CN109709506A - The recognition methods of fixture in a kind of T/R chip testing - Google Patents

The recognition methods of fixture in a kind of T/R chip testing Download PDF

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Publication number
CN109709506A
CN109709506A CN201811631421.9A CN201811631421A CN109709506A CN 109709506 A CN109709506 A CN 109709506A CN 201811631421 A CN201811631421 A CN 201811631421A CN 109709506 A CN109709506 A CN 109709506A
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fixture
frequency range
test
chip
measured
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CN201811631421.9A
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CN109709506B (en
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徐宝令
丁志钊
季汉国
展利
乔宏志
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China Electronics Technology Instruments Co Ltd CETI
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China Electronics Technology Instruments Co Ltd CETI
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Abstract

The present invention provides a kind of recognition methods of fixture in T/R chip testing, including fixture to be measured and vector network analyzer, recognition methods includes that vector network analyzer is connected by test cable with fixture to be measured;A test frequency range is chosen, 50 points is uniformly chosen in test frequency range, the standing-wave ratio of this 50 points is surveyed using vector network analyzer;The upper frequency limit for testing frequency range is identical as the upper frequency limit of working frequency range of T/R chip on fixture to be measured, and the lower-frequency limit for testing frequency range is 1GHz lower than the lower-frequency limit of the working frequency range of the T/R chip on fixture to be measured;By the summation of 50 standing-wave ratios obtain standing wave and, if standing wave and < 200:1 are transmitting fixture, if standing wave and >=200:1 are receiving jig.This method is utilized the intrinsic stationary wave characteristic difference of fixture and distinguishes, and does not need additional identification resistance, cable, multimeter module etc., reduces system complexity and construction cost.

Description

The recognition methods of fixture in a kind of T/R chip testing
Technical field
The present invention relates to T/R chip testing fields, and in particular to receiving jig and transmitting fixture in a kind of T/R chip testing Recognition methods.
Background technique
T/R chip is generally made of one or more transceiver channel, it is located at the phased arrays systems such as radar, electronic countermeasure Frequency microwave front end in electronic information equipment, and be that quantity is most in this kind of equipment while being also mostly important one kind Microwave chip has the Typical Representative of vital influence and microwave chip field on the performance entirely equipped.Separately Outside, from the point of view of test, it is a kind of microwave chip that test parameter is most, test realization is most complicated.
T/R chip generally requires connecting test fixture due to more than small in size, interface quantity etc. and is tested, T/R core Generally in 0dBm or so, emission state output power differs piece reception state output power from several watts to tens watts, additionally, due to The tolerance power of receiver generally in 1W hereinafter, so generally require two sets of reception, transmitting test fixtures in automatic test, The test fixture of middle emission state is often with attenuator.
If the test fixture that misconnection receives state often burns instrument in the actual test of T/R chip emission state Device, there are serious safety problems.To solve this problem, need to do fixture identification work in automatic test.Existing solution Certainly scheme is usually and simply carries out safety instruction on software interface and install different identification resistance on fixture, tests Cheng Zhongyong multimeter module testing resistance value identifies fixture, and then determines whether fixture installation is correct.
Current fixture identification the problem is that:
1) operator often turns a blind eye to safety instruction due to mindset after a large amount of retests;
2) the multimeter module that resistance identification method is additionally required will increase system Construction cost;
3) when two sleeve clamps put closer, resistance identification cable connection equally has safety problem when malfunctioning.
Summary of the invention
Existing fixture identification there are aiming at the problem that, the present invention provides a kind of identifications of fixture in T/R chip testing Method reliably and securely realizes receiving jig and emits the identification of fixture.
The following technical solution is employed by the present invention:
The recognition methods of fixture in a kind of T/R chip testing, including fixture to be measured and vector network analyzer, recognition methods The following steps are included:
Step 1: vector network analyzer is connected by test cable with fixture to be measured;
Step 2: choosing a test frequency range, uniformly choose 50 points in test frequency range, utilize vector network analysis Instrument surveys the standing-wave ratio of this 50 points;
The upper frequency limit for testing frequency range is identical as the upper frequency limit of working frequency range of T/R chip on fixture to be measured, test The lower-frequency limit of frequency range is 1GHz lower than the lower-frequency limit of the working frequency range of the T/R chip on fixture to be measured;
Step 3: by 50 standing-wave ratios summation in step 2 obtain standing wave and, if standing wave and < 200:1 are transmitting fixture, if Standing wave and >=200:1 are receiving jig.
The invention has the advantages that:
The intrinsic stationary wave characteristic difference of fixture is utilized in the recognition methods of fixture in T/R chip testing provided by the invention It distinguishes, does not need additional identification resistance, cable, multimeter module etc., reduce system complexity and construction cost;It penetrates Frequency receives the work that input/transmitting output test cable assumes responsibility for fixture identification simultaneously, with most while reducing additional line Direct means complete fixture identification, avoid the generation of safety accident;There is no operated due to operator's mindset Caused safety problem, test safety by test macro control, are reduced to tester's competency profiling completely.
Detailed description of the invention
Fig. 1 is receiving jig block diagram.
Fig. 2 is transmitting fixture block diagram.
Fig. 3 is vector network analyzer test fixture block diagram.
Fig. 4 is receiving jig standing wave curve graph.
Fig. 5 is transmitting fixture standing wave curve graph.
Specific embodiment
A specific embodiment of the invention is described further in the following with reference to the drawings and specific embodiments:
In conjunction with Fig. 1 to Fig. 5, the recognition methods of fixture in a kind of T/R chip testing, including fixture to be measured and vector network point Analyzer.
Fixture is divided into receiving jig and transmitting fixture, and receiving jig is relatively simple to primarily serve fixed clamp effect, such as Fig. 1 It is shown.Emit fixture and increase attenuation function compared to receiving jig, there is attenuator, as shown in Figure 2.
When T/R chip is in cold conditions (off-position), it is the safest to carry out fixture identification, T/R chip transmission ginseng when cold conditions Number is not available, and the standing wave in reflection parameters is good distinguishing characteristics.
Because vector network analyzer is the necessary equipment in the test of T/R chip S parameter, therefore normal index test can carried out The preceding vector network analyzer using in system receives input/transmitting output end standing wave to fixture and carries out test differentiation, such as Fig. 3 institute Show.
In T/R chip testing fixture recognition methods the following steps are included:
Step 1: vector network analyzer is connected by test cable with fixture to be measured;
Step 2: choosing a test frequency range, uniformly choose 50 points in test frequency range, utilize vector network analysis Instrument surveys the standing-wave ratio of this 50 points;
The upper frequency limit for testing frequency range is identical as the upper frequency limit of working frequency range of T/R chip on fixture to be measured, test The lower-frequency limit of frequency range is 1GHz lower than the lower-frequency limit of the working frequency range of the T/R chip on fixture to be measured;
Step 3: by 50 standing-wave ratios summation in step 2 obtain standing wave and, if standing wave and < 200:1 are transmitting fixture, if Standing wave and >=200:1 are receiving jig.
Embodiment 1
The stationary wave characteristic approximation of receiving jig is directly determined by T/R chip, by taking certain C-band T/R chip as an example, working frequency range For 5.2GHz to 5.5GHz, fixture identifies that standing wave test, for test end face, tests Frequency Band Selection 4.2GHz with fixture external interface To 5.5GHz.
In this way, fabulous only 1.3:1 or so of standing wave that vector network analyzer measures in the band of 5.2GHz to 5.5GHz, And in the very poor up to 160:1 of the standing wave that the band of 4.2GHz to 5.2GHz measures outside, test curve is as shown in Fig. 4.
In this way, choosing 50 points, the standing wave measured and certainty >=200:1 in test frequency range, therefore fixture to be measured is to connect Receive fixture.
Same test condition, which is changed, makees transmitting test fixture, it is assumed that between T/R chip and the port vector network analyzer Port1 Attenuator attenuation be 10dB, frequency DC~5.5GHz, be tested the excessively poor input signal total reflection of T/R chip standing wave, input It is -40dBm to fixture input end signal Pf, reflection signal power Pr is approximately -60dBm (twice by attenuator).According to electricity Press reflection coefficient formulaShow that voltage reflection coefficient is 0.1, according to standing-wave ratio formula Show that standing-wave ratio is about 1.22:1, test curve is as shown in Fig. 5.
In this way, the standing wave for 50 points that vector network analyzer measures and certainty < 200:1, therefore fixture to be measured is transmitting Fixture.
Certainly, the above description is not a limitation of the present invention, and the present invention is also not limited to the example above, this technology neck The variations, modifications, additions or substitutions that the technical staff in domain is made within the essential scope of the present invention also should belong to of the invention Protection scope.

Claims (1)

1. the recognition methods of fixture in a kind of T/R chip testing, which is characterized in that including fixture to be measured and vector network analysis Instrument, recognition methods the following steps are included:
Step 1: vector network analyzer is connected by test cable with fixture to be measured;
Step 2: choosing a test frequency range, uniformly choose 50 points in test frequency range, surveyed using vector network analyzer The standing-wave ratio of this 50 points;
The upper frequency limit for testing frequency range is identical as the upper frequency limit of working frequency range of T/R chip on fixture to be measured, tests frequency range Lower-frequency limit it is 1GHz lower than the lower-frequency limit of the working frequency range of the T/R chip on fixture to be measured;
Step 3: by 50 standing-wave ratios summation in step 2 obtain standing wave and, if standing wave and < 200:1 are transmitting fixture, if standing wave It is receiving jig with >=200:1.
CN201811631421.9A 2018-12-29 2018-12-29 Method for identifying clamp in T/R chip test Active CN109709506B (en)

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CN201811631421.9A CN109709506B (en) 2018-12-29 2018-12-29 Method for identifying clamp in T/R chip test

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CN201811631421.9A CN109709506B (en) 2018-12-29 2018-12-29 Method for identifying clamp in T/R chip test

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112398550A (en) * 2020-11-04 2021-02-23 深圳市创荣发电子有限公司 Wireless receiver testing device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202453492U (en) * 2011-12-23 2012-09-26 四川九洲电器集团有限责任公司 Protector for testing T/R (Transmit/Receive) assembly
US20150138026A1 (en) * 2013-09-30 2015-05-21 Vayyar Imaging Ltd Device and method for calibrating antenna array systems
CN106100677A (en) * 2016-06-22 2016-11-09 安徽天兵电子科技有限公司 A kind of method for packing of the multidimensional power division network of TR assembly
CN106443416A (en) * 2016-11-18 2017-02-22 中国电子科技集团公司第二十九研究所 Method and apparatus for realizing self-calibration of microwave performance of multi-layer circuit board
CN107167780A (en) * 2017-05-27 2017-09-15 中国电子科技集团公司第四十研究所 A kind of blindmate T/R module testing fixtures

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202453492U (en) * 2011-12-23 2012-09-26 四川九洲电器集团有限责任公司 Protector for testing T/R (Transmit/Receive) assembly
US20150138026A1 (en) * 2013-09-30 2015-05-21 Vayyar Imaging Ltd Device and method for calibrating antenna array systems
CN106100677A (en) * 2016-06-22 2016-11-09 安徽天兵电子科技有限公司 A kind of method for packing of the multidimensional power division network of TR assembly
CN106443416A (en) * 2016-11-18 2017-02-22 中国电子科技集团公司第二十九研究所 Method and apparatus for realizing self-calibration of microwave performance of multi-layer circuit board
CN107167780A (en) * 2017-05-27 2017-09-15 中国电子科技集团公司第四十研究所 A kind of blindmate T/R module testing fixtures

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112398550A (en) * 2020-11-04 2021-02-23 深圳市创荣发电子有限公司 Wireless receiver testing device

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