CN109901053A - Test device for testing of printed circuit board - Google Patents
Test device for testing of printed circuit board Download PDFInfo
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- CN109901053A CN109901053A CN201910221948.2A CN201910221948A CN109901053A CN 109901053 A CN109901053 A CN 109901053A CN 201910221948 A CN201910221948 A CN 201910221948A CN 109901053 A CN109901053 A CN 109901053A
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- dials
- lower die
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- upper mold
- testing
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- 238000012360 testing method Methods 0.000 title claims abstract description 162
- 230000000712 assembly Effects 0.000 claims description 7
- 238000000429 assembly Methods 0.000 claims description 7
- 230000000694 effects Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 8
- 230000008569 process Effects 0.000 abstract description 7
- 238000003032 molecular docking Methods 0.000 abstract description 2
- 238000004891 communication Methods 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 3
- 238000004804 winding Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
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Abstract
The present invention relates to test device technical fields, provide a kind of test device for testing of printed circuit board, including testing mould, press rack, the first lifting assembly, the second lifting assembly, upper mold dials component and lower die dials component.Press rack includes appear on the stage panel, leave from office panel and drop front, first lifting assembly is installed on panel of appearing on the stage, and, the extension end of first lifting assembly is connected to upper mold dials component, upper mold dials component is installed on the one end of drop front, and test upper mold is installed on the another side of drop front, and the second lifting assembly is installed on the one end of leave from office panel, the extension end of second lifting assembly is connected to lower die dials component, and test lower die is installed on the another side of leave from office panel.Test process is mechanically docked using monoblock type dials with testing mould, and time-consuming caused by avoiding because of use manual type docking, and the error-prone problem of wiring greatly increases testing efficiency.
Description
Technical field
The present invention relates to test device technical fields, especially provide a kind of test device for testing of printed circuit board.
Background technique
At present in the industry of production printed circuit board, test finished product printed circuit board is essential.Its test item
Mesh has open circuit, short circuit and resistance function.Existing test device is made of three parts, respectively press device, electron scanning
System and winding displacement connection component, wherein press device provides power, and winding displacement connection component is for connecting printed circuit board, electricity
Sub- scanning system realizes the instruction input and output of entire test process.However, existing test device is during the test, need
The detection interface of winding displacement connection component is connected on a printed circuit one by one by manual type, in this way, entire test process
Time-consuming, error-prone, and then influences testing efficiency.Therefore, time-consuming, easily goes out for the existing test device test process of urgent need to resolve
Wrong problem.
Summary of the invention
The purpose of the present invention is to provide a kind of test devices for testing of printed circuit board, it is intended to solve existing survey
The test process problem that time-consuming, error-prone is set in trial assembly.
To achieve the above object, the technical solution adopted by the present invention is that: for the test device of testing of printed circuit board, packet
Include testing mould, press rack, the first lifting assembly, the second lifting assembly, upper mold dials component and lower die dials component, institute
Stating testing mould includes the test upper mold being oppositely arranged up and down and test lower die, and press rack includes appear on the stage panel, leave from office panel
And in the drop front appeared on the stage and moved between panel and the leave from office panel, panel and the leave from office panel of appearing on the stage
It is vertically stacked and is spaced setting, first lifting assembly is installed on the panel of appearing on the stage, also, first lifting
The extension end of component is connected to the upper mold dials component, and the upper mold dials component is installed on one end of the drop front
Side, the test upper mold is installed on the another side of the drop front and is electrically connected with the upper mold dials component, described
Second lifting assembly is installed on the one end of the leave from office panel, and the extension end of second lifting assembly is connected to the lower die
Dials component, the test lower die are installed on the another side of the leave from office panel and electrically connect with the lower die dials component
It connects.
Specifically, the upper mold dials component include the test upper mould fixed plate being cascading along the vertical direction, on
Mould dials mounting plate and upper mold dials, the test upper mould fixed plate are connected to the extension end of first lifting assembly, institute
It states upper mold dials mounting plate to be installed in the test upper mould fixed plate, the upper mold dials is in the test upper mould fixed plate edge
It is inserted in when vertical direction moves down in the upper mold dials mounting plate, the upper mold dials is located at the one of the drop front
End side, the test upper mold are located at the another side of the drop front and opposite with the upper mold dials.
Further, the test device for testing of printed circuit board further includes dials locking assembly on two, two institutes
The opposite sides that dials locking assembly is set on the drop front and is distributed in the upper mold dials respectively is stated, described in two
Upper dials locking assembly is moved together to bear against in the opposite sides of the upper mold dials in horizontal direction.
Specifically, second lifting assembly includes lower die lifting cylinder and is connected to stretching for the lower die lifting cylinder
The lower die lifter plate of outlet, the lower die dials component are installed on the lower die lifter plate and are located at the one of the leave from office panel
End side, the test lower die are located at the another side of the leave from office panel.
Further, the test dress for testing of printed circuit board further includes four lower die locking assemblies, every two
The lower die locking assembly is one group and is respectively arranged on the opposite sides for testing lower die, also, each lower die locking assembly
The test lower die is arranged in when moving along the vertical direction.
Further, the test device for testing of printed circuit board further includes four lower dials locking assemblies, and every two
A lower dials locking assembly is one group of opposite sides for being respectively arranged on the lower die dials component, each lower dials locking
Component is moved together to bear against in the opposite sides of the lower die dials component in horizontal direction.
Specifically, the press lathe further includes multiple limit guide posts, and each limit guide post is successively arranged on described
Deck plate, the drop front and the leave from office panel.
Specifically, the test device for testing of printed circuit board further includes upper fuselage, lower fuselage and control plane
Plate, the upper body cover are set to the panel of appearing on the stage, and the lower body cover is set to the leave from office panel, and the control panel is set to
On the lower fuselage.
Beneficial effects of the present invention: the test device for testing of printed circuit board of offer of the invention, it is worked
Journey is as follows: when load is tested, the first lifting assembly pushes upper mold dials component in the vertical direction and is fixed on drop front
One end, and the another side that upper mold is then mounted on drop front is tested, and be connected to each other with upper mold dials component and realize electrical property
Connection；Meanwhile second lifting assembly push lower die dials component in the vertical direction and be fixed on the one end of leave from office panel, and
Test lower die is then mounted on the another side of leave from office panel, and is connected to each other with upper mold dials component and realizes electrical communication, at this point,
It tests upper mold and test lower die is opposite in the vertical direction and interval is arranged, printed circuit board to be tested is placed under test
On mould, when test upper mold is moved to above test lower die with drop front under the drive of the first lifting assembly, closure is utilized
The test upper mold of state tests printed circuit board with test lower die.Test process uses monoblock type dials and testing mould
It is mechanically docked, time-consuming caused by avoiding because of use manual type docking, the error-prone problem of wiring.Greatly mention
High testing efficiency.
Detailed description of the invention
It to describe the technical solutions in the embodiments of the present invention more clearly, below will be to embodiment or description of the prior art
Needed in attached drawing be briefly described, it should be apparent that, the accompanying drawings in the following description is only of the invention some
Embodiment for those of ordinary skill in the art without any creative labor, can also be according to these
Attached drawing obtains other attached drawings.
Fig. 1 is the structural schematic diagram of the test device provided in an embodiment of the present invention for testing of printed circuit board；
Fig. 2 is that the structure of another angle of the test device provided in an embodiment of the present invention for testing of printed circuit board is shown
It is intended to；
Fig. 3 is that the structure of the another angle of the test device provided in an embodiment of the present invention for testing of printed circuit board is shown
It is intended to.
Wherein, each appended drawing reference in figure:
| Testing mould | 100 | Test upper mould fixed plate | 111 |
| Press rack | 101 | Upper mold dials mounting plate | 112 |
| First lifting assembly | 102 | Upper mold dials | 113 |
| Second lifting assembly | 103 | Upper dials locking assembly | 114 |
| Upper mold dials component | 104 | Lower die lifting cylinder | 115 |
| Lower die dials component | 105 | Lower die lifter plate | 116 |
| Test upper mold | 106 | Lower die locking assembly | 117 |
| Test lower die | 107 | Lower dials locking assembly | 118 |
| It appears on the stage panel | 108 | Limit guide post | 119 |
| Leave from office panel | 109 | Upper fuselage | 120 |
| Drop front | 110 | Lower fuselage | 121 |
| Control panel | 122 |
Specific embodiment
The embodiment of the present invention is described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning to end
Same or similar label indicates same or similar element or element with the same or similar functions.Below with reference to attached
The embodiment of figure description is exemplary, it is intended to is used to explain the present invention, and is not considered as limiting the invention.
In the description of the present invention, it is to be understood that, term " length ", " width ", "upper", "lower", "front", "rear",
The orientation or positional relationship of the instructions such as "left", "right", "vertical", "horizontal", "top", "bottom" "inner", "outside" is based on attached drawing institute
The orientation or positional relationship shown, is merely for convenience of description of the present invention and simplification of the description, rather than the dress of indication or suggestion meaning
It sets or element must have a particular orientation, be constructed and operated in a specific orientation, therefore should not be understood as to limit of the invention
System.
In addition, term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance
Or implicitly indicate the quantity of indicated technical characteristic.Define " first " as a result, the feature of " second " can be expressed or
Implicitly include one or more of the features.In the description of the present invention, the meaning of " plurality " is two or more,
Unless otherwise specifically defined.
In the present invention unless specifically defined or limited otherwise, term " installation ", " connected ", " connection ", " fixation " etc.
Term shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integral；It can be mechanical connect
It connects, is also possible to be electrically connected；It can be directly connected, can also can be in two elements indirectly connected through an intermediary
The interaction relationship of the connection in portion or two elements.It for the ordinary skill in the art, can be according to specific feelings
Condition understands the concrete meaning of above-mentioned term in the present invention.
Fig. 1 and Fig. 2, the test device provided in an embodiment of the present invention for testing of printed circuit board are please referred to, including is surveyed
Test die 100, press rack 101, the first lifting assembly 102, the second lifting assembly 103, upper mold dials component 104 and lower die
Dials component 105.Testing mould 100 includes the test upper mold 106 being oppositely arranged up and down and test lower die 107, press rack 102
Including panel 108 of appearing on the stage, leave from office panel 109 and in the drop front moved between panel 108 and leave from office panel 109 of appearing on the stage
110, panel 108 of appearing on the stage is vertically stacked and is spaced setting with leave from office panel 109, and the first lifting assembly 102 is installed on
Deck plate 108, also, the extension end of the first lifting assembly 102 is connected to upper mold dials component 104, and upper mold dials component 104 is pacified
One end loaded on drop front 110, test upper mold 106 be installed on drop front 110 another side and with upper mold dials group
Part 104 is electrically connected, and the second lifting assembly 103 is installed on the one end of leave from office panel 109, the stretching of the second lifting assembly 103
End is connected to lower die dials component 105, test lower die 107 be installed on the another side of leave from office panel 109 and with lower die dials group
Part 105 is electrically connected.
Test device provided in an embodiment of the present invention for testing of printed circuit board, the course of work are as follows: load is surveyed
When examination, the first lifting assembly 102 pushes upper mold dials component 104 in the vertical direction and is fixed on one end of drop front 110
Side, and the another side that upper mold 106 is then mounted on drop front 110 is tested, and be connected to each other and realize with upper mold dials component 104
Electrical communication；Meanwhile second lifting assembly 103 push lower die dials component 105 in the vertical direction and be fixed on leave from office panel
109 one end, and test the another side that lower die 107 is then mounted on leave from office panel 109, and with 104 phase of upper mold dials component
It docks and realizes electrical communication, at this point, test upper mold 106 is opposite in the vertical direction with test lower die 107 and interval is arranged, by
Printed circuit board to be tested is placed in test lower die 107, when test upper mold 106 is under the drive of the first lifting assembly 102
It is right using the test upper mold 106 and test lower die 107 of closed state when being moved to test 107 top of lower die with drop front 110
Printed circuit board is tested.Test process is mechanically docked using monoblock type dials with testing mould 100, is avoided because adopting
Manually mode dock caused by time-consuming, the error-prone problem of wiring.Greatly increase testing efficiency.
Specifically, Fig. 1 and Fig. 2 are please referred to, in the present embodiment, upper mold dials component 104 includes along the vertical direction successively
Test upper mould fixed plate 111, upper mold dials mounting plate 112 and the upper mold dials 113 being stacked, wherein test upper mold peace
Loading board 111, which is realized, plays connection function to test upper mold 106 and the first lifting assembly 102, and upper mold dials 113 is then by plugging mode
It is fixed on upper mold dials mounting plate 112.Test upper mould fixed plate 111 is connected to the extension end of the first lifting assembly 102, upper mold
Dials mounting plate 112 is installed in test upper mould fixed plate 111, and upper mold dials 113 is in test upper mould fixed plate 111 along vertical side
To being inserted in upper mold dials mounting plate 112 when moving down, upper mold dials 113 is located at the one end of drop front 110, test
Upper mold position 106 in drop front 110 another side and with upper mold dials 113 it is opposite.In this way, according to the difference of test object,
While replacing testing mould, upper mold dials can also be replaced, to provide the versatility of its test.
Further, Fig. 1 and Fig. 2 are please referred to, in the present embodiment, the test device for testing of printed circuit board is also wrapped
Dials locking assembly 114 on two is included, dials locking assembly 114 is set on drop front 110 and is distributed in upper mold respectively on two
The opposite sides of dials 113, dials locking assembly 114 is moved together to bear against in upper mold dials in horizontal direction on two
113 opposite sides.It is to be appreciated that the effect limit upper mold dials 113 of upper dials locking assembly 114 is in the horizontal direction certainly
By spending, avoid during the test, upper mold dials 113 moves in the horizontal direction, influences test result.
Specifically, Fig. 1 and Fig. 2 are please referred to, in the present embodiment, the second lifting assembly 103 includes lower die lifting cylinder 115
And it is connected to the lower die lifter plate 116 of the extension end of lower die lifting cylinder 115, lower die dials component 105 is installed on lower die liter
The one end of leave from office panel 109 drops on plate 116 and is located at, and test lower die 107 is located at the another side of leave from office panel 109.It can be with
Understand ground, provide power using lower die lifting cylinder 115, lower die dials component 105 is pushed electrically connect with test lower die 107
It connects, meanwhile, meet removable property, improves the versatility of test.
Specifically, Fig. 1 and Fig. 2 are please referred to, in the present embodiment, the test dress for testing of printed circuit board further includes four
A lower die locking assembly 117, every two lower die locking assembly 117 are one group of opposite sides for being respectively arranged on test lower die 107, and
And each lower die locking assembly 117 is arranged in test lower die 107 when moving along the vertical direction.It is to be appreciated that lower die locking group
Part 117 can be L-shaped adjustable bolt, by screw screw realize locking.In this way, lower die locking assembly 117 will test
Lower die 107 is fixed on leave from office panel 109.
Specifically, Fig. 1 and Fig. 2 are please referred to, in the present embodiment, the test device for testing of printed circuit board further includes
Four play dials locking assemblies 118, and dials locking assembly 108 is one group of phase for being respectively arranged on lower die dials component 105 under every two
To two sides, each lower dials locking assembly 108 is moved together to bear against in the opposite of lower die dials component 105 in horizontal direction
Two sides.Similarly, the freedom degree in the horizontal direction of lower die dials component 105 is limited using lower dials locking assembly 117, avoids it
It shifts during the test, influences test result.
Specifically, referring to FIG. 1, in the present embodiment, press lathe further includes multiple limit guide posts 119, each limit is led
Column 119 is successively arranged in panel 108 of appearing on the stage, drop front 110 and leave from office panel 109.Here, each limit guide post 119 is utilized
Drop front 110 is oriented to, it is ensured that it is in the moving stability between panel 108 and leave from office panel 109 of appearing on the stage.
Further, referring to FIG. 3, in the present embodiment, the test device for testing of printed circuit board further includes
Fuselage 120, lower fuselage 121 and control panel 122, upper fuselage 120 are covered on panel 108 of appearing on the stage, and lower fuselage 121 is covered on down
Deck plate 109, control panel 122 are set on lower fuselage 121.Upper fuselage 120 and lower fuselage 121 play the role of protective shell.
And specific instruction output is realized by control panel 122.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.
Claims (8)
1. a kind of test device for testing of printed circuit board, it is characterised in that: including testing mould, press rack, first
Lifting assembly, the second lifting assembly, upper mold dials component and lower die dials component, the testing mould include opposite up and down set
The test upper mold set and test lower die, press rack include appear on the stage panel, leave from office panel and in it is described appear on the stage panel with it is described
The drop front moved between leave from office panel, the panel of appearing on the stage, which is vertically stacked and is spaced with the leave from office panel, to be set
Set, first lifting assembly is installed on the panel of appearing on the stage, also, the extension end of first lifting assembly be connected to it is described
Upper mold dials component, the upper mold dials component are installed on the one end of the drop front, and the test upper mold is installed on institute
State the another side of drop front and with the upper mold dials component be electrically connected, second lifting assembly be installed on it is described under
The one end of deck plate, the extension end of second lifting assembly are connected to the lower die dials component, the test lower die peace
Another side loaded on the leave from office panel and with the lower die dials component be electrically connected.
2. the test device according to claim 1 for testing of printed circuit board, it is characterised in that: the upper mold dials
Component includes the test upper mould fixed plate being cascading along the vertical direction, upper mold dials mounting plate and upper mold dials, institute
The extension end that test upper mould fixed plate is connected to first lifting assembly is stated, the upper mold dials mounting plate is installed on the survey
It tries in upper mould fixed plate, the upper mold dials is inserted in described when the test upper mould fixed plate moves vertically downwards
In upper mold dials mounting plate, the upper mold dials is located at the one end of the drop front, and the test upper mold is located at the work
The another side of dynamic panel and opposite with the upper mold dials.
3. the test device according to claim 2 for testing of printed circuit board, it is characterised in that: described for testing
The test device of printed circuit board further includes dials locking assembly on two, and the two upper dials locking assemblies are set to the activity
It is distributed in the opposite sides of the upper mold dials on panel and respectively, the two upper dials locking assemblies are moved in opposite directions in horizontal direction
It moves to bear against in the opposite sides of the upper mold dials.
4. the test device according to claim 1 for testing of printed circuit board, it is characterised in that: second lifting
Component include lower die lifting cylinder and be connected to the lower die lifting cylinder extension end lower die lifter plate, the lower die needle
Disk component is installed on the lower die lifter plate and is located at the one end of the leave from office panel, and the test lower die is under described
The another side of deck plate.
5. the test device according to claim 4 for testing of printed circuit board, it is characterised in that: described for testing
The test dress of printed circuit board further includes four lower die locking assemblies, and lower die locking assembly described in every two is one group and is respectively arranged on
The opposite sides of the test lower die, also, each lower die locking assembly is arranged in the survey when moving along the vertical direction
Try lower die.
6. the test device according to claim 4 for testing of printed circuit board, it is characterised in that: described for testing
The test device of printed circuit board further includes four lower dials locking assemblies, and lower dials locking assembly described in every two is one group of difference
Set on the opposite sides of the lower die dials component, each lower dials locking assembly is moved together to support respectively in horizontal direction
It is against the opposite sides of the lower die dials component.
7. the test device according to any one of claims 1 to 6 for testing of printed circuit board, it is characterised in that: institute
Stating press lathe further includes multiple limit guide posts, and each limit guide post is successively arranged in the appear on the stage panel, the active face
Plate and the leave from office panel.
8. according to claim 1 to any one of 6 test devices for testing of printed circuit board, feature exists
In: the test device for testing of printed circuit board further includes upper fuselage, lower fuselage and control panel, the upper fuselage
It is covered on the panel of appearing on the stage, the lower body cover is set to the leave from office panel, and the control panel is set on the lower fuselage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910221948.2A CN109901053A (en) | 2019-03-22 | 2019-03-22 | Test device for testing of printed circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910221948.2A CN109901053A (en) | 2019-03-22 | 2019-03-22 | Test device for testing of printed circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109901053A true CN109901053A (en) | 2019-06-18 |
Family
ID=66952356
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910221948.2A Pending CN109901053A (en) | 2019-03-22 | 2019-03-22 | Test device for testing of printed circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109901053A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111024989A (en) * | 2019-11-16 | 2020-04-17 | 江西福昌发电路科技有限公司 | Improved generation HDI circuit board high efficiency test needle bed |
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| CN1251425A (en) * | 1998-10-13 | 2000-04-26 | 三星电子株式会社 | Combined testing system and testing method using same |
| KR20020097446A (en) * | 2001-06-21 | 2002-12-31 | 에버테크노 주식회사 | Printed Circuit Board Rom Writing and Function Testing System |
| CN206505102U (en) * | 2017-02-24 | 2017-09-19 | 珠海快捷中祺电子科技有限公司 | A kind of PCB electrical testings composite fixture |
| CN206960607U (en) * | 2017-07-17 | 2018-02-02 | 江苏创源电子有限公司 | A kind of circuit board testing device |
| CN207380202U (en) * | 2017-11-17 | 2018-05-18 | 东莞市龙鸿电子设备有限公司 | One kind can portable detection device |
| CN207717926U (en) * | 2017-12-14 | 2018-08-10 | 深圳市视显光电技术有限公司 | Pcb board burning test device |
| CN209728122U (en) * | 2019-03-22 | 2019-12-03 | 深圳市新永安电子有限公司 | Test device for testing of printed circuit board |
-
2019
- 2019-03-22 CN CN201910221948.2A patent/CN109901053A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1251425A (en) * | 1998-10-13 | 2000-04-26 | 三星电子株式会社 | Combined testing system and testing method using same |
| KR20020097446A (en) * | 2001-06-21 | 2002-12-31 | 에버테크노 주식회사 | Printed Circuit Board Rom Writing and Function Testing System |
| CN206505102U (en) * | 2017-02-24 | 2017-09-19 | 珠海快捷中祺电子科技有限公司 | A kind of PCB electrical testings composite fixture |
| CN206960607U (en) * | 2017-07-17 | 2018-02-02 | 江苏创源电子有限公司 | A kind of circuit board testing device |
| CN207380202U (en) * | 2017-11-17 | 2018-05-18 | 东莞市龙鸿电子设备有限公司 | One kind can portable detection device |
| CN207717926U (en) * | 2017-12-14 | 2018-08-10 | 深圳市视显光电技术有限公司 | Pcb board burning test device |
| CN209728122U (en) * | 2019-03-22 | 2019-12-03 | 深圳市新永安电子有限公司 | Test device for testing of printed circuit board |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111024989A (en) * | 2019-11-16 | 2020-04-17 | 江西福昌发电路科技有限公司 | Improved generation HDI circuit board high efficiency test needle bed |
| CN111024989B (en) * | 2019-11-16 | 2021-10-29 | 江西福昌发电路科技有限公司 | Improved generation HDI circuit board high efficiency test needle bed |
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