CN110568303A - Test system for LCM-Mesh line function detection - Google Patents
Test system for LCM-Mesh line function detection Download PDFInfo
- Publication number
- CN110568303A CN110568303A CN201910915062.8A CN201910915062A CN110568303A CN 110568303 A CN110568303 A CN 110568303A CN 201910915062 A CN201910915062 A CN 201910915062A CN 110568303 A CN110568303 A CN 110568303A
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- plate
- probe
- detection
- lcm
- guide pillar
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Links
- 238000001514 detection method Methods 0.000 title claims abstract description 50
- 238000012360 testing method Methods 0.000 title claims abstract description 17
- 239000000523 sample Substances 0.000 claims abstract description 76
- 238000007689 inspection Methods 0.000 abstract 1
- 239000013072 incoming material Substances 0.000 description 4
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention relates to the technical field of LCM-Mesh line detection, in particular to a test system for LCM-Mesh line function detection, which comprises a frame body, an operating mechanism and a detection mechanism, wherein the frame body comprises a bottom plate and a vertical plate, the vertical plate is vertically arranged on the bottom plate, the operating mechanism comprises a quick clamp, a guide pillar and a mounting plate, the quick clamp is arranged on the vertical plate, the guide pillar is vertically arranged on the bottom plate, the top end of the guide pillar is fixedly connected with the vertical plate, the mounting plate is provided with a sliding hole, the guide pillar is in sliding fit with the sliding hole, the operating end of the quick clamp is connected with the mounting plate, the mounting plate can slide up and down on the guide pillar by moving the quick clamp up and down, the detection mechanism comprises a probe plate, a detection probe, a PCB detection plate and a carrier plate, the carrier plate is arranged on the bottom plate, the, the PCB is arranged on the carrier plate corresponding to the detection probes in a matched mode, and quality inspection can be rapidly performed on the LCM line.
Description
Technical Field
The invention relates to the technical field of LCM-Mesh line detection, in particular to a test system for LCM-Mesh line function detection.
Background
The LCM incoming material quality is different due to different manufacturers, the LCM incoming material quality is different, functional effectiveness detection needs to be carried out on the LCM incoming material quality when the LCM incoming material quality is used, an LCM supplier cannot efficiently control open short circuit between LCM-Mesh circuits and short circuit test of the LCM-Mesh circuits and GND, a universal meter is used for testing at present, work efficiency is low, and cost is high.
Disclosure of Invention
The invention aims to provide a test system for LCM-Mesh line function detection, which aims to solve the problems of low efficiency and high cost of LCM-Mesh line function validity detection in the prior art.
In order to achieve the purpose, the invention provides the following technical scheme: a test system for LCM-Mesh line function detection comprises a frame body, an operating mechanism and a detection mechanism, wherein the frame body comprises a bottom plate and a vertical plate, the vertical plate is vertically arranged on the bottom plate, the operating mechanism comprises a quick clamp, a guide pillar and a mounting plate, the quick clamp is arranged on the vertical plate, the guide pillar is vertically arranged on the bottom plate, the top end of the guide pillar is fixedly connected with the vertical plate, a slide hole is formed in the mounting plate, the guide pillar is in sliding fit with the slide hole, the operating end of the quick clamp is connected with the mounting plate, the mounting plate can slide up and down on the guide pillar by performing up-and-down movement operation on the quick clamp, the detection mechanism comprises a probe plate, a detection probe, a PCB detection plate and a carrier plate, the carrier plate is arranged on the bottom plate, the probe plate is fixed on the mounting plate, the detection probe is arranged on,
The PCB board includes 4 probe openings, 4 LED lamps, 2 resistance, and the detection circuitry of 2 button switch combinations, 4 probe openings are probe opening one, probe opening two, probe opening three, probe opening four, 4 LED lamps are LED lamp one, LED lamp two, LED lamp three, LED lamp four, 2 resistance is resistance one, resistance two, 2 button switch is switch one, switch two, external +12V power inserts PCB board back series connection resistance one in proper order, LED lamp one, probe opening one, switch one, probe opening two, LED lamp three, probe opening three, switch two, probe opening four, ground connection behind the LED lamp four, series connection resistance two and LED lamp two between probe opening two and the earthing terminal on the PBC board, probe opening one, probe opening two, probe opening three and probe opening four correspond the matching with the detection probe.
Preferably, two guide posts are vertically arranged on the bottom plate, and two sliding holes are correspondingly arranged on the mounting plate.
Preferably, a linear bearing matched with the guide pillar is installed in the sliding hole.
Preferably, the top end of the guide post is provided with a supporting plate, and the guide post is fixedly connected with the vertical plate through the supporting plate.
Preferably, be provided with the FPC stopper on the carrier board, the FPC stopper corresponds the matching with detection probe department.
Preferably, a rib plate for fixing the vertical plate is arranged on the bottom plate.
Preferably, 4 foot seats are uniformly distributed at the bottom of the bottom plate.
Compared with the prior art, the invention has the beneficial effects that: the invention can solve the effective management and control of LCM-Mesh circuit function, improve the working efficiency of the testing section and completely solve the situation of misdetection.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of the present invention showing a structure where LCM lines are placed;
fig. 3 is a schematic diagram of the circuit of the PCB board of the present invention.
In the figure: 1. a base plate; 2. a vertical plate; 3. quickly clamping; 4. a guide post; 5. mounting a plate; 6. a probe card; 7. a PCB detection board; 8. a carrier plate; 9. a linear bearing; 10. a support plate; 11. a rib plate; 12. a foot seat; 13. a limiting block; 14. a first probe port; 15. a second probe port; 16. a probe port III; 17. a probe port four; 18. an LED lamp I; 19. a second LED lamp; 20. a third LED lamp; 21. a fourth LED lamp; 22. a first resistor; 23. a second resistor; 24. a first switch; 25. and a second switch.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. … …, the present invention provides a technical solution: a test system for LCM-Mesh line function detection comprises a frame body, an operating mechanism and a detection mechanism, the frame body comprises a bottom plate and a vertical plate, the vertical plate is vertically arranged on the bottom plate, the operating mechanism comprises a quick clamp (the quick clamp is a 305CM quick clamp), a guide post and a mounting plate, the quick clamp is arranged on the vertical plate, the guide post is vertically arranged on the bottom plate, the top end of the guide post is fixedly connected with the vertical plate, the mounting plate is provided with a sliding hole, the guide post is in sliding fit with the sliding hole, the operating end of the quick clamp is connected with the mounting plate, the mounting plate can slide up and down on the guide post by moving the quick clamp up and down, the detection mechanism comprises a probe plate, detection probes, a PCB detection plate and a carrier plate, wherein the carrier plate is arranged on the bottom plate, the probe plate is fixed on the mounting plate, the detection probes are arranged on the probe plate, and the PCB is arranged on the carrier plate and is matched with the detection probes.
The PCB board includes 4 probe openings, 4 LED lamps, 2 resistance, and the detection circuitry of 2 button switch combinations, 4 probe openings are probe opening one, probe opening two, probe opening three, probe opening four, 4 LED lamps are LED lamp one, LED lamp two, LED lamp three, LED lamp four, 2 resistance is resistance one, resistance two, 2 button switch is switch one, switch two, external +12V power inserts PCB board back series connection resistance one in proper order, LED lamp one, probe opening one, switch one, probe opening two, LED lamp three, probe opening three, switch two, probe opening four, ground connection behind the LED lamp four, series connection resistance two and LED lamp two between probe opening two and the earthing terminal on the PBC board, probe opening one, probe opening two, probe opening three and probe opening four correspond the matching with the detection probe.
two guide posts are vertically arranged on the bottom plate, and two sliding holes are correspondingly arranged on the mounting plate.
And a linear bearing (the linear bearing is an LMU8 linear bearing) matched with the guide pillar is arranged in the sliding hole.
The top end of the guide pillar is provided with a supporting plate, and the guide pillar is fixedly connected with the vertical plate through the supporting plate.
The carrier plate is provided with an FPC limiting block, and the FPC limiting block is correspondingly matched with the detection probe.
And a rib plate for fixing the vertical plate is arranged on the bottom plate.
The bottom of bottom plate evenly distributed has 4 footstands.
through this technical scheme, through placing the LCM line on the carrier board, and the FPC end of LCM line is placed in the stopper, then through controlling quick clamp, make the mounting panel move down, drive the FPC end contact cooperation of detection probe and LCM line with the probe card, make the FPC end of LCM line be connected with 4 probe mouths on the PCB board, then through operating switch one and switch two, make the LED lamp light or extinguish, be used for detecting the quality of LCM line qualified.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. A test system for LCM-Mesh line function detection is characterized in that: the detection device comprises a frame body, an operating mechanism and a detection mechanism, wherein the frame body comprises a bottom plate and a vertical plate, the vertical plate is vertically arranged on the bottom plate, the operating mechanism comprises a quick clamp, a guide pillar and a mounting plate, the quick clamp is arranged on the vertical plate, the guide pillar is vertically arranged on the bottom plate, the top end of the guide pillar is fixedly connected with the vertical plate, a slide hole is arranged on the mounting plate, the guide pillar is in slide fit with the slide hole, the operating end of the quick clamp is connected with the mounting plate, the mounting plate can slide up and down on the guide pillar by moving the quick clamp up and down, the detection mechanism comprises a probe plate, a detection probe, a PCB and a carrier plate, the carrier plate is arranged on the bottom plate, the probe plate is fixed on the mounting plate, the detection probe is arranged on,
The PCB board includes 4 probe openings, 4 LED lamps, 2 resistance, and the detection circuitry of 2 button switch combinations, 4 probe openings are probe opening one, probe opening two, probe opening three, probe opening four, 4 LED lamps are LED lamp one, LED lamp two, LED lamp three, LED lamp four, 2 resistance is resistance one, resistance two, 2 button switch is switch one, switch two, external +12V power inserts PCB board back series connection resistance one in proper order, LED lamp one, probe opening one, switch one, probe opening two, LED lamp three, probe opening three, switch two, probe opening four, ground connection behind the LED lamp four, series connection resistance two and LED lamp two between probe opening two and the earthing terminal on the PBC board, probe opening one, probe opening two, probe opening three and probe opening four correspond the matching with the detection probe.
2. The test system for LCM-Mesh line function detection as claimed in claim 1, wherein: two guide posts are vertically arranged on the bottom plate, and two sliding holes are correspondingly arranged on the mounting plate.
3. The test system for LCM-Mesh line function detection as claimed in claim 2, wherein: and a linear bearing matched with the guide pillar is arranged in the sliding hole.
4. The test system for LCM-Mesh line function detection as claimed in claim 1, wherein: the top end of the guide pillar is provided with a supporting plate, and the guide pillar is fixedly connected with the vertical plate through the supporting plate.
5. The test system for LCM-Mesh line function detection as claimed in claim 1, wherein: the carrier plate is provided with an FPC limiting block, and the FPC limiting block is correspondingly matched with the detection probe.
6. The test system for LCM-Mesh line function detection as claimed in claim 1, wherein: and a rib plate for fixing the vertical plate is arranged on the bottom plate.
7. The test system for LCM-Mesh line function detection as claimed in claim 1, wherein: the bottom of bottom plate evenly distributed has 4 footstands.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910915062.8A CN110568303A (en) | 2019-09-26 | 2019-09-26 | Test system for LCM-Mesh line function detection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910915062.8A CN110568303A (en) | 2019-09-26 | 2019-09-26 | Test system for LCM-Mesh line function detection |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110568303A true CN110568303A (en) | 2019-12-13 |
Family
ID=68782376
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910915062.8A Pending CN110568303A (en) | 2019-09-26 | 2019-09-26 | Test system for LCM-Mesh line function detection |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110568303A (en) |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001153911A (en) * | 1999-11-29 | 2001-06-08 | Yokogawa Precision Kk | Method and apparatus for inspecting wiring pattern |
| CN202330608U (en) * | 2011-11-16 | 2012-07-11 | 东莞市润华光电有限公司 | Short circuit detector for big sheets of indium tin oxide (ITO) glass |
| US20130038343A1 (en) * | 2011-08-09 | 2013-02-14 | Hon Hai Precision Industry Co., Ltd. | Test circuit for testing short-circuit |
| CN204044279U (en) * | 2014-08-21 | 2014-12-24 | 宁波赛特信息科技发展有限公司 | A kind of flex circuit application on off test device |
| CN204807596U (en) * | 2015-07-29 | 2015-11-25 | 昆山建杰欣治具有限公司 | Inferior gram force switching test fixture |
| CN105606992A (en) * | 2016-02-02 | 2016-05-25 | 京东方科技集团股份有限公司 | LCM circuit detection apparatus and method for detecting LCM circuit |
| CN206321737U (en) * | 2016-11-25 | 2017-07-11 | 帝晶光电（深圳）有限公司 | A kind of detection tool for capacitance plate For POS Mesh lines |
| CN108919033A (en) * | 2018-07-26 | 2018-11-30 | 深圳市宇顺电子股份有限公司 | A kind of Mesh wire testing method and test circuit |
| CN109541367A (en) * | 2018-11-06 | 2019-03-29 | 广州市轻工高级技工学校 | A kind of socket secure specification diagnostic device |
| CN211014595U (en) * | 2019-09-26 | 2020-07-14 | 杭州凡诺电子有限公司 | Test system for L CM-Mesh line function detection |
-
2019
- 2019-09-26 CN CN201910915062.8A patent/CN110568303A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001153911A (en) * | 1999-11-29 | 2001-06-08 | Yokogawa Precision Kk | Method and apparatus for inspecting wiring pattern |
| US20130038343A1 (en) * | 2011-08-09 | 2013-02-14 | Hon Hai Precision Industry Co., Ltd. | Test circuit for testing short-circuit |
| CN202330608U (en) * | 2011-11-16 | 2012-07-11 | 东莞市润华光电有限公司 | Short circuit detector for big sheets of indium tin oxide (ITO) glass |
| CN204044279U (en) * | 2014-08-21 | 2014-12-24 | 宁波赛特信息科技发展有限公司 | A kind of flex circuit application on off test device |
| CN204807596U (en) * | 2015-07-29 | 2015-11-25 | 昆山建杰欣治具有限公司 | Inferior gram force switching test fixture |
| CN105606992A (en) * | 2016-02-02 | 2016-05-25 | 京东方科技集团股份有限公司 | LCM circuit detection apparatus and method for detecting LCM circuit |
| CN206321737U (en) * | 2016-11-25 | 2017-07-11 | 帝晶光电（深圳）有限公司 | A kind of detection tool for capacitance plate For POS Mesh lines |
| CN108919033A (en) * | 2018-07-26 | 2018-11-30 | 深圳市宇顺电子股份有限公司 | A kind of Mesh wire testing method and test circuit |
| CN109541367A (en) * | 2018-11-06 | 2019-03-29 | 广州市轻工高级技工学校 | A kind of socket secure specification diagnostic device |
| CN211014595U (en) * | 2019-09-26 | 2020-07-14 | 杭州凡诺电子有限公司 | Test system for L CM-Mesh line function detection |
Non-Patent Citations (1)
| Title |
|---|
| 许泽宇 等: "《 基于移位寄存器的 LCM模组开路短路测试方法》", 《现代显示》, 31 May 2010 (2010-05-31), pages 1 - 4 * |
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