CN110224748A - High-speed parallel test method for BOSA optical device - Google Patents
High-speed parallel test method for BOSA optical device Download PDFInfo
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- CN110224748A CN110224748A CN201910374250.4A CN201910374250A CN110224748A CN 110224748 A CN110224748 A CN 110224748A CN 201910374250 A CN201910374250 A CN 201910374250A CN 110224748 A CN110224748 A CN 110224748A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0799—Monitoring line transmitter or line receiver equipment
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- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
Abstract
The present invention discloses a kind of high-speed parallel test method for BOSA optical device, comprising the following steps: Step 1: several BOSA optical devices are installed on jig plate；Step 2: the laser scans instrument is powered on by electric switch to BOSA optical device transmitting terminal, the optical signal module issues standard testing light source；Step 3: the electric signal from laser scanner is converted to optical signal by the BOSA optical device transmitting terminal, meanwhile, the optical signal from optical signal module is converted to electric signal by BOSA optical device receiving end；Step 4: the laser scans instrument acquires the optical signal from BOSA optical device transmitting terminal, and the optical power of BOSA optical device transmitting terminal is obtained by collected optical signal, the error analyzer acquires the electric signal from BOSA optical device receiving end, and the sensitivity data of BOSA optical device receiving end is obtained by collected electric signal.The present invention reduces the testing times of BOSA optical device, reduce testing cost and time, improve the utilization rate of equipment and installations using BOSA optical device.
Description
Technical field
The present invention relates to a kind of high-speed parallel test methods for BOSA optical device, belong to optical communication measuring technology neck
Domain.
Background technique
In present optical communication network, optical module is device important in fiber optic communication.As one of important devices
The integrated module of optical transceiver (optical module) has pushed main line optical transmission system to low cost side as the core devices of Optical Access Network
To development.Optical module main effect in fiber optic communication is photoelectric conversion, and the electric signal sended over is converted into optical signal；
Optical signal electric signal is converted into again by optical fiber to be transmitted.
BOSA optical device test station is cumbersome, and testing process is complicated, test parameter multiplicity, and existing integrated test system
Technology is all greatly to waste the time according to process flow serially test, increase cost.And it is big to access wire stitcher part dosage,
It is badly in need of novel measuring technology to reduce cost.
Summary of the invention
The object of the present invention is to provide a kind of high-speed parallel test methods for BOSA optical device, can be by BOSA light
The uplink and downlink light wave of device separates well, avoids its mutual interference, so as to realize to BOSA optical device
The concurrent testing of transmitting terminal and receiving end reduces the testing time of BOSA optical device, reduces testing cost and time, improves
Use the utilization rate of equipment and installations of BOSA optical device.
In order to achieve the above objectives, the technical solution adopted by the present invention is that: a kind of high-speed parallel for BOSA optical device is surveyed
Method for testing is based on a test macro, and the test macro includes that several BOSA optical device, lasers being installed on jig plate are swept
Retouch instrument, the error analyzer configured with optical signal module, the BOSA optical device respectively with laser scans instrument, error analyzer
Connection；
The laser scans instrument for powering to BOSA optical device transmitting terminal, and acquires the front end of BOSA optical device transmitting terminal
Voltage and optical power；
The BOSA optical device transmitting terminal receives the electric signal from laser scans instrument, and converts electrical signals to optical signal biography
Defeated time laser scans instrument；
The optical signal module, for generating the optical signal for being transmitted to BOSA optical device receiving end；
BOSA optical device receiving end receives the optical signal from optical signal module, and converts optical signals to electric signal transmission
To error analyzer；
The error analyzer is for acquiring the electric signal from BOSA optical device receiving end；
Also there is a wavelength division module, this wavelength division module receives the optical signal from BOSA optical device transmitting terminal, and transmits it to
Laser scans instrument is also used to receive the optical signal from optical signal module, and transmits it to BOSA optical device receiving end；
It is provided with a photoswitch between the wavelength division module and several BOSA optical devices, this photoswitch will be for that will come from optical signal
Module simultaneously switches between several optical channels by the optical signal that wavelength division module enters several BOSA optical device receiving ends, also
For the optical signal of laser scans instrument will to be entered several from several BOSA optical device transmitting terminals and by wavelength division module
Switch between a optical channel；
There is the public input terminal of an electric switch, this electric switch is public between the laser scans instrument and several BOSA optical devices
It is connected with electric switch between input terminal and several BOSA optical devices, this electric switch is used for will be from the telecommunications of laser scanner
Number switch between several channels；
Test method based on the test macro the following steps are included:
Step 1: several BOSA optical devices are installed on jig plate；
Step 2: the laser scans instrument is powered on by electric switch to BOSA optical device transmitting terminal, meanwhile, the optical signal mould
Block issues standard testing light source, this light source enters BOSA optical device receiving end by the wavelength division module and photoswitch；
Step 3: the electric signal from laser scanner is converted to optical signal by the BOSA optical device transmitting terminal, this light letter
Number enter laser scans instrument by the wavelength division module, meanwhile, BOSA optical device receiving end will come from optical signal module
Optical signal be converted to electric signal；
Step 4: the laser scans instrument acquires the optical signal from BOSA optical device transmitting terminal, and pass through collected light
Signal obtains the optical power of BOSA optical device transmitting terminal, and the error analyzer acquires the telecommunications from BOSA optical device receiving end
Number, and pass through the sensitivity data of collected electric signal acquisition BOSA optical device receiving end.
Further improved scheme is as follows in above-mentioned technical proposal:
1. in above scheme, the number of several BOSA optical devices is 4.
2. in above scheme, the photoswitch is 2 × 4 photoswitches.
3. in above scheme, the electric switch is 1 × 4 electric switch.
4. in above scheme, BOSA optical device receiving end is connect with error analyzer by RF cable.
5. in above scheme, being provided with an optical attenuator between the optical signal module and wavelength division module, this optical attenuator
For adjusting the luminous intensity from optical signal module.
6. in above scheme, also there is a temperature controller connecting with BOSA optical device, this temperature controller is for adopting
The temperature of collection and monitoring BOSA optical device.
7. in above scheme, also having a detection module connecting with BOSA optical device receiving end, this detection module is used for
Detect the output current intensity of BOSA optical device receiving end.
8. in above scheme, the wavelength division module is 1 × 2 wavelength-division.
Due to the application of the above technical scheme, compared with the prior art, the invention has the following advantages:
1, the present invention is used for the high-speed parallel test method of BOSA optical device, and optical signal module issues standard testing light source, this
Light source enters BOSA optical device receiving end, the BOSA optical device transmitting terminal self-excitation in future by the wavelength division module and photoswitch
The electric signal of light device scanner is converted to optical signal, this optical signal enters laser scans instrument by the wavelength division module, from swashing
Photoscanner arrives laser scanner to BOSA optical device transmitting terminal again, forms the survey to BOSA optical device transmitting terminal of independent completion
Circuit is tried, and from optical signal module to BOSA optical device receiving end again to error analyzer, then it constitutes and BOSA optical device is connect
The complete test loop of receiving end can be by the uplink and downlink light wave of BOSA optical device further by the setting of wavelength division module
Separation well, avoids its mutual interference, so as to realize to the parallel of BOSA optical device transmitting terminal and receiving end
Test, greatly reduces the testing time of BOSA optical device, reduces testing cost and time, further, improve use
The utilization rate of equipment and installations of BOSA optical device.
2, the present invention is used for the high-speed parallel test method of BOSA optical device, and the laser scans instrument passes through electric switch
It is powered on to BOSA optical device transmitting terminal, the optical signal module issues standard testing light source, this light source passes through the wavelength division module
Enter BOSA optical device receiving end with photoswitch, by the setting of photoswitch and electric switch, optical signal and electric signal can be existed
Automatically switch between multiple channels, so as to test by clamped one time multiple BOSA optical devices, reduces test
Time, the efficiency for improving test cooperate wavelength division module, further reduce the testing time of BOSA optical device, reduce test
Cost and time improve the utilization rate of equipment and installations using BOSA optical device.
Detailed description of the invention
Attached drawing 1 is test system structure schematic diagram of the present invention for the high-speed parallel test method of BOSA optical device.
In the figures above: 1, BOSA optical device；2, laser scans instrument；3, optical signal module；4, error analyzer；5, wave
Sub-module；6, optical attenuator；7, temperature controller；8, detection module；9, photoswitch；10, the public input terminal of electric switch；11, electric
Switch.
Specific embodiment
Embodiment 1: a kind of high-speed parallel test method for BOSA optical device is based on a test macro, the test
System includes several BOSA optical devices 1 being installed on jig plate, laser scans instrument 2, the error code configured with optical signal module 3
Analyzer 4, the BOSA optical device 1 are connect with laser scans instrument 2, error analyzer 4 respectively；
The laser scans instrument 2, for giving the power supply of 1 transmitting terminal of BOSA optical device, and before acquiring 1 transmitting terminal of BOSA optical device
Hold voltage and optical power；
1 transmitting terminal of BOSA optical device receives the electric signal from laser scans instrument 2, and converts electrical signals to optical signal
It is transmitted back to laser scans instrument 2；
The optical signal module 3, for generating the optical signal for being transmitted to 1 receiving end of BOSA optical device；
1 receiving end of BOSA optical device receives the optical signal from optical signal module 3, and converts optical signals to electric signal biography
It is defeated to arrive error analyzer 4；
The error analyzer 4 is for acquiring the electric signal from 1 receiving end of BOSA optical device；
Also there is a wavelength division module 5, this wavelength division module 5 receives the optical signal from 1 transmitting terminal of BOSA optical device, and is transmitted
It to laser scans instrument 2, is also used to receive the optical signal from optical signal module 3, and transmits it to the reception of BOSA optical device 1
End；
A photoswitch 9 is provided between the wavelength division module 5 and several BOSA optical devices 1, this photoswitch 9 will be for that will come from light
Signaling module 3 simultaneously enters the optical signal of several 1 receiving ends of BOSA optical device between several optical channels by wavelength division module 5
Switching is also used to that the light of laser scans instrument 2 will be entered from several 1 transmitting terminals of BOSA optical device and by wavelength division module 5
Signal switches between several optical channels；
There is the public input terminal 10 of an electric switch, this electric switch between the laser scans instrument 2 and several BOSA optical devices 1
It is connected with electric switch 11 between public input terminal 10 and several BOSA optical devices 1, this electric switch 11 will be for that will come from laser
The electric signal of scanner 2 switches between several channels；
Test method based on the test macro the following steps are included:
Step 1: several BOSA optical devices 1 are installed on jig plate；
Step 2: the laser scans instrument 2 is powered on by electric switch 11 to 1 transmitting terminal of BOSA optical device, meanwhile, the light letter
Number module 3 issues standard testing light source, this light source enters the reception of BOSA optical device 1 by the wavelength division module 5 and photoswitch 9
End；
Step 3: the electric signal from laser scanner 2 is converted to optical signal by 1 transmitting terminal of BOSA optical device, this light
Signal enters laser scans instrument 2 by the wavelength division module 5, meanwhile, 1 receiving end of BOSA optical device will come from optical signal
The optical signal of module 3 is converted to electric signal；
Step 4: the laser scans instrument 2 acquires the optical signal from 1 transmitting terminal of BOSA optical device, and by collected
Optical signal obtains the optical power of 1 transmitting terminal of BOSA optical device, and the acquisition of error analyzer 4 comes from 1 receiving end of BOSA optical device
Electric signal, and pass through collected electric signal obtain 1 receiving end of BOSA optical device sensitivity data.
The number of above-mentioned several BOSA optical devices 1 is 4；Above-mentioned photoswitch 9 is 2 × 4 photoswitches；Above-mentioned electric switch 11 is
1 × 4 electric switch；
Above-mentioned 1 receiving end of BOSA optical device is connect with error analyzer 4 by RF cable；Above-mentioned optical signal module 3 and wavelength-division
An optical attenuator 6 is provided between module 5, this optical attenuator 6 is for adjusting the luminous intensity from optical signal module 3.
Embodiment 2: a kind of high-speed parallel test method for BOSA optical device is based on a test macro, the test
System includes several BOSA optical devices 1 being installed on jig plate, laser scans instrument 2, the error code configured with optical signal module 3
Analyzer 4, the BOSA optical device 1 are connect with laser scans instrument 2, error analyzer 4 respectively；
The laser scans instrument 2, for giving the power supply of 1 transmitting terminal of BOSA optical device, and before acquiring 1 transmitting terminal of BOSA optical device
Hold voltage and optical power；
1 transmitting terminal of BOSA optical device receives the electric signal from laser scans instrument 2, and converts electrical signals to optical signal
It is transmitted back to laser scans instrument 2；
The optical signal module 3, for generating the optical signal for being transmitted to 1 receiving end of BOSA optical device；
1 receiving end of BOSA optical device receives the optical signal from optical signal module 3, and converts optical signals to electric signal biography
It is defeated to arrive error analyzer 4；
The error analyzer 4 is for acquiring the electric signal from 1 receiving end of BOSA optical device；
Also there is a wavelength division module 5, this wavelength division module 5 receives the optical signal from 1 transmitting terminal of BOSA optical device, and is transmitted
It to laser scans instrument 2, is also used to receive the optical signal from optical signal module 3, and transmits it to the reception of BOSA optical device 1
End；
A photoswitch 9 is provided between the wavelength division module 5 and several BOSA optical devices 1, this photoswitch 9 will be for that will come from light
Signaling module 3 simultaneously enters the optical signal of several 1 receiving ends of BOSA optical device between several optical channels by wavelength division module 5
Switching is also used to that the light of laser scans instrument 2 will be entered from several 1 transmitting terminals of BOSA optical device and by wavelength division module 5
Signal switches between several optical channels；
There is the public input terminal 10 of an electric switch, this electric switch between the laser scans instrument 2 and several BOSA optical devices 1
It is connected with electric switch 11 between public input terminal 10 and several BOSA optical devices 1, this electric switch 11 will be for that will come from laser
The electric signal of scanner 2 switches between several channels；
Test method based on the test macro the following steps are included:
Step 1: several BOSA optical devices 1 are installed on jig plate；
Step 2: the laser scans instrument 2 is powered on by electric switch 11 to 1 transmitting terminal of BOSA optical device, meanwhile, the light letter
Number module 3 issues standard testing light source, this light source enters the reception of BOSA optical device 1 by the wavelength division module 5 and photoswitch 9
End；
Step 3: the electric signal from laser scanner 2 is converted to optical signal by 1 transmitting terminal of BOSA optical device, this light
Signal enters laser scans instrument 2 by the wavelength division module 5, meanwhile, 1 receiving end of BOSA optical device will come from optical signal
The optical signal of module 3 is converted to electric signal；
Step 4: the laser scans instrument 2 acquires the optical signal from 1 transmitting terminal of BOSA optical device, and by collected
Optical signal obtains the optical power of 1 transmitting terminal of BOSA optical device, and the acquisition of error analyzer 4 comes from 1 receiving end of BOSA optical device
Electric signal, and pass through collected electric signal obtain 1 receiving end of BOSA optical device sensitivity data.
Also there is a temperature controller 7 connecting with BOSA optical device 1, this temperature controller 7 is for acquiring and monitoring
The temperature of BOSA optical device 1；
Also there is a detection module 8 connecting with 1 receiving end of BOSA optical device, this detection module 8 is for detecting BOSA optical device 1
The output current intensity of receiving end；Above-mentioned wavelength division module 5 is 1 × 2 wavelength-division.
It, can be with by the setting of wavelength division module when using the above-mentioned high-speed parallel test method for BOSA optical device
The uplink and downlink light wave of BOSA optical device is separated well, avoids its mutual interference, so as to realize pair
The concurrent testing of BOSA optical device transmitting terminal and receiving end greatly reduces the testing time of BOSA optical device, reduces test
Cost and time further improve the utilization rate of equipment and installations using BOSA optical device；In addition, passing through photoswitch and electric switch
Setting, optical signal and electric signal can be automatically switched between multiple channels, so as to by clamped one time to multiple
BOSA optical device is tested, and is reduced the time of test, is improved the efficiency of test, cooperates wavelength division module, further reduce
The testing time of BOSA optical device, testing cost and time are reduced, improves the utilization rate of equipment and installations using BOSA optical device.
The above embodiments merely illustrate the technical concept and features of the present invention, and its object is to allow person skilled in the art
Scholar cans understand the content of the present invention and implement it accordingly, and it is not intended to limit the scope of the present invention.It is all according to the present invention
Equivalent change or modification made by Spirit Essence, should be covered by the protection scope of the present invention.
Claims (9)
1. a kind of high-speed parallel test method for BOSA optical device, it is characterised in that: be based on a test macro, the test
System includes several BOSA optical devices (1) being installed on jig plate, laser scans instrument (2), configured with optical signal module (3)
Error analyzer (4), the BOSA optical device (1) connect with laser scans instrument (2), error analyzer (4) respectively；
The laser scans instrument (2) for powering to BOSA optical device (1) transmitting terminal, and acquires BOSA optical device (1) transmitting
The front voltage and optical power at end；
BOSA optical device (1) transmitting terminal receives the electric signal for coming from laser scans instrument (2), and converts electrical signals to light
Signal is transmitted back to laser scans instrument (2)；
The optical signal module (3), for generating the optical signal for being transmitted to BOSA optical device (1) receiving end；
BOSA optical device (1) receiving end receives the optical signal for coming from optical signal module (3), and converts optical signals to telecommunications
Number it is transferred to error analyzer (4)；
The error analyzer (4) is used to acquire the electric signal from BOSA optical device (1) receiving end；
Also there are a wavelength division module (5), this wavelength division module (5) receives the optical signal for coming from BOSA optical device (1) transmitting terminal, and will
It is transmitted to laser scans instrument (2), is also used to receive the optical signal for coming from optical signal module (3), and transmit it to BOSA
Optical device (1) receiving end；
A photoswitch (9) are provided between the wavelength division module (5) and several BOSA optical devices (1), this photoswitch (9) is used for
Several BOSA optical devices (1) will be entered if the optical signal of receiving end exists from optical signal module (3) and by wavelength division module (5)
Switch between dry optical channel, is also used to enter from several BOSA optical device (1) transmitting terminals and by wavelength division module (5)
The optical signal of laser scans instrument (2) switches between several optical channels；
There is the public input terminal of an electric switch (10) between the laser scans instrument (2) and several BOSA optical devices (1), this
Electric switch (11) are connected between the public input terminal of electric switch (10) and several BOSA optical devices (1), this electric switch (11) is used
Switch between several channels in by the electric signal for coming from laser scanner (2)；
Test method based on the test macro the following steps are included:
Step 1: several BOSA optical devices (1) are installed on jig plate；
Step 2: the laser scans instrument (2) powers on by electric switch (11) to BOSA optical device (1) transmitting terminal, meanwhile, institute
It states optical signal module (3) and issues standard testing light source, this light source enters BOSA by the wavelength division module (5) and photoswitch (9)
Optical device (1) receiving end；
Step 3: the electric signal from laser scanner (2) is converted to optical signal by BOSA optical device (1) transmitting terminal,
This optical signal enters laser scans instrument (2) by the wavelength division module (5), meanwhile, BOSA optical device (1) receiving end will
Optical signal from optical signal module (3) is converted to electric signal；
Step 4: laser scans instrument (2) acquisition comes from the optical signal of BOSA optical device (1) transmitting terminal, and pass through acquisition
The optical signal arrived obtains the optical power of BOSA optical device (1) transmitting terminal, and error analyzer (4) acquisition comes from BOSA optical device
(1) electric signal of receiving end, and pass through the sensitivity data of collected electric signal acquisition BOSA optical device (1) receiving end.
2. the high-speed parallel test method according to claim 1 for BOSA optical device, it is characterised in that: described several
The number of BOSA optical device (1) is 4.
3. the high-speed parallel test method according to claim 1 or 2 for BOSA optical device, it is characterised in that: described
Photoswitch (9) is 2 × 4 photoswitches.
4. the high-speed parallel test method according to claim 3 for BOSA optical device, it is characterised in that: described to establish by cable
Closing (11) is 1 × 4 electric switch.
5. the high-speed parallel test method according to claim 1 for BOSA optical device, it is characterised in that: the BOSA
Optical device (1) receiving end is connect with error analyzer (4) by RF cable.
6. the high-speed parallel test method according to claim 1 for BOSA optical device, it is characterised in that: the light letter
Number an optical attenuator (6) are provided between module (3) and wavelength division module (5), this optical attenuator (6) comes from optical signal for adjusting
The luminous intensity of module (3).
7. the high-speed parallel test method according to claim 1 for BOSA optical device, it is characterised in that: also have one
The temperature controller (7) connecting with BOSA optical device (1), this temperature controller (7) is for acquiring and monitoring BOSA optical device (1)
Temperature.
8. the high-speed parallel test method according to claim 1 for BOSA optical device, it is characterised in that: also have one
The detection module (8) connecting with BOSA optical device (1) receiving end, this detection module (8) is for detecting BOSA optical device (1) reception
The output current intensity at end.
9. the high-speed parallel test method according to claim 1 for BOSA optical device, it is characterised in that: the wavelength-division
Module (5) is 1 × 2 wavelength-division.
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Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6676304B1 (en) * | 2001-01-11 | 2004-01-13 | Ciena Corporation | Optical module testing system |
| CN103731206A (en) * | 2013-12-26 | 2014-04-16 | 武汉电信器件有限公司 | Device for testing communication error rate and sensitivity of light module |
| CN104333415A (en) * | 2014-09-26 | 2015-02-04 | 武汉光迅科技股份有限公司 | Multi-channel automatic test method used for testing optical modules and system thereof |
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| CN205356347U (en) * | 2016-02-04 | 2016-06-29 | 湖北工业大学 | Multichannel parallel test system that is used for optical module |
| CN107769850A (en) * | 2017-11-23 | 2018-03-06 | 成都嘉纳海威科技有限责任公司 | A kind of multichannel optical module automatic testing equipment and method based on MCU |
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