CN110187534B - Method and system for detecting pin deviation of LCD product through AOI test - Google Patents
Method and system for detecting pin deviation of LCD product through AOI test Download PDFInfo
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- CN110187534B CN110187534B CN201910528120.1A CN201910528120A CN110187534B CN 110187534 B CN110187534 B CN 110187534B CN 201910528120 A CN201910528120 A CN 201910528120A CN 110187534 B CN110187534 B CN 110187534B
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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Abstract
The invention provides a method and a system for detecting pin deviation of LCD products by AOI test, comprising the following steps: electrifying an LCD product in the AOI tester, and displaying a pattern on the LCD product; photographing patterns displayed by an LCD product to generate a contrast image; and comparing the comparison image with the template image to identify deviation stitches. The automatic detection of the partial foot problem of the LCD glass can be realized, the standardized detection is realized through automation, and the detection efficiency is improved.
Description
Technical Field
The invention relates to the field of LCD detection equipment, in particular to a method and a system for detecting pin deviation of an LCD product through AOI test.
Background
The LCD glass is a component for displaying in electronic equipment, and comprises a glass screen for displaying and pins for connection, and the display of the LCD is realized by electrifying the pins.
Present LCD glass stitch can the off normal in process of production, and the stitch of off normal can influence the assembly because the off normal when specifically using in the electronic product, because the stitch off normal that detects LCD glass is essential in LCD glass's qualified inspection index, and present AOI check out test set does not provide the detection function to LCD glass's stitch off normal, relies on current machine to detect the difficulty, and adopts artifical the measuring then can only observe through people's eye, and people's eye observes and can't realize standardizedly, and detection efficiency is low.
Accordingly, the prior art is yet to be improved and developed.
Disclosure of Invention
The technical problem to be solved by the invention is to provide a method and a system for detecting the pin deviation of an LCD product by AOI test, which can realize automatic detection of the pin deviation problem of LCD glass and avoid the problems of incapability of realizing standardized detection and low detection efficiency caused by direct observation by human eyes.
The technical scheme adopted by the invention for solving the technical problem is as follows:
a method for checking pin deviation of LCD products by AOI test comprises the following steps:
electrifying an LCD product in the AOI tester, and displaying a pattern on the LCD product;
photographing patterns displayed by an LCD product to generate a contrast image;
and comparing the comparison image with the template image to identify deviation stitches.
Further, before the step of comparing the image with the template image to identify the offset pins, the method further comprises the following steps:
a template image is preset in an AOI testing machine, and the template image comprises a standard display pattern and a standard stitch arrangement graph corresponding to the display pattern.
Further, in the step of photographing the pattern displayed on the LCD product to generate a contrast image, the contrast image includes the pattern displayed on the LCD product and a stitch arrangement pattern arranged relative to the position of the image displayed on the LCD product.
Further, the specific steps of comparing the comparison image with the template image to identify the deviation stitch are as follows:
identifying patterns of the LCD display in the contrast image;
selecting a template image corresponding to the pattern displayed by the LCD;
and judging whether the stitch arrangement in the comparison image deviates according to the difference between the template image and the comparison image.
Further, in the step of determining whether the stitch arrangement in the comparison image is deviated according to the difference between the template image and the comparison image, the method specifically includes:
aligning the standard display pattern in the template image with the display pattern in the comparison image;
comparing the standard stitch arrangement pattern in the template image with the stitch arrangement pattern in the comparison image;
and judging whether the positions of the pins in the pin arrangement graph in the comparison image correspond to the positions of the pins in the standard pin arrangement graph.
A system for inspecting pin deviation of LCD products by AOI test comprises:
the power supply module is used for electrifying an LCD product in the AOI testing machine, and the LCD product displays patterns;
the shooting module is used for shooting the patterns displayed by the LCD product to generate contrast images;
and the comparison identification module is used for comparing the image with the template image to identify the deviation stitch.
The device further comprises a preset template module, wherein the preset template module is used for presetting a template image in the AOI testing machine, and the template image comprises a standard display pattern and a standard stitch arrangement graph corresponding to the display pattern.
Further, in the shooting module, the contrast image comprises a pattern displayed by the LCD product and a stitch arrangement pattern arranged relative to the position of the image displayed by the LCD product.
Further, the comparison identification module comprises:
an identification pattern unit for identifying a pattern displayed by the LCD in the contrast image;
a selection template unit for selecting a template image corresponding to a pattern displayed by the LCD;
and the deviation judging unit is used for judging whether the pin arrangement in the comparison image deviates according to the difference between the template image and the comparison image.
Further, the deviation judging unit is specifically configured to align a standard display pattern in the template image with a display pattern in the comparison image, compare a standard stitch arrangement pattern in the template image with a stitch arrangement pattern in the comparison image, and then judge whether a stitch in the stitch arrangement pattern in the comparison image corresponds to a stitch position in the standard stitch arrangement pattern.
The beneficial effect who adopts above-mentioned scheme is: the invention provides a method for detecting pin deviation of LCD products by AOI test, which comprises the steps of electrifying an LCD product in an AOI tester, displaying patterns on the LCD product, photographing the patterns displayed on the LCD product to generate a contrast image, comparing the contrast image with a template image to identify deviation pins, comparing a standard pin arrangement pattern in the template image with a pin arrangement pattern in the contrast image, carrying out differential operation on the standard pin arrangement pattern in the template image and the pin arrangement pattern in the contrast image to generate a difference image between the standard pin arrangement pattern and the pin arrangement pattern, and judging the difference image, namely judging whether the pins in the pin arrangement pattern in the contrast image correspond to the pin positions in the standard pin arrangement pattern. Therefore, whether the pins deviate or not is judged automatically, automatic detection of the deviation problem of the LCD glass can be realized, standardized detection is realized automatically, and the detection efficiency is improved.
Drawings
FIG. 1 is a flow chart illustrating an embodiment of the method for inspecting pin deviation of LCD products by AOI test according to the present invention.
FIG. 2 is a flow chart illustrating the preferred embodiment of the method for inspecting the pin deviation of LCD products by AOI test according to the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer and clearer, the present invention is further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1 and fig. 2, the present invention provides a method for inspecting pin deviation of LCD products by AOI test, which comprises the following steps:
and S100, electrifying the LCD product in the AOI testing machine, wherein the LCD product displays patterns.
In the step of this implementation, LCD glass places in AOI equipment, is connected and supplies power to LCD glass through power module and LCD glass's stitch, and the stitch of LCD glass shows the image on the display screen after circular telegram.
And step S200, photographing the pattern displayed by the LCD product to generate a contrast image.
Specifically, the AOI testing machine has a photographing contrast function, and images can be generated after the images displayed by the LCD product are photographed through the photographing assembly on the AOI testing machine, wherein the images are contrast images. In the process of shooting the pattern, the whole LCD glass is shot, so that the contrast image comprises the pattern displayed by the LCD product and the stitch arrangement pattern arranged relative to the position of the image displayed by the LCD product.
Step S300, presetting a template image in the AOI testing machine, wherein the template image comprises a standard display pattern and a standard stitch arrangement graph corresponding to the display pattern.
Specifically, a template image is preset in the AOI tester, and the template image is provided with a standard display pattern and a standard stitch arrangement graph corresponding to the display pattern; namely, the standard pin arrangement shape is corresponding to the standard display pattern, and the position of the standard display pattern and the position of the standard pin arrangement are fixed positions.
And S400, comparing the image with the template image to identify deviation stitches.
In the specific process, the deviation stitch is identified by comparing the difference between the image and the template image.
The step S400 specifically includes the steps of:
and step S410, identifying the pattern displayed by the LCD in the contrast image.
Step S420, selecting a template image corresponding to the pattern displayed by the LCD.
Step S430, judging whether the stitch arrangement in the comparison image deviates according to the difference between the template image and the comparison image.
In a specific implementation process, the pattern displayed by the LCD in the comparison image is identified through a software algorithm in the AOI, and the template image corresponding to the pattern displayed by the LCD is selected after identification. And judging whether the stitch arrangement in the comparison image deviates according to the difference between the template image and the comparison image, wherein the identified template image is provided with a stitch arrangement graph compared with the standard stitch arrangement graph, the difference image is easily obtained after the stitch arrangement graph in the comparison image is compared with the standard stitch arrangement graph, and the stitch deviation can be judged if the stitch arrangement graph in the image has the difference.
The specific step S430 includes the following steps:
step S431, aligning the standard display pattern in the template image with the display pattern in the comparison image.
And S432, comparing the standard stitch arrangement pattern in the template image with the stitch arrangement pattern in the comparison image.
Step S433, judging whether the stitch in the stitch arrangement graph in the comparison image corresponds to the stitch position in the standard stitch arrangement graph.
In the specific implementation process, the position of the contrast image is converted, so that the display pattern in the contrast image is aligned with the standard display pattern in the template image, then the standard stitch arrangement pattern in the template image is compared with the stitch arrangement pattern in the contrast image, a difference image is generated between the standard stitch arrangement pattern in the template image and the stitch arrangement pattern in the contrast image through differential operation of the standard stitch arrangement pattern in the template image and the stitch arrangement pattern in the contrast image, the difference image is judged, namely whether the stitch in the stitch arrangement pattern in the contrast image corresponds to the stitch position in the standard stitch arrangement pattern is judged, if the positions correspond to each other, the stitch of the LCD is judged not to be deviated, if the standard of the difference image does not conform to the standard of qualified difference, the stitch of the LCD is judged to be deviated, and the LCD product is unqualified.
The method comprises the steps of electrifying an LCD product in an AOI testing machine, displaying a pattern on the LCD product, photographing the pattern displayed on the LCD product to generate a contrast image, comparing the contrast image with a template image to identify deviation stitches, comparing a standard stitch arrangement pattern in the template image with a stitch arrangement pattern in the contrast image, carrying out differential operation on the standard stitch arrangement pattern in the template image and the stitch arrangement pattern in the contrast image to generate a difference image between the standard stitch arrangement pattern and the stitch arrangement pattern in the template image, and judging the difference image, namely judging whether the stitches in the stitch arrangement pattern in the contrast image correspond to the stitch positions in the standard stitch arrangement pattern.
The invention also provides a system for checking the pin deviation of the LCD product by AOI test, which comprises: the device comprises a power supply module, a shooting module and a comparison and identification module; the power supply module is used for electrifying an LCD product in the AOI testing machine, and the LCD product displays patterns; the shooting module is used for shooting the patterns displayed by the LCD product to generate contrast images; the comparison identification module is used for comparing the image with the template image to identify deviation stitches.
The device also comprises a preset template module, wherein the preset template module is used for presetting a template image in the AOI testing machine, and the template image comprises a standard display pattern and a standard stitch arrangement graph corresponding to the display pattern.
In the shooting module, the contrast image comprises a pattern displayed by the LCD product and a stitch arrangement pattern arranged relative to the position of the image displayed by the LCD product.
The contrast identification module comprises an identification pattern unit, and the identification pattern unit is used for identifying patterns displayed by an LCD in a contrast image; a selection template unit for selecting a template image corresponding to a pattern displayed by the LCD; and the deviation judging unit is used for judging whether the pin arrangement in the comparison image deviates according to the difference between the template image and the comparison image.
The deviation judging unit in the system is specifically used for aligning a standard display pattern in a template image and a display pattern in a comparison image, then comparing a standard stitch arrangement pattern in the template image with a stitch arrangement pattern in the comparison image, and then judging whether stitches in the stitch arrangement pattern in the comparison image correspond to stitch positions in the standard stitch arrangement pattern.
In summary, the present invention provides a method and a system for inspecting pin deviation of LCD products by AOI test, wherein the LCD products in the AOI tester are powered on to display patterns, the patterns displayed on the LCD products are photographed to generate contrast images, the contrast images are compared with the template images to identify the deviation pins, then the standard pin arrangement patterns in the template images are compared with the pin arrangement patterns in the contrast images, a difference image is generated between the standard pin arrangement patterns in the template images and the pin arrangement patterns in the contrast images by performing a difference operation on the standard pin arrangement patterns in the template images and the pin arrangement patterns in the contrast images, and the difference image is determined, i.e. whether the pins in the pin arrangement patterns in the contrast images correspond to the pin positions in the standard pin arrangement patterns is determined. Therefore, whether the pins deviate or not is judged automatically, automatic detection of the deviation problem of the LCD glass can be realized, standardized detection is realized automatically, and the detection efficiency is improved.
It is to be understood that the invention is not limited to the examples described above, but that modifications and variations may be effected thereto by those of ordinary skill in the art in light of the foregoing description, and that all such modifications and variations are intended to be within the scope of the invention as defined by the appended claims.
Claims (4)
1. A method for checking pin deviation of LCD products by AOI test is characterized by comprising the following steps:
electrifying an LCD product in the AOI tester, and displaying a pattern on the LCD product;
the method comprises the steps of photographing patterns displayed by an LCD product to generate a contrast image, wherein the contrast image comprises the patterns displayed by the LCD product and a stitch arrangement pattern arranged relative to the position of the images displayed by the LCD product;
identifying patterns of the LCD display in the contrast image;
selecting a template image corresponding to the pattern displayed by the LCD;
judging whether the stitch arrangement in the comparison image deviates according to the difference between the template image and the comparison image;
in the step of determining whether the stitch arrangement in the comparison image is deviated according to the difference between the template image and the comparison image, the method specifically includes:
aligning the standard display pattern in the template image with the display pattern in the comparison image;
comparing the standard stitch arrangement pattern in the template image with the stitch arrangement pattern in the comparison image;
performing differential operation on the standard stitch arrangement pattern in the template image and the stitch arrangement pattern in the comparison image to generate a differential image between the standard stitch arrangement pattern and the stitch arrangement pattern, and judging the differential image;
judging whether the positions of the pins in the pin arrangement pattern in the comparison image correspond to the positions of the pins in the standard pin arrangement pattern, if so, judging that the pins of the LCD do not deviate, and if the standard of the difference image does not meet the standard of qualified difference, judging that the pins of the LCD deviate, and the LCD product is unqualified.
2. The method for inspecting pin misalignment of LCD products according to claim 1, wherein: before the step of comparing the comparison image with the template image and identifying the deviation stitch, the method also comprises the following steps:
a template image is preset in an AOI testing machine, and the template image comprises a standard display pattern and a standard stitch arrangement graph corresponding to the display pattern.
3. A system for checking pin deviation of LCD products by AOI test is characterized by comprising:
the power supply module is used for electrifying an LCD product in the AOI testing machine, and the LCD product displays patterns;
the shooting module is used for shooting the patterns displayed by the LCD product to generate contrast images, and the contrast images comprise the patterns displayed by the LCD product and stitch arrangement patterns arranged relative to the positions of the images displayed by the LCD product;
the comparison identification module is used for comparing the image with the template image and identifying deviation stitches;
the comparison identification module comprises:
an identification pattern unit for identifying a pattern displayed by the LCD in the contrast image;
a selection template unit for selecting a template image corresponding to a pattern displayed by the LCD;
the deviation judging unit is used for judging whether the stitch arrangement in the comparison image deviates according to the difference between the template image and the comparison image;
the deviation judging unit is specifically used for aligning the standard display pattern in the template image and the display pattern in the comparison image, then comparing the standard stitch arrangement pattern in the template image with the stitch arrangement pattern in the comparison image,
performing differential operation on the standard stitch arrangement pattern in the template image and the stitch arrangement pattern in the comparison image to generate a differential image between the standard stitch arrangement pattern and the stitch arrangement pattern, and judging the differential image;
judging whether the positions of the pins in the pin arrangement pattern in the comparison image correspond to the positions of the pins in the standard pin arrangement pattern, if so, judging that the pins of the LCD do not deviate, and if the standard of the difference image does not meet the standard of qualified difference, judging that the pins of the LCD deviate, and the LCD product is unqualified.
4. The system according to claim 3, further comprising a pre-template module for pre-setting a template image in the AOI tester, wherein the template image comprises a standard display pattern and a standard stitch arrangement pattern corresponding to the display pattern.
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| CN111208147A (en) * | 2020-01-13 | 2020-05-29 | 普联技术有限公司 | Stitch detection method, device and system |
| CN111458628A (en) * | 2020-04-29 | 2020-07-28 | 广州镭晨智能科技有限公司 | Template file updating method, device, equipment and computer readable storage medium |
| CN115090540A (en) * | 2022-05-31 | 2022-09-23 | 江西合力泰科技有限公司 | Method and system for detecting full-display image of liquid crystal display screen |
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