CN110346746A - Digital combining unit accuracy closed loop test method and system - Google Patents
Digital combining unit accuracy closed loop test method and system Download PDFInfo
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- CN110346746A CN110346746A CN201910490247.9A CN201910490247A CN110346746A CN 110346746 A CN110346746 A CN 110346746A CN 201910490247 A CN201910490247 A CN 201910490247A CN 110346746 A CN110346746 A CN 110346746A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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Abstract
The invention discloses a kind of digital combining unit accuracy closed loop test methods, are not limited by simulation signal generator and electronic mutual inductor, are not also limited by electronic mutual inductor FT3 sampling value message real-time Transmission；When test, testing tool calls the sample values prestored in basic database, generates FT3 sampling value message and is sent to digital combining unit, while receiving the SV sampling value message of digital combining unit output, forms closed loop test system；During playback and reception sample values, testing tool is responsible for for electronic mutual inductor FT3 sample values being aligned in the time domain with the SV sample values that digital combining unit exports, calculate error between the two, the result as digital combining unit accuracy；The present invention is applied in digital combining unit type approval test, reduces difficulty of test, improves testing efficiency, meets the examination demand of digital combining unit items stable state and transient performance index.
Description
Technical field
The present invention relates to electrical equipment technical field, in particular to a kind of digital combining unit accuracy closed loop test side
Method.
Background technique
Data source of the digital combining unit as the digital substation interval layer equipment for following IEC61850 standard,
It acts on particularly significant, the electrical quantity that electronic mutual inductor transmits can be merged and synchronization process, and will be after processing
Digital signal be transmitted to bay device according to specific format and use, realize to a certain extent the shared of process layer data and
Digitlization.Power industry standard " DL/T282-2012 combining unit technical conditions " and State Grid Corporation of China company standard " Q/
GDW1426-2016 Intelligent substation merging unit technical specification " all the function and performance of digital combining unit are advised
Model, wherein the accuracy index of digital combining unit is the key that determination data Transfer characteristic, and emphasis is needed to examine.
Currently, needing the cooperation of electronic mutual inductor for the test of digital combining unit accuracy index, mould is utilized
Quasi- signal source electron formula mutual inductor applies an electrical quantity, then received simultaneously by test equipment electronic mutual inductor and
Data in two kinds of sampling value messages are carried out error analysis by the sampling value message of digital combining unit output.
Existing digital combining unit accuracy test method has the following drawbacks: 1) simulation signal generator need to by boosting,
Up-flow measure could export an electrical quantity of electronic mutual inductor needs, cause test can only in a small number of conditional times and
Place carries out, and difficulty of test is big；2) existing test macro is difficult to realize input electronic mutual inductor multichannel while boosting, rise
Stream causes Transfer characteristic when the asynchronous access of digital combining unit multichannel data to be difficult to examine；3) existing test macro can not
Electron formula mutual inductor output 63kA or more and damping time constant meet the transient fault signal of test request, lead to number
The transient signal Transfer characteristic of formula combining unit is difficult to examine；4) existing test macro can not the output of simulation electronic formula mutual inductor
The situation of FT3 sampling value message exception, causes the fault tolerant mechanism of digital combining unit that can not examine.
Summary of the invention
The purpose of the present invention is to solve defect in the prior art, a kind of digital combining unit accuracy is provided and is closed
Ring test method.
To achieve the above object, technical scheme is as follows:
A kind of digital combining unit accuracy closed loop test method, comprising the following steps:
S1: waveform conversion module converts original waveform data to the sample values of csv format；
S2:FT3 sends channel information and the channel information description that control module obtains tested device SV sample values,
FT3 sends control module and is described to generate SV sampled value report according to the channel information and channel information of the SV sample values of acquisition
Text, FT3 send the total data channel that control module shows SV sampling value message, are then the distribution of each data channel and its
Corresponding FT3 sampling data passageway, so that the data channel of tested SV sampled value and FT3 sampled value corresponds；
S3:FT3, which sends control module and sends parameter to the sample values of csv format, carries out configuration and by csv format
Sample values are handed down to front end processor by FTP mode；
S4: front end processor receives the sample values of csv format, sends the configuration that control module issues according to FT3 and generates electricity
Minor mutual inductor FT3 sampling value message, and it is sent to tested device, while sending time will be started and return to FT3 transmission control
Module；
S5:FT3 sends control module and receives the information that front end processor returns, and passes to data processing module；
S6: tested device exports SV sampling value message to data processing module, and data processing module is according to FT3 sampled value report
The sending time of text is aligned FT3 sample values and SV sample values by sampling sequence number in the time domain, carries out error analysis,
And analysis result is transferred to result display module；
S7: result display module comes out analysis as the result is shown, is completed.
In order to further realize the present invention, the format of the original waveform data is comtrade or pcap.
In order to further realize the present invention, original waveform data is converted csv format by waveform conversion module in the S1
Sample values when available parameter, the parameter include protocol type, sampling number, initial time, sampled point send phase
To at least one of time.
In order to further realize the present invention, the parameter in the S3 includes FT3 type of message and sample values and FT3
Corresponding relationship between sample values channel.
In order to further realize the present invention, the tested device is digital combining unit.
In order to further realize the present invention, the front end processor is FT3 sending device.
In order to further realize the present invention, the front end processor calls the sampled data value prestored in basic database, generates
FT3 sampling value message is simultaneously sent to digital combining unit.
A kind of digital combining unit accuracy closed loop test system, the digital combining unit accuracy closed loop test
The test method stated is fastened to be tested.
In order to further realize the present invention, it is provided with tested device and test equipment, the tested device is digital conjunction
And unit, the test equipment are provided with background computer and front end processor；
The background computer is connect with front end processor, and the front end processor is connect with digital combining unit；
The background computer editor test cases and operation test cases and to FT3 sampling value message and SV sampling value message it
Between error analyzed and determined, the front end processor is responsible for calling the sampled value number that prestores in basic database according to configuration
According to generation FT3 sampling value message is simultaneously sent to digital combining unit, while receiving the SV sampling of digital combining unit output
Value message is simultaneously transmitted to background computer.
In order to further realize the present invention, the background computer be provided with Wave data conversion module, sampling data passageway,
FT3 sends control module, data processing module and result display module, and the front end processor is FT3 sending device；
The Wave data conversion module is connect with sampling data passageway, and the sampling data passageway is sent with FT3 respectively
Control module is connected with data processing module, and the FT3 sends control module and connect with FT3 sending device, and the FT3 transmission is set
Standby to connect with digital combining unit, the digital combining unit is connect with data processing module, the data processing module
It is connect with result display module.
Beneficial effect
The digital combining unit accuracy closed loop test method of the present invention, not by simulation signal generator and electronic mutual inductor
Limitation, is not also limited by electronic mutual inductor FT3 sampling value message real-time Transmission, and the present invention is based on sample values playback is former
Reason works, and when test, testing tool calls the sample values prestored in basic database, generates FT3 sampling value message
And it is sent to digital combining unit, while receiving the SV sampling value message of digital combining unit output, form closed loop test
System；During playback and reception sample values, testing tool is responsible for electronic mutual inductor FT3 sample values and number
The SV sample values of word formula combining unit output are aligned in the time domain, error between the two are calculated, as digital
The result of combining unit accuracy；The present invention is applied in digital combining unit type approval test, reduces test
Difficulty improves testing efficiency, meets the examination demand of digital combining unit items stable state and transient performance index.
Detailed description of the invention
Fig. 1 is the structure chart of the digital combining unit accuracy closed loop test system of the present invention；
Fig. 2 is the digital combining unit accuracy closed loop test system flow chart of the present invention.
Include: in Fig. 1-Fig. 2
Data conversion module 1；
Sampling data passageway 2；
FT3 sends control module 3；
Data processing module 4；
Result display module 5；
FT3 sending device 6；
Digital combining unit 7.
Specific embodiment
The present invention is further described in detail with reference to the accompanying drawing, these attached drawings are simplified schematic diagram, only
The basic structure that the invention is illustrated in a schematic way.
Embodiment 1
The present invention provides a kind of digital combining unit accuracy closed loop test method, comprising the following steps:
S1: waveform conversion module converts original waveform data to the sample values of csv format, original waveform data
Format is comtrade or pcap；
Available parameter when original waveform data is converted the sample values of csv format by waveform conversion module in S1,
Parameter includes at least one of protocol type, sampling number, initial time, sampled point transmission relative time.
S2:FT3 sends channel information and the channel information description that control module obtains tested device SV sample values,
FT3 sends control module and is described to generate SV sampled value report according to the channel information and channel information of the SV sample values of acquisition
Text, FT3 send the total data channel that control module shows SV sampling value message, are then the distribution of each data channel and its
Corresponding FT3 sampling data passageway, so that the data channel of tested SV sampled value and FT3 sampled value corresponds；
S3:FT3, which sends control module and sends parameter to the sample values of csv format, carries out configuration and by csv format
Sample values are handed down to front end processor by FTP mode；
Parameter in S3 includes corresponding between FT3 type of message and sample values and FT3 sample values channel
Relationship.
S4: front end processor receives the sample values of csv format, sends the configuration that control module issues according to FT3 and generates electricity
Minor mutual inductor FT3 sampling value message, and it is sent to tested device, while sending time will be started and return to FT3 transmission control
Module；
S5:FT3 sends control module and receives the information that front end processor returns, and passes to data processing module；
S6: tested device exports SV sampling value message to data processing module, and data processing module is according to FT3 sampled value report
The sending time of text is aligned FT3 sample values and SV sample values by sampling sequence number in the time domain, carries out error analysis,
And analysis result is transferred to result display module；
S7: display module comes out analysis as the result is shown.
Tested device is digital combining unit.
Front end processor is FT3 sending device, and front end processor calls the sampled data value prestored in basic database, generates FT3 and adopts
Sample value message is simultaneously sent to digital combining unit.
The digital combining unit accuracy closed loop test method of the present invention, not by simulation signal generator and electronic mutual inductor
Limitation, is not also limited by electronic mutual inductor FT3 sampling value message real-time Transmission.The present invention is based on sample values playback is former
Reason works, and when test, testing tool calls the sample values prestored in basic database, generates FT3 sampling value message
And it is sent to digital combining unit, while receiving the SV sampling value message of digital combining unit output, form closed loop test
System.During playback and reception sample values, testing tool is responsible for electronic mutual inductor FT3 sample values and number
The SV sample values of word formula combining unit output are aligned in the time domain, error between the two are calculated, as digital
The result of combining unit accuracy；The present invention is applied in digital combining unit type approval test, reduces test
Difficulty improves testing efficiency, meets the examination demand of digital combining unit items stable state and transient performance index.
Embodiment 2
As depicted in figs. 1 and 2, the present invention provides a kind of digital combining unit accuracy closed loop test system, is provided with
Tested device and test equipment, tested device are digital combining unit, and test equipment is provided with background computer and front end processor.
Background computer editor test cases and operation test cases and between FT3 sampling value message and SV sampling value message
Error is analyzed and is determined, front end processor is responsible for calling the sample values prestored in basic database according to configuration, generates FT3
Sampling value message is simultaneously sent to digital combining unit, while receiving the SV sampling value message of digital combining unit output and turning
Issue background computer.
Background computer is provided with Wave data conversion module, sampling data passageway, FT3 and sends control module, data processing mould
Block, result display module, the front end processor are FT3 sending device.
Wave data conversion module is connect with sampling data passageway, and sampling data passageway sends control module with FT3 respectively
It is connected with data processing module, FT3 sends control module and connect with FT3 sending device, and FT3 sending device merges list with digital
Member connection, digital combining unit are connect with data processing module.
Waveform conversion module converts original waveform data to the sample values of csv format, and FT3 sends control module and obtains
The channel information and channel information description, FT3 for obtaining tested device SV sample values send control module and are adopted according to the SV of acquisition
Channel information and the channel information description of sample value data generate SV sampling value message, and FT3 sends control module and shows SV sampled value
Then corresponding FT3 sampling data passageway is distributed in the total data channel of message for each data channel, so that tested
The data channel of SV sampled value and FT3 sampled value corresponds, and FT3 sends control module and sends out the sample values of csv format
It send parameter to carry out configuration and the sample values of csv format is handed down to front end processor by FTP mode, front end processor receives csv lattice
The sample values of formula send the configuration that control module issues according to FT3 and generate electronic mutual inductor FT3 sampling value message, and
It is sent to tested device, while sending time will be started and return to FT3 transmission control module, before FT3 sends control module reception
The information of machine return is set, and passes to data processing module, tested device exports SV sampling value message to data processing module, number
Sampling sequence number is pressed to FT3 sample values and SV sample values according to the sending time of FT3 sampling value message according to processing module
It is aligned in the time domain, carries out error analysis, and analysis result is transferred to result result display module, result display module will divide
Analysis comes out as the result is shown, is completed.
The present invention is not limited by simulation signal generator and electronic mutual inductor, also not by electronic mutual inductor FT3 sampled value
The limit of message real-time Transmission, reduces difficulty of test, improves testing efficiency, meet digital combining unit items stable state and temporarily
The examination demand of state performance indicator.
The foregoing is merely better embodiments of the invention, and the invention is not limited to above embodiment, are implementing
The structural modification small there may be part in the process, if various changes or modifications of the invention are not departed from essence of the invention
Mind and range, and belong within the scope of claim and equivalent technologies of the invention, then the present invention is also intended to encompass these changes
And modification.
Claims (10)
1. a kind of digital combining unit accuracy closed loop test method, which comprises the following steps:
S1: waveform conversion module converts original waveform data to the sample values of csv format；
S2:FT3 sends channel information and the channel information description that control module obtains tested device SV sample values, FT3 hair
Control module is sent to be described to generate SV sampling value message, FT3 according to the channel information and channel information of the SV sample values of acquisition
The total data channel that control module shows SV sampling value message is sent, is then distributed for each data channel corresponding
FT3 sampling data passageway, so that the data channel of tested SV sampled value and FT3 sampled value corresponds；
S3:FT3, which sends control module and sends parameter to the sample values of csv format, carries out configuration and by the sampling of csv format
Value Data is handed down to front end processor by FTP mode；
S4: front end processor receives the sample values of csv format, sends the configuration that control module issues according to FT3 and generates electronic type
Mutual inductor FT3 sampling value message, and it is sent to tested device, while sending time will be started and return to FT3 transmission control module；
S5:FT3 sends control module and receives the information that front end processor returns, and passes to data processing module；
S6: tested device exports SV sampling value message to data processing module, and data processing module is according to FT3 sampling value message
Sending time is aligned FT3 sample values and SV sample values by sampling sequence number in the time domain, carries out error analysis, and will
Analysis result is transferred to result display module；
S7: result display module comes out analysis as the result is shown, is completed.
2. digital combining unit accuracy closed loop test method according to claim 1, which is characterized in that described original
The format of Wave data is comtrade or pcap.
3. digital combining unit accuracy closed loop test method according to claim 2, which is characterized in that in the S1
Available parameter when waveform conversion module converts original waveform data to the sample values of csv format, the parameter include
Protocol type, sampling number, initial time, sampled point send at least one of relative time.
4. digital combining unit accuracy closed loop test method according to claim 3, which is characterized in that in the S3
Parameter include corresponding relationship between FT3 type of message and sample values and FT3 sample values channel.
5. digital combining unit accuracy closed loop test method according to claim 4, which is characterized in that described tested
Device is digital combining unit.
6. digital combining unit accuracy closed loop test method according to claim 5, which is characterized in that described preposition
Machine is FT3 sending device.
7. digital combining unit accuracy closed loop test method according to claim 1, which is characterized in that described preposition
Machine calls the sampled data value prestored in basic database, generates FT3 sampling value message and is sent to digital combining unit.
8. a kind of digital combining unit accuracy closed loop test system, which is characterized in that the digital combining unit is accurate
Degree closed loop test system is tested using the test method as described in claim 1-7 any one.
9. digital combining unit accuracy closed loop test system according to claim 8, which is characterized in that be provided with by
Survey device and test equipment, the tested device is digital combining unit, and the test equipment is provided with background computer and preposition
Machine；
The background computer is connect with front end processor, and the front end processor is connect with digital combining unit；
The background computer editor test cases and operation test cases and between FT3 sampling value message and SV sampling value message
Error is analyzed and is determined, the front end processor is responsible for calling the sample values prestored in basic database according to configuration, raw
At FT3 sampling value message and it is sent to digital combining unit, while receiving the SV sampled value report of digital combining unit output
Text is simultaneously transmitted to background computer.
10. digital combining unit accuracy closed loop test method according to claim 9, which is characterized in that after described
Platform machine is provided with Wave data conversion module, sampling data passageway, FT3 and sends control module, data processing module and result and show
Show module, the front end processor is FT3 sending device；
The Wave data conversion module is connect with sampling data passageway, and the sampling data passageway sends with FT3 control respectively
Module is connected with data processing module, and the FT3 sends control module and connect with FT3 sending device, the FT3 sending device and
Digital combining unit connection, the digital combining unit are connect with data processing module, the data processing module and knot
The connection of fruit display module.
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Application publication date: 20191018 |