CN110095088A - The surface joining area surface appearance feature detection method and device distinguished based on grating - Google Patents
The surface joining area surface appearance feature detection method and device distinguished based on grating Download PDFInfo
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- CN110095088A CN110095088A CN201910397291.5A CN201910397291A CN110095088A CN 110095088 A CN110095088 A CN 110095088A CN 201910397291 A CN201910397291 A CN 201910397291A CN 110095088 A CN110095088 A CN 110095088A
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- grating
- shell
- joining area
- appearance feature
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
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- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses the surface joining area surface appearance feature detection method and device distinguished based on grating, including shell and the projection light source that shell bottom end is arranged in, it is characterized by: the top of the shell is fixedly connected with pedestal, the top interlocking of the pedestal has gauge head handle, the bottom end of the pedestal is fixedly connected with lens, and the inside of the shell is fixedly connected with Grating examinations device by screw hole.This kind invention design rationally, can be realized the detection of the surface topography in surface joining area, workpiece to be detected can be put into spectroscope by dismountable shell；Using wavelet transformation theory image can be carried out to grating image detected by Grating examinations device and embedding wireless signal generating device inside the housing and light sensor and be transformed to electric signal to pass to computer；It can be analyzed using amplitude situation of the hot spot depth to surface topography by computer；Grating acquired image can be handled by wavelet method, low-and high-frequency situation is analyzed.
Description
Technical field
The present invention relates to optical fields and numerical control processing on-machine measurement technical field, in particular to the song distinguished based on grating
Face splice region surface appearance feature detection method and device.
Background technique
The prior art, to the non-rotating unknown Blending surfaces with non-symmetrical features precise measurements and evaluation have compared with
Big difficulty, it is most of to use blue light digital 3 D scanner or three-dimensional coordinates measurement for the surface type measurement of Blending surfaces after processing
Machine and other contact type measurement instrument measure it, although first two measurement method is accurate, due to needing having added
Work part removes in measuring instrument from machining tool, and the mobile process being loaded again of this workpiece can not only generate positioning and miss
Difference can also extend measurement period, so that measurement process becomes cumbersome, the measurement method of contact is not only to workpiece material and workpiece
Steep requires, but also needs to carry out measured value corresponding error compensation and gauge head compensation.
With the rapid development of aerospace, shipbuilding, automobile and Die Industry, the application of Blending surfaces becomes increasingly wider
It is general, meanwhile, the requirement to high efficiency, high-precision measurement and evaluation is also higher and higher, therefore, smooth (coarse) degree of curved surface
Measurement just has great significance with evaluation.
Summary of the invention
The main purpose of the present invention is to provide the surface joining area surface appearance feature detection methods distinguished based on grating
And device, it can effectively solve the problems in background technique.
To achieve the above object, the technical scheme adopted by the invention is as follows:
Based on the surface joining area surface appearance feature detection method and device that grating distinguishes, including shell and setting are outside
The projection light source of shell bottom end, the top of the shell are fixedly connected with pedestal, and the top interlocking of the pedestal has gauge head handle, the base
The bottom end of seat is fixedly connected with lens, and the inside of the shell is fixedly connected with Grating examinations device by screw hole；
The two sides of the Grating examinations device are rabbeted respectively wireless signal generation apparatus and light sensor, the grating
The surface middle part of detection device is provided through groove from top to bottom, is provided with cavity in the middle part of the Grating examinations device, described
The bottom end of Grating examinations device is rotatably connected to rotary shaft, and one end of the rotary shaft is fixedly connected with deck, the deck
The spectroscope that inside interlocking has a large amount of wide equidistant parallel slits to constitute, the bottom end of the light sensor is fixedly connected with
Wavelet generator, the top of the Grating examinations device are provided with adjusting knob, and the outer surface side of the shell is provided with opening；
The Grating examinations device includes fixed bracket, testing agency, signal collection device and regulating mechanism；
Fixed bracket includes wavelet generator, screw hole；Testing agency includes spectroscope, groove and cavity；Signal collection
Device includes wireless signal generating device and light sensor；Regulating mechanism includes adjusting knob and rotary shaft.
Further, the Grating examinations device is integrated on dismountable cutter holder, and wireless signal generating device is used for will
Signal is collected and then is wirelessly transmitted to computer.
Further, it is placed with surface joining workpiece to be measured below the spectroscope, workpiece is placed on lathe, is convenient for
Translucency.
Further, the rotary shaft is for adjusting spectroscopical angle.
Further, the shell is spherical structure, and the material of the shell is metal, and the inner wall of shell is coarse
Face.
Further, the projection light source is annular LED lamp source.
Further, the spectroscope is detachable structure by rotary shaft.
The surface joining area surface appearance feature detection method and device distinguished based on grating, comprising the following steps:
S1: the detection method based on grating project
Light beam of the projection light source after beam expanding lens projects to sinusoidal grating in reference planes, at monitor at equal intervals
After reason light beam be directional light and project striped on the reference plane be it is equally spaced, i.e., striped has fixed space week
Phase, system construction drawing structure chart are as shown in Figure 2；
Light distribution in reference planes can be set as:
I (x, y)=a (x, y)+b (x, y) cos2 π fx
I (x, y) indicates the light distribution in reference planes in formula, and a (x, y) indicates background light distribution, and b (x, y) is item
The amplitude of line light intensity variation, f=1/p indicate that the fundamental frequency of projection grating, p are width of fringe pixels shared on picture monitor
Number, 2 π fx indicate that the phase distribution before light wave (artificially makes optical grating projection striped perpendicular to horizontal direction, therefore vertical cos without y
Component).
Sinusoidal grating is projected on arbitrary objects surface, the light distribution on body surface are as follows:
I1(x, y)=a1(x,y)+b1(x,y)cos[2πfx+Ф(x,y)]
I in formula1(x, y) indicates the light distribution on body surface, a1(x, y) indicates background light distribution, b1(x, y) is
The amplitude of striped light intensity variation, Ф (x, y) are that object height is distributed phase-modulation caused by h (x, y).In telecentricity projecting light path reality
I > > h (x, y) in the measurement of border, the relationship of the height distribution and phase modulation on testee surface are as follows:
Ф(x,y)≈2πfdlh(x,y)
Corresponding diagram be 3 shown in, by the hot spot depth can to splicing seams stitch before and seam after surface topography amplitude situation into
Row analysis.
S2: the detection based on wavelet method to surface joining part surface appearance feature
Grating acquired image is handled using the method for wavelet transformation, low-and high-frequency situation is analyzed.
Its decomposition and reconstruction process of wavelet transformation resolution filter system is as shown in figure 4, wherein y (k) is discrete input letter
Number, s (k) is discrete reconstruction signal, if the transform of y (k) and s (k) is Y (z) S (z)；H0(z)H1It (z) is to decompose low pass filtered respectively
Wave device h0(k) and decompose high-pass filter h1(k) transform G0(z)G1It (z) is reconstruction low pass filter g respectively0(k) it and reconstructs
High-pass filter g1(k) transform.
The system function of two channels filter group is
According to perfect reconstruction condition (PR condition), have
H0(-z)G0(z)+H1(-z)G1(z)=0
That is:
Low-pass filtering output are as follows:
Obtain the transmission characteristic of low-pass filter are as follows:
By correlated wavelets conversion process, the surface topography figure of workpiece can be obtained, as shown in Figure 5.
Compared with prior art, the invention has the following beneficial effects:
1. the present invention has rational design, easy to use, the detection of the surface topography in surface joining area can be realized, have integrated
Change, the original parts such as grating are combined with on-machine measurement, it can be in the inspection of machine progress curve surface of workpiece splice region surface appearance feature
It surveys；
2. passing through in Grating examinations device and embedding wireless signal generating device and computer-internal inside the housing
The wireless signal receiver set, it can be achieved that signal wireless transmission；
3. the Grating examinations device of the invention is mounted on dismountable cutter holder, more acurrate to sampled point can easily catch
It catches, while the design of LED light ring can effectively reduce the shade of detection, reduces the error of data acquisition aspect；
4. noise abatement processing can be carried out to grating image detected based on Wavelet Packet Theory, while according to the hot spot surveyed
The depth carries out three dimensional analysis to workpiece splicing seams surface topography based on Time-Frequency Analysis theory；
5. can be carried out to grating workpiece splicing seams region surface feature image collected based on Continuous Wavelet Transform
Time frequency analysis finds vibratory impulse bring time-frequency domain sign mutation in processing；
6. the present invention has the characteristics of light-weight, compact structure, due to being integrated a series of original part, internal junction
Structure is careful, describes the use of external original part, saves the space of detection, and alleviates the load of main shaft on the whole.
Detailed description of the invention
Fig. 1 is whole schematic diagram of internal structure of the invention；
Fig. 2 is Grating examinations structure drawing of device of the invention；
Fig. 3 is overall system structure schematic diagram of the invention；
Fig. 4 is optical-mechanical system structure chart of the invention；
Fig. 5 is the image schematic diagram that grating of the invention acquires；
Fig. 6 is its decomposition and reconstruction process schematic of wavelet transformation resolution filter system of the invention；
Fig. 7 is the workpiece topography schematic diagram that detection device proposed by the present invention is measured；
Fig. 8 is the flow chart that workpiece of the invention works.
In figure: 1, pedestal；2, adjusting knob；3, detection device；4, wireless signal generating device；5, deck；6, gauge head handle；
7, lens；8, shell；9, light sensor；10, rotary shaft；11, spectroscope；12, wavelet generator；13, it is open；14, cavity
15, groove；16, projection light source；17, screw hole.
Specific embodiment
To be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention, below with reference to
Specific embodiment, the present invention is further explained.
As shown in figures 1-8, the surface joining area surface appearance feature detection method and device distinguished based on grating, including it is outer
Shell 8 and the projection light source 16 that 8 bottom end of shell is arranged in, the top of the shell 8 is fixedly connected with pedestal 1, the top of the pedestal 1
Interlocking has gauge head handle 6, and the bottom end of the pedestal 1 is fixedly connected with lens 7, and the inside of the shell 8 is fixed by screw hole 17
It is connected with Grating examinations device 3；
The two sides of the Grating examinations device 3 are rabbeted respectively wireless signal generation apparatus 4 and light sensor 9, described
The surface middle part of Grating examinations device 3 is provided through groove 15 from top to bottom, and the middle part of the Grating examinations device 3 is provided with sky
Chamber 14, the bottom end of the Grating examinations device 3 are rotatably connected to rotary shaft 10, and one end of the rotary shaft 10 is fixedly connected with card
Seat 5, the spectroscope 11 that the inside interlocking of the deck 5 has a large amount of wide equidistant parallel slits to constitute, the light level
The bottom end of device 9 is fixedly connected with wavelet generator 12, and the top of the Grating examinations device 3 is provided with adjusting knob 2, described outer
The outer surface side of shell 8 is provided with opening 13；
The Grating examinations device 3 includes fixed bracket, testing agency, signal collection device and regulating mechanism；
Fixed bracket includes wavelet generator 12, screw hole 17；Testing agency includes spectroscope 11, groove 15 and cavity
14；Signal collection device includes wireless signal generating device 4 and light sensor 9；Regulating mechanism includes adjusting knob 2 and rotation
Axis 10.
Wherein, the Grating examinations device 3 is integrated on dismountable cutter holder, and wireless signal generating device 4 will be for that will believe
Number it is collected and then is wirelessly transmitted to computer.
Wherein, it is placed with surface joining workpiece to be measured below the spectroscope 11, workpiece is placed on lathe, convenient for saturating
Photosensitiveness.
Wherein, the rotary shaft 10 is used to adjust the angle of spectroscope 11.
Wherein, the shell 8 is spherical structure, and the material of the shell 8 is metal, and the inner wall of shell 8 is rough surface.
Wherein, the projection light source 16 is annular LED lamp source.
Wherein, the spectroscope 11 is detachable structure by rotary shaft 10.
The surface joining area surface appearance feature detection method and device distinguished based on grating, comprising the following steps:
S1: the detection method based on grating project
Light beam of the projection light source after beam expanding lens projects to sinusoidal grating in reference planes, at monitor at equal intervals
After reason light beam be directional light and project striped on the reference plane be it is equally spaced, i.e., striped has fixed space week
Phase.
Light distribution in reference planes can be set as:
I (x, y)=a (x, y)+b (x, y) cos2 π fx
I (x, y) indicates the light distribution in reference planes in formula, and a (x, y) indicates background light distribution, and b (x, y) is item
The amplitude of line light intensity variation, f=1/p indicate that the fundamental frequency of projection grating, p are width of fringe pixels shared on picture monitor
Number, 2 π fx indicate that the phase distribution before light wave (artificially makes optical grating projection striped perpendicular to horizontal direction, therefore vertical cos without y
Component).
Sinusoidal grating is projected on arbitrary objects surface, the light distribution on body surface are as follows:
I1(x, y)=a1(x,y)+b1(x,y)cos[2πfx+Ф(x,y)]
I in formula1(x, y) indicates the light distribution on body surface, a1(x, y) indicates background light distribution, b1(x, y) is
The amplitude of striped light intensity variation, Ф (x, y) are that object height is distributed phase-modulation caused by h (x, y).In telecentricity projecting light path reality
I > > h (x, y) in the measurement of border, the relationship of the height distribution and phase modulation on testee surface are as follows:
Ф(x,y)≈2πfdlh(x,y)
The amplitude situation of surface topography before being stitched to splicing seams by the hot spot depth and after seam is analyzed.
S2: the detection based on wavelet method to surface joining part surface appearance feature
Grating acquired image is handled using the method for wavelet transformation, low-and high-frequency situation is analyzed.
Its decomposition and reconstruction process of wavelet transformation resolution filter system is as shown in figure 4, wherein y (k) is discrete input letter
Number, s (k) is discrete reconstruction signal, if the transform of y (k) and s (k) is Y (z) S (z)；H0(z)H1It (z) is to decompose low pass filtered respectively
Wave device h0(k) and decompose high-pass filter h1(k) transform G0(z)G1It (z) is reconstruction low pass filter g respectively0(k) it and reconstructs
High-pass filter g1(k) transform.
The system function of two channels filter group is
According to perfect reconstruction condition (PR condition), have
H0(-z)G0(z)+H1(-z)G1(z)=0
That is:
Low-pass filtering output are as follows:
Obtain the transmission characteristic of low-pass filter are as follows:
By correlated wavelets conversion process, the surface topography figure of workpiece can be obtained.
It should be noted that the present invention is the surface joining area surface appearance feature detection method distinguished based on grating and dress
It sets, can be realized the detection of the surface topography in surface joining area, workpiece to be detected can be put by light splitting by dismountable shell
Mirror；Small echo is utilized to become by Grating examinations device and embedding wireless signal generating device inside the housing and light sensor
It changes theory and image can be carried out to grating image detected and be transformed to electric signal and pass to computer；It is available by computer
The hot spot depth analyzes the amplitude situation of surface topography；By wavelet method can be to grating acquired image at
Reason, analyzes low-and high-frequency situation, while workpiece for measurement being placed on lathe, is convenient for translucency.
The above shows and describes the basic principles and main features of the present invention and the advantages of the present invention.The technology of the industry
Personnel are it should be appreciated that the present invention is not limited to the above embodiments, and the above embodiments and description only describe this
The principle of invention, without departing from the spirit and scope of the present invention, various changes and improvements may be made to the invention, these changes
Change and improvement all fall within the protetion scope of the claimed invention.The claimed scope of the invention by appended claims and its
Equivalent thereof.
Claims (8)
1. based on the surface joining area surface appearance feature detection device that grating distinguishes, including shell (8) and setting are in shell (8)
The projection light source (16) of bottom end, it is characterised in that: the top of the shell (8) is fixedly connected pedestal (1), the pedestal (1)
Top interlocking has gauge head handle (6), and the bottom end of the pedestal (1) is fixedly connected with lens (7), and the inside of the shell (8) passes through
Screw hole (17) is fixedly connected with Grating examinations device (3)；
The two sides of the Grating examinations device (3) are rabbeted respectively wireless signal generation apparatus (4) and light sensor (9), institute
The surface middle part for stating Grating examinations device (3) is provided through groove (15) from top to bottom, in the Grating examinations device (3)
Portion is provided with cavity (14), and the bottom end of the Grating examinations device (3) is rotatably connected to rotary shaft (10), the rotary shaft (10)
One end is fixedly connected with deck (5), point that the inside interlocking of the deck (5) has a large amount of wide equidistant parallel slits to constitute
The bottom end of light microscopic (11), the light sensor (9) is fixedly connected with wavelet generator (12), the Grating examinations device (3)
Top be provided with adjusting knob (2), the outer surface side of the shell (8) is provided with opening (13)；
The Grating examinations device (3) includes fixed bracket, testing agency, signal collection device and regulating mechanism；
Fixed bracket includes wavelet generator (12), screw hole (17)；Testing agency includes spectroscope (11), groove (15) and sky
Chamber (14)；Signal collection device includes wireless signal generating device (4) and light sensor (9)；Regulating mechanism includes adjusting rotation
Button (2) and rotary shaft (10).
2. the surface joining area surface appearance feature detection device according to claim 1 distinguished based on grating, feature
Be: the Grating examinations device (3) is integrated on dismountable cutter holder, wireless signal generating device (4) be used for by signal into
Computer is collected and then be wirelessly transmitted to row.
3. the surface joining area surface appearance feature detection device according to claim 1 distinguished based on grating, feature
It is: is placed with surface joining workpiece to be measured below the spectroscope (11), workpiece is placed on lathe, is convenient for translucency.
4. the surface joining area surface appearance feature detection device according to claim 1 distinguished based on grating, feature
Be: the rotary shaft (10) is used to adjust the angle of spectroscope (11).
5. the surface joining area surface appearance feature detection device according to claim 1 distinguished based on grating, feature
Be: the shell (8) is spherical structure, and the material of the shell (8) is metal, and the inner wall of shell (8) is rough surface.
6. the surface joining area surface appearance feature detection device according to claim 1 distinguished based on grating, feature
Be: the projection light source (16) is annular LED lamp source.
7. the surface joining area surface appearance feature detection device according to claim 1 distinguished based on grating, feature
Be: the spectroscope (11) is detachable structure by rotary shaft (10).
8. distinguishing the surface appearance feature detection method in surface joining area based on grating, it is characterised in that: the following steps are included:
S1: the detection method based on grating project
Light beam of the projection light source after beam expanding lens projects to sinusoidal grating in reference planes, after the processing of monitor at equal intervals
Light beam be directional light and project striped on the reference plane be it is equally spaced, i.e., striped has fixed space periodic；Benefit
With the light distribution situation in reference planes, sinusoidal grating is projected on arbitrary objects surface, can be obtained on body surface
Light distribution be；The amplitude situation of surface topography before being stitched to splicing seams by the hot spot depth of feedback and after seam is divided
Analysis；
S2: the detection based on wavelet method to surface joining part surface appearance feature
Grating acquired image is handled using the method for wavelet transformation, low-and high-frequency situation is analyzed；
Its decomposition and reconstruction process of wavelet transformation resolution filter system, wherein y (k) is discrete input signal, and s (k) is discrete
Reconstruction signal, if the transform of y (k) and s (k) is Y (z) S (z)；H0(z)H1It (z) is to decompose low-pass filter h respectively0(k) and divide
Solve high-pass filter h1(k) transform G0(z)G1It (z) is reconstruction low pass filter g respectively0(k) and reconstruct high-pass filter g1
(k) transform；By the process of filtering decomposition and wavelet transformation to signal, the surface topography figure of workpiece can be obtained.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910397291.5A CN110095088B (en) | 2019-05-14 | 2019-05-14 | Method and device for detecting surface topography characteristics of curved surface splicing area based on grating identification |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910397291.5A CN110095088B (en) | 2019-05-14 | 2019-05-14 | Method and device for detecting surface topography characteristics of curved surface splicing area based on grating identification |
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| CN110095088A true CN110095088A (en) | 2019-08-06 |
| CN110095088B CN110095088B (en) | 2020-11-20 |
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| CN201910397291.5A Expired - Fee Related CN110095088B (en) | 2019-05-14 | 2019-05-14 | Method and device for detecting surface topography characteristics of curved surface splicing area based on grating identification |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101236660A (en) * | 2008-03-06 | 2008-08-06 | 张利群 | Three-dimensional scanners and its three-dimensional model reconfiguration method |
| CN101915554A (en) * | 2009-03-11 | 2010-12-15 | 富士能株式会社 | Method for measuring three-dimensional shape and device |
| JP2012127704A (en) * | 2010-12-13 | 2012-07-05 | Wakayama Univ | Shape measuring device and shape measuring method |
| JP2015083978A (en) * | 2009-06-17 | 2015-04-30 | ３シェイプ アー／エス | Focus scanning apparatus |
| CN105928470A (en) * | 2016-07-14 | 2016-09-07 | 哈尔滨理工大学 | Free curved surface morphology on-machine detection method and device based on holographic method |
| CN108106536A (en) * | 2017-11-13 | 2018-06-01 | 清华大学 | A kind of plane grating interferometer displacement measurement system |
-
2019
- 2019-05-14 CN CN201910397291.5A patent/CN110095088B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101236660A (en) * | 2008-03-06 | 2008-08-06 | 张利群 | Three-dimensional scanners and its three-dimensional model reconfiguration method |
| CN101915554A (en) * | 2009-03-11 | 2010-12-15 | 富士能株式会社 | Method for measuring three-dimensional shape and device |
| JP2015083978A (en) * | 2009-06-17 | 2015-04-30 | ３シェイプ アー／エス | Focus scanning apparatus |
| JP2012127704A (en) * | 2010-12-13 | 2012-07-05 | Wakayama Univ | Shape measuring device and shape measuring method |
| CN105928470A (en) * | 2016-07-14 | 2016-09-07 | 哈尔滨理工大学 | Free curved surface morphology on-machine detection method and device based on holographic method |
| CN108106536A (en) * | 2017-11-13 | 2018-06-01 | 清华大学 | A kind of plane grating interferometer displacement measurement system |
Non-Patent Citations (2)
| Title |
|---|
| 吴石 等: "基于自适应采样的曲面加工误差在机测量方法", 《仪器仪表学报》 * |
| 张爱武 等: "一种用于三维曲面视觉测量的立体精匹配方法", 《光学技术》 * |
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