CN110142229A - A kind of method and device for the center luminous flux accounting calculating semiconductor laser - Google Patents
A kind of method and device for the center luminous flux accounting calculating semiconductor laser Download PDFInfo
- Publication number
- CN110142229A CN110142229A CN201910309279.4A CN201910309279A CN110142229A CN 110142229 A CN110142229 A CN 110142229A CN 201910309279 A CN201910309279 A CN 201910309279A CN 110142229 A CN110142229 A CN 110142229A
- Authority
- CN
- China
- Prior art keywords
- laser
- image
- calculating
- luminous flux
- centre
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Lasers (AREA)
Abstract
The invention discloses a kind of method and devices of center luminous flux accounting for calculating semiconductor laser.It include the luminous universe of the testing laser device in the laser image this method comprises: obtaining the laser image of testing laser device；Calculate the luminous universe in the laser image and centre of luminescence region；The brightness summation sum1 for calculating whole pixels in the luminous universe calculates the brightness summation sum2 of whole pixels in the centre of luminescence region；Calculate center luminous flux accounting ratio=sum2/sum1 of the testing laser device.This method can calculate the center luminous flux accounting of semiconductor laser, to screen qualified product and defective products.
Description
Technical field
The present invention relates to semiconductor laser device more particularly to a kind of center luminous flux accountings for calculating semiconductor laser
Method and device.
Background technique
With the development of cell-phone camera technology, depth camera becomes the standard configuration of the electronic equipments such as mobile phone.Semiconductor
Laser is composition device important in depth camera, for being obtained with auxiliary laser imager to object projection laser hot spot
Take the depth information of object.Center luminous flux accounting is an important technology index of semiconductor laser, center luminous flux
Accounting is too low or too high can all form defective products.
Summary of the invention
In order to solve above-mentioned the deficiencies in the prior art, the present invention provides a kind of center luminous flux for calculating semiconductor laser
The method and device of accounting can calculate the center luminous flux accounting of semiconductor laser, to screen qualified product and defective products.
The technical problems to be solved by the invention are achieved by the following technical programs:
A method of the center luminous flux accounting of semiconductor laser being calculated, step includes:
The laser image of testing laser device is obtained, includes the luminous universe of the testing laser device in the laser image；
Calculate the luminous universe in the laser image and centre of luminescence region；
The brightness summation sum1 for calculating whole pixels in the luminous universe, calculates the whole in the centre of luminescence region
The brightness summation sum2 of pixel；
Calculate center luminous flux accounting ratio=sum2/ sum1 of the testing laser device.
Further, the step of obtaining the laser image of the testing laser device include:
The testing laser device is driven to project laser facula in a plane；
It drives a Laser imagers that the laser facula in the plane is imaged, obtains the laser image.
Further, the FOV of the Laser imagers is greater than the FOV of the testing laser device.
Further, the step of calculating the luminous universe in the laser image include:
It is according to preset first luminance threshold, brightness value in the laser image is all not less than first luminance threshold
Pixel extracts；
The all pixels extracted point is formed into the luminous universe.
Further, the step of calculating the centre of luminescence region in the laser image include:
Brightness value maximum or former big pixels are found in the laser image；
The average brightness between brightness value maximum or former big pixels is calculated, and by the average brightness by default
Ratio is converted to the second luminance threshold；
According to second luminance threshold, binaryzation is carried out to the laser image, obtains binary image；
The minimum circumscribed rectangle for calculating the binaryzation central area in the binary image, as the centre of luminescence area
Domain.
Further, second luminance threshold is the 50%-80% of the average brightness.
Further, before the sum1 and sum2 for calculating the laser image, the centre of luminescence region is first calculated
Relative to the laser image rotation angle and corrected.
Further, the angle between the centre of luminescence region and the laser image is being calculated in the laser image
Spending the step of deviating includes:
Rectangular coordinate system XY is established on the laser image；
Calculate the linear equation of an at least edges of regions in the centre of luminescence region；
The angle between an at least edges of regions and corresponding image border in the laser image is calculated, as the rotation
Angle Zro.
Further, before obtaining the luminous universe and centre of luminescence region, yin first is carried out to the laser image
At least one of shadow correction, distortion correction and mean filter processing.
It is a kind of calculate semiconductor laser center luminous flux accounting device, including processor and with the processor connect
The memory connect, the computer program executed for the processor is stored in the memory, and the processor executes the meter
When calculation machine program, the method that carries out the center luminous flux accounting of above-mentioned calculating semiconductor laser.
The center luminous flux that semiconductor laser can be calculated the invention has the following beneficial effects: this method and device accounts for
Than to screen qualified product and defective products.
Detailed description of the invention
Fig. 1 is the step block diagram provided by the invention for calculating center luminous flux accounting；
Fig. 2 is the detection platform schematic diagram carried out when center luminous flux accounting calculates；
Fig. 3 is the step block diagram provided by the invention for obtaining centre of luminescence region；
Fig. 4 is the schematic diagram of binary image provided by the invention；
Fig. 5 is that binary image provided by the invention corrects the schematic diagram after rotation angle.
Specific embodiment
The present invention will be described in detail with reference to the accompanying drawings and examples.
Embodiment one
As shown in Figure 1, a kind of method for the center luminous flux accounting for calculating semiconductor laser, step include:
S101: obtaining the laser image of testing laser device, includes the luminous complete of the testing laser device in the laser image
Domain；
Before step S101, test platform need to be first built, as shown in Fig. 2, the testing laser device is placed in a plane
One Laser imagers, are placed in the other side of the plane by side, and the plane is a transmission plane；If the plane is one
The plane of reflection, then the testing laser device and Laser imagers are placed in the same side of the plane.
Specifically, the step of obtaining the laser image of the testing laser device includes:
S101.1: the testing laser device is driven to project laser facula in the plane；
S101.2: driving the Laser imagers that the laser facula in the plane is imaged, and obtains the laser image.
In order to enable the Laser imagers to cover the entire laser facula of the testing laser device, the laser at
As the FOV of device is preferably more than the FOV of the testing laser device or the distance between the Laser imagers and plane are greater than
The distance between the testing laser device and plane.
Then, before carrying out next step S102, first to the laser image carry out shadow correction, distortion correction and
At least one of in value filtering processing.
S102: the luminous universe in the laser image and centre of luminescence region are calculated；
In step s 102, the luminous universe refers to that the entire laser facula projected by the testing laser device covers
The range covered, the centre of luminescence region refer to bright in the entire laser facula projected by the testing laser device
Spend the range that higher central area covers.
Specifically, the step of calculating the luminous universe in the laser image includes:
S102.a1: according to preset first luminance threshold, brightness value in the laser image is not less than first luminance threshold
The all pixels point of value extracts；
First luminance threshold is empirically preset by testing staff, as long as can distinguish in the laser image
The luminous universe and image peripheral region (region not being irradiated to by laser facula)；In general, described image
The brightness value of peripheral region is similar to 0, even and the lower luminous peripheral region of brightness is (in non-luminescent in the luminous universe
Heart district domain), brightness value will also be far longer than 0.
S102.a2: all pixels extracted point is formed into the luminous universe.
Specifically, as shown in figure 3, the step of calculating the centre of luminescence region in the laser image includes:
S102.b1: brightness value maximum or former big pixels are found in the laser image；
In step S102.b1, brightness value maximum or former big pixels are referred to all pixels in the laser image
After pressing the descending arrangement of brightness value, the pixel that makes number one or (such as front two or front three) is ranked in the top
Pixel.
S102.b2: calculating that brightness value is maximum or former big pixels between average brightness, and by the brightness
Average value is converted to the second luminance threshold by preset ratio；
Preferably, second luminance threshold is the 50%-80% of the average brightness.
S102.b3: according to second luminance threshold, binaryzation is carried out to the laser image, obtains binary image；
In step S102.b3, brightness value in the laser image is lower than all pixels point of second luminance threshold
Brightness value is uniformly adjusted to 255, and brightness value in the laser image is higher than the bright of all pixels point of second luminance threshold
Angle value is uniformly adjusted to 0, obtains binary image as shown in Figure 4；It include the binaryzation center of black in the binary image
The binaryzation peripheral region in region and white；Certainly, brightness value in the laser image is lower than second brightness in turn
The brightness value of all pixels point of threshold value is uniformly adjusted to 0, and brightness value in the laser image is higher than second luminance threshold
All pixels point brightness value be uniformly adjusted to 255 can also be with, include the binaryzation of white in the binary image obtained at this time
The binaryzation peripheral region of central area and black.
The binaryzation central area corresponds to the centre of luminescence region, and the binaryzation peripheral region corresponds to described
Image peripheral region and luminous peripheral region (non-luminescent central area).
S102.b4: the minimum circumscribed rectangle of the binaryzation central area in the binary image is calculated, as described
Centre of luminescence region.
In step S102.b4, due to passing through binary conversion treatment, there was only central area and periphery in the binary image
The difference in region, the i.e. only difference of black region and white area；In view of the central area of the binary image may
In the presence of lesser block of pixels of taking measurements greatly, four-way region can be used or eight passage areas screen out the lesser block of pixels of size.
Wherein, minimum circumscribed rectangle is the existing concept of field of image processing, and calculation method is also the prior art, no longer
It is discussed in detail.
Then, before carrying out next step S103, the centre of luminescence region is first calculated relative to the laser figure
The rotation angle of picture is simultaneously corrected as shown in Figures 4 and 5.
Specifically, calculating rotation angle of the centre of luminescence region relative to the laser image in the laser image
The step of spending include:
Rectangular coordinate system XY is established on the laser image；
Calculate the linear equation of an at least edges of regions in the centre of luminescence region；
The angle between an at least edges of regions and corresponding image border in the laser image is calculated, as the rotation
Angle Zro.
Wherein, the edges of regions in the centre of luminescence region is the rectangular edges of the minimum circumscribed rectangle, by entangling
After just, the edges of regions in the centre of luminescence region is parallel with corresponding image border in the laser image.
S103: the brightness summation sum1 of whole pixels in the luminous universe is calculated, the centre of luminescence area is calculated
The brightness summation sum2 of whole pixels in domain；
In step s 103, the added luminance of whole pixels in the luminous universe is summed, obtains sum1, it will be described
The added luminance of whole pixels in centre of luminescence region is summed, and sum2 is obtained.
S104: center luminous flux accounting ratio=sum2/ sum1 of the testing laser device is calculated；
In step S104, if the center luminous flux accounting ratio of the testing laser device is within a preset range, it is described to
Survey laser is qualified product, if the center luminous flux accounting ratio of the testing laser device is below or above preset range, institute
Stating testing laser device is defective products.
This method can calculate the center luminous flux accounting of semiconductor laser, to screen qualified product and defective products.
Embodiment two
A kind of device for the center luminous flux accounting calculating semiconductor laser, including processor and is connected to the processor
Memory, the computer program executed for the processor is stored in the memory, and the processor executes the computer
When program, the method for the center luminous flux accounting of calculating semiconductor laser described in progress embodiment one.
Embodiments of the present invention above described embodiment only expresses, the description thereof is more specific and detailed, but can not
Therefore limitations on the scope of the patent of the present invention are interpreted as, as long as skill obtained in the form of equivalent substitutions or equivalent transformations
Art scheme should all be fallen within the scope and spirit of the invention.
Claims (10)
1. a kind of method for the center luminous flux accounting for calculating semiconductor laser, which is characterized in that step includes:
The laser image of testing laser device is obtained, includes the luminous universe of the testing laser device in the laser image；
Calculate the luminous universe in the laser image and centre of luminescence region；
The brightness summation sum1 for calculating whole pixels in the luminous universe, calculates the whole in the centre of luminescence region
The brightness summation sum2 of pixel；
Calculate center luminous flux accounting ratio=sum2/ sum1 of the testing laser device.
2. the method for the center luminous flux accounting according to claim 1 for calculating semiconductor laser, which is characterized in that obtain
The step of taking the laser image of the testing laser device include:
The testing laser device is driven to project laser facula in a plane；
It drives a Laser imagers that the laser facula in the plane is imaged, obtains the laser image.
3. the method for the center luminous flux accounting according to claim 2 for calculating semiconductor laser, which is characterized in that institute
The FOV for stating Laser imagers is greater than the FOV of the testing laser device.
4. the method for the center luminous flux accounting according to claim 1 for calculating semiconductor laser, which is characterized in that meter
The step of calculating the luminous universe in the laser image include:
It is according to preset first luminance threshold, brightness value in the laser image is all not less than first luminance threshold
Pixel extracts；
The all pixels extracted point is formed into the luminous universe.
5. the method for the center luminous flux accounting according to claim 1 for calculating semiconductor laser, which is characterized in that meter
The step of calculating the centre of luminescence region in the laser image include:
Brightness value maximum or former big pixels are found in the laser image；
The average brightness between brightness value maximum or former big pixels is calculated, and by the average brightness by default
Ratio is converted to the second luminance threshold；
According to second luminance threshold, binaryzation is carried out to the laser image, obtains binary image；
The minimum circumscribed rectangle for calculating the binaryzation central area in the binary image, as the centre of luminescence area
Domain.
6. the method for the center luminous flux accounting according to claim 5 for calculating semiconductor laser, which is characterized in that institute
State the 50%-80% that the second luminance threshold is the average brightness.
7. the method for calculating the center luminous flux accounting of semiconductor laser according to claim 1 or 5, feature exist
In first calculating the centre of luminescence region relative to the laser before the sum1 and sum2 for calculating the laser image
The rotation angle of image is simultaneously corrected.
8. the method for the center luminous flux accounting according to claim 7 for calculating semiconductor laser, which is characterized in that
The step of angle offset between the centre of luminescence region and the laser image is calculated in the laser image include:
Rectangular coordinate system XY is established on the laser image；
Calculate the linear equation of an at least edges of regions in the centre of luminescence region；
The angle between an at least edges of regions and corresponding image border in the laser image is calculated, as the rotation
Angle Zro.
9. the method for the center luminous flux accounting according to claim 1 for calculating semiconductor laser, which is characterized in that
Before obtaining the luminous universe and centre of luminescence region, first to the laser image carry out shadow correction, distortion correction and
At least one of value filtering processing.
10. it is a kind of calculate semiconductor laser center luminous flux accounting device, including processor and with the processor connect
The memory connect stores the computer program executed for the processor in the memory, which is characterized in that the processing
When device executes the computer program, the center luminous flux of any calculating semiconductor laser in claim 1-9 is carried out
The method of accounting.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910309279.4A CN110142229A (en) | 2019-04-17 | 2019-04-17 | A kind of method and device for the center luminous flux accounting calculating semiconductor laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910309279.4A CN110142229A (en) | 2019-04-17 | 2019-04-17 | A kind of method and device for the center luminous flux accounting calculating semiconductor laser |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110142229A true CN110142229A (en) | 2019-08-20 |
Family
ID=67588386
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910309279.4A Pending CN110142229A (en) | 2019-04-17 | 2019-04-17 | A kind of method and device for the center luminous flux accounting calculating semiconductor laser |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110142229A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110595738A (en) * | 2019-08-30 | 2019-12-20 | 歌尔股份有限公司 | Laser detection method, device and equipment and depth camera |
| CN110736610A (en) * | 2019-10-22 | 2020-01-31 | 歌尔股份有限公司 | Method and device for measuring optical center deviation, storage medium and depth camera |
| CN111460844A (en) * | 2020-04-17 | 2020-07-28 | 支付宝(杭州)信息技术有限公司 | Method, device and equipment for detecting positioning light of code scanning equipment |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3945729A (en) * | 1974-12-30 | 1976-03-23 | Stanford Research Institute | Combined ranging and color sensor |
| US4812641A (en) * | 1987-02-03 | 1989-03-14 | General Electric Company | High power optical fiber failure detection system |
| CN1591037A (en) * | 2003-09-05 | 2005-03-09 | 明基电通股份有限公司 | Method and apparatus for measuring lampbulb effect |
| CN103983429A (en) * | 2014-04-22 | 2014-08-13 | 常州市武进区半导体照明应用技术研究院 | Luminous surface brightness uniformity analyzing method |
| CN108548481A (en) * | 2018-02-24 | 2018-09-18 | 厦门盈趣科技股份有限公司 | A kind of measuring system and method for laser spot size |
| CN109580174A (en) * | 2018-12-26 | 2019-04-05 | 信利光电股份有限公司 | Detection method, device and the readable storage medium storing program for executing of semiconductor laser local uniformity |
-
2019
- 2019-04-17 CN CN201910309279.4A patent/CN110142229A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3945729A (en) * | 1974-12-30 | 1976-03-23 | Stanford Research Institute | Combined ranging and color sensor |
| US4812641A (en) * | 1987-02-03 | 1989-03-14 | General Electric Company | High power optical fiber failure detection system |
| CN1591037A (en) * | 2003-09-05 | 2005-03-09 | 明基电通股份有限公司 | Method and apparatus for measuring lampbulb effect |
| CN103983429A (en) * | 2014-04-22 | 2014-08-13 | 常州市武进区半导体照明应用技术研究院 | Luminous surface brightness uniformity analyzing method |
| CN108548481A (en) * | 2018-02-24 | 2018-09-18 | 厦门盈趣科技股份有限公司 | A kind of measuring system and method for laser spot size |
| CN109580174A (en) * | 2018-12-26 | 2019-04-05 | 信利光电股份有限公司 | Detection method, device and the readable storage medium storing program for executing of semiconductor laser local uniformity |
Non-Patent Citations (2)
| Title |
|---|
| 朱小清 等: "《照明技术手册》", 30 November 1995, 机械工业出版社 * |
| 王驰: "《激光检测技术及应用》", 31 December 2016, 上海大学出版社 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110595738A (en) * | 2019-08-30 | 2019-12-20 | 歌尔股份有限公司 | Laser detection method, device and equipment and depth camera |
| CN110595738B (en) * | 2019-08-30 | 2021-04-16 | 歌尔光学科技有限公司 | Laser detection method, device and equipment and depth camera |
| CN110736610A (en) * | 2019-10-22 | 2020-01-31 | 歌尔股份有限公司 | Method and device for measuring optical center deviation, storage medium and depth camera |
| CN111460844A (en) * | 2020-04-17 | 2020-07-28 | 支付宝(杭州)信息技术有限公司 | Method, device and equipment for detecting positioning light of code scanning equipment |
| CN111460844B (en) * | 2020-04-17 | 2023-05-09 | 支付宝(杭州)信息技术有限公司 | Method, device and equipment for detecting positioning lamplight of code scanning equipment |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110142229A (en) | A kind of method and device for the center luminous flux accounting calculating semiconductor laser | |
| CN104756490B (en) | Depth image enhancement method | |
| CN110599548A (en) | Camera calibration method and device, camera and computer readable storage medium | |
| CN109272459A (en) | Image processing method, device, storage medium and electronic equipment | |
| KR101941801B1 (en) | Image processing method and device for led display screen | |
| US7499600B2 (en) | Method for characterizing a digital imaging system | |
| CN113365041A (en) | Projection correction method, projection correction device, storage medium and electronic equipment | |
| CN109983401A (en) | Video camera assists automatic screen fitting | |
| CN108369650A (en) | The method that candidate point in the image of calibrating pattern is identified as to the possibility characteristic point of the calibrating pattern | |
| CN108320270B (en) | Image correction method, device and storage medium | |
| JP6115214B2 (en) | Pattern processing apparatus, pattern processing method, and pattern processing program | |
| CN109191520B (en) | Plant leaf area measuring method and system based on color calibration | |
| CN107024485A (en) | The defect inspection method and device of camber display screen | |
| US20130216121A1 (en) | Pattern measuring method, pattern measuring apparatus, and program using same | |
| CN109727215A (en) | Image processing method, device, terminal device and storage medium | |
| CN113286135A (en) | Image correction method and apparatus | |
| CN110736610A (en) | Method and device for measuring optical center deviation, storage medium and depth camera | |
| CN115100037A (en) | Large-breadth tile imaging method and system based on multi-line scanning camera image splicing | |
| CN111192227B (en) | Fusion processing method for overlapped pictures | |
| CN108259667A (en) | Have the function of to go out and shield the mobile terminal and its control method of barcode scanning | |
| CN105095824A (en) | Identification control method and apparatus for information code | |
| CN108955519A (en) | Express delivery living object detection system and method | |
| CN106445223A (en) | Anti-interference method for automatic positioning of optical touch screen | |
| CN114078094A (en) | Image edge brightness correction method, device and system | |
| JP2006133055A (en) | Unevenness defect detection method and device, spatial filter, unevenness defect inspection system, and program for unevenness defect detection method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20190820 |