CN110579489B - Defect detection method for mirror bowl-shaped structure product - Google Patents

Defect detection method for mirror bowl-shaped structure product Download PDF

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CN110579489B
CN110579489B CN201911092080.7A CN201911092080A CN110579489B CN 110579489 B CN110579489 B CN 110579489B CN 201911092080 A CN201911092080 A CN 201911092080A CN 110579489 B CN110579489 B CN 110579489B
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strip
light sources
product
detected
shaped light
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CN110579489A (en
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王郑
王岩松
马凯
周子健
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Focusight Technology Co Ltd
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Focusight Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The invention relates to defect detection methods for mirror bowl-shaped products, which adopts a plurality of cameras and corresponding strip light sources to sequentially image parts of the surface of a product to be detected, well presents all defects of the surface of the product, solves the problem that the defects of the surface of a highly reflective mirror bowl-shaped product cannot be imaged, realizes automatic detection of the product, and helps a production line to improve the quality and the capacity of the product.

Description

Defect detection method for mirror bowl-shaped structure product
Technical Field
The invention relates to the technical field of visual inspection, in particular to defect detection methods for mirror bowl-shaped structure products.
Background
With the continuous development of society, the industrial automation degree is higher and higher, not only production is replaced by machines, but also manual detection is replaced by machines, machine vision is adopted , in all surface defect detection, an object searched by imaging is determined to find imaging modes which can obtain better defect contrast and have uniform images, when the imaging is used for surface detection of a mirror surface product, a spot effect is required to be formed to well present defects, but the imaging problem cannot be well solved for a product with a bowl surface shape at the same time of the mirror surface.
Disclosure of Invention
The invention aims to solve the technical problem of overcoming the defects in the prior art and provides defect detection methods for mirror bowl-shaped products.
The invention solves the technical problem by adopting the technical scheme that defect detection methods for mirror bowl-shaped structure products comprise the following process steps:
(1) placing the product with the mirror bowl-shaped structure to be detected on a bearing table, adjusting the positions of all cameras to ensure that all cameras are positioned right above the middle part of the product to be detected, and cameras correspond to groups of strip-shaped light sources;
(2) each group of strip-shaped light sources is used for polishing in a time-sharing manner, and the corresponding cameras are used for imaging the product to be detected in sequence to obtain imaging results positioned at different positions on the surface of the product to be detected;
(3) and (3) adjusting the height of each group of strip-shaped light sources, continuously observing the imaging result of the product to be detected in the step (2) in the height adjusting process until the strip-shaped light spot effect is presented, adjusting the position of each group of strip-shaped light sources in the horizontal direction, performing width and length calculation on the strip-shaped light spot image imaged by the product to be detected in the adjusting process, ensuring that the sum of the maximum widths of all the strip-shaped light spot images is greater than the maximum length of the strip-shaped light spot image, finally observing whether black features exist in all the strip-shaped light spot images, and judging the product to be defective if the black features exist.
The bowl surface is actually surfaces with constantly changing radian, the light of the strip light at the fixed position irradiates the bowl surface in a certain section of the fixed radian change range , most of the light is reflected into the camera lens to form a light spot effect, the section can be changed by changing the fixed position of the strip light to form the light spot effect, and all defects on the surface of a product to be detected can be well presented.
Each group of strip-shaped light sources can present the strip-shaped light spot effect only by vertically adjusting the height of the strip-shaped light sources, and then the interval where the strip-shaped light spots are located can be changed by adjusting the position of each group of strip-shaped light sources in the horizontal direction; although the wider strip-shaped light spots are more uniform in image, optical interference exists, the defect effect is weakened, and the light spot effect which is shown when the sum of the maximum widths of all strip-shaped light spot images is larger than the maximum length of the longest strip-shaped light spot image is the best defect polishing effect.
When the light passes through the tiny defects of the unevenness, such as crushing and scratching of the product to be detected, no light is reflected, and therefore the black imaging characteristic is presented.
, the camera of step (1) includes a camera, a second camera and a third camera, the camera corresponds to the group of strip light sources, the second camera corresponds to the second group of strip light sources, the third camera corresponds to the third group of strip light sources, the group of strip light sources and the second group of strip light sources have two strip light sources, and the third group of strip light sources is strip light sources.
The 3 groups of strip light sources can ensure the presenting effect of the surface defects of the mirror bowl-shaped structure product to be detected, and are the most suitable light source groups; if the number of the strip light sources is less than 3, light spots must be enlarged to ensure that the whole bowl surface is shot, so that certain surface defects cannot be well presented; if the number of the defect data is larger than 3 groups, the number of images of the system is increased, and the difficulty of defect data synthesis is increased.
is further limited, strip light sources in the group of strip light sources are arranged on the side of the camera, the camera images a product to be detected to obtain images of strip light spots on the edge of the product to be detected, and the camera is provided with another strip light sources on the other side for imaging the product to be detected again to obtain images of two strip light spots on the edges of two sides of the product to be detected respectively.
, arranging strip-shaped light sources in the second group of strip-shaped light sources vertically at the side of the second camera, imaging the product to be detected by the second camera to obtain images of strip-shaped light spots located at the middle part of the product to be detected, arranging another strip-shaped light sources at the other side of the second camera, imaging the product to be detected again to obtain images of the two strip-shaped light spots respectively close to the middle part of the product to be detected.
And , fixing strip light sources of the third group of strip light sources right above the middle part of the product to be detected, lighting by the strip light sources, rotating the position of the third camera, imaging the product to be detected, finding out an image with the maximum strip light spot width, and recording the rotation angle of the camera corresponding to the image.
, the height of each group of bar light sources in the step (3) is 160 mm.
, the black features in step (3) are specifically presented in black blocks, black flowers and black stripes.
The invention has the advantages that the parts of the surface of the product to be detected are imaged in sequence by adopting a plurality of cameras and corresponding strip-shaped light sources, all defects of the surface of the product are well shown, the problem that the defects of the surface of the bowl-shaped product with a high reflective mirror surface cannot be imaged is solved, the automatic detection of the product is realized, and the product quality and the productivity of a production line are improved.
Drawings
The invention is further illustrated in the following description with reference to the figures and examples.
FIG. 1 is a schematic structural diagram of an imaging device for detecting a product with a mirror bowl structure according to the present invention.
FIG. 2 is an image of the th camera under the light of th group of bar light sources.
FIG. 3 is an image of a second camera illuminated by a second set of bar light sources according to the present invention.
FIG. 4 is an image of a third camera under illumination by a third set of bar light sources according to the present invention.
Detailed Description
The invention will now be described in further with reference to the accompanying drawings and preferred embodiments, which are simplified schematic drawings that are intended to illustrate, by way of example only, the basic structure of the invention and, therefore, to show only the elements that are relevant to the invention.
Example
defect detection method for mirror bowl-shaped structure product, the imaging device shown in fig. 1 includes a th camera, a second camera and a third camera arranged side by side, the th camera corresponds to the th group of strip light sources, the second camera corresponds to the second group of strip light sources, the third camera corresponds to the third group of strip light sources, the th group of strip light sources and the second group of strip light sources have two strip light sources, and the third group of strip light sources is strip light sources.
The method comprises the steps of firstly placing a product with a mirror surface bowl-shaped structure to be detected on a bearing table (the bearing table is fixed on a conveying belt and moves along with the conveying belt), adjusting the positions of all cameras to ensure that all the cameras are in a vertical state, when the product to be detected moves to the position under a th camera, firstly moving the heights of strip-shaped light sources in a 0 th group of strip-shaped light sources on the left side of a th camera, continuously observing the imaging result of the product to be detected in the height adjusting process, repeatedly testing to ensure that the imaging result shows a strip-shaped light spot effect when the height of the strip-shaped light source is 160mm, then adjusting the horizontal position of the strip-shaped light source, simultaneously lighting the strip-shaped light source, imaging the product to be detected by a th camera until images that strip-shaped light spots are located at the edge of a bowl surface are obtained, symmetrically adjusting other strip-shaped light sources in a th group of strip-shaped light sources on the right side of a th camera, lighting two strip-shaped light sources in an th group of the strip-shaped light source simultaneously, imaging the product to be detected by a , obtaining two strip-shaped light spot images located1maxAnd the width W of the strip-shaped light spot1
When a product to be detected moves to a position right below a second camera, the heights of strip-shaped light sources in a second group of strip-shaped light sources on the left side of the second camera are directly adjusted to 160mm, then the positions of the strip-shaped light sources in the horizontal direction are adjusted, meanwhile, the strip-shaped light sources are used for lighting, the second camera images the product to be detected until an image that strip-shaped light spots are located on the middle portion of the bowl surface is obtained, another strip-shaped light sources in the second group of strip-shaped light sources are symmetrically adjusted on the right side of the second camera, two strip-shaped light sources in the second group of strip-shaped light sources are used for lighting simultaneously, and the second camera forms the product to beObtaining an image of two strip-shaped light spots near the middle of the bowl surface, as shown in FIG. 3, calculating by image processing software to obtain the maximum length L in the image2maxAnd the width W of the strip-shaped light spot2
When a product to be detected moves to the position right below the third camera, the height of a third group of strip light sources (only strip light sources) is directly adjusted to 160mm, the strip light sources are positioned right above the product to be detected and right below the third camera, the strip light sources are used for lighting, the position of the third camera is rotated, the glass product to be detected is imaged, an image with the maximum strip light spot width is found out, as shown in fig. 4, the camera rotation angle corresponding to the image is recorded, and the maximum length L in the formed image is obtained through calculation of image processing software3maxAnd the width W of the strip-shaped light spot3
If W is1+ W2+ W3Greater than L1max、L2maxAnd L3maxAnd if any of the detection results are detected, the positions of all the imaging devices are adjusted according to the conditions, and then black characteristics such as black blocks, flower shapes, linear shapes and the like appear in light spots in the product image.
The above-mentioned embodiments are merely illustrative of the technical idea and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the scope of the present invention, and all equivalent changes or modifications made according to the spirit of the present invention should be covered in the scope of the present invention.

Claims (6)

1, A method for detecting defects of mirror bowl products, comprising the steps of:
(1) placing a mirror bowl-shaped structure product to be detected on a bearing table, and adjusting the positions of all cameras, wherein the cameras comprise th cameras, second cameras and third cameras, the th camera corresponds to the th group of strip light sources, the second camera corresponds to the second group of strip light sources, the third camera corresponds to the third group of strip light sources, the th group of strip light sources and the second group of strip light sources are provided with two strip light sources, the third group of strip light sources are strip light sources, and the cameras are ensured to be positioned right above the middle part of the product to be detected;
(2) each group of strip-shaped light sources is used for polishing in a time-sharing manner, and the corresponding cameras are used for imaging the product to be detected in sequence to obtain imaging results positioned at different positions on the surface of the product to be detected;
(3) and (3) adjusting the height of each group of strip-shaped light sources, continuously observing the imaging result of the product to be detected in the step (2) in the height adjusting process until the strip-shaped light spot effect is presented, adjusting the position of each group of strip-shaped light sources in the horizontal direction, performing width and length calculation on the strip-shaped light spot image imaged by the product to be detected in the adjusting process, ensuring that the sum of the widths of all the strip-shaped light spot images is greater than the maximum length of the strip-shaped light spot image, and finally observing whether black features exist in all the strip-shaped light spot images or not, and if the black features exist, judging.
2. The method for detecting the defects of the mirror surface bowl-shaped structure product according to claim 1, wherein strip-shaped light sources in the th group of strip-shaped light sources are arranged on the side of the th camera, the th camera images the product to be detected to obtain images of strip-shaped light spots on the edge of the product to be detected, and the th camera is provided with another symmetrical strip-shaped light sources on the other side to image the product to be detected again to obtain images of two strip-shaped light spots on the two side edges of the product to be detected respectively.
3. The method for detecting the defects of the mirror bowl-shaped product according to claim 1, wherein strip-shaped light sources in the second group of strip-shaped light sources are vertically arranged on the side of the second camera, the second camera images the product to be detected to obtain an image in which strip-shaped light spots are located in the middle portion of the product to be detected, and another strip-shaped light sources are symmetrically arranged on the other side of the second camera to image the product to be detected again to obtain images in which the two strip-shaped light spots are respectively close to the middle portion of the product to be detected.
4. The method for detecting the defects of the mirror surface bowl-shaped structure product according to claim 1, wherein bar light sources of the third group of bar light sources are fixed right above the middle part of the product to be detected, the bar light sources are used for lighting, the third camera is rotated, the product to be detected is imaged, the image with the maximum width of the bar light spot is found out, and the camera rotation angle corresponding to the image is recorded.
5. The method of claim 1, wherein the step of detecting the defects comprises: and (4) the height of each group of strip-shaped light sources in the step (3) is 160 mm.
6. The method of claim 1, wherein the step of detecting the defects comprises: the black features in the step (3) are specifically presented as black blocks, black flowers and black lines.
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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101261234A (en) * 2008-03-26 2008-09-10 广州中国科学院工业技术研究院 Surface flaw detection device
CN201170772Y (en) * 2008-03-26 2008-12-24 广州中国科学院工业技术研究院 Industry detection apparatus
CN205426804U (en) * 2015-11-05 2016-08-03 苏州威盛视信息科技有限公司 Surface detection device
WO2018075562A1 (en) * 2016-10-19 2018-04-26 The Regents Of The University Of California Imaging platform based on nonlinear optical microscopy for rapid scanning large areas of tissue
CN109142366A (en) * 2018-06-13 2019-01-04 广东拓斯达科技股份有限公司 Spherical housing defect inspection method, device and computer readable storage medium
KR101962072B1 (en) * 2018-08-14 2019-03-25 김정덕 Lens surface inspection device
CN110018167A (en) * 2019-04-04 2019-07-16 武汉精立电子技术有限公司 A kind of Curved screen open defect rapid detection method and system

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101261234A (en) * 2008-03-26 2008-09-10 广州中国科学院工业技术研究院 Surface flaw detection device
CN201170772Y (en) * 2008-03-26 2008-12-24 广州中国科学院工业技术研究院 Industry detection apparatus
CN205426804U (en) * 2015-11-05 2016-08-03 苏州威盛视信息科技有限公司 Surface detection device
WO2018075562A1 (en) * 2016-10-19 2018-04-26 The Regents Of The University Of California Imaging platform based on nonlinear optical microscopy for rapid scanning large areas of tissue
CN109142366A (en) * 2018-06-13 2019-01-04 广东拓斯达科技股份有限公司 Spherical housing defect inspection method, device and computer readable storage medium
KR101962072B1 (en) * 2018-08-14 2019-03-25 김정덕 Lens surface inspection device
CN110018167A (en) * 2019-04-04 2019-07-16 武汉精立电子技术有限公司 A kind of Curved screen open defect rapid detection method and system

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
A novel imaging-enhancement-based inspection method for transparent aesthetic defects in a polymeric polarizer;Yuanlong Deng等;《Polymer Testing》;20170525;第333-340页 *
高反射球面表面缺陷的条纹检测方法研究;宋宇航;《中国优秀硕士学位论文全文数据库》;20180515;全文 *

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