CN110514937A - A kind of non-solder type device detection compoboard - Google Patents

A kind of non-solder type device detection compoboard Download PDF

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Publication number
CN110514937A
CN110514937A CN201910892729.7A CN201910892729A CN110514937A CN 110514937 A CN110514937 A CN 110514937A CN 201910892729 A CN201910892729 A CN 201910892729A CN 110514937 A CN110514937 A CN 110514937A
Authority
CN
China
Prior art keywords
measurement circuit
fuse
main body
copper sheet
sheet main
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910892729.7A
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Chinese (zh)
Inventor
董福兴
戴剑
仇利民
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Jingxun Technology Co Ltd
Semitel Electronics Co Ltd
Original Assignee
Suzhou Jingxun Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Jingxun Technology Co Ltd filed Critical Suzhou Jingxun Technology Co Ltd
Priority to CN201910892729.7A priority Critical patent/CN110514937A/en
Publication of CN110514937A publication Critical patent/CN110514937A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention discloses a kind of non-solder type device detection compoboards, including measurement circuit plate and test fixture, fuse measurement circuit is horizontally arranged on measurement circuit plate, the end of the fuse measurement circuit is external connection exit, two ends of the fuse measurement circuit have hole, the inside of hole is connected with fuse measurement circuit, pad is connected in the middle part of fuse measurement circuit, electrostatic protector measurement circuit is vertically arranged on measurement circuit plate, the lower end of electrostatic protector measurement circuit has static gun hitting region, the upper end is radio-frequency terminals welding section, test fixture includes copper sheet main body, spring is connected in copper sheet main body, copper contact chip is hung on spring, mask placement device between copper contact chip and copper sheet main body, test fixture is welded on pad.It when the present invention is assessed and tested to device, does not need to be welded, is tested in such a way that compression joint type contacts, avoid device from scrapping, and may be reused, save the cost.

Description

A kind of non-solder type device detection compoboard
Technical field
The present invention relates to the testing field of electronic component, in particular to a kind of non-solder type device detection compoboard.
Background technique
The passive protections component such as static suppressor ESD and paster fuse FUSE, is prepared, In using thick film printing technique Because product can not weld in preparation process, so can not assess product, prepare after finished product if it find that bad will be by the gross It scraps, wastes a large amount of time and cost.
When testing passive protection component using existing test board, need for device to be welded on test board; Device after test then needs to be blown off from test board with heat-sealing rifle, have to pad and device certain if necessary to analyze Damage, device are scrapped substantially, and test board can only at most use 3 times;The bond pad surface of this solder type test board need by Gold-plated processing, the cost is relatively high, and test board cannot reuse, and a large amount of waste is caused in production cost.
Summary of the invention
In order to solve the above technical problems, the purpose of the present invention is to provide a kind of non-solder type device detection compoboard, In It when device is assessed and tested, does not need to be welded, is directly tested in such a way that compression joint type contacts, avoid device Part is scrapped, and may be reused, save the cost.
To realize above-mentioned technical purpose and the technique effect, the invention is realized by the following technical scheme: Yi Zhongfei Solder type device detection compoboard, including measurement circuit plate and test fixture are horizontally arranged with fusing on the measurement circuit plate Device measurement circuit, the end of the fuse measurement circuit are external connection exit, two ends of the fuse measurement circuit With hole, and the hole is through-hole, and the inside of hole is connected with fuse measurement circuit, the middle part of the fuse measurement circuit It is connected with pad by the way that route is connected, is also vertically arranged with electrostatic protector measurement circuit on the measurement circuit plate, the electrostatic The lower end of protector measurement circuit has static gun hitting region, and the upper end of the electrostatic protector measurement circuit is radio-frequency terminals welding The terminal for connecting oscillograph is welded in area, the radio-frequency terminals welding section, and the test fixture includes copper sheet main body, copper sheet master It is connected with spring in vivo, copper contact chip is hung on the spring, needs to test for placing between copper contact chip and copper sheet main body Device, the test fixture is welded on the pad.
In above-mentioned technical proposal, the measurement circuit plate is pcb board, and surface is etched to define fuse survey after covering copper foil Try route and electrostatic protector measurement circuit.
As a further improvement of the above technical scheme, the fuse measurement circuit and electrostatic protector measurement circuit table Face is gold-plated.
As a further improvement of the above technical scheme, the inside spray of described hole is equipped with tin layers, and tin layers are again by gold-plated Processing.
In above-mentioned technical proposal, the copper sheet main body has top, bottom and vertical component effect, and the spring is welded on copper sheet master On the top of body, device to be tested is needed to be placed between copper contact chip and the bottom of copper sheet main body.
In above-mentioned technical proposal, multiple test fixtures are welded on the pad.
As a further improvement of the above technical scheme, the copper sheet main body is silver coated.
The beneficial effects of the present invention are:
(1) the test compoboard when in use, will need device to be tested to be placed in the copper contact chip and copper of test fixture Between the bottom of piece main body, under the cooperation of spring, in such a way that compression joint type contacts, device passes through test fixture and p-wire Plate conducting in road, without being welded, to avoid generating scrapping for device, is tested to realize the assessment and test to device Plate and reusable, save the cost;
(2) spring is set in test fixture, so that the size for the device being put into test fixture is adjustable, is suitable for not With the device of size, test board is remake without the variation because of device size;
(3) device tested can be finished product and be also possible to semi-finished product, if device semi-finished product printed table electrode can To be assessed using the test compoboard, do not need that termination electrode is electroplated in production;
(4) process assessed device and tested using test compoboard of the invention is simple, can find in time Defective products avoids material and waste of time;
(5) after the completion of assessing device and testing, device directly can be removed from test compoboard, it will not be to pad Damage is generated with appearance of device;
(6) the test compoboard can be adapted for different types of device assessment, have a wide range of application.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the measurement circuit plate in non-solder type device detection compoboard of the present invention.
Fig. 2 is the structural schematic diagram of the test fixture in non-solder type device detection compoboard of the present invention.
Specific embodiment
The preferred embodiments of the present invention will be described in detail with reference to the accompanying drawing, so that advantages and features of the invention energy It is easier to be readily appreciated by one skilled in the art, so as to make a clearer definition of the protection scope of the present invention.
As depicted in figs. 1 and 2, a kind of non-solder type device detection compoboard, including measurement circuit plate 1 and test fixture 2, It is horizontally arranged with fuse measurement circuit 11 on the measurement circuit plate 1, the end of the fuse measurement circuit 11 is external connection Exit, two ends of the fuse measurement circuit 11 have hole 111, and the hole 111 is through-hole, hole 111 Internal to be connected with fuse measurement circuit 11, the middle part of the fuse measurement circuit 11 is connected with pad by the way that route 112 is connected 113, electrostatic protector measurement circuit 12 is also vertically arranged on the measurement circuit plate 1, the electrostatic protector measurement circuit 12 Lower end there is static gun hitting region 121, the upper end of the electrostatic protector measurement circuit 12 is radio-frequency terminals welding section, the radio frequency The terminal for connecting oscillograph is welded in terminal welding section, and the test fixture 2 includes copper sheet main body 21, in the copper sheet main body 21 It is connected with spring 22, copper contact chip 23 is hung on the spring 22, is needed between copper contact chip 23 and copper sheet main body 21 for placing Device to be tested, the test fixture 2 are welded on the pad 113.
Wherein, measurement circuit plate 1 is pcb board, and surface, which is covered, is etched to define fuse measurement circuit 11 and quiet after copper foil Non-electricity protector measurement circuit 12, then in 12 surface gold-plating of fuse measurement circuit 11 and electrostatic protector measurement circuit.
In order to realize that inside and the fuse measurement circuit 11 of hole 111 are connected, the inside spray of hole 111 sets tin layers, tin Layer passes through gold-plated processing again.The external connection exit of fuse measurement circuit 11 is connect with external power supply, and external power supply passes through molten Disconnected device measurement circuit 11 and hole 111 are connected to measurement circuit plate 1.
Wherein, the copper sheet main body 21 has top, bottom and vertical component effect, and the spring 22 is welded on copper sheet main body 21 On top, device to be tested is needed to be placed between copper contact chip 23 and the bottom of copper sheet main body 21.
Wherein, multiple test fixtures 2 can be welded on pad 113.It, can by mobile solder joint when welding test fixture 2 To adjust the distance between test fixture, so as to be suitable for various sizes of device.
In addition, test fixture 2 is using the silver-plated material of copper, resistance is relatively small, does not influence electric conductivity, completely can be with Meet the needs of device detection.
When in use, chip fuse is put between the copper contact chip 23 of test fixture 2 and the bottom of copper sheet main body 21, Under the action of spring 22, copper contact chip 23 crimps chip fuse, the bottom of iron plate fuse and copper sheet main body 21 Contact;The external connection exit of fuse measurement circuit 11 is connect with external power supply, connects external power supply with measurement circuit plate 1 It is logical, and connected by pad 113 and test fixture 2, measurement circuit plate 1 and chip fuse, to be carried out to chip fuse Test and assessment.After the completion of test and assessment, directly chip fuse can be removed from test fixture 2.In test electrostatic When protector, electrostatic protector is put into test fixture 2, ground wire connects the hole 111 on fuse measurement circuit 11, electrostatic The static gun hitting region 121 of electrostatic protector measurement circuit 12, radio-frequency terminals welding section solder terminal are beaten in gunslinging, and terminal connection is shown Wave device, tests electrostatic protector, and oscillograph captures test image, to assess the performance of electrostatic protector.
The above description is only an embodiment of the present invention, is not intended to limit the scope of the invention, all to utilize this hair Equivalent structure or equivalent flow shift made by bright specification and accompanying drawing content is applied directly or indirectly in other relevant skills Art field, is included within the scope of the present invention.

Claims (7)

1. a kind of non-solder type device detection compoboard, it is characterised in that: including measurement circuit plate and test fixture, the test Fuse measurement circuit is horizontally arranged on wiring board, the end of the fuse measurement circuit is external connection exit, the fusing Two ends of device measurement circuit have hole, and the hole is through-hole, and the inside of hole is connected with fuse measurement circuit, The middle part of the fuse measurement circuit is connected with pad by the way that route is connected, and is also vertically arranged with electrostatic on the measurement circuit plate The lower end of protector measurement circuit, the electrostatic protector measurement circuit has static gun hitting region, the electrostatic protector p-wire The upper end on road is radio-frequency terminals welding section, which welds the terminal for connecting oscillograph, and the test is controlled Tool includes copper sheet main body, is connected with spring in the copper sheet main body, copper contact chip, copper contact chip and copper sheet master are hung on the spring Device to be tested is needed for placing between body, the test fixture is welded on the pad.
2. a kind of non-solder type device detection compoboard according to claim 1, it is characterised in that: the measurement circuit plate For pcb board, surface is etched to define fuse measurement circuit and electrostatic protector measurement circuit after covering copper foil.
3. a kind of non-solder type device detection compoboard according to claim 1, it is characterised in that: the fuse test Route and electrostatic protector measurement circuit surface gold-plating.
4. a kind of non-solder type device detection compoboard according to claim 1, it is characterised in that: the inside of described hole Spray is equipped with tin layers, and tin layers pass through gold-plated processing again.
5. a kind of non-solder type device detection compoboard according to claim 1, it is characterised in that: the copper sheet main body tool There are top, bottom and vertical component effect, the spring to be welded on the top of copper sheet main body, device to be tested is needed to be placed in copper contact Between piece and the bottom of copper sheet main body.
6. a kind of non-solder type device detection compoboard according to claim 1, it is characterised in that: welded on the pad There are multiple test fixtures.
7. a kind of non-solder type device detection compoboard according to claim 1, it is characterised in that: the copper sheet main body plating There is silver layer.
CN201910892729.7A 2019-09-20 2019-09-20 A kind of non-solder type device detection compoboard Pending CN110514937A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910892729.7A CN110514937A (en) 2019-09-20 2019-09-20 A kind of non-solder type device detection compoboard

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910892729.7A CN110514937A (en) 2019-09-20 2019-09-20 A kind of non-solder type device detection compoboard

Publications (1)

Publication Number Publication Date
CN110514937A true CN110514937A (en) 2019-11-29

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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0511019A (en) * 1991-07-04 1993-01-19 Nippon Mektron Ltd Circuit component testing method and flexible circuit board therefor
JPH0552778U (en) * 1991-12-17 1993-07-13 沖電気工業株式会社 Pressure welding jig for test board
JPH07226244A (en) * 1994-02-10 1995-08-22 Chikaya Yamashita Solderless device for wire connection of board
JP2004077238A (en) * 2002-08-14 2004-03-11 Murata Mfg Co Ltd Characteristic measuring device of electronic component
CN101136252A (en) * 2006-08-30 2008-03-05 台湾积体电路制造股份有限公司 Repair circuitry and method for preventing electrical fuse from being burned during static discharge testing
US20100245025A1 (en) * 2009-03-25 2010-09-30 Littelfuse, Inc. Solderless surface mount fuse
CN204330983U (en) * 2014-12-31 2015-05-13 昆山埃维奥电机有限公司 Fusing inductance opening time proving installation
CN210775703U (en) * 2019-09-20 2020-06-16 苏州晶讯科技股份有限公司 Non-welding type device test compoboard

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0511019A (en) * 1991-07-04 1993-01-19 Nippon Mektron Ltd Circuit component testing method and flexible circuit board therefor
JPH0552778U (en) * 1991-12-17 1993-07-13 沖電気工業株式会社 Pressure welding jig for test board
JPH07226244A (en) * 1994-02-10 1995-08-22 Chikaya Yamashita Solderless device for wire connection of board
JP2004077238A (en) * 2002-08-14 2004-03-11 Murata Mfg Co Ltd Characteristic measuring device of electronic component
CN101136252A (en) * 2006-08-30 2008-03-05 台湾积体电路制造股份有限公司 Repair circuitry and method for preventing electrical fuse from being burned during static discharge testing
US20100245025A1 (en) * 2009-03-25 2010-09-30 Littelfuse, Inc. Solderless surface mount fuse
CN204330983U (en) * 2014-12-31 2015-05-13 昆山埃维奥电机有限公司 Fusing inductance opening time proving installation
CN210775703U (en) * 2019-09-20 2020-06-16 苏州晶讯科技股份有限公司 Non-welding type device test compoboard

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
章俊华等: "电子技术基础实验指导", 西南交通大学出版社, pages: 273 - 274 *

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