CN110108210B - Measuring jig - Google Patents
Measuring jig Download PDFInfo
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- CN110108210B CN110108210B CN201910267996.5A CN201910267996A CN110108210B CN 110108210 B CN110108210 B CN 110108210B CN 201910267996 A CN201910267996 A CN 201910267996A CN 110108210 B CN110108210 B CN 110108210B
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- working plate
- electronic device
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- plate
- fixing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2408—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring roundness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
The application provides a measuring jig. The measuring jig comprises a fixed plate, a working plate and a jacking mechanism, wherein the fixed plate is used for fixing the measuring jig; the working plate is hinged with the fixed plate; the jacking mechanism is fixed on the working plate and used for elastically deforming to jack electronic devices of different sizes; when the working plate rotates around the fixing plate, the electronic device fixed by the jacking mechanism moves simultaneously with the working plate. The application discloses measurement tool can assist quadratic element measuring apparatu to carry out accurate measurement to electron device's size.
Description
Technical Field
The application relates to the technical field of measuring jigs, in particular to a measuring jig.
Background
In the design, trial production and production processes of the electronic device, the structure size of the electronic device needs to be accurately measured. The quadratic element measuring instrument has the characteristics of accurate measurement and simple use, and has unique advantages in measurement of micro size. However, the magnification of the quadratic element measuring instrument is large, the electronic device needs to be moved when the quadratic element measuring instrument measures large size characteristics, the reference standards of the electronic device are different before and after the electronic device is moved, and the measuring precision is reduced.
Disclosure of Invention
The application provides a measuring jig, which comprises a fixed plate, a working plate and a jacking mechanism, wherein the fixed plate is used for fixing the measuring jig; the working plate is hinged with the fixed plate; the jacking mechanism is fixed on the working plate and used for elastically deforming to jack electronic devices of different sizes; when the working plate rotates around the fixing plate, the electronic device fixed by the jacking mechanism moves simultaneously with the working plate.
In this application, electron device can fix on the working plate, and the working plate is articulated with the fixed plate, and electron device can rotate around the fixed plate along with the working plate to quadratic element measuring apparatu can carry out accurate measurement to electron device's different positions under the prerequisite that does not move electron device. In addition, the jacking mechanism has the capability of restoring deformation, and after the electronic devices with different sizes are installed and the jacking mechanism is promoted to deform, the jacking mechanism applies elastic force to the electronic devices with different sizes so as to fix the electronic devices with different sizes, so that the universality of the measuring jig is improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of an embodiment of a measurement fixture provided in the present application;
FIG. 2 is a schematic cross-sectional view of one embodiment of the present application in the direction II-II of FIG. 1;
FIG. 3 is a schematic cross-sectional view of another embodiment of the present application in the direction II-II of FIG. 1;
FIG. 4 is a schematic structural diagram of one embodiment of a work plate provided herein;
FIG. 5 is an enlarged partial schematic view of region A of FIG. 2 of the present application;
fig. 6 is a schematic structural diagram of another embodiment of a measurement fixture provided in the present application;
fig. 7 is a schematic structural diagram of another embodiment of a measurement fixture provided in the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the specific embodiments described herein are merely illustrative of the application and are not limiting of the application. It should be further noted that, for the convenience of description, only some of the structures related to the present application are shown in the drawings, not all of the structures. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a measurement fixture according to an embodiment of the present disclosure.
The present application provides a measuring tool, which is used to fix the electronic device 1000 when a two-dimensional measuring instrument (not shown in fig. 1) measures the size of the electronic device 1000, so as to prevent the electronic device 1000 from shaking to cause inaccurate size measurement.
The two-dimensional measuring instrument is called a two-dimensional measuring instrument, a video measuring instrument or a video measuring machine, and is used for measuring the position degree, the concentricity, the straightness, the profile degree, the roundness, the size related to the standard and the like of the measured element. Because the surface light or the contour light is used by the two-dimensional measuring instrument to illuminate the part to obtain an image, and the accurate two-dimensional plane size is obtained by measuring the image taking point, the slight shake of the electronic device 1000 can cause great influence on the measuring result.
The electronic device 1000 of the present application may be any one of a number of electronic devices including, but not limited to, cellular phones, smart phones, other wireless communication devices, personal digital assistants, audio players, other media players, music recorders, video recorders, cameras, other media recorders, radios, medical devices, calculators, programmable remote controllers, pagers, netbook computers, Personal Digital Assistants (PDAs), Portable Multimedia Players (PMPs), moving picture experts group (MPEG-1 or MPEG-2), audio layer 3(MP3) players, portable medical devices, and digital cameras and combinations thereof, including devices that display a screen. The present embodiment is described by taking the electronic device 1000 as a smart phone as an example.
The measuring jig of the present embodiment includes a fixing plate 10, a working plate 20, and a supporting mechanism 30.
The fixing plate 10 is connected with the quadratic element measuring instrument to fix the measuring jig on the quadratic element measuring instrument; the working plate 20 is used for fixing the electronic device 1000, the electronic device 1000 can move along with the working plate 20, the working plate 20 is hinged with the fixed plate 10, and the working plate 20 can rotate relative to the fixed plate 10 by taking the hinged position as a fulcrum; the supporting mechanism 30 is fixed on the working plate 20, the supporting mechanism 30 is used for elastically deforming to support the electronic devices 1000 with different sizes, that is, the supporting mechanism 30 has the capability of restoring deformation, and after the electronic device 1000 is installed and the supporting mechanism 30 is deformed, the supporting mechanism 30 applies elastic force to the electronic device 1000 so as to complete the fixing of the electronic device 1000. Since the supporting mechanism 30 can apply elastic force within the elastic deformation range, the supporting mechanism 30 can be used to fix electronic devices 1000 of different sizes.
In order to make those skilled in the art have an intuitive understanding of the technical solution, the following is described by specific implementation procedures:
1: the electronic device 1000 abuts against the supporting mechanism 30 and causes the supporting mechanism 30 to deform within the deformation range; 2: placing the electronic device 1000 on the working plate 20, and the propping mechanism 30 recovers the deformation to apply elastic force to the electronic device 1000 so as to complete the fixation of the electronic device 1000; 3: and starting the quadratic element measuring instrument to measure the electronic device 1000, wherein when the position to be measured of the electronic device 1000 cannot be measured, the working plate 20 is rotated to a proper position to complete the measurement of the electronic device 1000.
In this embodiment, the electronic device 1000 can be fixed on the working board 20, the working board 20 is hinged to the fixing board 10, and the electronic device 1000 can rotate around the fixing board 10 along with the working board 20, so that the quadratic element measuring instrument can accurately measure different positions of the electronic device 1000 without moving the electronic device 1000. In addition, the supporting mechanism 30 has the ability of recovering deformation, and after the electronic devices 1000 with different sizes are mounted and the supporting mechanism 30 is caused to deform, the supporting mechanism 30 applies elastic force to the electronic devices 1000 with different sizes to complete the fixing of the electronic devices 1000 with different sizes, thereby increasing the universality of the measuring jig.
Referring to fig. 1 and 2, fig. 2 is a schematic cross-sectional view of an embodiment of fig. 1 taken along the direction ii-ii.
The measuring tool of the present embodiment includes a fixing plate 10, a working plate 20, a supporting mechanism 30 and a supporting rod 40.
The fixing plate 10 is connected with the quadratic element measuring instrument to fix the measuring jig on the quadratic element measuring instrument; the working plate 20 is used for fixing the electronic device 1000, the electronic device 1000 can move along with the working plate 20, the working plate 20 is hinged with the fixed plate 10, and the working plate 20 can rotate relative to the fixed plate 10 by taking the hinged position as a fulcrum; the supporting mechanism 30 is fixed on the working plate 20, and the supporting mechanism 30 is used for elastically deforming to support the electronic devices 1000 with different sizes; the support bar 40 is disposed between the fixed plate 10 and the operating plate 20 so that the operating plate 20 can be fixed with respect to the fixed plate 10 when rotated to a preset angle with respect to the fixed plate 10.
Specifically, a side of the fixed plate 10 facing the operating plate 20 and/or a side of the operating plate 20 facing the fixed plate 10 is provided with a plurality of slots 11, and the support bar 40 is used to support the operating plate 20 when inserted into any one of the plurality of slots 11, so that the operating plate 20 can be fixed relative to the fixed plate 10 when rotated to a preset angle relative to the fixed plate 10.
The embodiment comprises three technical schemes that 1, one side of a fixed plate 10 facing a working plate 20 and one side of the working plate 20 facing the fixed plate 10 are both provided with a plurality of clamping grooves 11, and a support rod 40 is used for supporting the fixed plate 10 when being inserted into any one of the clamping grooves 11, so that the working plate 20 can be fixed relative to the fixed plate 10 when rotating to a preset angle relative to the fixed plate 10; a plurality of clamping grooves 11 are formed in one side of the working plate 20 facing the fixed plate 10, and the supporting rod 40 is used for supporting the fixed plate 10 when being inserted into any one of the clamping grooves 11, so that the working plate 20 can be fixed relative to the fixed plate 10 when rotating to a preset angle relative to the fixed plate 10; a plurality of slots 11 are formed in a side of the fixed plate 10 facing the working plate 20, and the support rod 40 is configured to support the working plate 20 when inserted into any one of the plurality of slots 11, so that the working plate 20 can be fixed with respect to the fixed plate 10 when rotated to a predetermined angle with respect to the fixed plate 10.
In the embodiment shown in fig. 2, the support rod 40 is inserted into the slot 11, and when the operating plate 20 is rotated to a predetermined angle with respect to the fixed plate 10, the support rod 40 supports and separates the fixed plate 10 and the operating plate 20 by its own radial volume. The sectional shape of the support rod 40 may be a circle, the sectional shape of the support rod 40 may be a square, or the sectional shape of the support rod 40 may be a hexagon.
Referring to fig. 1 and 3, fig. 3 is a schematic cross-sectional view of another embodiment of fig. 1 taken along the direction ii-ii.
The measuring tool of the present embodiment includes a fixing plate 10, a working plate 20, a supporting mechanism 30 and a supporting rod 40.
The fixing plate 10 is connected with the quadratic element measuring instrument to fix the measuring jig on the quadratic element measuring instrument; the working plate 20 is used for fixing the electronic device 1000, the electronic device 1000 can move along with the working plate 20, the working plate 20 is hinged with the fixed plate 10, and the working plate 20 can rotate relative to the fixed plate 10 by taking the hinged position as a fulcrum; the supporting mechanism 30 is fixed on the working plate 20, and the supporting mechanism 30 is used for elastically deforming to support the electronic devices 1000 with different sizes; the support bar 40 is disposed between the fixed plate 10 and the operating plate 20 so that the operating plate 20 can be fixed with respect to the fixed plate 10 when rotated to a preset angle with respect to the fixed plate 10.
Specifically, the present embodiment is different from the embodiment shown in fig. 2 in that the support rod 40 supports and partitions the fixed plate 10 and the working plate 20 using its own length volume. As shown in fig. 3, the working plate 20 is provided with a plurality of slots 11, the supporting rod 40 is hinged to the fixing plate 10, and the supporting rod 40 is inserted into the plurality of slots 11 and supports the working plate 20 when rotating around the fixing plate 10, so that the working plate 20 can be fixed relative to the fixing plate 10 when rotating to a predetermined angle relative to the fixing plate 10. Alternatively, the fixed plate 10 is provided with a plurality of slots 11, the support rod 40 is hinged to the working plate 20, and the support rod 40 is used to be inserted into the plurality of slots 11 when rotating around the working plate 20, so that the working plate 20 can be fixed relative to the fixed plate 10 when rotating to a preset angle relative to the fixed plate 10, and so that the working plate 20 can be fixed relative to the fixed plate 10 when rotating to a preset angle relative to the fixed plate 10.
Referring to fig. 1, the supporting mechanism 30 may include a fixing base 31 and an elastic extending base 32, the fixing base 31 and the elastic extending base 32 are both connected to and disposed opposite to the working plate 20, and the elastic extending base 32 is used for being elastically deformed to cooperate with the fixing base 31 to abut against two opposite sides of the electronic device 1000, thereby fixing the electronic device 1000. The fixed seat 31 and the elastic extension seat 32 are used in a matching way, and can be one set or two sets. As shown in fig. 1, in the case of two sets of fixing bases 31 and elastic extension bases 32, the two sets of fixing bases 31 and elastic extension bases 32 abut against four adjacent sides of the electronic device 1000, so as to fix the electronic device 1000.
Specifically, the elastic extension seat 32 includes a push block 322 and a spring 324, and the spring 324 is connected to the push block 322 and the working plate 20, respectively, wherein when the electronic device 1000 is fixed, the spring 324 is in a deformed state to push the push block 322 to support the electronic device 1000.
The elastic extension seat 32 may further include a guiding rod 326, the pushing block 322 is disposed on the working plate 20, the guiding rod 326 is connected to the pushing block 322 and the working plate 20, and the guiding rod 326 is configured to guide the pushing block 322 when the pushing block 322 moves towards the fixing seat 31 or moves away from the fixing seat 31 (as shown by an arrow in fig. 1), wherein when the electronic device 1000 is fixed, the spring 324 is in a compressed state to push the pushing block 322 to clamp the electronic device 1000 together with the fixing seat 31. It should be noted that, because the pushing block 322 is disposed on the working board 20, the working board 20 has a certain supporting function on the electronic device 1000, so that the quadratic element measuring instrument can complete the measurement of the length and width dimensions of the electronic device 1000 without shaking the electronic device 1000.
The guiding rod 326 can pass through the working plate 20, and an end of the guiding rod 326 extends out of the working plate 20 to receive the external force, and the guiding rod 326 drives the pushing block 322 to move in the direction away from the fixing base 31 under the external force, so that the electronic device 1000 can be taken out conveniently. The spring 324 may be sleeved on the guide rod 326, thereby avoiding deformation of the spring 324 in a non-axial direction of the spring 324; of course, the spring 324 may be provided separately from the guide bar 326.
The fixing seat 31 may be disposed at a side of the working plate 20 close to a hinge joint of the working plate 20 and the fixing plate 10, such that when the working plate 20 rotates a preset angle relative to the fixing plate 10, the electronic device 1000 directly abuts against the fixing seat 31 without elasticity due to its own weight, and thus the position of the electronic device 1000 is not changed due to the rotation of the working plate 20.
Referring to fig. 4 and 5, fig. 4 is a schematic structural diagram of an embodiment of the working plate 20 provided in the present application, and fig. 5 is a schematic partial enlarged view of a region a in fig. 2 in the present application.
The working plate 20 is protruded with a mounting portion 21, the mounting portion 21 is used for placing the electronic device 1000, and because the surface area of the mounting portion 21 is small relative to the surface area of the main surface of the working plate 20, the mounting portion 21 can achieve higher flatness relative to the main surface of the working plate 20.
The working plate 20 is provided with a sliding slot 22, the push block 322 is embedded in the sliding slot 22, and the push block 322 slides under the guidance of the sliding slot 22. The elastic extension base 32 may further include a plastic block 328, the plastic block 328 is mounted on the pushing block 322, and the plastic block 328 is used for directly supporting the electronic device 1000, so as to prevent the electronic device 1000 from being scratched.
Referring to fig. 6, fig. 6 is a schematic structural diagram of another embodiment of a measurement fixture provided in the present application.
The supporting mechanism 30 may include a fixing seat 31 and an elastic extending seat 32, and both the fixing seat 31 and the elastic extending seat 32 are fixed on the working plate 20 and are disposed oppositely. Fixing base 31 sets up in the border department of working plate 20, and elasticity stretches out seat 32 in the one side of keeping away from working plate 20 of fixing base 31, thereby elasticity stretches out seat 32 and is used for elastic deformation to accomplish the fixed to electron device 1000 with the relative both sides of fixing base 31 cooperation butt electron device 1000. The fixed seat 31 and the elastic extension seat 32 are used in a matching way, and can be one set or two sets. As shown in fig. 6, in the case of a set of the fixed seat 31 and the elastic extension seat 32, the set of the fixed seat 31 and the elastic extension seat 32 abut against opposite sides of the electronic device 1000, so as to fix the electronic device 1000.
In this embodiment, because the fixing base 31 is disposed at the edge of the working board 20, and the elastic extension base 32 is disposed at one side of the fixing base 31 away from the working board 20, the elastic extension base 32 elastically deforms to abut against the opposite sides of the electronic device 1000 in cooperation with the fixing base 31, thereby fixing the electronic device 1000, when the electronic device 1000 is placed between the elastic extension base 32 and the fixing base 31, the working board 20 can be avoided from sinking to the preset depth along the length direction thereof, when the electronic device 1000 sinks to the preset depth, the elastic extension base 32 and the fixing base 31 can be clamped to the center of gravity of the electronic device 1000, thereby ensuring that the electronic device 1000 does not shake when the two-dimensional measuring instrument measures the thickness of the electronic device 1000.
Specifically, the elastic extension seat 32 includes a push block 322 and a spring 324, the spring 324 is connected to the push block 322 and the working plate 20, the push block 322 is on a side of the fixing seat 31 away from the working plate 20, wherein when the electronic device 1000 is fixed, the spring 324 is in a stretching state to push the push block 322 to push the electronic device 1000, and the push block 322 and the fixing seat 31 clamp the electronic device 1000 together.
The elastically extending seat 32 may further include a guiding rod 326, the guiding rod 326 is connected to the pushing block 322 and the fixing seat 31, and the guiding rod 326 is used for guiding the pushing block 322 when the pushing block 322 moves towards the fixing seat 31 or moves away from the fixing seat 31 (as shown in fig. 6).
The guiding rod 326 can pass through the pushing block 322, and the end of the guiding rod 326 extends out of the pushing block 322 to receive the external force, and the guiding rod 326 drives the pushing block 322 to move in the direction away from the fixing base 31 under the external force, so that the electronic device 1000 can be taken out conveniently. The spring 324 may be sleeved on the guide rod 326, thereby avoiding deformation of the spring 324 in a non-axial direction of the spring 324; of course, the spring 324 may be provided separately from the guide bar 326.
The measuring jig further comprises a fixing column 50 and an elastic sheet 60, the fixing column 50 is fixed on the working plate 20, the elastic sheet 60 is connected with one end, far away from the working plate 20, of the fixing column 50 and extends towards the working plate 20 in a bending mode, and the elastic sheet 60 has the capacity of restoring deformation when deforming, so that the measuring jig is used for quickly fixing a measured object with a small volume. The elastic sheet 60 may be a stainless steel sheet, and the elastic sheet 60 deforms when moving in a direction away from the working plate 20, so as to quickly fix the object to be measured with a small volume.
Referring to fig. 7, the measuring tool of the present embodiment can simultaneously measure the thickness, the length, and the width of the electronic device 1000, and the specific principle is as shown in the above embodiments and is not described in detail herein.
The above description is only for the purpose of illustrating embodiments of the present application and is not intended to limit the scope of the present application, and all modifications of equivalent structures and equivalent processes, which are made by the contents of the specification and the drawings of the present application or are directly or indirectly applied to other related technical fields, are also included in the scope of the present application.
Claims (8)
1. The utility model provides a measuring jig, its characterized in that, measuring jig is used for fixing electron device when quadratic element measuring apparatu measures electron device's size, measuring jig includes:
the fixing plate is used for fixing the measuring jig on the quadratic element measuring instrument;
the working plate is hinged with the fixing plate and used for fixing the electronic device; and
the jacking mechanism is fixed on the working plate and used for elastically deforming to jack electronic devices of different sizes; the supporting mechanism comprises a fixed seat and an elastic extension seat which are oppositely arranged, and the elastic extension seat is used for elastically deforming to support electronic devices with different sizes in a supporting mode by matching with the fixed seat so as to complete the fixation of the electronic devices;
the fixing column is fixed on the working plate;
the elastic sheet is connected with one end, far away from the working plate, of the fixing column and extends towards the working plate in a bending mode, and the elastic sheet has the capacity of restoring deformation when deformed;
the working plate is provided with two sets of fixed seats and elastic extension seats, and the two sets of fixed seats and the elastic extension seats are abutted against four adjacent sides of the electronic device so as to measure the length and width dimensions of the electronic device; and the number of the first and second groups,
the edge of the working plate is also provided with a fixed seat and an elastic extending seat arranged on one side of the fixed seat far away from the working plate, and the fixed seat and the elastic extending seat at the edge of the working plate are abutted against two opposite sides of the electronic device and can be clamped to the gravity center of the electronic device so as to measure the thickness of the electronic device;
when the working plate rotates around the fixing plate, the electronic device fixed by the jacking mechanism and the working plate move simultaneously, so that the thickness, the length and the width of the electronic device can be measured when the electronic device is not moved.
2. The measuring jig according to claim 1,
the measuring jig further comprises a supporting rod, the fixing plate faces one side of the working plate and/or the working plate faces one side of the fixing plate, a plurality of clamping grooves are formed in the supporting rod and used for supporting the working plate when the supporting rod is inserted into any one of the clamping grooves, and therefore the working plate can be fixed relative to the fixing plate when the fixing plate rotates to a preset angle.
3. The measuring jig according to claim 2,
the working plate is provided with a plurality of clamping grooves, the supporting rod is hinged with the fixed plate, and the supporting rod is inserted into the clamping grooves when rotating around the fixed plate; or
The fixed plate is provided with a plurality of draw-in grooves, the bracing piece with the working plate is articulated, the bracing piece is used for winding insert when the working plate rotates to in a plurality of draw-in grooves.
4. The measuring jig according to claim 1,
the elastic extension seat comprises a push block and a spring, the spring is respectively connected with the push block and the working plate, and when the electronic device is fixed, the spring is in a deformation state to push the push block to prop against the electronic device.
5. The measuring fixture of claim 4,
the elastic extension seat further comprises a guide rod, the push block is arranged on the working plate, the guide rod is respectively connected with the push block and the working plate, the guide rod is used for guiding the push block when the push block moves towards the fixed seat or moves towards the direction far away from the fixed seat, and when the electronic device is fixed, the spring is in a compression state to push the push block and the fixed seat to clamp the electronic device together.
6. The measuring fixture of claim 5,
the spring is sleeved on the guide rod.
7. The measuring fixture of claim 4,
the working plate is provided with a sliding groove, the push block is embedded in the sliding groove, and the push block slides under the guide of the sliding groove.
8. The measuring fixture of claim 4,
the elastic extension seat further comprises a guide rod, the fixed seat is arranged at the edge of the working plate, the push block is arranged on one side of the fixed seat far away from the working plate, the guide rod is respectively connected with the fixed seat and the push block, the guide rod is used for guiding the push block towards the fixed seat during movement or towards the direction far away from the fixed seat, and when the electronic device is fixed, the spring is in a stretching state to pull the push block and the fixed seat to clamp the electronic device together.
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CN201910267996.5A CN110108210B (en) | 2019-04-03 | 2019-04-03 | Measuring jig |
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CN201910267996.5A CN110108210B (en) | 2019-04-03 | 2019-04-03 | Measuring jig |
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