CN109963150A - A kind of detection method, system and computer storage medium - Google Patents

A kind of detection method, system and computer storage medium Download PDF

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Publication number
CN109963150A
CN109963150A CN201910229334.9A CN201910229334A CN109963150A CN 109963150 A CN109963150 A CN 109963150A CN 201910229334 A CN201910229334 A CN 201910229334A CN 109963150 A CN109963150 A CN 109963150A
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detection device
measured panel
image
panel
controls
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CN109963150B (en
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刘云明
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Lenovo Beijing Ltd
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Lenovo Beijing Ltd
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00Diagnosis, testing or measuring for television systems or their details
    • H04N17/004Diagnosis, testing or measuring for television systems or their details for digital television systems

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  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The embodiment of the invention discloses a kind of detection methods, this method comprises: control measured panel shows structure light image, and receive the confirmation message that the measured panel is sent;Wherein, the confirmation message is used to indicate the measured panel and the structure light image has been displayed;The structure light image is shot based on confirmation message control detection device, obtains target image;It controls the detection device to analyze the target image, determine whether defective inside the measured panel.The embodiment of the present invention also discloses a kind of detection system and computer storage medium simultaneously.

Description

A kind of detection method, system and computer storage medium
Technical field
The present invention relates to electron and information technology fields, store more particularly, to a kind of detection method, system and computer Medium.
Background technique
With the fast development of display technology, in production process, the defects detection of the display panel of each processing procedure, which becomes, guarantees The process indispensable with panel yield is promoted.However, can not determine in the related technology whether defective inside display panel.
Summary of the invention
In order to solve the above technical problems, an embodiment of the present invention is intended to provide the storages of a kind of detection method, system and computer Whether medium solves the problems, such as not determining in the related technology defective inside display panel.
The technical scheme of the present invention is realized as follows:
A kind of detection method, which comprises
It controls measured panel and shows structure light image, and receive the confirmation message that the measured panel is sent;Wherein, described Confirmation message is used to indicate the measured panel and the structure light image has been displayed;
The structure light image is shot based on confirmation message control detection device, obtains target image;
The detection device is controlled to analyze the target image, determine inside the measured panel whether have it is scarce It falls into.
Optionally, the control measured panel shows structure light image, and receives the confirmation letter that the measured panel is sent Breath, comprising:
It controls the measured panel and shows sinusoidal grating image, and receive the confirmation letter that the measured panel is sent Breath;
Correspondingly, described that the structure light image is shot based on confirmation message control detection device, obtain target figure Picture, comprising:
The detection device is controlled based on the confirmation message and shoots the sinusoidal grating image, obtains the target figure Picture.
Optionally, the control detection device analyzes the target image, determines in the measured panel Whether portion is defective, comprising:
It controls the detection device and obtains calibrating parameters;Wherein, the calibrating parameters include the detection device with respect to institute State the second structure ginseng of the location parameter of measured panel, the first structure parameter of the measured panel and the detection device Number;
It controls the detection device to analyze the target image, and is determined based on the calibrating parameters described to be measured Whether panel itself is defective.
Optionally, the control detection device analyzes the target image, and is based on the calibrating parameters It determines whether defective inside the measured panel, comprising:
It controls the detection device to analyze the target image, obtains the deforming stripe in the target image;
It controls the detection device and demodulates the deforming stripe, obtain phase information corresponding with the deforming stripe;
It controls the detection device and is based on the phase information and the calibrating parameters, determining inside the measured panel is It is no defective.
Optionally, the control detection device is based on the phase information and the calibrating parameters, determine it is described to Whether defective survey panel itself, comprising:
It controls the detection device and is based on the phase information and the calibrating parameters, obtain inside the measured panel First part is with respect to the relatively described reference planes of second part inside the first height of reference planes and the measured panel Second height;Wherein, the first part is corresponding with the deformed part of the deforming stripe, the second part and the deformation The undeformed part of striped is corresponding;
If it is determined that the difference of first height and second height meets preset condition, it is true to control the detection device Existing defects inside the fixed measured panel, and determine that the position of defect is the position where the first part.
Optionally, the control measured panel shows sinusoidal grating image, and receives what the measured panel was sent The confirmation message, comprising:
It controls the measured panel and successively shows at least three sinusoidal grating images, and successively receive the measured panel hair At least three confirmation messages sent;Wherein, in at least three sinusoidal gratings image any two sinusoidal grating images phase It is different;
Correspondingly, described that the detection device shooting sinusoidal grating image is controlled based on the confirmation message, it obtains The target image, comprising:
The detection device, which is controlled, based at least three confirmation message successively shoots at least three sinusoidal grating Image obtains at least three target images.
Optionally, the control detection device analyzes the target image, determines in the measured panel Whether portion is defective, comprising:
The detection device is controlled to analyze at least three target image, and using phase shift method determine it is described to Whether defective survey panel itself.
Optionally, the control detection device analyzes at least three target image, and uses phase shift Whether method determines defective inside the measured panel, comprising:
It controls the detection device and obtains calibrating parameters;Wherein, the calibrating parameters include the detection device with respect to institute State the second structure ginseng of the location parameter of measured panel, the first structure parameter of the measured panel and the detection device Number;
It controls the detection device to analyze at least three target image, obtains at least three targets figure Deforming stripe as in;
It controls the detection device and the deforming stripe is demodulated using phase shift method, obtain phase corresponding with the deforming stripe Position information;
Controlling the detection device and being determined inside the measured panel based on the phase information and the calibrating parameters is It is no defective.
A kind of detection system, the system comprises: processor, memory and communication bus;
The communication bus is for realizing the communication connection between the processor and the memory;
The processor is used to execute the program of the detection method in the memory, to perform the steps of
It controls measured panel and shows structure light image, and receive the confirmation message that the measured panel is sent;Wherein, described Confirmation message is used to indicate the measured panel and the structure light image has been displayed;
The structure light image is shot based on confirmation message control detection device, obtains target image;
The detection device is controlled to analyze the target image, determine inside the measured panel whether have it is scarce It falls into.
A kind of computer storage medium, the computer storage medium are stored with one or more program, and one or more A program can be executed by one or more processor, the step of to realize above-mentioned detection method.
Detection method, system provided by the embodiment of the present invention and computer storage medium, detection system control tested surface Plate shows structure light image, and receives the confirmation message that structure light image has been displayed of measured panel transmission;And then based on confirmation Information controls detection device and shoots structure light image, obtains target image and analyzes the target image, determines tested surface Whether intralamellar part is defective;In this way, detection device can shoot measured panel since structure light image is shown in measured panel The structure light image of display obtains target image, therefore detection device can obtain the inside of measured panel according to target image Three-dimensional data, and then determined by three-dimensional data whether defective inside measured panel, in the related technology can not to solve Determine inside display panel whether defective problem.
Detailed description of the invention
Fig. 1 is a kind of flow diagram of detection method provided in an embodiment of the present invention;
Fig. 2 is a kind of structural schematic diagram of detection system provided in an embodiment of the present invention;
Fig. 3 is the flow diagram of another detection method provided in an embodiment of the present invention;
Fig. 4 is sinusoidal grating provided in an embodiment of the present invention inside measured panel when zero defect, that measured panel is shown The schematic diagram of image;
When Fig. 5 is provided in an embodiment of the present invention defective inside measured panel, sinusoidal grating that measured panel is shown The schematic diagram of image;
Fig. 6 is the flow diagram of another detection method provided in an embodiment of the present invention;
Fig. 7 is the structural schematic diagram of another detection system provided in an embodiment of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description.
It should be understood that " embodiment of the present invention " or " previous embodiment " that specification is mentioned in the whole text means have with embodiment The a particular feature, structure, or characteristic of pass is included at least one embodiment of the present invention.Therefore, go out everywhere in the whole instruction Existing " in the embodiment of the present invention " or " in the aforementioned embodiment " not necessarily refers to identical embodiment.In addition, these are specific Feature, structure or characteristic can be combined in any suitable manner and be answered in one or more embodiments.In various realities of the invention It applies in example, magnitude of the sequence numbers of the above procedures are not meant that the order of the execution order, the execution sequence Ying Yiqi of each process Function and internal logic determine that the implementation process of the embodiments of the invention shall not be constituted with any limitation.Aforementioned present invention is implemented Example serial number is for illustration only, does not represent the advantages or disadvantages of the embodiments.
The embodiment of the present invention provides a kind of detection method, is applied to detection system, as shown in Figure 1, this method includes following Step:
Step 101: control measured panel shows structure light image, and receives the confirmation message of measured panel transmission.
Wherein, confirmation message is used to indicate measured panel and structure light image has been displayed.
Referring to Fig. 2, detection system 2 may include measured panel 21, detection device 22, processor 23 and memory 24;Processor 23 and memory 24 electrically connect, and memory 24 is used for the step of storing the detection method in present example, processing Device 23 is for the step of executing the detection method stored in memory 24.
Detection device 22 may include photographing module 221 and processing module 222,222 electricity of photographing module 221 and processing module Connection, photographing module 221 obtains target image for shooting measured panel 21, and the target image of shooting is sent to processing mould Block 222 can be handled target image after processing module 222 receives the target image of the transmission of photographing module 221.It takes the photograph As module 221 can be CCD camera module.In the present embodiment, photographing module 221 and processing module 222 can also be arranged in In one equipment (i.e. detection device 22).In other embodiments, photographing module 221 and processing module 222 can be individually present In different equipment, for example, photographing module 221 is located in camera apparatus, processing module 222 is located in computer equipment.
Photographing module 221 can be located at the light emission side of measured panel 21.The optical axis of photographing module 221 can be perpendicular to be measured The optical axis of panel 21 or photographing module 221 can have default angle between measured panel 21.In the embodiment of the present invention In, the optical axis of photographing module 221 is perpendicular to measured panel 21 and across the center of measured panel 21.
Measured panel 21 may include liquid crystal display (Liquid Crystal Display, LCD), organic light emitting display One of device (Organic Light Emitting Display, OLED) and glass panel.The embodiment of the present invention is treated The type for surveying panel 21 is not construed as limiting, as long as measured panel 21 is light penetrating panel.
Processor 23 controls measured panel 21 and shows structure light image, and receives the confirmation message of the transmission of measured panel 21. In one embodiment, processor 23 can send control instruction to measured panel 21, and measured panel 21 receives control instruction Afterwards, structure light image is shown based on control instruction, and after showing structure light image, sends confirmation message to processor 23.? Under this embodiment, 21 storage inside of measured panel includes the coded program of pre-arranged code parameter, and measured panel 21 is receiving To after control instruction, structure light image can be shown by calling directly coded program.Coding parameter includes background light intensity, striped width At least one of degree, initial phase, width of fringe, fringe spacing, fringe period and phase intervals.In another embodiment In, processor 23 can send control information to measured panel 21 and be based on the control after measured panel 21 receives control information Information shows structure light image, and after showing structure light image, sends confirmation message to processor 23, wherein control information In include coding parameter.Under this embodiment, coding parameter of the measured panel 21 according to the control information received, display Structure light image corresponding with coding parameter.
In embodiments of the present invention, structure light image is sinusoidal raster image.Measured panel can use Fourier transformation The method of technology of profiling (Phase Measurement Profilometry, PMP) encodes to obtain sinusoidal grating image.In another reality It applies in example, can also be encoded using the method for phase measuring profilometer (Fourier Transform Profilometry, FTP) Obtain sinusoidal grating image.In other embodiments, structure light image can also be rectangular raster image or cosine grating image Deng being not construed as limiting herein.
Step 102: structure light image being shot based on confirmation message control detection device, obtains target image.
Processor 23 shoots structure light image based on the photographing module 221 of confirmation message control detection device 22, obtains mesh Logo image.Obtained target image can be sent to processing module 222 by photographing module 221.
Step 103: whether control detection device analyzes target image, determine defective inside measured panel.
The processing module 222 of detection device 22 after obtaining target image, processing module 222 can also to target image into Row filtering processing, to avoid when carrying out image analysis, the noise on analysis result in image is had an impact.To target image into Row filtering processing may include: to carry out median filter process, mean filter processing or gaussian filtering process to target image.
The processing module 222 of detection device 22 and the processor 23 of detection system 2 are different, and processing module 222 is located at detection In equipment 22, processor 23 is independently located in the detection system 2 except detection device 22 and measured panel 21, i.e. detection device 22 Processing module 222 cannot execute the operation of above-mentioned processor 23.In another embodiment, the processing module of detection device 22 222 and the processor 23 of detection system 2 can be identical, i.e. the processing module 222 of detection device 22 can execute above-mentioned processor 23 operation.
Detection device 22 can divide target image using phase measuring profilometer or Fourier transform profilometry Analysis.Wherein phase measuring profilometer includes three step phase shift methods, four-stepped switching policy and five step phase shift methods, i.e. detection device 22 can be adopted Target image is analyzed with three step phase shift methods, four-stepped switching policy or five step phase shift methods.It is used when analyzing image Method, should with Devices to test show structure light image when used method it is corresponding.
Detection device 22 can by whether having deformed region in analysis target image, come determine inside measured panel whether It is defective.
In embodiments of the present invention, due to measured panel it is shown that structure light image, detection device can shoot to be measured The structure light image of Display panel obtains target image, therefore detection device can obtain in measured panel according to target image The three-dimensional data in portion, so determined by three-dimensional data it is whether defective inside measured panel, to solve in the related technology Can not determine inside display panel whether defective problem.
Based on previous embodiment, the embodiment of the present invention provides a kind of detection method, is applied to detection system, as shown in figure 3, Method includes the following steps:
Step 301: control measured panel shows sinusoidal grating image, and receives the confirmation message of measured panel transmission.
Wherein, the confirmation message of this step is used to indicate measured panel and sinusoidal grating image has been displayed.
Fig. 2 is please referred to Fig. 5, wherein Fig. 4 is inside measured panel when zero defect, and measured panel is shown just The schematic diagram of string raster image, in Fig. 4, the display of measured panel 21 includes the sinusoidal grating image of multiple stripeds, multiple stripeds In each striped do not have deformed part.When Fig. 5 is defective inside measured panel, sinusoidal grating that measured panel is shown The schematic diagram of image, in Fig. 5, the display of measured panel 21 includes the sinusoidal grating image of multiple stripeds, is existed in multiple stripeds Striped with deformed part, it should be appreciated that Fig. 4 and Fig. 5, which is only exemplary, describes the sinusoidal grating of the display of measured panel 21 Image, in practical application, measured panel 21 shows different sinusoidal grating images according to different coding parameters.It should also manage Solution, although there are three deforming stripes for the sinusoidal grating image tool shown in Fig. 5, in actual display, sinusoidal light Grid image has the position of the quantity and deformed part of deforming stripe in deforming stripe, is according to lacking inside side panel 21 Fall into what position determined, i.e., the deformed part in striped is inside the position of the display area of measured panel 21 and measured panel 21 Defective locations are corresponding.
Wherein, in Fig. 4 and Fig. 5, the gray value of each striped is identical in multiple stripeds, and the pixel value of multiple stripeds according to Sinusoidal rule alternation.Wherein, pixel value may include grey scale pixel value or pixel color value, different pixel values and different phases Position information is corresponding.Can only have the sinusoidal grating striped of a cycle in one sinusoidal grating image, can also there is at least two The sinusoidal grating striped in a period.In Fig. 4 and Fig. 5, sinusoidal grating stripe pattern is longitudinally shown in measured panel 21, Zong Xiangzhan The sinusoidal grating striped shown is column sinusoidal grating striped.In other embodiments, sinusoidal grating stripe pattern is in measured panel 21 On can also laterally show, the sinusoidal grating striped laterally shown be row sinusoidal grating striped.Sinusoidal grating stripe pattern to Surveying can be with oblique displaying on panel 21.
In the embodiment of the present invention, sinusoidal grating image can be obtained using the method for Fourier transform profilometry.It is using When Fourier transform profilometry, measured panel 21 shows a sinusoidal grating image.In another embodiment, phase can also be used The method of position measurement technology of profiling obtains sinusoidal grating image.When using phase measuring profilometer, measured panel 21 is successively shown Phase intervals are multiple sinusoidal grating images of preset phase, and preset phase can be 120 degree, 90 degree or 72 degree etc..
Step 302: sinusoidal grating image being shot based on confirmation message control detection device, obtains target image.
The one sinusoidal grating image of every display of measured panel 21 can all send a confirmation message, processing to processor 23 Device 23 is based on confirmation message, sends photographing instruction to detection device 22, and detection device 22 is made to receive the transmission of processor 23 After photographing instruction, control photographing module 221 shoots sinusoidal grating image, obtains target image.Therefore, when measured panel 21 successively When showing multiple sinusoidal grating images, multiple confirmation messages can be successively sent to processor 23, so that the every reception of processor 23 When to a confirmation message, it can all control detection device 22 and shoot the sinusoidal grating image that measured panel 21 is shown.
Step 303: control detection device obtains calibrating parameters.
Wherein, calibrating parameters include detection device 22 with respect to the location parameter of measured panel 21, measured panel 21 first Second structural parameters of structural parameters and detection device 22.
Detection device 22 can be detection device 22 with respect to the three of measured panel 21 with respect to the location parameter of measured panel 21 It is relatively to be measured with respect to the coordinate origin of the three-dimensional coordinate of measured panel 21 or photographing module 221 to tie up coordinate, photographing module 221 The three-dimensional coordinate of 21 coordinate origin of panel;The first structure parameter of measured panel 21 includes the length of measured panel 21, width And at least one in height;Second structural parameters of detection device 22 include the optical axis of photographing module 221 with respect to measured panel 21 angle and the structural parameters of photographing module 221, wherein the structural parameters of photographing module 221 include camera internal parameter, At least one of camera external parameter, camera lens distortion parameter, image resolution ratio and camera focus.
User can voluntarily input calibrating parameters by the processing module 222 of detection device 22, so that processing module 222 After the calibrating parameters for receiving user's input, calibrating parameters can be stored in memory module (not shown go out), detection device 22 processing module 222 can call the calibrating parameters being stored in memory module.In one embodiment, memory module can be set It sets in computer equipment.In another embodiment, memory module can be located in detection device 22, and independently of processing module 222 and photographing module 221.In another embodiment, memory module can be located at independently of detection device 22 and measured panel 21 Detection system in.In another embodiment, memory module can be located at other equipment or cloud, be not construed as limiting herein.
Step 304: control detection device analyzes target image, and is determined inside measured panel based on calibrating parameters It is whether defective.
Control detection device 22 analyzes target image, and based on calibrating parameters determine inside measured panel 21 whether It is defective, comprising: control detection device 22 analyzes target image, obtains the deforming stripe in target image;Control inspection Measurement equipment 22 demodulates deforming stripe, obtains phase information corresponding with deforming stripe;It controls detection device 22 and is based on phase information And calibrating parameters, it determines whether defective inside measured panel 21.
It is identical due to shooting the image that obtained target image and measured panel 21 are shown please continue to refer to Fig. 5, figure The image that measured panel 21 is shown in 5 is also possible to the target image that detection device 22 obtains, the processing module of detection device 22 222 pairs of target images are analyzed, it can be deduced that include three deforming stripes in target image.Processing module 222 is available In this three deforming stripes in the phase of undeformed part and three deforming stripes deformed part phase;Wherein, each deformation The phase of undeformed part is different with the phase of deformed part in striped.Processing module 222 can be based in three deforming stripes The phase and calibrating parameters of deformed part, determine the interior of measured panel 21 in the phase of undeformed part, three deforming stripes Whether portion is defective.
Wherein, control detection device 22 be based on phase information and calibrating parameters, determine inside measured panel 21 whether have it is scarce It falls into, comprising: control detection device 22 is based on phase information and calibrating parameters, and the first part obtained inside measured panel 21 is opposite Reference planes first height and measured panel 21 inside second part with respect to reference planes second highly;Wherein, first Part is corresponding with the deformed part of deforming stripe, and second part is corresponding with the undeformed part of deforming stripe;If it is determined that first is high The difference of degree and the second height meets preset condition, and control detection device 22 determines 21 inside existing defects of measured panel, and really Determine position of the position of defect where first part.
Please continue to refer to Fig. 5, phase, three modified strips of the detection device 22 based on undeformed part in three deforming stripes The phase and calibrating parameters of deformed part in line, obtain the deformed part pair with three deforming stripes inside measured panel 21 The first part answered is with respect to the undeformed portion with three deforming stripes inside the first height and measured panel 21 of reference planes Divide second height of the corresponding second part with respect to reference planes.
The difference of first height and the second height meets preset condition, may include: the difference of the first height and the second height Value is greater than the first preset value or less than the second preset value, and the first preset value is greater than zero, and the second preset value is less than zero.Of the invention real It applies in example, reference planes can be the side of the separate photographing module 221 of measured panel 21, or be the close of measured panel 21 The side of photographing module 221, reference planes can also be other planes, be not construed as limiting herein.
Since the deformed part of a deforming stripe is one section of striped, the deformed part of deforming stripe includes multiple First object point, multiple first object points are on deformed part, so as to by multiple first object points in target figure Position as in obtains the phase of multiple first object points, and the phase and multiple first of the undeformed part by deforming stripe The phase of target point obtains multiple second targets of the first part inside measured panel 21 corresponding with multiple first object points Multiple object heights of the opposite reference planes of point, wherein multiple object heights include in the first height.In one embodiment, The difference of first height and the second height can be the difference of minimum altitude and the second height in multiple object heights.Another In embodiment, the difference of the first height and the second height can be the difference in multiple object heights in maximum height and the second height Value.In another embodiment, the difference of the first height and the second height can be the mean value and the second height of multiple object heights Difference.In another embodiment, the difference of the first height and the second height can be and be placed in the first deformed part edge The difference of first object point corresponding object height and the second height.
When detection device 22 determines that first part is defect part, available defect part is with respect to measured panel 21 The three-dimensional coordinate of reference axis, and then determine the position of defect part.
Optionally, after getting three-dimensional coordinate of the defect part with respect to the reference axis of measured panel 21, processing equipment can To determine defect type belonging to defect part based on the three-dimensional coordinate.
It should be noted that in the present embodiment with the explanation of same steps in other embodiments and identical content, Ke Yican According to the description in other embodiments, details are not described herein again.
In embodiments of the present invention, due to measured panel it is shown that structure light image, detection device can shoot to be measured The structure light image of Display panel obtains target image, therefore detection device can obtain in measured panel according to target image The three-dimensional data in portion, so determined by three-dimensional data it is whether defective inside measured panel, to solve in the related technology Can not determine inside display panel whether defective problem.In addition, due in the difference for determining the first height and the second height When meeting preset condition, just determine that first part is defect part, the defect part for judging detection device is accurate.
Based on previous embodiment, the embodiment of the present invention provides a kind of detection method, is applied to detection system, as shown in fig. 6, Method includes the following steps:
Step 401: control measured panel successively shows at least three sinusoidal grating images, and successively receives measured panel hair At least three confirmation messages sent.
In conjunction with referring to Fig.2, wherein, the phase of any two sinusoidal grating images is different at least three sinusoidal grating images, The pixel value of striped is different i.e. in any two sinusoidal grating images.In this step, each confirmation message is used to indicate tested surface Sinusoidal grating image has been displayed in plate 21.
In one embodiment, processor 23 can be based on three step phase shift methods, and control measured panel 21 successively shows three rows Sinusoidal grating image or three column sinusoidal grating images.Wherein, three row sinusoidal grating images or three column sinusoidal grating figures Phase difference as between adjacent two images is 120 degree, for example, the phase range that first row sinusoidal grating image is shown is Range greater than zero and less than or equal to 120 degree, the phase range that second row sinusoidal grating image is shown are greater than 120 and to be less than Range equal to 240 degree, the phase range that third row sinusoidal grating image is shown are greater than 240 and less than or equal to 360 degree Range.In another embodiment, processor 23 can be based on three step phase shift methods, and successively three phase differences are control measured panel 21 The column sinusoidal grating image that 120 degree of row sinusoidal grating image and three phase differences are 120 degree.In another embodiment, it handles Device 23 can be based on four-stepped switching policy, control measured panel 21 show row sinusoidal grating image that four phase differences are 90 degree with/ Or the column sinusoidal grating image that four phase differences are 90 degree.In another embodiment, processor 23 can be based on five step phase shift methods, Control the row sinusoidal grating image that measured panel 21 shows that five phase differences are 72 degree and/or the column that five phase differences are 72 degree just String raster image.
Step 402: at least three sinusoidal grating images are successively shot based at least three confirmation messages control detection device, Obtain at least three target images.
As soon as processor 23 often receives the confirmation message of the transmission of a measured panel 21, a bat is sent to detection device 22 One is obtained so that detection device 22 can shoot the sinusoidal grating image that measured panel 21 is shown according to photographing instruction according to instruction A target image.
In embodiments of the present invention, processor 23 is sequentially received three confirmation messages, can be according to being sequentially received Three confirmation messages, control detection device 22 successively shoot three sinusoidal grating images, obtain three target images.Similarly, It, can be according at least fours' or more be sequentially received if processor 23 is sequentially received at least four or more confirmation message Confirmation message, control detection device 22 successively shoot at least four sinusoidal grating images, obtain at least four target images.
Step 403: control detection device analyzes at least three target images, and determines tested surface using phase shift method Whether intralamellar part is defective.
For detection device 22 after obtaining at least three target images, the processing module 222 of detection device 22 can also be successively At least three target images are filtered, when to avoid carrying out image analysis at least three target images, in image Noise on analysis result have an impact.
Three step phase shift methods are based on when processor 23 controls measured panel 21, when successively showing three row sinusoidal grating images, Processor 23 can control detection device 22 using three step phase shift methods determine it is whether defective inside measured panel 21.In other realities It applies in example, is based on four-stepped switching policy or five step phase shift methods when processor 23 controls measured panel 21, successively shows four or five When sinusoidal grating image, processor 23 can control detection device 22 and determine tested surface using four-stepped switching policy or five step phase shift methods It is whether defective inside plate 21.
In one embodiment, control detection device 22 analyzes at least three target images, and true using phase shift method Determine it is whether defective inside measured panel 21, may include: control detection device 22 obtain calibrating parameters;Wherein, calibrating parameters Including detection device 22 with respect to the location parameter of measured panel 21, the first structure parameter and detection device 22 of measured panel 21 The second structural parameters;Control detection device 22 analyzes at least three target images, obtains at least three target images In deforming stripe;It controls detection device 22 and deforming stripe is demodulated using phase shift method, obtain phase letter corresponding with deforming stripe Breath;Whether control detection device 22 is determined defective inside measured panel 21 based on phase information and calibrating parameters.
In another embodiment, control detection device 22 analyzes at least three target images, and uses phase shift method Determine it is whether defective inside measured panel 21, may include: control detection device 22 obtain calibrating parameters;Wherein, calibration ginseng Number includes detection device 22 with respect to the location parameter of measured panel 21, the first structure parameter and detection device of measured panel 21 22 the second structural parameters;Control detection device 22 analyzes at least three target images, and is determined based on calibrating parameters It is whether defective inside measured panel 21.
Wherein, control detection device 22 analyzes at least three target images, and is determined based on calibrating parameters to be measured It is whether defective inside panel 21, it can be realized by following step A~C.
Step A: control detection device analyzes at least three target images, obtains at least three target images Deforming stripe.
Due to the defect area inside measured panel 21 be it is fixed, if 21 inside existing defects of measured panel, There is deforming stripe at least three target images, position of the deformed part of deforming stripe in each target image is true Fixed.For example, have defect inside the measured panel 21, and when defect is in the center of measured panel, the deformation of deforming stripe Part is in the center of at least three target images.
Step B: control detection device demodulates deforming stripe using phase shift method, obtains phase letter corresponding with deforming stripe Breath.
In this step, processor 23 controls detection device 22 and demodulates each of at least three target images using phase shift method The deforming stripe of target image obtains phase information corresponding with the deforming stripe of at least three target images.
When detection device 22 obtains the target image that three phase differences are 120 degree, detection device 22 can use three steps Phase shift method demodulates the deforming stripe.In another embodiment, when detection device 22 obtains the target figure that four phase differences are 90 degree When picture, detection device 22 can demodulate deforming stripe using four-stepped switching policy.In another embodiment, when detection device 22 obtains When the target image that five phase differences are 72 degree, detection device 22 can demodulate deforming stripe using five step phase shift methods.
Step C: whether control detection device is determined defective inside measured panel based on phase information and calibrating parameters.
Wherein, control detection device 22 determined inside measured panel 21 based on phase information and calibrating parameters whether have it is scarce It falls into, may include: control deforming stripe corresponding phase information and calibration of the detection device 22 based at least three target images Parameter;First part inside measured panel 21 is obtained with respect to the inside the first height and measured panel 21 of reference planes Second height of two parts with respect to reference planes;Wherein, first part is corresponding with the deformed part of deforming stripe, second part with The undeformed part of deforming stripe is corresponding;If it is determined that the difference of the first height and the second height meets preset condition, control detection Equipment 22 determines 21 inside existing defects of measured panel, and determines that the position of defect is the position where first part.
It should be noted that in the present embodiment with the explanation of same steps in other embodiments and identical content, Ke Yican According to the description in other embodiments, details are not described herein again.
In embodiments of the present invention, due to measured panel it is shown that structure light image, detection device can shoot to be measured The structure light image of Display panel obtains target image, therefore detection device can obtain in measured panel according to target image The three-dimensional data in portion, so determined by three-dimensional data it is whether defective inside measured panel, to solve in the related technology Can not determine inside display panel whether defective problem.In addition, phase shift method is used since processing can control detection device, At least three images shot to detection detection device are analyzed, and detection device can be made to accurately determine measured panel It is internal whether defective.
Based on previous embodiment, the embodiment of the present invention provides a kind of detection system 5, which can be applied to In a kind of detection method that the corresponding embodiment in Fig. 1,3 and 5 provides, referring to shown in Fig. 7, which may include: place Device 51, memory 52 and communication bus 53 are managed, processor 51 and memory 52 can be with the processors 23 in above-described embodiment It is identical with memory 24, in which:
Communication bus 53 is for realizing the communication connection between processor 51 and memory 52.
Processor 51 is used to execute the program of the detection method stored in memory 52, to perform the steps of
It controls measured panel and shows structure light image, and receive the confirmation message of measured panel transmission;Wherein, confirmation message It is used to indicate measured panel and structure light image has been displayed;
Structure light image is shot based on confirmation message control detection device, obtains target image;
Whether control detection device analyzes target image, determine defective inside measured panel.
In other embodiments of the invention, it is aobvious to be used to execute the control measured panel stored in memory 52 for processor 51 Show structure light image, and receive the confirmation message of measured panel transmission, to perform the steps of
It controls measured panel and shows sinusoidal grating image, and receive the confirmation message of measured panel transmission;
Correspondingly, processor 51 be used for execute stored in memory 52 based on confirmation message control detection device shooting knot Structure light image, obtains target image, to perform the steps of
Sinusoidal grating image is shot based on confirmation message control detection device, obtains target image.
In other embodiments of the invention, processor 51 is for executing the control detection device pair stored in memory 52 Target image is analyzed, determine it is whether defective inside measured panel, to perform the steps of
It controls detection device and obtains calibrating parameters;Wherein, calibrating parameters include position of the detection device with respect to measured panel Second structural parameters of parameter, the first structure parameter of measured panel and detection device;
Control detection device analyzes target image, and determined inside measured panel based on calibrating parameters whether have it is scarce It falls into.
In other embodiments of the invention, processor 51 is for executing the control detection device pair stored in memory 52 Target image is analyzed, and determined based on calibrating parameters it is whether defective inside measured panel, to perform the steps of
Control detection device analyzes target image, obtains the deforming stripe in target image;
It controls detection device and demodulates deforming stripe, obtain phase information corresponding with deforming stripe;
It controls detection device and is based on phase information and calibrating parameters, determine whether defective inside measured panel.
In other embodiments of the invention, processor 51 is for executing the control detection device base stored in memory 52 In phase information and calibrating parameters, determine it is whether defective inside measured panel, to perform the steps of
It controls detection device and is based on phase information and calibrating parameters, obtain the opposite reference of first part inside measured panel Plane first height and measured panel inside second part with respect to reference planes second highly;Wherein, first part with The deformed part of deforming stripe is corresponding, and second part is corresponding with the undeformed part of deforming stripe;
If it is determined that the difference of the first height and the second height meets preset condition, control detection device is determined in measured panel Portion's existing defects, and determine that the position of defect is the position where first part.
In other embodiments of the invention, it is aobvious to be used to execute the control measured panel stored in memory 52 for processor 51 Show sinusoidal grating image, and receive the confirmation message of measured panel transmission, to perform the steps of
Control measured panel successively shows at least three sinusoidal grating images, and successively receives measured panel and send at least Three confirmation messages;Wherein, the phase of any two sinusoidal grating images is different at least three sinusoidal grating images;
Correspondingly, processor 51 be used for execute stored in memory 52 based on confirmation message control detection device shooting just String raster image, obtains target image, to perform the steps of
At least three sinusoidal grating images are successively shot based at least three confirmation messages control detection device, are obtained at least Three target images.
In other embodiments of the invention, processor 51 is for executing the control detection device pair stored in memory 52 Target image is analyzed, determine it is whether defective inside measured panel, to perform the steps of
It controls detection device to analyze at least three target images, and use phase shift method to determine inside measured panel to be It is no defective.
In other embodiments of the invention, processor 51 is for executing the control detection device pair stored in memory 52 At least three target images are analyzed, and whether phase shift method is used to determine defective inside measured panel, to realize following step It is rapid:
It controls detection device and obtains calibrating parameters;Wherein, calibrating parameters include position of the detection device with respect to measured panel Second structural parameters of parameter, the first structure parameter of measured panel and detection device;
Control detection device analyzes at least three target images, obtains the modified strip at least three target images Line;
It controls detection device and deforming stripe is demodulated using phase shift method, obtain phase information corresponding with deforming stripe;
Whether control detection device is determined defective inside measured panel based on phase information and calibrating parameters.
In embodiments of the present invention, due to measured panel it is shown that structure light image, detection device can shoot to be measured The structure light image of Display panel obtains target image, therefore detection device can obtain in measured panel according to target image The three-dimensional data in portion, so determined by three-dimensional data it is whether defective inside measured panel, to solve in the related technology Can not determine inside display panel whether defective problem.
Based on previous embodiment, the embodiment of the present invention provides a kind of computer readable storage medium, computer-readable to deposit Storage media is stored with one or more program, which can be executed by one or more processor, with The step of realizing the as above detection method of any one.
It should be noted that above-mentioned processor can be application-specific IC (ASIC, Application Specific Integrated Circuit), digital signal processor (DSP, Digital Signal Processor), number Word signal processing apparatus (DSPD, Digital Signal Processing Device), programmable logic device (PLD, Programmable Logic Device), field programmable gate array (FPGA, Field Programmable Gate Array), central processing unit (CPU, Central Processing Unit), controller, in microcontroller, microprocessor extremely Few one kind.It is to be appreciated that realizing that the electronic device of above-mentioned processor function can also be to be other, the embodiment of the present application is not made to have Body limits.
It should be noted that above-mentioned computer storage medium/memory can be read-only memory (Read Only Memory, ROM), programmable read only memory (Programmable Read-Only Memory, PROM), erasable programmable Read-only memory (Erasable Programmable Read-Only Memory, EPROM), electrically erasable is read-only deposits Reservoir (Electrically Erasable Programmable Read-Only Memory, EEPROM), magnetic random access Memory (Ferromagnetic Random Access Memory, FRAM), flash memory (Flash Memory), magnetic table The memories such as face memory, CD or CD-ROM (Compact Disc Read-Only Memory, CD-ROM);It can also be with It is the various terminals for including one of above-mentioned memory or any combination, such as mobile phone, computer, tablet device, individual digital Assistant etc..
It should be noted that, in this document, the terms "include", "comprise" or its any other variant are intended to non-row His property includes, so that the process, method, article or the device that include a series of elements not only include those elements, and And further include other elements that are not explicitly listed, or further include for this process, method, article or device institute it is intrinsic Element.In the absence of more restrictions, the element limited from sentence "including a ...", it is not excluded that including being somebody's turn to do There is also other identical elements in the process, method of element, article or device.
Above-mentioned the embodiment of the present application serial number is for illustration only, does not represent the advantages or disadvantages of the embodiments.
Through the above description of the embodiments, those skilled in the art can be understood that above-described embodiment side Method can be realized by means of software and necessary general hardware platform, naturally it is also possible to by hardware, but in many cases The former is more preferably embodiment.Based on this understanding, the technical solution of the application substantially in other words does the prior art The part contributed out can be embodied with the pattern of software product, which is stored in a storage medium In (such as ROM/RAM, magnetic disk, CD), including some instructions are used so that a terminal device (can be mobile phone, computer, clothes Business device, air conditioner or the network equipment etc.) execute method described in each embodiment of the application.
The application is referring to method, the process of equipment (system) and computer program product according to the embodiment of the present application Figure and/or block diagram describe.It should be understood that can be from every one stream in computer program instructions implementation flow chart and/or block diagram The combination of process and/or box in journey and/or box and flowchart and/or the block diagram.It can provide these computer programs Instruct the processor of general purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices to produce A raw machine, so that being generated by the instruction that computer or the processor of other programmable data processing devices execute for real The device for the function of being specified in present one or more flows of the flowchart and/or one or more blocks of the block diagram.
These computer program instructions, which may also be stored in, is able to guide computer or other programmable data processing devices with spy Determine in the computer-readable memory that mode works, so that it includes referring to that instruction stored in the computer readable memory, which generates, Enable the manufacture of device, the command device realize in one box of one or more flows of the flowchart and/or block diagram or The function of being specified in multiple boxes.
These computer program instructions also can be loaded onto a computer or other programmable data processing device, so that counting Series of operation steps are executed on calculation machine or other programmable devices to generate computer implemented processing, thus in computer or The instruction executed on other programmable devices is provided for realizing in one or more flows of the flowchart and/or block diagram one The step of function of being specified in a box or multiple boxes.
The above is only preferred embodiment of the present application, are not intended to limit the scope of the patents of the application, all to utilize this Shen Please equivalent structure or equivalent flow shift made by specification and accompanying drawing content, be applied directly or indirectly in other relevant skills Art field similarly includes in the scope of patent protection of the application.

Claims (10)

1. a kind of detection method, which comprises
It controls measured panel and shows structure light image, and receive the confirmation message that the measured panel is sent;Wherein, the confirmation Information is used to indicate the measured panel and the structure light image has been displayed;
The structure light image is shot based on confirmation message control detection device, obtains target image;
It controls the detection device to analyze the target image, determine whether defective inside the measured panel.
2. the method according to claim 1, wherein the control measured panel shows structure light image, and connecing Receive the confirmation message that the measured panel is sent, comprising:
It controls the measured panel and shows sinusoidal grating image, and receive the confirmation message that the measured panel is sent;
Correspondingly, described that the structure light image is shot based on confirmation message control detection device, target image is obtained, is wrapped It includes:
The detection device is controlled based on the confirmation message and shoots the sinusoidal grating image, obtains the target image.
3. method according to claim 1 or 2, which is characterized in that the control detection device is to the target figure As being analyzed, determine whether defective inside the measured panel, comprising:
It controls the detection device and obtains calibrating parameters;Wherein, the calibrating parameters include the detection device it is relatively described to Survey location parameter, the first structure parameter of the measured panel and the second structural parameters of the detection device of panel;
It controls the detection device to analyze the target image, and determines the measured panel based on the calibrating parameters It is internal whether defective.
4. according to the method described in claim 3, it is characterized in that, the control detection device to the target image into Row analysis, and determined based on the calibrating parameters whether defective inside the measured panel, comprising:
It controls the detection device to analyze the target image, obtains the deforming stripe in the target image;
It controls the detection device and demodulates the deforming stripe, obtain phase information corresponding with the deforming stripe;
It controls the detection device and is based on the phase information and the calibrating parameters, whether determine inside the measured panel has Defect.
5. according to the method described in claim 4, it is characterized in that, the control detection device is based on the phase information With the calibrating parameters, determine whether defective inside the measured panel, comprising:
It controls the detection device and is based on the phase information and the calibrating parameters, obtain first inside the measured panel The second of the first relatively described reference planes of second part highly and inside the measured panel of the opposite reference planes in part Highly;Wherein, the first part is corresponding with the deformed part of the deforming stripe, the second part and the deforming stripe Undeformed part it is corresponding;
If it is determined that the difference of first height and second height meets preset condition, controls the detection device and determine institute Existing defects inside measured panel are stated, and determine that the position of defect is the position where the first part.
6. according to the method described in claim 2, it is characterized in that, the control measured panel shows sinusoidal grating figure Picture, and receive the confirmation message that the measured panel is sent, comprising:
It controls the measured panel and successively shows at least three sinusoidal grating images, and successively receive what the measured panel was sent At least three confirmation messages;Wherein, the phase of any two sinusoidal grating images is different in at least three sinusoidal gratings image;
Correspondingly, described that the detection device shooting sinusoidal grating image is controlled based on the confirmation message, it obtains described Target image, comprising:
The detection device, which is controlled, based at least three confirmation message successively shoots at least three sinusoidal gratings image, Obtain at least three target images.
7. according to the method described in claim 6, it is characterized in that, the control detection device to the target image into Whether row analysis, determine defective inside the measured panel, comprising:
It controls the detection device to analyze at least three target image, and the tested surface is determined using phase shift method Whether intralamellar part is defective.
8. the method according to the description of claim 7 is characterized in that the control detection device is at least three mesh Logo image is analyzed, and whether phase shift method is used to determine defective inside the measured panel, comprising:
It controls the detection device and obtains calibrating parameters;Wherein, the calibrating parameters include the detection device it is relatively described to Survey location parameter, the first structure parameter of the measured panel and the second structural parameters of the detection device of panel;
It controls the detection device to analyze at least three target image, obtain at least three target image Deforming stripe;
It controls the detection device and the deforming stripe is demodulated using phase shift method, obtain phase letter corresponding with the deforming stripe Breath;
It controls the detection device and determines inside the measured panel whether have based on the phase information and the calibrating parameters Defect.
9. a kind of detection system, which is characterized in that the system comprises: processor, memory and communication bus;
The communication bus is for realizing the communication connection between the processor and the memory;
The processor is used to execute the program of the detection method in the memory, to perform the steps of
It controls measured panel and shows structure light image, and receive the confirmation message that the measured panel is sent;Wherein, the confirmation Information is used to indicate the measured panel and the structure light image has been displayed;
The structure light image is shot based on confirmation message control detection device, obtains target image;
It controls the detection device to analyze the target image, determine whether defective inside the measured panel.
10. a kind of computer storage medium, which is characterized in that the computer storage medium is stored with one or more journey Sequence, one or more of programs can be executed by one or more processor, to realize as any in claim 1 to 8 The step of detection method described in item.
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