CN110703059B - Device for improving tuning stability of series resonance test under small load - Google Patents

Device for improving tuning stability of series resonance test under small load Download PDF

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CN110703059B
CN110703059B CN201911107893.9A CN201911107893A CN110703059B CN 110703059 B CN110703059 B CN 110703059B CN 201911107893 A CN201911107893 A CN 201911107893A CN 110703059 B CN110703059 B CN 110703059B
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tuning
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CN110703059A (en
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王黎明
魏本刚
张文辉
陈坚
杨来斌
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Shanghai Gaolsee Electrical Technology Co ltd
Shanghai Hengnengtai Enterprise Management Co ltd Puneng Power Technology Engineering Branch
State Grid Shanghai Electric Power Co Ltd
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Shanghai Gaolsee Electrical Technology Co ltd
Shanghai Hengnengtai Enterprise Management Co ltd Puneng Power Technology Engineering Branch
State Grid Shanghai Electric Power Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/14Circuits therefor, e.g. for generating test voltages, sensing circuits

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Abstract

The invention relates to a device for improving tuning stability of a series resonance test under a small load, which comprises a column type voltage regulator, an exciting transformer, a tuning inductor, a measuring voltage divider, a measuring module and an upper computer, wherein the output end of the column type voltage regulator is connected to a power supply, the output end of the column type voltage regulator is connected to the input end of the exciting transformer, the output end of the exciting transformer, the tuning inductor and a test article capacitor are connected in series to form a closed loop, the measuring voltage divider is connected with the test article capacitor in parallel, the output ends of the measuring module and the measuring voltage divider are connected with the upper computer, the input end of the measuring module is connected with the exciting transformer, and the device also comprises a damping resistor, and the damping resistor is connected between the exciting transformer and the tuning inductor in series. Compared with the prior art, the invention leads the tuning of the series resonance test to be more stable under small load and the tuning speed to be faster by connecting the damping resistor between the output end of the exciting transformer and the tuning inductor in series.

Description

Device for improving tuning stability of series resonance test under small load
Technical Field
The invention relates to the technical field of a tuning type series resonance power frequency high voltage test of electrical equipment, in particular to a device for improving tuning stability of a series resonance test under a small load.
Background
The principle of the method is mainly that series resonance between an inductor and a capacitor (called a load capacitor) of a tested object is utilized to realize that high voltage is output on the tested object by inputting low voltage so as to reduce the requirement of a high-voltage test on the capacity of a power supply, and the method has the great advantage of reducing the requirements of the test power supply and the capacity of test equipment for the test of a large-capacity tested object (large load capacitor). The first method is a variable-frequency series resonance test method, and the series resonance between an electric reactor and an equivalent capacitor of a tested product is realized by changing the frequency of a test loop through a variable-frequency power supply; the second method does not change the power supply frequency, and realizes the resonance with the tested product by changing the inductance in the test loop through tuning the inductance, namely the tuning inductance type series resonance power frequency high voltage test method. Compared with the first method, the second method does not change the frequency during the test, and is more effective in the examination of the high-voltage electrical equipment which actually runs under the power frequency.
The steps of the tuning type series resonance power frequency high voltage test are generally to pre-tune under a lower voltage, namely to adjust and change the tuning inductance, to judge whether the tuning is approached or not by measuring whether the power factor of the loop is approached or not, and to increase the voltage to an output test target voltage after the tuning is approached, so as to complete the test. Due to the two main reasons that the measurement error under the lower voltage is relatively larger and the tuning inductance may slightly fluctuate in the process of increasing the voltage to the output test target voltage after approaching tuning, if the tuning degree is greatly deviated in the voltage increasing process, the voltage increasing needs to be stopped, the inductance of the tuning inductance is adjusted and changed, the voltage increasing is continued after the tuning degree requirement is met, and the process is circulated until the target test voltage is reached. A flow diagram of the tuning process is shown in fig. 1.
However, in practical applications, the inventors found that the inductance fluctuation of the tuning inductance is large in a small load condition (the equivalent capacitance of the test article is small), and that the unstable or reciprocating adjustment condition often occurs in the process of "pre-tuning → boosting → retuning → re-boosting" and the unstable or reciprocating adjustment condition often occurs in the process of "pre-tuning → boosting → retuning → re-boosting".
Disclosure of Invention
The invention aims to overcome the defects in the prior art, provides a device for improving the tuning stability of a series resonance test under a small load, and solves the problem of poor tuning stability of the series resonance test under the condition of the small load.
The purpose of the invention can be realized by the following technical scheme:
the utility model provides an improve device of series resonance test tuning stability under little load, includes column voltage regulator, exciting transformer, tuning inductance, measurement voltage divider, measuring module and host computer, the output of column voltage regulator is connected to the power, and the output is connected to exciting transformer's input, exciting transformer's output and tuning inductance and sample electric capacity are established ties and are constituted closed circuit, it is parallelly connected with sample electric capacity to measure the voltage divider, measuring module and the output of measuring the voltage divider all with the host computer connection, measuring module's input and exciting transformer are connected, the device still includes damping resistance, and this damping resistance is established ties between exciting transformer and tuning inductance.
The measuring module comprises a power factor meter and a current transformer, wherein the input end of the power factor meter is connected with the primary side of the exciting transformer, and the current transformer is connected with the secondary side of the exciting transformer.
The resistance value of the damping resistor is specifically as follows:
Figure BDA0002271861840000021
Figure BDA0002271861840000022
Figure BDA0002271861840000023
Figure BDA0002271861840000024
wherein: a is an intermediate variable, b is an intermediate variable, c is an intermediate variable, R1Is the resistance value of the damping resistor, U2NIs rated output voltage of secondary side of exciting transformer, omega is 2 pi f, f is power frequency of power supply, CminFor measuring the capacitance of the voltage divider, CNFor designing rated loads, UNBeta is the upper limit of the proportion of the designed rated load for the rated test voltage,
Figure BDA0002271861840000025
to the upper limit of the tuning target range, Δ l is the distance that the tuning inductor air gap may jitter,
Figure BDA0002271861840000026
alpha is a lower limit of a proportion of a design rated load, mu, which is a lower limit of a tuning target range0For vacuum permeability, N is the number of turns of the coil of the tuning inductor, S0The equivalent magnetic conduction area of the tuning inductance air gap is obtained.
And the power frequency of the power supply is 50 Hz.
The lower limit of the design rated load is 10%.
The upper limit of the design rated load is 40%.
And the rated withstand voltage of the damping resistor is the rated output voltage of the secondary side of the excitation transformer.
And the damping resistor is connected with a short-circuit switch in parallel, and when the capacitance value of the test sample capacitor exceeds 40% of the designed rated load, the short-circuit switch is switched on.
Compared with the prior art, the invention has the following beneficial effects:
1) the damping resistor is connected in series between the output end of the exciting transformer and the tuning inductor, so that the tuning of the series resonance test under a small load is more stable, and the tuning speed is higher.
2) Through setting up the short circuit switch, can switch on the short circuit switch when the capacitance value of sample electric capacity surpasses design rated load's 40%, thus do not influence normal experiment.
Drawings
FIG. 1 is a block flow diagram of a tuning process;
FIG. 2 is a schematic structural view of the present invention;
fig. 3 is an equivalent circuit diagram of the test loop.
Detailed Description
The invention is described in detail below with reference to the figures and specific embodiments. The present embodiment is implemented on the premise of the technical solution of the present invention, and a detailed implementation manner and a specific operation process are given, but the scope of the present invention is not limited to the following embodiments.
The technical scheme of the invention solves the problem of poor tuning stability of the series resonance test under the condition of small load, and particularly, a damping resistor is connected between the output end of an excitation transformer (or called a step-up transformer) and a tuning inductor in the inductance-regulating type series resonance power frequency high-voltage test device (or system).
The utility model provides a device for improve series resonance test tuning stability under light load, as shown in figure 2, including column voltage regulator, exciting transformer, tuning inductance, measure the divider, measuring module and host computer, the output of column voltage regulator is connected to the power, the output is connected to exciting transformer's input, exciting transformer's output and tuning inductance and sample electric capacity series connection constitute closed circuit, measure the divider and connect in parallel with sample electric capacity, measuring module and measuring voltage divider's output all are connected with the host computer, measuring module's input and exciting transformer are connected, the device still includes damping resistance, this damping resistance is established ties between exciting transformer and tuning inductance.
The measuring module comprises a power factor meter and a current transformer, wherein the input end of the power factor meter is connected with the primary side of the exciting transformer, and the current transformer is connected with the secondary side of the exciting transformer.
The resistance range of the damping resistor is determined by the following method:
aiming at the series resonance power frequency high voltage test adopting the air gap type tuning inductor, the inductance value is changed by adjusting the size of the air gap. The theoretical calculation formula of the inductance value of the air gap adjusting type tuning inductor is as follows:
Figure BDA0002271861840000041
in the formula (1), N is the number of turns of the coil; rm0Is an air gap equivalent reluctance; mu.s0Is a vacuum magnetic conductivity; s0Is the equivalent magnetic conduction area of the air gap; l0Is the air gap geometric length.
Referring to fig. 2, the equivalent circuit of the test loop viewed from the secondary side of the exciter transformer is shown in fig. 3. In the figure, R0For testing the equivalent resistance of the circuit, L0In order to test the equivalent inductance of the loop, the stray capacitance of the loop is small and negligible compared with the load capacitance (i.e. the equivalent capacitance of the tested object) and the capacitance of the voltage divider.
Total resistance of loop R ═ R0+R1Total inductance L ═ L in the loop0+L1Total capacitance of the loop
Figure BDA0002271861840000042
CminThe capacitor C of the voltage divider consists of a high-voltage arm and a low-voltage arm of the voltage divider1And C2And (4) forming. CxThe equivalent capacitance of the test sample, namely the load capacitance. Usually, under the condition of small load, the tuning inductance is far larger than the equivalent inductance of the test loop, namely L when the tuning is close to the tuning1>>L0The total inductance of the loop can be approximated as L ≈ L1
Usually, the tuning inductance is adjusted from large to small at the beginning of tuning, i.e. the air gap of the tuning inductance is adjusted from small to large. Assuming that the loop power factor is reached
Figure BDA0002271861840000043
The total inductance of the time loop is L, and the air gap length of the tuning inductor is L, then
Figure BDA0002271861840000044
Figure BDA0002271861840000045
Then in the tuning process, if the air gap of the tuning inductor slightly fluctuates, if the air gap length is slightly reduced by delta L, the inductance is reduced by delta L, and the power factor of the loop is reduced to be
Figure BDA0002271861840000046
Then
Figure BDA0002271861840000047
Figure BDA0002271861840000048
The finishing agent can be obtained by finishing,
Figure BDA0002271861840000049
where ω is 2 π f, f is power frequency, 50 Hz.
Solving equation (4) can result in maintaining the loop power factor at not less than
Figure BDA00022718618400000410
Under the condition that
Figure BDA0002271861840000051
In the formula (I), the compound is shown in the specification,
Figure BDA0002271861840000052
Figure BDA0002271861840000053
Figure BDA0002271861840000054
when the formula (5) is usually satisfied, the series damping resistance is much larger than the equivalent resistance of the test loop, so the formula (5) can be approximately used as the condition of the series damping resistance, that is, the damping resistance is
Figure BDA0002271861840000055
It can also be seen from equation (6) that the lower limit of the series damping resistance needs to be determined in accordance with the lower limit of the small load capacitance case to be considered. The most extreme case is no load, i.e. only the capacitance of the voltage divider is measured,
Figure BDA0002271861840000056
the minimum load condition to be considered by the common inductance-regulating series resonance power frequency high voltage test device (or system) is that the load is only 10% of the design rated load CNIn the case of
Figure BDA0002271861840000057
Meanwhile, it is considered that if the series damping resistor is too large, the loop current may be limited, so that the test target voltage may not be raised even if the test sample is tuned. R can be obtained according to the test target voltage condition1The conditions are required to be satisfied:
Figure BDA0002271861840000058
in the formula of U2NIs rated output voltage of secondary side of exciting transformer, UtThe maximum rated test voltage U of the inductance-regulating series resonance power frequency high-voltage test device (or system) is the test target voltageN
As can be seen from formula (7), a damping resistor is connected in seriesShould be determined by the upper load limit of the small load situation under consideration. Usually, the condition that tuning instability easily occurs in the tuning type series resonance power frequency high voltage test device (or system) is that the design rated load C is less than 40 percent of the loadNIn the case of (1).
The resistance value of the damping resistor is specifically as follows:
Figure BDA0002271861840000059
Figure BDA0002271861840000061
Figure BDA0002271861840000062
Figure BDA0002271861840000063
wherein: a is an intermediate variable, b is an intermediate variable, c is an intermediate variable, R1Is the resistance value of the damping resistor, U2NIs rated output voltage of secondary side of exciting transformer, omega is 2 pi f, f is power frequency of power supply, CminFor measuring the capacitance of the voltage divider, CNFor designing rated loads, UNBeta is the upper limit of the proportion of the designed rated load for the rated test voltage,
Figure BDA0002271861840000064
to the upper limit of the tuning target range, Δ l is the distance that the tuning inductor air gap may jitter,
Figure BDA0002271861840000065
alpha is a lower limit of a proportion of a design rated load, mu, which is a lower limit of a tuning target range0For vacuum permeability, N is the number of turns of the coil of the tuning inductor, S0The equivalent magnetic conduction area of the tuning inductance air gap is obtained.
The power frequency of the power supply is 50Hz, the lower limit of the proportion of the designed rated load is 10%, and the upper limit of the proportion of the designed rated load is 40%.
In addition, during tuning, the voltage of the secondary side of the exciting transformer is almost completely added to the damping resistor, and the voltage is connected in series with the tolerable rated voltage U of the damping resistorR1NShould press UR1N=U2NAnd (4) limiting.
And the damping resistor is connected with a short-circuit switch in parallel, and when the capacitance value of the test sample capacitor exceeds 40% of the designed rated load, the short-circuit switch is switched on. Under the condition of non-small load, the inductance-adjusting series resonance power frequency high-voltage test device (or system) can realize stable tuning without additionally serially connecting damping resistors, so that the serially connected damping resistors can be in short circuit through a short-circuit switch. The non-small load condition generally refers to the condition that the load capacitance of a test article is larger than 40% of the rated test load capacitance range of the inductance-regulating series resonance power frequency high-voltage test device (or system).
The invention provides a method for improving the tuning stability of a series resonance test under a small load, which comprises the following steps: a damping resistor is connected between the output end of an exciting transformer (or called a step-up transformer) and a tuning inductor in the inductance-regulating series resonance power frequency high-voltage test device (or system). Now, the following is specifically set forth:
a set of 400kV inductance-regulating type series resonance power frequency high-voltage test device is taken as an example to illustrate the specific implementation mode of the patent method. The power supply is 0.4kV, and the power frequency is 50 Hz; secondary side rated voltage U of exciting transformer2N9 kV; rated capacity Q of tuning reactorLN1200kVA, rated voltage ULNRated current I allowed to pass at 400kVLN3A, 28000 turns N, and equivalent air gap magnetic conduction area S0=400cm2Maximum length of air gap lmax200 mm; the capacitance of the capacitive voltage divider is 3000pF, i.e. C at no loadmin3000 pF; maximum test target voltage UNDesigning rated test load capacitance C as 400kVN20000 pF; the loop equivalent resistance does not exceed R at the maximum0Estimated at 100 Ω, tuning inductance L near tuning under light load1>>L0Thus neglecting the loop equivalent inductance L0。ω=100π,μ0=4π×10-7H/m, tuning target range of
Figure BDA0002271861840000071
If the minimum sample load to be considered by the set of inductance-regulating series resonance power frequency high-voltage test device is 10 percent of rated test capacitance, the tuning can be stabilized, namely Cx2000 pF. The total loop capacitance is 5000pF when the divider capacitance is added. The relationship between the inductance of the tuning inductor and the length of the air gap is L as calculated by equation (1)139408/l H, l in mm. When the damping resistor is not connected in series according to the existing method, R is R0Loop power factor adjusted to 100 omega
Figure BDA0002271861840000072
When the inductance is required to be adjusted to 2026.49H, the air gap length l is 19.446 mm. If the air gap fluctuates slightly in the tuning process, for example, the air gap is reduced by 0.01mm, the inductance will change by about 1H, and the loop power factor changes to
Figure BDA0002271861840000074
Far below the lower limit of the tuning target range
Figure BDA0002271861840000073
Therefore, the tuning inductance needs to be adjusted, and even the reciprocating adjustment cannot be stable.
According to the method, under the condition of no load, a damping resistor R is connected in series according to the calculation of a formula (6)1Not less than 2611 omega. Then at R1When 2611 Ω, the loop equivalent resistance R is ignored0,R=R1Loop power factor adjusted to
Figure BDA0002271861840000076
When the inductance is required to be adjusted to 2028.11H, the air gap length l is 19.431 mm. If the air gap fluctuates slightly in the tuning process, for example, the air gap is reduced by 0.01mm, the inductance will change by about 1H, and the loop power factor changes to
Figure BDA0002271861840000077
Still meet the lower limit of the tuning target range
Figure BDA0002271861840000075
Therefore, the tuning inductance does not need to be adjusted, and the tuning is stable. When the design rated test load capacitance is below 40% as a small load range, and the C is 3000+ 40% multiplied by 20000 to 11000pF according to the formula (7), the damping resistance R is connected in series1Is less than or equal to 6511 omega. R is more than or equal to 2611 omega1The range of not more than 6511 omega, theoretically, the tuning can be stable under the condition of 10 to 40 percent of small load, and the output can reach the target voltage of the test.
In extreme cases, stable tuning under no-load conditions is taken into account, i.e. only the divider capacitance C-Cmin3000 pF. At this time, the damping resistance of the series connection is limited to 5334 Ω ≦ R calculated by the method of the present invention1Is less than or equal to 6511 omega.
It can be seen from the above embodiments that, after the damping resistors are connected in series according to the method of the present invention, the tuning stability under the condition of small load can be greatly improved, and the tuning speed is remarkably fast.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (7)

1. A device for improving the tuning stability of a series resonance test under a small load comprises a column type voltage regulator, an excitation transformer, a tuning inductor, a measuring voltage divider, a measuring module and an upper computer, wherein the input end of the column type voltage regulator is connected to a power supply, the output end of the column type voltage regulator is connected to the input end of the excitation transformer, the output end of the excitation transformer, the tuning inductor and a test article capacitor are connected in series to form a closed loop, the measuring voltage divider is connected with the test article capacitor in parallel, the output ends of the measuring module and the measuring voltage divider are connected with the upper computer, and the input end of the measuring module is connected with the excitation transformer;
the resistance value of the damping resistor is specifically as follows:
Figure FDA0003078952600000011
Figure FDA0003078952600000012
Figure FDA0003078952600000013
Figure FDA0003078952600000014
wherein: a is an intermediate variable, b is an intermediate variable, c is an intermediate variable, R1Is the resistance value of the damping resistor, U2NIs rated output voltage of secondary side of exciting transformer, omega is 2 pi f, f is power frequency of power supply, CminFor measuring the capacitance of the voltage divider, CNFor designing rated loads, UNBeta is the upper limit of the proportion of the designed rated load for the rated test voltage,
Figure FDA0003078952600000015
to the upper limit of the tuning target range, Δ l is the distance that the tuning inductor air gap may jitter,
Figure FDA0003078952600000016
alpha is a lower limit of a proportion of a design rated load, mu, which is a lower limit of a tuning target range0For vacuum permeability, N is the number of turns of the coil of the tuning inductor, S0The equivalent magnetic conduction area of the tuning inductance air gap is obtained.
2. The apparatus of claim 1, wherein the measurement module comprises a power factor meter and a current transformer, an input end of the power factor meter is connected to a primary side of the excitation transformer, and the current transformer is connected to a secondary side of the excitation transformer.
3. The device for improving the tuning stability of the series resonance test under the small load of claim 1, wherein the power frequency of the power supply is 50 Hz.
4. The apparatus of claim 1, wherein the lower limit of the design rated load is 10%.
5. The apparatus of claim 1, wherein the upper limit of the design rated load is 40%.
6. The device for improving the tuning stability of the series resonance test under the small load as claimed in claim 1, wherein the rated withstand voltage of the damping resistor is the rated output voltage of the secondary side of the exciting transformer.
7. The device for improving the tuning stability of the series resonance test under the small load according to claim 1, wherein a short-circuit switch is connected in parallel to the damping resistor, and the short-circuit switch is turned on when the capacitance value of the test capacitor exceeds 40% of the designed rated load.
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