CN110068392A - A kind of luminous flux measurement device and method of LED light source - Google Patents
A kind of luminous flux measurement device and method of LED light source Download PDFInfo
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- CN110068392A CN110068392A CN201910422108.2A CN201910422108A CN110068392A CN 110068392 A CN110068392 A CN 110068392A CN 201910422108 A CN201910422108 A CN 201910422108A CN 110068392 A CN110068392 A CN 110068392A
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
- G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
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- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The present invention relates to photometric measurement technology more particularly to a kind of luminous flux measurement device and methods of LED light source.Above-mentioned luminous flux measurement device includes: hollow sphere, is internally provided with diffusing reflection coating, and the ball wall of hollow sphere is equipped at least three mounting holes；2 π standard sources, are set to the outside of hollow sphere by the first mounting hole of hollow sphere, and the light-emitting surfaces of 2 π standard sources is towards the inside of hollow sphere；Measuring table, for placing LED light source to be measured, measuring table is set to the outside of hollow sphere by the second mounting hole of hollow sphere, and light-emitting surface is towards the inside of hollow sphere；Illumination detector is set to the outside of hollow sphere, the inside of the incidence surface connection hollow sphere of illumination detector by the third mounting hole of hollow sphere；And spectral radiometer, illumination detector is connected by optical fiber.The present invention can accurately measure the luminous flux of different type LED light source, to fundamentally solve the problems, such as the measurement of LED light flux.
Description
Technical field
The present invention relates to photometric measurement technology more particularly to a kind of luminous flux measurement devices of LED light source, and one kind
The luminous flux measurement method of LED light source.
Background technique
Since the eighties in last century, semiconductor technology is developed rapidly, and LED rapidly becomes as emerging light source and grinds
Study carefully hot spot.It is known as light emitting diode (Light-emitting using the device that semiconductor PN converts electrical current into luminous energy
Diode, LED).LED component is usually fixed on the semiconductor luminous chip of its core on conductive, thermally conductive metallic support, then
Its periphery is encapsulated with epoxy resin, to play the role of optically focused and protection chip.
Luminous flux is the most important performance indicator of LED light source.The measurement method of existing LED light source luminous flux mainly includes
Distribution photometer method and integrating-sphere photometer method.
Above-mentioned distribution photometer method is measured using distributed photometer of about determining the Illumination Distribution of each point on spherical surface, then is led to
The mode for crossing digital integration obtains the luminous flux of light source.Distributed photometer be for measure light source luminescent intensity to be measured (that is,
Agreement spherical surface on illuminance) spatial distribution instrument.Although the light that distribution photometer method can accurately measure light source is logical
Amount, but the entire cumbersome time-consuming of measurement process, and be easy to be influenced by stray light, but also that there are instrument and equipments is with high costs
The problem of.
Above-mentioned integrating-sphere photometer method uses integrating sphere type photometer, passes through measurement standard light source and light source to be measured respectively
The luminous flux of light source to be measured is calculated further according to the brightness value for brightness value.Product of ideal bulb separation is a hollow ball, sphere
Inner wall is formed with ideal white diffuse-reflective material even spread, and the light of the diffusion illumination on wall and the expected light source received is logical
It measures directly proportional.Although the measuring speed of integrating-sphere photometer method is fast, easy to operate, require accepted standard light source need with
Light source to be measured has similar power, structure, encapsulation, the angle of divergence and spectral power distribution etc., otherwise will introduce biggish survey
Measure uncertainty.
In recent years, with the continuous promotion of the continuous development of LED industry and technical level, illumination is gone out not with New LED layer
Thoroughly.Compared with traditional LED, the more powerful of New LED, structure are more complicated, packing forms are also more varied.
Therefore, it is on the one hand limited to the characteristics of luminescence of LED light source itself narrowband Gaussian distribution, is on the other hand limited to novel
The characteristic of LED light source packing forms (single tube, patch, TOP and COB etc.) and luminescent color multiplicity, it is difficult to be marked by limited LED
Quasi-optical source meets the comparison demands of all LED light sources to be measured.Existing integrating-sphere photometer method will certainly be because of can not find
It is matched with the standard sources of LED light source to be measured, and introduces biggish uncertainty of measurement.
In order to overcome drawbacks described above of the existing technology, this field needs a kind of luminous flux measurement technology of LED light source,
For accurately measuring the luminous flux of different type LED light source, so that the measurement for fundamentally solving above-mentioned LED light flux is asked
Topic.
Summary of the invention
A brief summary of one or more aspects is given below to provide to the basic comprehension in terms of these.This general introduction is not
The extensive overview of all aspects contemplated, and be both not intended to identify critical or decisive element in all aspects also non-
Attempt to define the range in terms of any or all.Its unique purpose is to provide the one of one or more aspects in simplified form
A little concepts are with the sequence for more detailed description given later.
In order to overcome drawbacks described above of the existing technology, the present invention provides a kind of luminous flux measurement of LED light source dresses
It sets and a kind of luminous flux measurement method of LED light source, for accurately measuring the luminous flux of different type LED light source, thus
Fundamentally solve the problems, such as the measurement of above-mentioned LED light flux.
The luminous flux measurement device of above-mentioned LED light source provided by the invention, comprising:
Hollow sphere, is internally provided with diffusing reflection coating, and the ball wall of the hollow sphere is equipped at least three mounting holes；
2 π standard sources are set to the outside of the hollow sphere, the 2 π standard by the first mounting hole of the hollow sphere
The light-emitting surface of light source is towards the inside of the hollow sphere；
Measuring table, for placing LED light source to be measured, the measuring table is set to by the second mounting hole of the hollow sphere
The outside of the hollow sphere, light-emitting surface is towards the inside of the hollow sphere；
Illumination detector, the outside of the hollow sphere is set to by the third mounting hole of the hollow sphere, and the illumination is visited
The incidence surface for surveying device connects the inside of the hollow sphere；And
Spectral radiometer connects the illumination detector by optical fiber.
Preferably, in the luminous flux measurement device of above-mentioned LED light source provided by the invention, the 2 π standard sources can be with
Include:
Light uniforming device set on the light-emitting surface of the 2 π standard sources, and connects first mounting hole, and the light uniforming device can be used for
Light inside the hollow sphere described in directive carries out diffusing transmission processing；
Halogen tungsten lamp light source can be used for issuing the full spectral radiance of visible light wave range set on the rear of the light uniforming device；And
Reflector, set on the rear of the halogen tungsten lamp light source, the light that can be used for issuing the halogen tungsten lamp light source all reflects
To the inside of the hollow sphere.
Preferably, in the luminous flux measurement device of above-mentioned LED light source provided by the invention, the light uniforming device may include
The microlens array being made of multiple lenticules, the multiple lenticule can be towards multiple and different directions, so that 2 π
The radiation intensity of the emergent light of standard sources and the cosine value of the angle of emergence are directly proportional.
Optionally, in the luminous flux measurement device of above-mentioned LED light source provided by the invention, the 2 π standard sources may be used also
To include:
Lamp holder can be used for fixing the halogen tungsten lamp light source, and connects DC power supply and come for halogen tungsten lamp light source power supply；With
And
Radiator set on the rear of the reflector, and connects the lamp holder, and the radiator can be used for the halogen tungsten
2 π standard sources described in the heat derives that lamp source issues simultaneously distribute.
Optionally, in the luminous flux measurement device of above-mentioned LED light source provided by the invention, the measuring table be can wrap
It includes:
Temperature control chip can be used for distributing the heat that the LED light source to be measured issues；
Thermal insulation layer can be used for placing the LED light source to be measured and will be described to be measured set on the top of the temperature control chip
The heat that LED light source issues is conducted to the temperature control chip；And
Adjustable electrode is set to the top of the temperature control chip by insulating trip, and position is adjustable in the horizontal direction, the adjustable electric
Pole can be used for being electrically connected the pin of the LED light source to be measured.
Preferably, in the luminous flux measurement device of above-mentioned LED light source provided by the invention, the measuring table can be with
Include:
Constant temperature controller connects the temperature control chip, can be used for adjusting the temperature of the temperature control chip to control the LED light to be measured
The junction temperature in source is constant.
Optionally, in the luminous flux measurement device of above-mentioned LED light source provided by the invention, the illumination detector can be with
Include:
Adapter connects the third mounting hole and the optical fiber of the hollow sphere；And
Trim tab is radiated, set on the incidence surface of the illumination detector, and connects the incident end face of the optical fiber, the radiation is repaired
Positive can be used for carrying out cosine amendment and Homogenization Treatments to the light radiation for being incident on the illumination detector.
Optionally, in the luminous flux measurement device of above-mentioned LED light source provided by the invention, the spectral radiometer can be with
Include:
Guiding device connects the outgoing end face of the optical fiber, can be used for the light radiation in the optical fiber importing the spectrum
Radiometer；
Monochromator, set on the rear end of the guiding device, the light radiation that can be used for importing the guiding device is separated
For the narrow wave optical radiation of multiple monochromes；
Detecting module can be used for detecting the narrow wave optical radiation of the multiple monochrome at the exit slit of the monochromator
Radiant illumination, and the radiant illumination of the narrow wave optical radiation of the multiple monochrome is converted into corresponding digital signal；And
Signal processing module, detecting module described in communication connection, the signal processing module may be configured to according to described more
The radiant illumination of the narrow wave optical radiation of a monochrome calculates the luminous flux of the LED light source to be measured.
Preferably, in the luminous flux measurement device of above-mentioned LED light source provided by the invention, the signal processing module is also
It may be configured to the nonlinear response that the spectral radiometer is corrected according to linear correction method, the linear correction method can
With comprising steps of
Big illumination range light modulation is carried out using the spectral irradiance lamp for completing calibration, and multiple with spectral radiometer measurement
Illuminations actually measured value；
The ideal response range of linearity of the spectral radiometer is determined according to the illuminations actually measured value；
According to the recursion illumination for the illuminations actually measured value and the ideal response range of linearity for being greater than the ideal response range of linearity
Value determines the saturation response correction coefficient of illumination saturation part；
According to the recursion illumination for the illuminations actually measured value and the ideal response range of linearity for being less than the ideal response range of linearity
Value, determines the noise response correction coefficient of dark current and noise section；And
The nonlinear response of illumination saturation part is corrected according to the saturation response correction coefficient, and is rung according to the noise
Correction coefficient is answered to correct the nonlinear response of the dark current and noise section.
Preferably, in the luminous flux measurement device of above-mentioned LED light source provided by the invention, the signal processing module can
To be further configured to:
The multiple illuminations actually measured value is fitted using least square method, to obtain the linear side of the multiple illuminations actually measured value
Journey；And
According to the difference of the illuminations actually measured value and the recursion brightness value of the linear equation, the reason of the spectral radiometer is determined
Think responsing linear range.
Optionally, in the luminous flux measurement device of above-mentioned LED light source provided by the invention, can also include:
First baffle is set between first mounting hole and the third mounting hole, can be used for preventing without described hollow
The light that the irreflexive 2 π standard sources of sphere issues is directly entered the incidence surface of the illumination detector；And
Second baffle is set between second mounting hole and the third mounting hole, can be used for preventing without described hollow
The incidence surface for the directly incident illumination detector of light that the irreflexive LED light source to be measured of sphere issues.
According to another aspect of the present invention, a kind of luminous flux measurement method of LED light source is also provided herein.
The luminous flux measurement method of above-mentioned LED light source provided by the invention, comprising steps of
It is calibrated using luminous flux measurement device of the 2 π standard sources to any one of the above LED light source；
The 2 π standard sources is closed, and makes LED light source to be measured to issuing light radiation inside hollow sphere；
It is obtained inside the hollow sphere using illumination detector and passes through the irreflexive light radiation of the hollow sphere；
The irreflexive light radiation of the hollow sphere is passed through from illumination detector acquisition is described using spectral radiometer, to survey
Measure the spectral irradiance at the illumination detector；And
The luminous flux of the LED light source is determined according to the spectral irradiance.
Preferably, described to use 2 π standard sources in the luminous flux measurement method of above-mentioned LED light source provided by the invention
The luminous flux measurement device of any one of the above LED light source is calibrated, may include step:
Make the 2 π standard sources to the full spectral radiance of sending visible light wave range inside the hollow sphere；
It is obtained inside the hollow sphere using the illumination detector by the irreflexive 2 π mark of the hollow sphere
The light radiation that quasi-optical source issues；
The light radiation that the 2 π standard sources issues is obtained from the illumination detector using spectral radiometer, to measure its spectrum
Irradiation level；And
The spectral irradiance measured according to the spectral irradiance of the known 2 π standard sources and the spectral radiometer is to institute
Spectral radiometer is stated to be calibrated.
Preferably, described to make the 2 π standard light in the luminous flux measurement method of above-mentioned LED light source provided by the invention
Full spectral radiance of the source to sending visible light wave range inside the hollow sphere, may include step:
For full spectral radiance of the halogen tungsten lamp light source power supply to generate visible light wave range in the 2 π standard sources；
The light radiation generated using reflector to halogen tungsten lamp light source described in the hollow sphere internal reflection, to generate described in
The light radiation of 2 π Space Angles inside hollow sphere；And
Diffusing transmission is carried out using light radiation of the light uniforming device to light radiation and reflector reflection that the halogen tungsten lamp light source generates
Processing, so that the radiation intensity of the emergent light of the 2 π standard sources is directly proportional to the cosine value of the angle of emergence.
Optionally, in the luminous flux measurement method of above-mentioned LED light source provided by the invention, the measurement illumination is visited
The spectral irradiance at device is surveyed, may include step:
Using monochromator by the narrow wave optical radiation for being separated into multiple monochromes by the irreflexive light radiation of the hollow sphere；
And
Measure the intensity of illumination of the narrow wave optical radiation of the multiple monochrome respectively to obtain the spectrum spoke at the illumination detector
Illumination.
Optionally, in the luminous flux measurement method of above-mentioned LED light source provided by the invention, the measurement illumination is visited
Survey device at spectral irradiance, can with comprising steps of
Big illumination range light modulation is carried out using the spectral irradiance lamp for completing calibration, and multiple with spectral radiometer measurement
Illuminations actually measured value；
The ideal response range of linearity of the spectral radiometer is determined according to the illuminations actually measured value；
According to the recursion illumination for the illuminations actually measured value and the ideal response range of linearity for being greater than the ideal response range of linearity
Value determines the saturation response correction coefficient of illumination saturation part；
According to the recursion illumination for the illuminations actually measured value and the ideal response range of linearity for being less than the ideal response range of linearity
Value, determines the noise response correction coefficient of dark current and noise section；And
The nonlinear response of illumination saturation part is corrected according to the saturation response correction coefficient, and is rung according to the noise
Correction coefficient is answered to correct the nonlinear response of the dark current and noise section.
Preferably, described to be shone according to the actual measurement in the luminous flux measurement method of above-mentioned LED light source provided by the invention
Angle value determines the ideal response range of linearity of the spectral radiometer, may include step:
Multiple illuminations actually measured values that the spectral radiometer measures are fitted using least square method, to obtain the illuminations actually measured
The linear equation of value；And
According to the difference of the illuminations actually measured value and the recursion brightness value of the linear equation, the reason of the spectral radiometer is determined
Think responsing linear range.
Optionally, described according to the spectrum spoke in the luminous flux measurement method of above-mentioned LED light source provided by the invention
Illumination determines the luminous flux of the LED light source, may include step:
The spectral irradiance is sought integrating to obtain the intensity of illumination at the illumination detector；
According to the intensity of illumination at the illumination detector and the area inside the hollow sphere, the LED light source is determined
Luminous flux.
Detailed description of the invention
After the detailed description for reading embodiment of the disclosure in conjunction with the following drawings, it better understood when of the invention
Features described above and advantage.In the accompanying drawings, each component is not necessarily drawn to scale, and has similar correlation properties or feature
Component may have same or similar appended drawing reference.
Fig. 1 shows the structural schematic diagram of the luminous flux measurement device of the LED light source provided according to an aspect of the present invention.
Fig. 2 shows the structural schematic diagrams of the 2 π standard sources provided according to one embodiment of present invention.
Fig. 3 shows the structural schematic diagram of the measuring table provided according to one embodiment of present invention.
Fig. 4 shows the structural schematic diagram of the illumination detector provided according to one embodiment of present invention.
Fig. 5 shows the process signal of the luminous flux measurement method of the LED light source provided according to another aspect of the present invention
Figure.
Fig. 6 shows the flow diagram of the linear correction method provided according to one embodiment of present invention.
Appended drawing reference
1 hollow sphere；
22 π standard sources；
21 light uniforming devices；
22 reflectors；
23 halogen tungsten lamp light sources；
24 lamp holders；
25 radiators；
3 measuring tables；
31 LED chips to be measured；
32 aluminum substrates；
33 thermal insulation layers；
34 insulating trips；
35 temperature control chips；
36 LED chip pins；
37 adjustable electrodes；
4 illumination detectors；
5 optical fiber；
6 spectral radiometers；
7 first baffles；
8 second baffles；
The step of luminous flux measurement method of 501-505 LED light source；
The step of 601-605 linear correction method.
Specific embodiment
Embodiments of the present invention are illustrated by particular specific embodiment below, those skilled in the art can be by this specification
Revealed content is understood other advantages and efficacy of the present invention easily.Although description of the invention will combine preferred embodiment
It introduces together, but this feature for not representing the invention is only limitted to the embodiment.On the contrary, being invented in conjunction with embodiment
The purpose of introduction is to be possible to the other selections extended or transformation to cover based on claim of the invention.In order to mention
For that will include many concrete details in depth understanding of the invention, being described below.The present invention can also be thin without using these
Section is implemented.In addition, in order to avoid confusion or obscuring emphasis of the invention, some details will be omitted in the de-scription.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " installation ", " phase
Even ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected；It can
To be mechanical connection, it is also possible to be electrically connected；It can be directly connected, can also can be indirectly connected through an intermediary
Connection inside two elements.For the ordinary skill in the art, above-mentioned term can be understood at this with concrete condition
Concrete meaning in invention.
In addition, in the following description used in "upper", "lower", "left", "right", "top", "bottom", "horizontal", " hang down
It directly " should be understood orientation depicted in this section and relevant drawings.The term of this relativity explanation merely for convenience
With not representing device that it is described need to be manufactured or be operated with particular orientation, therefore should not be construed as to of the invention
Limitation.
It is appreciated that, although term " first ", " second ", " third " etc. can be used herein to describe various assemblies, area
Domain, layer and/or part, these components, regions, layers, and/or portions should not be limited by these terms, and these terms are intended merely to
Distinguish different components, regions, layers, and/or portions.Therefore, first assembly discussed below, regions, layers, and/or portions can be
It is referred to as the second component, regions, layers, and/or portions in the case where without departing from some embodiments of the invention.
In order to overcome drawbacks described above of the existing technology, the present invention provides a kind of luminous flux measurement of LED light source dresses
The embodiment of a kind of luminous flux measurement method of the embodiment and LED light source set, for accurately measuring different type LED
The luminous flux of light source, to fundamentally solve the problems, such as the measurement of above-mentioned LED light flux.
Referring to FIG. 1, Fig. 1 shows the luminous flux measurement device of the LED light source provided according to an aspect of the present invention
Structural schematic diagram.
As shown in Figure 1, the luminous flux measurement device of above-mentioned LED light source provided in this embodiment may include: hollow sphere
1,2 π standard sources 2, measuring table 3, illumination detector 4 and spectral radiometer 6.
In one embodiment, above-mentioned hollow sphere 1 can select integrating sphere.Integrating sphere 1 can be by upper and lower two hemisphere
It is spliced, the inner wall of hollow sphere can be coated uniformly with diffusing reflection coefficient close to 1 diffusive white reflective material.It is above-mentioned
Diffusive white reflective material includes but is not limited to magnesia, diffusing reflection coating made of barium sulfate and polytetrafluoroethylene (PTFE).
In one embodiment, at least three mounting holes can be equipped on the ball wall of integrating sphere hollow sphere 1, wherein the
One mounting hole can be used for installing 2 π standard sources 2；Second mounting hole can be used for installing measuring table 3；Third mounting hole can
For installing illumination detector 4.
In a preferred embodiment of this embodiment, 2 π standard sources 2, measuring table 3, illumination detector 4 and hollow ball
The contact surface of body 1 can be preferably set to be identical to the curved surface of 1 inner wall radian of hollow sphere, to prevent these contact surfaces pair
The luminous flux for measuring 2 π standard sources 2 or LED to be measured generates interference.
In another preferred embodiment of the present embodiment, the luminous flux measurement device of above-mentioned LED light source can also include the
One baffle 7 and second baffle 8.First baffle 7 can be set between the first mounting hole and third mounting hole, for preventing without in
The light that the irreflexive 2 π standard sources 2 of empty sphere 1 issues is directly entered the incidence surface of illumination detector 4.Second baffle 8 can be set
Light between the second mounting hole and third mounting hole, for preventing from issuing without the irreflexive LED light source to be measured of hollow sphere 1
The incidence surface of direct incoming illumination detector 4.
By setting first baffle 7 and second baffle 8, the light spoke of all incoming illumination detectors 4 may further ensure that
Penetrate all is by the irreflexive uniform light radiation of hollow sphere 1, so that it is guaranteed that the diffusion that the incidence surface of illumination detector 4 receives
Intensity of illumination is directly proportional to the expected luminous flux of light source received, and then obtains higher measuring accuracy.
In the luminous flux measurement device of above-mentioned LED light source provided in this embodiment, for demarcating above-mentioned luminous flux measurement
The standard sources of device can select the 2 π standard sources 2 that can be traced to the source.2 π standard sources 2 refer to the standard that irradiation Space Angle is 2 π
Light source, that is, can only be based on plane where light source to the standard sources of front irradiation.The standard sources that can be traced to the source refers to the standard
Light source has already passed through in visible light wave range (380nm-780nm) spectral irradiance value and accurately demarcates, and user can be according to institute
Any wavelength needed knows the corresponding radiant illumination value of the standard sources.
As shown in Figure 1, in one embodiment, 2 π standard sources 2 can be set to by the first mounting hole of hollow sphere 1
The outside of hollow sphere 1, and the light-emitting surface of 2 π standard sources 2 can be towards the inside of hollow sphere 1, thus the institute issued
There is light radiation to be all emitted to the inside of hollow sphere 1.
Compared to the existing integrating-sphere photometer method that light source is placed in the integrating sphere centre of sphere, above-mentioned 2 π provided in this embodiment
Standard sources 2 and its matched temperature control fixture are not necessarily to be mounted on the centre of sphere of integrating sphere 1, therefore can be adapted for various sizes size
Integrating sphere 1, while destruction of the condensed water to 1 inner wall of integrating sphere also can be effectively avoided.
The luminous flux measurement device of above-mentioned LED light source provided in this embodiment is not only easy for installation, and will not mark to 2 π
The light radiation that quasi-optical source 2 and LED light source to be measured issue generate it is any block, therefore the integrating sphere that can be obtained more evenly is rung
It answers, to obtain higher measuring accuracy.
Please further refer to Fig. 2, Fig. 2 shows the structures of the 2 π standard sources provided according to one embodiment of present invention
Schematic diagram.
As shown in Fig. 2, in one embodiment, 2 π standard sources 2 may include light uniforming device 21, reflector 22 and halogen
Tungsten light source 23.
Above-mentioned light uniforming device 21 can be set to the front end of 2 π standard sources 2, that is, the light-emitting surface of 2 π standard sources 2, and
It is connected with the first mounting hole.Light uniforming device 21 can be used for carrying out the light that 2 π standard sources 2 issue homogenization diffusing transmission processing, with
Keep its shooting angle as big as possible, and equably inside directive hollow sphere 1.
In a preferred embodiment of this embodiment, light uniforming device 21 can be preferably designed to be made of multiple lenticules
Microlens array.Multiple lenticules in microlens array can be respectively facing multiple and different directions, so that 2 π standard sources 2
Constitute Lambertian radiator.That is, the diffusing transmission by light uniforming device 21 is handled, the radiation intensity of 2 π standard sources, 2 emergent light
Can be directly proportional to the cosine value of its angle of emergence, to promote the uniformity of its emergent light further to reduce roomage response
It influences.
As shown in Fig. 2, above-mentioned halogen tungsten lamp light source 23 can be set to the rear of light uniforming device 21, for providing 2 π standard sources 2
Emergent light.Since halogen tungsten lamp light source 23 can issue the full spectral radiance of visible light wave range (380nm-780nm), halogen tungsten
Lamp source 23 can cooperate monochromator to use and generate the narrow wave optical radiation of any wavelength, to simulate any LED light source to be measured
The characteristics of luminescence.
Since the spectral power distribution of LED is narrowband Gaussian distribution, even if peak wavelength only differs several nanometers, also result in
Very big spectral power distribution difference.Need to prepare the LED light source of a large amount of different encapsulation, bandwidth, color compared with the prior art
As the scheme of standard sources, it is next that above-mentioned halogen tungsten lamp light source 23 provided in this embodiment can be used as a kind of general standard sources
Reduce measurement cost.Compared with the prior art using close encapsulation, bandwidth, scheme of the LED light source as standard sources of color,
The above-mentioned modeling scheme with the cooperation monochromator of halogen tungsten lamp light source 23 provided in this embodiment also can more acurrate matching LED light source to be measured
Peak wavelength, to obtain higher measuring accuracy.It is the LED light source that narrowband Gaussian is distributed compared to spectral power distribution,
Halogen tungsten lamp light source 23 is easier to trace to the source, and is easy to carry out spectroscopic calibration.And it is complete compared to can equally generate visible light wave range
The incandescent lamp of spectral radiance, halogen tungsten lamp light source 23 has smaller volume, therefore can obtain better integrating sphere uniformity.
Above-mentioned reflector 22 can be set to the rear of halogen tungsten lamp light source 23, and reflective surface can be made of metal material.It is logical
The preferred design corresponding to 23 specific location of halogen tungsten lamp light source is crossed, reflector 22 as far as possible can collect the hair of halogen tungsten lamp light sources 23 more
Light radiation backward out, and these light radiation backward are all reflected towards light uniforming device 21, and then in directive hollow sphere 1
Portion.By this preferred design, 2 π standard sources 2 can produce ideal high-effect spectral radiance.
It shines since most of LED light source on the market is all only in the space forward 2 π, without firing backward light radiation
LED light source, therefore the structure of above-mentioned reflector 22 not only can effectively promote the light efficiency of 2 π standard sources 2, moreover it is possible to more preferable
The characteristics of luminescence of simulation LED light source to be measured, to obtain higher measuring accuracy.
As shown in Fig. 2, in a preferred embodiment of this embodiment, above-mentioned 2 π standard sources 2 can further include
Lamp holder 24 and radiator 25.
Above-mentioned lamp holder 24 can be used for fixed halogen tungsten lamp light source 23, and connects DC power supply and come for the confession of halogen tungsten lamp light source 23
Electricity.It uses direct current supply mode for the power supply of halogen tungsten lamp light source 23, the stable radiation of halogen tungsten lamp light source 23 can be effectively improved
Property, to further obtain higher measuring accuracy.
Above-mentioned radiator 24 can be set to the rear of reflector 22, and connect lamp holder 23.Radiator 24 can be designed to
Laminated structure, the method by increasing metal material and air contact area, reaches the radiant heat for issuing halogen tungsten lamp light source 23
The purpose that amount quickly exports 2 π standard sources 2 and distributes.
As shown in Figure 1, in the luminous flux measurement device of above-mentioned LED light source provided in this embodiment, it is to be measured for placing
The measuring table 3 of LED light source can be set to the outside of hollow sphere 1 by the second mounting hole of hollow sphere 1.Measuring table 3
Light-emitting surface can towards the inside of hollow sphere 1, thus all light radiation that LED light source to be measured is issued all be emitted to it is hollow
The inside of sphere 1.
It is provided in this embodiment compared to the existing integrating-sphere photometer method for needing to replace standard sources and light source to be measured
Above-mentioned measuring table 3 can be installed on the ball wall of integrating sphere 1 simultaneously with 2 π standard sources 2, to be more convenient for measuring LED to be measured
The luminous flux of light source.When measuring the luminous flux of multiple and different LED light sources to be measured, survey crew need not repeatedly dismount standard light
Source, and need to unload measuring table 3 only to replace LED light source to be measured therein, the survey of next LED light source to be measured can be continued
Amount.
Show please further refer to Fig. 3, Fig. 3 structure for showing the measuring table provided according to one embodiment of present invention
It is intended to.
As shown in figure 3, in one embodiment, measuring table 3 may include thermal insulation layer 33, temperature control chip 35 and adjustable
Electrode 37.
Since the characteristics of luminescence of LED light source is affected by PN junction temperature, it is therefore desirable in the measurement process of luminous flux
Thermostatic control is carried out to LED chip.In one embodiment, temperature control chip 35 can simply select the copper heat spreader of metal,
The heat issued for distributing LED chip 31 to be measured, so that it is guaranteed that the characteristics of luminescence of LED chip to be measured 31 will not be increased because of junction temperature
And it changes.And in another preferred embodiment, measuring table 3 can also preferably include constant temperature controller (not being painted).
The constant temperature controller can be electrically connected temperature control chip 35, adjust temperature control by adjusting the voltage and current applied to temperature control chip 35
The temperature of piece 35, so that the junction temperature for controlling LED chip 31 to be measured is constant.
In one embodiment, above-mentioned thermal insulation layer 33 can select the heat conductive silica gel or thermally conductive silicon wafer of electrical isolation.Absolutely
Edge heat-conducting layer 33 can be set to the top of temperature control chip 35, issue for placing LED chip 31 to be measured, and by LED chip 31 to be measured
Heat conduct to temperature control chip 35.Since heat conductive silica gel or thermally conductive silicon wafer have good electrical isolation capabilities, thermal insulation layer 33
Good electrical isolation can be formed between the pin 36 and temperature control chip 35 of LED chip 31 to be measured, to prevent temperature control chip 35
On voltage and current influence the characteristics of luminescence of LED chip 31 to be measured, and prevent two adjustable electrodes 37 from passing through conductive copper
Short circuit occurs for temperature control chip 35.
In one embodiment, above-mentioned adjustable electrode 37 can be two and be set to 35 liang of temperature control chip by insulating trip 34 respectively
The metal slide plate at end.One metal slide plate electrode can connect the anode of external direct current power supply, and another metal slide plate electrode
It can connect the cathode of external direct current power supply.Two metal slide plate adjustable electrodes 37 can be horizontally slipped in the horizontal direction to adjust
Its relative position is saved, for being electrically connected the pin 36 of LED chip 31 to be measured.
As shown in figure 3, LED chip 31 to be measured can be set on its integrally formed aluminum substrate 32, the two sides of aluminum substrate 32
It can be equipped with for the pin 36 for LED chip 31 to be measured power supply.External DC power supply can be used in survey crew, from pin
36 power for LED chip 31 to be measured so that it steadily shines.And in a preferred embodiment, survey crew can also use outer
The pulse power is connect, LED chip 31 to be measured is controlled by pin 36 and is shone with specific frequency and pulsewidth.
In the luminous flux of the different LED chips 31 to be measured of measurement, since different LED chips to be measured 31 may have difference
Encapsulating structure and size, survey crew can horizontally slip adjustable electrode 37 to adjust its relative position, to adapt to difference
The installation requirements of the LED chip to be measured 31 of size.
In a preferred embodiment, adjustable electrode 37 can also have certain elasticity, so that LED chip 31 to be measured is tight
It is tightly pressed in temperature control chip 35, so that it is guaranteed that chip pin 36 is contacted with the good of adjustable electrode 37, and ensures constant temperature controller
To the accurate thermostatic control of LED chip 31 to be measured.Experimental data shows that in this embodiment constant temperature controller is to LED core to be measured
Reachable ± 0.1 DEG C of the temperature control precision of piece 31.
As shown in Figure 1, in the luminous flux measurement device of above-mentioned LED light source provided in this embodiment, for detecting integral
The illumination detector 4 of 1 inside average light intensity of ball can be set to hollow sphere 1 by the third mounting hole of hollow sphere 1
It is external.The incidence surface of illumination detector 4 can connect the inside of hollow sphere 1, pass through to obtain from the inner wall of hollow sphere 1
The irreflexive light radiation of hollow sphere 1.
The structure of the illumination detector provided according to one embodiment of present invention is shown please further refer to Fig. 4, Fig. 4
Schematic diagram.
As shown in figure 4, illumination detector 4 may include adapter 41 and radiation trim tab 42.
Above-mentioned adapter 41 can connect the third mounting hole of hollow sphere 1 and for transmitting light spoke for spectral radiometer 6
The optical fiber 5 penetrated, for combining closely between the two, to prevent light radiation from leaking out from the seam crossing of 1 third mounting hole of integrating sphere.
Above-mentioned radiation trim tab 42 can be set to the incidence surface of illumination detector 4, and connect the incident end face of optical fiber 5.?
In one embodiment, radiation trim tab 42 can be incident on illumination detector 4 light radiation carry out cosine correcting process and
Processing is homogenized, to obtain higher measuring accuracy.
Above-mentioned optical fiber 43 may be used as the signal transmission device part that light radiation is transmitted to spectral radiometer 6.Illumination detector 4 can
The collected optical radiation signal of adapter 41 is passed to spectral radiometer 6 to be received and be handled by optical fiber 5.
As shown in Figure 1, in the luminous flux measurement device of above-mentioned LED light source provided in this embodiment, it is to be measured for calculating
The spectral radiometer 6 of LED light source luminous flux can connect illumination detector 4 by optical fiber 5.
In one embodiment, spectral radiometer 6 may include at guiding device, monochromator, detecting module and signal
Manage module.
Guiding device can connect the outgoing end face of optical fiber 5, for the light radiation in optical fiber 5 to be imported spectral radiometer 6,
And it is incident upon on the entrance slit of monochromator.
Monochromator can be set to the rear end of guiding device, and the light radiation for importing guiding device is separated into multiple monochromes
Narrow wave optical radiation, so that signal processing module obtains the radiant illumination of the light radiation of different wave length respectively, to obtain light spoke
The spectral irradiance penetrated.
Detecting module can be set at the exit slit of monochromator, the radiation of the narrow wave optical radiation for detecting multiple monochromes
Illumination.The radiant illumination of the narrow wave optical radiation of multiple monochromes can be converted to corresponding digital signal by detecting module, for letter
Number processing module obtains.
Signal processing module can be with communication connection detecting module, thus according to the spoke of the narrow wave optical radiation of above-mentioned multiple monochromes
Illumination is penetrated to obtain the spectral irradiance of LED light source to be measured.Signal processing module can also be configured to according to above-mentioned multiple
The radiant illumination of monochromatic narrow wave optical radiation calculates its corresponding luminous flux, and is integrated to these luminous fluxes to be measured to obtain
The luminous flux of LED light source.
According to another aspect of the present invention, the embodiment of a kind of luminous flux measurement method of LED light source is also provided herein.
Referring to FIG. 5, Fig. 5 shows the luminous flux measurement method of the LED light source provided according to another aspect of the present invention
Flow diagram.
As shown in figure 5, the luminous flux measurement method of above-mentioned LED light source provided in this embodiment, may include step:
501: being carried out using luminous flux measurement device of the 2 π standard sources to LED light source provided by any one above-mentioned embodiment
Calibration；
502: closing 2 π standard sources, and make LED light source to be measured to issuing light radiation inside hollow sphere；
503: being obtained using illumination detector from hollow ball interior and pass through the irreflexive light radiation of hollow sphere；
504: being obtained using spectral radiometer from illumination detector and pass through the irreflexive light radiation of hollow sphere, to measure illumination spy
Survey the spectral irradiance at device；And
505: the luminous flux of LED light source is determined according to spectral irradiance.
In one embodiment, survey crew is carried out using luminous flux measurement device of the 2 π standard sources to LED light source
When calibration, it can now use 2 π standard sources to the complete spectrum of sending visible light wave range (380nm-780nm) inside hollow sphere
Radiation；Obtain the light issued by the irreflexive 2 π standard sources of hollow sphere from hollow ball interior using illumination detector again
Radiation；And then the light radiation that 2 π standard sources issue is obtained from illumination detector using spectral radiometer, to measure its spectrum spoke
Illumination.
As noted previously, as what the standard sources of the luminous flux measurement device of LED light source selected is the 2 π standards that can be traced to the source
Light source has already passed through in visible light wave range (380nm-780nm) spectral irradiance value and accurately demarcates, and user can basis
Required any wavelength knows the corresponding radiant illumination value of the standard sources.Therefore, survey crew can measure spectral radiance
The spectral irradiance of the spectral irradiance and known 2 π standard sources that obtain compares, to determine spectral radiometer
Mark.
It is professed, in a preferred embodiment of the embodiment, survey crew can be first the halogen tungsten in 2 π standard sources
Lamp source direct current supply, to generate the full spectral radiance of stable visible light wave range；Halogen tungsten lamp light source is produced using reflector again
Raw light radiation backward is all to hollow sphere internal reflection, to generate the light spoke towards 2 π Space Angles inside hollow sphere
It penetrates；And it is preferably carried out at diffusing transmission using light radiation of the light uniforming device to light radiation and reflector reflection that halogen tungsten lamp light source generates
Reason, so that 2 π standard sources constitute a Lambertian radiator.That is, the radiation intensity of the emergent light of 2 π standard sources at this time
It is directly proportional to the cosine value of the angle of emergence, so that the light radiation of generation more evenly is to obtain higher measuring accuracy.
In one embodiment, survey crew, can be first using single when measuring the spectral irradiance at illumination detector
Color instrument will be separated into the narrow wave optical radiation of multiple monochromes by the irreflexive light radiation of hollow sphere；Measure multiple monochromes respectively again
Narrow wave optical radiation intensity of illumination, to obtain the spectral irradiance on integrating sphere inner wall at illumination detector.
In a preferred embodiment of this embodiment, responded to further deduct the saturation nonlinearity of spectral radiometer,
The interference of dark current and noise, to obtain higher measuring accuracy, the signal processing module of spectral radiometer can also be preferred
Ground is configured to correct the nonlinear response of spectral radiometer according to linear correction method.
The stream of the linear correction method provided according to one embodiment of present invention is shown please further refer to Fig. 6, Fig. 6
Journey schematic diagram.
As shown in fig. 6, above-mentioned linear correction method may include step:
601: big illumination range light modulation being carried out using the spectral irradiance lamp for completing calibration, and multiple with spectral radiometer measurement
Illuminations actually measured value；
602: the ideal response range of linearity of spectral radiometer is determined according to illuminations actually measured value；
603: according to the recursion brightness value for the illuminations actually measured value and the ideal response range of linearity for being greater than the ideal response range of linearity, really
Determine the saturation response correction coefficient of illumination saturation part；
604: according to the recursion brightness value for the illuminations actually measured value and the ideal response range of linearity for being less than the ideal response range of linearity, really
Determine the noise response correction coefficient of dark current and noise section；And
605: correcting the nonlinear response of illumination saturation part according to saturation response correction coefficient, and corrected according to noise response and be
The nonlinear response of number correction dark current and noise section.
Before the luminous flux parameter for measuring LED light source to be measured, survey crew can be first using the high-precision light traced to the source
Detector is spent as standard, spectral irradiance lamp is demarcated, to obtain the spectral radiance of spectral irradiance lamp
Illumination.
It will be understood to those skilled in the art that the step of above-mentioned calibration spectral irradiance lamp, only obtains spectral radiance
A kind of concrete scheme of the spectral irradiance of illumination lamp, when executing above-mentioned linear correction method every time not for limitation, all
Need to re-scale spectral irradiance lamp.It, can also in the embodiment of the spectral irradiance of known spectra radiant illumination lamp
With the step of without carrying out above-mentioned calibration spectral irradiance lamp, and the reason of spectral radiometer is directly determined according to illuminations actually measured value
Think responsing linear range.
During measuring the luminous flux parameter of LED light source to be measured, by carrying out big illumination to spectral irradiance lamp
The light modulation of range, the available minimal illumination range from spectral radiometer of survey crew is to more its maximal illumination range
A illuminations actually measured value.By being fitted to these illuminations actually measured values using least square method, these available illuminations actually measured values
Linear equation.Survey crew can determine in turn according to the difference of these illuminations actually measured values and the recursion brightness value of linear equation
The ideal response range of linearity of spectral radiometer.
In one embodiment, survey crew can define, if the recursion brightness value of illuminations actually measured value and linear equation
99.9%) difference is greater than no more than 0.1%(, that is, linearity of recursion brightness value, then determine the illuminations actually measured value in spectral radiometer
The ideal response range of linearity in.
It will be understood to those skilled in the art that judgment criteria of the above-mentioned linearity greater than 99.9% is that the present embodiment mentions
A kind of concrete case supplied, is mainly used for clearly showing design of the invention, and provides a kind of convenient for the specific of public's implementation
Scheme, protection scope and is not intended to limit the present invention.In other embodiments, survey crew can also be according to LED light source light
The Surveying Actual Precision requirement of flux, it would be desirable to which the criterion of responsing linear range is set to 99% lower, or is higher set to
99.99% or even 99.999%.
After determining the ideal response range of linearity of spectral radiometer, survey crew can will be greater than the linear model of ideal response
The radiant illumination enclosed is judged to being saturated part.Since the illuminations actually measured value of saturation part can be because of the radiant illumination of spectral radiometer
Saturation, and generate measurement numerical value error less than normal, survey crew can be according to illuminations actually measured value and the ideal response ranges of linearity
Recursion brightness value determines the saturation response correction coefficient of illumination saturation part, shines when correcting actual measurement LED light source to be measured
The illuminations actually measured value of degree saturation part.
Similarly, the radiant illumination for being less than the ideal response range of linearity can also be determined as dark current and noise by survey crew
Part.Since the illuminations actually measured value of dark current and noise section can generate survey because of the dark current and noise of spectral radiometer
Numerical quantity error less than normal, survey crew can be according to the recursion brightness values of illuminations actually measured value and the ideal response range of linearity, really
The noise response correction coefficient for determining dark current and noise section, noise section when correcting actual measurement LED light source to be measured
Illuminations actually measured value.
It will be understood to those skilled in the art that the linear school manually completed described in above-described embodiment by survey crew
Correction method can also be executed by the signal processing module of spectral radiometer according to the software installed in it automatically.That is,
The signal processing module of spectral radiometer may be configured to execute linear correction method provided by the above embodiment automatically.
In a preferred embodiment, signal processing module can also further be configured to seek above-mentioned spectral irradiance
It integrates to obtain total intensity of illumination at illumination detector, and then according to the intensity of illumination and hollow sphere at the illumination detector
Internal area determines the luminous flux of LED light source.
Although for simplify explain the above method is illustrated to and is described as a series of actions, it should be understood that and understand,
The order that these methods are not acted is limited, because according to one or more embodiments, some movements can occur in different order
And/or with from it is depicted and described herein or herein it is not shown and describe but it will be appreciated by those skilled in the art that other
Movement concomitantly occurs.
Offer is to make any person skilled in the art all and can make or use this public affairs to the previous description of the disclosure
It opens.The various modifications of the disclosure all will be apparent for a person skilled in the art, and as defined herein general
Suitable principle can be applied to other variants without departing from the spirit or scope of the disclosure.The disclosure is not intended to be limited as a result,
Due to example described herein and design, but should be awarded and principle disclosed herein and novel features phase one
The widest scope of cause.
Claims (10)
1. a kind of luminous flux measurement device of LED light source characterized by comprising
Hollow sphere, is internally provided with diffusing reflection coating, and the ball wall of the hollow sphere is equipped at least three mounting holes；
2 π standard sources are set to the outside of the hollow sphere, the 2 π standard by the first mounting hole of the hollow sphere
The light-emitting surface of light source is towards the inside of the hollow sphere；
Measuring table, for placing LED light source to be measured, the measuring table is set to by the second mounting hole of the hollow sphere
The outside of the hollow sphere, light-emitting surface is towards the inside of the hollow sphere；
Illumination detector, the outside of the hollow sphere is set to by the third mounting hole of the hollow sphere, and the illumination is visited
The incidence surface for surveying device connects the inside of the hollow sphere；And
Spectral radiometer connects the illumination detector by optical fiber.
2. the luminous flux measurement device of LED light source as described in claim 1, which is characterized in that the 2 π standard sources includes:
Light uniforming device set on the light-emitting surface of the 2 π standard sources, and connects first mounting hole, and the light uniforming device is used for penetrating
To inside the hollow sphere light carry out diffusing transmission processing so that the radiation intensity of the emergent light of the 2 π standard sources with go out
The cosine value of firing angle is directly proportional；
Halogen tungsten lamp light source, set on the rear of the light uniforming device, for issuing the full spectral radiance of visible light wave range；And
Reflector, set on the rear of the halogen tungsten lamp light source, the light for issuing the halogen tungsten lamp light source is all reflected towards institute
It states inside hollow sphere.
3. the luminous flux measurement device of LED light source as described in claim 1, which is characterized in that the measuring table includes:
Temperature control chip, the junction temperature for controlling the LED light source to be measured are constant；
Thermal insulation layer, set on the top of the temperature control chip, for placing the LED light source to be measured and by the LED light to be measured
The heat that source issues is conducted to the temperature control chip；And
Adjustable electrode is set to the top of the temperature control chip by insulating trip, and position is adjustable in the horizontal direction, the adjustable electric
Pole is used to be electrically connected the pin of the LED light source to be measured.
4. the luminous flux measurement device of LED light source as described in claim 1, which is characterized in that the illumination detector packet
It includes:
Adapter connects the third mounting hole and the optical fiber of the hollow sphere；And
Trim tab is radiated, set on the incidence surface of the illumination detector, and connects the incident end face of the optical fiber, the radiation is repaired
Positive is used to carry out cosine amendment and Homogenization Treatments to the light radiation for being incident on the illumination detector.
5. the luminous flux measurement device of LED light source as described in claim 1, which is characterized in that the spectral radiometer includes:
Guiding device connects the outgoing end face of the optical fiber, for the light radiation in the optical fiber to be imported the spectral radiance
Meter；
Monochromator, set on the rear end of the guiding device, the light radiation for importing the guiding device is separated into more
The narrow wave optical radiation of a monochrome；
Detecting module, at the exit slit of the monochromator, the spoke of the narrow wave optical radiation for detecting the multiple monochrome
Illumination is penetrated, and the radiant illumination of the narrow wave optical radiation of the multiple monochrome is converted into corresponding digital signal；And
Signal processing module, detecting module described in communication connection, the signal processing module are configured to according to the multiple list
The radiant illumination of the narrow wave optical radiation of color calculates the luminous flux of the LED light source to be measured.
6. a kind of luminous flux measurement method of LED light source characterized by comprising
It is calibrated using luminous flux measurement device of the 2 π standard sources to LED light source of any of claims 1-5；
The 2 π standard sources is closed, and makes LED light source to be measured to issuing light radiation inside hollow sphere；
It is obtained inside the hollow sphere using illumination detector and passes through the irreflexive light radiation of the hollow sphere；
The irreflexive light radiation of the hollow sphere is passed through from illumination detector acquisition is described using spectral radiometer, to survey
Measure the spectral irradiance at the illumination detector；And
The luminous flux of the LED light source is determined according to the spectral irradiance.
7. the luminous flux measurement method of LED light source as claimed in claim 6, which is characterized in that described to use 2 π standard sources
Carrying out calibration to the luminous flux measurement device of LED light source of any of claims 1-5 includes:
Make the 2 π standard sources to the full spectral radiance of sending visible light wave range inside the hollow sphere；
It is obtained inside the hollow sphere using the illumination detector by the irreflexive 2 π mark of the hollow sphere
The light radiation that quasi-optical source issues；
The light radiation that the 2 π standard sources issues is obtained from the illumination detector using spectral radiometer, to measure its spectrum
Irradiation level；And
The spectral irradiance measured according to the spectral irradiance of the known 2 π standard sources and the spectral radiometer is to institute
Spectral radiometer is stated to be calibrated.
8. the luminous flux measurement method of LED light source as claimed in claim 7, which is characterized in that described to make the 2 π standard light
Source includes: to the full spectral radiance of sending visible light wave range inside the hollow sphere
For full spectral radiance of the halogen tungsten lamp light source power supply to generate visible light wave range in the 2 π standard sources；
The light radiation generated using reflector to halogen tungsten lamp light source described in the hollow sphere internal reflection, to generate described in
The light radiation of 2 π Space Angles inside hollow sphere；And
Diffusing transmission is carried out using light radiation of the light uniforming device to light radiation and reflector reflection that the halogen tungsten lamp light source generates
Processing, so that the radiation intensity of the emergent light of the 2 π standard sources is directly proportional to the cosine value of the angle of emergence.
9. the luminous flux measurement method of LED light source as claimed in claim 6, which is characterized in that the measurement illumination is visited
Survey the spectral irradiance at device further include:
Big illumination range light modulation is carried out using the spectral irradiance lamp for completing calibration, and multiple with spectral radiometer measurement
Illuminations actually measured value；
The ideal response range of linearity of the spectral radiometer is determined according to the illuminations actually measured value；
According to the recursion illumination for the illuminations actually measured value and the ideal response range of linearity for being greater than the ideal response range of linearity
Value determines the saturation response correction coefficient of illumination saturation part；
According to the recursion illumination for the illuminations actually measured value and the ideal response range of linearity for being less than the ideal response range of linearity
Value, determines the noise response correction coefficient of dark current and noise section；And
The nonlinear response of illumination saturation part is corrected according to the saturation response correction coefficient, and is rung according to the noise
Correction coefficient is answered to correct the nonlinear response of the dark current and noise section.
10. the luminous flux measurement method of LED light source as claimed in claim 9, which is characterized in that described according to the actual measurement
Brightness value determines that the ideal response range of linearity of the spectral radiometer includes:
Multiple illuminations actually measured values that the spectral radiometer measures are fitted using least square method, to obtain the illuminations actually measured
The linear equation of value；And
According to the difference of the illuminations actually measured value and the recursion brightness value of the linear equation, the reason of the spectral radiometer is determined
Think responsing linear range.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111289227A (en) * | 2020-03-20 | 2020-06-16 | 江西照世科技有限公司 | LED lamp string detector based on Internet of things |
| CN111811786A (en) * | 2020-08-20 | 2020-10-23 | 深圳市路美康尔医疗科技有限公司 | Exposure intensity calibration method for ultraviolet disinfection cabinet |
| CN112629832A (en) * | 2020-12-16 | 2021-04-09 | 南京信息职业技术学院 | Device for detecting uniformity of medical cold light source and calibration method |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1959366A (en) * | 2006-11-30 | 2007-05-09 | 复旦大学 | Luminous flux measurement device of using standard light source in narrow beam for LED, and testing method |
| CN101398453A (en) * | 2007-09-26 | 2009-04-01 | 中国科学院半导体研究所 | Single light path quantum efficiency test system |
| CN202302818U (en) * | 2011-09-21 | 2012-07-04 | 南通天华和睿科技创业有限公司 | LED (light-emitting diode) lamp bulb easily radiating heat |
| CN202599522U (en) * | 2012-03-21 | 2012-12-12 | 中国计量科学研究院 | Spherical photometer for measuring luminous flux of LED |
| CN202678401U (en) * | 2012-05-31 | 2013-01-16 | 泰州赛龙电子有限公司 | Packaging structure for high-power LED |
| JP2017120200A (en) * | 2015-12-28 | 2017-07-06 | 国立研究開発法人産業技術総合研究所 | Spectral radiation measuring device |
| CN209764269U (en) * | 2019-05-21 | 2019-12-10 | 上海市计量测试技术研究院 | Luminous flux measuring device of LED light source |
-
2019
- 2019-05-21 CN CN201910422108.2A patent/CN110068392B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1959366A (en) * | 2006-11-30 | 2007-05-09 | 复旦大学 | Luminous flux measurement device of using standard light source in narrow beam for LED, and testing method |
| CN101398453A (en) * | 2007-09-26 | 2009-04-01 | 中国科学院半导体研究所 | Single light path quantum efficiency test system |
| CN202302818U (en) * | 2011-09-21 | 2012-07-04 | 南通天华和睿科技创业有限公司 | LED (light-emitting diode) lamp bulb easily radiating heat |
| CN202599522U (en) * | 2012-03-21 | 2012-12-12 | 中国计量科学研究院 | Spherical photometer for measuring luminous flux of LED |
| CN202678401U (en) * | 2012-05-31 | 2013-01-16 | 泰州赛龙电子有限公司 | Packaging structure for high-power LED |
| JP2017120200A (en) * | 2015-12-28 | 2017-07-06 | 国立研究開発法人産業技術総合研究所 | Spectral radiation measuring device |
| CN209764269U (en) * | 2019-05-21 | 2019-12-10 | 上海市计量测试技术研究院 | Luminous flux measuring device of LED light source |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111289227A (en) * | 2020-03-20 | 2020-06-16 | 江西照世科技有限公司 | LED lamp string detector based on Internet of things |
| CN111289227B (en) * | 2020-03-20 | 2021-10-08 | 江西照世科技有限公司 | LED lamp string detector based on Internet of things |
| CN111811786A (en) * | 2020-08-20 | 2020-10-23 | 深圳市路美康尔医疗科技有限公司 | Exposure intensity calibration method for ultraviolet disinfection cabinet |
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