CN109613051B - Device and method for measuring Seebeck coefficient of material by using contrast method - Google Patents
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- 239000000463 material Substances 0.000 title claims abstract description 38
- 238000000034 method Methods 0.000 title claims abstract description 36
- 238000012360 testing method Methods 0.000 claims abstract description 110
- 238000010438 heat treatment Methods 0.000 claims abstract description 67
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 25
- 229910002804 graphite Inorganic materials 0.000 claims abstract description 25
- 239000010439 graphite Substances 0.000 claims abstract description 25
- 238000007789 sealing Methods 0.000 claims description 7
- 238000005259 measurement Methods 0.000 abstract description 17
- 238000009529 body temperature measurement Methods 0.000 abstract description 10
- 238000005260 corrosion Methods 0.000 abstract description 6
- 230000007797 corrosion Effects 0.000 abstract description 6
- 230000008569 process Effects 0.000 abstract description 4
- 239000000523 sample Substances 0.000 description 151
- 239000002184 metal Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 2
- 239000010432 diamond Substances 0.000 description 2
- 229910001006 Constantan Inorganic materials 0.000 description 1
- 230000005678 Seebeck effect Effects 0.000 description 1
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 1
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 238000005057 refrigeration Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
Abstract
The invention relates to a device for measuring Seebeck coefficient of a material by using a contrast method, which comprises a sample table, a heating power supply and a data acquisition device, wherein the sample table comprises a clamp, the clamp comprises a lower clamp and an upper clamp, the sample comprises a standard sample and a test sample, the standard sample and the test sample are clamped between the lower clamp and the upper clamp, and a heating rod is arranged in the lower clamp. According to the invention, through comparison between the test sample and the standard sample, the Seebeck coefficient of the material is indirectly measured, and is conveniently compared with direct measurement, so that the problem of inaccurate temperature measurement at two ends of the sample is avoided, the inaccurate temperature measurement is the largest error source in the Seebeck coefficient measurement, and the system only needs to measure the potential difference between the two ends of the test sample and the standard sample, because the temperature at two sides of the sample is not required to be measured, the signal leads in the system are greatly reduced, the system is more simple and effective, and meanwhile, the graphite electrode is used for contacting with the sample, so that the problem of thermocouple corrosion in the test process is avoided.
Description
Technical Field
The invention relates to a thermoelectric semiconductor material performance sample table, in particular to a device and a method for measuring a Seebeck coefficient of a material by using a contrast method.
Background
The Seebeck coefficient is the inherent thermoelectric property of the material, the thermoelectric material utilizing the Seebeck effect is mainly used for manufacturing temperature sensors such as thermocouples, thermoelectric generation sheets and semiconductor refrigeration sheets, and the accurate measurement of the Seebeck coefficient value of the thermoelectric material at different temperatures has important significance for the research and application of the thermoelectric material.
The existing measuring device and method are as follows: the test sample is held between sample stages and is brought into direct contact with the two ends of the sample by thermocouple probes a and B, thereby measuring the temperature at the two contact points and the potential difference between probes a and B.
The Seebeck coefficient of the material is calculated according to a formula for solving the Seebeck coefficient, so the measurement has the following problems:
(1) the thermocouple directly contacts with the surface of the sample to measure the surface temperature of the sample, so that a large error exists, and the inaccurate temperature measurement of the conventional testing device is the largest error source in the Seebeck coefficient measurement;
(2) the thermocouple and the sample can generate corrosion reaction at high temperature, so that the thermocouple fails and cannot be tested repeatedly.
Disclosure of Invention
In order to solve the technical problem, a device and a method for measuring the Seebeck coefficient of the material by using a contrast method are provided.
The device for measuring the Seebeck coefficient of the material by adopting the contrast method comprises a sample table, a heating power supply and a data acquisition device, wherein the sample table comprises a clamp, the clamp is provided with two sample test positions, one sample test position is used for placing a standard sample, the other sample test position is used for placing a test sample, the clamp comprises a lower clamp and an upper clamp, the standard sample and the test sample are clamped between the lower clamp and the upper clamp, and a heating rod is arranged in the lower clamp;
the heating power supply is used for supplying power to the heating rod;
the heating rod is used for heating one ends of the standard sample and the test sample, which are contacted with the lower clamp;
the data acquisition module is used for acquiring the potential difference between the two ends of the standard sample and the test sample.
Further, graphite electrodes are arranged on the contact surfaces of the upper clamp and the lower clamp with the sample, heat conducting fins are arranged between the upper clamp and the graphite electrodes and between the lower clamp and the graphite electrodes, the heating rod is in contact with the heat conducting fins, and the heat conducting fins are in contact with the graphite electrodes;
the heating rod transfers heat to the graphite electrode on the surface of the lower clamp through the heat conducting sheet, and then heats the standard sample and the test sample which are contacted with the heating rod through the graphite electrode on the surface of the lower clamp.
The sample stage is placed in the chamber of the infrared heating furnace, and the temperature control device is electrically connected with the infrared heating furnace and used for controlling the temperature of the infrared heating furnace.
Furthermore, the temperature control device comprises a PID controller and a power regulator, a temperature sensor for detecting the temperature in the cavity is arranged in the infrared heating furnace, the PID controller and the infrared heating furnace are both electrically connected with the power regulator, and the temperature sensor is electrically connected with the PID controller.
Further, the infrared heating furnace is also provided with a vacuumizing sealing nozzle connected with a vacuum pump, and the vacuumizing sealing nozzle is communicated into the cavity through a pipeline.
Further, the data acquisition device comprises a first voltage test meter and a second voltage test meter, wherein the first voltage test meter is used for measuring the potential difference between the two ends of the standard sample, and the second voltage test meter is used for measuring the potential difference between the two ends of the test sample.
Further, still include the host computer, data acquisition device, temperature control device all with the host computer electrical connection.
As another aspect of the present invention, there is provided a method of measuring the Seebeck coefficient of a material using a contrast method, using an apparatus as described in any one of the above, the method comprising the steps of:
step 1, heating one ends of a standard sample and a test sample by using a heating rod, and measuring potential differences between the two ends of the standard sample and the test sample by using a data acquisition module after the two ends of the standard sample and the test sample reach the same temperature difference;
and 2, establishing a Seebeck equation of the standard sample and a Seebeck equation of the test sample according to the potential difference between the two ends of the standard sample and the test sample, and solving the absolute Seebeck coefficient value of the test sample according to the Seebeck equation of the standard sample and the Seebeck equation of the test sample.
Further, the step 2 specifically includes:
let the potential difference across the standard sample be VCu_SPotential difference across the test sample is VCu_TThe Seebeck equation of the standard sample and the Seebeck equation of the test sample are obtained and expressed as the following equation (1) and equation (2), respectively:
equation (1): vCu_T＝(SCu-ST)ΔT，
Equation (2): vCu_S＝(SCu-SS)ΔT，
Wherein SCuIs the absolute Seebeck coefficient value of the connecting wire between the sample and the data acquisition module, Δ T is the temperature difference between the two ends of the standard sample and the test sample, SSIs the absolute Seebeck coefficient value, S, of the standard sampleTAbsolute Seebeck coefficient values for the test samples;
equation (3) is obtained by combining equation (1) and equation (2), and is expressed as follows:
equation (3):
the absolute Seebeck coefficient values for the test samples were finally obtained according to equation (3) and are expressed as follows:
the invention has the beneficial effects that:
according to the invention, through comparison between the test sample and the standard sample, the Seebeck coefficient of the material is indirectly measured, and is conveniently compared with direct measurement, so that the problem of inaccurate temperature measurement at two ends of the sample is avoided, the inaccurate temperature measurement is the largest error source in the Seebeck coefficient measurement, and the system only needs to measure the potential difference between the two ends of the test sample and the standard sample, and because the temperature at two sides of the sample does not need to be measured, the signal leads in the system are greatly reduced, so that the system is simpler and more effective. Meanwhile, the graphite electrode is contacted with the sample, so that the problem of thermocouple corrosion in the test process is avoided.
Drawings
FIG. 1 is a schematic diagram illustrating a structure of an apparatus for measuring Seebeck coefficient of a material by a contrast method according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a sample stage according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a device for measuring the Seebeck coefficient of a material in the prior art.
Description of reference numerals: 1. the device comprises a lower clamp, 2, an upper clamp, 3, a standard sample, 4, a test sample, 5 heating rods, 6, heat conducting fins, 7 and graphite electrodes.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1-2, as a first embodiment of the present invention, an apparatus for measuring Seebeck coefficient of a material by using a contrast method is provided, which includes a sample stage, a heating power supply, and a data acquisition device, wherein the sample stage includes a fixture, the fixture has two sample testing positions, one of the sample testing positions is used for placing a standard sample, the other sample testing position is used for placing a test sample, the fixture includes a lower fixture and an upper fixture, the standard sample and the test sample are both clamped between the lower fixture and the upper fixture, and the lower fixture is installed with a heating rod.
The heating power supply is used for supplying power to the heating rod.
The heating rod is used for heating one end of the standard sample and the test sample, which are contacted with the lower clamp.
The data acquisition module is used for acquiring the potential difference between the two ends of the standard sample and the test sample.
Preferably, to ensure good thermal contact, the upper holder of the sample employs an intermediate rotatable mechanism which is angularly adjustable to ensure good thermal contact between the holder and the upper surfaces of both samples when the holder and sample are clamped together.
Preferably, graphite electrodes are arranged on contact surfaces of the upper clamp and the sample, heat conducting fins are arranged between the upper clamp and the graphite electrodes and between the lower clamp and the graphite electrodes, the heating rod is in contact with the heat conducting fins, and the heat conducting fins are in contact with the graphite electrodes.
The heating rod transfers heat to the graphite electrode on the surface of the lower clamp through the heat conducting sheet, and then heats the standard sample and the test sample which are contacted with the heating rod through the graphite electrode on the surface of the lower clamp.
In the above embodiment, the graphite electrode is directly contacted with the sample in the design of the sample stage, and because the temperature of each contact point of the graphite electrode is basically consistent, the influence of each contact point on the total thermal potential in the loop can be ignored, wherein the heat conducting sheet is preferably made of diamond, and because the cold end and the hot end of the sample clamp are made of composite materials of diamond and high-heat-conductivity metal, the temperature consistency of the leading-out end of the Seebeck voltage signal and the cold end and the hot end of the clamp is further ensured.
Preferably, the device further comprises a temperature control device and an infrared heating furnace, wherein the infrared heating furnace is provided with a closed cavity, the sample stage is placed in the cavity of the infrared heating furnace, and the temperature control device is electrically connected with the infrared heating furnace and used for controlling the temperature of the infrared heating furnace.
Preferably, the temperature control device comprises a PID controller and a power regulator, a temperature sensor for detecting the temperature in the cavity is arranged in the infrared heating furnace, the PID controller and the infrared heating furnace are both electrically connected with the power regulator, and the temperature sensor is electrically connected with the PID controller.
In the above embodiment, the power output of the power regulator is controlled by the PID controller, so that the temperature of the infrared heating furnace can be accurately controlled.
Preferably, the infrared heating furnace is further provided with a vacuumizing sealing nozzle connected with a vacuum pump, and the vacuumizing sealing nozzle is communicated into the cavity through a pipeline.
In the above embodiment, the whole comparison test sample stage is placed in the temperature-changing environment of the infrared heating furnace, the vacuumizing seal is connected with the vacuum pump during testing, and the cavity is vacuumized, so that the sample is guaranteed to be consistent in temperature and not oxidized, and various signal lines on the sample stage are led out to the external data acquisition device through the vacuum sealing plug for measurement.
Preferably, the data acquisition device comprises a first voltage test meter and a second voltage test meter, wherein the first voltage test meter is used for measuring the potential difference between the two ends of the standard sample, and the second voltage test meter is used for measuring the potential difference between the two ends of the test sample.
Preferably, the device further comprises an upper computer, the data acquisition device and the temperature control device are electrically connected with the upper computer, the temperature control device and the data acquisition device which control the infrared heating furnace are communicated with the upper computer, and the operation can be carried out through computer software.
According to the invention, different standard samples are adopted for comparison test according to different Seebeck coefficients of test samples, specifically, for the test samples with smaller Seebeck coefficients, the standard samples adopt a metal thermocouple material constantan, and a thermocouple is the most important purpose of thermoelectric materials, so that the Seebeck coefficients of the metal thermocouple materials with standards at different temperatures can be consulted, and the metal thermocouple materials have stable performance and can be repeatedly measured, thus being the best choice for comparison standard samples; for a semiconductor test sample with a higher Seebeck coefficient, the standard sample adopts a semiconductor silicon germanium alloy which is high temperature resistant and has stable performance, the Seebeck coefficient changes between (100- & lt 300- & gt) uV/K along with the temperature change and is an ideal comparison standard sample.
In the embodiment, the Seebeck coefficient of the material is indirectly measured by comparing the test sample with the standard sample, and is conveniently compared with the direct measurement, so that the problem of inaccurate temperature measurement at two ends of the sample is avoided, the inaccurate temperature measurement is the largest error source in the measurement of the Seebeck coefficient, and the system only needs to measure the potential difference between the two ends of the test sample and the standard sample, so that the temperature at two sides of the sample is not required to be measured, signal leads in the system are greatly reduced, and the system is simpler and more effective. Meanwhile, the graphite electrode is contacted with the sample, so that the problem of thermocouple corrosion in the test process is avoided.
As a second embodiment of the present invention, there is provided a method of measuring a Seebeck coefficient of a material using a contrast method, the method using any one of the above-described apparatuses for measuring a Seebeck coefficient of a material, the method including the steps of:
step 1, heating one ends of a standard sample and a test sample by using a heating rod, and measuring potential differences between the two ends of the standard sample and the test sample by using a data acquisition module after the two ends of the standard sample and the test sample reach the same temperature difference;
and 2, establishing a Seebeck equation of the standard sample and a Seebeck equation of the test sample according to the potential difference between the two ends of the standard sample and the test sample, and solving the absolute Seebeck coefficient value of the test sample according to the Seebeck equation of the standard sample and the Seebeck equation of the test sample.
In the above embodiment, the heating rod in the lower end fixture is used for heating one end of the sample during the Seebeck coefficient test, and the heat balance can be achieved after one end of the sample is heated for a while, because of the high thermal conductivity of the fixture, the temperature difference between the two ends of the standard sample and the two ends of the sample can be the same.
Preferably, the step 2 specifically comprises:
let the potential difference across the standard sample be VCu_SPotential difference across the test sample is VCu_TThe Seebeck equation of the standard sample and the Seebeck equation of the test sample are obtained and expressed as the following equation (1) respectively) And equation (2):
equation (1): vCu_T＝(SCu-ST)ΔT。
Equation (2): vCu_S＝(SCu-SS)ΔT。
Wherein SCuIs the absolute Seebeck coefficient value of the connecting wire between the sample and the data acquisition module, Δ T is the temperature difference between the two ends of the standard sample and the test sample, SSIs the absolute Seebeck coefficient value, S, of the standard sampleTIs the absolute Seebeck coefficient value of the test sample.
Equation (3) is obtained by combining equation (1) and equation (2), and is expressed as follows:
equation (3):
the absolute Seebeck coefficient value of the test sample is finally obtained according to equation (3), and is expressed as the following equation (4):
equation (4):
in the above embodiment, according to equation (4), the system only needs to measure the voltages at the two ends of the standard sample and the test sample to calculate the absolute Seebeck coefficient of the sample, so that the data acquisition end only acquires two voltage values.
In the specific measurement, in order to reduce the test error, the temperature difference Δ T between the upper and lower ends of the sample can be changed by controlling the power of the heating power supply in the data acquisition device in fig. 2, and the potential difference between the standard sample and the test sample should be measured for multiple times under multiple sets of temperature differences Δ T to obtain an average value.
In addition, the testing device with the whole sample platform inside is placed in a temperature-changing environment in the infrared heating furnace, the infrared heating furnace is controlled to reach different environmental temperatures during measurement, and then the measurement is carried out through the testing device. Finally, the Seebeck coefficient values of the test samples at different temperatures are gathered, so that a trend curve of the absolute Seebeck coefficient value of the test sample along with the temperature change can be obtained, in order to ensure that the sample is not oxidized at high temperature and the temperature is uniform, the interior of the infrared furnace is vacuumized, a control part of the infrared heating furnace is connected with a data acquisition device through a communication line and a host computer, coordination control is realized, automatic operation of the whole system is realized in host computer software, and the use is simple and convenient.
Fig. 3 shows a prior art test apparatus, as shown in fig. 3, in which only a test sample is tested alone, the sample is held between sample stages, and thermocouple probes a and B are in direct contact with the sample, thereby measuring the temperatures of both contact points, and the potential difference between the probes a and B.
Calculating the Seebeck coefficient of the material according to the following formula:
wherein S is the Seebeck coefficient of the test sample material, VA-VBTo measure the potential difference across the sample, TA-TBTo measure the temperature difference between the two ends of the sample, the measurement has several problems as follows:
(1) the thermocouple directly contacts with the surface of the sample to measure the surface temperature of the sample, so that a large error exists, and the inaccuracy of temperature measurement of the conventional testing device is the largest error source in Seebeck coefficient measurement.
(2) The thermocouple and the sample can generate corrosion reaction at high temperature, so that the thermocouple fails and cannot be tested repeatedly.
The Seebeck coefficient of the material is indirectly measured by comparing the test sample with the standard sample, the Seebeck coefficient of the material is conveniently compared with the Seebeck coefficient of the material by direct measurement, the problem that the temperature measurement at two ends of the sample is inaccurate is avoided, the inaccurate temperature measurement is the largest error source in the Seebeck coefficient measurement, and the system only needs to measure the potential difference between the two ends of the test sample and the standard sample, so that the temperature at two sides of the sample does not need to be measured, signal leads in the system are greatly reduced, and the system is simpler and more effective. Meanwhile, the graphite electrode is contacted with the sample, so that the problem of thermocouple corrosion in the test process is avoided.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (9)
1. The device for measuring the Seebeck coefficient of the material by using the contrast method is characterized by comprising a sample table, a heating power supply and a data acquisition device, wherein the sample table comprises a clamp, the clamp is provided with two sample test positions, one sample test position is used for placing a standard sample, the other sample test position is used for placing a test sample, the clamp comprises a lower clamp and an upper clamp, the standard sample and the test sample are clamped between the lower clamp and the upper clamp, and a heating rod is arranged in the lower clamp;
the heating power supply is used for supplying power to the heating rod;
the heating rod is used for heating one ends of the standard sample and the test sample, which are contacted with the lower clamp;
the data acquisition module is used for acquiring the potential difference between the two ends of the standard sample and the test sample.
2. The device for measuring the Seebeck coefficient of a material by using the contrast method according to claim 1, wherein graphite electrodes are arranged on the contact surfaces of the upper clamp and the lower clamp with the sample, heat-conducting fins are arranged between the upper clamp and the graphite electrodes and between the lower clamp and the graphite electrodes, the heating rod is in contact with the heat-conducting fins, and the heat-conducting fins are in contact with the graphite electrodes;
the heating rod transfers heat to the graphite electrode on the surface of the lower clamp through the heat conducting sheet, and then heats the standard sample and the test sample which are contacted with the heating rod through the graphite electrode on the surface of the lower clamp.
3. The apparatus for measuring the Seebeck coefficient of a material by using the contrast method according to claim 1, further comprising a temperature control device and an infrared heating furnace, wherein the infrared heating furnace is provided with a closed chamber, the sample stage is placed in the chamber of the infrared heating furnace, and the temperature control device is electrically connected with the infrared heating furnace and used for controlling the temperature of the infrared heating furnace.
4. The device for measuring the Seebeck coefficient of a material by using the contrast method according to claim 3, wherein the temperature control device comprises a PID controller and a power regulator, a temperature sensor for detecting the temperature in the cavity is arranged in the infrared heating furnace, the PID controller and the infrared heating furnace are both electrically connected with the power regulator, and the temperature sensor is electrically connected with the PID controller.
5. The device for measuring the Seebeck coefficient of a material by using the contrast method according to claim 4, wherein a vacuumizing sealing nozzle for connecting with a vacuum pump is further arranged on the infrared heating furnace, and the vacuumizing sealing nozzle is communicated into the chamber through a pipeline.
6. The device for measuring the Seebeck coefficient of a material by using the contrast method according to claim 1, wherein the data acquisition device comprises a first voltage test meter and a second voltage test meter, the first voltage test meter is used for measuring the potential difference between the two ends of the standard sample, and the second voltage test meter is used for measuring the potential difference between the two ends of the test sample.
7. The device for measuring the Seebeck coefficient of a material by using the contrast method according to claim 3, further comprising an upper computer, wherein the data acquisition device and the temperature control device are electrically connected with the upper computer.
8. A method for measuring the Seebeck coefficient of a material by a contrast method, characterised in that it uses a device according to any one of claims 1 to 7, said method comprising the following steps:
step 1, heating one ends of a standard sample and a test sample by using a heating rod, and measuring potential differences between the two ends of the standard sample and the test sample by using a data acquisition module after the two ends of the standard sample and the test sample reach the same temperature difference;
and 2, establishing a Seebeck equation of the standard sample and a Seebeck equation of the test sample according to the potential difference between the two ends of the standard sample and the test sample, and solving the absolute Seebeck coefficient value of the test sample according to the Seebeck equation of the standard sample and the Seebeck equation of the test sample.
9. The method for measuring the Seebeck coefficient of the material by the contrast method according to claim 8, wherein the step 2 is specifically as follows:
let the potential difference across the standard sample be VCu_SPotential difference across the test sample is VCu_TThe Seebeck equation of the standard sample and the Seebeck equation of the test sample are obtained and expressed as the following equation (1) and equation (2), respectively:
equation (1): vCu_T＝(SCu-ST)ΔT，
Equation (2): vCu_S＝(SCu-SS)ΔT，
Wherein SCuIs the absolute Seebeck coefficient value of the connecting wire between the sample and the data acquisition module, Δ T is the temperature difference between the two ends of the standard sample and the test sample, SSIs the absolute Seebeck coefficient value, S, of the standard sampleTAbsolute Seebeck coefficient values for the test samples;
equation (3) is obtained by combining equation (1) and equation (2), and is expressed as follows:
equation (3):
the absolute Seebeck coefficient values for the test samples were finally obtained according to equation (3) and are expressed as follows:
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| CN113640637A (en) * | 2020-04-27 | 2021-11-12 | 中国科学院大连化学物理研究所 | Clamp for auxiliary measurement of performances of thin film and soft and brittle thermoelectric material and application of clamp |
| CN114577843B (en) * | 2022-01-17 | 2023-06-09 | 中国科学院合肥物质科学研究院 | Sample clamp for LFA series laser heat conduction instrument and application method thereof |
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