping relation table;
the defect data determining unit is suitable for inquiring the mapping relation table and determining a directory hierarchy of the defect storage system which has a mapping relation with the service hierarchy of the specified test order when an acquisition request of the defect data of the specified test order is received; and acquiring the defect data corresponding to the specified test list from the storage file under the determined directory hierarchy of the defect storage system.
B12, the device of B11, wherein the device further comprises:
and the test report generating unit is suitable for generating a corresponding test report according to the acquired defect data corresponding to the specified test list.
B13, the device of B10, wherein,
the mapping relation establishing unit is suitable for acquiring a service level corresponding to the test order; and establishing a mapping relation between the service level corresponding to the test list and the directory level of the defect storage system according to the acquired service level.
B14, the device of B13, wherein,
the mapping relation establishing unit is suitable for directly acquiring a corresponding service level from the extracting and testing list; or, providing a service level input interface, and receiving a service level corresponding to the sampling list through the interface; or when the test order is received, acquiring a service level corresponding to the test order from a specified database; and the specified database stores the service level corresponding to the test sheet.
The apparatus of B15 as B10, wherein the directory levels of the defective memory system include levels and second levels, wherein levels include or more second levels;
the mapping relation establishing unit is suitable for establishing a mapping relation between a service line corresponding to the test list and the th level of the directory level of the defect storage system according to service line information in the service level, and establishing a mapping relation between test identification information corresponding to the test list and the second level of the th level of the defect storage system according to test identification information in the service level.
B16, the device of B10, wherein the device further comprises:
the mapping relation query unit is suitable for querying a mapping relation table before establishing the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system, and judging whether the mapping relation corresponding to the service level of the test order exists in the mapping relation table or not; the mapping relation table stores the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system; if the directory hierarchy does not exist, a new directory hierarchy is created in the defect storage system, and a mapping relation between the service hierarchy corresponding to the test sheet and the created new directory hierarchy is established; and if so, directly storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
The apparatus of B17, B16, wherein the defect storage system comprises th level and second level, wherein th level comprises or more second levels;
the mapping relation query unit is suitable for querying whether a mapping relation corresponding to the service line information of the service level corresponding to the test order exists in the mapping relation table, if so, creating a new second level under th level having the mapping relation with the service line information, establishing a mapping relation between the test identification information of the service level corresponding to the test order and the created second level, if not, creating a new th level in the defect storage system, creating a new second level under the created th level, establishing a mapping relation between the service line information of the service level corresponding to the test order and the created th level, and establishing a mapping relation between the test identification information of the service level corresponding to the test order and the created second level.
B18, the apparatus of any of B10-B17, wherein the defective memory system is defect tracking system bugzilla.
The invention also discloses C19 and electronic equipment, wherein the electronic equipment comprises:
a processor; and the number of the first and second groups,
a memory arranged to store computer executable instructions that, when executed, cause the processor to perform the method of any of a1-a 9, item .
The invention also discloses D20 and computer readable storage media, wherein the computer readable storage media store or more programs, and the or more programs, when executed by a processor, implement the method of any of A1-A9.

Claims (10)

1, test defect data storage method, wherein the method comprises:
receiving a test order for making a test request;
establishing a mapping relation between a service level corresponding to the test order and a directory level of the defect storage system;
acquiring defect data obtained by testing corresponding to the test sheet;
and storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
2. The method of claim 1, wherein the method further includes:
creating a mapping relation table;
storing the established mapping relation between the service level of the test order and the directory level of the defect storage system into the mapping relation table;
when an acquisition request of the defect data of a specified test order is received, inquiring the mapping relation table, and determining a directory hierarchy of the defect storage system which has a mapping relation with the service hierarchy of the specified test order;
and acquiring the defect data corresponding to the specified test list from the storage file under the determined directory hierarchy of the defect storage system.
3. The method of claim 2, wherein the method further includes:
and generating a corresponding test report according to the acquired defect data corresponding to the specified test list.
4. The method of claim 1, wherein the establishing a mapping relationship between a service level corresponding to the test ticket and a directory level of a defective memory system comprises:
acquiring a service level corresponding to the sampling list;
and establishing a mapping relation between the service level corresponding to the test list and the directory level of the defect storage system according to the acquired service level.
5. The method of claim 4, wherein the obtaining a service level corresponding to the test ticket comprises:
directly acquiring a corresponding service level from the test list;
alternatively, the first and second electrodes may be,
providing a business level input interface, and receiving the business level corresponding to the test order through the interface;
alternatively, the first and second electrodes may be,
when the test order is received, acquiring a service level corresponding to the test order from a specified database; and the specified database stores the service level corresponding to the test sheet.
6. The method of claim 1, wherein the directory hierarchy of the defective memory system includes th hierarchy and a second hierarchy, wherein th hierarchy includes or more second hierarchies;
the establishing of the mapping relationship between the service level corresponding to the test order and the directory level of the defect storage system comprises:
according to the service line information in the service hierarchy, establishing a mapping relation between the service line corresponding to the sampling list and the th hierarchy of the directory hierarchy of the defect storage system;
and establishing a mapping relation between the test identification information corresponding to the test order and a second level of the defect storage system under the th level according to the test identification information in the service level.
7. The method of claim 1, wherein prior to said establishing a mapping between a service level corresponding to the test ticket and a directory level of the defective memory system, the method further comprises:
inquiring a mapping relation table, and judging whether a mapping relation corresponding to the service level of the test order exists in the mapping relation table; the mapping relation table stores the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system;
if the directory hierarchy does not exist, a new directory hierarchy is created in the defect storage system, and a mapping relation between the service hierarchy corresponding to the test sheet and the created new directory hierarchy is established;
and if so, directly storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
8, test defect data storage device, wherein the device comprises:
the test order receiving unit is suitable for receiving a test order for making a test request;
the mapping relation establishing unit is suitable for establishing the mapping relation between the service level corresponding to the test list and the directory level of the defect storage system;
the defect data acquisition unit is suitable for acquiring the defect data obtained by the test corresponding to the test order;
and the defect data storage unit is suitable for storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.
An electronic device of the type , wherein the electronic device comprises:
a processor; and the number of the first and second groups,
a memory arranged to store computer executable instructions that when executed cause the processor to perform the method of any of claims 1-7.
10, computer readable storage media, wherein the computer readable storage media stores or more programs, the or more programs when executed by a processor implement the method of any of claims 1-7.
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CN113051165A (en) * 2021-03-30 2021-06-29 北京金山云网络技术有限公司 Method, device, monitoring server and medium for processing test order

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