CN110441722B - Method, device and system for checking dielectric loss tester - Google Patents
Method, device and system for checking dielectric loss tester Download PDFInfo
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Abstract
The application provides a method, a device and a system for verifying a dielectric loss tester, wherein the method comprises the following steps: independently controlling a voltage and current standard source to transmit preset test current to a dielectric loss tester to obtain corresponding target test current; independently controlling a voltage and current standard source to transmit preset reference current to a dielectric loss tester to obtain corresponding target reference current; obtaining a first phase angle from respective phase angles of the target test current and the target reference current; and if the difference value between the value of the test current and the value of the target test current does not exceed the preset upper limit of the test current error, the difference value between the value of the reference current and the value of the target reference current does not exceed the preset upper limit of the reference current error, and the difference value between the preset second phase angle and the first phase angle does not exceed the preset upper limit of the phase angle error, the medium loss tester passes the current verification. The method and the device can enlarge the range for checking the dielectric loss tester, and further improve the accuracy for checking the dielectric loss tester.
Description
Technical Field
The present application relates to the field of power technologies, and in particular, to a method, an apparatus, and a system for verifying a dielectric loss tester.
Background
For common electrical equipment such as transformers, bushings and transformers, the capacitance is small, usually in the pF or nF level, the maximum test current in the dielectric loss test is in the mA level, generally not exceeding 1A, and can be detected by using a conventional dielectric loss tester.
At present, when a common dielectric loss factor tester is verified in a laboratory, a plurality of high-voltage standard factor loss devices with different fixed capacitance values (generally 100 pF-50 nF) are generally adopted, and the capacitance and the dielectric loss factor are verified by a direct comparison method. The high-voltage standard-factor loss device is formed by connecting a high-voltage standard capacitor in series with different resistors, so that different dielectric loss factors are obtained.
However, for the generator, especially for the power equipment such as air cooling, full hydrogen cooling generator, hydro-generator and long distance power cable, the single phase has large capacitance to earth, which can reach 2.5 muF, and the test current in the measurement of dielectric loss factor can also reach more than ten amperes, and can reach 25A at most, so the current test range of the dielectric loss tester for the large capacity capacitive test sample in the market at present reaches 20A, and the common range is 5A-20A. In the traditional method for calibrating the dielectric loss tester by adopting the standard factor loss device, the rated current is generally below 1A, only the range of less than 5 percent (1A) of the full range (20A) of the high-capacity precise dielectric loss tester can be calibrated, and the conventional calibration method is unrealistic when more high-capacity dielectric loss factor standards are equipped, so that the accuracy grade of the high-capacity precise dielectric loss tester in the common range cannot be effectively checked by the traditional calibration method.
Disclosure of Invention
Aiming at the problems in the prior art, the application provides a method, a device and a system for verifying a dielectric loss tester, which can enlarge the range for verifying the dielectric loss tester and further improve the accuracy for verifying the dielectric loss tester.
In order to solve the technical problem, the present application provides the following technical solutions:
in a first aspect, the present application provides a method for verifying a dielectric loss tester, including:
independently controlling a voltage and current standard source to transmit preset test current to the dielectric loss tester so as to obtain corresponding target test current after the test current is transmitted to the dielectric loss tester;
independently controlling a voltage and current standard source to transmit preset reference current to the dielectric loss tester so as to obtain corresponding target reference current after the reference current is transmitted to the dielectric loss tester;
obtaining a first phase angle according to the phase angle of the target test current and the phase angle of the target reference current, wherein the first phase angle is the phase angle between the target test current and the target reference current;
and if the difference between the preset test current value and the corresponding target test current value does not exceed the preset test current maximum allowable error, the difference between the preset reference current value and the corresponding target reference current value does not exceed the preset reference current maximum allowable error, and the difference between the preset second phase angle and the first phase angle does not exceed the preset phase angle maximum allowable error, determining the medium loss tester as the medium loss tester passing the current verification.
Further, the method for verifying the dielectric loss tester further comprises the following steps: and if the difference value between the preset second phase angle and the first phase angle exceeds the maximum allowable error of the preset phase angle through judgment, determining the medium loss tester as a medium loss tester which does not pass the current verification.
Further, the method for verifying the dielectric loss tester further comprises the following steps: and if the difference between the preset test current value and the corresponding target test current value is judged to exceed the preset maximum allowable error of the test current, determining the dielectric loss tester as the dielectric loss tester which does not pass the current verification.
Further, the method for verifying the dielectric loss tester further comprises the following steps: and if the difference between the preset reference current value and the corresponding target reference current value is judged to be obtained whether to exceed the preset maximum allowable error of the reference current, determining the dielectric loss tester as the dielectric loss tester which does not pass the current verification.
Further, the test current and the reference current are respectively transmitted into the dielectric loss tester through two independent channels.
Further, the method for verifying the dielectric loss tester further comprises the following steps: and adjusting at least one of the preset reference current, the test current and the second phase angle for multiple times to realize multiple times of verification.
In a second aspect, the present application further provides a device for verifying a dielectric loss tester, including:
the test current control module is used for independently controlling a voltage current standard source to transmit preset test current to the dielectric loss tester so as to obtain corresponding target test current after the test current is transmitted to the dielectric loss tester;
the reference current control module is used for independently controlling a voltage and current standard source to transmit preset reference current to the dielectric loss tester so as to obtain corresponding target reference current after the reference current is transmitted to the dielectric loss tester;
the phase angle control module is used for obtaining a first phase angle according to the phase angle of the target test current and the phase angle of the target reference current, wherein the first phase angle is the phase angle between the target test current and the target reference current;
and the judging module is used for determining the dielectric loss tester as a dielectric loss tester passing the current verification if the difference between the preset test current value and the corresponding target test current value does not exceed the preset maximum allowable error of the test current, the difference between the preset reference current value and the corresponding target reference current value does not exceed the preset maximum allowable error of the reference current, and the difference between the preset second phase angle and the first phase angle does not exceed the preset maximum allowable error of the phase angle.
Further, the determining module further includes: and the phase angle judging unit is used for determining the dielectric loss tester as a dielectric loss tester which does not pass the current verification if the difference value between the preset second phase angle and the first phase angle is judged to exceed the maximum allowable error of the preset phase angle.
Further, the determining module further includes: and the test current judging unit is used for determining the dielectric loss tester as the dielectric loss tester which does not pass the current verification if the difference between the preset test current value and the corresponding target test current value is judged to exceed the preset maximum allowable error of the test current.
Further, the determining module further includes: and the reference current judging unit is used for determining the dielectric loss tester as the dielectric loss tester which does not pass the current reference current verification if the difference between the preset reference current value and the corresponding target reference current value is judged and obtained to determine whether the difference exceeds the preset reference current maximum allowable error.
Further, the preset test current and the reference current are respectively transmitted into the dielectric loss tester through two independent channels.
Further, the device for verifying a dielectric loss tester further comprises: and the adjusting module is used for adjusting at least one of the preset reference current, the test current and the second phase angle for multiple times so as to realize multiple times of verification.
In a third aspect, the present application provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the method for verifying a dielectric loss tester when executing the program.
In a fourth aspect, the present application provides a computer readable storage medium having stored thereon computer instructions that, when executed, perform the steps of the method for verifying a dielectric loss tester.
In a fifth aspect, the present application provides a system for verifying a dielectric loss tester, comprising:
the medium loss tester calibration device and the medium loss tester;
the medium loss tester calibration device is in wired connection with the medium loss tester.
According to the technical scheme, the embodiment of the application provides a method, a device and a system for verifying a dielectric loss tester, wherein the method for verifying the dielectric loss tester comprises the following steps: independently controlling a voltage and current standard source to transmit preset test current to the dielectric loss tester so as to obtain corresponding target test current after the test current is transmitted to the dielectric loss tester; independently controlling a voltage and current standard source to transmit preset reference current to the dielectric loss tester so as to obtain corresponding target reference current after the reference current is transmitted to the dielectric loss tester; obtaining a first phase angle according to the phase angle of the target test current and the phase angle of the target reference current, wherein the first phase angle is the phase angle between the target test current and the target reference current; if the difference between the preset test current value and the corresponding target test current value, the difference between the preset reference current value and the corresponding target reference current value, and the difference between the preset second phase angle and the first phase angle are judged not to exceed the preset maximum allowable error, determining the dielectric loss tester as the one passing the current verification, wherein the preset maximum allowable error comprises a preset maximum allowable error of a test current, a preset maximum allowable error of a reference current and a preset maximum allowable error of a phase angle, and the calibration range of the dielectric loss tester can be expanded, therefore, the accuracy of checking the dielectric loss tester is improved, the application reliability of the dielectric loss tester can be effectively improved, and meanwhile, the accuracy of performing related experiments by using the dielectric loss tester can be improved.
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In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a dielectric loss tester calibration system provided in the present application;
fig. 2 is a schematic flow chart of a verification method of a dielectric loss tester in an embodiment of the present application;
FIG. 3 is a schematic flow chart of a method for verifying a dielectric loss tester according to another embodiment of the present application;
fig. 4 is a schematic structural diagram of a verification apparatus of a dielectric loss tester provided in an embodiment of the present application;
fig. 5 is a schematic structural diagram of a determining module in a verification apparatus of a dielectric loss tester according to another embodiment of the present application;
fig. 6 is a schematic structural diagram of a dielectric loss tester calibration system provided in a specific application example of the present application;
FIG. 7 is a vector diagram illustrating the correspondence between phase angles provided in the exemplary embodiment of the present application;
Fig. 8 is a block diagram schematically illustrating a system configuration of an electronic device 9600 according to an embodiment of the present application.
Detailed Description
In order to make those skilled in the art better understand the technical solutions in the present specification, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
At present, when a common dielectric loss factor tester is verified in a laboratory, a plurality of high-voltage standard factor loss devices with different fixed capacitance values (generally 100 pF-50 nF) are generally adopted, and the capacitance and the dielectric loss factor are verified by a direct comparison method. If a high voltage standard factor loss device with larger capacitance value is needed to be equipped for verifying the high capacity precision dielectric loss tester, such as 100 nF-2.5 muF.
The high-voltage standard-factor loss device is formed by connecting a high-voltage standard capacitor in series with different resistors, so that different dielectric loss factors are obtained. The disadvantage of the standard device manufactured by the method is that: when the capacity of the high-voltage standard capacitor is large, the capacitance value is unstable, so that the dielectric loss factor value is also unstable; the capacitance value is single, and the rated voltage of the standard device is difficult to increase. Due to the manufacturing process of the high-voltage standard capacitor, along with the increase of capacitance, the stability is difficult to ensure. By adopting a method of serially connecting a capacitor with a resistor, the dielectric loss factor standard device with the rated voltage of 10kV and the capacitance of more than 10nF is very difficult to manufacture, the requirement of calibrating a rated voltage dielectric loss tester is difficult to realize, and the method has several defects:
When simulating a large dielectric loss factor, the series resistor needs to bear a very high voltage and consume a very large power, and a high-stability and high-power resistor is difficult to obtain. Furthermore, after the large resistor is connected, the potential of the measuring terminal of the standard capacitor is raised, the maximum voltage of the terminal is generally allowed to be 2kV, and as the test voltage is increased and the dielectric loss value is increased, the voltage of the terminal is increased, and the voltage withstanding requirement of the terminal is possibly exceeded. This is also difficult to handle in manufacturing. Therefore, the maximum dielectric loss factor of the standard device under the test voltage of 10kV can only be 0-0.1. If higher test voltage is needed, the range of dielectric loss factors can be smaller.
The data of the large dielectric loss factor gear of the traditional standard device is unstable. This is because the resistance of the resistor connected in series with the standard capacitor is very large when the dielectric loss factor is large, and the distribution parameters (distribution capacitance and leakage resistance) around the resistor have an influence on the impedance of the resistor, and when the environmental conditions change, the presented impedance changes, which results in the change of the final dielectric loss factor.
The traditional standard factor loss device can only change the dielectric loss factor value and cannot change the capacitance value. If a plurality of capacitance values are to be verified, a plurality of etalons of different capacitance values are required.
The traditional standard device generally adopts a mechanical socket or a switch for grading, and the contact of the mechanical switch is easy to age to cause poor contact.
The traditional standard device can not switch gears in an electrified way, and is not beneficial to improving the checking work efficiency.
Based on this, in order to expand the range of checking the dielectric loss tester and further improve the accuracy of checking the dielectric loss tester, starting from changing the checking mechanism of the dielectric loss tester, a precise controllable voltage and current standard source is adopted for simulating the current of a standard capacitor as a reference current and the test current for checking the dielectric loss tester, the phase angle between the reference current and the test current is adjusted in a mode of setting a dielectric loss factor, and the full-range checking of the tested dielectric loss tester is realized by outputting two paths of currents.
According to the above, an embodiment of the present invention provides a system for verifying a dielectric loss tester, and referring to fig. 1, the system for verifying a dielectric loss tester includes: the medium loss tester calibration device 10 is in wired connection with the medium loss tester 20, and according to actual calibration requirements, the medium loss tester calibration device 10 is considered to be used for simultaneously or time-divisionally testing a plurality of medium loss testers 20 which are connected with the medium loss tester calibration device 10, so that calibration efficiency and convenience are improved, and the use cost of the medium loss tester calibration device is saved.
Specifically, the check device of the dielectric loss tester can be a check device of the dielectric loss tester comprising a processor and a data transmission interface, and can also be composed of an independent processor and a voltage and current standard source, so that under the condition that the voltage and current standard source exists in a check field, only the processor matched with the voltage and current standard source needs to be provided, and the use cost of the check device of the dielectric loss tester is further saved. The independent processor can be replaced by a server or client equipment correspondingly, and the processor can be a single chip microcomputer or a CPU arranged in a computer; the independent processor is in communication connection with the voltage and current standard source, and the voltage and current standard source can be provided with a group of output channels of standard current and reference current and also can be provided with a plurality of groups of output channels of standard current and reference current so as to realize the verification of a plurality of dielectric loss testers.
It is understood that the client devices may include smart phones, tablet electronic devices, network set-top boxes, portable computers, desktop computers, Personal Digital Assistants (PDAs), in-vehicle devices, smart wearable devices, and the like. Wherein, intelligence wearing equipment can include intelligent glasses, intelligent wrist-watch and intelligent bracelet etc..
In practical applications, the part for performing the verification of the dielectric loss tester may be performed on the server side as described above, or all operations may be performed in the client device. The selection may be specifically performed according to the processing capability of the client device, the limitation of the user usage scenario, and the like. This is not a limitation of the present application. The client device may further include a processor if all operations are performed in the client device.
The client device may have a communication module (i.e., a communication unit), and may be communicatively connected to a remote server to implement data transmission with the server. The server may include a server on the task scheduling center side, and in other implementation scenarios, the server may also include a server on an intermediate platform, for example, a server on a third-party server platform that is communicatively linked to the task scheduling center server. The server may include a single computer device, or may include a server cluster formed by a plurality of servers, or a server structure of a distributed apparatus.
The server and the client device may communicate using any suitable network protocol, including network protocols not yet developed at the filing date of this application. The network protocol may include, for example, a TCP/IP protocol, a UDP/IP protocol, an HTTP protocol, an HTTPS protocol, or the like. Of course, the network Protocol may also include, for example, an RPC Protocol (Remote Procedure Call Protocol), a REST Protocol (Representational State Transfer Protocol), and the like used above the above Protocol.
In one or more embodiments of the present application, the compute nodes and the master node both belong to the same Linux cluster (load balancing cluster). The operating system of the Linux cluster is a low-level support software that is used to interface with hardware and provide a limited set of services for user programs. A computer system is a co-organism of hardware and software that are interdependent, not separable. The hardware of the computer comprises peripheral equipment, a processor, a memory, a hard disk and other electronic equipment which form a motor of the computer. But has no software to operate and control it and is not functional by itself. The software that performs this control task is called the operating system, which in Linux terminology is called the "kernel" and may also be called the "kernel". The main modules (or components) of the Linux kernel are divided into the following parts: storage management, CPU and process management, file systems, device management and drivers, network communications, and initialization (boot) of the system, system calls, and the like.
The following examples are intended to illustrate the details.
In order to expand the range of verifying the dielectric loss tester and further improve the accuracy of verifying the dielectric loss tester, the application provides a method for verifying the dielectric loss tester, in which the execution main body is a verifying device of the dielectric loss tester, and referring to fig. 2, the method specifically comprises the following steps:
Step 100: and independently controlling a voltage and current standard source to transmit preset test current to the dielectric loss tester so as to obtain corresponding target test current after the test current is transmitted to the dielectric loss tester.
Specifically, the preset test current includes a preset test current value and a phase of a pre-acquired test current; wherein the phase δ of the pre-acquired test current1By a predetermined value of the dielectric loss factor tg α and a predetermined phase δ of the reference current2Obtaining, for example, a dielectric loss factor tg α of 0.5%, δ is set in advance in the parameter configuration290 °, where α is the phase angle between the predetermined test current and the reference current, in accordance with δ1＝δ2α, the phase δ of the corresponding pre-acquired test current being obtainable1. The preset dielectric loss factor value and the preset phase of the reference current can be set according to practical application, and the application is not limited to this.
In particular, the value I of the preset test currentnCan be set in advance in a parameter configuration, e.g. InThe value of 0.01A may be set according to practical applications, and the present application is not limited thereto.
Specifically, the method for verifying the dielectric loss tester can be applied to any dielectric loss tester, for example, the method for verifying the dielectric loss tester can be applied to a high-capacity precise dielectric loss tester, the current test range of the dielectric loss tester can be 0.1 mA-20A, and the full-range verification of the dielectric loss tester can be realized by the method for verifying the dielectric loss tester.
Step 200: and independently controlling a voltage and current standard source to transmit preset reference current to the dielectric loss tester so as to obtain corresponding target reference current after the reference current is transmitted to the dielectric loss tester.
Specifically, the preset reference current includes a preset reference current value and a phase of the preset reference current, and may be set according to an actual application condition, which is not limited in this application.
Specifically, the preset test current and the reference current are respectively transmitted to the dielectric loss tester through two independent channels.
Step 300: and obtaining a first phase angle according to the phase angle of the target test current and the phase angle of the target reference current, wherein the first phase angle is the phase angle between the target test current and the target reference current.
Specifically, in steps 100 to 300, the method further includes adjusting at least one of the preset reference current, the preset test current, and the preset second phase angle for multiple times to implement a process of verifying the dielectric loss tester for multiple times, and selecting multiple current values in the range of the dielectric loss tester to perform detection, thereby covering the full range of the verified dielectric loss tester.
Step 400: and if the difference between the preset test current value and the corresponding target test current value does not exceed the preset test current maximum allowable error, the difference between the preset reference current value and the corresponding target reference current value does not exceed the preset reference current maximum allowable error, and the difference between the preset second phase angle and the first phase angle does not exceed the preset phase angle maximum allowable error, determining the medium loss tester as the medium loss tester passing the current verification.
Specifically, the preset second phase angle is a phase angle between the preset test current and the reference current, and may be obtained by setting the dielectric loss factor tg α in a parameter configuration in advance, for example, the preset dielectric loss factor tg α is 0.5%, and a value of the second phase angle α may be obtained thereby.
Specifically, the preset maximum allowable error of the phase angle may be set according to actual conditions, which is not limited in this application.
Specifically, the preset maximum allowable error of the test current may be set according to actual conditions, which is not limited in this application.
Specifically, the preset maximum allowable error of the reference current may be set according to actual conditions, which is not limited in this application.
In order to further improve the accuracy of the result of the check dielectric loss tester, in one or more embodiments of the present application, referring to fig. 3, after step 300, the method further includes:
step 301: and if the difference value between the preset second phase angle and the first phase angle exceeds the maximum allowable error of the preset phase angle through judgment, determining the medium loss tester as a medium loss tester which does not pass the current verification.
Step 302: and if the difference between the preset test current value and the corresponding target test current value is judged to exceed the preset maximum allowable error of the test current, determining the dielectric loss tester as the dielectric loss tester which does not pass the current verification.
Step 303: and if the difference between the preset reference current value and the corresponding target reference current value is judged to be obtained whether to exceed the preset maximum allowable error of the reference current, determining the dielectric loss tester as the dielectric loss tester which does not pass the current verification.
Specifically, the value of the first phase angle, the target reference current value and the target test current value may be displayed on a display screen of the dielectric loss tester; if the dielectric loss tester calibration device is packaged in the voltage and current standard source, the preset second phase angle value, the reference current value and the test current value can be displayed on a display screen of the voltage and current standard source, and if the dielectric loss tester calibration device is a single device, such as a notebook computer, the preset second phase angle value, the reference current value and the test current value can be displayed on the display screen of the voltage and current standard source or the display screen of the notebook computer.
In terms of software, in order to expand the range of verifying the dielectric loss tester and further improve the accuracy of verifying the dielectric loss tester, the present application provides an embodiment of a device for verifying the dielectric loss tester, which is used for executing all or part of the contents in the method for verifying the dielectric loss tester, where the device for verifying the dielectric loss tester, referring to fig. 4, specifically includes the following contents:
and the test current control module 11 is configured to separately control the voltage and current standard source to transmit a preset test current to the dielectric loss tester, so as to obtain a corresponding target test current after the test current is transmitted to the dielectric loss tester.
And a reference current control module 12, configured to separately control the voltage and current standard source to transmit a preset reference current to the dielectric loss tester, so as to obtain a corresponding target reference current after the reference current is transmitted to the dielectric loss tester.
And a phase angle control module 13, configured to obtain a first phase angle according to the phase angle of the target test current and the phase angle of the target reference current, where the first phase angle is a phase angle between the target test current and the target reference current.
And a determining module 14, configured to determine the dielectric loss tester as a dielectric loss tester passing the current verification if it is determined that a difference between the preset test current value and the corresponding target test current value does not exceed a preset test current maximum allowable error, a difference between the preset reference current value and the corresponding target reference current value does not exceed a preset reference current maximum allowable error, and a difference between a preset second phase angle and the first phase angle does not exceed a preset phase angle maximum allowable error.
The preset test current and the reference current are respectively transmitted into the dielectric loss tester through two independent channels.
In one or more embodiments of the present application, in order to extend the range of verifying the dielectric loss tester, referring to fig. 5, the determining module further includes:
and the phase angle judging unit 14a is configured to determine the dielectric loss tester as a dielectric loss tester which does not pass the current verification if it is judged that the difference between the preset second phase angle and the first phase angle exceeds the preset maximum allowable error of the phase angle.
And the test current judging unit 14b is configured to determine the dielectric loss tester as a dielectric loss tester that does not pass the current verification if it is judged that a difference between the preset test current value and the corresponding target test current value exceeds a preset maximum allowable error of the test current.
And a reference current determining unit 14c, configured to determine the dielectric loss tester as a dielectric loss tester that does not pass the current reference current verification if it is determined that a difference between the preset reference current value and the corresponding target reference current value exceeds a preset reference current maximum allowable error.
In order to further improve the accuracy of the result of the check dielectric loss tester, in one or more embodiments of the present application, the method further includes:
and the adjusting module 15 is used for adjusting at least one of the preset reference current, the test current and the second phase angle for multiple times so as to realize multiple times of verification.
Based on the method, the device and the system for verifying the dielectric loss tester, in the embodiment of the present application, in order to further improve the efficiency and the range of verifying the dielectric loss tester and further improve the accuracy of verifying the dielectric loss tester, the process of verifying the dielectric loss tester by the verifying device of the dielectric loss tester can be executed, and an application scenario in which the verifying device of the dielectric loss tester and the verifying method of the dielectric loss tester are applied in the embodiment of the present application is specifically described below.
Specific application of (I) dielectric loss tester checking system
In a specific application example of the present application, referring to fig. 6, the system for verifying a dielectric loss tester includes: the device comprises a notebook computer, a precise controllable voltage and current standard source and a large-capacity precise dielectric loss tester. The function realized by combining the notebook computer and the accurate controllable voltage and current standard source is equivalent to the function realized by the medium loss tester calibration device.
The current test range of the high-capacity precise dielectric loss tester is 0.1 mA-20A, and the high-capacity precise dielectric loss tester comprises a reference current output channel I corresponding to the precise controllable voltage and current standard sourceNReference current input channel CNIn addition, a test current output channel I corresponding to the accurate controllable voltage and current standard sourceXTest current input channel CX。
The precise controllable voltage and current standard source is used for simulating the current I of a standard capacitornAnd the current I of the samplexAdjusting I in the form of setting the dielectric loss factornAnd IxThe phase angle between the two paths of current is 0.1 mA-20A, so that the full-range calibration of the tested high-capacity precise dielectric loss tester is realized.
The voltage and current standard sourceTwo independent current output channels are provided, the output current ranges are all 0.1 mA-20A, and one current source is used as a reference signal I nThe other current source is used as a detected signal IxAnd is positively grounded. When testing the relative dielectric loss of capacitive devices, there are generally two test modes: absolute and relative. The absolute method is used to take the voltage signal as the reference signal, and the relative method is used to take the current signal as the reference signal. The checking device uses current signal InFor reference, a high-capacity precision dielectric loss tester measured by a relative method is checked.
(II) Process for verifying dielectric loss tester
In the specific application example of the present application, in combination with the above-mentioned verification system of the dielectric loss tester, referring to fig. 7, a relative measurement method is used to use the phase of the voltage signal of the verification device of the dielectric loss tester as the reference of the phase angles of the reference current signal and the test current signal, so as to ensure the accuracy and stability of the phases of the two current signals. Calibration device reference current output InC for connecting test wire to tested medium loss testerNChannel, test current output IxC for connecting test wire to tested medium loss testerXThe channel adopts the two standard current sources which can independently set the current output value to simulate the current signal I input when the tested dielectric loss tester carries out detection nAnd Ix。InAnd IxThe output value can be set and controlled to be output and turned off through the program of the upper computer of the device.
InAnd IxThe output phase of (a) is also set on the upper computer program. According to the test requirement, the test parameters of the tested dielectric loss tester are expressed by a dielectric loss value tg alpha, wherein alpha is delta2-δ1Output delta2Is a fixed value (e.g. 90 deg.), then delta1＝δ2A, setting tg α, can be calculated as IxOutput phase delta of1. To determine InAnd IxThe output value and the phase.
The current signal I of the calibration devicenAnd IxThe setting range is 0.1 mA-20A, and the dielectric loss value tg alpha isThe measurement range is 0.1% -90%, the full-range calibration problem of the measurement value 20A of the large-capacitance precision dielectric loss tester can be solved, and the accuracy of the large-capacity dielectric loss tester for detecting the insulation state of equipment such as a generator and a power cable is ensured.
That is to say, the reference current and the test current value output by the standard source are set in the upper computer software according to the requirement of the detection point, such as: setting In＝0.01A，IxWhen the user clicks an output key on a software interface, the standard source outputs two current values with a certain angle. Dielectric loss tester measured In、IxAnd tg α are displayed on the interface. And judging whether the test value of the dielectric loss tester meets the requirement of the maximum allowable error or not by comparing the difference value between the standard output value and the value measured by the dielectric loss tester.
When the standard source outputs the reference current and the test current, the amplitude (e.g., 0.1A) and the phase of the current need to be set. The phase position of the reference current is fixed to be 90 degrees, and the amplitude value is recorded in the upper computer software. For the test current, the amplitude is also recorded in the upper computer software, and the phase is converted through tg alpha recorded in the upper computer software. Delta1＝δ2A, setting tg α, can be calculated as IxOutput phase delta of1。
From the above description, the method, the device and the system for verifying the dielectric loss tester provided by the application can expand the range of verifying the dielectric loss tester, so that the accuracy of verifying the dielectric loss tester is improved, the application reliability of the dielectric loss tester can be effectively improved, meanwhile, the accuracy of performing related experiments by using the dielectric loss tester can be improved, in addition, the device for verifying the dielectric loss tester is simple in structure and easy to operate, and the efficiency of verifying the dielectric loss tester can be improved.
In order to expand the range of verifying the dielectric loss tester and further improve the accuracy of verifying the dielectric loss tester, the present application provides an embodiment of an electronic device for implementing all or part of the contents in the method for verifying the dielectric loss tester, where the electronic device specifically includes the following contents:
A processor (processor), a memory (memory), a communication Interface (Communications Interface), and a bus; the processor, the memory and the communication interface complete mutual communication through the bus; the communication interface is used for realizing information transmission between the medium loss tester calibration device, the user terminal and other related equipment; the electronic device may be a desktop computer, a tablet computer, a mobile terminal, and the like, but the embodiment is not limited thereto. In this embodiment, the electronic device may be implemented with reference to the embodiment for implementing the method for verifying the dielectric loss tester and the embodiment for implementing the device for verifying the dielectric loss tester in the embodiments, and the contents thereof are incorporated herein, and repeated details are not repeated.
Fig. 8 is a schematic block diagram of a system configuration of an electronic device 9600 according to an embodiment of the present application. As shown in fig. 8, the electronic device 9600 can include a central processor 9100 and a memory 9140; the memory 9140 is coupled to the central processor 9100. Notably, this FIG. 8 is exemplary; other types of structures may also be used in addition to or in place of the structure to implement telecommunications or other functions.
In one or more embodiments of the present application, the dielectric loss tester calibration function may be integrated into the central processor 9100. The central processor 9100 can be configured to perform the following control:
step 100: and independently controlling a voltage and current standard source to transmit preset test current to the dielectric loss tester so as to obtain corresponding target test current after the test current is transmitted to the dielectric loss tester.
Step 200: and independently controlling a voltage and current standard source to transmit preset reference current to the dielectric loss tester so as to obtain corresponding target reference current after the reference current is transmitted to the dielectric loss tester.
Step 300: and obtaining a first phase angle according to the phase angle of the target test current and the phase angle of the target reference current, wherein the first phase angle is the phase angle between the target test current and the target reference current.
Step 400: and if the difference between the preset test current value and the corresponding target test current value does not exceed the preset test current maximum allowable error, the difference between the preset reference current value and the corresponding target reference current value does not exceed the preset reference current maximum allowable error, and the difference between the preset second phase angle and the first phase angle does not exceed the preset phase angle maximum allowable error, determining the medium loss tester as the medium loss tester passing the current verification.
As can be seen from the above description, the electronic device provided in the embodiments of the present application expands the range of verifying the dielectric loss tester, and further improves the accuracy of verifying the dielectric loss tester.
In another embodiment, the verification apparatus of the dielectric loss tester may be configured separately from the central processing unit 9100, for example, the verification apparatus of the dielectric loss tester may be configured as a chip connected to the central processing unit 9100, and the verification function of the dielectric loss tester is realized by the control of the central processing unit.
As shown in fig. 8, the electronic device 9600 may further include: a communication module 9110, an input unit 9120, an audio processor 9130, a display 9160, and a power supply 9170. It is noted that the electronic device 9600 also does not necessarily include all of the components shown in fig. 8; further, the electronic device 9600 may further include components not shown in fig. 8, which may be referred to in the art.
As shown in fig. 8, a central processor 9100, sometimes referred to as a controller or operational control, can include a microprocessor or other processor device and/or logic device, which central processor 9100 receives input and controls the operation of the various components of the electronic device 9600.
The memory 9140 can be, for example, one or more of a buffer, a flash memory, a hard drive, a removable media, a volatile memory, a non-volatile memory, or other suitable device. The information relating to the failure may be stored, and a program for executing the information may be stored. And the central processing unit 9100 can execute the program stored in the memory 9140 to realize information storage or processing, or the like.
The input unit 9120 provides input to the central processor 9100. The input unit 9120 is, for example, a key or a touch input device. The power supply 9170 is used to provide power to the electronic device 9600. The display 9160 is used for displaying display objects such as images and characters. The display may be, for example, an LCD display, but is not limited thereto.
The memory 9140 can be a solid state memory, e.g., Read Only Memory (ROM), Random Access Memory (RAM), a SIM card, or the like. There may also be a memory that holds information even when power is off, can be selectively erased, and is provided with more data, an example of which is sometimes called an EPROM or the like. The memory 9140 could also be some other type of device. Memory 9140 includes a buffer memory 9141 (sometimes referred to as a buffer). The memory 9140 may include an application/function storage portion 9142, the application/function storage portion 9142 being used for storing application programs and function programs or for executing a flow of operations of the electronic device 9600 by the central processor 9100.
The memory 9140 can also include a data store 9143, the data store 9143 being used to store data, such as contacts, digital data, pictures, sounds, and/or any other data used by an electronic device. The driver storage portion 9144 of the memory 9140 may include various drivers for the electronic device for communication functions and/or for performing other functions of the electronic device (e.g., messaging applications, contact book applications, etc.).
The communication module 9110 is a transmitter/receiver 9110 that transmits and receives signals via an antenna 9111. The communication module (transmitter/receiver) 9110 is coupled to the central processor 9100 to provide input signals and receive output signals, which may be the same as in the case of a conventional mobile communication terminal.
Based on different communication technologies, a plurality of communication modules 9110, such as a cellular network module, a bluetooth module, and/or a wireless local area network module, may be provided in the same electronic device. The communication module (transmitter/receiver) 9110 is also coupled to a speaker 9131 and a microphone 9132 via an audio processor 9130 to provide audio output via the speaker 9131 and receive audio input from the microphone 9132, thereby implementing ordinary telecommunications functions. The audio processor 9130 may include any suitable buffers, decoders, amplifiers and so forth. In addition, the audio processor 9130 is also coupled to the central processor 9100, thereby enabling recording locally through the microphone 9132 and enabling locally stored sounds to be played through the speaker 9131.
According to the above description, the electronic device provided by the embodiment of the application can effectively enlarge the range of the verification of the dielectric loss tester, and further improve the accuracy of the verification of the dielectric loss tester.
An embodiment of the present application further provides a computer-readable storage medium capable of implementing all the steps in the method for verifying a dielectric loss tester in the foregoing embodiment, where the computer-readable storage medium stores a computer program, and the computer program, when executed by a processor, implements all the steps in the method for verifying a dielectric loss tester in the foregoing embodiment, for example, when the processor executes the computer program, the processor implements the following steps:
step 100: and independently controlling a voltage and current standard source to transmit preset test current to the dielectric loss tester so as to obtain corresponding target test current after the test current is transmitted to the dielectric loss tester.
Step 200: and independently controlling a voltage and current standard source to transmit preset reference current to the dielectric loss tester so as to obtain corresponding target reference current after the reference current is transmitted to the dielectric loss tester.
Step 300: and obtaining a first phase angle according to the phase angle of the target test current and the phase angle of the target reference current, wherein the first phase angle is the phase angle between the target test current and the target reference current.
Step 400: and if the difference between the preset test current value and the corresponding target test current value does not exceed the preset test current maximum allowable error, the difference between the preset reference current value and the corresponding target reference current value does not exceed the preset reference current maximum allowable error, and the difference between the preset second phase angle and the first phase angle does not exceed the preset phase angle maximum allowable error, determining the medium loss tester as the medium loss tester passing the current verification.
As can be seen from the above description, the computer-readable storage medium provided in the embodiment of the present application can effectively improve the verification range of the dielectric loss tester, and further improve the accuracy of verifying the dielectric loss tester.
In the present application, each embodiment of the method is described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. Reference is made to the description of the method embodiments.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
The principle and the implementation of the present application are explained by applying specific embodiments in the present application, and the description of the above embodiments is only used to help understand the method and the core idea of the present application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.
Claims (15)
1. A method for verifying a dielectric loss tester is characterized by comprising the following steps:
independently controlling a voltage and current standard source to transmit preset test current to the dielectric loss tester so as to obtain corresponding target test current after the test current is transmitted to the dielectric loss tester;
independently controlling a voltage and current standard source to transmit preset reference current to the dielectric loss tester so as to obtain corresponding target reference current after the reference current is transmitted to the dielectric loss tester;
obtaining a first phase angle according to the phase angle of the target test current and the phase angle of the target reference current, wherein the first phase angle is the phase angle between the target test current and the target reference current;
if the difference between the preset test current value and the corresponding target test current value does not exceed the preset test current maximum allowable error, the difference between the preset reference current value and the corresponding target reference current value does not exceed the preset reference current maximum allowable error, and the difference between the preset second phase angle and the first phase angle does not exceed the preset phase angle maximum allowable error, determining the dielectric loss tester as a dielectric loss tester passing the current verification;
The preset setting range of the test current and the reference current is 0.1 mA-20A; the setting range of the dielectric loss factor of the voltage and current standard source is 0.1% -90%; the second phase angle is obtained according to the dielectric loss factor of the voltage and current standard source.
2. The dielectric loss tester calibration method as claimed in claim 1, further comprising:
and if the difference value between the preset second phase angle and the first phase angle exceeds the maximum allowable error of the preset phase angle through judgment, determining the medium loss tester as a medium loss tester which does not pass the current verification.
3. The dielectric loss tester calibration method as claimed in claim 2, further comprising:
and if the difference between the preset test current value and the corresponding target test current value is judged to exceed the preset maximum allowable error of the test current, determining the dielectric loss tester as the dielectric loss tester which does not pass the current verification.
4. The dielectric loss tester verification method of claim 3, further comprising:
and if the difference between the preset reference current value and the corresponding target reference current value is judged to be obtained whether to exceed the preset maximum allowable error of the reference current, determining the dielectric loss tester as the dielectric loss tester which does not pass the current verification.
5. The dielectric loss tester calibration method as set forth in claim 1,
the test current and the reference current are respectively transmitted into the dielectric loss tester through two independent channels.
6. The dielectric loss tester calibration method as claimed in claim 1, further comprising:
and adjusting at least one of the preset reference current, the test current and the second phase angle for multiple times to realize multiple times of verification.
7. A dielectric loss tester calibration apparatus, comprising:
the test current control module is used for independently controlling a voltage current standard source to transmit preset test current to the dielectric loss tester so as to obtain corresponding target test current after the test current is transmitted to the dielectric loss tester;
the reference current control module is used for independently controlling a voltage and current standard source to transmit preset reference current to the dielectric loss tester so as to obtain corresponding target reference current after the reference current is transmitted to the dielectric loss tester;
the phase angle control module is used for obtaining a first phase angle according to the phase angle of the target test current and the phase angle of the target reference current, wherein the first phase angle is the phase angle between the target test current and the target reference current;
The judging module is used for determining the dielectric loss tester as a dielectric loss tester passing the current verification if the difference between the preset test current value and the corresponding target test current value does not exceed the preset test current maximum allowable error, the difference between the preset reference current value and the corresponding target reference current value does not exceed the preset reference current maximum allowable error, and the difference between the preset second phase angle and the first phase angle does not exceed the preset phase angle maximum allowable error after being judged;
the preset setting range of the test current and the reference current is 0.1 mA-20A; the setting range of the dielectric loss factor of the voltage and current standard source is 0.1% -90%; the second phase angle is obtained according to the dielectric loss factor of the voltage and current standard source.
8. The device for verifying a dielectric loss tester as claimed in claim 7, wherein the determining module further comprises:
and the phase angle judging unit is used for determining the dielectric loss tester as a dielectric loss tester which does not pass the current verification if the difference value between the preset second phase angle and the first phase angle is judged to exceed the maximum allowable error of the preset phase angle.
9. The device for verifying a dielectric loss tester as claimed in claim 7, wherein the determining module further comprises:
and the test current judging unit is used for determining the dielectric loss tester as the dielectric loss tester which does not pass the current verification if the difference between the preset test current value and the corresponding target test current value is judged to exceed the preset maximum allowable error of the test current.
10. The device for verifying a dielectric loss tester as claimed in claim 7, wherein the determining module further comprises:
and the reference current judging unit is used for determining the dielectric loss tester as the dielectric loss tester which does not pass the current reference current verification if the difference between the preset reference current value and the corresponding target reference current value is judged and obtained to determine whether the difference exceeds the preset reference current maximum allowable error.
11. The dielectric loss tester verification apparatus according to claim 7,
the test current and the reference current are respectively transmitted into the dielectric loss tester through two independent channels.
12. The dielectric loss tester calibration apparatus of claim 7, further comprising:
And the adjusting module is used for adjusting at least one of the preset reference current, the test current and the second phase angle for multiple times so as to realize multiple times of verification.
13. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the steps of the method of any of claims 1 to 6 are performed by the processor when executing the program.
14. A computer readable storage medium having stored thereon computer instructions, wherein the instructions, when executed, implement the steps of the method of any of claims 1 to 6.
15. A system for verifying a dielectric loss tester, comprising:
a dielectric loss tester and a dielectric loss tester verification apparatus as claimed in any one of claims 7 to 12;
the medium loss tester calibration device is connected with the medium loss tester in a wired mode.
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