CN110426622A - A kind of voltage and current source test circuit and test method - Google Patents
A kind of voltage and current source test circuit and test method Download PDFInfo
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- CN110426622A CN110426622A CN201910754975.6A CN201910754975A CN110426622A CN 110426622 A CN110426622 A CN 110426622A CN 201910754975 A CN201910754975 A CN 201910754975A CN 110426622 A CN110426622 A CN 110426622A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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Abstract
The present invention provides a kind of voltage and current source test circuit and test methods, including voltage and current source, the voltage and current source includes control unit, output power amplifier, current measurement circuit and tension measuring circuit, and its four line Kelvin's circuits of connection, the voltage and current source further include: two-pass DINSAR tension measuring circuit, the voltage on the pressure-wire and current line of four lines Kelvin's circuit is acquired, by calculus of differences output difference voltage to described control unit.The present invention realizes that additional differential voltage measures on the basis of traditional four line Kelvin's wiring, by increasing two-way voltage signal measuring circuit, to measure the pressure drop in current line, to realize the equivalent contact resistance dynamically to read back in current line when test every time.
Description
Technical field
The present invention relates to ic test technique field, in particular to a kind of voltage and current source test circuit and test side
Method.
Background technique
In integrated circuit testing, need voltage and current source (be referred to as below the source VI) to measured device (hereinafter referred to DUT,
Device Under Test) carry out signal excitation and the measurement of voltage and current.
In order to improve output voltage and test voltage precision, traditional source VI is all connect using four line Kelvins (Kelvin)
Line mode, respectively high-side current line (FH, Force High), high-end pressure-wire (SH, Sense High), low-side current line
(FL, Force Low), lower terminal voltage line (SL, Sense Low).Wherein electric current is defeated from high-side current line (FH, Force High)
(or input) out, from low-side current line (FL, Force Low) reflux (or outflow).Wherein Rfh and Rfl is respectively FH and FL
Equivalent resistance caused by transmission link causes in electric current transmission link since electric current flows through Rfh and Rfl, can generate certain
Pressure drop.
Voltage measurement then takes high-end pressure-wire (SH, Sense High) and the difference of lower terminal voltage line (SL, Sense Low) is
Voltage difference on DUT.It is high impedance input inside the end SH and the end SL, signal proximal end is identical as the voltage of distal end.Wherein Rsh and
Rsl is respectively the transmission link equivalent resistance at the end SH and the end SL.Due to being high impedance input inside the end SH and the end SL, Rsh and
Rsl contact be well in the following magnitude of ohm, poor contact also megaohm or more magnitude.When contacting good, with the end SH and SL
End is internal to be compared for the high impedance of the above magnitude of gigabit, can be ignored, therefore the pressure difference very little of Rsh and Rsl, can be ignored not
Meter.
Fig. 1 show the traditional source VI framework, which includes following part, and the end SH and the end SL are common
It is connected to CONTROL control after connection differential operational amplifier OP2, the series voltage follower OP1 on the end SH goes here and there on the end SL
Join voltage follower OP5, the range resistance Ri being connected on the end FL, is connected in parallel on the current-differencing measurement at the both ends range resistance Ri
OP4, the output power amplifier OP3 being connected between CONTROL control and the end FH.The source the VI framework is CONTROL control at work
The corresponding VI source module state is arrived in VI source module as needed, setting, and driving output power amplifier OP3 work is exported from the end FH,
Voltage follower OP1 and voltage follower OP5 carries out voltage follow measurement, respectively obtains Vsh and Vsl, puts by calculus of differences
Big device OP2, obtains Vmeter signal, is sent into CONTROL control and is fed back and measured；The signal exported simultaneously from the end FH passes through
After DUT flows to the end FL, flows through Ri and eventually flow into the end GND；Difference amplifier OP4 measures the voltage at the both ends Ri, obtains Imeter letter
Number, it is sent into CONTROL control and is fed back and measured.
As shown in Fig. 2, when carrying out signal excitation or the measurement of voltage and current to DUT using the traditional source VI framework, usually
Also the connection type that four line Kelvins can be used, can deduct the voltage difference that electric current generates on the equivalent resistance of current line, from
And accurately measure the voltage difference for being sent to the both ends DUT.
But in actual application, to pass through cable, various multi-taps, golden finger or probe from the output in the source VI
DUT is got to, each link has transmission resistance or contact resistance, will cause different pressure drops.It is fixed for cable etc.
Electrical transmission resistance is more stable in connection line, and it is relatively fixed that ohmically pressure drop is transmitted under a constant current.And for because
There are the multi-tap of electrical connection, especially golden finger or probe for pressure, the contact portion resistance is related to contact pressure,
Also related to flatness to the cleannes of contact surface, when contact pressure becomes smaller or contact surface is unclean, contact surface is uneven
It is whole, it will lead to contact resistance and become larger extremely, lead to poor contact.
Special golden finger or probe are in use, respectively with more device multiple-contacts, exist using abrasion, cause to contact
The problem of decline of face cleannes, contact surface out-of-flatness or contact pressure decline；The problem will lead to testing contact resistance and become extremely
Greatly, cause test abnormal.It needs to detect the poor contact that may be present of foregoing description thus, once discovery contact is not
It is good, it is necessary to carry out cleaning golden finger or detecting probe surface in time and need to adjust contact pressure if still abnormal；If still
It is so abnormal, then golden finger or probe are needed replacing, to guarantee that contact is good.
For being carried out frequently with following manner in the contact detection of golden finger or probe:
A kind of test method as shown in Figure 3, by the way of the connection of two lines, using the diode inside DUT as biography
Defeated circuit, to detect the equivalent contact resistance situation of Diode series golden finger or probe, wherein diode is usually DUT pin
To power end or a power end to the protection diode of another power end.The test method is common in connecing for digital device
Touching detection, the test method cannot can only measure respectively Rhc or Rlc to the equivalent contact resistance unified measurement of two contact jaws,
And batch pressure drop by device diode is different is influenced, and the equivalent contact resistance precision is not high, at the source VI constant current 1mA,
The contact resistance of hundred ohms can usually be detected.
Another test method as shown in Figure 4, Figure 5 is separately connected the source VI using the both ends (high-end and low side) of DUT
Two output ends, to be measured respectively to the both ends of DUT and the contact resistance of golden finger or probe.The test method can only be right
The Rflc and Rslc of high-end Rfhc and Rshc or low side carries out unified measurement, although than two lines connection type shown in Fig. 3, it is few
Diode bring batch error, measurement result can be more accurate.But the measurement method cannot accurately measure current line
On equivalent contact resistance, i.e. Rfhc and Rflc, in high-current test, which influences the pressure drop of current line
It is very big, and these equivalent contact resistances may change in each test process.In each test in the source VI, if
The value of these equivalent contact resistances can be accurately measured, then can quickly determine to contact link with the presence or absence of security risk
(as: contact resistance variation caused by golden finger oxidation, abrasion, impurity etc.), so that early alert is carried out according to test data,
Into plant maintenance, to reduce later period bigger quality risk, such as: needle is burnt, burner part burns source VI etc., especially high-power,
In the test of high current, this problem is even more serious.
Summary of the invention
In view of this, the main purpose of the present invention is to provide a kind of voltage and current source test circuit and test method, In
On the basis of traditional four line Kelvin's wiring, realize that additional differential voltage is surveyed by increasing two-way voltage signal measuring circuit
Amount, to measure the pressure drop in current line, to realize the equivalent contact resistance dynamically to read back in current line when test every time.This
Invention can also be achieved and survey to differential voltage additional in four line Kelvin's circuits under the premise of not influencing the source VI primary characteristic
Amount, accurately measures equivalent contact resistance, to quickly determine that contact link whether there is security risk, prevents because contacting link
Reliability reduce and cause to be easy the problem of damaging device when high-current test.
The technical solution adopted by the present invention is a kind of voltage and current source test circuit, including voltage and current source, voltage electricity
Stream source includes control unit, output power amplifier, current measurement circuit and tension measuring circuit, and its four line Kelvins of connection
Circuit, the voltage and current source further include:
Two-pass DINSAR tension measuring circuit acquires the voltage on the pressure-wire and current line of four lines Kelvin's circuit,
By calculus of differences output difference voltage to described control unit.
By upper, by increasing differential voltage measuring circuit on the basis of the framework in original voltage and current source, due to voltage electricity
When stream source measures measured device, it can be contacted by golden finger or probe with measured device, equivalent contact resistance can be generated,
Pressure-wire and electric current that four line Kelvin circuits are connect with measured device are acquired by the differential voltage measuring circuit respectively at this time
Voltage on line, and carry out calculus of differences and be sent to control unit, differential voltage that control unit is obtained according to calculus of differences and
Known electric current can calculate golden finger or probe and contact generated equivalent contact resistance with measured device.
Wherein, the differential voltage measuring circuit includes the first differential operational amplifier and voltage follower；
The input terminal of the voltage follower connects the current line of four lines Kelvin's circuit, acquires voltage on its line,
Output end connects an input terminal of first differential operational amplifier；
Another input terminal of first differential operational amplifier connects the pressure-wire of four lines Kelvin's circuit, acquisition
Voltage on its line, output end connect described control unit；
The voltage of two input terminals is carried out calculus of differences by first differential operational amplifier, and output difference voltage is to described
Control unit.
By upper, the calculus of differences to two input terminal voltages can be realized by differential operational amplifier, and feed back single to control
Member.
Wherein, four lines Kelvin's circuit includes:
High-side current line, one end connect described control unit, and the other end connects measured device, goes back on the high-side current line
One output power amplifier of series connection；
Low-side current line, one end connect measured device, and the other end is grounded, range electricity of also connecting on the low-side current line
Resistance；
Second differential operational amplifier, two input terminals acquire the electric current at range resistance both ends, by calculus of differences
Output difference electric current is to described control unit；
High-end pressure-wire, for acquiring the voltage on high-side current line, output to third differential operational amplifier；
Lower terminal voltage line, for acquiring the voltage on low-side current line, output to third differential operational amplifier；
The third differential operational amplifier export after calculus of differences the differential voltage of high low side current line to described
Control unit.
Preferably, the two-pass DINSAR tension measuring circuit measures the high-side current of four lines Kelvin's circuit respectively
Line and the differential voltage of high-end pressure-wire and the differential voltage of low-side current line and lower terminal voltage line.
By upper, by the way that two differential voltage measuring circuits are arranged, can measure that four line Kelvins are high-end simultaneously and low side etc.
Contact resistance is imitated, and is independent of each other.
Wherein, the voltage and current source is by the four lines Kelvin circuit connection measured device, in measured device
Additional device forming circuit.
Wherein, the additional device includes diode.
It, can be with by using components with conduction such as additional devices, such as diode in measured device by upper
Four line Kelvin circuits and voltage and current source forming circuit, so as to carry out the measurement of subsequent differential voltage.
The present invention also provides a kind of voltage and current source test methods based on above-mentioned test circuit, comprising the following steps:
A, a constant current is exported by the current line that voltage and current source is arranged in control unit；
B, the voltage and current line on the pressure-wire of four line Kelvin's circuits is acquired respectively by differential voltage measuring circuit
On voltage, carry out calculus of differences；
C, the differential voltage that the differential voltage measuring circuit output is acquired by control unit, according to low-side current line string
The current value measured on the range resistance of connection, calculating current line connect the equivalent contact resistance generated with measured device.
By upper, based on above-mentioned voltage and current source, voltage and current source is set as to export constant electricity by the way that control unit is arranged
The mode of stream makes the constant current of output by high-side current line, measured device and low-side current line, forming circuit, pressure-wire
The Voltage Feedback measured also acquires the voltage generated in current line to differential voltage measuring circuit, by calculus of differences
Current line can be calculated because of pressure drop caused by equivalent contact resistance, by the measurement concatenated range resistance of low-side current line
Current value, then according to Ohm's law, it is known that in the case where voltage and current, the big of equivalent contact resistance can be calculated
It is small.
Wherein, it is further comprised the steps of: before the step A
Voltage and current source is formed back by four line Kelvin's circuit connection measured devices with the additional device in measured device
Road.
By upper, by the way that the high-end and low side of four line Kelvin's circuits is connected with the additional device in measured device respectively
It connects, to form complete loops.
It is further improved, is further comprised the steps of: before the step A
The pressure-wire of four line Kelvin's circuits and current line are shorted, measured on the pressure-wire and the line of current line
Equivalent resistance.
By upper, by being shorted by high-end pressure-wire and current line short circuit, and by the pressure-wire of low side and current line, survey
Equivalent resistance on its line is measured, whether within the specified scope to determine it, if it is within range, the equivalent contact resistance of next step can be carried out
Measurement, if determining golden finger or probe poor contact not in range, needing replacing.
Wherein, the error of the current value measured on the constant current value and the concatenated range resistance of the low-side current line
When more than limiting range, the poor contact of Cutoff current line and the measured device.
By upper, under normal circumstances, since current line is to connect with measured device, on the concatenated range resistance of low-side current line
The current value of measurement should be identical as the constant current value of output, can be calculated at this time according to the current value and differential voltage of measurement etc.
Contact resistance is imitated, but when current line and measured device poor contact, the perseverance of the current value measured and output on range resistance
Constant current value can then generate error, when error range is larger, be more than when limiting range such as 5%, can determine whether at this time current line with
The poor contact of measured device.
In conclusion the present invention has the advantage that compared with existing voltage and current source structure and test circuit
Additional differential voltage measurement may be implemented in increased differential voltage measuring circuit on high low-end line；
Increased differential voltage measuring circuit can carry out the measurement of differential voltage on high low-end line simultaneously；
Increased differential voltage measuring circuit does not influence original voltage and current source characteristic, i.e. voltage and current source is normal
When FV, FI, CV, CI, differential voltage measurement can be still carried out simultaneously.
Detailed description of the invention
Fig. 1 is the circuit diagram in traditional voltage and current source；
Fig. 2 is four line Kelvin's connection schematic diagrams of conventional voltage current source sources and DUT；
Fig. 3 is a kind of circuit diagram of the contact resistance of test DUT contact golden finger or probe in the prior art；
Fig. 4 is the circuit diagram of the contact resistance of another test DUT high end in contact golden finger or probe in the prior art；
Fig. 5 is the circuit diagram of the contact resistance of another test DUT low side contact golden finger or probe in the prior art；
Fig. 6 is the circuit diagram in voltage and current source of the present invention；
Fig. 7 is the circuit diagram for the first embodiment that voltage and current source of the present invention measures equivalent contact resistance；
Fig. 8 is the circuit diagram for the second embodiment that voltage and current source of the present invention measures equivalent contact resistance.
Specific embodiment
It is carried out referring to specific embodiment of Fig. 6~Fig. 8 to voltage and current source of the present invention test circuit detailed
It describes in detail bright.
As shown in fig. 6, the source VI is in original VI the present invention provides a kind of new voltage and current source (being referred to as the source VI below)
Increase two differential voltage measuring circuits on the basis of the framework of four line Kelvin's connection type of source, with measure the source VI and DUT it
Between differential voltage, according to known electric current, to be calculated generated equivalent when driving circuit is connect with measured device
Contact resistance.
Specifically, original framework in the source VI includes CONTROL control, power amplifier, current measurement circuit and electricity are exported
Measuring circuit, and its four line Kelvin's circuits of connection are pressed, which is respectively high-side current line (FH, Force
High), high-end pressure-wire (SH, Sense High), low-side current line (FL, Force Low), lower terminal voltage line (SL, Sense
Low)；
The source the VI framework at work, VI source module as needed is controlled by CONTROL, and the corresponding source VI is arrived in setting
Mode state, driving output power amplifier OP3 work export electric current from the end FH, and voltage follower OP1 and voltage follower OP5 are carried out
Voltage follow measurement, respectively obtains Vsh and Vsl, by differential operational amplifier OP2, obtains Vmeter signal, is sent into
CONTROL control is fed back and is measured；The signal exported simultaneously from the end FH flows through range resistance after DUT flows to the end FL
Ri eventually flows into the end GND；The voltage at the both ends difference amplifier OP4 measuring range resistance Ri, obtains Imeter signal, is sent into
CONTROL control is fed back and is measured；
The present invention adds additional two differential voltage measuring circuits on the basis of the original framework in the above-mentioned source VI, respectively
For measuring the differential voltage at the end FH and the end SH and the differential voltage at the end FL and the end SL；
Wherein, the differential voltage measuring circuit for being connected to the end FH and the end SH includes differential operational amplifier OP8 and is connected to
The voltage follower OP6 at the end SHx, the input terminal of differential operational amplifier OP8 receive the voltage at the end SHx and the electricity at the end SH respectively
Pressure, when work, the Vshx voltage of the end SHx measurement is sent into the just defeated of differential operational amplifier OP8 after voltage follower OP6
Enter end, the Vsh voltage at the end SH is sent into the negative input end of differential operational amplifier OP8, Vshx voltage after voltage follower OP1
With Vsh voltage after the calculus of differences of differential operational amplifier OP8, differential voltage Vdiff_High is obtained, is sent into CONTROL
Control measures；
Similarly, the differential voltage measuring circuit for being connected to the end FL and the end SL includes differential operational amplifier OP9 and is connected to
The voltage follower OP7 at the end SLx, the input terminal of differential operational amplifier OP9 receive the voltage at the end SLx and the electricity at the end SL respectively
Pressure, when work, it is defeated that the Vslx voltage of the end SLx measurement is sent into bearing for differential operational amplifier OP9 after voltage follower OP7
Enter end, the Vsl voltage at the end SL is sent into the positive input terminal of differential operational amplifier OP9, Vslx voltage after voltage follower OP5
With Vsl voltage after the calculus of differences of differential operational amplifier OP9, differential voltage Vdiff_Low is obtained, is sent into CONTROL
Control measures；
As shown in fig. 7, in one embodiment of the present of invention, using the above-mentioned improved source VI to measured device contact jaw
Equivalent contact resistance measures, but before using the connection type of four line Kelvins connection measured device DUT, passes through first
It is shorted FH line and SH line, the mode for being shorted FL line and SL line, whether are the sum of detection the sum of Rfhc and Rshc, Rflc and Rslc respectively
In a certain range, if it is within range, then measured device DUT is connected using the connection type of four line Kelvins, and the end SHx is connected
The FH line in four line Kelvins is connected to close to one end of DUT, the end SLx is connected to the FL line of four line Kelvins close to the one of DUT
Then circuit is done by the device of the additional device diode of DUT etc in end, cooperation differential voltage measuring circuit detection Rfhc and
The equivalent contact resistance value of Rflc；
The test specification of equivalent contact resistance, specific works are carried out by taking the additional device diode by DUT as an example below
Principle is as follows:
The setting of CONTROL control is passed through in the source VI, and the electric current I fixed from the constant output of the end FL one, electric current I pass through VI
The FL line of source periphery connection after DUT and FH line, flow back into the end FH, and the end SHx passes through peripheral conducting wire and connects FH line close to the one of DUT
End can measure the voltage on FH line, feed back after the voltage follower OP6 in differential voltage measuring circuit and put to calculus of differences
The positive input terminal of big device OP8, the sensing voltage on SH line feed back after the voltage follower OP1 inside the source VI arrives calculus of differences
The negative input end of amplifier OP8, after calculus of differences, differential operational amplifier OP8 output difference voltage Vdiff_High,
Due to being high impedance input inside the end SH and the end SHx, signal proximal end is identical as the voltage of distal end, resistance Rsh, Rshc and Rshx
It is negligible, therefore differential voltage Vdiff_High is electricity caused by the equivalent contact resistance Rfhc that generates on FH line
Then pressure measures the current value of the upper concatenated range resistance Ri of low-side current line FL, according to Ohm's law, by Vdiff_High and
The current value of range resistance Ri does operation, it can calculate the value of Rfhc, under normal circumstances, the current value of range resistance Ri with
The fixed current I of output is equal, i.e. Rfhc=Vdiff_High/I；
Similarly, the end SLx also can measure the voltage on FL line, by the voltage follower OP7 in differential voltage measuring circuit
Feedback arrives the negative input end of differential operational amplifier OP9 afterwards, and the sensing voltage on SL line is by the voltage follower inside the source VI
Feedback arrives the positive input terminal of differential operational amplifier OP9 after OP5, after calculus of differences, differential operational amplifier OP9 output
Differential voltage Vdiff_Low can calculate the equivalent contact resistance Rflc, i.e. Rflc generated on FL line according to Ohm's law
=Vdiff_Low/I；
It is worth noting that under normal circumstances, on low-side current line FL the current value of concatenated range resistance Ri with it is high-end
The fixed current I of current line FL output is equal, however when the poor contact of current line (golden finger or probe) and measured device,
The current value and fixed current I of range resistance Ri will appear error, at this time when error range is more than to limit range (such as 5%)
When, it can determine that current line poor contact, production when can also calculate poor contact according to the current value of range resistance Ri and differential voltage
Raw equivalent contact resistance.
As shown in figure 8, in another embodiment of the invention, when there is a plurality of current line between the source VI and measured device DUT
When in parallel, above-mentioned differential voltage measuring circuit can be switched to respectively by the way that relay is arranged in every current line by relay
It is measured in corresponding current line, measuring principle is consistent with above-described embodiment；
By connecting relay Ksh1, Kfh1, Ksl1, Kfl1, the equivalent of Rfhc1 and Rflc1 can be measured respectively and is connect
Electric shock resistance value.Similarly, relay Ksh2, Kfh2, Ksl2, Kfl2 are connected, the equivalent of Rfhc2 and Rflc2 can be measured respectively
Contact resistance value can also similarly test out the equivalent contact resistance value of Rfhcn and Rflcn.
The present embodiment is consistent with the principle of above-described embodiment, and specific measurement process and principle repeat no more, and difference is,
When there is the connection of a plurality of current line between the source VI and measured device, due to using switching, appointing for concern can be switched to
Two contact resistance points of anticipating carry out precise measurement, realize more flexible measurement method.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Within mind and principle, any modification, equivalent replacement, improvement and so on be should all be included in the protection scope of the present invention.
Claims (10)
1. circuit, including voltage and current source are tested in a kind of voltage and current source, which includes control unit, output power amplifier
Circuit, current measurement circuit and tension measuring circuit, and its four line Kelvin's circuits of connection, which is characterized in that the voltage
Current source further include:
Two-pass DINSAR tension measuring circuit acquires the voltage on the pressure-wire and current line of four lines Kelvin's circuit respectively,
By calculus of differences output difference voltage to described control unit.
2. test circuit according to claim 1, which is characterized in that the differential voltage measuring circuit includes the first difference
Operational amplifier and voltage follower；
The input terminal of the voltage follower connects the current line of four lines Kelvin's circuit, acquires voltage on its line, output
End connects an input terminal of first differential operational amplifier；
Another input terminal of first differential operational amplifier connects the pressure-wire of four lines Kelvin's circuit, acquires its line
Upper voltage, output end connect described control unit；
The voltage of two input terminals is carried out calculus of differences, output difference voltage to the control by first differential operational amplifier
Unit.
3. test circuit according to claim 1, which is characterized in that four lines Kelvin's circuit includes:
High-side current line, one end connect described control unit, and the other end connects measured device, also connects on the high-side current line
One output power amplifier；
Low-side current line, one end connect measured device, and the other end is grounded, a range resistance of also connecting on the low-side current line；
Second differential operational amplifier, two input terminals acquire the electric current at range resistance both ends, export by calculus of differences
Difference current is to described control unit；
High-end pressure-wire, for acquiring the voltage on high-side current line, output to third differential operational amplifier；
Lower terminal voltage line, for acquiring the voltage on low-side current line, output to third differential operational amplifier；
The third differential operational amplifier export after calculus of differences the differential voltage of high low side current line to the control
Unit.
4. test circuit according to claim 1, which is characterized in that the two-pass DINSAR tension measuring circuit is surveyed respectively
Measure the high-side current line of four lines Kelvin's circuit and the differential voltage of high-end pressure-wire and low-side current line and lower terminal voltage
The differential voltage of line.
5. test circuit according to claim 1, which is characterized in that the voltage and current source passes through the four lines Kelvin
Circuit connection measured device is formed into a loop with the additional device in measured device.
6. test circuit according to claim 5, which is characterized in that the additional device includes diode.
7. a kind of test method based on any test circuit of claim 1~6, which comprises the following steps:
A, a constant current is exported by the current line that voltage and current source is arranged in control unit；
B, it is acquired respectively by differential voltage measuring circuit on the voltage and current line on the pressure-wire of four line Kelvin's circuits
Voltage carries out calculus of differences；
C, the differential voltage of the differential voltage measuring circuit output is acquired by control unit, it is concatenated according to low-side current line
The current value measured on range resistance, calculating current line connect the equivalent contact resistance generated with measured device.
8. test method according to claim 7, which is characterized in that further comprised the steps of: before the step A
Voltage and current source is formed into a loop by four line Kelvin's circuit connection measured devices with the additional device in measured device.
9. test method according to claim 8, which is characterized in that further comprised the steps of: before the step A
The pressure-wire of four line Kelvin's circuits and current line are shorted, measured equivalent on the pressure-wire and the line of current line
Resistance.
10. test method according to claim 7, which is characterized in that the constant current value and the low-side current line
The error of the current value measured on concatenated range resistance is more than when limiting range, and Cutoff current line connects with the measured device
It touches bad.
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| CN112257371A (en) * | 2020-10-29 | 2021-01-22 | 国网河北省电力有限公司 | Power grid transmission line analysis system |
| CN116699475A (en) * | 2023-08-09 | 2023-09-05 | 湖南恩智测控技术有限公司 | Remote sampling contact detection system and method based on source meter and source meter device |
| CN117075003A (en) * | 2023-10-19 | 2023-11-17 | 青岛锐捷智能仪器有限公司 | Four-terminal test line contact detection method and system |
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2019
- 2019-08-15 CN CN201910754975.6A patent/CN110426622A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112257371A (en) * | 2020-10-29 | 2021-01-22 | 国网河北省电力有限公司 | Power grid transmission line analysis system |
| CN116699475A (en) * | 2023-08-09 | 2023-09-05 | 湖南恩智测控技术有限公司 | Remote sampling contact detection system and method based on source meter and source meter device |
| CN116699475B (en) * | 2023-08-09 | 2023-10-27 | 湖南恩智测控技术有限公司 | Remote sampling contact detection system and method based on source meter and source meter device |
| CN117075003A (en) * | 2023-10-19 | 2023-11-17 | 青岛锐捷智能仪器有限公司 | Four-terminal test line contact detection method and system |
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