CN110568285A

CN110568285A - waveform testing machine

Info

Publication number: CN110568285A
Application number: CN201910850495.XA
Authority: CN
Inventors: 胡凤鸣; 黄向阳; 王海红; 梁海伟
Original assignee: Suzhou Minghuo Intelligent Equipment Co Ltd
Current assignee: Suzhou Minghuo Intelligent Equipment Co Ltd
Priority date: 2019-09-10
Filing date: 2019-09-10
Publication date: 2019-12-13

Abstract

The invention discloses a waveform testing machine, which comprises a feeding device, a material conveying device, a base, a testing disc device and a probe device, wherein the feeding device is arranged on the base; the conveying device is positioned below the feeding device; the testing disc device comprises a rotating disc and a screening platform which are both arranged on a base, wherein a plurality of material grooves are formed in the edge of the rotating disc along the circumference, the screening platform is embedded in the base, and air blowing holes communicated with an external air source are formed in the screening platform and are communicated with the inner sides of the material grooves; the probe device comprises an insulation test platform arranged on the base and a probe capable of lifting, the top surface of the insulation test platform is consistent with the bottom surface of the rotating disc in height, a test hole is formed in the insulation test platform, and the probe is located in the test hole and located below the trough. The automatic component feeding and screening device can automatically complete feeding, testing and screening of components, can perform processes before and after seamless butt joint, and is high in automation degree and efficiency, simple in structure and excellent in production quality.

Description

Waveform testing machine

Technical Field

The invention relates to a testing machine, in particular to a waveform testing machine.

Background

During or after the production of the device, the device is usually subjected to electrical waveform testing. Waveform testing is done as a separate process using separate equipment. When testing the components, the components are generally arranged on a platform, and then the probes are sequentially moved across each component and each component is tested. This process requires a fast moving probe and its accompanying large number of mechanisms, which limits the speed of testing and is inefficient. In addition, the equipment has a complex structure and a plurality of movement processes, and the front and rear processes cannot be in seamless butt joint. The number of components produced is large each day, and these additional steps further reduce production efficiency.

Disclosure of Invention

The invention aims to provide a waveform testing machine which can automatically complete the feeding, testing and screening of components, can perform the processes before and after seamless butt joint, and has the advantages of high automation degree and efficiency, simple structure and excellent production quality.

In order to solve the technical problem, the invention provides a waveform testing machine, which comprises a feeding device for feeding components in batches, a material conveying device capable of enabling the bottom surfaces of the components to face to be uniform, a base, a testing disc device for conveying and positioning the components and a probe device for waveform testing; the conveying device is positioned below the feeding device; the testing disc device comprises a rotating disc and a screening platform which are both arranged on a base, wherein a plurality of material grooves capable of being in butt joint with a material outlet of the material conveying device are formed in the edge of the rotating disc along the circumference, the screening platform is embedded on the base, the top surface of the screening platform and the bottom surface of the rotating disc are located at the same height, air blowing holes communicated with an external air source are formed in the screening platform, and the air blowing holes are communicated and arranged on the inner side of the material grooves; the probe device comprises an insulation test platform arranged on the base and a probe capable of lifting, the top surface of the insulation test platform is consistent with the bottom surface of the rotating disc in height, a test hole is formed in the insulation test platform, and the probe is located in the test hole and located below the trough.

Preferably, the screening platform is provided with a discharging guide groove, and the discharging guide groove is positioned at the opening side of the trough.

Preferably, the screening platform is provided with a discharge pipe, and the discharge pipe and the air blowing holes are respectively positioned on two sides of the discharge guide groove.

Preferably, the screening platform and the base are respectively provided with a correlation sensor, and light paths of the two correlation sensors are mutually connected.

Preferably, the feeding device comprises a feeding support, a funnel, a vibrator and an inclined guide chute, the funnel and the vibrator are both arranged on the feeding support, the guide chute is arranged on the vibrator, the end part of the guide chute at a high position is positioned below the funnel, and the end part of the guide chute at a low position is positioned above the material conveying device.

preferably, a mesh screen is arranged on the bottom wall of the material guide groove, and the mesh screen is positioned at the end part of the material guide groove at the low position.

preferably, the bottom of the guide chute is provided with a support strip, a collection box is slidably clamped in the support strip, and the collection box is positioned below the mesh screen.

Preferably, a shaking head is hinged at the discharge port of the guide chute.

Preferably, the test disc device comprises a test disc; the test disc comprises a limiting disc, a covering disc and a rotating disc which can rotate automatically, wherein the limiting disc, the covering disc and the rotating disc are all arranged on the base; the edge of the rotating disc is close to a discharge hole of the material conveying device, a plurality of material grooves are formed in the rotating disc from the edge inwards in the circumferential direction of the rotating disc, a plurality of gas grooves are formed in the bottom of the rotating disc, each gas groove is communicated with one material groove, and the communication port is located in the side wall of the material groove close to the circle center of the rotating disc; spacing dish all is the ring form with hiding the dish, the inseparable border that surrounds at the rolling disc of spacing dish, set up the bin outlet that can communicate with the silo concatenation on the spacing dish, it hides the top that the dish covers at the silo to hide, spacing dish all sets up the opening with hiding the dish in defeated silo place department.

Preferably, the probe apparatus includes a support, a driving unit, a testing unit, and a stage unit; the driving unit comprises a test driving source and a lifting block which are arranged on the bracket, and the lifting block is connected with the free end of the test driving source; the test unit comprises a test support arranged on the lifting block, a vertical plate is arranged on the test support, two insulating plates are arranged on the vertical plate in a sliding mode and are arranged side by side, an elastic piece is arranged between each insulating plate and the test support, and the probes are arranged at the top ends of the insulating plates; the platform unit comprises a platform support arranged on the support, the insulation test platform is arranged on the platform support, test holes are formed in the insulation test platform, and the two probes are respectively inserted into one test hole.

Compared with the prior art, the invention has the beneficial effects that:

1. The test disc device is arranged, so that components can be conveyed annularly, a good positioning effect is achieved in the conveying process, waveform testing is greatly facilitated, operation steps are saved, and the occupied space is small.

2. By arranging the screening platform, the invention can automatically screen and discharge components with different qualities, so that the components entering the subsequent process have excellent quality, and the product quality is ensured.

3. According to the invention, the probe device is arranged at the bottom of the test disc device, so that the waveform test of the component can be completed when the component passes through, and the probe is only required to be lifted in the test process without moving a complicated device, so that the test efficiency is greatly improved, the equipment complexity is reduced, and the cost is saved.

4. The automatic component feeding and screening device can automatically complete feeding, testing and screening of components, is high in automation degree and efficiency, can realize seamless butt joint with front and rear processes, and greatly improves production efficiency.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments of the present invention will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to be able to obtain other drawings based on these drawings without creative efforts.

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is a schematic structural view of a test tray apparatus;

FIG. 3 is an exploded view of a test tray;

FIG. 4 is a schematic bottom view of a test tray;

FIG. 5 is a schematic bottom view of the push-down guide unit;

FIG. 6 is a schematic structural diagram of a screening unit;

FIG. 7 is a first schematic structural diagram of a probe apparatus;

FIG. 8 is an enlarged view of portion A;

FIG. 9 is a second schematic structural view of the probe apparatus;

fig. 10 is a schematic cross-sectional view of a probe device.

Wherein, 100-base, 101-conveying trough, 102-vibration screening conveying tray;

2-test disc device, 200-rotary drive source, 210-rotary disc, 211-material groove, 212-air groove, 213-guide surface, 220-limit disc, 221-discharge port, 230-cover disc, 231-detection hole, 240-heavy shaft, 241-pressure rod, 242-pressure head, 243-guide groove, 244-sensor bracket, 245-induction sheet, 246-stop sensor, 250-screening platform, 251-air hole, 252-air pipe, 253-discharge guide groove, 254-discharge pipe and 255-correlation sensor;

3-probe device, 300-bracket, 310-driving source bracket, 311-bearing plate, 312-testing driving source, 313-polished rod, 314-lifting block, 315-counting sensor, 320-fine adjustment sliding cavity, 321-rotating shaft, 322-eccentric wheel, 323-fine adjustment sliding block, 324-eccentric groove, 325-fine adjustment head, 330-coarse adjustment sliding cavity, 331-coarse adjustment fixed block, 332-coarse adjustment bolt, 340-testing bracket, 341-vertical plate, 342-testing slide rail, 343-insulating plate, 344-testing plate, 345-probe, 346-elastic piece, 350-spacing groove, 351-spacing hook, 360-platform bracket, 361-insulating testing platform and 362-testing hole;

400-feeding support, 401-vibrator, 402-guide chute, 403-mesh screen, 404-supporting strip, 405-collecting box, 406-shaking head, 407-funnel.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without any inventive step, are within the scope of the present invention.

Examples

Referring to fig. 1, the invention discloses a waveform testing machine, which comprises a feeding device, a material conveying device, a base 100, a testing disc device 2 and a probe device 3.

the feeding device comprises a feeding bracket 400, a vibrator 401, a material guide groove 402, a mesh screen 403, a supporting strip 404, a collecting box 405 and a shaking head 406.

The vibrator 401 and the funnel 407 are provided on the stand 400. The vibrator 401 is provided with an inclined guide chute 402. The end of the chute 402 at the high level is located below the hopper 407. The material guide chute 402 can guide the components in the hopper 407 in a specific direction.

The mesh screen 403 is disposed on the bottom wall of the material guide chute 402 and is located at the end of the material guide chute 402 at the low position. The mesh screen 403 is capable of screening dust and debris as the components pass.

The supporting strip 404 is disposed at the bottom of the material guiding chute 402 and perpendicular to the conveying direction of the material guiding chute 402. The collection box 405 is slidably engaged within the carrier strip 404. A collection box 405 is located below the mesh 403. The collection box 405 can collect dust and crushed aggregates falling from the mesh screen 403, and when the collection box is full, the dust and crushed aggregates can be directly drawn out from the supporting strip 404, so that the collection box is convenient to replace.

The rocking head 406 is hinged at the discharge opening of the chute 402. The shaking head 406 can be rotated to adjust the discharge position.

The material conveying device comprises a material conveying groove 101 and a vibration screening material conveying disc 102. The vibratory screening feed tray 102 is disposed below the agitation head 406. Two ends of the material conveying groove 101 are respectively erected on the vibration screening material conveying disc 102 and the base 100. The vibration screening and conveying tray 102 can convey the components to the conveying chute 101 with the uniform bottom face downward. The feed chute 101 can feed components.

Referring to fig. 2 to 6, the test disc apparatus 2 includes a rotary drive source 200, a test disc, a push-down guide unit, and a sorting unit.

The rotary drive source 200 is provided on the base 100.

The test tray includes a rotating tray 210, a stopping tray 220, and a covering tray 230.

The rotary disk 210 is horizontally disposed at a free end of the rotary drive source 200. The edge of the rotary disk 210 is adjacent to the discharge port of the feed chute 101. A notch-shaped trough 211 is formed at the edge of the rotating disc 210. The trough 211 extends inward from the circumferential surface of the rotating disk 210. A plurality of pockets 211 are equidistantly spaced around the periphery of the rotating disk 210. The rotary driving source 200 can drive the rotary disc 210 to rotate, when a certain trough 211 reaches the discharge hole of the material conveying trough 101, the component enters the trough 211 and rotates along with the rotary disc 210 to realize material conveying; after the components enter the material groove 211, the components are separated one by one, the position is controllable, subsequent testing is facilitated, and the working efficiency is high.

A plurality of air grooves 212 are formed at the bottom of the rotary plate 210. Each air groove 212 is communicated with one material groove 211, and the communication port is positioned on the side wall of the material groove 211 close to the circle center side of the rotating disc 210. The gas tank 212 is in communication with an external gas source. The air groove 212 can spray air to the material groove 211 communicated with the air groove, so that components in the material groove 211 are sprayed from inside to outside, and defective material screening is achieved.

As a further improvement of the present invention, a guide surface 213 spreading outward is provided at the junction between the trough 211 and the circumferential surface of the rotating disk 210. The guide surface 213 can improve the success rate of the components entering the pockets 211.

The limiting plate 220 is disposed on the base 100. The limiting disc 220 is circular. The limiting disc 220 tightly surrounds the circumference of the rotating disc 210, and a notch is formed at the position of the material conveying groove 101. The limiting disc 220 can limit the horizontal position of components in the trough 211, and the components in the trough 211 are prevented from being separated from the trough 211 under the action of centrifugal force when the rotating disc 210 rotates. The limiting disc 200 is provided with a discharge opening 221 which can be spliced and communicated with the trough 211. The discharge opening 221 can discharge the discharged component or defective material to be subjected to the next process.

the cover plate 230 is disposed on the base 100. The cover disk 230 has a circular ring shape. The covering disc 230 covers the trough 211, and a notch is arranged at the position of the feed chute 101. The bottle cap tray 230 can limit the vertical position of the components in the trough 211, prevent the components from being upwards collapsed out of the trough 211, and ensure the continuity, stability and reliability of the operation. The cover plate 230 is formed with a detecting hole 231. The detecting hole 231 is used for detecting whether the material is in the material tank 211 or performing an appearance test on the material.

The press-down pilot unit includes a heavy shaft 240, a press rod 241, and a press head 242. The heavy shaft 240 is rotatably disposed on the base 100 with its central axis horizontal. A press lever 241 is provided at an end of the heavy shaft 240. A ram 242 is provided at the free end of the strut 241. The bottom of the ram 242 is provided with a guide groove 243. The guide groove 243 is positioned above the discharge port of the material conveying groove 101 and the material groove 211. The guide groove 243 can be pressed above the component, so that the component can accurately enter the material groove 211 in both the horizontal direction and the vertical direction, and the entering success rate is guaranteed; meanwhile, when the material is clamped below the guide groove 243, the material can be cleaned only by lifting the pressure head 242, so that the operation is convenient; the heavy shaft 240 has a larger inertia, reducing the ripple of the ram 242.

As a further improvement of the present invention, the ram 242 is provided with a sensor holder 244. The sensor holder 244 is used for mounting a sensor to detect whether the material groove 211 below the guiding groove 243 enters the component.

In a further improvement of the present invention, the other end of the heavy shaft 240 opposite to the end of the pressing rod 241 is provided with a sensing piece 245. The base 100 is provided with a stop sensor 246 engaged with the sensing piece 245. When material is jammed under the guide slot 243, the ram 242 can be raised for cleaning while the stop sensor 246 can signal to stop the device.

The screening unit comprises a screening platform 250, an air blowing hole 251, an air pipe 252, a discharging guide groove 253, a discharging pipe 254 and a correlation sensor 255.

the screening platform 250 is embedded in the base 100. The top surface of the screening deck 250 and the bottom surface of the rotary disk 210 are located at the same height. Screening platform 250 can be held below chute 211.

the air blowing holes 251 are formed on the upper surface of the screening table 250 and are located below the air grooves 212. An air tube 252 is disposed through the screening platform 250. The air pipe 252 is communicated with the air blowing hole 251. The air tube 252 is in communication with an external air source. The air blowing holes 251 can blow air, and the air flow is sprayed out from the material groove 211 through the air groove 212, so that the screening of the components is realized.

The discharge guide groove 253 is formed on the sieving platform 250. Discharge guide channel 253 is located below discharge opening 221. The discharging guide groove 253 guides the discharged components, so that the components are convenient to collect.

the discharging pipe 254 is disposed on the screening platform 250, and the discharging pipe and the blowing hole 251 are disposed at both sides of the discharging guide groove 253, respectively. The discharge pipe 254 is capable of collecting the discharged components.

the correlation sensors 255 are respectively provided on the screening platform 250 and the capping plate 230. The light path of the correlation sensor 255 is interfaced through the detection aperture 231. The correlation sensor 255 can detect whether the material is in the trough 211.

Referring to fig. 7 to 10, the probe apparatus 3 includes a holder 300, a driving unit, a fine adjustment unit, a coarse adjustment unit, a test unit, a limit unit, and a stage unit. The bracket 300 is disposed at the bottom of the base 100.

The driving unit includes a driving source bracket 310, a support plate 311, a test driving source 312, a polish rod 313, and a lifting block 314.

The driving source bracket 310 is provided on the bracket 300. A support plate 311 is provided at the bottom of the drive source bracket 310. The test drive source 312 is fixed to the support plate 311. The polish rod 313 is disposed on the driving source bracket 310. The lifting block 314 is slidably disposed on the polished rod 313. The elevator 314 is connected to the free end of the test drive source 312. The test driving source 312 can drive the lifting block 314 to lift so that the probe 345 can perform a lifting test.

As a further improvement of the present invention, the driving source bracket 310 is provided with a counting sensor 315 adjacent to the elevating block 314. The counting sensor 315 can detect the number of times the lifting block 314 is lifted.

The coarse adjustment unit includes a coarse adjustment slide chamber 330, a coarse adjustment fixing block 331 and a coarse adjustment bolt 332.

The coarse slide chamber 330 is opened at the bottom of the support 300. The support plate 311 is slidably disposed within the coarse slide chamber 330. The coarse adjustment fixing block 331 is fixed to the bracket 300. The coarse adjustment bolt 332 is inserted into the supporting plate 311 and the coarse adjustment fixing block 331. By screwing the coarse adjustment bolt 332, the height of the support plate 311 can be adjusted, and thus the initial height of the probe 345 can be adjusted coarsely.

The fine adjustment unit includes a fine adjustment sliding chamber 320, a rotation shaft 321, an eccentric 322, a fine adjustment slider 323, and an eccentric groove 324.

The fine slide chamber 320 is formed in the elevator block 314. The shaft 321 is rotatably disposed on the lifting block 314 and passes through the fine tuning sliding cavity 320. The eccentric 322 is disposed on the rotating shaft 321. The central axes of the eccentric 322 and the rotating shaft 321 are parallel but not coincident. The fine slide 323 is slidably disposed within the fine slide chamber 320 and is coupled to the free end of the test drive source 312. An eccentric groove 324 is opened on the vernier slider 323. The eccentric 322 is located within the eccentric slot 324. By rotating the rotating shaft 321, the initial position of the lifting block 314 can be finely adjusted, so as to achieve fine adjustment of the probe 345.

As a further improvement of the present invention, a fine adjustment head 325 having an inner hexagonal shape is provided at an end of the rotation shaft 321. The fine adjustment head 325 can facilitate insertion and fine adjustment of the tool.

The test unit includes a test support 340, a vertical plate 341, a test rail 342, an insulating plate 343, a test board 344, a probe 345, and an elastic member 346.

the test support 340 is disposed on the elevator block 314. The riser 341 is disposed on the test stand 340. Two test slide rails 342 are arranged on the vertical plate 341 side by side along the direction of the polish rod 313. The two insulating plates 343 are respectively disposed on one test slide 342. The elastic member 346 is disposed between the insulating plate 343 and the test fixture 340. The test board 344 is disposed on top of the insulating board 343. The probes 345 are disposed on top of the test plate 344. The probe 345 can be driven by the lifting block 314 to be lifted quickly to realize testing; the elastic member 346 can ensure that the probe 345 has a buffer when contacting the component to control the needle pressure and ensure the test accuracy.

the above-mentioned spacing unit includes spacing groove 350 and spacing hook 351.

the limiting groove 350 is formed on the insulating plate 343. Spacing hook 351 sets up on the test support. The limit hook 351 is hooked in the limit groove 350. The width of the spacing groove 350 is greater than the width of the spacing hook 351. The initial position and the maximum moving position of the insulating plate 343 can be determined, so that the insulating plate 343 is more controllable in motion, and the testing accuracy is further improved.

The platform unit includes a platform holder 360, an insulation test platform 361, and a test hole 362.

The platform bracket 360 is disposed on the bracket 300. The insulation test platform 361 is clamped on the platform support 360. The top surface of the insulation test platform 361 and the bottom surface of the rotary disk 210 have the same height. The insulation test platform 361 is located below the trough 211. The test holes 362 have two, which are opened on the insulation test platform 361. Two probes 345 are located in one of the test holes 362. When the device is temporarily stopped on the insulation test platform 361, the probe 345 can quickly contact the pole piece of the device to complete the test. When the insulation test platform 361 can be prevented from being electrified, the probe 345 and the component are conducted with the device, and damage is avoided.

As a further improvement of the present invention, the insulating test platform 361 and the insulating plate 343 are ceramic plates.

The working principle is as follows:

Pouring the components into a hopper 407, and leaking the components in the hopper 407 onto the material guide groove 402; the vibrator 401 vibrates to make the components slide down rapidly, and finally fall onto the vibration screening material conveying disc 102, so that the components can be screened when passing through the mesh screen 403.

The vibratory screening and conveying tray 102 conveys the bottom surfaces of the components uniformly downward into the conveying chute 101.

The material conveying groove 101 continuously conveys materials; the rotary driving source 200 drives the rotary disc 210 to rotate, and when the material groove 211 is spliced with the material conveying groove 101, the components enter the material groove 211; then, the trough 211 drives the component to be transported, and when the component reaches a test position, the probe penetrates through the base 100 from the bottom of the base 100 and pricks on the component to be tested; meanwhile, the next material groove 211 rotates to the position of the material conveying groove 101; thus circulating.

the test driving source 312 drives the lifting block 314 to reciprocate; when the probe 345 rises, the test hole 362 is exposed and contacts with the component staying in the trough 211 above the probe to complete the test; when the probe 345 descends, the probe is collected into the testing hole 362, and at the moment, the components on the insulation testing platform 361 are replaced; according to the above cycle.

The tested components are separated through the screening unit.

The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A waveform testing machine is characterized by comprising a feeding device for feeding components in batches, a material conveying device capable of enabling the bottom surfaces of the components to face to be uniform, a base, a testing disc device for conveying and positioning the components and a probe device for waveform testing;

The conveying device is positioned below the feeding device;

The testing disc device comprises a rotating disc and a screening platform which are both arranged on a base, wherein a plurality of material grooves capable of being in butt joint with a material outlet of the material conveying device are formed in the edge of the rotating disc along the circumference, the screening platform is embedded on the base, the top surface of the screening platform and the bottom surface of the rotating disc are located at the same height, air blowing holes communicated with an external air source are formed in the screening platform, and the air blowing holes are communicated and arranged on the inner side of the material grooves;

The probe device comprises an insulation test platform arranged on the base and a probe capable of lifting, the top surface of the insulation test platform is consistent with the bottom surface of the rotating disc in height, a test hole is formed in the insulation test platform, and the probe is located in the test hole and located below the trough.

2. The waveform testing machine as set forth in claim 1, wherein the screening platform is provided with a discharge guide slot, and the discharge guide slot is located at an opening side of the trough.

3. The waveform testing machine as claimed in claim 2, wherein a discharge pipe is provided on said screening table, and said discharge pipe and said blow hole are respectively located on both sides of said discharge guide groove.

4. the waveform testing machine as set forth in claim 1, wherein the screening platform and the base are respectively provided with correlation sensors, and optical paths of the two correlation sensors are mutually connected.

5. The waveform testing machine as set forth in claim 1, wherein the loading device includes a loading frame, a hopper, a vibrator, and an inclined chute, the hopper and the vibrator being disposed on the loading frame, the chute being disposed on the vibrator, the chute having an upper end portion disposed below the hopper and a lower end portion disposed above the feeding device.

6. The wave form testing machine as set forth in claim 5, wherein a mesh screen is provided on the bottom wall of the chute, the mesh screen being located at the end of the chute that is in the lowered position.

7. The wave form testing machine as claimed in claim 6, wherein a support strip is arranged at the bottom of the guide chute, a collection box is slidably clamped in the support strip, and the collection box is positioned below the mesh screen.

8. The wave form testing machine as claimed in claim 5, wherein a rocking head is hinged at the discharge opening of the material guiding chute.

9. The waveform testing machine of claim 1, wherein the test disk device includes a test disk; the test disc comprises a limiting disc, a covering disc and a rotating disc which can rotate automatically, wherein the limiting disc, the covering disc and the rotating disc are all arranged on the base; the edge of the rotating disc is close to a discharge hole of the material conveying device, a plurality of material grooves are formed in the rotating disc from the edge inwards in the circumferential direction of the rotating disc, a plurality of gas grooves are formed in the bottom of the rotating disc, each gas groove is communicated with one material groove, and the communication port is located in the side wall of the material groove close to the circle center of the rotating disc; spacing dish all is the ring form with hiding the dish, the inseparable border that surrounds at the rolling disc of spacing dish, set up the bin outlet that can communicate with the silo concatenation on the spacing dish, it hides the top that the dish covers at the silo to hide, spacing dish all sets up the opening with hiding the dish in defeated silo place department.

10. The waveform testing machine as set forth in claim 1, wherein the probe device includes a holder, a driving unit, a test unit, and a stage unit; the driving unit comprises a test driving source and a lifting block which are arranged on the bracket, and the lifting block is connected with the free end of the test driving source; the test unit comprises a test support arranged on the lifting block, a vertical plate is arranged on the test support, two insulating plates are arranged on the vertical plate in a sliding mode and are arranged side by side, an elastic piece is arranged between each insulating plate and the test support, and the probes are arranged at the top ends of the insulating plates; the platform unit comprises a platform support arranged on the support, the insulation test platform is arranged on the platform support, test holes are formed in the insulation test platform, and the two probes are respectively inserted into one test hole.