CN110235393A - Automated testing method and system - Google Patents
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- CN110235393A CN110235393A CN201880000246.5A CN201880000246A CN110235393A CN 110235393 A CN110235393 A CN 110235393A CN 201880000246 A CN201880000246 A CN 201880000246A CN 110235393 A CN110235393 A CN 110235393A
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Abstract
This application involves the field of test technology, a kind of automated testing method and system are provided.Automated testing method includes: the communication path for identifying each Devices to test connecting with test host；Several corresponding Devices to test of an at least test assignment are obtained from preset test configurations information；By the communication path of each Devices to test, test assignment is burnt in the corresponding each Devices to test of test assignment；Control the test assignment that each Devices to test executes burning；By the communication path of each Devices to test, obtains each Devices to test and execute the feedback data that test assignment generates.Present invention also provides a kind of automatization test systems.In the application, the multitask test of multiple Devices to test can be realized, to improve testing efficiency and save exploitation and the testing cost of Devices to test.
Description
This application involves the field of test technology, in particular to a kind of automated testing method and system.
Micro-control unit (Microcontroller Unit, MCU), also known as one chip microcomputer (Single Chip Microcomputer) or single-chip microcontroller, as the range of constantly improve for MCU control function, application is more and more wider.Designer needs to carry out functional test to it by testing host when designing MCU development board.
The inventor finds that the existing technology has at least the following problems: (1) needing the connection status for manually checking test host and MCU development board and issue test assignment, it is also necessary to the corresponding serial port of manual identified MCU development board, to obtain test result；(2) every test host can only test a MCU development board, test multiple development boards if necessary, then need more test hosts.
Summary of the invention
The application section Example is designed to provide a kind of automated testing method and system, can be realized the multitask test of multiple Devices to test, to improve testing efficiency and save exploitation and the testing cost of Devices to test.
The embodiment of the present application provides a kind of automated testing method, is applied to test host, and automated testing method includes: the communication path for identifying each Devices to test connecting with test host；Several corresponding Devices to test of an at least test assignment are obtained from preset test configurations information；By the communication path of each Devices to test, test assignment is burnt in the corresponding each Devices to test of test assignment；Control the test assignment that each Devices to test executes burning；By the communication path of each Devices to test, obtains each Devices to test and execute the feedback data that test assignment generates.
The embodiment of the present application also provides a kind of automatization test systems, comprising: test host and multiple intermediate link blocks with multiple connectivity ports, and each intermediate link block has the function of burning；Connectivity port is identical as the intermediate number of link block, and each connectivity port is connected to a Devices to test by an intermediate link block；Test the automated testing method that host requires any one of 1 to 11 for perform claim.
The embodiment of the present application in terms of existing technologies, is capable of the communication path of automatic identification test host and each Devices to test, and passes through the communication path of each Devices to test, and test assignment is burnt in the corresponding each Devices to test of test assignment；That is, supporting multitasking, and multiple Devices to test is allowed to be tested simultaneously；The multitask test for realizing multiple Devices to test, to improve testing efficiency and save exploitation and the testing cost of Devices to test.
In addition, communication path includes burning path and data feedback path；By the communication path of each Devices to test, test assignment is burnt in the corresponding each Devices to test of test assignment, specifically: by the burning path of each Devices to test, test assignment is burnt in the corresponding each Devices to test of test assignment；By the communication path of each Devices to test, obtains each Devices to test and executes the feedback data that test assignment generates, specifically: by the data feedback path of each Devices to test, obtains each Devices to test and execute the feedback data that test assignment generates.Present embodiments provide the specific implementation of communication path.
In addition, feedback data includes test log；Before the test assignment for controlling each Devices to test execution burning, further includes: judge whether the data feedback path of each Devices to test is in normal communication state；When the judgment result is yes, the step of executing the test assignment of burning into each Devices to test of control.In the present embodiment, confirmation data feedback path just can allow to execute the test assignment of burning in Devices to test after normal communication, and the test log generated in real time when executing test assignment to avoid Devices to test can not be timely feedbacked to testing host.
In addition, before obtaining several corresponding Devices to test of an at least test assignment in preset test configurations information, further includes: generate the executable file of test assignment according to test configurations information；Pass through the communication path of each Devices to test, test assignment is burnt in the corresponding each Devices to test of test assignment, specifically: by the communication path of each Devices to test, the executable file of test assignment is burnt in the corresponding each Devices to test of test assignment.It, can be according to the executable file of test configurations Automatic generation of information test assignment in the present embodiment.
In addition, generating the executable file of test assignment according to test configurations information, specifically include: obtaining the corresponding at least test case of test assignment from test configurations information；The program code of test case is obtained from code library；The test use cases of test assignment are generated using the program code of test case；The test use cases of test assignment are compiled, the executable file of test assignment is generated.Present embodiments provide the specific implementation that the executable file of test assignment is generated according to test configurations information, i.e., as long as the program code of the test case in test case and code library is pre-established corresponding relationship, the automatic program code for obtaining test case can be realized to generate the test use cases of test assignment, and then generate the executable file of test assignment；Test use cases are generated without manually integrating the program code of each test case as in the state of the art, to save cost of labor and improve efficiency.
In addition, test configurations information obtains in the following manner, comprising: provide test configurations interface；Test configurations information is received by test configurations interface.Present embodiments provide a kind of acquisition modes of test configurations information.
In addition, test configurations information obtains in the following manner, comprising: when detecting that preset task trigger event occurs, set test configurations information according to task trigger event.Another acquisition modes for present embodiments providing test configurations information, can automatically generate test configurations information.
In addition, task trigger event includes at least one of following event: code uploads event, code is incorporated into event, regression test event.Present embodiments provide the specific type of task trigger event.
In addition, test assignment be it is N number of, N is integer greater than 1；By the communication path of each Devices to test, test assignment is burnt to before the corresponding each Devices to test of test assignment, further includes: be put into each test assignment in the task queue of the corresponding each Devices to test of test assignment；It wherein, include K test assignment being arranged successively in the task queue of each Devices to test；Wherein, K is integer and 0 < K≤N；Pass through the communication path of each Devices to test, test assignment is burnt in the corresponding each Devices to test of test assignment, specifically: by the communication path of each Devices to test, K test assignment in the task queue of each Devices to test is successively burnt in Devices to test.Present embodiments provide the specific implementation that device under test carries out the test of multiple test assignments.
In addition, passing through the communication path of each Devices to test, after the feedback data for obtaining each Devices to test execution test assignment generation, further includes: generate the test report of each Devices to test according to the feedback data of each Devices to test.In the present embodiment, each Devices to test test report is generated according to feedback data, is convenient for the contrast difference of multiple Devices to test.
In addition, passing through the communication path of each Devices to test, before test assignment is burnt in the corresponding each Devices to test of test assignment, further includes: each Devices to test corresponding to test assignment initializes.The present embodiment device under test before burning is initialized, the feedback data for this test that the data influence stored before avoiding in Devices to test obtains.
One or more embodiments are illustrated by the picture in corresponding attached drawing, these exemplary illustrations do not constitute the restriction to embodiment, element in attached drawing with same reference numbers label is expressed as similar element, unless there are special statement, composition does not limit the figure in attached drawing.
Fig. 1 is the specific flow chart according to the automated testing method in the application first embodiment；
Fig. 2 is the detail flow chart according to the automated testing method in the application first embodiment；
Fig. 3 is the specific flow chart according to the executable file of the generation test assignment in the application first embodiment；
Fig. 4 is the specific flow chart according to the generation method of the test configurations information in the application second embodiment；
Fig. 5 is the specific flow chart according to the automated testing method in the application 3rd embodiment；
Fig. 6 is the block diagram according to the automatization test system in the application fourth embodiment.
In order to which the objects, technical solutions and advantages of the application are more clearly understood, with reference to the accompanying drawings and embodiments, the application section Example is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the application, it is not used to limit the application.
The application first embodiment is related to a kind of automated testing method, is applied to test host, for test host for testing multiple Devices to test, Devices to test can be the development board based on MCU or the terminal based on MCU.
The detailed process of automated testing method in the present embodiment is as shown in Figure 1, comprising the following steps:
Step 101, the communication path for each Devices to test connecting with test host is identified.
Step 102, several corresponding Devices to test of an at least test assignment are obtained from preset test configurations information.
Step 103, by the communication path of each Devices to test, test assignment is burnt in the corresponding each Devices to test of test assignment.
Step 104, the test assignment that each Devices to test executes burning is controlled.
Step 105, it by the communication path of each Devices to test, obtains each Devices to test and executes the feedback data that test assignment generates.
The present embodiment in terms of existing technologies, is capable of the communication path of automatic identification test host and each Devices to test, and passes through the communication path of each Devices to test, and test assignment is burnt in the corresponding each Devices to test of test assignment；That is, supporting multitasking, and multiple Devices to test is allowed to be tested simultaneously；The multitask test for realizing multiple Devices to test, to improve testing efficiency and save exploitation and the testing cost of Devices to test.
The realization details of the automated testing method of the present embodiment is specifically described below, referring to FIG. 2, the following contents not implements the necessary of this programme only for convenience of the realization details provided is understood.
In a step 101, specifically, test host is connected to multiple Devices to test, and the communication path for testing host and each Devices to test includes burning path and data feedback path, and test host can recognize that the burning path and data feedback path of each Devices to test connected to it.It tests after host identification burning path and data feedback path, tests between host and Devices to test to establish communicating.
Preferably, after step 101 further include:
Step 101 ', the executable file of test assignment is generated according to test configurations information.
It include N number of test assignment in test configurations information specifically, prestoring test configurations information in test host, N is the integer greater than 1.Each test assignment includes at least the test case of required execution and executes the Devices to test of the test assignment.Preferably, test assignment further includes the code library where test case.It should be noted that may not need when each test case is stored in the same code library and mark code library to each test case in test assignment (system can be with default setting code library)；So, it when each test case is stored in different code libraries, then needs to mark code library to each test case in test assignment.
Wherein, the generating mode of test configurations information can be with are as follows: test host provides test configurations interface, and designer passes through test configurations interface input test configuration information.For example, designer chosen in test configurations interface the test case in need used (each test case has corresponding code name)；Then, designer creates each test assignment；That is, setting the title (for example, test assignment 1, test assignment 2 etc.) of each test assignment, and set the test case executed needed for each test assignment and the Devices to test for executing the test assignment；Preferably, designer can also set the code library where it for test case.
Preferably, the test configurations information is integrated into a document and serializes the document, in order to be stored after obtaining test configurations information.
It should be noted that only schematically describing step 101 in Fig. 2, ' with step 101 execute sequence, that is, can execute step 101 before step 101 ' is according to the executable file of test configurations information generation test assignment.
In the present embodiment, referring to FIG. 3, step 101 ' it is generated according to test configurations information in the executable file of test assignment, it specifically includes:
Sub-step 1011 ' obtains the corresponding at least test case of test assignment from test configurations information.
Specifically, including the test case of required execution in each test assignment, so that the corresponding at least test case of test assignment can be obtained from test configurations information by testing host.
Sub-step 1012 ' obtains the program code of test case from code library.
Specifically, can enter the code library of system default setting when not marking code library to each test case in test assignment and obtain the program code of each test case；If each test case in test assignment has been labelled with code library, enters the corresponding code library of each test case and obtain the program code of each test case.
Sub-step 1013 ' generates the test use cases of test assignment using the program code of test case.
Specifically, test host pulls the program code of the corresponding test case of test assignment from code library automatically, the program code of each test case is gathered into the test use cases as test assignment.
It should be noted that being still manually to gather the program code of each test case to generate the test use cases of test assignment in the prior art；Therefore, compared to the prior art, the technical solution in the present embodiment saves cost of labor and improves efficiency.
Sub-step 1014 ' is compiled the test use cases of test assignment, generates the executable file of test assignment.
Specifically, the test use cases of test assignment are compiled and are packaged, the executable file of test assignment is generated.
It in a step 102, include the Devices to test for executing each test assignment in test configurations information, to test several corresponding Devices to test of the available each test assignment of host.
Preferably, after step 102, further includes:
Step 102 ', each test assignment is put into the task queue of the corresponding each Devices to test of test assignment.
Specifically, each Devices to test corresponds to several test assignments, that is, each Devices to test needs to be implemented K test assignment to complete the test of itself function, wherein K is integer and 0 < K≤N；The type and quantity (K value) of test assignment corresponding to each Devices to test, the function of the test needed for the Devices to test determines.Testing host is that each Devices to test distributes a task queue, and each test assignment is respectively put into the task queue of the corresponding object to be measured of the test assignment, i.e., the task queue of each Devices to test includes K test assignment being arranged successively.
It should be noted that, it include K test assignment being arranged successively in task queue in the present embodiment, task queue carries out Dynamic Maintenance by test host, K putting in order for test assignment can be put into the time of test queue according to task priority and test assignment to arrange, the weight of task priority is greater than the task creation time, specific arrangement mode is as follows: test assignment is successively arranged according to task priority, the high test assignment of task priority is arranged in front of task queue, preferential to execute；If task priority is identical, the time of test queue is put into arrange according to test assignment, and being put into test queue's time, test assignment is arranged in front earlier, preferential to execute.
In step 103, specifically, test host issues burning instruction, pass through the burning path of each Devices to test, it puts in order according to K test assignment in task queue, successively the executable file of K test assignment is burnt in corresponding each Devices to test.Wherein, the executable file of test assignment can be burnt in the running memory or flash memory of Devices to test.
In addition, before test assignment being burnt in corresponding each Devices to test, generally can each Devices to test corresponding to test assignment initialize, specifically: before the test assignment of device under test burning for the first time, device under test is needed to be initialized, initialize content for example, the state that resets Devices to test, the system clock and carrying out for starting Devices to test are calibrated etc., provide a basic environment with the execution for test assignment.And, after the completion of previous test assignment executes, before next test assignment is programmed, test host also can device under test reset, empty the executable file of previous test assignment, previous test assignment is performed the related data etc. of generation, and the burning and execution to avoid next test assignment are interfered and generate the feedback data of mistake.
At step 104, specifically, test host sending starts test instruction, the test assignment that burning is executed in each Devices to test is controlled.
In step 105, specifically, host is tested when Devices to test executes test assignment, corresponding feedback data is obtained by data feedback path, feedback data includes following one of any or any combination: the register value of test log, test result and Devices to test.Wherein, test log includes that the Devices to test recorded in real time executes all test operations of test assignment, in order to according to test log tracking and positioning；Test result can be to be successfully tested or test crash；The register value of Devices to test is the register value of the Devices to test of acquisition after test host obtains test result.
Preferably, after step 105, further includes:
Step 105 ', the test report of each Devices to test is generated according to the feedback data of each Devices to test.
Specifically, test host summarizes the feedback data of each Devices to test, generates the test report of each Devices to test, be convenient for the contrast difference of multiple Devices to test after each Devices to test has executed its corresponding test assignment.Wherein, for each Devices to test, it can be after each test assignment in task queue be finished, it is immediately generated the corresponding test report of each test assignment, or after all test assignments in task queue are completed, summarized, obtains the corresponding test report of the Devices to test.
The present embodiment, it include K test assignment in the task queue of each Devices to test, by taking any Devices to test as an example, Devices to test executes a test assignment in task queue every time in order, after a test assignment is burnt to Devices to test and is finished, test host can receive the test result (can be confirmed and be completed) of the test assignment；Then, test host checks next test assignment in task queue, empty data (executable file, register value of test assignment etc.) relevant to a upper test assignment in Devices to test, next test assignment is burnt in Devices to test and is tested again, until the test assignment in task queue is completed.
Illustrate the technical solution of the present embodiment with a specific example below.In this example, test configurations information can be as shown in table 1 below:
Table 1
In addition, the task queue of Devices to test D1 is test assignment 4, test assignment 1, test assignment 3；The task queue of Devices to test D2 is test assignment 1, test assignment 2, test assignment 3；The task queue of Devices to test D3 is test assignment 2, test assignment 3, test assignment 4.
In test, test host first identifies the communication path with Devices to test D1, Devices to test D2 and Devices to test D3, and generates the executable file of test assignment 1 to test assignment 4；Then, test assignment 1 is obtained to the corresponding Devices to test of test assignment 4, and test assignment 1 is put into the task queue of corresponding Devices to test to test assignment 4.
Illustrate to test the detailed process that host control Devices to test executes test assignment by taking Devices to test D1 as an example.The task queue of Devices to test D1 is test assignment 4, test assignment 1, test assignment 3, host is tested after device under test D1 initialization, the executable file of test assignment 4 is burnt in Devices to test D1, and it controls Devices to test D1 and executes test assignment 4, while obtaining test log when executing test assignment 4；After test assignment 4 is finished, test host can receive the test result (can be confirmed and be completed) of the test assignment；Then, test host checks that there is also next test assignment (i.e. test assignments 1) in task queue, it empties in Devices to test D1 after the relevant data of test assignment 4 (executable file, register value of test assignment 4 etc.), the test assignment 1 is burnt in Devices to test D1 and is tested again, until the test assignment in task queue is completed.
The application second embodiment is related to a kind of automated testing method, and the present embodiment is roughly the same with first embodiment, is in place of main difference: in the present embodiment, providing another generation method of test configurations information.
In the present embodiment, the detailed process for testing the generation method of test configurations information is as shown in Figure 4.
Step 201, detect whether that there are the generations of the trigger event of preset task.If so, entering step 202；Otherwise, then step 201 is returned to.
Specifically, task trigger event includes at least one of following event: code uploads event, code is incorporated into event, regression test event.When testing Host Detection to when the generation of preset task trigger event, 202 are entered step；Otherwise, then step 201 is returned to, until detecting that preset task trigger event occurs.
Wherein, when designer is that Devices to test increases some function newly, which can be uploaded to code transit space, as code uploads event；After the exploitation code uploaded in code transit space is identified, exploitation code is incorporated into code library, and as code is incorporated into event；After the program code of some test case in code library is modified, need to re-execute the test case to confirm modification without introducing new mistake or other codes being caused to generate mistake, as regression test event.
Step 202, test configurations information is set according to task trigger event.
Specifically, generating test assignment and the corresponding test case of test assignment and the Devices to test of required execution according to task trigger event, that is, form the test configurations information.
In the present embodiment, the function that test configurations information is automatically generated according to task trigger event is realized by continuous integrating tool in test host；Preferably, being based on the continuous integrating tool, the test report of generation can also be automatically fed to tester and designer by mail by test host, in order to which tester and designer obtain test report in first time.
The present embodiment provides another generating mode of test configurations information, can automatically generate test configurations information for first embodiment.
The application 3rd embodiment is related to a kind of automated testing method, and the present embodiment is improvement on the basis of first embodiment, mainly thes improvement is that: in the present embodiment, whether the data feedback path of device under test, which is in normal communication state, is judged.
In the present embodiment, feedback data includes test log, and the detailed process of automated testing method is as shown in Figure 5.
Wherein, roughly the same, step 305 to step 306 ' with step 104 to step 105 ' is roughly the same to step 303 and step 101 to step 103 for step 301, is not repeating herein, is being in place of main difference, increases step 304, specific as follows:
Step 304, judge whether the data feedback path of each Devices to test is in normal communication state.If so, entering step 305；If it is not, then executing step 304 again.
Wherein, test host is established between meeting and Devices to test and is communicated after identifying data feedback path；When establishing completion, Devices to test can pass through data feedback path and carry out data feedback.Due to the real-time recorded data that test log is the process that device under test executes test assignment (i.e. Devices to test starts to begin to generate test log when executing test assignment), therefore, if when Devices to test starts to execute test assignment, it is not yet successfully established between test host and Devices to test, then it can lost part test log.
Therefore, for each Devices to test, need to judge whether the data feedback path of Devices to test is in normal communication state before the test assignment for executing burning, when the judgment result is yes, the test assignment that 305 control Devices to test execute burning is entered step；Otherwise, then illustrate that the communication connection in the data feedback path of the Devices to test is not yet successfully established, execute step 304 again, until the data feedback path of the Devices to test is in normal communication state, enter back into step 305.
The present embodiment is for first embodiment, confirm that data feedback path can be after normal communication, just allow to execute the test assignment of burning in Devices to test, the test log generated in real time when executing test assignment to avoid Devices to test can not be timely feedbacked to test host.It should be noted that the present embodiment can also be used as improvement on the basis of second embodiment, same technical effect can achieve.
The application fourth embodiment is related to a kind of automatization test system, referring to FIG. 6, automatization test system includes the test host 1 with multiple connectivity ports 11 and multiple intermediate link blocks.Wherein, each intermediate link block has the function of burning.It should be noted that right the present embodiment is not intended to be limited in any this in Fig. 6 for testing host 1 with 2 connectivity ports 11.
In the present embodiment, each intermediate link block includes usb hub 21 and cd-rom recorder 22, realizes burning function by cd-rom recorder 22；Usb hub 21 has 4 USB ports, respectively USB port 211, USB port 212, USB port 213 and USB port 214.
The connectivity port 11 for testing host 1 is identical as the intermediate number of link block, and each connectivity port 11 is connected to a Devices to test 3 by an intermediate link block.Below by taking a connectivity port 11 for testing host 1 as an example, be illustrated to the connection relationship of test host, intermediate link block and Devices to test 3: the connectivity port 11 of test host 1 is connected to USB port 211, USB port 212 is connected to the USB port 221 of cd-rom recorder 22, USB port 213 is connected to the feeder ear 31 of Devices to test 3, USB port 214 is connected to the UART Universal Serial Bus 32 of Devices to test 3, and cd-rom recorder 22 is connect with Devices to test 3 by wire jumper.
The communication path for testing host 1 and each Devices to test 3 includes burning path and data feedback path.Wherein, the connectivity port 11 for testing host 1 is connected to USB port 211, the USB port 212 of usb hub 21 is connected to the USB port 221 of cd-rom recorder 22, cd-rom recorder 22 is connect with Devices to test 3 by wire jumper, forms burning path；The connectivity port 11 of test host 1 is connected to USB port 211, the USB port 214 of usb hub 21 is connected to UART Universal Serial Bus 32, forms data feedback path.In addition, also having supply path between test host 1 and each Devices to test 3, that is, connectivity port 11 is connected to USB port 211, the USB port 213 of usb hub 21 is connected to feeder ear 31, forms the supply path.
Test host 1 is for executing first embodiment automated testing method described in any embodiment into 3rd embodiment.
The present embodiment in terms of existing technologies, is capable of the communication path of automatic identification test host and each Devices to test, and passes through the communication path of each Devices to test, and test assignment is burnt in the corresponding each Devices to test of test assignment；That is, supporting multitasking, and multiple Devices to test is allowed to be tested simultaneously；The multitask test for realizing multiple Devices to test, to improve testing efficiency and save exploitation and the testing cost of Devices to test.
It will be understood by those skilled in the art that the various embodiments described above are to realize the specific embodiment of the application, and in practical applications, can to it, various changes can be made in the form and details, without departing from spirit and scope.
Claims (12)
- A kind of automated testing method, which is characterized in that be applied to test host, the automated testing method includes:Identify the communication path for each Devices to test connecting with the test host；Several corresponding described Devices to test of an at least test assignment are obtained from preset test configurations information；By the communication path of each Devices to test, the test assignment is burnt in the corresponding each Devices to test of the test assignment；Control the test assignment that each Devices to test executes burning；By the communication path of each Devices to test, obtains each Devices to test and execute the feedback data that the test assignment generates.
- Automated testing method as described in claim 1, which is characterized in that the communication path includes burning path and data feedback path；The communication path by each Devices to test, the test assignment is burnt in the corresponding each Devices to test of the test assignment, specifically: by the burning path of each Devices to test, the test assignment is burnt in the corresponding each Devices to test of the test assignment；The communication path by each Devices to test, it obtains each Devices to test and executes the feedback data that the test assignment generates, specifically: by the data feedback path of each Devices to test, obtains each Devices to test and execute the feedback data that the test assignment generates.
- Automated testing method as claimed in claim 2, which is characterized in that the feedback data includes test log；The each Devices to test of control executes before the test assignment of burning, further includes:Judge whether the data feedback path of each Devices to test is in normal communication state；When the judgment result is yes, the step of executing the test assignment of burning into each Devices to test of the control.
- Automated testing method as described in claim 1, which is characterized in that described before obtaining several corresponding described Devices to test of an at least test assignment in preset test configurations information, further includes:The executable file of the test assignment is generated according to the test configurations information；The communication path by each Devices to test, the test assignment is burnt in the corresponding each Devices to test of the test assignment, specifically: by the communication path of each Devices to test, the executable file of the test assignment is burnt in the corresponding each Devices to test of the test assignment.
- Automated testing method as claimed in claim 4, which is characterized in that the executable file that the test assignment is generated according to the test configurations information specifically includes:The corresponding at least test case of the test assignment is obtained from the test configurations information；The program code of the test case is obtained from code library；The test use cases of the test assignment are generated using the program code of the test case；The test use cases of the test assignment are compiled, the executable file of the test assignment is generated.
- Automated testing method as described in claim 1, which is characterized in that the test configurations information obtains in the following manner, comprising:Test configurations interface is provided；The test configurations information is received by the test configurations interface.
- Automated testing method as described in claim 1, which is characterized in that the test configurations information obtains in the following manner, comprising:When detecting that preset task trigger event occurs, the test configurations information is set according to the task trigger event.
- Automated testing method as claimed in claim 7, which is characterized in that the task trigger event includes at least one of following event: code uploads event, code is incorporated into event, regression test event.
- Automated testing method as described in claim 1, which is characterized in that the test assignment be it is N number of, N is integer greater than 1；The test assignment is burnt to before the corresponding each Devices to test of the test assignment by the communication path by each Devices to test, further includes:Each test assignment is put into the task queue of the corresponding each Devices to test of the test assignment；It wherein, include the K test assignments being arranged successively in the task queue of each Devices to test；Wherein, K is integer and 0 < K≤N；The communication path by each Devices to test, the test assignment is burnt in the corresponding each Devices to test of the test assignment, specifically: by the communication path of each Devices to test, the K test assignments in the task queue of each Devices to test are successively burnt in the Devices to test.
- Automated testing method as described in claim 1, which is characterized in that the communication path by each Devices to test, each Devices to test of acquisition execute after the feedback data that the test assignment generates, further includes:The test report of each Devices to test is generated according to the feedback data of each Devices to test.
- Automated testing method as described in claim 1, which is characterized in that the communication path by each Devices to test, before the test assignment is burnt in the corresponding each Devices to test of the test assignment, further includes:Each Devices to test corresponding to the test assignment initializes.
- A kind of automatization test system characterized by comprising test host and multiple intermediate link blocks with multiple connectivity ports, and each intermediate link block has the function of burning；The number of the connectivity port and the intermediate link block is identical, and each connectivity port is connected to a Devices to test by an intermediate link block；The test host is for automated testing method described in any one of perform claim requirement 1 to 11.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2018/071522 WO2019134113A1 (en) | 2018-01-05 | 2018-01-05 | Automated test method and system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110235393A true CN110235393A (en) | 2019-09-13 |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111458105A (en) * | 2020-04-21 | 2020-07-28 | 欧菲微电子技术有限公司 | Method, device and equipment for testing optical module |
| CN113138886A (en) * | 2021-04-23 | 2021-07-20 | 摩拜(北京)信息技术有限公司 | Method and device for testing embedded equipment and testing equipment |
| CN113470618A (en) * | 2021-06-08 | 2021-10-01 | 阿波罗智联(北京)科技有限公司 | Wake-up test method and device, electronic equipment and readable storage medium |
| CN116881063A (en) * | 2023-09-06 | 2023-10-13 | 合肥康芯威存储技术有限公司 | Test system and test method for storage unit of electronic product |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110888656B (en) * | 2019-11-26 | 2022-07-26 | 卡斯柯信号有限公司 | Multifunctional programming device and programming method |
| CN113596871A (en) * | 2021-07-05 | 2021-11-02 | 哲库科技(上海)有限公司 | Test method, server and computer storage medium |
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- 2018-01-05 WO PCT/CN2018/071522 patent/WO2019134113A1/en active Application Filing
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| CN101247293A (en) * | 2008-03-11 | 2008-08-20 | 福建星网锐捷网络有限公司 | Automatic test approach and system |
| CN101848042A (en) * | 2010-04-20 | 2010-09-29 | 惠州Tcl移动通信有限公司 | Method and system for testing radio frequency of mobile phones |
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| CN111458105A (en) * | 2020-04-21 | 2020-07-28 | 欧菲微电子技术有限公司 | Method, device and equipment for testing optical module |
| CN113138886A (en) * | 2021-04-23 | 2021-07-20 | 摩拜(北京)信息技术有限公司 | Method and device for testing embedded equipment and testing equipment |
| CN113470618A (en) * | 2021-06-08 | 2021-10-01 | 阿波罗智联(北京)科技有限公司 | Wake-up test method and device, electronic equipment and readable storage medium |
| CN116881063A (en) * | 2023-09-06 | 2023-10-13 | 合肥康芯威存储技术有限公司 | Test system and test method for storage unit of electronic product |
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| WO2019134113A1 (en) | 2019-07-11 |
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