CN109656803B - Information pushing method and device and electronic equipment - Google Patents
Information pushing method and device and electronic equipment Download PDFInfo
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- CN109656803B CN109656803B CN201710945531.1A CN201710945531A CN109656803B CN 109656803 B CN109656803 B CN 109656803B CN 201710945531 A CN201710945531 A CN 201710945531A CN 109656803 B CN109656803 B CN 109656803B
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- G06F11/36—Preventing errors by testing or debugging software
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Abstract
The embodiment of the application discloses an information pushing method and device and electronic equipment. One embodiment of the method comprises: acquiring defect occurrence time information and defect solution time information of each defect in a plurality of defects which have occurred, which correspond to the software project; determining statistical parameters for counting the defects based on the defect occurrence time and the defect solution time of each defect of the plurality of defects; determining overdue information based on the distance between the statistical parameter and a preset first clustering center and a preset second clustering center respectively, wherein the first clustering center is a clustering center representing non-overdue, the second clustering center is a clustering center representing overdue, and the overdue information is used for indicating whether software project development is overdue; and pushing overdue information to the user. According to the implementation method, overdue information of the software project can be determined in multiple time periods of software project development to guide adjustment of software project development resources so as to ensure that the software project is completed on time, and economic loss caused by overdue of the software project is avoided.
Description
Technical Field
The application relates to the technical field of computers, in particular to the technical field of internet, and particularly relates to an information pushing method and device and electronic equipment.
Background
The software development project can comprise stages of requirement analysis design, summary design, detailed design, code writing and the like. Each stage may generate defects, and testing may be used to detect defects generated by each stage. When the test finds a defect at any stage, the relevant developer needs to correct the defect.
Any one of the items has a predetermined completion time. Because each stage of the software development project continuously generates defects and solves the defects, the actual completion time of the software development project is possibly later than the preset completion time, and the project is overdue. If the software development project is overdue, huge economic loss can be caused.
Disclosure of Invention
An object of the embodiments of the present application is to provide an information pushing method, an information pushing apparatus, and an electronic device, so as to solve the technical problems mentioned in the above background.
In a first aspect, an embodiment of the present application provides an information pushing method, where the method includes: acquiring defect occurrence time information and defect solution time information of each defect in a plurality of defects which have occurred, which correspond to the software project; determining statistical parameters for counting the defects based on the defect occurrence time and the defect solution time of each defect of the plurality of defects; determining overdue information based on the distance between the statistical parameter and a preset first clustering center and a preset second clustering center respectively, wherein the first clustering center is a clustering center representing non-overdue, the second clustering center is a clustering center representing overdue, and the overdue information is used for indicating whether software project development is overdue; and pushing overdue information to the user.
In a second aspect, an embodiment of the present application provides an information pushing apparatus, where the apparatus includes: the device comprises an acquisition unit, a processing unit and a processing unit, wherein the acquisition unit is configured to acquire information of defect occurrence time and information of defect solution time of each defect in a plurality of defects which have occurred and correspond to a software project; a statistical parameter determination unit configured to determine statistical parameters of the statistical defects based on information of defect occurrence times and information of defect solution times of respective defects among the plurality of defects; the overdue information determining unit is configured to determine overdue information based on the distance between the statistical parameter and a preset first clustering center and a preset second clustering center respectively, wherein the first clustering center is a clustering center representing non-overdue, the second clustering center is a clustering center representing overdue, and the overdue information is used for indicating whether software project development is overdue; and the pushing unit is configured to push overdue information to the user.
In a third aspect, an embodiment of the present application provides an electronic device, including: one or more processors; a storage device, configured to store one or more programs, which when executed by one or more processors, cause the one or more processors to implement the information pushing method of the first aspect.
In a fourth aspect, the present application provides a computer-readable storage medium, on which a computer program is stored, where the computer program is executed by a processor to implement the information pushing method in the first aspect.
According to the information pushing method, the information pushing device and the electronic equipment, information of defect occurrence time and defect solution time of each defect in a plurality of defects which are corresponding to a software project and occur is obtained, statistical parameters of the statistical defects are determined based on the defect occurrence time and the defect solution time of each defect, overdue information is determined based on the distance between the statistical parameters and the preset first clustering center and the preset second clustering center, and finally the overdue information is pushed to a user. According to the method provided by the embodiment, the overdue information of the software project can be determined in a plurality of periods of development of the software project. Therefore, the development resources of the software project can be adjusted according to the overdue information to ensure that the software project is completed within the specified time, and the economic loss caused by overdue of the software project can be avoided.
Drawings
Other features, objects and advantages of the present application will become more apparent upon reading of the following detailed description of non-limiting embodiments thereof, made with reference to the accompanying drawings in which:
FIG. 1 is an exemplary system architecture diagram in which the present application may be applied;
FIG. 2 is a flow diagram of one embodiment of an information push method according to the present application;
FIG. 3 is a schematic diagram of an application scenario of an information push method according to the present application;
fig. 4 is a schematic diagram of an information push method according to the present application;
FIG. 5 is a schematic diagram of an embodiment of an information pushing device according to the present application;
FIG. 6 is a schematic block diagram of a computer system suitable for use in implementing an electronic device according to embodiments of the present application.
Detailed Description
The present application will be described in further detail with reference to the following drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the relevant invention and not restrictive of the invention. It should be noted that, for convenience of description, only the portions related to the related invention are shown in the drawings.
It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.
Fig. 1 shows an exemplary system architecture 100 to which the information push method or the information push apparatus of the present application can be applied.
As shown in fig. 1, the system architecture 100 may include a first server 101, a second server 102, user terminal devices 103, 104, a network 105, and a network 106. The network 105 serves as a medium for providing a communication link between the first server 101 and the second server 102. The network 106 serves as a medium for providing a communication link between the second server 101 and the user terminal devices 103, 104. The networks 105, 106 may each include various connection types, such as wired, wireless communication links, or fiber optic cables, among others.
The first server 101 may interact with the second server 102 via the network 105 to receive or send messages or the like. The user terminal devices 103, 104 may interact with the second server 102 via the network 106 to receive or send messages or the like.
The first server 101 may be a server that supports various tests of a software project. Such as servers that support testing of various stages of demand analysis design, summary design, detailed design, and code writing of software development projects. The first server 101 may identify the defect found in the testing process of each stage, where the identification may include a defect code, a defect content, a defect occurrence time, and the like. Any of the defects identified by the first server 101 may be corrected by the developer. Also, the first server 101 may record when any one defect is corrected. The first server 101 may store any defect related record. The defect-related record may include a software item number corresponding to the defect, a defect code number, defect content, and a time when the defect occurred, a time when the defect was resolved, and the like. In addition, the first server 101 may further send the defect record to the second server 102 through the network 105.
The second server 102 may be a server providing various services, such as a background server that can analyze and process a plurality of defect records obtained from the first server 101 through the network 105. For any software project, the second server 102 may obtain a record of each defect that has occurred corresponding to the software project. The second server 102 may process a plurality of defect records corresponding to the item of software, so as to determine overdue information of the item of software. And pushes the expiry information to the user terminal devices 103, 104 over the network 106.
The user may interact with the second server 102 via the user terminal device 103, 104, for example, to receive information pushed by the second server 102. The user terminal devices 103, 104 may have installed thereon various communication client applications, such as instant messaging tools, and the like. The user terminal devices 103, 104 may be various electronic devices having a display screen and supporting web browsing, including but not limited to smart phones, tablet computers, e-book readers, laptop portable computers, desktop computers, and the like.
It should be noted that the information pushing method provided in the embodiment of the present application is generally executed by the second server 102, and accordingly, the information pushing apparatus is generally disposed in the server 102.
It should be understood that the number of first servers, second servers, user terminal devices, networks in fig. 1 is merely illustrative. There may be any number of first servers, second servers, networks, and user terminal devices, as desired for implementation.
With continued reference to FIG. 2, a flow 200 of one embodiment of an information push method according to the present application is shown. The information pushing method comprises the following steps:
In this embodiment, an electronic device (for example, the second server 102 shown in fig. 1) on which the information push method operates may first receive, through a wired connection manner or a wireless connection manner, information of a plurality of defects that have occurred and correspond to a predetermined software item, which is sent by a first server (for example, the first server 101 shown in fig. 1). The information of the defect may include: the software item number information, the defect code number information, the defect content information, the defect occurrence time information, the defect solution time information and the like corresponding to the defect. The electronic device may extract information of defect occurrence time and information of defect solution time corresponding to each defect from the information of the defects.
In this embodiment, in a development cycle of a software project, the information of the defect occurrence time and the information of the defect solution time of each defect that has occurred, which correspond to the software project, may be obtained once every other time period according to the above method. The time period may be determined according to the size and the progress of the item, and is not particularly limited herein.
For a plurality of defects acquired for each time period, the plurality of defects may be analyzed as statistical defects in the time period as follows.
In this embodiment, the electronic device may use a plurality of currently acquired defects as statistical defects in the current time period.
The electronic device may determine the statistical parameters of the plurality of defects according to the defect occurrence time and the defect solution time of the plurality of defects acquired at the current time period. In this embodiment, the statistical parameter may be, for example, a statistical average of defect solution durations of the plurality of defects.
And step 203, determining overdue information based on the distance between the statistical parameter and the preset first clustering center and the preset second clustering center respectively.
In this embodiment, the electronic device may be preset with a first cluster center and a second cluster center. Wherein the first cluster center is a cluster center that is characterized as non-overdue, and the second cluster center is a cluster center that is characterized as overdue.
In this embodiment, the first cluster center and the second cluster center may be artificially set according to an average value of defect-solving periods of a plurality of history items. The first cluster center and the second cluster center may be, for example, a numerical value that identifies a time length.
The distance d1 between the statistical parameter obtained in step 202 and the first cluster center and the distance d2 between the statistical parameter and the second cluster center can be calculated, respectively.
The electronic device can determine the overdue information of the software project according to the distance d1 between the statistical parameter and the preset first clustering center and the distance d2 between the statistical parameter and the second clustering center. For example, when d1 is less than a first predetermined value, it may be determined that the item of software is not overdue; when d2 is less than a second predetermined value, the item of software may be determined to be overdue. The first predetermined value and the second predetermined value may be set according to specific needs, and are not limited herein.
And step 204, pushing the overdue information to the user.
After determining the overdue information of the software item in step 203, the electronic device on which the information pushing method is operated pushes the overdue information to a preset user. Specifically, the overdue information may be pushed to the preset user terminal device of the user. The preset user may be a person in charge of the software project or a developer related to the software project.
Therefore, whether the software project has the overdue risk or not can be judged according to the method at different time intervals of the software project development. When the software is judged to have overdue risk, development resources can be increased in the subsequent time period to accelerate the progress of the software project so as to ensure that the software project is completed within the specified time. Therefore, the economic loss caused by overdue of the software project can be reduced.
Referring to fig. 3, fig. 3 is a schematic diagram of an application scenario of the information push method according to the present application. In the application scenario 300 of fig. 3, a first server 301 sends defect information 303 of a software project that exists thereon to a second server 302. Wherein the defect information includes information of defect occurrence time and defect solution time of each of the plurality of defects. The second server 302 may then determine statistical parameters 304 for statistical defects based on the information of the defect occurrence times and the information of the defect solution times of the plurality of defects in the defect information 303. Then, the second server 302 determines overdue information 305 according to the distance between the statistical parameter and the preset first cluster center and the preset second cluster center. Here, the first cluster center is a cluster center that indicates non-overdue, the second cluster center is a cluster center that indicates overdue, and the overdue information 305 is used to indicate whether the software project development is overdue. The second server 302 pushes the overdue information 305 to a user terminal device 306 of a pre-designated user.
In this embodiment, the electronic device first obtains information of defect occurrence time and information of defect solution time of each of a plurality of defects that have occurred, which correspond to the software project; determining statistical parameters of the statistical defects based on the defect occurrence time and the defect solution time of each defect; then, determining overdue information based on the distance between the statistical parameters and a preset first clustering center and a preset second clustering center respectively; and finally pushing overdue information to the user. According to the method provided by the embodiment, overdue information of the software project can be determined in a plurality of periods of development of the software project. Therefore, the development resources of the software project can be adjusted within a plurality of time intervals according to the overdue information, so that the software project can be ensured to be completed within the specified time, and further, the economic loss caused by the overdue of the software project can be avoided.
In some optional implementations of the present embodiment, the statistical parameters counted in step 202 may be a standard deviation, a statistical mean, and a 90% quantile of defect resolution duration. The overdue information is determined by using the statistical mean, the standard deviation and the 90% division number of the defect solving duration as statistical parameters, so that the accuracy of the overdue information can be improved.
Further optionally, the information pushing method further includes, before acquiring information of defect occurrence time and defect solution time of each defect of a plurality of defects that have occurred, which correspond to the software project, generating a first clustering center and a second clustering center respectively by using a preset clustering algorithm based on statistical parameters of a plurality of historical software projects that are known to be overdue and not overdue in advance. The first clustering center and the second clustering center may be obtained by clustering statistical parameters (for example, statistical mean, standard deviation and 90% quantile of defect resolution duration) corresponding to a plurality of overdue developed historical software projects and a plurality of unexpired developed software projects. The above clustering algorithm may be, but is not limited to: K-MEANS algorithm, K-MEDOIDS algorithm, GMM algorithm, Spectral clustering algorithm, Ncut algorithm, and the like. Thus, the distance d1 between the statistical parameter and the first cluster center may be the distance between the statistical parameter and the first cluster center in the three-dimensional space. In particular, it may be the euclidean distance of the statistical parameter from the first cluster center. Likewise, the distance d2 between the statistical parameter and the second cluster center may be the Euclidean distance between the statistical parameter and the second cluster center in the three-dimensional space. The method for calculating the euclidean distance between two points in the three-dimensional space is not described herein.
In some optional implementations of this embodiment, step 202 may include the following sub-steps:
substep 2021, calculating defect solution time length of each defect according to the defect occurrence time and defect solution time of each defect, respectively.
For any defect in a plurality of defects that have occurred and correspond to the software project, the electronic device on which the information push method is executed may calculate the defect solution duration of the defect according to the defect occurrence time and the defect solution time of the defect. The plurality of defects that have occurred in the software project are taken as statistical defects. In this way, a statistical sample of defect resolution durations corresponding to a plurality of defects can be obtained.
Substep 2022, statistics of standard deviation, mean and 90% quantile of defect resolution duration.
The electronic device may use a conventional statistical method to count the standard deviation and the mean of the defect solving time. The above statistical method and statistical formula are not described herein.
In some optional implementations of the embodiment, the electronic device may count the 90% quantile per of the defect resolution duration according to the following formula (1):
wherein n is the total number of defects that have occurred before the current time corresponding to the item; tfcThe repair time for the c-th defect; tfc+1The repair time for the c +1 th defect; int is the rounding operator.
In some optional implementations of the embodiment, the following method may also be used to determine the overdue information in step 203: if d1< d2, the item of software is not overdue; otherwise, the software project is overdue; wherein d1 is the distance between the statistical parameter and the first cluster center and d2 is the distance between the statistical parameter and the second cluster center. Thus, the overdue information of the item of software can be clearly determined based on the relationship between the sizes of d1 and d 2. Therefore, the user can manually adjust the development resources of the software project according to the overdue information so as to ensure that the software project can be completed on time.
Please refer to fig. 4, which shows a schematic diagram of an information pushing method provided in an embodiment of the present application.
For convenience of illustration, a statistical mean of the defect-solved time lengths and a standard deviation of the defect-solved time lengths are shown in the diagram as statistical parameters. It will be appreciated that the statistical parameter may be a single value, as well as a plurality of values, and the like.
The electronic equipment clusters the statistical parameters of a plurality of known overdue and unexpired historical software items to obtain a cluster A (unexpired class) and a cluster center A1 point of the cluster A; cluster B (overdue class) and cluster center B1 points for cluster B.
For a software project in a development stage, acquiring defect occurrence time information and defect solution time information of each defect in a plurality of defects of the software project at regular intervals in the development stage, and taking the defects occurring before each acquisition time as statistical defects of the acquisition time. Then, determining the statistical parameters of the statistical defects: statistical mean and standard deviation of defect resolution duration. The calculation result of the statistical parameter may be, for example, a coordinate value of the point C in the figure.
The Euclidean distance D1 between the point C and the point A1 is calculated, and the Euclidean distance D2 between the point C and the point B1 is calculated. As shown in the graph D1< D2, the overdue information of the item of software can be determined as not overdue according to the statistical defect of the current time period. Assuming D1> D2, it can be determined that the overdue information for the item of software is overdue.
With further reference to fig. 5, as an implementation of the method shown in the above-mentioned figures, the present application provides an embodiment of an information pushing apparatus, which corresponds to the embodiment of the method shown in fig. 2, and which can be applied in various electronic devices.
As shown in fig. 5, the information pushing apparatus 500 of the present embodiment includes an acquiring unit 501, a statistical parameter determining unit 502, a overdue information determining unit 503, and a pushing unit 504. The acquiring unit 501 is configured to acquire information of defect occurrence time and information of defect solution time of each defect in a plurality of defects that have occurred, which correspond to the software project; a statistical parameter determination unit 502 configured to determine statistical parameters of statistical defects based on information of defect occurrence times and information of defect solution times of respective defects among the plurality of defects; a overdue information determining unit 503 configured to determine overdue information based on distances between the statistical parameters and preset first and second cluster centers, respectively, where the first cluster center is a cluster center representing non-overdue, the second cluster center is a cluster center representing overdue, and the overdue information is used to indicate whether the software project development is overdue; a pushing unit 504 configured to push the overdue information to a user.
In this embodiment, specific processing of the obtaining unit 501, the statistical parameter determining unit 502, the overdue information determining unit 503, and the pushing unit 504 of the apparatus 500 of the information pushing method and technical effects thereof may refer to related descriptions of step 201, step 202, step 203, and step 204 in the corresponding embodiment of fig. 2, which are not repeated herein.
In some optional implementations of this embodiment, the statistical parameters include: standard deviation of defect resolution duration, sample mean, and 90% quantile.
In some optional implementations of the present embodiment, the statistical parameter determining unit 502 is further configured to: determining the defect solving time length of each defect according to the defect occurrence time and the defect solving time of each defect; and (4) counting the standard deviation, the mean value and the 90% quantile of the solving time of a plurality of defects.
In some optional manners of this embodiment, the statistical parameter determining unit is further configured to: determining a 90% quantile per of defect resolution duration of the statistical defect according to the following formula:
wherein n is the total number of defects that have occurred before the current time corresponding to the item; tfcThe repair time for the c-th defect; tfc+1The repair time for the c +1 th defect; int is the rounding operator.
In some optional implementations of the embodiment, the overdue information determining unit 503 is further configured to determine the overdue information according to the following rules: if d1< d2, the item of software is not overdue; otherwise, the software project is overdue; wherein d1 is the distance between the statistical parameter and the first cluster center and d2 is the distance between the statistical parameter and the second cluster center. In some optional implementations of the present embodiment, the information pushing apparatus 500 further includes a cluster center generating unit (not shown in the figure). The cluster center generating unit is configured to generate the first cluster center and the second cluster center using a preset clustering algorithm based on statistical parameters of a plurality of historical software projects before the obtaining unit 501 obtains information of defect occurrence time and defect solution time of each defect of a plurality of defects that have occurred, which correspond to the software projects.
Referring to fig. 6, a schematic structural diagram of a computer system 600 to which the electronic device according to the embodiment of the present application is applied is shown.
As shown in fig. 6, the computer system 600 includes a Central Processing Unit (CPU)601 that can perform various appropriate actions and processes according to a program stored in a Read Only Memory (ROM)602 or a program loaded from a storage section 608 into a Random Access Memory (RAM) 603. In the RAM 603, various programs and data necessary for the operation of the system 600 are also stored. The CPU601, ROM 602, and RAM 603 are connected to each other via a bus 604. An input/output (I/O) interface 605 is also connected to bus 604.
The following components are connected to the I/O interface 605: an input portion 606 including a keyboard, a mouse, and the like; an output portion 607 including a display such as a Liquid Crystal Display (LCD) and a speaker; a storage section 608 including a hard disk and the like; and a communication section 609 including a network interface card such as a LAN card, a modem, or the like. The communication section 609 performs communication processing via a network such as the internet. The driver 610 is also connected to the I/O interface 605 as needed. A removable medium 611 such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, or the like is mounted on the drive 610 as necessary, so that a computer program read out therefrom is mounted in the storage section 608 as necessary.
In particular, according to an embodiment of the present disclosure, the processes described above with reference to the flowcharts may be implemented as computer software programs. For example, embodiments of the present disclosure include a computer program product comprising a computer program embodied on a computer readable medium, the computer program comprising program code for performing the method illustrated in the flow chart. In such an embodiment, the computer program may be downloaded and installed from a network through the communication section 609, and/or installed from the removable medium 611. The computer program performs the above-described functions defined in the method of the present application when executed by a Central Processing Unit (CPU) 601. It should be noted that the computer readable medium described herein can be a computer readable signal medium or a computer readable storage medium or any combination of the two. A computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, server, or device, or any combination of the foregoing. More specific examples of the computer readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the present application, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, server, or device. In this application, however, a computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, server, or device. Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to: wireless, wire, fiber optic cable, RF, etc., or any suitable combination of the foregoing.
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present application. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
The units described in the embodiments of the present application may be implemented by software or hardware. The described units may also be provided in a processor, and may be described as: a processor includes an acquisition unit, a statistical parameter determination unit, a overdue information determination unit, and a push unit. Here, the names of these units do not constitute a limitation to the unit itself in some cases, and for example, the acquiring unit may also be described as "a unit that acquires information of defect occurrence time and information of defect solution time of each of a plurality of defects that have occurred, corresponding to the software items".
As another aspect, the present application also provides a computer-readable medium, which may be contained in the apparatus described in the above embodiments; or may be present separately and not assembled into the device. The computer readable medium carries one or more programs which, when executed by the apparatus, cause the apparatus to: acquiring defect occurrence time information and defect solution time information of each defect in a plurality of defects which have occurred, which correspond to the software project; determining statistical parameters for counting the defects based on the defect occurrence time and the defect solution time of each defect of the plurality of defects; determining overdue information based on the distance between the statistical parameter and a preset first clustering center and a preset second clustering center respectively, wherein the first clustering center is a clustering center representing non-overdue, the second clustering center is a clustering center representing overdue, and the overdue information is used for indicating whether software project development is overdue; and pushing overdue information to the user.
The above description is only a preferred embodiment of the application and is illustrative of the principles of the technology employed. It will be appreciated by those skilled in the art that the scope of the invention herein disclosed is not limited to the particular combination of features described above, but also encompasses other arrangements formed by any combination of the above features or their equivalents without departing from the spirit of the invention. For example, the above features may be replaced with (but not limited to) features having similar functions disclosed in the present application.
Claims (12)
1. An information pushing method, characterized in that the method comprises:
acquiring defect occurrence time information and defect solution time information of each defect in a plurality of defects which have occurred, which correspond to the software project;
determining statistical parameters for statistical defects based on defect occurrence times and defect solution times for each of the plurality of defects;
determining overdue information based on the distance between the statistical parameters and a preset first clustering center and a preset second clustering center respectively, wherein the first clustering center is a clustering center representing non-overdue, the second clustering center is a clustering center representing overdue, and the overdue information is used for indicating whether the software project development is overdue; and
and pushing the overdue information to a user.
2. The method of claim 1, wherein the statistical parameters comprise: standard deviation of defect resolution duration, sample mean and 90% quantile;
the determining statistical parameters of statistical defects based on defect occurrence time and defect solution time of each defect of the plurality of defects includes:
determining the defect solving time length of each defect according to the defect occurrence time and the defect solving time of each defect;
and (5) counting the standard deviation, the mean value and the 90% quantile of the defect solving time length.
3. The method of claim 2, wherein the counting the standard deviation, the mean, and the 90% quantile of defect resolution durations comprises counting the 90% quantile of defect resolution durations according to the following formulaper：
Wherein n is the total number of defects that have occurred before the current time corresponding to the item; the repair time for the c-th defect; the repair time for the c +1 th defect; int is the operator of rounding; the repair time represents the repair duration.
4. The method of claim 1, wherein the determining the overdue information based on the distance between the statistical parameter and a preset first cluster center and a preset second cluster center respectively comprises:
if d1< d2, then the item of software is not overdue;
otherwise, the software project is overdue; wherein
d1 is the distance between the statistical parameter and the first cluster center, and d2 is the distance between the statistical parameter and the second cluster center.
5. The method according to claim 1, wherein before the obtaining information of the defect occurrence time and the defect solution time of each defect of the plurality of defects that have occurred corresponding to the item of software, the method further comprises:
and generating the first clustering center and the second clustering center by using a preset clustering algorithm based on the statistical parameters of a plurality of historical software projects.
6. An information pushing apparatus, characterized in that the apparatus comprises:
the device comprises an acquisition unit, a processing unit and a processing unit, wherein the acquisition unit is configured to acquire information of defect occurrence time and information of defect solution time of each defect in a plurality of defects which have occurred and correspond to a software project;
a statistical parameter determination unit configured to determine statistical parameters of the statistical defects based on information of defect occurrence times and information of defect solution times of respective defects among the plurality of defects;
the overdue information determining unit is configured to determine overdue information based on distances between the statistical parameters and preset first clustering centers and second clustering centers respectively, wherein the first clustering centers represent non-overdue clustering centers, the second clustering centers represent overdue clustering centers, and the overdue information is used for indicating whether the software project development is overdue; and
and the pushing unit is configured to push the overdue information to a user.
7. The apparatus of claim 6, wherein the statistical parameters comprise: standard deviation of defect resolution duration, sample mean and 90% quantile;
the statistical parameter determination unit is further configured to:
determining the defect solving time length of each defect according to the defect occurrence time and the defect solving time of each defect;
and (4) counting the standard deviation, the mean value and the 90% quantile of the solving time of a plurality of defects.
8. The apparatus of claim 7, wherein the statistical parameter determination unit is further configured to:
determining a 90% quantile of defect resolution duration for statistical defects according to the following formulaper：
Wherein n is the total number of defects that have occurred before the current time corresponding to the item; the repair time for the c-th defect; the repair time for the c +1 th defect; int is the operator of rounding; the repair time represents the repair duration.
9. The apparatus of claim 6, wherein the overdue information determining unit is further configured to: determining overdue information according to the following rules:
if d1< d2, then the item of software is not overdue; otherwise
The software project is overdue; wherein
d1 is the distance between the statistical parameter and the first cluster center, and d2 is the distance between the statistical parameter and the second cluster center.
10. The apparatus of claim 6, further comprising a cluster center generation unit,
the cluster center generating unit is configured to: before the acquiring unit acquires the information of the defect occurrence time and the information of the defect solution time of each defect in the plurality of defects which have occurred and correspond to the software project, the first clustering center and the second clustering center are generated by using a preset clustering algorithm based on the statistical parameters of the plurality of historical software projects.
11. An electronic device, comprising:
one or more processors;
a storage device for storing one or more programs,
the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method recited in any of claims 1-5.
12. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1-5.
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| US20140344775A1 (en) * | 2013-05-17 | 2014-11-20 | International Business Machines Corporation | Project modeling using iterative variable defect forecasts |
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| CN101599013A (en) * | 2009-06-26 | 2009-12-09 | 中国科学院软件研究所 | A kind of iteration project quantification monitoring method and system thereof based on defect driven |
| US20140344775A1 (en) * | 2013-05-17 | 2014-11-20 | International Business Machines Corporation | Project modeling using iterative variable defect forecasts |
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