CN110109342B - Crystal oscillator frequency time keeping method and time keeping equipment - Google Patents
Crystal oscillator frequency time keeping method and time keeping equipment Download PDFInfo
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- CN110109342B CN110109342B CN201810103343.9A CN201810103343A CN110109342B CN 110109342 B CN110109342 B CN 110109342B CN 201810103343 A CN201810103343 A CN 201810103343A CN 110109342 B CN110109342 B CN 110109342B
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- 238000012545 processing Methods 0.000 claims description 24
- 230000002431 foraging effect Effects 0.000 claims 2
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- 238000010586 diagram Methods 0.000 description 4
- 229910052701 rubidium Inorganic materials 0.000 description 3
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- NUJOXMJBOLGQSY-UHFFFAOYSA-N manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 description 2
- 230000035882 stress Effects 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- FBDMJGHBCPNRGF-UHFFFAOYSA-M [OH-].[Li+].[O-2].[Mn+2] Chemical compound [OH-].[Li+].[O-2].[Mn+2] FBDMJGHBCPNRGF-UHFFFAOYSA-M 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical compound [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
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- 239000003792 electrolyte Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910017053 inorganic salt Inorganic materials 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- MHCFAGZWMAWTNR-UHFFFAOYSA-M lithium perchlorate Chemical compound [Li+].[O-]Cl(=O)(=O)=O MHCFAGZWMAWTNR-UHFFFAOYSA-M 0.000 description 1
- 229910001486 lithium perchlorate Inorganic materials 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
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Classifications
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- G—PHYSICS
- G04—HOROLOGY
- G04R—RADIO-CONTROLLED TIME-PIECES
- G04R20/00—Setting the time according to the time information carried or implied by the radio signal
- G04R20/02—Setting the time according to the time information carried or implied by the radio signal the radio signal being sent by a satellite, e.g. GPS
- G04R20/04—Tuning or receiving; Circuits therefor
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- G—PHYSICS
- G04—HOROLOGY
- G04R—RADIO-CONTROLLED TIME-PIECES
- G04R40/00—Correcting the clock frequency
- G04R40/06—Correcting the clock frequency by computing the time value implied by the radio signal
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- Theoretical Computer Science (AREA)
- Oscillators With Electromechanical Resonators (AREA)
- Electric Clocks (AREA)
Abstract
The embodiment of the invention relates to the technical field of time keeping, and discloses a crystal oscillator frequency time keeping method and time keeping equipment. The crystal oscillator frequency time keeping method comprises the following steps: acquiring the power-off starting time and the power-on starting time of the crystal oscillator; calculating the actual power-off duration according to the power-off starting time and the power-on starting time; obtaining a frequency aging rate curve corresponding to the actual power-off duration from a pre-stored corresponding relation between the power-off duration and the frequency aging rate curve of the crystal oscillator; calculating compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration; and adjusting the frequency of the crystal oscillator according to the compensation frequency. Through the mode, the embodiment of the invention can meet the requirements of low cost and stability.
Description
Technical Field
The invention relates to the technical field of time keeping, in particular to a crystal oscillator frequency time keeping method and time keeping equipment.
Background
The system is characterized in that a GPS satellite signal antenna receiving module is arranged in the general system and is used for receiving GPS satellite time service information containing pulse-per-second signals and realizing system time service and network time synchronization according to the pulse-per-second signals in the received satellite time service information. However, in some cases, when the GPS satellite signal antenna receiving module cannot normally receive the second pulse signal in the GPS satellite timing information, in order to ensure normal operation of system timing and network clock synchronization, the system generally also sets a time keeping module so as to avoid affecting the normal operation of the system when the GPS satellite communication fails.
In the prior art, most timekeeping modules use a rubidium clock or crystal oscillator to lock a GPS in order to obtain accurate time, so that timekeeping capacity is improved, and the system timekeeping is accurate. However, the rubidium clock has high cost and is difficult to realize, the crystal oscillator locking GPS can realize the high-stability time keeping effect only by carrying out long-time taming on the crystal oscillator, and the crystal oscillator locking GPS needs to be tamed again after power failure and has a strong relationship with the power failure time.
The inventor finds that the time keeping equipment of the related technology has high cost and instability in the process of realizing the embodiment of the invention.
Disclosure of Invention
In order to solve the technical problems, the invention aims to provide a low-cost and stable crystal oscillator frequency time keeping method and time keeping equipment.
In order to achieve the above purpose, the embodiment of the invention discloses the following technical scheme:
the invention provides a crystal oscillator frequency time keeping method, which comprises the following steps: acquiring the power-off starting time and the power-on starting time of the crystal oscillator; calculating the actual power-off duration according to the power-off starting time and the power-on starting time; obtaining a frequency aging rate curve corresponding to the actual power-off duration from a pre-stored corresponding relation between the power-off duration and the frequency aging rate curve of the crystal oscillator; calculating compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration; and adjusting the frequency of the crystal oscillator according to the compensation frequency.
In some embodiments, acquiring the power-off start time and the power-on start time of the crystal oscillator; calculating the actual power-off duration according to the power-off starting time and the power-on starting time; obtaining a frequency aging rate curve corresponding to the actual power-off duration from a pre-stored corresponding relation between the power-off duration and the frequency aging rate curve of the crystal oscillator; calculating compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration; and adjusting the frequency of the crystal oscillator according to the compensation frequency.
In some embodiments, the calculation formula for calculating the compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration is as follows: y=y 0+At;ΔY＝Y-Y0; wherein Y is a current frequency, Y 0 is an initial frequency, a is an aging rate, t is a current energization time, and Δy is a compensation frequency.
In some embodiments, before said adjusting the frequency of the crystal oscillator according to the compensation frequency, the method further comprises: inquiring the corresponding test output frequency according to the actual power-off duration and the current power-on duration; comparing the corresponding test output frequency with the current frequency to obtain a frequency deviation; and if the frequency deviation is smaller than a preset error threshold, adjusting the frequency of the crystal oscillator according to the compensation frequency.
The invention also provides a time keeping device, comprising: the crystal oscillator is connected with the central processing unit; the central processing unit is used for: acquiring the power-off starting time and the power-on starting time of the crystal oscillator; calculating the actual power-off duration according to the power-off starting time and the power-on starting time; obtaining a frequency aging rate curve corresponding to the actual power-off duration from a pre-stored corresponding relation between the power-off duration and the frequency aging rate curve of the crystal oscillator; calculating compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration; and adjusting the frequency of the crystal oscillator according to the compensation frequency.
In some embodiments, the time keeping device further comprises an antenna receiving module;
the antenna receiving module is used for receiving a reference source signal;
The central processing unit is used for: when the antenna receiving module normally receives the reference source signal, the crystal oscillator is powered off, and after the test power-off time of the crystal oscillator, the crystal oscillator is normally powered on; after the crystal oscillator is normally powered, acquiring the test power-on time length of the crystal oscillator and the test output frequency of the crystal oscillator, and generating a frequency aging rate curve of the crystal oscillator according to the test power-on time length, the test output frequency and the standard frequency of the reference source signal; taking the test power-off time length as a power-off time length, and storing a corresponding relation between the power-off time length and the frequency aging rate curve; and adding a preset interval value to the test power-off duration, judging whether the test power-off duration is larger than a preset threshold value after the test power-off duration is added with the preset interval value, if so, stopping, otherwise, returning to the step of powering off the crystal oscillator, and normally powering on the crystal oscillator after the crystal oscillator is powered off for the test power-off duration.
In some embodiments, the time keeping device further comprises a power supply, wherein the power supply is respectively connected with the crystal oscillator and the central processing unit; the power supply is used for providing power for the crystal oscillator; the central processing unit is further configured to: and controlling the power supply to cut off the power of the crystal oscillator or controlling the power supply to supply power to the crystal oscillator.
In some embodiments, the number of the crystal oscillators is at least two, and the time keeping device further comprises a gating switch, wherein the gating switch is connected with the crystal oscillators; the central processing unit is further configured to: and controlling the gating switch to select the tested crystal oscillator.
In some embodiments, the time keeping device further comprises a counter, the counter being connected with the gating switch and the central processing unit; the central processing unit is further configured to: the counter is controlled to automatically gate the gating switch.
In some embodiments, the time keeping apparatus further comprises a frequency meter coupled to the crystal oscillator, the frequency meter for testing the frequency of the crystal oscillator.
In some embodiments, the antenna receiving module is a receiver or a cesium clock.
The embodiment of the invention has the beneficial effects that: compared with the prior art, the method for keeping the crystal oscillator frequency in time provided by the embodiment of the invention obtains the frequency aging rate curve through automatic test and calculation, and automatically compensates the crystal oscillator when the second pulse signal in the reference source signal is not received, thereby meeting the requirements of low cost and stability.
Drawings
One or more embodiments are illustrated by way of example and not limitation in the figures of the accompanying drawings, in which like references indicate similar elements, and in which the figures of the drawings are not to be taken in a limiting sense, unless otherwise indicated.
FIG. 1 is a flow chart illustrating a method for clock timing of a crystal oscillator according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a time keeping device according to another embodiment of the present invention;
FIG. 3 is a schematic diagram of the CPU of FIG. 2;
fig. 4 is a schematic structural diagram of the power supply of fig. 2.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In addition, the technical features of the embodiments of the present invention described below may be combined with each other as long as they do not collide with each other.
When a GPS satellite has communication faults, a GPS satellite signal cannot normally receive a second pulse signal in GPS satellite time service information, and in order to ensure normal operation of system time service and network clock synchronization, a network clock time keeping module is generally arranged in a satellite time service system. Such time keeping modules are typically implemented using rubidium clocks, crystal oscillator locked GPS, or other reference sources, but such time keeping modules tend to be costly and difficult to tame. Therefore, the embodiment of the invention provides a crystal oscillator frequency time keeping method and time keeping equipment, which can meet the requirements of low cost and stability.
The timekeeping device of the embodiment of the invention can be used as a hardware functional unit and independently arranged in the battery management system, and can also be integrated into a functional module to execute the crystal oscillator frequency timekeeping method of the embodiment of the invention.
In particular, embodiments of the present invention are further described below with reference to the accompanying drawings.
Example 1
FIG. 1 is a flow chart illustrating a method for clock timing of a crystal oscillator according to an embodiment of the present invention. Because the stress of the crystal oscillator is different, the frequency drift of the crystal oscillator in the initial stage after the crystal oscillator is powered on again is influenced by the length of the power-off time, and therefore the frequency of the crystal oscillator needs to be compensated. The crystal oscillator frequency time keeping method in the embodiment is suitable for realizing high-efficiency compensation of the crystal oscillator when the reference source signal cannot be normally received, and if the equipment is powered off for a plurality of times, the equipment is powered on again. As shown in fig. 1, the method includes:
110. and acquiring the power-off starting time and the power-on starting time of the crystal oscillator.
The power-off starting time is the time when the crystal oscillator starts to be powered off, and the power-on starting time is the time when the crystal oscillator is powered on again, namely the time when the power-off is finished. The UTC time before power failure and the UTC time after power failure are obtained, wherein the UTC time before power failure is the power failure starting time, and the UTC time after power failure is the power failure starting time, so that the power failure starting time and the power failure starting time are obtained.
120. And calculating the actual power-off duration according to the power-off starting time and the power-on starting time.
The actual power-off time length is the time length of last power-on of the crystal oscillator. According to the power-off starting time and the power-on starting time, calculating the actual power-off duration in the specific mode: subtracting the power-off starting time from the power-on starting time to obtain the actual power-off time. For example, assuming that the power-off start time is 0800 (i.e., 8:00 of the UCT time), the power-on start time is 0900 (i.e., 9:00 of the UCT time), the actual power-off duration is 0900-0800=0100, i.e., the actual power-off duration is 1 hour.
130. And obtaining a frequency aging rate curve corresponding to the actual power-off duration from a pre-stored corresponding relation between the power-off duration and the frequency aging rate curve of the crystal oscillator.
Because the stress of the crystal oscillator is different, the frequency drift of the crystal oscillator in different outage time periods is different. The pre-stored correspondence between the power-off time length and the frequency aging rate curve of the crystal oscillator refers to a frequency aging rate curve of the same crystal oscillator, which is pre-stored in the device and has different power-off time lengths, for example, 1 day of power-off, 2 days of power-off, 3 days of power-off, and c of the frequency aging rate curve.
The frequency aging rate curve corresponding to the actual power-off duration is obtained from the pre-stored corresponding relation between the power-off duration and the frequency aging rate curve of the crystal oscillator, and the specific mode is as follows: inquiring the pre-stored power-off time length which is the same as the actual power-off time length according to the actual power-off time length, and acquiring a frequency aging rate curve corresponding to the pre-stored power-off time length. For example, assuming that the actual power-off duration is 1 day, and the pre-stored power-off duration corresponds to the frequency aging rate curve a, the frequency aging rate curve corresponding to the actual power-off duration is obtained as the frequency aging rate curve a.
140. And calculating the compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration.
And the same power-off time length corresponds to the same frequency aging rate curve, and the frequency drift amount changes along with the change of the power-on time length. The current power-on time is the time from the power-on starting time of the crystal oscillator to the current time. For example, assuming that the start time of energization of the crystal oscillator is 0900 and the current time is 1000, the current energization time period is 0100, i.e., 1 hour.
The calculation formula for calculating the compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration is as follows: y=y 0+Αt;ΔY＝Y-Y0; the Y is the current frequency, the Y 0 is the initial frequency, the A is the aging rate, the t is the current time duration, and the DeltaY is the compensation frequency. For example, assume that a corresponding frequency aging rate curve a is obtained: y=3+4t, the current power-on duration is 1, the current frequency y=3+4×1, and the compensation frequency Δy=3+4×1-3=4, and the compensation frequency is 4.
150. And adjusting the frequency of the crystal oscillator according to the compensation frequency.
After the compensation frequency is obtained through calculation, the frequency of the crystal oscillator is adjusted according to the compensation frequency, wherein the frequency of the crystal oscillator is adjusted in the following specific modes: and obtaining a correction coefficient according to the compensation frequency, and adjusting the frequency division coefficient of the crystal oscillator according to the correction coefficient so as to adjust the frequency of the crystal oscillator.
It will be appreciated that in some other embodiments, the method further comprises, prior to step 110: 101. when a reference source signal is normally received, the crystal oscillator is powered off, and after the test power-off time of the crystal oscillator, the crystal oscillator is normally powered on; 102. after the crystal oscillator is normally powered, acquiring test power-on time length of the crystal oscillator and output frequency of the crystal oscillator, and generating a frequency aging rate curve of the crystal oscillator according to the test power-on time length, the output frequency and the standard frequency of the reference source signal; 103. taking the test power-off time length as a power-off time length, and storing a corresponding relation between the power-off time length and the frequency aging rate curve; 104. and adding a preset interval value to the test power-off duration, judging whether the test power-off duration is larger than a preset threshold value after the test power-off duration is added with the preset interval value, if so, stopping, otherwise, returning to the step of powering off the crystal oscillator, and normally powering on the crystal oscillator after the crystal oscillator is powered off for the test power-off duration.
Before leaving the factory or before using, the crystal oscillator is tested first to generate frequency aging curves corresponding to different power-on and power-off times. When the reference source signal is normally received during testing, the crystal oscillator is powered off in the test power-off time period, then power is supplied in the test power-on time period, the output frequency of the crystal oscillator is obtained, and a frequency aging rate curve is generated by taking the standard frequency of the reference source signal as a starting point and according to the test power-on time period and the output frequency; and increasing the test power-off time length by a preset interval value, powering off the crystal oscillator, supplying power, acquiring output frequency, and generating standard frequency … … of the reference source signal until the test power-off time length is greater than a preset threshold value. For example, assuming that the preset interval value is 24 hours, under the condition that the test outage duration is 24 hours, when the power-on time is X 1, the output frequency is Y 11, when the power-on time is X 2, the output frequency is Y 12, when the power-on time is X 3, when the output frequency is Y 13 … …, the power-on time is X n, the output frequency is Y 1n, and according to the corresponding relation between X and Y, the curve F 1 is obtained by least square fitting, and then the frequency aging rate curve corresponding to the test outage duration is 24 hours is F 1; then under the condition that the test outage duration is 48 hours, when the power-on time is X 1, the output frequency is Y 21, when the power-on time is X 2, the output frequency is Y 22, when the power-on time is X 3, the output frequency is Y 23 … …, when the power-on time is X n, the output frequency is Y 2n, according to the corresponding relation between X and Y, a curve F 2 is obtained through least square fitting, and then the frequency aging rate curve corresponding to the test outage duration is 48 hours is F 2 … … until the test outage duration is longer than a preset threshold value, and so on, so as to obtain the frequency aging rate curves corresponding to different test outage durations.
The test power-off time length and the test power-on time length are determined according to UTC time in the reference source signal, and the test power-off time length and the test power-on time length can be set according to a certain model.
It will be appreciated that in some other embodiments, prior to step 150, the method further comprises: 161. inquiring the corresponding test output frequency according to the actual power-off duration and the current power-on duration; 162. comparing the corresponding test output frequency with the current frequency to obtain a frequency deviation; 163. and if the frequency deviation is smaller than a preset error threshold, adjusting the frequency of the crystal oscillator according to the compensation frequency.
According to the actual power-off duration and the current power-on duration, the corresponding test output frequency is queried, and the specific implementation manner may be as follows: inquiring the test power-off time length equal to the actual power-off time length according to the actual power-off time length, and inquiring the test power-on time length equal to the current power-on time length according to the current power-on time length in the same test power-off time length to acquire the corresponding test output frequency. Comparing the corresponding test output frequency with the current frequency to obtain a frequency deviation, wherein the specific implementation manner may be as follows: the absolute value of the current frequency is subtracted from the acquired test output frequency as the frequency deviation. When the frequency deviation is smaller than a preset error threshold, adjusting the frequency of the crystal oscillator according to the compensation frequency; when the frequency deviation is larger than a preset error threshold, the complementary frequency is considered to be calculated incorrectly, and the frequency of the crystal oscillator is not adjusted. Wherein, can set for and trace the time to predetermine, trace the frequency deviation, take the average value as the frequency deviation to the frequency deviation in the time of predetermining, compare with the threshold value of predetermining error. For example, assuming that the preset tracking time is 2 hours, the frequency deviation between the test output frequency and the current frequency is averaged within 2 hours, and if the average value of the frequency deviation is smaller than the preset error threshold, the crystal oscillator is adjusted according to the compensation frequency.
According to the crystal oscillator frequency time keeping method, the frequency aging rate curve is obtained through automatic test and calculation, and when the second pulse signal in the reference source signal is not received, the crystal oscillator is automatically compensated, so that the requirements of low cost and stability are met.
Fig. 2 is a schematic structural diagram of a time keeping device according to another embodiment of the present invention. As shown in fig. 2, the time keeping device 200 of the present embodiment can be applied to the method of crystal oscillator frequency time keeping in any of the above method embodiments, where the time keeping device 200 includes an antenna receiving module 210, a crystal oscillator 220, a central processing unit 230, a power supply 240, a gating switch 250, a counter 260 and a frequency meter 270. The antenna receiving module 210 is connected to the central processing unit 230, and the crystal oscillator 220 is connected to the central processing unit 230 through the gating switch 250.
The antenna receiving module 210 may be a receiver or a cesarean for receiving the reference source signal.
The crystal oscillator 220 is a crystal oscillator, and may be packaged using a metal casing, a glass casing, ceramic, or plastic. The number of crystal oscillators 220 may be one or more.
Referring to fig. 3, the cpu 230 includes one or more processors 231 and a memory 232. The processor 231 is a processor with a certain logic operation capability, such as a single-chip microcomputer, a microprocessor, or a CPU, etc., and the processor 231 may also have one or more processing cores. The processor 231 is connected to the antenna receiving module 210, the crystal 220 and the memory 232, respectively. The memory 232 may be internal to the processor 231 or external to the processor 231, or the memory 232 may be a remote memory, and may be connected to the processor 231 through a network (the memory 232 is illustrated as being external to the processor 231 in fig. 3). The processor 231 and the memory 232 may be connected by a bus or otherwise, for example in fig. 3. The memory 232 is used as a non-volatile computer readable storage medium, and may be used to store a non-volatile software program, a non-volatile computer executable program, and a module, such as program instructions/modules (e.g., the instructions shown in fig. 1) corresponding to the method for clock frequency conservation in the embodiment of the present invention. The processor 231 executes by running non-volatile software programs, instructions and modules stored in the memory to: acquiring the power-off starting time and the power-on starting time of the crystal oscillator; calculating the actual power-off duration according to the power-off starting time and the power-on starting time; obtaining a frequency aging rate curve corresponding to the actual power-off duration from a pre-stored corresponding relation between the power-off duration and the frequency aging rate curve of the crystal oscillator; calculating compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration; and adjusting the frequency of the crystal oscillator according to the compensation frequency.
Optionally, the processor 231 of the central processor 230 is further configured to perform: when the antenna receiving module 210 normally receives the reference source signal, the crystal oscillator 220 is powered off, and after the test power-off time of the crystal oscillator 220, the crystal oscillator 220 is normally powered on; after the crystal oscillator 220 is normally powered, acquiring the test power-on time length of the crystal oscillator 220 and the test output frequency of the crystal oscillator 220, and generating a frequency aging rate curve of the crystal oscillator 220 according to the test power-on time length, the test output frequency and the standard frequency of the reference source signal; taking the test power-off time length as the power-off time length, and storing the corresponding relation between the power-off time length and the frequency aging rate curve; and adding a preset interval value to the test outage duration, judging whether the test outage duration is greater than a preset threshold value after the test outage duration is added with the preset interval value, if so, stopping, otherwise, returning to the step of powering off the crystal oscillator 220, and normally powering on the crystal oscillator 220 after the crystal oscillator 220 is powered off for the test outage duration.
Since the apparatus embodiments and the method embodiments are based on the same concept, on the premise that the contents do not conflict with each other, the contents of the apparatus embodiments may refer to the method embodiments, which are not described herein.
Embodiments of the present invention also provide a non-volatile computer storage medium storing computer-executable instructions that are executed by one or more processors, such as the one processor 231 of fig. 3, to cause the one or more processors to perform the method of crystal oscillator frequency conservation in any of the method embodiments described above, such as performing the steps shown in fig. 1 described below.
The power supply 240 is connected to the crystal oscillator 220 and the central processing unit 230, respectively, and is used for providing power for the crystal oscillator 220. The central processor 230 is also configured to: and controlling the power supply to cut off the power of the crystal oscillator or controlling the power supply to supply power to the crystal oscillator. The specific method comprises the following steps: and when the reference source signal is normally received, controlling the power supply to cut off the power of the crystal oscillator, and after the test power-off time of the crystal oscillator, controlling the power supply to normally supply power to the crystal oscillator so as to test the crystal oscillator, thereby obtaining a frequency aging rate curve of the crystal oscillator.
Referring to fig. 4, the power supply 240 may include a power interface 241, a battery 242, a control switch 243, a charging circuit 244, and a discharging circuit 245. The control switch 243 is electrically connected to the cpu 230, the battery 242 is a rechargeable battery, the battery 242 is electrically connected to an input terminal of the discharging circuit 245 through the control switch 243, an output terminal of the discharging circuit 245 is electrically connected to the crystal oscillator 220, and the battery 242 is electrically connected to the power interface 241 through the charging circuit 244. Specifically, when the central processor 230 controls the power supply 240 to supply power to the crystal oscillator 220, the control switch 243 is closed, the battery 242 is electrically connected with the input end of the discharging circuit 245, and the discharging circuit 245 enters a discharging working state and supplies power to the crystal oscillator 220 through the output end thereof; when the central processing unit 230 controls the power supply 240 to power off the crystal oscillator 220, the control switch 243 is turned off, the battery 242 is not communicated with the input end of the discharging circuit 245, and the discharging circuit 245 is in a non-working state; when the power interface 241 is connected to an external power supply, the charging circuit 244 detects the existence of the external power supply and enters a charging working state, so as to charge the rechargeable battery; when the power interface 241 is not connected to the external power, the charging circuit 244 does not detect the existence of the external power, and the charging circuit 244 will be in a non-operating state.
It will be appreciated that in some other embodiments, the power supply 240 may also be a micro battery, specifically a lithium manganese dioxide battery, with metallic lithium as the negative electrode, electrolytic manganese dioxide as the positive electrode, and lithium perchlorate as the inorganic salt as the electrolyte, and has a small volume, a large capacity, and a long service life.
The gate switch 250 may be a data selector, where the gate switch 250 is connected to the crystal oscillator 220, the gate switch 250 is further connected to the central processor 230, and the central processor 230 is further configured to: the control gating switch 250 selects the crystal 220 under test. When the number of the crystal oscillators 220 is plural, the cpu 230 may select to test one crystal oscillator 220 individually by controlling the gate switch 250.
It will be appreciated that in some other embodiments, when the number of crystal oscillators 220 is 1, the gate switch 250 may be omitted, and the cpu 230 is directly connected to the crystal oscillators 220.
The counter 260 is connected to the gate switch 250 and the cpu 230, and the counter 260 counts the number of pulses to realize a counting function. The cpu 230 is further configured to control the counter 260 to automatically gate the gate switch 250, which may be: when the counter 260 counts once, the next crystal 220 is gated.
The frequency meter 270 is connected to the crystal oscillator 220, and is used for testing the frequency of the crystal oscillator 220 and transmitting the frequency to the central processing unit 230.
It will be appreciated that in some other embodiments, the frequency meter 270 may be omitted and a timing module may be provided in the central processor 230 to measure the frequency of the crystal 220.
The time keeping device 200 in this embodiment includes an antenna receiving module 210, a crystal oscillator 220 and a central processing unit 230, where when the antenna receiving module 210 cannot receive the second pulse signal in the reference source signal, the central processing unit 230 automatically compensates the crystal oscillator 220, so as to meet the requirements of low cost and stability.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; the technical features of the above embodiments or in the different embodiments may also be combined within the idea of the invention, the steps may be implemented in any order, and there are many other variations of the different aspects of the invention as described above, which are not provided in detail for the sake of brevity; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the invention.
Claims (10)
1. A method for maintaining crystal oscillator frequency, comprising:
acquiring the power-off starting time and the power-on starting time of the crystal oscillator;
Calculating the actual power-off duration according to the power-off starting time and the power-on starting time;
Obtaining a frequency aging rate curve corresponding to the actual power-off duration from a pre-stored corresponding relation between the power-off duration and the frequency aging rate curve of the crystal oscillator;
calculating compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration;
According to the compensation frequency, the frequency of the crystal oscillator is adjusted;
The step of obtaining the frequency aging rate curve corresponding to the actual power-off duration from the pre-stored correspondence between the power-off duration and the frequency aging rate curve of the crystal oscillator comprises the following steps:
when a reference source signal is normally received, the crystal oscillator is powered off, and after the test power-off time of the crystal oscillator, the crystal oscillator is normally powered on;
After the crystal oscillator is normally powered, acquiring the test power-on time length of the crystal oscillator and the test output frequency of the crystal oscillator, and generating a frequency aging rate curve of the crystal oscillator according to the test power-on time length, the test output frequency and the standard frequency of the reference source signal;
Taking the test power-off time length as a power-off time length, and storing a corresponding relation between the power-off time length and the frequency aging rate curve;
wherein, calculating the compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration includes:
the current electrifying time length is the time from the electrifying starting time of the crystal oscillator to the current time;
The calculation formula of the compensation frequency is as follows:
；
;
Wherein the said For the current frequency, the/>For the initial frequency, the/>For aging rate, t is the current power-on duration, and/>To compensate for the frequency.
2. The method of claim 1, wherein prior to the acquiring the power-off start time and the power-on start time of the crystal, the method further comprises:
And adding a preset interval value to the test power-off duration, judging whether the test power-off duration is larger than a preset threshold value after the test power-off duration is added with the preset interval value, if so, stopping, otherwise, returning to the step of powering off the crystal oscillator, and normally powering on the crystal oscillator after the crystal oscillator is powered off for the test power-off duration.
3. The method of claim 1, wherein prior to said adjusting the frequency of the crystal oscillator in accordance with the compensation frequency, the method further comprises:
Inquiring the corresponding test output frequency according to the actual power-off duration and the current power-on duration;
Comparing the corresponding test output frequency with the current frequency to obtain a frequency deviation;
And if the frequency deviation is smaller than a preset error threshold, adjusting the frequency of the crystal oscillator according to the compensation frequency.
4. A time keeping apparatus, comprising: the crystal oscillator is connected with the central processing unit;
the central processing unit is used for: acquiring the power-off starting time and the power-on starting time of the crystal oscillator; calculating the actual power-off duration according to the power-off starting time and the power-on starting time; obtaining a frequency aging rate curve corresponding to the actual power-off duration from a pre-stored corresponding relation between the power-off duration and the frequency aging rate curve of the crystal oscillator; calculating compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration; according to the compensation frequency, the frequency of the crystal oscillator is adjusted;
The step of obtaining the frequency aging rate curve corresponding to the actual power-off duration from the pre-stored correspondence between the power-off duration and the frequency aging rate curve of the crystal oscillator comprises the following steps:
when a reference source signal is normally received, the crystal oscillator is powered off, and after the test power-off time of the crystal oscillator, the crystal oscillator is normally powered on;
After the crystal oscillator is normally powered, acquiring the test power-on time length of the crystal oscillator and the test output frequency of the crystal oscillator, and generating a frequency aging rate curve of the crystal oscillator according to the test power-on time length, the test output frequency and the standard frequency of the reference source signal;
Taking the test power-off time length as a power-off time length, and storing a corresponding relation between the power-off time length and the frequency aging rate curve;
wherein, calculating the compensation frequency according to the corresponding frequency aging rate curve and the current power-on duration includes:
the current electrifying time length is the time from the electrifying starting time of the crystal oscillator to the current time;
The calculation formula of the compensation frequency is as follows:
；
;
Wherein the said For the current frequency, the/>For the initial frequency, the/>For aging rate, t is the current power-on duration, and/>To compensate for the frequency.
5. The timekeeping device of claim 4 further comprising an antenna receiving module;
the antenna receiving module is used for receiving a reference source signal;
The central processing unit is used for:
When the antenna receiving module normally receives the reference source signal, the crystal oscillator is powered off, and after the test power-off time of the crystal oscillator, the crystal oscillator is normally powered on;
After the crystal oscillator is normally powered, acquiring the test power-on time length of the crystal oscillator and the test output frequency of the crystal oscillator, and generating a frequency aging rate curve of the crystal oscillator according to the test power-on time length, the test output frequency and the standard frequency of the reference source signal;
Taking the test power-off time length as a power-off time length, and storing a corresponding relation between the power-off time length and the frequency aging rate curve;
And adding a preset interval value to the test power-off duration, judging whether the test power-off duration is larger than a preset threshold value after the test power-off duration is added with the preset interval value, if so, stopping, otherwise, returning to the step of powering off the crystal oscillator, and normally powering on the crystal oscillator after the crystal oscillator is powered off for the test power-off duration.
6. The timekeeping apparatus of claim 5 further comprising a power source, the power source being connected to the crystal oscillator and the central processor, respectively;
The power supply is used for providing power for the crystal oscillator;
The central processing unit is further configured to: and controlling the power supply to cut off the power of the crystal oscillator or controlling the power supply to supply power to the crystal oscillator.
7. The time keeping device of claim 6, wherein the number of crystal oscillators is at least two, the time keeping device further comprising a gate switch, the gate switch being connected to the crystal oscillators;
the central processing unit is further configured to: and controlling the gating switch to select the tested crystal oscillator.
8. The timekeeping device of claim 7 further comprising a counter, the counter being connected to the gating switch, the central processing unit;
the central processing unit is further configured to: the counter is controlled to automatically gate the gating switch.
9. The time keeping apparatus of claim 4, further comprising a frequency meter coupled to the crystal, the frequency meter configured to test the frequency of the crystal.
10. The time keeping device of any one of claims 5-8, wherein the antenna receiving module is a receiver.
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