CN110146546B - 一种冷镜式露点仪自动光电检测*** - Google Patents
一种冷镜式露点仪自动光电检测*** Download PDFInfo
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- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
- G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
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Citations (11)
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CN2906609Y (zh) * | 2006-05-12 | 2007-05-30 | 北京京虹天科技有限公司 | 改进型冷镜露点传感器 |
CN101004397A (zh) * | 2007-01-16 | 2007-07-25 | 丁五行 | 智能化快速测量冷镜露点仪 |
CN101236166A (zh) * | 2008-02-19 | 2008-08-06 | 丁五行 | 冷镜式露点仪的控制方法 |
CN102087205A (zh) * | 2009-12-04 | 2011-06-08 | 上海莫克电子技术有限公司 | 一种冷镜式精密露点仪 |
CN102636519A (zh) * | 2011-02-12 | 2012-08-15 | 北京兴泰学成仪器有限公司 | 一种快速准确测定低湿气体露点的方法和装置 |
CN202710497U (zh) * | 2012-07-19 | 2013-01-30 | 上海电控研究所 | 一种冷镜式露点测试仪的光路*** |
JP2013019870A (ja) * | 2011-07-14 | 2013-01-31 | Shinyei Technology Co Ltd | 鏡面冷却式露点計 |
JP2014185952A (ja) * | 2013-03-25 | 2014-10-02 | Kyocera Corp | 補間選択方法および補間選択装置 |
CN204286633U (zh) * | 2014-12-01 | 2015-04-22 | 苏州赛宝校准技术服务有限公司 | 一种远程冷镜式露点仪 |
CN106706708A (zh) * | 2015-11-16 | 2017-05-24 | 杨斌 | 快速高精度冷镜式露点仪的控制方法 |
CN107579429A (zh) * | 2016-07-04 | 2018-01-12 | 深圳市光峰光电技术有限公司 | 半导体激光器及其温度控制方法 |
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- 2019-06-17 CN CN201910521026.3A patent/CN110146546B/zh active Active
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2906609Y (zh) * | 2006-05-12 | 2007-05-30 | 北京京虹天科技有限公司 | 改进型冷镜露点传感器 |
CN101004397A (zh) * | 2007-01-16 | 2007-07-25 | 丁五行 | 智能化快速测量冷镜露点仪 |
CN101236166A (zh) * | 2008-02-19 | 2008-08-06 | 丁五行 | 冷镜式露点仪的控制方法 |
CN102087205A (zh) * | 2009-12-04 | 2011-06-08 | 上海莫克电子技术有限公司 | 一种冷镜式精密露点仪 |
CN102636519A (zh) * | 2011-02-12 | 2012-08-15 | 北京兴泰学成仪器有限公司 | 一种快速准确测定低湿气体露点的方法和装置 |
JP2013019870A (ja) * | 2011-07-14 | 2013-01-31 | Shinyei Technology Co Ltd | 鏡面冷却式露点計 |
CN202710497U (zh) * | 2012-07-19 | 2013-01-30 | 上海电控研究所 | 一种冷镜式露点测试仪的光路*** |
JP2014185952A (ja) * | 2013-03-25 | 2014-10-02 | Kyocera Corp | 補間選択方法および補間選択装置 |
CN204286633U (zh) * | 2014-12-01 | 2015-04-22 | 苏州赛宝校准技术服务有限公司 | 一种远程冷镜式露点仪 |
CN106706708A (zh) * | 2015-11-16 | 2017-05-24 | 杨斌 | 快速高精度冷镜式露点仪的控制方法 |
CN107579429A (zh) * | 2016-07-04 | 2018-01-12 | 深圳市光峰光电技术有限公司 | 半导体激光器及其温度控制方法 |
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Effective date of registration: 20211230 Address after: 518000 202-203, 2nd floor, building 10, Guanlong 2nd Industrial Zone, Xinwei community, Xili street, Nanshan District, Shenzhen City, Guangdong Province Applicant after: Shenzhen Yiliang Testing Co.,Ltd. Address before: 545000 Room 601, unit 1, building 6, No. 52, Shandong Road, Chengzhong District, Liuzhou City, Guangxi Zhuang Autonomous Region Applicant before: Qin Yan |
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