CN110160460B - Metal structure deformation measuring device and method based on digital photography - Google Patents
Metal structure deformation measuring device and method based on digital photography Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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Abstract
The invention relates to the technical field of metal structure deformation measurement, in particular to a metal structure deformation measurement device and method based on digital photography, wherein the invention designs a special target light source target module and a reference light source target module, and has stronger capability of resisting ambient light interference compared with other machine vision measurement technologies; the horizontal deformation can be dynamically measured, and the measuring precision can reach the level of sub-pixels by utilizing a high-resolution CMOS camera and a sub-pixel positioning algorithm; the problem of small camera vision can be effectively solved by utilizing the multiple reflectors, so that the CMOS camera can collect the target light source target module and the reference light source target module at the same time; the camera shake problem caused by the environment can be effectively eliminated by utilizing the reference light source target module, the measurement precision is effectively improved, and the target light source target module can be increased or decreased to move so as to measure a plurality of positions or specific positions of the metal member to be measured in a targeted manner.
Description
Technical Field
The invention relates to the technical field of metal structure deformation measurement, in particular to a metal structure deformation measurement device and method based on digital photography.
Background
With the continuous progress and development of technology and metal materials, metal structures are increasingly applied and implemented in fields such as traditional portal cranes, tower cranes, modern metal structure bridges, metal structure rail beams, metal structure house frames and the like. The metal structure is deformed by external force or internal force, and once the elastic limit is exceeded, the metal structure cannot be restored to the original state, even is broken, and causes accidents, so that important parameters such as plastic deformation such as camber, lower deflection, warping degree, span, horizontal deformation under the action of external force and the like of the large-scale structure must be detected.
Among the existing metal structure deformation measuring methods, the common methods include an instrument measuring method, a sensor measuring method, a GPS measuring method and the like, wherein the instrument measuring method is to acquire three-dimensional coordinates by utilizing instruments for measuring angles and displacements conventionally such as theodolites, total stations, level gauges and range finders, and the methods have the problems that the measuring speed is low, multiple points cannot be measured at the same time, the measuring accuracy is greatly influenced by operators and the like; the conventional sensor measuring methods comprise an LVDT displacement meter, a fiber bragg grating, a strain gauge and the like, and the methods need to be contacted with or buried in a measured object, so that interference can be caused to the measured object; the GPS measurement method is non-contact measurement, but the volume is large, the number of satellites can influence the measurement precision, and the existing instrument can not measure the deformation of the metal structure in the horizontal direction under the dynamic condition.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides the metal structure deformation measuring device and method based on digital photography, which can be high-precision, long-distance non-contact, real-time continuous dynamic and convenient to install and use.
In order to solve the technical problems, the invention adopts the following technical scheme:
The invention provides a metal structure deformation measuring device based on digital photography, which comprises an upper computer, a CMOS camera, a support, a target light source target module, a reference light source target module, a connecting device and a power supply unit, wherein the target light source target module comprises a first powerful magnet, a first LED (light-emitting diode) area light source and a target film target, the reference light source target module comprises a second powerful magnet, a second LED area light source and the reference film target, the connecting device is fixed on the support, the CMOS camera is fixed on the connecting device, the CMOS camera is provided with a zoom lens, the upper computer is connected and regulated with the CMOS camera through a network, the connecting device is provided with a first reflecting mirror, a second reflecting mirror, a third reflecting mirror and an angular displacement table, the second reflecting mirror is rotatably arranged on the angular displacement table, the first reflecting mirror and the third reflecting mirror are respectively arranged on the second reflecting mirror and below, the power supply unit is used for supplying power to the first area light source, the second area light source is fixed on the second surface light source and the target film target, and the first area light source is adhered to the first surface light source and the second surface light source is fixed on the first surface light source target film target, and the first surface light source is adhered to the first surface LED film target film is adhered to the surface of the first surface LED.
Preferably, the first mirror, the second mirror and the third mirror are silvered mirrors.
Preferably, the target film target and the reference film target are set to be round, the target film target and the reference film target are both provided with concentric circles of different materials, the circle center angle of the circle in the middle of the target film target, which is provided with two sectors, is located at the circle center of the target film target, and the circle center angle of the circle in the middle of the reference film target, which is provided with two sectors, is located at the circle center of the reference film target.
Preferably, the emitted light emitted by the first LED area light source and the second LED area light source is 1000-10000K natural light, and the light emitting surface of the first LED area light source and the light emitting surface of the second LED area light source are both provided with high-light-transmittance PWMA panels.
Preferably, the first LED area light source and the second LED area light source are all circular, the outer end of the first LED area light source and the outer end of the second LED area light source are both provided with frames, the widths of the frames of the first LED area light source and the frames of the second LED area light source are 0.5 cm to 2cm, the areas of the first LED area light source and the second LED area light source are both larger than the area of the target film target and the area of the reference film target, the target film target is attached to the middle of the first LED area light source, and the reference film target is attached to the middle of the second LED area light source.
Preferably, the number of the target modules of the target light source is a plurality.
A metal structure deformation measuring method based on digital photography comprises the following steps:
The first step: adjusting the bracket and the angular displacement table to enable the target light source target module and the reference light source target module to be simultaneously positioned in the field of view of the COMS camera, and enabling the imaging to be as close to the middle position of the image as possible;
And a second step of: opening a first LED area light source, adjusting the focal length and aperture of a zoom lens of the CMOS camera, collecting images of a target film target module and a reference film target module, and transmitting image data to an upper computer through a GigE protocol;
And a third step of: on an upper computer, dividing an image by using a threshold segmentation algorithm and prior information to obtain areas where a target film target module and a reference film target module are located, and respectively solving coordinates (Xbeg _1, ybeg_1), (Xbeg _2 and Ybeg_2) of starting points of the areas where the target film target module and the reference film target module are located in an original image;
fourth step: the existing physical size information of the target film target and the reference film target is utilized, a custom threshold algorithm is designed to carry out custom threshold segmentation processing on the areas where the target film target and the reference film target are located, the pixel-level edges of the outermost circles of the target film target and the reference film target are obtained, the horizontal pixel points xPiXcels and the vertical pixel points yPiXcels of the ellipses outside the target film target are obtained;
Fifth step: obtaining sub-pixel level edges of the outermost circles of the target film target and the reference film target obtained in the fourth step by adopting a sub-pixel detection and correction algorithm, then fitting the sub-pixel edges to obtain central coordinates (Xti_1, yti_1), (Xti_2, yti_2) of the target film target and the reference film target in the area where the segmentation is located, and finally obtaining central coordinates (xi_1, yi_1) and (xi_2, yi_2) of the target film target and the reference film target in the original image by utilizing the (Xbeg _1, ybeg_1), (Xbeg _2, ybeg_2) obtained in the third step;
Sixth step: according to xPiXcels, yPiXcels obtained in the fourth step, combining the physical size parameter of the outermost edge circle of the target film target and the parameter of the camera, and determining a horizontal conversion factor kx and a vertical conversion factor ky from an image coordinate system to a world coordinate system;
Seventh step: calculating world coordinates (Xwi _1, ywi_1), (Xwi _2, ywi_2) of the centers of the target film target and the reference film target image of each frame by using the center coordinates (xi_1, yi_1), (xi_2, yi_2) of the target film target and the reference film target obtained in the fifth step and the coordinate conversion factors kx and ky obtained in the sixth step, and calculating fluctuation amounts (delta Xwi _1, delta Ywi _1), (delta Xwi _2, delta Ywi _2) of the centers of the target film target and the reference film target image;
eighth step: and subtracting the fluctuation amount of the center of the reference film target image from the fluctuation amount of the center of the target film target image to obtain displacement variation amounts (delta Xwi and delta Ywi), and then drawing a displacement curve variation graph of the world coordinate differences delta Xwi and delta Ywi with the initial positions.
Preferably, the method for partitioning the target film target image by using the self-defined threshold value in the fourth step specifically includes the steps of setting an initial threshold value of 0 for the target film target image, partitioning the target film target image by using the initial threshold value, then solving the size information of the target film target image after the threshold value is partitioned, comparing the size information with the physical size of the target film target image, and if the size information of the target film target image is inconsistent with the size information of the target film target image, adding 1 to the threshold value until the size information of the partitioned target film target image is consistent with the physical size information of the target film target image, wherein the current threshold value is the final threshold value.
Preferably, the specific steps of sub-pixel level edge acquisition, fitting and center coordinate acquisition by the sub-pixel detection and correction algorithm in the fifth step are as follows, a spatial moment method is adopted according to the pixel level edge of the outermost circle of the target film target acquired in the fourth step, the sub-pixel level edge is acquired, then the pixel level edge is corrected to eliminate the systematic error generated by the method, then the sub-pixel points are subjected to ellipse fitting by using a least square method, the image coordinates (Xti, yti) of the target film target in the segmented area are acquired, and finally the coordinates (Xi, yi) of the center of the target film target in the original image are obtained according to the coordinates (Xbeg, ybeg) acquired in the third step.
Preferably, in the sixth step, according to the physical size information of the outermost edge circle of the target film target, the transformation factors kx and ky from the image coordinate system to the world coordinate system are determined, and the transformation relationship is as follows:
the invention has the beneficial effects that:
Compared with the prior art, the device and the method for measuring the deformation of the metal structure based on digital photography have the following remarkable advantages: the special target light source target module and the reference light source target module are designed, and compared with other machine vision measurement technologies, the device has stronger capability of resisting the interference of the ambient light; the horizontal deformation can be dynamically measured, and the measuring precision can reach the level of sub-pixels by utilizing a high-resolution CMOS camera and a sub-pixel positioning algorithm; the problem of small camera vision can be effectively solved by utilizing the multiple reflectors, so that the CMOS camera can collect the target light source target module and the reference light source target module at the same time; the camera shake problem caused by the environment can be effectively eliminated by utilizing the reference light source target module, the measurement precision is effectively improved, and the target light source target module can be increased or decreased to move so as to measure a plurality of positions or specific positions of the metal member to be measured in a targeted manner.
Drawings
Fig. 1 is a schematic diagram of the structure of the present invention.
Fig. 2 is a schematic structural diagram of the target module of the target light source according to the present invention.
Fig. 3 is a front view of the target film target or the reference film target of the present invention.
Fig. 4 is a schematic structural view of the connecting device of the present invention.
Fig. 5 is a schematic diagram of the light reflection of the connection device of the present invention.
The reference numerals are respectively:
The device comprises an upper computer-1, a power supply unit-2, a bracket-3, a CMOS camera-4, a connecting device-5, a zoom lens-6, a target light source target module-7, a metal component to be tested-8, a reference light source target module-9, a vice-10, a first powerful magnet-11, a first LED surface light source-12, a target film target-13, a first reflecting mirror-14, a second reflecting mirror-15, a third reflecting mirror-16 and an angular displacement table-17.
Detailed Description
The invention will be further described with reference to examples and drawings, to which reference is made, but which are not intended to limit the scope of the invention. The present invention will be described in detail below with reference to the accompanying drawings.
As shown in fig. 1-5, the metal structure deformation measuring device based on digital photography provided by the invention comprises a host computer 1, a CMOS camera 4, a bracket 3, a target light source target module 7, a reference light source target module 9, a connecting device 5 and a power supply unit 2, wherein the target light source target module 7 comprises a first powerful magnet 11, a first LED surface light source 12 and a target film target 13, the reference light source target module 9 comprises a second powerful magnet, a second LED surface light source and a reference film target, the connecting device 5 is fixed on the bracket 3, the CMOS camera 4 is fixed on the connecting device 5, the CMOS camera 4 is provided with a zoom lens 6, the host computer 1 regulates and controls the CMOS camera 4 through network connection, the connecting device 5 is provided with a first reflecting mirror 14, a second reflecting mirror 15, a third reflecting mirror 16 and an angular displacement table 17, the first reflecting mirror 14 and the third reflecting mirror 16 are fixedly arranged on the angular displacement table 17, the second reflecting mirror 15 is rotatably arranged on the first powerful magnet 17, the second reflecting mirror 14 and the third reflecting mirror 16 are respectively arranged on the first surface light source 12 and the target film target 11, the second surface light source is adhered to the power supply unit 11, the first surface light source is adhered to the first surface light source 1 and the second surface light source target film target 11, the second surface light source is adhered to the first surface light source 1 is adhered to the power supply unit, the second surface light source is adhered to the first surface light source 1 and the second surface light source target 1 is adhered to the power supply unit through the first surface light source 1 and the second surface light source 1, the first surface light source is adhered to the first surface light source and the second surface light source is adhered to the power supply unit 12, the reference light source target module 9 is fixed and placed on the ground by using the vice 10, and compared with the prior art, the invention has the following remarkable advantages: the special target light source target module 7 and the reference light source target module 9 are designed, and compared with other machine vision measurement technologies, the device has stronger environment light interference resistance; the horizontal deformation can be dynamically measured, and the measurement precision can reach the sub-pixel level by utilizing the high-resolution CMOS camera 4 and the sub-pixel positioning algorithm; the problem of small camera vision can be effectively solved by utilizing a plurality of reflectors, so that the CMOS camera 4 can collect the target light source target module 7 and the reference light source target module 9 at the same time; the camera shake problem caused by the environment can be effectively eliminated by utilizing the reference light source target module 9, the measurement precision is effectively improved, and the target light source target module 7 can be increased or decreased to move so as to measure a plurality of positions or specific positions of the metal member 8 to be measured in a targeted manner.
Specifically, during measurement, the target light source target module 7 is placed at a position to be measured of the metal member 8 to be measured, the reference light source target module 9 is fixed in a shooting view of the CMOS camera 4, for example, the reference light source target module 9 is fixed on the ground in the shooting view of the CMOS camera 4 by using the vice 10, the height and the direction of the CMOS camera 4 are adjusted by using the bracket 3, the angle of the second reflecting mirror 15 is changed by adjusting the angle of the angular displacement table 17, the target light source target module 7 and the reference light source target module 9 are in the view of the CMOS camera 4, and are imaged at a position as close to the middle of the image as possible, image information acquired by the CMOS camera 4 is transmitted into the upper computer 1 to be processed, and the deformation of the metal member 8 to be measured is obtained by obtaining the displacement of the target film target 13 module through a shake elimination algorithm.
In this embodiment, to ensure the reflectivity of the first mirror 14, the second mirror 15, and the third mirror 16, the first mirror 14, the second mirror 15, and the third mirror 16 are silvered mirrors.
In this embodiment, the target film target 13 and the reference film target are set to be circular, the target film target 13 and the reference film target are both provided with concentric rings made of different materials, the central angles of the two fan-shaped circular rings in the middle of the target film target 13 are set at the center of the target film target 13, and the central angles of the two fan-shaped circular rings in the middle of the reference film target are set at the center of the reference film target.
In this embodiment, the light emitted by the first LED surface light source 12 and the second LED surface light source is natural light with a value of 1000-10000K, and preferably, the light emitted by the first LED surface light source 12 and the second LED surface light source is natural light with a value of 4000K, and both the light emitting surface of the first LED surface light source 12 and the light emitting surface of the second LED surface light source are provided with high-transmittance PWMA panels.
In this embodiment, the first LED area light source 12 and the second LED area light source are all set to be circular, the outer end of the first LED area light source 12 and the outer end of the second LED area light source are both provided with frames, the widths of the frames of the first LED area light source 12 and the frames of the second LED area light source are 0.5-2cm, the areas of the first LED area light source 12 and the second LED area light source are both greater than the area of the target film target 13 and the area of the reference film target, the target film target 13 is attached to the middle part of the first LED area light source 12, and the reference film target is attached to the middle part of the second LED area light source.
In this embodiment, the number of the target modules 7 is plural.
A metal structure deformation measuring method based on digital photography comprises the following steps:
The first step: adjusting the bracket 3 and the angular displacement table 17 so that the target light source target module 7 and the reference light source target module 9 are simultaneously in the field of view of the COMS camera, and imaging is as close to the middle position of the image as possible;
And a second step of: opening a first LED area light source 12, adjusting the focal length and aperture of a zoom lens 6 of the CMOS camera 4, collecting images of a target film target 13 module and a reference film target module, and transmitting image data to the upper computer 1 through a GigE protocol;
And a third step of: on the upper computer 1, dividing an image by using a threshold segmentation algorithm and prior information to obtain areas where the target film target 13 module and the reference film target module are located, and respectively solving coordinates (Xbeg _1, ybeg_1), (Xbeg _2 and Ybeg_2) of starting points of the areas where the target film target 13 module and the reference film target module are located in an original image;
Fourth step: the existing physical size information of the target film target 13 and the reference film target is utilized, a custom threshold algorithm is designed to carry out custom threshold segmentation processing on the areas where the target film target 13 and the reference film target are located, the pixel-level edges of the outermost circles of the target film target 13 and the reference film target are obtained, the horizontal pixel points xPiXcels and the vertical pixel points yPiXcels of the ellipses outside the target film target 13 are obtained;
Fifth step: obtaining sub-pixel level edges of the outermost circles of the target film target 13 and the reference film target obtained in the fourth step by adopting a sub-pixel detection and correction algorithm, then fitting the sub-pixel edges to obtain central coordinates (Xti_1, yti_1), (Xti_2, yti_2) of the region where the target film target 13 and the reference film target are segmented, and finally obtaining central coordinates (xi_1, yi_1) and (xi_2) and (Yi_2) of the target film target 13 and the reference film target in an original image by utilizing the (Xbeg _1, ybeg_1), (Xbeg _2, ybeg_2) obtained in the third step;
Sixth step: according to xPiXcels, yPiXcels obtained in the fourth step, combining the physical size parameter of the outermost edge circle of the target film target 13 and the parameter of the camera, and determining a horizontal conversion factor kx and a vertical conversion factor ky from an image coordinate system to a world coordinate system;
Seventh step: calculating world coordinates (Xwi _1, ywi_1), (Xwi _2, ywi_2) of the centers of the target film target 13 and the reference film target image of each frame by using the center coordinates (xi_1, yi_1), (xi_2, yi_2) of the target film target 13 and the reference film target obtained in the fifth step and the coordinate conversion factors kx and ky obtained in the sixth step, and calculating fluctuation amounts (Δ Xwi _1, Δ Ywi _1) and (Δ Xwi _2, Δ Ywi _2) of the centers of the target film target 13 and the reference film target image;
Eighth step: and subtracting the fluctuation amount of the center of the reference film target image from the central fluctuation amount of the target film target 13 image to obtain displacement variation amounts (delta Xwi and delta Ywi), and then drawing a displacement curve variation graph of the world coordinate differences delta Xwi and delta Ywi with the initial positions.
In this embodiment, the self-defining threshold segmentation algorithm described in the fourth step specifically includes the steps of setting an initial threshold of an image of the target film target 13 to be 0, performing threshold segmentation on the target film target 13, then solving the size information of the image of the target film target 13 after threshold separation, comparing with the physical size of the target film target 13, and if the size information of the image of the target film target 13 is inconsistent, adding 1 to the threshold until the size information of the image of the target film target 13 after separation is consistent with the physical size information of the target film target 13, wherein the current threshold is the final threshold.
In this embodiment, the specific steps of obtaining the sub-pixel level edge, fitting and center coordinates by the sub-pixel detection and correction algorithm described in the fifth step are as follows, according to the pixel level edge of the outermost circle of the target film target 13 obtained in the fourth step, a spatial moment method is adopted to obtain the sub-pixel level edge, then the pixel level edge is corrected to eliminate the systematic error generated by the method, then the sub-pixel point is subjected to ellipse fitting by using the least square method to obtain the image coordinates (Xti, yti) of the target film target 13 in the segmented area, and finally the coordinates (Xi, yi) of the center of the target film target 13 in the original image are obtained according to the (Xbeg, ybeg) obtained in the third step.
In this embodiment, in the sixth step, according to the physical size information of the outermost edge circle of the target film target 13, the transformation factors kx and ky from the image coordinate system to the world coordinate system are determined, and the transformation relationship is as follows:
Example two
In this embodiment, the number of the target light source target modules 7 is plural, and the plural target light source target modules 7 are respectively adhered to different detection positions of the mechanism to be detected through strong magnets, so that different points of the plural metal members 8 to be detected can be detected at the same time, and the detection principle is the same as that of the first embodiment, and no redundant description is provided here.
The present invention is not limited to the preferred embodiments, but is intended to be limited to the following description, and any modifications, equivalent changes and variations in light of the above-described embodiments will be apparent to those skilled in the art without departing from the scope of the present invention.
Claims (9)
1. The utility model provides a metal structure deformation measuring device based on digital photography which characterized in that: comprises an upper computer, a CMOS camera, a bracket, a target light source target module, a reference light source target module, a connecting device and a power supply unit, wherein the target light source target module comprises a first powerful magnet, a first LED surface light source and a target film target, the reference light source target module comprises a second powerful magnet, a second LED surface light source and a reference film target, the connecting device is fixed on the bracket, the CMOS camera is fixed on the connecting device, the CMOS camera is provided with a zoom lens, the upper computer regulates and controls the CMOS camera through network connection, the connecting device is provided with a first reflector, a second reflector, a third reflector and an angular displacement table, the first reflector and the third reflector are fixedly arranged on the angular displacement table, the second reflecting mirror is rotatably arranged on the angular displacement table, the first reflecting mirror and the third reflecting mirror are respectively arranged above and below the second reflecting mirror, the power supply unit is used for supplying power to the first LED area light source, the second LED area light source, the CMOS camera and the upper computer, the target film target is adhered to the surface of the first LED area light source, the first powerful magnet is adhered to the back surface of the first LED area light source, the reference film target is adhered to the surface of the second LED area light source, the second powerful magnet is adhered to the back surface of the second LED area light source, the target light source target module is adhered to a metal member to be detected through the first powerful magnet, and the reference light source target module is fixed in the shooting view of the CMOS camera;
The first reflecting mirror, the second reflecting mirror and the third reflecting mirror are silver plating reflecting mirrors;
The target film target and the reference film target are arranged in a round shape.
2. The digital photographing-based metal structure deformation measuring device according to claim 1, wherein: the device comprises a target film target and a reference film target, wherein concentric rings of different materials are arranged on the target film target and the reference film target, two fan-shaped circular angles are arranged on the circular ring in the middle of the target film target, the circular angles of the two fan-shaped circular angles are arranged at the circle center of the target film target, and the circular ring in the middle of the reference film target is provided with two fan-shaped circular angles which are arranged at the circle center of the reference film target.
3. The digital photographing-based metal structure deformation measuring device according to claim 1, wherein: the light emitted by the first LED area light source and the second LED area light source is 1000-10000K natural light, and high-light-transmittance PWMA panels are arranged on the light-emitting surface of the first LED area light source and the light-emitting surface of the second LED area light source.
4. The digital photographing-based metal structure deformation measuring device according to claim 1, wherein: the first LED area light source and the second LED area light source are all set to be circular, first LED area light source outer end with the second LED area light source outer end all is provided with the frame, the frame of first LED area light source with the width of the frame of second LED area light source is 0.5-2cm, first LED area light source area with the area of second LED area light source is all greater than the area of target film target and the area of reference film target, target film target laminate in first LED area light source middle part, reference film target laminate in second LED area light source middle part.
5. The digital photographing-based metal structure deformation measuring device according to claim 1, wherein: the number of the target modules of the target light source is a plurality.
6. The metal structure deformation measuring method based on digital photography is characterized by comprising the following steps:
The first step: adjusting the bracket and the angular displacement table to enable the target light source target module and the reference light source target module to be simultaneously positioned in the field of view of the COMS camera, and imaging the middle position close to the image;
And a second step of: opening a first LED area light source, adjusting the focal length and aperture of a zoom lens of the CMOS camera, collecting images of a target film target module and a reference film target module, and transmitting image data to an upper computer through a GigE protocol;
And a third step of: on an upper computer, dividing an image by using a threshold segmentation algorithm and prior information to obtain areas where a target film target module and a reference film target module are located, and respectively solving coordinates (Xbeg _1, ybeg_1), (Xbeg _2 and Ybeg_2) of starting points of the areas where the target film target module and the reference film target module are located in an original image;
fourth step: the existing physical size information of the target film target and the reference film target is utilized, a custom threshold algorithm is designed to carry out custom threshold segmentation processing on the areas where the target film target and the reference film target are located, the pixel-level edges of the outermost circles of the target film target and the reference film target are obtained, the horizontal pixel points xPiXcels and the vertical pixel points yPiXcels of the ellipses outside the target film target are obtained;
Fifth step: obtaining sub-pixel level edges of the outermost circles of the target film target and the reference film target obtained in the fourth step by adopting a sub-pixel detection and correction algorithm, then fitting the sub-pixel edges to obtain central coordinates (Xti_1, yti_1), (Xti_2, yti_2) of the target film target and the reference film target in the area where the segmentation is located, and finally obtaining central coordinates (xi_1, yi_1) and (xi_2, yi_2) of the target film target and the reference film target in the original image by utilizing the (Xbeg _1, ybeg_1), (Xbeg _2, ybeg_2) obtained in the third step;
Sixth step: according to xPiXcels, yPiXcels obtained in the fourth step, combining the physical size parameter of the outermost edge circle of the target film target and the parameter of the camera, and determining a horizontal conversion factor kx and a vertical conversion factor ky from an image coordinate system to a world coordinate system;
Seventh step: calculating world coordinates (Xwi _1, ywi_1), (Xwi _2, ywi_2) of the centers of the target film target and the reference film target image of each frame by using the center coordinates (xi_1, yi_1), (xi_2, yi_2) of the target film target and the reference film target obtained in the fifth step and the coordinate conversion factors kx and ky obtained in the sixth step, and calculating fluctuation amounts (delta Xwi _1, delta Ywi _1), (delta Xwi _2, delta Ywi _2) of the centers of the target film target and the reference film target image;
eighth step: and subtracting the fluctuation amount of the center of the reference film target image from the fluctuation amount of the center of the target film target image to obtain displacement variation amounts (delta Xwi and delta Ywi), and then drawing a displacement curve variation graph of the world coordinate differences delta Xwi and delta Ywi with the initial positions.
7. The method for measuring deformation of a metal structure based on digital photographing according to claim 6, wherein: setting an initial threshold value of a target film target image as 0, carrying out threshold segmentation on the target film target, then solving the size information of the target film target image after threshold separation, comparing with the physical size of the target film target, and if the size information of the target film target image and the physical size information of the target film target are inconsistent, adding 1 to the threshold value, and if the size information of the separated target film target image and the physical size information of the target film target are inconsistent, obtaining the current threshold value as the final threshold value.
8. The method for measuring deformation of a metal structure based on digital photographing according to claim 6, wherein: the specific steps of sub-pixel level edge acquisition, fitting and center coordinate acquisition by the sub-pixel detection and correction algorithm in the fifth step are as follows, the sub-pixel level edge is acquired by adopting a space moment method according to the pixel level edge of the outermost circle of the target film target acquired in the fourth step, then the pixel level edge is corrected to eliminate the systematic error generated by the method, then the sub-pixel points are subjected to ellipse fitting by using a least square method to acquire the image coordinates (Xti, yti) of the target film target in the segmented area, and finally the coordinates (Xi, yi) of the center of the target film target in the original image are obtained according to the coordinates (Xbeg, ybeg) acquired in the third step.
9. The method for measuring deformation of a metal structure based on digital photographing according to claim 6, wherein: in the sixth step, according to the physical size information of the outermost edge circle of the target film target, the transformation factors kx and ky from the image coordinate system to the world coordinate system are determined, and the transformation relationship is as follows:
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