CN109783063A - The Auto-Test System self-check program development approach and device of signal-oriented - Google Patents
The Auto-Test System self-check program development approach and device of signal-oriented Download PDFInfo
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Abstract
The invention discloses the Auto-Test System self-check program development approaches and device of a kind of signal-oriented, the described method comprises the following steps: being layered based on ATML model to signal, and determine the connection relationship of testing station inner port according to the signal after layering；The self-test logic and dynamic adapter line of resource in current system are generated according to signal hierarchical relational；According to self-test logical AND dynamic adapter line, self-check program is generated.The present invention overcomes self-check program is developed towards instrument mode, self-test logical AND self-check program can be automatically generated, development efficiency and reusability is improved and reduces workload, the system of improving can cut expandability.
Description
Technical field
The invention belongs to test macro self-test field more particularly to a kind of Auto-Test System self-check programs of signal-oriented
Development approach and device.
Background technique
Test macro self-test refers to the availability before testing using test macro measured piece to test macro
A kind of inspection carried out.Whether the content of the inspection mainly includes test macro internal tester device and switchgear can normal work
Make, whether the communication between System control computer and test equipment is normal, whether signal connecting line road is intact, pumping signal is defeated
It is whether correct out, whether response signal measurement accurate etc..Test macro function is normally the premise accurately tested measured piece, because
This test macro self-test is one of important and indispensable component links in automatic test.
In automatization test system, the technology that test program (TPS) exploitation uses directly is linked up with test macro performance,
At present there are mainly two types of test program development technique, one is the test program development technique towards instrument, and one is towards letter
Number test program development technique.The core feature of test program development technique towards instrument is surveyed using instrumentation description
Program is tried, and the test program of signal-oriented is to shield specific instrumentation, using the signal category unrelated with specific instrument
Property is developed.
At present test program development scheme it is current there are two types of: it is a kind of one is the test program development scheme towards instrument
It is the test program development scheme of signal-oriented.
The development scheme of self-check program is generallyd use towards instrument mode at present, towards instrument mode development scheme self-test stream
Journey is associated with instrumentation, is not sought unity of standard, and self-check program is portable poor；The design of self-test process, self-check program are opened
It sends out heavy workload and only supports serial exploitation；When resource is cropped in test macro or expands, self-check program even self-test process
It all needs to redesign, develop.Development scheme exploitation self-check program towards instrument is needed by following steps: 1, being according to test
It needs the resource of self-test to collect related data in system and arranges；2, the self checking method of the test macro is designed, and design simultaneously is certainly
It examines adapter (Adapter)；3, the self checking method of design is changed into the self-check program that can be run using certain development scheme；4,
By the self-test adapter developed together with self-check program, with test macro joint debugging；5, according to joint debugging as a result, optimization self checking method with
The design of self-test adapter；6, it repeats step 3 and arrives step 5, until meeting the self-test demand of test macro.
The self-check program of test macro at present is mainly developed in a manner of towards instrument, there is following several disadvantages: 1, needing to open
Hair personnel are familiar with the usage mode of the resources such as instrument, can just design reasonable self-test scheme, consumption high to exploitation personnel requirement
Shi Duo；2, the design of self-test scheme and the exploitation of self-check program can only use serial development scheme, and no fado people concurrent development is opened
Send out low efficiency；3, self-check program is combined by instrumentation and is constituted, and the self-check program that so exploitation is completed is to this test macro
Custom program, it is poor that reusability is poor, development efficiency is low, system can cut expandability；4, developer needs self-test scheme
It is encoded, is converted into self-check program, time-consuming.
The test program development technique of signal-oriented, which refers to, describes test program using signal operation sentence, signal-oriented
Test language includes ATLAS and two kinds of ATML.ATLAS is born in the 1960s, ARINC company, the U.S. in 1962 presides over and opens
Air standard detecting descriptive language ATLAS is sent out, for solving aviation field detecting descriptive language standardization issue.ATLAS tool
It is strong etc. a little there are device independence, expandability, but with the growth of testing requirement, ATLAS also gradually exposes language and gets over
Carry out the disadvantages of more numerous and more jumbled, signal definition is fuzzy, SCC20 sets about improving ATLAS standard thus, thus generates a new generation
Test language --- ATLAS 2000, and 1641 standard of IEEE has been formulated on this basis, the standard is fixed for signal and test
Justice.1641 standard of IEEE solves the standardization issue of test description, also solves the problems, such as instrument interchange, but not can solve
Test program Transplanting Problem.IEEE formulated ATML family of standards since 2002 thus, produced 1671 series mark of IEEE
Standard describes test information using XML language, which is referred to 1641 standard of IEEE, described to be tested by the way of signal
The information such as part (UUT) testing requirement, instrument ability, test description (TestDescription, abbreviation TD).
How for signal-oriented test macro carry out self-check program exploitation, with improve program development efficiency, can
Reusability is that those skilled in the art need the technical issues of urgently solving at present.
Summary of the invention
To overcome above-mentioned the deficiencies in the prior art, the present invention provides a kind of Auto-Test System self-test journeys of signal-oriented
Sequence development approach and device use the shortcomings that developing self-check program scheme towards instrument mode for existing, propose signal-oriented
Develop autotest program method be applied to exploitation self-check program, overcome it is above-mentioned towards instrument mode develop self-check program lack
Point proposes self-test logic, dynamic adapter line and self-check program generation method, realize self-test logical design automation, oneself
The automation of program development is examined, raising development efficiency, raising reusability, reduction workload, raising system can cut extendible
Property.
To achieve the above object, the present invention adopts the following technical scheme:
A kind of Auto-Test System self-check program development approach of signal-oriented, comprising the following steps:
Step 1: signal being layered based on ATML model, and testing station inner port is determined according to the signal after layering
Connection relationship；
Step 2: the self-test logic and dynamic adapter line of resource in current system are generated according to signal hierarchical relational；
Step 3: according to self-test logical AND dynamic adapter line, generating self-check program.
Further, the step 2 further include: judge whether reasonable and dynamic adapter line is self-test logic respectively
No meet demand executes step 3 when self-test logic is reasonable and dynamic adapter line meet demand.
Further, the step 1 specifically includes:
Step 101: extracting the information needed such as signal in ATML model；
Step 102: all signals of extraction being carried out to be divided into three layers, first layer classification foundation is signal type；The second layer
Continue to classify on the basis of first layer, classification foundation is signal kinds；Third layer continues to classify on the basis of the second layer, classification according to
According to being excitation and measuring signal；
Step 103: whether signal meets classification foundation and actual demand after judging layering, the return step if being unsatisfactory for
102 manual amendment's hierarchical signals continue if meeting；
Step 104: being index with signal, using existing ATML model, by line relationship from signal model, instrument mould
It extracts and is connected in type, testing station model, get through testing station Instrumental capable port-instrument port-testing station end
Mouth line；
Step 105: judge testing station interconnector whether meet demand, return step 4 increases according to demand if being unsatisfactory for
Add line relationship, terminates if meeting.
Further, self-test logic is generated in the step 2 to specifically include:
Step 201: the hierarchical signal that input signal hierarchical block generates；
Step 202: according to physical characteristic demand, provide first layer signal with different type self-test sequence and can parallel self-test
Property, and be given under first layer same type signal simultaneously, the self-test sequence of second layer variety classes signal and can parallel self-test,
By arrangement obtain the self-tests of all signals successively with parallel sequence；
Step 203: congener excitation and measuring signal are separately connected in third layer；
Step 204: whether the both ends that certain described excitation of judgement is connect with measuring signal include the signal for needing self-test, if
Both ends do not include, the connection of the 203 deletions excitation and measuring signal that go to step, if all connections have one end to include
Then continue；
Step 205: judging whether signal self-test is successively runed counter to physical characteristic demand with parallel sequence, jumped if runing counter to
To the self-test of step 202 adjustment signal successively with parallel sequence, continue if not runing counter to；
Step 206: generating self-test logic from relationship between the signal that adjustment finishes.
Further, the generation self-test logic includes: according to the instrument capable port-instrument port-testing station end
Mouth line establishes spatial relationship inside testing station；Then it will be built according to signal self-test sequence inside testing station with signal for index
Vertical time relationship, obtains self-test logic.
Further, dynamic adapter line is generated in the step 2 to specifically include:
Step 207: the hierarchical signal that input signal hierarchical block generates；
Step 208: utilizing adapter line generation method, adapter line distribution transform method, obtain dynamic adaptation
Device line；
Step 209: judging whether dynamic adapter line can satisfy each signal for needing self-test and have adapter end
Mouth distributes and adapter port will not be used simultaneously by same signal, manual amendment's dynamic adapter line if being unsatisfactory for, if
Satisfaction then terminates.
Further, the step 3 specifically includes:
Step 301: input self-test logical AND dynamic adapter line obtains complete line relationship；
Step 302: self-check program is generated according to the complete line relationship.
Further, the method also includes steps 4: judging whether self-check program meets self-test demand, if being unsatisfactory for
Self-check program is manually adjusted, is terminated if meeting.
Second purpose according to the present invention, the present invention also provides a kind of Auto-Test System self-check programs of signal-oriented
Development device including memory, processor and stores the computer program that can be run on a memory and on a processor, described
Processor realizes the Auto-Test System self-check program development approach of the signal-oriented when executing described program.
Third purpose according to the present invention, the present invention also provides a kind of computer readable storage mediums, are stored thereon with
Computer program, the program realize the Auto-Test System self-check program exploitation side of the signal-oriented when being executed by processor
Method.Beneficial effects of the present invention
1, it proposes to generate self-test process based on relationship between signal, by the development scheme of self-check program by towards instrument
It is changed into signal-oriented, improves the compatibility and portable, realization concurrent development, raising development efficiency of program；
2, by self-test logic generation module, self-test is patrolled between the signal self-test logic generation method after layering is generated signal
Volume, the resource using modes such as instrument are familiar with without developer, while without designing different self-test processes, effect for not homologous ray
Rate greatly improves, and shortens the development cycle；
3, distributed using adapter line generation method, adapter line by dynamic adapter line generation module
Transform method generates dynamic adapter line, without manually establishing adapter line, improves development efficiency.
4, self-test is generated using code automatic generation method, self-check program generation method by self-check program generation module
Program individually develops self-check program without operator, and efficiency greatly improves.
Detailed description of the invention
The accompanying drawings constituting a part of this application is used to provide further understanding of the present application, and the application's shows
Meaning property embodiment and its explanation are not constituted an undue limitation on the present application for explaining the application.
Fig. 1 is the existing method flow diagram that self-check program is developed using the development scheme towards instrument；
Fig. 2 is the Auto-Test System self-check program development approach flow chart of signal-oriented of the present invention；
Fig. 3 is that signal of the present invention is layered flow chart；
Fig. 4 is self-test logic product process figure of the present invention；
Fig. 5 is dynamic adapter line product process figure of the present invention；
Fig. 6 is self-check program product process figure of the present invention.
Specific embodiment
It is noted that following detailed description is all illustrative, it is intended to provide further instruction to the application.Unless another
It indicates, all technical and scientific terms used herein has usual with the application person of an ordinary skill in the technical field
The identical meanings of understanding.
It should be noted that term used herein above is merely to describe specific embodiment, and be not intended to restricted root
According to the illustrative embodiments of the application.As used herein, unless the context clearly indicates otherwise, otherwise singular
Also it is intended to include plural form, additionally, it should be understood that, when in the present specification using term "comprising" and/or " packet
Include " when, indicate existing characteristics, step, operation, device, component and/or their combination.
In the absence of conflict, the features in the embodiments and the embodiments of the present application can be combined with each other.
General thought proposed by the present invention: core of the invention is made of four parts, first part using hierarchical signal as
Basis generates self-test process, by the development scheme of self-check program by being signal-oriented towards instrument, inherits signal-oriented and opens
The advantages of sending out test program, and signal is layered, classification processing；Second part is incited somebody to action by self-test logic generation module
Signal after layering passes through self-test logic between Signal Matching method, self-test logic generation method generation signal；Part III is logical
Dynamic adapter line generation module is crossed, using adapter line generation method, adapter line distribution transform method, is generated
Dynamic adapter line；Part IV is to utilize code automatic generation method, self-check program life by self-check program generation module
At method, self-check program is generated.
Embodiment one
Present embodiment discloses a kind of Auto-Test System self-check program development approaches of signal-oriented, as shown in Fig. 2, packet
Include following steps:
Step 1: signal being layered based on ATML model, and testing station inner port is determined according to the signal after layering
Connection relationship；
Step 2: the self-test logic and dynamic adapter line of resource in current system are generated according to signal hierarchical relational, and
Judge respectively self-test logic whether rationally and dynamic adapter line whether meet demand, when self-test logic rationally and dynamic is suitable
When orchestration line meet demand, perform the next step；
Step 3: according to self-test logical AND dynamic adapter line, generating self-check program；
Step 4: judging whether self-check program meets self-test demand, self-check program is manually adjusted if being unsatisfactory for, if meeting
Then terminate.
As described in Figure 3, the step 1 specifically includes:
Step 101: extracting the information needed such as signal in ATML model；
Step 102: all signals of extraction being carried out to be divided into three layers, first layer classification foundation is signal type, such as greatly
Electric current, high frequency, bus signals etc. are distinguished with required connector species and cable type；The second layer continues on the basis of first layer
Classification, classification foundation is the concrete signals such as signal kinds, such as DC_SIGNAL, AC_POWER；Third layer is on the basis of the second layer
Continue to classify, classification foundation is excitation and measuring signal；
Step 103: whether signal meets classification foundation and actual demand after judging layering, the return step if being unsatisfactory for
102 manual amendment's hierarchical signals continue if meeting；
Step 104: being index with signal, using existing ATML model, by line relationship from signal model, instrument mould
It extracts and is connected in type, testing station model, get through testing station Instrumental capable port-instrument port-testing station end
Mouth line；
Step 105: judge testing station interconnector whether meet demand, return step 4 increases according to demand if being unsatisfactory for
Add line relationship, terminates if meeting.
Wherein ATML model is made of signal library model, instrument models, testing station model, adaptor model: 1) signal library
Including STDBSCLib (BSC layers of 1641 standard of IEEE), STDTSFLib (TSF layers of 1641 standard of IEEE) and customized signal
Library in customized signal library is composed of the signal in baseband signal library；2) instrument models include the essential information of instrument
(including verbal description, program-controlled address etc.), instrument ability, tool interface system information (port and connector), instrument capabilities map (instrument
The corresponding relationship of device ability and port), instrument drivers (instrument driving and signal drive), connector information；3) testing station
Model includes testing station essential information, the instrument for constituting testing station, testing station interface message (port and connector), testing station company
Line (instrument port and testing station port connection relationship), connector information；4) adaptor model includes adapter essential information, fits
Orchestration interface message (port and connector).
It is specifically included as shown in figure 4, generating self-test logic in the step 2:
Step 201: the hierarchical signal that input signal hierarchical block generates；
Step 202: according to physical characteristic demand, provide first layer signal with different type self-test sequence and can parallel self-test
Property, and be given under first layer same type signal simultaneously, the self-test sequence of second layer variety classes signal and can parallel self-test,
By arrangement obtain the self-tests of all signals successively with parallel sequence；
Step 203: congener excitation and measuring signal are separately connected in third layer；
Step 204: whether the both ends for judging that all excitations are connect with measuring signal include the signal for needing self-test,
If a certain connection for connecting the 203 deletions excitation and measuring signal that go to step if both ends do not include, if all connections are equal
Having one end includes then to continue；
Step 205: judge whether signal self-test is successively runed counter to physical characteristic demand with parallel sequence, if with run counter to if jump
The self-test of step 202 adjustment signal is gone to successively with parallel sequence, is continued if not runing counter to；
Step 206: utilizing self-test logic generation method, generate self-test logic from relationship between the signal that adjustment finishes.
Specifically, self-test logic is according to line model in test description in ATML and ATML (wire lists) two parts
It generates, above-mentioned two parts respectively correspond signal self-test sequence and instrument capable port-instrument port-testing station in the present invention
Port line.Line will establish spatial relationship inside testing station, when self-test sequence with signal inside testing station for index by being established
Between relationship, finally establish self-check program logical relation required inside testing station, as self-test logic.
It is specifically included as shown in figure 5, generating dynamic adapter line in the step 2:
Step 207: the hierarchical signal that input signal hierarchical block generates；
Step 208: utilizing adapter line generation method, adapter line distribution transform method, generate dynamic adaptation
Device line；
Wherein adapter line generation method is by Inner Route of Test Unit Adapter resource allocation to unlike signal, same adaptation
Device port can be used for unlike signal；And adapter line distribution transform method, it is that will distribute duplicate adapter port
It is reorganized according to the relationship of signal after layering, final each adapter port will not be reused in the same time.
The dynamic adapter line changed over time.
Step 209: judging whether dynamic adapter line can satisfy each signal for needing self-test and have adapter end
Mouth distributes and adapter port will not be used simultaneously by same signal, manual amendment's dynamic adapter line if being unsatisfactory for, if
Satisfaction then terminates.
For above step 201-206 and step 207-209 realization sequence without limitation, step can also be first carried out
207-209 or step 201-206 and step 207-209 is performed simultaneously.
As shown in fig. 6, the step 3 specifically includes:
Step 301: input self-test logical AND dynamic adapter line obtains complete line relationship；
Specifically, interconnector relationship in testing station in self-test logic is attached with adapter line, may finally be obtained
Station port-is tested to instrument capable port-instrument port-test station port-adapter port (entering)-adapter port (out)-
Instrument port-instrument capable port line constitutes complete loops, calls unlike signal by signal self-test sequence in self-test logic
Corresponding complete line relationship；
Step 302: being obtained according to the complete line relationship using code automatic generation method, self-check program generation method
To self-check program；
Specifically, code automatic generation method is to call corresponding connect according to signal self-test sequence using code generating framework
Line is related to that this process is reorganized using the XML language format for meeting ATML test description, obtains corresponding XML file and (retouches
Language is stated, Complied executing is unable to).Self-check program generation method is the XML file for obtaining code automatic generation method, benefit
With the framework of interpretation to descriptive language, executable self-check program is generated.
Self-check program should consist of two parts, a part be by testing station execute test program, another part be into
The operation of row adapter, this two parts can not be separately separated；
Step 303: judging whether self-check program meets self-test demand, manual amendment's self-check program if being unsatisfactory for, if full
It is sufficient then terminate.
Embodiment two
The purpose of the present embodiment is to provide a kind of computing device.
A kind of Auto-Test System self-check program development device of signal-oriented, including memory, processor and be stored in
On memory and the computer program that can run on a processor, the processor realize following steps when executing described program,
Include:
Step 1: signal being layered based on ATML model, and testing station inner port is determined according to the signal after layering
Connection relationship；
Step 2: the self-test logic and dynamic adapter line of resource in current system are generated according to signal hierarchical relational, and
Judge respectively self-test logic whether rationally and dynamic adapter line whether meet demand, when self-test logic rationally and dynamic is suitable
When orchestration line meet demand, perform the next step；
Step 3: according to self-test logical AND dynamic adapter line, generating self-check program；
Step 4: judging whether self-check program meets self-test demand, self-check program is manually adjusted if being unsatisfactory for, if meeting
Then terminate.
Embodiment three
The purpose of the present embodiment is to provide a kind of computer readable storage medium.
A kind of computer readable storage medium, is stored thereon with computer program, calculates for fingerprint similarity, should
Following steps are executed when program is executed by processor:
Step 1: signal being layered based on ATML model, and testing station inner port is determined according to the signal after layering
Connection relationship；
Step 2: the self-test logic and dynamic adapter line of resource in current system are generated according to signal hierarchical relational, and
Judge respectively self-test logic whether rationally and dynamic adapter line whether meet demand, when self-test logic rationally and dynamic is suitable
When orchestration line meet demand, perform the next step；
Step 3: according to self-test logical AND dynamic adapter line, generating self-check program；
Step 4: judging whether self-check program meets self-test demand, self-check program is manually adjusted if being unsatisfactory for, if meeting
Then terminate.
Each step involved in the device of above embodiments two and three is corresponding with embodiment of the method one, specific embodiment
It can be found in the related description part of embodiment one.Term " computer readable storage medium " is construed as including one or more
The single medium or multiple media of instruction set；It should also be understood as including any medium, any medium can be stored, be compiled
Code carries instruction set for being executed by processor and processor is made either to execute in the present invention method.
The present invention proposes the Auto-Test System self-check program development approach and device of a kind of signal-oriented, dependent on test
Support of the system software for signal-oriented (ATML) development scheme, the present invention solve transplanting using the development scheme of signal-oriented
Property difference and the problem of be unable to concurrent development, solve that development amount is big, system can reduce to expand using self-test logic generation technique
The problem of filling property difference solves the problems, such as that self-check program development amount is big using self-check program generation technique.
It will be understood by those skilled in the art that each module or each step of aforementioned present invention can be filled with general computer
It sets to realize, optionally, they can be realized with the program code that computing device can perform, it is thus possible to which they are stored
Be performed by computing device in the storage device, perhaps they are fabricated to each integrated circuit modules or by they
In multiple modules or step be fabricated to single integrated circuit module to realize.The present invention is not limited to any specific hardware and
The combination of software.
Above-mentioned, although the foregoing specific embodiments of the present invention is described with reference to the accompanying drawings, not protects model to the present invention
The limitation enclosed, those skilled in the art should understand that, based on the technical solutions of the present invention, those skilled in the art are not
Need to make the creative labor the various modifications or changes that can be made still within protection scope of the present invention.
Claims (10)
1. a kind of Auto-Test System self-check program development approach of signal-oriented, which comprises the following steps:
Step 1: signal being layered based on ATML model, and determines the connection of testing station inner port according to the signal after layering
Relationship；
Step 2: the self-test logic and dynamic adapter line of resource in current system are generated according to signal hierarchical relational；
Step 3: according to self-test logical AND dynamic adapter line, generating self-check program.
2. the Auto-Test System self-check program development approach of signal-oriented as described in claim 1, which is characterized in that described
Step 2 further include: judge respectively self-test logic whether rationally and dynamic adapter line whether meet demand, when self-test logic
When reasonable and dynamic adapter line meet demand, step 3 is executed.
3. the Auto-Test System self-check program development approach of signal-oriented as described in claim 1, which is characterized in that described
Step 1 specifically includes:
Step 101: extracting the information needed such as signal in ATML model；
Step 102: all signals of extraction being carried out to be divided into three layers, first layer classification foundation is signal type；The second layer is
Continue to classify on the basis of one layer, classification foundation is signal kinds；Third layer continues to classify on the basis of the second layer, and classification foundation is
Excitation and measuring signal；
Step 103: whether signal meets classification foundation and actual demand after judging layering, 102 people of return step if being unsatisfactory for
Work modifies hierarchical signal, continues if meeting；
Step 104: being index with signal, using existing ATML model, by line relationship from signal model, instrument models, survey
It extracts and is connected in the model of examination station, get through testing station Instrumental capable port-instrument port-test station port company
Line；
Step 105: judge testing station interconnector whether meet demand, return step 4 increases company according to demand if being unsatisfactory for
Line relationship terminates if meeting.
4. the Auto-Test System self-check program development approach of signal-oriented as claimed in claim 3, which is characterized in that described
Self-test logic is generated in step 2 to specifically include:
Step 201: the hierarchical signal that input signal hierarchical block generates；
Step 202: according to physical characteristic demand, provide first layer signal with different type self-test sequence and can parallel self-test,
And be given under first layer same type signal simultaneously, the self-test of second layer variety classes signal sequence and can parallel self-test, warp
Cross arrange obtain the self-tests of all signals successively with parallel sequence；
Step 203: congener excitation and measuring signal are separately connected in third layer；
Step 204: whether the both ends for judging that all excitations are connect with measuring signal include the signal for needing self-test, if certain
One connection both ends do not include, the connection of the 203 deletions excitation and measuring signal that go to step, if all connections have one
End is comprising then continuing；
Step 205: judge whether signal self-test is successively runed counter to physical characteristic demand with parallel sequence, if with run counter to if jump to
The self-test of step 202 adjustment signal successively with parallel sequence, continues if not runing counter to；
Step 206: generating self-test logic from relationship between the signal that adjustment finishes.
5. the Auto-Test System self-check program development approach of signal-oriented as claimed in claim 4, which is characterized in that described
Generating self-test logic includes: to be established inside testing station according to the instrument capable port-instrument port-test station port line
Spatial relationship；Then it will with signal be index settling time relationship inside testing station according to signal self-test sequence, obtain self-test and patrol
Volume.
6. the Auto-Test System self-check program development approach of signal-oriented as claimed in claim 2, which is characterized in that described
Dynamic adapter line is generated in step 2 to specifically include:
Step 207: the hierarchical signal that input signal hierarchical block generates；
Step 208: utilizing adapter line generation method, adapter line distribution transform method, obtain dynamic adapter company
Line；
Step 209: judging whether dynamic adapter line can satisfy each signal for needing self-test and have adapter port point
Match and adapter port by same signal while will not use, manual amendment's dynamic adapter line if being unsatisfactory for, if meeting
Then terminate.
7. the Auto-Test System self-check program development approach of signal-oriented as described in claim 1, which is characterized in that described
Step 3 specifically includes:
Step 301: input self-test logical AND dynamic adapter line obtains complete line relationship；
Step 302: self-check program is generated according to the complete line relationship.
8. the Auto-Test System self-check program development approach of signal-oriented as described in claim 1, which is characterized in that described
Method further includes step 4: judging whether self-check program meets self-test demand, self-check program is manually adjusted if being unsatisfactory for, if full
It is sufficient then terminate.
9. a kind of Auto-Test System self-check program development device of signal-oriented, including memory, processor and it is stored in
On reservoir and the computer program that can run on a processor, which is characterized in that the processor is realized when executing described program
The Auto-Test System self-check program development approach of signal-oriented as described in claim any one of 1-8.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the program is by processor
The Auto-Test System self-check program development approach of the signal-oriented as described in claim any one of 1-8 is realized when execution.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110412496A (en) * | 2019-07-29 | 2019-11-05 | 中电科仪器仪表有限公司 | The test function quick self-checking circuit and method of integrated circuit multi parameter tester |
| CN111964724A (en) * | 2020-08-18 | 2020-11-20 | 中电科仪器仪表有限公司 | Instrument-oriented test description model-based description method and apparatus |
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| CN110412496A (en) * | 2019-07-29 | 2019-11-05 | 中电科仪器仪表有限公司 | The test function quick self-checking circuit and method of integrated circuit multi parameter tester |
| CN110412496B (en) * | 2019-07-29 | 2021-05-07 | 中电科思仪科技股份有限公司 | Test function quick self-checking circuit and method for integrated circuit multi-parameter tester |
| CN111964724A (en) * | 2020-08-18 | 2020-11-20 | 中电科仪器仪表有限公司 | Instrument-oriented test description model-based description method and apparatus |
| CN111966572A (en) * | 2020-08-18 | 2020-11-20 | 中电科仪器仪表有限公司 | Description method and device based on signal-oriented test description model |
| CN111966572B (en) * | 2020-08-18 | 2024-04-26 | 中电科思仪科技股份有限公司 | Description method and device based on test description model facing signal |
| CN116047390A (en) * | 2022-12-30 | 2023-05-02 | 北京航天测控技术有限公司 | Self-checking method, device, equipment and storage medium for signal testing system |
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