CN110672206A - Double-slit curved prism chromatic dispersion ultra-large field of view spectrometer optical system - Google Patents
Double-slit curved prism chromatic dispersion ultra-large field of view spectrometer optical system Download PDFInfo
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- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
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Abstract
The invention belongs to the technical field of spectral imaging, and discloses an optical system of a double-slit curved prism dispersion super-large field-of-view spectrometer, wherein a first entrance slit and a second entrance slit are positioned in front of a first concave spherical reflector and are positioned near one focus; the first curved surface prism and the second spherical surface prism are positioned between the first concave spherical surface reflector and the convex spherical surface reflector and are close to the convex spherical surface reflector, so that the volume and the weight of the curved surface prism are reduced, the flexibility of material selection is enhanced, and the processing difficulty is reduced. The first and second curved prisms are used to increase the chromatic dispersion capability and simultaneously increase the aberration correction capability. Spectral images of the first incident slit and the second incident slit are simultaneously obtained on an image surface of the spectrometer, and the area array detectors are spliced in a staggered mode, so that ultra-large field-of-view high-resolution spectral imaging is realized. The invention is connected with an ultra-large-caliber telescopic system and is used for large-amplitude wide-spectrum remote sensing detection of a static track; the system is connected with a telescope with an oversized view field and is used for airborne or low-orbit wide-range hyperspectral remote sensing detection.
Description
Technical Field
The invention relates to the technical field of spectral imaging, in particular to an optical system of a double-slit curved prism dispersion ultra-large field of view spectrometer.
Background
With the development of the hyperspectral remote sensing technology, the fields of land, ocean and atmosphere detection require high space-time resolution, so that the requirement on the field of view of an imaging spectrometer is higher and higher, the larger the field of view is, the larger the breadth is, the smaller the revisit period of the instrument is, and the larger the field of view is, the larger the width of the swath is, the smaller the revisit period of the instrument is, and the higher the time resolution is. The imaging spectrometer consists of a front telescope and a spectrometer, which are organically connected together through an incident slit. Spectrometer optics is the core and key of imaging spectrometers. The spectrometer of Hyperion, a typical imaging spectrometer in the United states, employs an Offner convex grating dispersive structure with a field of view of only 7.65 mm. The spectrometer plane prism dispersion structure of the Tiangong I imaging spectrometer developed in China has a field of view of only 18 mm. The field of view of the spectrometer for hyperspectral imaging by a curved prism designed by the institute of photonics, von leigh (optics, 39 (5): 0511002) of the Chinese academy is only 14mm, as shown in fig. 1. The curved prism is characterized in that the first curved prism is positioned on the incident arm and close to the first concave spherical reflector, the second curved prism is positioned on the emergent arm and close to the second concave spherical reflector, the caliber of the curved prism is close to that of the concave spherical reflector, and the curved prism is large in caliber, large in volume and heavy in weight. The field of view of the existing spectrometer optical system can not meet the detection requirement of the imaging spectrum, and the spectrometer optical system with the ultra-large field of view is urgently needed, and the field of view requirement reaches 90-150 mm. The size of the existing short wave infrared area array detector is only 30mm, and a single detector cannot realize imaging detection of 90mm-150mm oversized view field.
In summary, the problems of the prior art are as follows: the incident slit of the existing spectrometer optical system is a single slit, the field of view of the spectrometer is small, the information acquisition capability is poor, the time resolution is low, and the application requirement of the spectrometer with the ultra-large field of view can not be met.
The difficulty of solving the technical problems is as follows: the larger the field of view, the longer the entrance slit, and the more difficult the aberration correction. In addition, due to the limitation of the size of the existing area array detector, the area array detector needs to be spliced in a staggered mode, a single slit cannot be realized, double slits need to be adopted, the size of the object plane of the spectrograph is increased equivalently by the double slits, and the difficulty in aberration correction is further increased.
The significance of solving the technical problems is as follows: the technical problem is solved, the limitation of the size of the existing area array detector can be broken through, an optical system of the super-large view field spectrometer is designed, super-large-breadth super-large view field spectrum imaging detection is realized, and the requirements of land, ocean and atmosphere high-spectral remote sensing high-time resolution dynamic observation are met.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides an optical system of a double-slit curved prism dispersion ultra-large field spectrometer, and provides a design scheme capable of realizing ultra-large field spectral imaging.
The invention is realized in such a way that a double-slit curved prism dispersion ultra-large field spectrometer optical system comprises a first entrance slit, a second entrance slit, a first concave spherical reflector, a first curved prism, a second curved prism, a convex spherical reflector, a second concave spherical reflector and an image plane. The first and second entrance slits are object surfaces of the spectrometer, light rays emitted from the first and second slits are reflected by the first concave spherical reflector and then incident on the first curved surface prism, are dispersed by the first curved surface prism and the second curved surface prism and then incident on the convex spherical reflector, are reflected by the convex spherical reflector, are dispersed by the second curved surface prism and the first curved surface prism and then incident on the second concave spherical reflector, are spectrally imaged on an image surface by the second concave spherical reflector, spectral images of the first slit and the second slit are simultaneously obtained on the image surface, and the area array detectors are spliced on the image surface in a staggered manner to realize the spectral imaging of the ultra-large high-resolution field of view.
The first entrance slit and the second entrance slit are positioned in front of the first concave spherical reflector and are positioned near one of the focal points;
the first curved surface prism and the second spherical surface prism are located between the first concave spherical surface reflector and the convex spherical surface reflector and are close to the convex spherical surface reflector, so that the volume and the weight of the curved surface prism are reduced, the flexibility of material selection is enhanced, and the processing difficulty is reduced.
The first and second curved prisms increase the chromatic dispersion capability and increase the aberration correction capability. Spectral images of the first incident slit and the second incident slit are simultaneously obtained on an image surface of the spectrometer, and the area array detectors are spliced in a staggered mode, so that ultra-large field-of-view high-resolution spectral imaging is realized.
Further, the first entrance slit and the second entrance slit are parallel to each other, and a distance d separating in the dispersion direction satisfies a condition that d is not less than 5mm1Not more than 30mm, and the slit length l satisfies 90 not more than l1≤150mm。
Further, the first curved surface prism and the second curved surface prism are made of different glass materials, and the air interval d between the first curved surface prism and the second curved surface prism1D is more than or equal to 2mm1Not more than 10mm, air space d between the second curved prism and the convex spherical reflector2Satisfies the following conditions: d is not less than 2mm2≤10mm
Further, the first working surface and the second working surface of the first curved surface prism are both standard spherical surfaces, and the first working surface and the second working surface of the second curved surface prism are both standard spherical surfaces.
Furthermore, the array detectors on the image surface are spliced in a staggered mode, and the splicing length of the detectors is not less than 90'1≤150mm。
Furthermore, the inclination angle alpha of the image plane in the dispersion plane is more than or equal to 5 degrees and less than or equal to 5 degrees.
In summary, the advantages and positive effects of the invention are:
the invention provides an optical system of a double-slit curved prism dispersion ultra-large field spectrometer, and provides a design scheme capable of realizing ultra-large field spectral imaging. The field of view of the spectrometer is improved to 90-150 mm from the existing tens of millimeters, so that the width of the imaging spectrometer is increased, the revisit period is shortened, and the time resolution is improved. In the invention, the two curved surface prisms are both positioned near the convex spherical reflector, so that the volume and the weight of the curved surface prisms are reduced; the light rays pass through the curved surface prism 1 and the curved surface prism 2 twice, the dispersion rate is improved, and the volume of the spectrograph is reduced by more than half under the condition of the same spectral resolution. The technical parameters of the spectrometer are compared with those of the prior spectrometer as shown in the table 1.
TABLE 1 comparison of technical parameters of the present invention with existing spectrometers
Drawings
Fig. 1 is a schematic structural diagram of an optical system of a conventional curved prism dispersion spectrometer.
FIG. 2 is a schematic structural diagram of an optical system of a double-slit curved prism dispersion extra-large field-of-view spectrometer provided by the invention.
In the figure: 1. a first entrance slit; 2. a second entrance slit; 3. a first concave spherical reflector; 4. a first curved prism; 5. a second spherical prism; 6. a convex spherical reflector; 7. a second concave spherical reflector; 8. an image plane; 9. a first entrance slit dispersed spectral image; 10. the second entrance slit disperses the spectral image.
Fig. 3 is a schematic diagram of detector cross-stitching on an image plane 8.
FIG. 4 is a graph of the optical transfer function of the first entrance slit of the optical system of the double-slit curved prism dispersive spectrometer at a wavelength of 1.0 μm shown in FIG. 2.
FIG. 5 is a graph of the optical transfer function at a wavelength of 2.5 μm for the first entrance slit of the optical system of the double-slit curved prism dispersive spectrometer shown in FIG. 2.
FIG. 6 is a graph of the optical transfer function at 1.0 μm of the second entrance slit of the optical system of the double-slit curved prism dispersive spectrometer shown in FIG. 2.
FIG. 7 is a graph of the optical transfer function at 2.5 μm for the second entrance slit of the optical system of the double-slit curved prism dispersive spectrometer shown in FIG. 2.
Fig. 8 is a three-dimensional optical structural diagram of the optical system of the double-slit curved prism dispersive spectrometer shown in fig. 2.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the following embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The technical solution and technical effects of the present invention are further described below with reference to specific embodiments.
As shown in fig. 1, a first entrance slit 1 and a second entrance slit are located on an object plane of a spectrometer, the slits are 120mm in length, light emitted from a first radiation slit 1 and a second entrance slit 2 is reflected by a first concave spherical reflector 3 and then enters a first curved prism 4, is dispersed by a first curved prism 4 and a second curved prism 5 and then enters a convex spherical reflector 6, is reflected by the convex spherical reflector 5, is dispersed by a second curved prism 5 and a first curved prism 4 and then enters a second concave spherical reflector 7, is spectrally imaged on an image plane by the second concave spherical reflector 7, simultaneously obtains a spectral image 9 of the first entrance slit and a spectral image 10 of the second entrance slit on the image plane 8, and area array detectors are alternately spliced on the image plane to realize ultra-large field high resolution spectral imaging.
In the embodiment, the working waveband of the spectrometer with the oversized view field is 1.0-2.5 microns, the view field of the spectrometer is 120mm, the first curved surface prism is made of F _ Silica, and the second curved surface prism is made of ZnSe. Optical parameters of the spectrometer are shown in table 2.
TABLE 2 optical parameters of spectrometer
The detector adopts a short-wave infrared MCT detector, the size of a pixel is 30 mu m multiplied by 30 mu m, the number of the pixels is 1024 multiplied by 256, and as shown in figure 3, 5 detectors are adopted for staggered splicing. FIG. 4 is the optical transfer function curve of the optical system of the double-slit curved prism dispersive spectrometer shown in FIG. 2 at the incident wavelength of 1.0 μm, and FIG. 5 is the optical transfer function curve of the optical system of the double-slit curved prism dispersive spectrometer shown in FIG. 2 at the incident wavelength of 2.5 μm. As can be seen from fig. 4 and 5, the optical transfer function >0.5@17lp/mm, good imaging quality is obtained. Fig. 6 is a three-dimensional optical structure diagram of the double-slit curved prism dispersion spectrometer optical system shown in fig. 2, and it can be seen from fig. 6 that the invention utilizes the dispersion of two curved prisms close to the convex spherical reflector, the prism has small volume and weight, is easy to process, and is beneficial to practical engineering application. The dual-slit curved prism is used for dispersion, detectors on an image surface are spliced in a staggered mode, and 120mm ultra-large field spectrum imaging is achieved. The ultra-large field-of-view spectrometer can be connected with an ultra-large caliber telescope with the caliber of 4m and the focal length of 21.6m to form a static track imaging spectrometer for static track spectrum remote sensing detection, and the width of the imaging spectrometer reaches 200 km.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (8)
1. An optical system of a double-slit curved prism dispersion ultra-large field-of-view spectrometer is characterized by comprising a first entrance slit, a second entrance slit, a first concave spherical reflector, a first curved prism, a second curved prism, a convex spherical reflector, a second concave spherical reflector and an image plane;
the first entrance slit and the second entrance slit are object surfaces of the spectrometer, light rays emitted from the first slit and the second slit are reflected by the first concave spherical reflector and then are incident on the first curved surface prism, are dispersed by the first curved surface prism and the second curved surface prism and then are incident on the convex spherical reflector, are reflected by the convex spherical reflector, are dispersed by the second curved surface prism and the first curved surface prism and then are incident on the second concave spherical reflector, are spectrally imaged on an image surface by the second concave spherical reflector, spectral images of the first slit and the second slit are simultaneously obtained on the image surface, and the area array detectors are spliced on the image surface in a staggered manner to realize the spectral imaging with the ultra-large field-view and high resolution;
the first entrance slit and the second entrance slit are positioned in front of the first concave spherical reflector and are positioned near one of the focal points;
the first curved surface prism and the second spherical surface prism are positioned between the first concave spherical reflector and the convex spherical reflector and are close to the convex spherical reflector;
the first curved surface prism and the second curved surface prism increase the chromatic dispersion capability and increase the aberration correction capability at the same time; spectral images of the first incident slit and the second incident slit are simultaneously obtained on an image surface of the spectrometer, and the area array detectors are spliced in a staggered mode, so that ultra-large field-of-view high-resolution spectral imaging is realized.
2. The optical system of the double-slit curved prism dispersion extra-large field spectrometer as claimed in claim 1, wherein the first entrance slit and the second entrance slit are parallel to each other, and the distance d separating in the dispersion direction satisfies the condition that d is not less than 5mm1Not more than 30mm, and the slit length l satisfies 90 not more than l1≤150mm。
3. The optical system of the double-slit curved prism dispersion extra-large field spectrometer of claim 1, wherein the first curved prism and the second curved prism are made of different glass materials, and the air space between the first curved prism and the second curved prism is sufficient: d is not less than 2mm1Not more than 10mm, air space d between the second curved prism and the convex spherical reflector2Satisfies the following conditions: d is not less than 2mm2≤10mm。
4. The optical system of a double-slit curved prism dispersion extra-large field spectrometer as claimed in claim 1, wherein the first working surface and the second working surface of the first curved prism are both standard spherical surfaces, and the first working surface and the second working surface of the second curved prism are both standard spherical surfaces.
5. The optical system of the double-slit curved prism dispersion extra-large field spectrometer as claimed in claim 1, wherein the array detectors on the image plane are spliced in a staggered manner, and the splicing length of the detectors is not less than 90 ≤ l′1≤150mm。
6. The optical system of the double-slit curved prism dispersion extra-large field spectrometer as claimed in claim 1, wherein the inclination angle of the image plane in the dispersion plane is-5 ° to α 5 °.
7. The application of the double-slit curved prism dispersion extra-large field spectrometer optical system as claimed in any one of claims 1 to 6 in large-width hyperspectral remote sensing detection of a stationary orbit is characterized in that the double-slit curved prism dispersion extra-large field spectrometer optical system is connected with an extra-large-diameter telescope system.
8. The application of the double-slit curved prism dispersion ultra-large field spectrometer optical system as claimed in any one of claims 1 to 6 in airborne or low-orbit large-width hyperspectral remote sensing detection is characterized in that the double-slit curved prism dispersion ultra-large field spectrometer optical system is connected with an ultra-large field telescope.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111678598A (en) * | 2020-06-05 | 2020-09-18 | 中国科学院空天信息创新研究院 | Dyson curved surface prism spectral imaging system |
| CN112212985A (en) * | 2020-09-30 | 2021-01-12 | 中国科学院西安光学精密机械研究所 | Shortwave infrared imaging spectrometer light splitting system and shortwave infrared imaging spectrometer |
| CN113759530A (en) * | 2021-09-15 | 2021-12-07 | 中国科学院长春光学精密机械与物理研究所 | Double-slit long-wave infrared spectrometer, optical system thereof and optical system design method |
| CN114280764A (en) * | 2021-12-27 | 2022-04-05 | 苏州大学 | Large-view-field spectral imaging method and system based on free-form surface prism |
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| CN114280764A (en) * | 2021-12-27 | 2022-04-05 | 苏州大学 | Large-view-field spectral imaging method and system based on free-form surface prism |
| CN114280764B (en) * | 2021-12-27 | 2023-12-08 | 苏州大学 | Free-form surface prism-based large-view-field spectroscopic imaging method and system |
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