CN109709506A - The recognition methods of fixture in a kind of T/R chip testing - Google Patents
The recognition methods of fixture in a kind of T/R chip testing Download PDFInfo
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- CN109709506A CN109709506A CN201811631421.9A CN201811631421A CN109709506A CN 109709506 A CN109709506 A CN 109709506A CN 201811631421 A CN201811631421 A CN 201811631421A CN 109709506 A CN109709506 A CN 109709506A
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Abstract
The present invention provides a kind of recognition methods of fixture in T/R chip testing, including fixture to be measured and vector network analyzer, recognition methods includes that vector network analyzer is connected by test cable with fixture to be measured;A test frequency range is chosen, 50 points is uniformly chosen in test frequency range, the standing-wave ratio of this 50 points is surveyed using vector network analyzer;The upper frequency limit for testing frequency range is identical as the upper frequency limit of working frequency range of T/R chip on fixture to be measured, and the lower-frequency limit for testing frequency range is 1GHz lower than the lower-frequency limit of the working frequency range of the T/R chip on fixture to be measured;By the summation of 50 standing-wave ratios obtain standing wave and, if standing wave and < 200:1 are transmitting fixture, if standing wave and >=200:1 are receiving jig.This method is utilized the intrinsic stationary wave characteristic difference of fixture and distinguishes, and does not need additional identification resistance, cable, multimeter module etc., reduces system complexity and construction cost.
Description
Technical field
The present invention relates to T/R chip testing fields, and in particular to receiving jig and transmitting fixture in a kind of T/R chip testing
Recognition methods.
Background technique
T/R chip is generally made of one or more transceiver channel, it is located at the phased arrays systems such as radar, electronic countermeasure
Frequency microwave front end in electronic information equipment, and be that quantity is most in this kind of equipment while being also mostly important one kind
Microwave chip has the Typical Representative of vital influence and microwave chip field on the performance entirely equipped.Separately
Outside, from the point of view of test, it is a kind of microwave chip that test parameter is most, test realization is most complicated.
T/R chip generally requires connecting test fixture due to more than small in size, interface quantity etc. and is tested, T/R core
Generally in 0dBm or so, emission state output power differs piece reception state output power from several watts to tens watts, additionally, due to
The tolerance power of receiver generally in 1W hereinafter, so generally require two sets of reception, transmitting test fixtures in automatic test,
The test fixture of middle emission state is often with attenuator.
If the test fixture that misconnection receives state often burns instrument in the actual test of T/R chip emission state
Device, there are serious safety problems.To solve this problem, need to do fixture identification work in automatic test.Existing solution
Certainly scheme is usually and simply carries out safety instruction on software interface and install different identification resistance on fixture, tests
Cheng Zhongyong multimeter module testing resistance value identifies fixture, and then determines whether fixture installation is correct.
Current fixture identification the problem is that:
1) operator often turns a blind eye to safety instruction due to mindset after a large amount of retests;
2) the multimeter module that resistance identification method is additionally required will increase system Construction cost;
3) when two sleeve clamps put closer, resistance identification cable connection equally has safety problem when malfunctioning.
Summary of the invention
Existing fixture identification there are aiming at the problem that, the present invention provides a kind of identifications of fixture in T/R chip testing
Method reliably and securely realizes receiving jig and emits the identification of fixture.
The following technical solution is employed by the present invention:
The recognition methods of fixture in a kind of T/R chip testing, including fixture to be measured and vector network analyzer, recognition methods
The following steps are included:
Step 1: vector network analyzer is connected by test cable with fixture to be measured;
Step 2: choosing a test frequency range, uniformly choose 50 points in test frequency range, utilize vector network analysis
Instrument surveys the standing-wave ratio of this 50 points;
The upper frequency limit for testing frequency range is identical as the upper frequency limit of working frequency range of T/R chip on fixture to be measured, test
The lower-frequency limit of frequency range is 1GHz lower than the lower-frequency limit of the working frequency range of the T/R chip on fixture to be measured;
Step 3: by 50 standing-wave ratios summation in step 2 obtain standing wave and, if standing wave and < 200:1 are transmitting fixture, if
Standing wave and >=200:1 are receiving jig.
The invention has the advantages that:
The intrinsic stationary wave characteristic difference of fixture is utilized in the recognition methods of fixture in T/R chip testing provided by the invention
It distinguishes, does not need additional identification resistance, cable, multimeter module etc., reduce system complexity and construction cost;It penetrates
Frequency receives the work that input/transmitting output test cable assumes responsibility for fixture identification simultaneously, with most while reducing additional line
Direct means complete fixture identification, avoid the generation of safety accident;There is no operated due to operator's mindset
Caused safety problem, test safety by test macro control, are reduced to tester's competency profiling completely.
Detailed description of the invention
Fig. 1 is receiving jig block diagram.
Fig. 2 is transmitting fixture block diagram.
Fig. 3 is vector network analyzer test fixture block diagram.
Fig. 4 is receiving jig standing wave curve graph.
Fig. 5 is transmitting fixture standing wave curve graph.
Specific embodiment
A specific embodiment of the invention is described further in the following with reference to the drawings and specific embodiments:
In conjunction with Fig. 1 to Fig. 5, the recognition methods of fixture in a kind of T/R chip testing, including fixture to be measured and vector network point
Analyzer.
Fixture is divided into receiving jig and transmitting fixture, and receiving jig is relatively simple to primarily serve fixed clamp effect, such as Fig. 1
It is shown.Emit fixture and increase attenuation function compared to receiving jig, there is attenuator, as shown in Figure 2.
When T/R chip is in cold conditions (off-position), it is the safest to carry out fixture identification, T/R chip transmission ginseng when cold conditions
Number is not available, and the standing wave in reflection parameters is good distinguishing characteristics.
Because vector network analyzer is the necessary equipment in the test of T/R chip S parameter, therefore normal index test can carried out
The preceding vector network analyzer using in system receives input/transmitting output end standing wave to fixture and carries out test differentiation, such as Fig. 3 institute
Show.
In T/R chip testing fixture recognition methods the following steps are included:
Step 1: vector network analyzer is connected by test cable with fixture to be measured;
Step 2: choosing a test frequency range, uniformly choose 50 points in test frequency range, utilize vector network analysis
Instrument surveys the standing-wave ratio of this 50 points;
The upper frequency limit for testing frequency range is identical as the upper frequency limit of working frequency range of T/R chip on fixture to be measured, test
The lower-frequency limit of frequency range is 1GHz lower than the lower-frequency limit of the working frequency range of the T/R chip on fixture to be measured;
Step 3: by 50 standing-wave ratios summation in step 2 obtain standing wave and, if standing wave and < 200:1 are transmitting fixture, if
Standing wave and >=200:1 are receiving jig.
Embodiment 1
The stationary wave characteristic approximation of receiving jig is directly determined by T/R chip, by taking certain C-band T/R chip as an example, working frequency range
For 5.2GHz to 5.5GHz, fixture identifies that standing wave test, for test end face, tests Frequency Band Selection 4.2GHz with fixture external interface
To 5.5GHz.
In this way, fabulous only 1.3:1 or so of standing wave that vector network analyzer measures in the band of 5.2GHz to 5.5GHz,
And in the very poor up to 160:1 of the standing wave that the band of 4.2GHz to 5.2GHz measures outside, test curve is as shown in Fig. 4.
In this way, choosing 50 points, the standing wave measured and certainty >=200:1 in test frequency range, therefore fixture to be measured is to connect
Receive fixture.
Same test condition, which is changed, makees transmitting test fixture, it is assumed that between T/R chip and the port vector network analyzer Port1
Attenuator attenuation be 10dB, frequency DC~5.5GHz, be tested the excessively poor input signal total reflection of T/R chip standing wave, input
It is -40dBm to fixture input end signal Pf, reflection signal power Pr is approximately -60dBm (twice by attenuator).According to electricity
Press reflection coefficient formulaShow that voltage reflection coefficient is 0.1, according to standing-wave ratio formula
Show that standing-wave ratio is about 1.22:1, test curve is as shown in Fig. 5.
In this way, the standing wave for 50 points that vector network analyzer measures and certainty < 200:1, therefore fixture to be measured is transmitting
Fixture.
Certainly, the above description is not a limitation of the present invention, and the present invention is also not limited to the example above, this technology neck
The variations, modifications, additions or substitutions that the technical staff in domain is made within the essential scope of the present invention also should belong to of the invention
Protection scope.
Claims (1)
1. the recognition methods of fixture in a kind of T/R chip testing, which is characterized in that including fixture to be measured and vector network analysis
Instrument, recognition methods the following steps are included:
Step 1: vector network analyzer is connected by test cable with fixture to be measured;
Step 2: choosing a test frequency range, uniformly choose 50 points in test frequency range, surveyed using vector network analyzer
The standing-wave ratio of this 50 points;
The upper frequency limit for testing frequency range is identical as the upper frequency limit of working frequency range of T/R chip on fixture to be measured, tests frequency range
Lower-frequency limit it is 1GHz lower than the lower-frequency limit of the working frequency range of the T/R chip on fixture to be measured;
Step 3: by 50 standing-wave ratios summation in step 2 obtain standing wave and, if standing wave and < 200:1 are transmitting fixture, if standing wave
It is receiving jig with >=200:1.
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CN201811631421.9A CN109709506B (en) | 2018-12-29 | 2018-12-29 | Method for identifying clamp in T/R chip test |
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CN201811631421.9A CN109709506B (en) | 2018-12-29 | 2018-12-29 | Method for identifying clamp in T/R chip test |
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CN109709506B CN109709506B (en) | 2021-07-20 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112398550A (en) * | 2020-11-04 | 2021-02-23 | 深圳市创荣发电子有限公司 | Wireless receiver testing device |
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CN202453492U (en) * | 2011-12-23 | 2012-09-26 | 四川九洲电器集团有限责任公司 | Protector for testing T/R (Transmit/Receive) assembly |
US20150138026A1 (en) * | 2013-09-30 | 2015-05-21 | Vayyar Imaging Ltd | Device and method for calibrating antenna array systems |
CN106100677A (en) * | 2016-06-22 | 2016-11-09 | 安徽天兵电子科技有限公司 | A kind of method for packing of the multidimensional power division network of TR assembly |
CN106443416A (en) * | 2016-11-18 | 2017-02-22 | 中国电子科技集团公司第二十九研究所 | Method and apparatus for realizing self-calibration of microwave performance of multi-layer circuit board |
CN107167780A (en) * | 2017-05-27 | 2017-09-15 | 中国电子科技集团公司第四十研究所 | A kind of blindmate T/R module testing fixtures |
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2018
- 2018-12-29 CN CN201811631421.9A patent/CN109709506B/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN202453492U (en) * | 2011-12-23 | 2012-09-26 | 四川九洲电器集团有限责任公司 | Protector for testing T/R (Transmit/Receive) assembly |
US20150138026A1 (en) * | 2013-09-30 | 2015-05-21 | Vayyar Imaging Ltd | Device and method for calibrating antenna array systems |
CN106100677A (en) * | 2016-06-22 | 2016-11-09 | 安徽天兵电子科技有限公司 | A kind of method for packing of the multidimensional power division network of TR assembly |
CN106443416A (en) * | 2016-11-18 | 2017-02-22 | 中国电子科技集团公司第二十九研究所 | Method and apparatus for realizing self-calibration of microwave performance of multi-layer circuit board |
CN107167780A (en) * | 2017-05-27 | 2017-09-15 | 中国电子科技集团公司第四十研究所 | A kind of blindmate T/R module testing fixtures |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN112398550A (en) * | 2020-11-04 | 2021-02-23 | 深圳市创荣发电子有限公司 | Wireless receiver testing device |
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