CN109853036A - A kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip - Google Patents

A kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip Download PDF

Info

Publication number
CN109853036A
CN109853036A CN201910164295.9A CN201910164295A CN109853036A CN 109853036 A CN109853036 A CN 109853036A CN 201910164295 A CN201910164295 A CN 201910164295A CN 109853036 A CN109853036 A CN 109853036A
Authority
CN
China
Prior art keywords
buddha
polysilicon chip
wire cutting
warrior attendant
silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910164295.9A
Other languages
Chinese (zh)
Inventor
陈玉伟
唐惠东
陈小卉
李龙珠
杨蓉
徐立波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Changzhou Vocational Institute of Engineering
Original Assignee
Changzhou Vocational Institute of Engineering
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Changzhou Vocational Institute of Engineering filed Critical Changzhou Vocational Institute of Engineering
Priority to CN201910164295.9A priority Critical patent/CN109853036A/en
Publication of CN109853036A publication Critical patent/CN109853036A/en
Pending legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Silicon Compounds (AREA)

Abstract

The invention discloses a kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip, the further perfect technique that black silicon is prepared using wet etching selects Fe when preparing black silicon2+Ion, rather than the noble metals such as gold used in conventional wet etch process, platinum or silver, preparation cost are substantially reduced;Use Fe2+Compared to using the noble metals such as gold, platinum or silver that will not cause serious environmental pollution;The black silicon reflectivity of preparation is low, and performance is stablized;This method provides a new route to improve crystal silicon solar energy battery efficiency and reducing production cost, has good economic benefits.

Description

A kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip
Technical field
The present invention relates to solar cell material technical fields, and in particular to a kind of making herbs into wool of Buddha's warrior attendant wire cutting polysilicon chip Method.
Background technique
The traditional energies such as coal, petroleum, natural gas not only have it is non-renewable, long-time service also result in serious ring Border pollution problem, moment threaten the health of the mankind.Therefore, renewable energy has been to be concerned by more and more people, solar energy conduct Important green energy resource becomes one of research hotspot in recent years, wherein crystal silicon battery is currently the only depth industrialization again A kind of solar battery.
Currently, the cost of electricity-generating of crystal silicon battery is still higher than traditional coal power generation, in order to reduce its cost of electricity-generating, need into one Step optimizes its production technology, reduces production cost and make great efforts to improve its photoelectric efficiency.Improve crystal silicon battery photoelectric conversion efficiency There are many methods, but the factors such as considering cost, efficiency, can be used for realizing the technique of large-scale production and few.
Silicon wafer used in conventional crystalline silicon cell piece mainly uses free abrasive cutting method to prepare, the letter though this method operates Singly, conveniently, but more serious problem of environmental pollution can be brought when waste mortar is cut in processing, meanwhile, this method was implemented Silicon loss in journey is big and cutting speed is slower.In order to further decrease silicon wafer cutting cost, introduces fixed abrasive diamond wire and cut It cuts, though this method compensates for the defects of free abrasive cutting method cutting speed is slow, mortar processing is difficult, silicon loss is high, gold The polysilicon chip surface damage layer of rigid wire cutting is shallower, this will lead to later period silicon wafer and is difficult to reduce reflection by conventional etching method Rate.
The principle of the polycrystalline silicon texturing technology of industrialization is to etch silicon substrate by acid solution to be formed on its surface The suede structure of micron order worm hole shape, silicon wafer average reflectance are reduced to 23% or so by 40% or so, and reflectivity is still very Greatly, in order to further increase the efficiency of polycrystal silicon cell, need to be further reduced the reflectivity on its surface.
In order to solve the problems, such as the making herbs into wool of silicon wafer cut by diamond wire while reducing polysilicon chip reflectivity, researcher draws Into black silicon technology.So-called black silicon is exactly to prepare one layer of nanometer-scale texture extremely low with high light absorptive, reflectivity in silicon chip surface Structure.In the prior art, mainly there are two kinds of dry and wet about the preparation method of black silicon.Dry method is mainly that plasma is carved Erosion, uses fluoro-gas to corrode at low pressure to silicon chip surface, and that there are production efficiencys is low for this method, equipment cost is high The disadvantages of.And wet etching is mainly corroded under metallic catalyst assistance, this method is simple with apparatus, operates It reacted under easy, at low cost, room temperature, be easy to implement the features such as large-scale production, therefore this method becomes black silicon technology in recent years The research hotspot in field.But this kind of method is also perfectly not, and in practical application, there is also some defects, such as production process In need to add noble metal, the addition one side of such as metal ion of gold, platinum, silver, noble metal increases production cost, another party Face also brings along problem of environmental pollution.
Therefore, noble metal can be substituted by finding one kind, while the method that can guarantee black silicon making herbs into wool quality again, it will be brought aobvious The economic benefit of work.
Summary of the invention
It is an object of the invention to solve deficiency in the prior art, a kind of making herbs into wool of Buddha's warrior attendant wire cutting polysilicon chip is provided Method provides a new technical support to improve crystal silicon solar energy battery efficiency and reducing production cost, further complete It has been apt to prepare the technique of black silicon using wet etching, it is with good economic efficiency.
The technical solution of the present invention is as follows: providing a kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip, comprising the following steps:
(1) Buddha's warrior attendant wire cutting polysilicon chip is placed in containing H2O2With prerinse is carried out in the aqueous solution of ethyl alcohol;
(2) by aqueous solution of the silicon wafer merging containing 2~8wt%HF, 5~10min is stood, by the SiO of silicon chip surface2It is molten Solution, solution temperature are 15~50 DEG C;
(3) it prepares and contains Fe2+、H2O2With the aqueous solution of HF;
(4) by the solution prepared through step 1 treated silicon wafer merging step 3, nanometer is obtained on polysilicon chip surface The black silicon flannelette of grade;
(5) will through step 4, treated that polysilicon chip is placed in hydrochloric acid solution, remove the Fe of silicon chip surface2+Ion;
(6) deionized water cleaning silicon chip is used, then by silicon wafer blow-drying.
Further, H in the step 12O2Concentration is 2~10wt%, and concentration of alcohol is 5~10wt%, aqueous temperature It is 40~70 DEG C, scavenging period is 1~5min.
Further, in the solution that step 3 is prepared, Fe2+、H2O2Concentration with HF be respectively 0.05~1mol/L, 1~ 3mol/L and 2~8mol/L.
Further, reaction solution temperature is 20~50 DEG C in step 4,1~5min of reaction time.
Further, the concentration of hydrochloric acid is 2~5mol/L in step 5, and solution temperature is 20~40 DEG C.
Further, in the solution that step 3 is prepared, Fe2+Source includes ferrous sulfate, frerrous chloride, ferrous acetate, carbonic acid Ferrous iron, ferrous nitrate, potassium ferrocyanide and ferrous sulfide.
The invention has the benefit that
(1) present invention selects Fe when preparing black silicon2+Ion, rather than gold used in conventional wet etch process, platinum or The noble metals such as silver, preparation cost are substantially reduced;
(2) compared to problem of environmental pollution brought by the noble metals such as gold, platinum or silver is used, Fe is used2+It not will cause tight The environmental pollution of weight;
(3) conventional wet etch process generallys use concentrated nitric acid removal silicon chip surface noble metal, and the present invention only needs to use Low-concentration hcl removes silicon chip surface iron ion, and preparation method is more simple;
(4) the black silicon that through the invention prepared by published method, reflectivity is low, and performance is stablized.
Detailed description of the invention
Fig. 1 is black silicon sample figure prepared by the embodiment of the present invention 1;
Fig. 2 is black silicon reflectivity map prepared by the embodiment of the present invention 1.
Specific embodiment
Following embodiment further illustrates the contents of the present invention, but should not be construed as limiting the invention.Without departing substantially from In the case where essence of the present invention, to modification made by the method for the present invention, step or condition and replaces, belong to model of the invention It encloses.
Involved correlated response principle is as follows in the embodiment of the present invention:
Fe is selected when preparing black silicon process2+Ion, it is main in the process to occur to react as shown in formula (1) and (2), and OH has There is 2.72eV oxidation potential, there is stronger oxidisability, understand reaction shown in generating polynomial (3) later, silica exists in hydrofluoric acid In the case of, it can then reaction shown in generating polynomial (4).
Fe2++H2O2→Fe3++·OH+OHˉ (1)
Fe3++H2O2→Fe2++·OH+H+ (2)
Si+4·OH→SiO2+2H2O (3)
SiO2+6HF→H2SiF6+H2O (4)
Embodiment 1:
(1) Buddha's warrior attendant wire cutting polysilicon chip is placed in containing H2O2With prerinse is carried out in the aqueous solution of ethyl alcohol, wherein H2O2It is dense Degree is 5wt%, and concentration of alcohol 8wt%, aqueous temperature is 60 DEG C, scavenging period 3min;
(2) silicon wafer is placed in the aqueous solution containing 5wt%HF, 8min is stood, by the SiO of silicon chip surface2Dissolution, solution temperature Degree is 30 DEG C;
(3) it prepares and contains Fe2+、H2O2With the aqueous solution of HF, three's concentration is respectively 0.5mol/L, 2mol/L and 6mol/L;
(4) by the solution prepared through the processed silicon wafer merging step 3 of step 2, solution temperature is 40 DEG C, the time 3min obtains the black silicon flannelette of nanoscale on polysilicon chip surface;
(5) it by through step 4, treated that polysilicon chip is placed in the aqueous hydrochloric acid solution of 4mol/L, 30 DEG C of solution temperature, goes Except silicon chip surface Fe2+Ion;
(6) deionized water cleaning silicon chip is used, then by silicon wafer blow-drying.
Embodiment 2:
(1) Buddha's warrior attendant wire cutting polysilicon chip is placed in containing H2O2With prerinse is carried out in ethanol water, wherein H2O2Concentration For 2wt%, concentration of alcohol 5wt%, aqueous temperature is 40 DEG C, scavenging period 1min;
(2) silicon wafer is placed in the aqueous solution containing 2wt%HF, 5min is stood, by the SiO of silicon chip surface2Dissolution, solution temperature Degree is 15 DEG C;
(3) it prepares and contains Fe2+、H2O2With the aqueous solution of HF, three's concentration is respectively 0.05mol/L, 1mol/L and 2mol/L;
(4) by the solution prepared through the processed silicon wafer merging step 3 of step 2, solution temperature is 20 DEG C, the time 1min obtains the black silicon flannelette of nanoscale on polysilicon chip surface;
(5) will through step 4, treated that polysilicon chip is placed in 2mol/L aqueous hydrochloric acid solution, 20 DEG C of solution temperature, removal Silicon chip surface Fe2+Ion;
(6) deionized water cleaning silicon chip is used, then by silicon wafer blow-drying.
Embodiment 3:
(1) Buddha's warrior attendant wire cutting polysilicon chip is placed in containing H2O2With prerinse is carried out in ethanol water, wherein H2O2Concentration For 10wt%, concentration of alcohol 10wt%, aqueous temperature is 70 DEG C, scavenging period 5min;
(2) silicon wafer is placed in the aqueous solution containing 8wt%HF, 10min is stood, by the SiO of silicon chip surface2Dissolution, solution Temperature is 50 DEG C;
(3) it prepares and contains Fe2+、H2O2With the aqueous solution of HF, three's concentration is respectively 1mol/L, 3mol/L and 8mol/L;
(4) by the solution prepared through the processed silicon wafer merging step 3 of step 2, solution temperature is 50 DEG C, the time 5min obtains the black silicon flannelette of nanoscale on polysilicon chip surface;
(5) will through step 4, treated that polysilicon chip is placed in 5mol/L aqueous hydrochloric acid solution, 40 DEG C of solution temperature, removal Silicon chip surface Fe2+Ion;
(6) deionized water cleaning silicon chip is used, then by silicon wafer blow-drying.
Embodiment 4:
(1) Buddha's warrior attendant wire cutting polysilicon chip is placed in containing H2O2With prerinse is carried out in ethanol water, wherein H2O2Concentration For 2wt%, concentration of alcohol 10wt%, aqueous temperature is 40 DEG C, scavenging period 2min;
(2) silicon wafer is placed in the aqueous solution containing 8wt%HF, 5min is stood, by the SiO of silicon chip surface2Dissolution, solution temperature Degree is 50 DEG C;
(3) it prepares and contains Fe2+、H2O2With the aqueous solution of HF, three's concentration is respectively 0.1mol/L, 2mol/L and 8mol/L;
(4) by the solution prepared through the processed silicon wafer merging step 3 of step 2, solution temperature is 20 DEG C, the time 5min obtains the black silicon flannelette of nanoscale on polysilicon chip surface;
(5) will through step 4, treated that polysilicon chip is placed in 2mol/L aqueous hydrochloric acid solution, 40 DEG C of solution temperature, removal Silicon chip surface Fe2+Ion;
(6) deionized water cleaning silicon chip is used, then by silicon wafer blow-drying.
Basic principles and main features and advantage of the invention have been shown and described above.But the foregoing is merely this hairs Bright specific embodiment, technical characteristic of the invention are not limited thereto, and any those skilled in the art is not departing from this hair The other embodiments obtained under bright technical solution should all cover within the scope of the patent of the present invention.

Claims (6)

1. a kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip, which is characterized in that specifically includes the following steps:
(1) Buddha's warrior attendant wire cutting polysilicon chip is placed in containing H2O2With prerinse is carried out in the aqueous solution of ethyl alcohol;
(2) by aqueous solution of the silicon wafer merging containing 2~8wt%HF, 5~10min is stood, by the SiO of silicon chip surface2Dissolution, solution Temperature is 15~50 DEG C;
(3) it prepares and contains Fe2+、H2O2With the aqueous solution of HF;
(4) by the solution prepared through step 1 treated silicon wafer merging step 3, it is black that nanoscale is obtained on polysilicon chip surface Silicon flannelette;
(5) will through step 4, treated that polysilicon chip is placed in hydrochloric acid solution, remove silicon chip surface Fe2+Ion;
(6) deionized water cleaning silicon chip is used, then by silicon wafer blow-drying.
2. a kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip as described in claim 1, which is characterized in that the step 1 Middle H2O2Concentration be 2~10wt%, concentration of alcohol be 5~10wt%, aqueous temperature be 40~70 DEG C, scavenging period be 1~ 5min。
3. a kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip as described in claim 1, which is characterized in that step 3 is prepared Solution in, Fe2+、H2O2Concentration with HF is respectively 0.05~1mol/L, 1~3mol/L and 2~8mol/L.
4. a kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip as described in claim 1, which is characterized in that anti-in step 4 Answering solution temperature is 20~50 DEG C, 1~5min of reaction time.
5. a kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip as described in claim 1, which is characterized in that salt in step 5 The concentration of acid is 2~5mol/L, and solution temperature is 20~40 DEG C.
6. a kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip as described in claim 1, which is characterized in that step 3 is prepared Solution in, Fe2+Source include ferrous sulfate, frerrous chloride, ferrous acetate, ferrous carbonate, ferrous nitrate, potassium ferrocyanide And ferrous sulfide.
CN201910164295.9A 2019-03-05 2019-03-05 A kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip Pending CN109853036A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910164295.9A CN109853036A (en) 2019-03-05 2019-03-05 A kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910164295.9A CN109853036A (en) 2019-03-05 2019-03-05 A kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip

Publications (1)

Publication Number Publication Date
CN109853036A true CN109853036A (en) 2019-06-07

Family

ID=66899919

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910164295.9A Pending CN109853036A (en) 2019-03-05 2019-03-05 A kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip

Country Status (1)

Country Link
CN (1) CN109853036A (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011152973A1 (en) * 2010-06-01 2011-12-08 Asia Union Electronic Chemical Corporation Texturing of multi-crystalline silicon substrates
CN104393114A (en) * 2014-11-17 2015-03-04 中国电子科技集团公司第四十八研究所 Preparation method of polycrystalline black silicon of micro-nano composite suede structure
CN105154982A (en) * 2015-07-08 2015-12-16 中国科学院宁波材料技术与工程研究所 Polycrystalline black silicon texturization treatment fluid, polysilicon chip texturization method applying treatment fluid, and polycrystalline black silicon texturization product
CN106935669A (en) * 2017-05-23 2017-07-07 江苏福吉食品有限公司 A kind of etching method of the diamond wire section black silicon of polycrystalline
CN108281508A (en) * 2018-01-25 2018-07-13 浙江大学 The preparation method of low surface reflectivity Buddha's warrior attendant wire cutting polysilicon chip matte

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011152973A1 (en) * 2010-06-01 2011-12-08 Asia Union Electronic Chemical Corporation Texturing of multi-crystalline silicon substrates
CN104393114A (en) * 2014-11-17 2015-03-04 中国电子科技集团公司第四十八研究所 Preparation method of polycrystalline black silicon of micro-nano composite suede structure
CN105154982A (en) * 2015-07-08 2015-12-16 中国科学院宁波材料技术与工程研究所 Polycrystalline black silicon texturization treatment fluid, polysilicon chip texturization method applying treatment fluid, and polycrystalline black silicon texturization product
CN106935669A (en) * 2017-05-23 2017-07-07 江苏福吉食品有限公司 A kind of etching method of the diamond wire section black silicon of polycrystalline
CN108281508A (en) * 2018-01-25 2018-07-13 浙江大学 The preparation method of low surface reflectivity Buddha's warrior attendant wire cutting polysilicon chip matte

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
张倩等主编: "《普通高等院校环境科学与工程类系列规划教材 水环境化学》", 30 June 2018, 中国建材工业出版社 *

Similar Documents

Publication Publication Date Title
CN104576830B (en) Texturing pretreatment liquid and texturing pretreatment method for diamond wire cutting polycrystalline silicon sheet, texturing pretreatment silicon sheet and application of texturing pretreatment silicon sheet
CN105810761B (en) A kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip
TWI669830B (en) Method for manufacturing local back contact solar cell
CN107268087A (en) A kind of metal catalytic etching method for the polysilicon chip reflectivity for reducing Buddha's warrior attendant wire cutting
CN100583465C (en) Method for preparing silicon solar battery texturing
CN106653889B (en) Woolen-making liquid and its application for ablation of solar cells silicon chip surface
CN104218122B (en) A kind of etching method of the polysilicon emitter rate reducing diamond wire cutting
JPWO2005117138A1 (en) Semiconductor substrate for solar cell, method for producing the same, and solar cell
CN106935669A (en) A kind of etching method of the diamond wire section black silicon of polycrystalline
CN102703989A (en) Monocrystal-like solar battery texturing process
CN105576080A (en) Single-surface texturing method for diamond wire cut polycrystalline silicon wafer, and diamond wire cut polycrystalline silicon wafer with single surface textured
CN101800264A (en) Process for texturing crystalline silicon solar cell by dry etching
CN107039241B (en) A kind of chemical cleavage method of ultra-thin silicon
CN102270702A (en) Rework process for texturing white spot monocrystalline silicon wafer
CN105951184A (en) Texturing method of diamond wire-cut polycrystalline silicon wafer
CN102487105A (en) Method for preparing high efficiency solar cell with stereostructure
CN106340446B (en) A kind of method of wet process removal diamond wire saw polysilicon chip surface line marker
CN109037369B (en) Method for preparing efficient light trapping suede by reactive ion etching
CN104966762A (en) Preparation method of texturized surface structure of crystalline silicon solar cell
CN103904157A (en) Method for making texture surface of silicon wafer
CN107316917A (en) A kind of method for the monocrystalline silicon suede structure for preparing antiradar reflectivity
JP6584571B1 (en) Texturing process of polycrystalline black silicon
CN105826410A (en) Diamond wire cutting trace eliminated polysilicon texturizing method
CN107326383B (en) A kind of cuprous oxide base heterojunction photocathode and preparation method thereof
CN109853036A (en) A kind of etching method of Buddha's warrior attendant wire cutting polysilicon chip

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20190607

RJ01 Rejection of invention patent application after publication