CN110375858A - Spark detector testing probe head performance method - Google Patents
Spark detector testing probe head performance method Download PDFInfo
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- CN110375858A CN110375858A CN201910501759.0A CN201910501759A CN110375858A CN 110375858 A CN110375858 A CN 110375858A CN 201910501759 A CN201910501759 A CN 201910501759A CN 110375858 A CN110375858 A CN 110375858A
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- 239000000523 sample Substances 0.000 title claims abstract description 139
- 238000012360 testing method Methods 0.000 title claims abstract description 41
- 238000000034 method Methods 0.000 title claims abstract description 32
- 238000004088 simulation Methods 0.000 claims abstract description 79
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 9
- 230000035945 sensitivity Effects 0.000 claims abstract description 9
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 9
- 239000010703 silicon Substances 0.000 claims abstract description 9
- 239000000758 substrate Substances 0.000 claims abstract description 8
- 230000005855 radiation Effects 0.000 claims description 26
- 230000001105 regulatory effect Effects 0.000 claims description 17
- 230000004044 response Effects 0.000 claims description 16
- 238000001514 detection method Methods 0.000 claims description 9
- 230000003595 spectral effect Effects 0.000 claims description 9
- 238000013461 design Methods 0.000 claims description 8
- 230000003287 optical effect Effects 0.000 claims description 7
- 239000002210 silicon-based material Substances 0.000 claims description 6
- 230000010354 integration Effects 0.000 claims description 4
- 239000007787 solid Substances 0.000 claims description 4
- 230000005457 Black-body radiation Effects 0.000 abstract description 3
- 238000010892 electric spark Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- -1 detection pole (12) Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0014—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation from gases, flames
- G01J5/0018—Flames, plasma or welding
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
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- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
The invention discloses a kind of spark detector testing probe head performance methods, include the following steps.Step S1: the space layout between calibration spark simulation source and spark detector to be tested probe, to form original operating state.Step S2: the output parameter of spark simulation source is adaptively adjusted according to the type that spark detector to be tested is popped one's head in.Step S3: configuration signal generator successively moves sliding block until the maximum range value between spark detector probe and spark simulation source is recorded, to form the sensitivity parameter of spark detector probe to be tested.Spark detector testing probe head performance method disclosed in present patent application, thoroughly abandon using blackbody radiation source as spark simulation source, effectively improve the stability and accuracy of spark simulation source, it cannot be only used for the spark detector probe of calibration silicon substrate, can also can demarcate other kinds of spark detector probe by the way that the LED current of spark simulation source is adaptively adjusted.
Description
Technical field
The invention belongs to spark detector the field of test technology, and in particular to a kind of spark detector testing probe head performance side
Method.
Background technique
Publication No. CN206974957U, subject name are the utility model patent of electric spark detector, technical solution
Disclose " including host, high-voltage probe, detection pole (12), probe vehicles (11), the host are provided with integrated control electric appliance, sound
Warning device is rung, the high-voltage probe is provided with high pressure generator, and high-voltage probe connects host by connecting cable (8), described
Detection pole (12) is connected to high-voltage probe end, and the high-voltage probe is fixed on probe vehicles (11), in the probe vehicles (11)
Equipped with two-way drive motor ".
However, by taking above-mentioned utility model patent as an example, the existing instrument for electric spark detection is mainly used in pipeline
The electric spark in portion detects work, and the working principle for the electric spark that can be detected is generated using high-voltage pulse breakdown air gap,
Obviously there are significant differences with the composed structure of the invention patent, working principle.
It notices in spark detector the field of test technology, based on American standard (FM) and European standard (CEA).Its
In, above-mentioned American standard (referring to Spark Detection and Extinguishing Systems, such as 4.20 trifles) is only
It can be used for demarcating silicon-based detector, there is more apparent limitation for the type of spark detector, and be difficult to pass through adaptation
Property adjustment simultaneously suitable for other kinds of spark detector.In addition, above-mentioned European standard is (referring to Spark Detectors, example
Such as 5.2 trifles and appendix A) spark simulation source (radiation source) use blackbody radiation source, the stability of energy output is poor, drifts about
Range is big, no longer meets the mainstream developments trend such as high-precision, high sensitivity of spark detector the field of test technology, needs to give
To be further improved.
Summary of the invention
The present invention is directed to the situation of the prior art, overcomes disadvantages described above, provides a kind of spark detector testing probe head performance
Method.
Spark detector testing probe head performance method disclosed in present patent application, its main purpose is, providing wound
New and reliable means can be used simultaneously with detecting the performance parameters such as sensitivity, the response time of spark detector probe to be tested
In measuring and draw RDA curve.
Spark detector testing probe head performance method, another object disclosed in present patent application are, thoroughly get rid of
Blackbody radiation source outcast the soldier as spark simulation source, effectively improves the stability and accuracy of spark simulation source.
Spark detector testing probe head performance method, another object disclosed in present patent application are, not only may be used
Spark detector for demarcating silicon substrate is popped one's head in, and can also can demarcate it by the way that the LED current of spark simulation source is adaptively adjusted
The spark detector of his type is popped one's head in.
The present invention use following technical scheme, the spark detector testing probe head performance method the following steps are included:
Step S1: the space layout between calibration spark simulation source and spark detector to be tested probe, to be formed just
Beginning working condition；
Step S2: joined according to the output that spark simulation source is adaptively adjusted in the type that spark detector to be tested is popped one's head in
Number；
Step S3: configuration signal generator successively moves sliding block and simulates until spark detector probe is recorded with spark
Maximum range value between source, to form the sensitivity parameter of spark detector probe to be tested.
According to above technical scheme, as the further preferred technical solution of above technical scheme, the step S1 is specific
It is embodied as following steps:
Step S1.1: spark simulation source and guide rail are coaxially disposed, while spark simulation source is fixedly installed on optics and is put down
Platform；Probe gripper is fixedly installed in sliding block, while sliding block is placed in guide rail；
Step S1.2: spark detector is popped one's head in and is electrically connected with wiring of popping one's head in, while spark is clamped by probe gripper
Detector probe tightens the screw of the rear side positioned at probe gripper, and the X-axis turntable of probe gripper is set to by adjusting simultaneously
With Y-axis turntable make spark detector pop one's head in just facing towards spark simulation source；
Step S1.3: probe wire is accessed into control cabinet and opens control cabinet；
Step S1.4: opening the cross laser lamp for being located at the top of spark simulation source, is located at spark simulation source by adjusting
The upper edge that the lifting platform of lower section makes the horizontal line of cross laser lamp pop one's head in spark detector is overlapped, then by adjusting spark
Simulation source is overlapped the vertical line of cross laser lamp with the form center that spark detector is popped one's head in；
Step S1.5: cross laser lamp is closed.
According to above technical scheme, as the further preferred technical solution of above technical scheme, the step S2 is specific
It is embodied as following steps:
Step S2.1: D.C. regulated power supply is opened, and outputs it voltage and is adjusted to 5V, maximum output current is adjusted to 1A；
Step S2.2: the output end of the lead-out wire of spark simulation source and D.C. regulated power supply is electrically connected, and will be electric
Flow table series connection access circuit；
Step S2.3: adjusting the knob of spark simulation source, so that the registration of ammeter stablizes the spark detection in the type
The corresponding LED current of device probe；
Step S2.4: D.C. regulated power supply is closed, the line between D.C. regulated power supply and spark simulation source is simultaneously switched off；
Step S2.5: the output end of the lead-out wire of spark simulation source and signal generator is electrically connected, and by electric current
Table series connection access circuit；
Step S2.6: the operating mode of open signal generator and selective signal generator is continuous and pulse plasma models, together
When set impulse wave for the output waveform of signal generator and configure the design parameter of impulse wave.
According to above technical scheme, as the further preferred technical solution of above technical scheme, in the step S2.3,
The LED current of the spark detector probe of silicon substrate is obtained by following steps:
Step S2.3.1: the spectral response range for determining the spark detector probe of silicon substrate is 800~1100nm；
Step S2.3.2: the spark for being 900 DEG C for temperature calculates radiation intensity, Pu Lang according to Planck's law of radiation
Gram radiation intensity formula:
Wherein:
H: planck constant；
C: the light velocity in vacuum；
K: Boltzmann constant；
E: natural number；
π: pi；
λ: optical wavelength；
T: absolute temperature；
Step S2.3.3: integrating planck radiation strength formula, and limit of integration takes the spectral response model of silicon materials
It encloses, obtains:
Step S2.3.4: the numerical value that above formula is calculated, unit W/m2, it is assumed that spark is the sphere of radius r,
Surface area S=4 π r2, solid angle is 4 π, the radiation intensity of the sphere are as follows:
Wherein:
M: the value being calculated in step S2.3.3, unit w/m2；
R: radius of sphericity, 1mm；
Step S2.3.5: radius 1mm, the radiation intensity of 900 degrees Celsius of sphere are as follows: 0.420mW/Sr is calculated；
Step S2.3.6: according to the tables of data of LED, inquiry obtains the corresponding LED current size of 0.420mW/Sr and is
4.78mA。
According to above technical scheme, as the further preferred technical solution of above technical scheme, in the step S2.6,
The design parameter of impulse wave is frequency 1Hz, amplitude 5Vpp, biases 2.5V, pulsewidth 48ms.
According to above technical scheme, as the further preferred technical solution of above technical scheme, the spark detector
Testing probe head performance method further includes step S4:
Step S4: measuring and draws RDA curve.
According to above technical scheme, as the further preferred technical solution of above technical scheme, the step S4 is specific
It is embodied as following steps:
Step S4.1: resetting X-axis turntable, Y-axis turntable and sliding block, so that X-axis turntable, Y-axis turntable and sliding block
Restore original operating state；
Step S4.2: n-th adjusts X-axis turntable and the M times adjusting Y-axis turntable, so that spark detector probe is in X
The accumulative deflection angle of axis is (N*P) °, and it is (M*Q) ° that spark detector, which is popped one's head in the accumulative deflection angle of Y-axis,；
Step S4.3: by mobile sliding block to observe and judge whether control cabinet shows spark signal, if shown
Spark signal, which then records spark detector probe, to be added up deflection angle in X-axis and is (N*P) ° and adds up deflection angle in Y-axis and be
(M*Q) ° the distance between spark detector probe and spark simulation source value, while step S4.2 is repeated with n-th tune
It saves X-axis turntable and (M+1) secondary adjusting Y-axis turntable and resets sliding block；Otherwise spark detector is popped one's head in and is added up in X-axis
Deflection angle is (N*P) ° and between the spark detector probe and spark simulation source that Y-axis adds up that deflection angle is (M*Q) °
Distance value be denoted as maximum range value, while repeating step S4.2 with (N+1) secondary adjusting X-axis turntable and resetting Y
Axis turntable and sliding block；
Wherein, when spark detector is popped one's head in when X-axis is to rotate clockwise, spark detector is popped one's head in the accumulative inclined of X-axis
Gyration is (N*P) °；
Wherein, when spark detector probe is when X-axis is rotation counterclockwise, spark detector is popped one's head in the accumulative inclined of X-axis
Gyration is (- N*P) °；
Wherein, when spark detector is popped one's head in when Y-axis is to rotate clockwise, spark detector is popped one's head in the accumulative inclined of Y-axis
Gyration is (M*Q) °；
Wherein, when spark detector probe is when Y-axis is rotation counterclockwise, spark detector is popped one's head in the accumulative inclined of Y-axis
Gyration is (- M*Q) °；
Wherein, | M*Q | °≤90 °；
Wherein, N, M are natural number and are all larger than equal to 1.
According to above technical scheme, as the further preferred technical solution of above technical scheme, in the step S4:
P is 5 °；
Q is 10 °.
According to above technical scheme, as the further preferred technical solution of above technical scheme, the spark detector
Testing probe head performance method further includes step S5:
Step S5: the response time parameter of spark detector probe to be tested is detected.
According to above technical scheme, as the further preferred technical solution of above technical scheme, the step S5 is specific
Embodiment following steps:
Step S5.1: the operating mode of open signal generator and selective signal generator is burst mode, is matched simultaneously
Set that start-phase is 0 °, N circulation, periodicity 1, trigger source are manual；
Step S5.2: the probe of one of input channel of oscillograph is connected to the output end of signal generator, will be shown
The probe of another input channel of wave device is connected to the signal wire of spark detector probe, is then turned on oscillograph；
Step S5.3: mobile sliding is until spark detector probe is 10cm at a distance from spark simulation source；
Step S5.4: the triggering knob positioned at signal generator is pressed；
Step S5.5: measuring and the first signal of recording oscillometer and the initial time of second signal are poor；
Step S5.6: mobile sliding block successively increases the distance between spark detector probe and spark simulation source every time
10cm repeats step S5.4 to step S5.5, until stopping when the oscillograph of a certain distance fails effectively to detect spark
The only record start time difference.
Specific embodiment
The invention discloses a kind of spark detector testing probe head performance methods, below with reference to preferred embodiment, to this hair
Bright specific embodiment is further described.
Preferred embodiment.
Preferably, the spark detector testing probe head performance method the following steps are included:
Step S1: the space layout between calibration spark simulation source and spark detector to be tested probe, to be formed just
Beginning working condition；
Step S2: joined according to the output that spark simulation source is adaptively adjusted in the type that spark detector to be tested is popped one's head in
Number；
Step S3: configuration signal generator successively moves sliding block and simulates until spark detector probe is recorded with spark
Maximum range value between source, to form the sensitivity parameter of spark detector probe to be tested.
Further, the step S1 is embodied as following steps:
Step S1.1: spark simulation source and guide rail are coaxially disposed, while spark simulation source is fixedly installed on optics and is put down
Platform；Probe gripper is fixedly installed in sliding block, while sliding block is placed in guide rail；
Step S1.2: spark detector is popped one's head in and is electrically connected with wiring of popping one's head in, while spark is clamped by probe gripper
Detector probe tightens the screw of the rear side positioned at probe gripper, and the X-axis turntable of probe gripper is set to by adjusting simultaneously
With Y-axis turntable make spark detector pop one's head in just facing towards spark simulation source；
Step S1.3: probe wire is accessed into control cabinet and opens control cabinet；
Step S1.4: opening the cross laser lamp for being located at the top of spark simulation source, is located at spark simulation source by adjusting
The upper edge that the lifting platform of lower section makes the horizontal line of cross laser lamp pop one's head in spark detector is overlapped, then by adjusting spark
Simulation source is overlapped the vertical line of cross laser lamp with the form center that spark detector is popped one's head in；
Step S1.5: cross laser lamp is closed.
Further, the step S2 is embodied as following steps:
Step S2.1: D.C. regulated power supply is opened, and outputs it voltage and is adjusted to 5V, maximum output current is adjusted to 1A；
Step S2.2: the output end of the lead-out wire of spark simulation source and D.C. regulated power supply is electrically connected, and will be electric
Flow table series connection access circuit；
Step S2.3: adjusting the knob of spark simulation source, so that the registration of ammeter stablizes the spark detection in the type
The corresponding LED current of device probe；
Step S2.4: D.C. regulated power supply is closed, the line between D.C. regulated power supply and spark simulation source is simultaneously switched off；
Step S2.5: the output end of the lead-out wire of spark simulation source and signal generator is electrically connected, and by electric current
Table series connection access circuit；
Step S2.6: the operating mode of open signal generator and selective signal generator is continuous and pulse plasma models, together
When set impulse wave for the output waveform of signal generator and configure the design parameter of impulse wave.
Further, in the step S2.3, the LED current of the spark detector probe of silicon substrate is obtained by following steps:
Step S2.3.1: the spectral response range for determining the spark detector probe of silicon substrate is 800~1100nm；
Step S2.3.2: the spark for being 900 DEG C for temperature calculates radiation intensity, Pu Lang according to Planck's law of radiation
Gram radiation intensity formula:
Wherein:
H: planck constant；
C: the light velocity in vacuum；
K: Boltzmann constant；
E: natural number；
π: pi；
λ: optical wavelength；
T: absolute temperature；
Step S2.3.3: integrating planck radiation strength formula, and limit of integration takes the spectral response model of silicon materials
It encloses, obtains:
Step S2.3.4: the numerical value that above formula is calculated, unit W/m2, it is assumed that spark is the sphere of radius r,
Surface area S=4 π r2, solid angle is 4 π, the radiation intensity of the sphere are as follows:
Wherein:
M: the value being calculated in step S2.3.3, unit w/m2；
R: radius of sphericity, 1mm；
Step S2.3.5: radius 1mm, the radiation intensity of 900 degrees Celsius of sphere are as follows: 0.420mW/Sr is calculated；
Step S2.3.6: according to the tables of data of LED, inquiry obtains the corresponding LED current size of 0.420mW/Sr and is
4.78mA。
Further, in the step S2.6, the design parameter of impulse wave is frequency 1Hz, amplitude 5Vpp, biasing 2.5V,
Pulsewidth 48ms.
Further, the spark detector testing probe head performance method further includes step S4:
Step S4: measuring and draws RDA curve.
Further, the step S4 is embodied as following steps:
Step S4.1: resetting X-axis turntable, Y-axis turntable and sliding block, so that X-axis turntable, Y-axis turntable and sliding block
Restore original operating state；
Step S4.2: n-th adjusts X-axis turntable and the M times adjusting Y-axis turntable, so that spark detector probe is in X
The accumulative deflection angle of axis is (N*P) °, and it is (M*Q) ° that spark detector, which is popped one's head in the accumulative deflection angle of Y-axis,；
Step S4.3: by mobile sliding block to observe and judge whether control cabinet shows spark signal, if shown
Spark signal, which then records spark detector probe, to be added up deflection angle in X-axis and is (N*P) ° and adds up deflection angle in Y-axis and be
(M*Q) ° the distance between spark detector probe and spark simulation source value, while step S4.2 is repeated with n-th tune
It saves X-axis turntable and (M+1) secondary adjusting Y-axis turntable and resets sliding block；Otherwise spark detector is popped one's head in and is added up in X-axis
Deflection angle is (N*P) ° and between the spark detector probe and spark simulation source that Y-axis adds up that deflection angle is (M*Q) °
Distance value be denoted as maximum range value, while repeating step S4.2 with (N+1) secondary adjusting X-axis turntable and resetting Y
Axis turntable and sliding block；
Wherein, when spark detector is popped one's head in when X-axis is to rotate clockwise, spark detector is popped one's head in the accumulative inclined of X-axis
Gyration is (N*P) °；
Wherein, when spark detector probe is when X-axis is rotation counterclockwise, spark detector is popped one's head in the accumulative inclined of X-axis
Gyration is (- N*P) °；
Wherein, when spark detector is popped one's head in when Y-axis is to rotate clockwise, spark detector is popped one's head in the accumulative inclined of Y-axis
Gyration is (M*Q) °；
Wherein, when spark detector probe is when Y-axis is rotation counterclockwise, spark detector is popped one's head in the accumulative inclined of Y-axis
Gyration is (- M*Q) °；
Wherein, | M*Q | °≤90 °；
Wherein, N, M are natural number and are all larger than equal to 1.
Further, in the step S4:
P is 5 °；
Q is 10 °.
Further, the spark detector testing probe head performance method further includes step S5:
Step S5: the response time parameter of spark detector probe to be tested is detected.
Further, the step S5 is embodied as following steps:
Step S5.1: the operating mode of open signal generator and selective signal generator is burst mode, is matched simultaneously
Set that start-phase is 0 °, N circulation, periodicity 1, trigger source are manual；
Step S5.2: the probe of one of input channel of oscillograph is connected to the output end of signal generator, will be shown
The probe of another input channel of wave device is connected to the signal wire of spark detector probe, is then turned on oscillograph；
Step S5.3: mobile sliding is until spark detector probe is 10cm at a distance from spark simulation source；
Step S5.4: the triggering knob positioned at signal generator is pressed；
Step S5.5: measuring and the first signal of recording oscillometer and the initial time of second signal are poor；
Step S5.6: mobile sliding block successively increases the distance between spark detector probe and spark simulation source every time
10cm repeats step S5.4 to step S5.5, until stopping when the oscillograph of a certain distance fails effectively to detect spark
The only record start time difference.
Spark detector testing probe head performance method disclosed in present patent application, be related to multimeter (containing ammeter and
Voltmeter), D.C. regulated power supply, signal generator, spark simulation source, oscillograph and probe gripper etc., specific work process is such as
Under.
First, sensitivity test.
1.1 are coaxially disposed spark simulation source and guide rail, while spark simulation source is fixedly installed on optical platform；It will visit
Fixture head is fixedly installed in the sliding block (positioned at optical platform), while sliding block is placed in guide rail.
1.2 pop one's head in (to be tested) spark detector is electrically connected with wiring of popping one's head in, while being clamped by probe gripper
Spark detector pops one's head in (side of probe is flushed with the side of fixture).The screw of the rear side positioned at probe gripper is tightened,
To fix spark detector probe.Make fire by adjusting the X-axis turntable for being set to probe gripper and Y-axis turntable simultaneously
Flower detector probe just facing towards spark simulation source, it is ensured that (spark detector probe) X-axis and the equal zero deflection of Y-axis.
Probe wire is accessed control cabinet and opens control cabinet by 1.3.
1.4 open the cross laser lamp for being located at the top of spark simulation source, are located at below spark simulation source by adjusting
The upper edge that lifting platform makes the horizontal line of cross laser lamp pop one's head in spark detector is overlapped, then by adjusting spark simulation source
So that the vertical line of cross laser lamp is overlapped with the form center that spark detector is popped one's head in.
1.5 close cross laser lamp.
1.6 open D.C. regulated power supply, and output it voltage and be adjusted to 5V, and maximum output current is adjusted to 1A.
The output end of the lead-out wire of spark simulation source and D.C. regulated power supply is electrically connected and (forms the first circuit) by 1.7,
And ammeter is connected and accesses (first) circuit.
1.8 adjust the knob of spark simulation source, so that the registration of ammeter is stablized in (the spark detector probe of the type
Corresponding LED current) 4.78mA.
1.9 close D.C. regulated power supply, simultaneously switch off the line between D.C. regulated power supply and spark simulation source.
The output end of the lead-out wire of spark simulation source and signal generator is electrically connected and (forms second circuit) by 1.10, and
And ammeter is connected and accesses (second) circuit.
The operating mode of 1.11 open signal generators and selective signal generator is continuous and pulse plasma models, while will letter
The output waveform of number generator is set as impulse wave and configures the design parameter of impulse wave, and the design parameter of impulse wave is frequency
1Hz, amplitude 5Vpp, biasing 2.5V, pulsewidth 48ms.
1.12, in the case where guaranteeing the registration of test environment relative darkness and ammeter within the allowable range, pass through shifting
Movable slider is to which observation is by the spark signal shown in control cabinet.
1.13 successively move sliding block (sliding block while spark detector being driven to pop one's head in synchronizing moving) until (control cabinet is recorded
Spark signal can be shown, spark can be effectively detected) spark detector probe spark simulation source between maximum distance
Value.
Second, relative distance and angular relationship curve (RDA curve) are tested.
2.1 repeat the step 1.1-1.13 of above-mentioned sensitivity test.
2.2 adjust X-axis turntables so that spark detector probe clockwise or counter-clockwise deflect 5 ° (clockwise for+,
Be counterclockwise -).
2.3, in the case where guaranteeing the registration of test environment relative darkness and ammeter within the allowable range, pass through shifting
Movable slider is to which observation is by the spark signal shown in control cabinet.
2.4 successively move sliding block (sliding block at the same drive spark detector pop one's head in synchronizing moving) until be recorded this clockwise
Or add up corresponding (control cabinet can show spark signal, can effectively the detect spark) spark detection of deflection angle counterclockwise
Maximum range value between device probe and spark simulation source.
2.5 on the basis of previous execution step 2.2, repeats step 2.2-2.4 and (adjusts X-axis turntable again, make
It is inclined clockwise or counter-clockwise again on the basis of former accumulative deflection angle clockwise or counter-clockwise to obtain spark detector probe
Turn 5 °), it successively moves sliding block and records the corresponding spark detector spy of each deflection angle accumulative clockwise or counter-clockwise respectively
Maximum range value between head and spark simulation source, until being controlled in a certain accumulative deflection angle clockwise or counter-clockwise
Case fails to stop recording maximum range value when showing spark signal (failing effectively to detect spark).
2.6 resetting Y-axis turntables and sliding block, so that Y-axis turntable and sliding block restore original operating state.
2.7 spark detectors probe readjusts Y-axis on the basis of former accumulative deflection angle clockwise or counter-clockwise
Turntable, so that spark detector is popped one's head in along 10 ° of throw of pointer.
2.8, in the case where guaranteeing the registration of test environment relative darkness and ammeter within the allowable range, pass through shifting
Movable slider is to which observation is by the spark signal shown in control cabinet.
2.9 successively move sliding block (sliding block at the same drive spark detector pop one's head in synchronizing moving) until be recorded this clockwise
Or add up corresponding (control cabinet can show spark signal, can effectively the detect spark) spark detection of deflection angle counterclockwise
Maximum range value between device probe and spark simulation source.
2.10 on the basis of previous execution step 2.7, repeat step 2.7-2.9 (again adjust Y-axis turntable,
So that 10 ° of the deflection clockwise again on the basis of former accumulative deflection angle clockwise or counter-clockwise of spark detector probe), according to
Secondary mobile sliding block records each deflection angle that adds up clockwise or counter-clockwise respectively and (adds up deflection angle clockwise or counter-clockwise
Degree is not more than 90 °) maximum range value between corresponding spark detector probe and spark simulation source.
2.16 (according to the data recorded above) draw RDA curve.
Third, the response time tests.
3.1 repeat the step 1.1-1.13 of above-mentioned sensitivity test.
The operating mode of 3.2 open signal generators and selective signal generator is burst mode, while configuring starting
Phase is 0 °, N circulation, periodicity 1, trigger source are manual.
3.3 output ends that the probe of one of input channel of oscillograph is connected to signal generator (are used for transmission
The data of one signal), the probe of another input channel of oscillograph is connected to the signal wire of spark detector probe (for passing
The data of defeated second signal), it is then turned on oscillograph.
3.4 mobile slidings are until spark detector probe is 10cm at a distance from spark simulation source.
3.5, in the case where guaranteeing to test environment relative darkness, press the triggering knob positioned at signal generator.
3.6 measurement and the first signal of recording oscillometer and the initial time of second signal it is poor (i.e. response time).
3.7 each mobile sliding blocks make the distance between spark detector probe and spark simulation source successively increase 10cm,
Step 3.5-3.6 is repeated, until in the oscillograph of a certain (between spark detector probe and spark simulation source) distance
It is poor (i.e. response time) to fail to stop recording (the first signal and second signal) initial time when effectively detecting spark.
According to above preferred embodiment, spark detector testing probe head performance method disclosed in present patent application is related to
And spark simulation source, be specifically described as follows.
1. determining the spectral response range of spark detector probe.
Since spark detector probe preferably uses silicon materials, so spectral response range is in 800~1100nm.
2. the spark for being 900 DEG C for temperature calculates radiation intensity, planck radiation intensity according to Planck's law of radiation
Formula:
Wherein:
H: planck constant；
C: the light velocity in vacuum；
K: Boltzmann constant；
E: natural number；
π: pi；
λ: optical wavelength；
T: absolute temperature.
Planck radiation strength formula is integrated, limit of integration takes the spectral response range of silicon materials, it obtains:
3, it converts.The numerical value that above formula is calculated, unit W/m2, it is physical quantity of the power to area, reaction is single
The radiant power of plane product.Since the radiation intensity of LED is W/Sr, need to convert.
Assuming that the spark for needing to detect is the sphere of radius r, surface area S=4 π r2, solid angle is 4 π.So the ball
The radiation intensity of body are as follows:
Wherein:
M: the value being calculated in step 2, unit w/m2；
R: radius of sphericity, 1mm；
Finally be calculated: radius 1mm, the radiation intensity of the sphere of 900 degrees Celsius (900+273.15K) is (by silicon materials
The part seen) are as follows: 0.420mW/Sr.
4, according to the tables of data of LED (Datasheet), inquiry obtains the corresponding size of current of 0.420mW/Sr
(4.78mA).LED operation is under the electric current, just with 0.420mW/Sr to external radiation, can simulate a radius 1mm, and 900 degrees Celsius
The sphere spark of (900+273.15K).
It is noted that the technical characteristics such as ammeter, oscillograph that present patent application is related to should be considered as existing
Technology, specific structure, working principle and the control mode that may relate to, the space layout mode of these technical characteristics use
The conventional selection of this field, is not construed as where the inventive point of the invention patent, and the invention patent does not do further tool
Body expansion is described in detail.
For a person skilled in the art, technical solution documented by foregoing embodiments can still be repaired
Change or equivalent replacement of some of the technical features, it is all within the spirits and principles of the present invention, made any to repair
Change, equivalent replacement, improvement etc., should be included in protection scope of the present invention.
Claims (10)
1. a kind of spark detector testing probe head performance method, which comprises the following steps:
Step S1: the space layout between calibration spark simulation source and spark detector to be tested probe, to form initial work
Make state；
Step S2: the output parameter of spark simulation source is adaptively adjusted according to the type that spark detector to be tested is popped one's head in；
Step S3: configuration signal generator, successively move sliding block until be recorded spark detector probe with spark simulation source it
Between maximum range value, to form the sensitivity parameter of spark detector probe to be tested.
2. spark detector testing probe head performance method according to claim 1, which is characterized in that the step S1 is specific
It is embodied as following steps:
Step S1.1: spark simulation source and guide rail are coaxially disposed, while spark simulation source is fixedly installed on optical platform；It will
Probe gripper is fixedly installed in sliding block, while sliding block is placed in guide rail；
Step S1.2: spark detector is popped one's head in and is electrically connected with wiring of popping one's head in, while spark detection is clamped by probe gripper
Device probe, tightens the screw of the rear side positioned at probe gripper, and the X-axis turntable and Y of probe gripper are set to by adjusting simultaneously
Axis turntable make spark detector pop one's head in just facing towards spark simulation source；
Step S1.3: probe wire is accessed into control cabinet and opens control cabinet；
Step S1.4: opening the cross laser lamp for being located at the top of spark simulation source, is located at below spark simulation source by adjusting
Lifting platform upper edge that the horizontal line of cross laser lamp is popped one's head in spark detector be overlapped, then by adjusting spark simulation
Source is overlapped the vertical line of cross laser lamp with the form center that spark detector is popped one's head in；
Step S1.5: cross laser lamp is closed.
3. spark detector testing probe head performance method according to claim 2, which is characterized in that the step S2 is specific
It is embodied as following steps:
Step S2.1: D.C. regulated power supply is opened, and outputs it voltage and is adjusted to 5V, maximum output current is adjusted to 1A；
Step S2.2: the output end of the lead-out wire of spark simulation source and D.C. regulated power supply is electrically connected, and by ammeter
Series connection access circuit；
Step S2.3: adjusting the knob of spark simulation source, so that the registration of ammeter stablizes the spark detector spy in the type
Corresponding LED current；
Step S2.4: D.C. regulated power supply is closed, the line between D.C. regulated power supply and spark simulation source is simultaneously switched off；
Step S2.5: the output end of the lead-out wire of spark simulation source and signal generator is electrically connected, and by ammeter string
Couple into circuit；
Step S2.6: the operating mode of open signal generator and selective signal generator is continuous and pulse plasma models, simultaneously will
The output waveform of signal generator is set as impulse wave and configures the design parameter of impulse wave.
4. spark detector testing probe head performance method according to claim 3, which is characterized in that the step S2.3
In, the LED current of the spark detector probe of silicon substrate is obtained by following steps:
Step S2.3.1: the spectral response range for determining the spark detector probe of silicon substrate is 800~1100nm；
Step S2.3.2: the spark for being 900 DEG C for temperature calculates radiation intensity, Planck spoke according to Planck's law of radiation
Penetrate strength formula:
Wherein:
H: planck constant；
C: the light velocity in vacuum；
K: Boltzmann constant；
E: natural number；
π: pi；
λ: optical wavelength；
T: absolute temperature；
Step S2.3.3: integrating planck radiation strength formula, and limit of integration takes the spectral response range of silicon materials, obtains
It arrives:
Step S2.3.4: the numerical value that above formula is calculated, unit W/m2, it is assumed that spark is the sphere of radius r, surface
Product S=4 π r2, solid angle is 4 π, the radiation intensity of the sphere are as follows:
Wherein:
M: the value being calculated in step S2.3.3, unit w/m2；
R: radius of sphericity, 1mm；
Step S2.3.5: radius 1mm, the radiation intensity of 900 degrees Celsius of sphere are as follows: 0.420mW/Sr is calculated；
Step S2.3.6: according to the tables of data of LED, it is 4.78mA that inquiry, which obtains the corresponding LED current size of 0.420mW/Sr,.
5. spark detector testing probe head performance method according to claim 3, which is characterized in that the step S2.6
In, the design parameter of impulse wave is frequency 1Hz, amplitude 5Vpp, biases 2.5V, pulsewidth 48ms.
6. spark detector testing probe head performance method, feature described in any one of -5 claims according to claim 1
It is, the spark detector testing probe head performance method further includes step S4:
Step S4: measuring and draws RDA curve.
7. spark detector testing probe head performance method according to claim 6, which is characterized in that the step S4 is specific
It is embodied as following steps:
Step S4.1: resetting X-axis turntable, Y-axis turntable and sliding block, so that X-axis turntable, Y-axis turntable and sliding block restore
Original operating state；
Step S4.2: n-th adjusts X-axis turntable and the M times adjusting Y-axis turntable, so that spark detector probe is in X-axis
Accumulative deflection angle is (N*P) °, and it is (M*Q) ° that spark detector, which is popped one's head in the accumulative deflection angle of Y-axis,；
Step S4.3: by mobile sliding block to observe and judge whether control cabinet shows spark signal, if showing spark
Signal then records spark detector probe and adds up that deflection angle is (N*P) ° and to add up deflection angle in Y-axis be (M* in X-axis
) ° Q the distance between spark detector probe and spark simulation source value, while repeating step S4.2 and X is adjusted with n-th
Axis turntable and (M+1) secondary adjusting Y-axis turntable and reset sliding block；Otherwise spark detector is popped one's head in accumulative inclined in X-axis
Gyration is (N*P) ° and between the spark detector probe and spark simulation source that Y-axis adds up that deflection angle is (M*Q) °
Distance value is denoted as maximum range value, while repeating step S4.2 with (N+1) secondary adjusting X-axis turntable and resetting Y-axis
Turntable and sliding block；
Wherein, when spark detector is popped one's head in when X-axis is to rotate clockwise, spark detector is popped one's head in the accumulative deflection angle of X-axis
Degree is (N*P) °；
Wherein, when spark detector is popped one's head in when X-axis is rotation counterclockwise, spark detector is popped one's head in the accumulative deflection angle of X-axis
Degree is (- N*P) °；
Wherein, when spark detector is popped one's head in when Y-axis is to rotate clockwise, spark detector is popped one's head in the accumulative deflection angle of Y-axis
Degree is (M*Q) °；
Wherein, when spark detector is popped one's head in when Y-axis is rotation counterclockwise, spark detector is popped one's head in the accumulative deflection angle of Y-axis
Degree is (- M*Q) °；
Wherein, | M*Q | °≤90 °；
Wherein, N, M are natural number and are all larger than equal to 1.
8. spark detector testing probe head performance method according to claim 7, it is characterised in that: in the step S4:
P is 5 °；
Q is 10 °.
9. spark detector testing probe head performance method according to claim 6, which is characterized in that the spark detector
Testing probe head performance method further includes step S5:
Step S5: the response time parameter of spark detector probe to be tested is detected.
10. spark detector testing probe head performance method according to claim 9, which is characterized in that the step S5 tool
Body is embodied as following steps:
Step S5.1: the operating mode of open signal generator and selective signal generator is burst mode, while being configured
Beginning phase is 0 °, N circulation, periodicity 1, trigger source are manual；
Step S5.2: the probe of one of input channel of oscillograph is connected to the output end of signal generator, by oscillograph
Another input channel probe be connected to spark detector probe signal wire, be then turned on oscillograph；
Step S5.3: mobile sliding is until spark detector probe is 10cm at a distance from spark simulation source；
Step S5.4: the triggering knob positioned at signal generator is pressed；
Step S5.5: measuring and the first signal of recording oscillometer and the initial time of second signal are poor；
Step S5.6: mobile sliding block successively increases the distance between spark detector probe and spark simulation source every time
10cm repeats step S5.4 to step S5.5, until stopping when the oscillograph of a certain distance fails effectively to detect spark
The only record start time difference.
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