CN109612593A - A kind of device and method for the measurement of ultrashort pulse time waveform - Google Patents
A kind of device and method for the measurement of ultrashort pulse time waveform Download PDFInfo
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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Abstract
The invention discloses a kind of device and method for the measurement of ultrashort pulse time waveform, belong to ultrafast pulsed laser the field of test technology.Device and method proposed by the present invention for the measurement of ultrashort pulse time waveform, measuring device is at low cost, structure is simple, easy to adjust, need to only rotate nonlinear crystal, so that it may realize and measure the time waveform of the ultrashort pulse of random polarization state；Secondly the intensity auto-correlation three times of light beam is realized along the I saphe matching way of non-colinear of nonlinear crystal light pass surface using the optical axis of crystal, it is adapted to the angle automatching requirement of different nonlinear crystals, improve the compactedness of device, and to the measurement efficiency of ultrafast laser beam pulse time waveform height, technological guidance is provided for the structure design of ultrafast laser beam pulse fields of measurement.
Description
Technical field
The invention belongs to ultrafast pulsed laser the field of test technology, and in particular to one kind is used for ultrashort pulse Time Wave
The device of shape measurement and corresponding measurement method.
Background technique
FROG (Frequency-Resolved is mainly used for the measurement of ultrashort pulse time waveform at present
Optical Gating, frequency resolved optical gating), SPIDER (spectrum phase interference electric field Reconstruction Method) and its mutation, this
The algorithm that a little methods restore burst length waveform is many and diverse, and in comparison double delay third-order correlation methods are a kind of measurement ultrafast lasers
The reliable method of burst length waveform.Chinese patent literature library discloses entitled " the laser pulse wave based on third-order correlation method
Shape measuring device " utility model patent (patent No.: ZL 2,016 2 0734206.1), the patent use the orthogonal rotation of light beam
In conjunction with the concatenation technology that non-linear harmonic wave twice is converted, the single ultrashort pulse waveform based on double delay third-order correlations is realized
Measurement；The utility model patent of " a kind of ultrashort laser pulse measuring device " entitled disclosed in Chinese patent literature library is (specially
Benefit number: ZL 2,017 2 1273442.9) using by equal proportion imaging transmission auto-correlation frequency multiplication light beam and tested basic frequency beam into
Row and frequency are converted, and generate the method for three rank intensity coherent signals of double delays to obtain the Time Wave of single-shot time ultrashort pulse
Shape.But there are still the impulse waves for requiring measured laser beam to have specific polarization state, can not adapt to random polarization state for the above method
The defect of shape measurement.
Summary of the invention
Goal of the invention of the invention is: in order to overcome existing measuring technique to want in ultrashort pulse waveform measurement
Ask measured laser beam that there is the deficiency of specific polarization state, the present invention provides a kind of dress for ultrashort pulse waveform measurement
It sets and method, the impulse waveform for effectively adapting to random polarization state measures.
The technical solution adopted by the invention is as follows:
A kind of device for the measurement of ultrashort pulse time waveform, described device is in ultrashort pulse collimated light beam
Spectroscope I 1 is provided in incident direction, for laser pulse to be divided into the first transmitted light and the first reflected light；
Reflecting mirror I 2, nonlinear crystal I 3 are disposed on the first reflected light path of spectroscope I 1, spectroscope I 1
First reflected light obtains the first basic frequency beam after the reflection of reflecting mirror I 2, and first basic frequency beam is projected with the first fixed angle
To nonlinear crystal I 3；
Spectroscope II 4 is set on the first transmitted light path of spectroscope I 1, and the first transmitted light of spectroscope I 1 is through spectroscope
The second transmitted light and the second reflected light are again divided into after II 4；Reflecting mirror is provided on the second transmitted light path of spectroscope II 4
II 5, the second transmitted light of delay modulator I 6, reflecting mirror III 7, nonlinear crystal I 3, spectroscope II 4 is reflected through reflecting mirror II 5
After project delay modulator I 6 carry out aplanatism adjusting, from delay modulator I 6 be emitted light beam through reflecting mirror III 7 reflection after
Corresponding second basic frequency beam is obtained, second basic frequency beam projects nonlinear crystal I 3 with the second fixed angle；
The first basic frequency beam that reflecting mirror I 2 reflects is with the second basic frequency beam reflected from reflecting mirror III 7 with the fixed angles
Degree symmetrically projects on nonlinear crystal I 3 simultaneously, and frequency multiplication is carried out in the overlapping region of two light beams by nonlinear crystal I 3
Two frequency multiplication light beams of conversion, generation are emitted along I 3 normal to a surface direction of nonlinear crystal；
Delay modulator II 8, guide-lighting microscope group 9, nonlinear crystal II are provided on the second reflected light path of spectroscope II 4
10；The delayed adjuster II 8 of second reflected light of spectroscope II 4 projects the guide-lighting progress of microscope group 9 light after carrying out aplanatism adjusting
Road deflection, the third basic frequency beam after guide-lighting microscope group 9 carries out optical path-deflecting are projected non-obliquely with third fixed angle
On linear crystal II 10, along I 3 normal to a surface direction of nonlinear crystal outgoing two frequency multiplication light beams with the 4th fixed angle with from
The third basic frequency beam that guide-lighting microscope group 9 is emitted obliquely is with third fixed angle while projecting on nonlinear crystal II 10, leads to
It crosses nonlinear crystal II 10 and carries out frequency conversion in the overlapping region of two light beams, the frequency tripling light beam of generation is along non-linear crystalline substance
The outgoing of II 10 surface normal direction of body；
Imaging len 11 and CCD12 are provided on frequency tripling beam exit direction；From nonlinear crystal II 10
The imaged lens 11 of frequency tripling light beam on surface normal direction are imaged onto CCD12, and CCD12 output is three rank phases of double delays
OFF signal；The external computer of CCD12, double delay third-order correlation signals from CCD12 enter computer and carry out data processing, obtain
Obtain laser pulse shape information.
Further, it is additionally provided with absorbing sheet I 13 on the first basic frequency beam direction penetrated from nonlinear crystal I 3, used
In remaining first basic frequency beam of absorption；Absorption is additionally provided on the second basic frequency beam direction penetrated from nonlinear crystal I 3
Piece II 14, for absorbing remaining second basic frequency beam；On the third basic frequency beam direction penetrated from nonlinear crystal II 10
It is additionally provided with absorbing sheet III 15, for absorbing remaining third basic frequency beam.
Further, the nonlinear crystal I 3 and nonlinear crystal II 10 are matched using I saphe of non-colinear, crystal
Optical axis is parallel with plane of crystal；Different crystalline materials is selected according to different laser wavelength of incidence.
Further, the nonlinear crystal I 3 and nonlinear crystal II 10 are all mounted on along the rotation of plane of crystal normal
It rotates on mirror holder；According to different incoming laser beam polarization state rotating crystal optical axises, so as to adjust nonlinear crystal I 3, non-linear
The angle of crystal II 10.
Further, first fixed angle and the second fixed angle are all 15 ° of incident angle, and third fixed angle is
17 °, the 4th fixed angle is 10 °.
Further, the guide-lighting microscope group 9 is by upper and lower two pieces guide-lighting mirrors: guide-lighting mirror I 901 and guide-lighting mirror II 902 are constituted；?
It is disposed with guide-lighting mirror I 901 and guide-lighting mirror II 902 in basic frequency laser pulse transmission direction, projects the level of guide-lighting microscope group 9
Light beam is reflected by guide-lighting mirror I 901 vertically upward first, then by guide-lighting mirror II 902 that the light beam reflected vertically upward is oblique
Lower reflection, and the outgoing beam direction of guide-lighting microscope group 9 is vertical with incoming Level beam direction.
Further, described according to different incoming laser beam polarization state rotating crystal optical axises, so as to adjust non-linear crystalline substance
Body I 3, nonlinear crystal II 10 angle specifically include: when incident laser pulse be horizontal polarization when, rotate nonlinear crystal I 3
With nonlinear crystal II 10, the optical axis of nonlinear crystal I 3 is made to be in vertical direction, the optical axis of nonlinear crystal II 10 is in water
Square to；When incident laser pulse is vertical polarization, nonlinear crystal I 3 and nonlinear crystal II 10 are rotated, non-linear crystalline substance is made
The optical axis of body I 3 is horizontally oriented, the optical axis of nonlinear crystal II 10 is in vertical direction；When incident laser pulse is non-hangs down
Directly, non-horizontal polarization rotates nonlinear crystal I 3 and nonlinear crystal II 10, the two frequency multiplication light beams for exporting nonlinear crystal I 3
The frequency tripling light beam that most strong, nonlinear crystal II 10 exports is most strong.
On the other hand, the present invention also provides a kind of methods for the measurement of ultrashort pulse time waveform, including with
Lower step:
Spectroscope I 1 is set up in ultrashort pulse parallel beam incident side, laser pulse is divided into after spectroscope I 1
First transmitted light and the first reflected light；
Reflecting mirror I 2, nonlinear crystal I 3 are set gradually on the first reflected light path of spectroscope I 1；In spectroscope I 1
Spectroscope II 4 is set on first transmitted light path, and the first transmitted light of spectroscope I 1 is again divided into second thoroughly after spectroscope II 4
Penetrate light and the second reflected light；Reflecting mirror II 5, delay modulator I 6, reflecting mirror are set on the second transmitted light path of spectroscope II 4
III 7, nonlinear crystal I 3；Delay modulator II 8, guide-lighting microscope group 9, non-thread is set on the second reflected light path of spectroscope II 4
Property crystal II 10；
The optical axis of crystal of nonlinear crystal I 3, nonlinear crystal II 10 is rotated according to different incoming laser beam polarization states,
So as to adjust the angle of nonlinear crystal I 3, nonlinear crystal II 10, so that:
(a) the first reflected light of spectroscope I 1 obtains the first basic frequency beam after the reflection of reflecting mirror I 2, by first base
Frequency light beam projects nonlinear crystal I 3 with the first fixed angle；
(b) the second transmitted light of spectroscope II 4 projects delay modulator I 6 after the reflection of reflecting mirror II 5 and carries out aplanatism
It adjusts, the light beam being emitted from delay modulator I 6 obtains corresponding second basic frequency beam after the reflection of reflecting mirror III 7, by described the
Two basic frequency beams project nonlinear crystal I 3 with the second fixed angle；
It (c) will be from the first basic frequency beam that reflecting mirror I 2 reflects and more than the second basic frequency beam that reflecting mirror III 7 reflects
It states fixed angle while symmetrically projecting and carry out frequency-doubled conversion on nonlinear crystal I 3, two frequency multiplication light beams of generation are along non-linear crystalline substance
The outgoing of I 3 normal to a surface direction of body；
(d) the delayed adjuster II 8 of the second reflected light of spectroscope II 4 projects guide-lighting microscope group after carrying out aplanatism adjusting
9 carry out optical path-deflecting, obliquely with third fixed angle by the third basic frequency beam after guide-lighting microscope group 9 carries out optical path-deflecting
It projects on nonlinear crystal II 10；
(e) by two frequency multiplication light beams being emitted along I 3 normal to a surface direction of nonlinear crystal with the 4th fixed angle with from leading
The third basic frequency beam that light microscopic group 9 is emitted obliquely is with third fixed angle while projecting the enterprising line frequency of nonlinear crystal II 10
The frequency tripling light beam of rate conversion, generation is emitted along II 10 surface normal direction of nonlinear crystal；
Imaging len 11 and CCD12 are set on the frequency tripling beam exit direction；From nonlinear crystal II 10
The imaged lens 11 of frequency tripling light beam on surface normal direction are imaged onto CCD12, and CCD12 output is three rank phases of double delays
OFF signal；The external computer of CCD12, double delay third-order correlation signals from CCD12 enter computer and carry out data processing, obtain
Obtain laser pulse shape information.
Further, it further comprises the steps of: and is provided with suction on the first basic frequency beam direction penetrated from nonlinear crystal I 3
I 13 are taken up, for absorbing remaining first basic frequency beam；It is set on the second basic frequency beam direction penetrated from nonlinear crystal I 3
It is equipped with absorbing sheet II 14, for absorbing remaining second basic frequency beam；In the third fundamental frequency light penetrated from nonlinear crystal II 10
Absorbing sheet III 15 is provided on Shu Fangxiang, for absorbing remaining third basic frequency beam.
Further, described that nonlinear crystal I 3, nonlinear crystal II are rotated according to different incoming laser beam polarization states
10 optical axis of crystal, the angle so as to adjust nonlinear crystal I 3, nonlinear crystal II 10 specifically include: working as incident laser pulse
When for horizontal polarization, the optical axis of rotation nonlinear crystal I 3 be in vertical direction, and the optical axis of nonlinear crystal II 10 is in horizontal
Direction；When incident laser pulse is vertical polarization, nonlinear crystal I 3 and nonlinear crystal II 10 are rotated, nonlinear crystal is made
I 3 optical axis is horizontally oriented, the optical axis of nonlinear crystal II 10 is in vertical direction；When incident laser pulse be it is non-perpendicular,
Non-horizontal polarization rotates nonlinear crystal I 3 and nonlinear crystal II 10, and the two frequency multiplication light beams for exporting nonlinear crystal I 3 are most
By force, the frequency tripling light beam that nonlinear crystal II 10 exports is most strong.
In conclusion by adopting the above-described technical solution, the beneficial effects of the present invention are:
1. it is proposed by the present invention for ultrashort pulse time waveform measurement device and method, wherein measuring device at
This is low, structure is simple, easy to adjust, need to only rotate nonlinear crystal, so that it may realize the ultrashort pulse to random polarization state
Autocorrelation signal measurement.
2. the device and method proposed by the present invention for the measurement of ultrashort pulse time waveform, using optical axis of crystal edge
The I saphe matching way of non-colinear of nonlinear crystal light pass surface realizes the intensity of light beam auto-correlation three times, is adapted to difference
The angle automatching requirement of frequency-doubling crystal, improves the compactedness of device.
3. the device and method proposed by the present invention for the measurement of ultrashort pulse time waveform are to ultrafast laser beam arteries and veins
The measurement efficiency for rushing time waveform is high, provides technological guidance for the structure design of ultrafast laser beam pulse fields of measurement.
Detailed description of the invention
Examples of the present invention will be described by way of reference to the accompanying drawings, in which:
Fig. 1 is the device light path schematic diagram for the measurement of ultrashort pulse time waveform of the invention；
Fig. 2 is the guide-lighting microscope group optical path signal in the device for the measurement of ultrashort pulse time waveform of the invention
Figure；
Fig. 3 is the nonlinear frequency conversion optical path in the device for the measurement of ultrashort pulse time waveform of the invention
Schematic diagram；
In figure, the delay of 1. spectroscope, I 2. reflecting mirror, I 3. nonlinear crystal, I 4. spectroscope, II 5. reflecting mirror II 6. is adjusted
Save 10. nonlinear crystal of the guide-lighting microscope group of I 7. reflecting mirror of device, III 8. delay modulator II 9., II 11. imaging len 12.CCD
13. I 14. absorbing sheet of absorbing sheet, II 15. absorbing sheet III；The 901. guide-lighting mirrors II of guide-lighting mirror I 902..
Specific embodiment
It is right below with reference to attached drawing of the invention in order to make those skilled in the art more fully understand technical solution of the present invention
Technical solution of the present invention carries out clear, complete description, and based on the embodiment in the application, those of ordinary skill in the art exist
Other similar embodiments obtained under the premise of creative work are not made, shall fall within the protection scope of the present application.
Embodiment 1
As shown in Figure 1, being a kind of signal for ultrashort pulse time waveform measuring device provided in this embodiment
Figure, described device are provided with spectroscope 1 on ultrashort pulse parallel beam incident direction；Laser pulse is after spectroscope 1
It is divided into the first transmitted light and the first reflected light.
Reflecting mirror I 2, nonlinear crystal I 3, absorbing sheet I 13 are disposed on the first reflected light path of spectroscope 1, point
First reflected light of light microscopic I 1 obtains the first basic frequency beam after the reflection of reflecting mirror I 2, and first basic frequency beam is fixed with first
Angle projects nonlinear crystal I 3, and remaining first basic frequency beam is absorbed piece I 13 after the outgoing of nonlinear crystal I 3 and absorbs.
Spectroscope II 4 is provided on the first transmitted light path of spectroscope I 1；First transmitted light of spectroscope I 1 is through being divided
The second transmitted light and the second reflected light are again divided into after mirror II 4；Reflection is provided on the second transmitted light path of spectroscope II 4
Mirror II 5, delay modulator I 6, reflecting mirror III 7, nonlinear crystal I 3, absorbing sheet II 14, the second transmitted light warp of spectroscope II 4
Reflecting mirror II 5 projects delay modulator I 6 and carries out aplanatism adjusting after reflecting, the light beam being emitted from delay modulator I 6 is through anti-
It penetrates after mirror III 7 reflects and obtains corresponding second basic frequency beam, second basic frequency beam is projected non-thread with the second fixed angle
Property crystal I 3, remaining second basic frequency beam from nonlinear crystal I 3 outgoing after be absorbed piece II 14 absorb.
First fixed angle and the second fixed angle are symmetrical incident angle, therefore first reflected from reflecting mirror I 2
Basic frequency beam symmetrically projects nonlinear crystal with the second basic frequency beam reflected from reflecting mirror III 7 with above-mentioned fixed angle simultaneously
Frequency-doubled conversion is carried out on I 3, by nonlinear crystal I 3 in the overlapping region of two light beams, two frequency multiplication light beams of generation are along non-
The outgoing of I 3 normal to a surface direction of linear crystal.
On the other hand, delay modulator II 8, guide-lighting microscope group 9, non-is provided on the second reflected light path of spectroscope II 4
Linear crystal II 10, absorbing sheet III 15；After the delayed adjuster II 8 of second reflected light of spectroscope II 4 carries out aplanatism adjusting
It projects guide-lighting microscope group 9 and carries out optical path-deflecting, as shown in Figure 2.
Fig. 2 is the light path schematic diagram of the guide-lighting microscope group 9, is the A of guide-lighting microscope group 9 in Fig. 1 to side view.The leaded light mirror
Group 9 is by upper and lower two pieces guide-lighting mirrors: guide-lighting mirror I 901 and guide-lighting mirror II 902 are constituted；In basic frequency laser pulse transmission direction successively
It is provided with guide-lighting mirror I 901, guide-lighting mirror II 902, the horizontal light beam for projecting guide-lighting microscope group (9) is hung down by guide-lighting mirror I (901) first
Straight reflection upwards, then reflect the light beam reflected vertically upward by guide-lighting mirror II 902 obliquely, and guide-lighting microscope group 9 goes out
Irradiating light beam direction is vertical with incoming Level beam direction.
Third basic frequency beam after guide-lighting microscope group 9 carries out optical path-deflecting is projected non-obliquely with third fixed angle
On linear crystal II 10, remaining third basic frequency beam is absorbed piece III 15 after the outgoing of nonlinear crystal II 10 and absorbs.At this time
Along I 3 normal to a surface direction of nonlinear crystal outgoing two frequency multiplication light beams with the 4th fixed angle with from guide-lighting microscope group 9 obliquely
The third basic frequency beam of outgoing projects the conversion of the enterprising line frequency of nonlinear crystal II 10 with third fixed angle simultaneously, generation
Frequency tripling light beam is emitted along II 10 surface normal direction of nonlinear crystal.
Imaging len 11, CCD12 are set on the frequency tripling beam exit direction；From II 10 table of nonlinear crystal
The imaged lens 11 of frequency tripling light beam in the normal direction of face are imaged onto CCD12, and CCD12 output is double delay third-order correlations
Signal；The external computer of CCD12, double delay third-order correlation signals from CCD12 enter computer and carry out data processing, obtain
Laser pulse shape information.
The nonlinear crystal I 3, nonlinear crystal II 10 are all matched using I saphe of non-colinear, the optical axis of crystal and brilliant
Body surface face is parallel；Different crystalline materials such as BBO, KDP etc. are selected according to different laser wavelength of incidence.
The nonlinear crystal I 3, nonlinear crystal II 10 are mounted on the rotation mirror holder along the rotation of plane of crystal normal
On；According to different incoming laser beam polarization states, the optical axis of crystal of nonlinear crystal I 3, nonlinear crystal II 10 is rotated, thus
Carry out corresponding angle adjustment.
Embodiment 2
By measuring device provided in this embodiment, its light channel structure is identical as the device in embodiment 1, wherein incident laser
Pulse center wavelength is 1053nm, and pulse width is about 10ps, and energy is about 10mJ, and beam size is 1cm × 1cm, horizontal inclined
Vibration, nonlinear crystal I 3, nonlinear crystal II 10 all select KDP material, non-linear using I saphe matching way of non-colinear
The optical axis of crystal I 3 is in vertical direction, and the optical axis of nonlinear crystal II 10 is horizontally oriented, the vertical side of nonlinear crystal I 3
To placement, nonlinear crystal II 10 and vertical plane are in about 10 ° of slant settings；
In one embodiment, first fixed angle and the second fixed angle are all 15 °, and third fixed angle is
17 °, the 4th fixed angle is 10 °, corresponding the first basic frequency beam reflected from reflecting mirror I 2 with reflected from reflecting mirror III 7 the
Two basic frequency beams are symmetrically projected simultaneously with 30 ° of angle and carry out frequency-doubled conversion on nonlinear crystal I 3, the frequency multiplication light beam of generation
It is emitted along I 3 surface normal direction of nonlinear crystal；The horizontal frequency multiplication light beam of outgoing with about 10 ° of angle, from guide-lighting microscope group 9 tiltedly
The third basic frequency beam being emitted downwards is with about 17 ° of angle while being incident on the progress frequency conversion of nonlinear crystal II 10, generates
Frequency tripling light beam along II 10 normal to a surface direction of nonlinear crystal be emitted, as shown in Figure 3.II 10 surface of nonlinear crystal goes out
The imaged lens 11 of the frequency tripling light beam penetrated are imaged onto CCD12, and CCD12 output is double delay third-order correlation signals, come from
Double delay third-order correlation signals of CCD12 finally enter computer and carry out data processing, obtain laser pulse shape information.
Embodiment 3
The present embodiment is identical as the light channel structure of embodiment 2, and data handling procedure is identical, the difference is that, incidence swashs
Light pulse is vertical polarization, at this time rotation nonlinear crystal I 3 and nonlinear crystal II 10, at the optical axis for making nonlinear crystal I 3
Vertical direction is in the optical axis of horizontal direction, nonlinear crystal II 10.
Embodiment 4
The present embodiment is identical as the light channel structure of embodiment 2, and data handling procedure is identical, the difference is that, incidence swashs
Light pulse is non-perpendicular, non-horizontal polarization, rotates nonlinear crystal I 3 and nonlinear crystal II 10 at this time, makes nonlinear crystal I 3
The frequency tripling light beam that two frequency multiplication light beams of output are most strong, nonlinear crystal II 10 exports is most strong.
Embodiment 5
A kind of method for the measurement of ultrashort pulse time waveform is present embodiments provided, this method is based on aforementioned
What the measuring device of any embodiment was realized.The measurement method the following steps are included:
Spectroscope 1 is set up in ultrashort pulse parallel beam incident side, is used for laser pulse after spectroscope 1
It is divided into the first transmitted light and the first reflected light.
Reflecting mirror I 2, nonlinear crystal I 3, absorbing sheet I 13 are set gradually on the first reflected light path of spectroscope 1, are being divided
On first transmitted light path of light microscopic I 1 be arranged spectroscope II 4 so that the first transmitted light of spectroscope I 1 after spectroscope II 4 again
It is divided into the second transmitted light and the second reflected light；Reflecting mirror II 5 is set on the second transmitted light path of spectroscope II 4, delay is adjusted
Save device I 6, reflecting mirror III 7, nonlinear crystal I 3, absorbing sheet II 14；Delay is set on the second reflected light path of spectroscope II 4
Adjuster II 8, guide-lighting microscope group 9, nonlinear crystal II 10, absorbing sheet III 15.
The direction of nonlinear crystal I 3, nonlinear crystal II 12 is rotated and adjusted according to the type of laser pulse, so that:
(a) the first reflected light of spectroscope I 1 obtains the first basic frequency beam after the reflection of reflecting mirror I 2, by first base
Frequency light beam projects nonlinear crystal I 3 with the first fixed angle, and remaining first basic frequency beam is after the outgoing of nonlinear crystal I 3
It is absorbed the absorption of piece I 13；
(b) the second transmitted light of spectroscope II 4 projects delay modulator I 6 after the reflection of reflecting mirror II 5 and carries out aplanatism
It adjusts, the light beam being emitted from delay modulator I 6 obtains corresponding second basic frequency beam after the reflection of reflecting mirror III 7, by described the
Two basic frequency beams project nonlinear crystal I 3 with the second fixed angle, and make remaining second basic frequency beam from nonlinear crystal
The absorption of piece II 14 is absorbed after I 3 outgoing；
It (c) will be from the first basic frequency beam that reflecting mirror I 2 reflects and more than the second basic frequency beam that reflecting mirror III 7 reflects
It states fixed angle while symmetrically projecting on nonlinear crystal I 3, by nonlinear crystal I 3 in the overlapping region of two light beams
Frequency-doubled conversion is carried out, two frequency multiplication light beams of generation are emitted along I 3 normal to a surface direction of nonlinear crystal；
(d) the delayed adjuster II 8 of the second reflected light of spectroscope II 4 projects guide-lighting microscope group after carrying out aplanatism adjusting
9 carry out optical path-deflecting, obliquely with third fixed angle by the third basic frequency beam after guide-lighting microscope group 9 carries out optical path-deflecting
It projects on nonlinear crystal II 10, and remaining third basic frequency beam is made to be absorbed piece III after the outgoing of nonlinear crystal II 10
15 absorb；
(e) by two frequency multiplication light beams being emitted along I 3 normal to a surface direction of nonlinear crystal with the 4th fixed angle with from leading
The third basic frequency beam that light microscopic group 9 is emitted obliquely is with third fixed angle while projecting the enterprising line frequency of nonlinear crystal II 10
The frequency tripling light beam of rate conversion, generation is emitted along II 10 surface normal direction of nonlinear crystal.
Imaging len 11, CCD12 are set on the frequency tripling beam exit direction；From II 10 table of nonlinear crystal
The imaged lens 11 of frequency tripling light beam in the normal direction of face are imaged onto CCD12, and CCD12 output is double delay third-order correlations
Signal；The external computer of CCD12, the signal from CCD12 enter computer and carry out data processing, obtain laser pulse shape letter
Breath.
The nonlinear crystal I 3, nonlinear crystal II 10 all use I saphe of non-colinear in one embodiment
Match, the optical axis of crystal is parallel with plane of crystal；Different crystalline materials such as BBO, KDP are selected according to different laser wavelength of incidence
Deng.
In one embodiment, the nonlinear crystal I 3, nonlinear crystal II 10 are mounted on along plane of crystal normal
On the rotation mirror holder of rotation；It thus can be according to different incoming laser beam polarization state rotating crystal optical axises, so as to adjust non-thread
The angle of property crystal I 3, nonlinear crystal II 10.
In one embodiment, described according to different incoming laser beam polarization state rotating crystal optical axises, so as to adjust non-
Linear crystal I 3, nonlinear crystal II 10 angle specifically include: when incident laser pulse be horizontal polarization when, rotate it is non-linear
The optical axis of crystal I 3 is in vertical direction, and the optical axis of nonlinear crystal II 10 is horizontally oriented；When incident laser pulse is perpendicular
When straight polarization, nonlinear crystal I 3 and nonlinear crystal II 10 are rotated, the optical axis of nonlinear crystal I 3 is made to be horizontally oriented, is non-
The optical axis of linear crystal II 10 is in vertical direction；When incident laser pulse be non-perpendicular, non-horizontal polarization, rotate non-linear crystalline substance
Body I 3 and nonlinear crystal II 10, the two frequency multiplication light beams for exporting nonlinear crystal I 3 are most strong, nonlinear crystal II 10 exports
Frequency tripling light beam is most strong.
In conclusion the embodiment of the present invention proposes the device and method for the measurement of ultrashort pulse time waveform,
The impulse waveform measurement of random polarization state can be effectively adapted to, measurement cost is low, structure is simple, and it is easy to adjust, it need to only rotate non-thread
Property crystal, so that it may realize and measure the autocorrelation signal of the ultrashort pulse of random polarization state that there is practical directive significance.
All features disclosed in this specification or disclosed all methods or in the process the step of, in addition to mutually exclusive
Feature and/or step other than, can combine in any way.
Any feature disclosed in this specification (including any accessory claim, abstract), unless specifically stated,
It is replaced by other equivalent or with similar purpose alternative features.That is, unless specifically stated, each feature is a series of
An example in equivalent or similar characteristics.
The invention is not limited to specific embodiments above-mentioned.The present invention, which expands to, any in the present specification to be disclosed
New feature or any new combination, and disclose any new method or process the step of or any new combination.
Claims (10)
1. a kind of device for the measurement of ultrashort pulse time waveform, which is characterized in that described device is in ultrafast laser arteries and veins
It rushes on parallel beam incident direction and is provided with spectroscope I (1), for laser pulse to be divided into the first transmitted light and the first reflection
Light；
Reflecting mirror I (2), nonlinear crystal I (3), spectroscope I are disposed on the first reflected light path of spectroscope I (1)
(1) the first reflected light obtains the first basic frequency beam after reflecting mirror I (2) reflection, and first basic frequency beam is fixed with first
Angle projects nonlinear crystal I (3)；
Spectroscope II (4) are set on the first transmitted light path of spectroscope I (1), the first transmitted light of spectroscope I (1) is through being divided
The second transmitted light and the second reflected light are again divided into after mirror II (4)；It is provided on the second transmitted light path of spectroscope II (4)
Reflecting mirror II (5), delay modulator I (6), reflecting mirror III (7), nonlinear crystal I (3), the second transmitted light of spectroscope II (4)
Delay modulator I (6) is projected after reflecting mirror II (5) reflection and carries out aplanatism adjusting, is emitted from delay modulator I (6)
Light beam obtains corresponding second basic frequency beam after reflecting mirror III (7) reflection, and second basic frequency beam is with the second fixed angle
Project nonlinear crystal I (3)；
First basic frequency beam of reflecting mirror I (2) reflection is with the second basic frequency beam reflected from reflecting mirror III (7) with the fixed angles
Degree symmetrically projects on nonlinear crystal I (3) simultaneously, is carried out in the overlapping region of two light beams by nonlinear crystal I (3)
Two frequency multiplication light beams of frequency-doubled conversion, generation are emitted along nonlinear crystal I (3) normal to a surface direction；
Delay modulator II (8), guide-lighting microscope group (9), nonlinear crystal are provided on the second reflected light path of spectroscope II (4)
Ⅱ(10)；The delayed adjuster II (8) of second reflected light of spectroscope II (4) projects guide-lighting microscope group after carrying out aplanatism adjusting
(9) optical path-deflecting is carried out, the third basic frequency beam after guide-lighting microscope group (9) carry out optical path-deflecting is oblique with third fixed angle
Under project on nonlinear crystal II (10), the two frequency multiplication light beams along the outgoing of nonlinear crystal I (3) normal to a surface direction are with the
Four fixed angles with third fixed angle while projecting non-thread with the third basic frequency beam being emitted obliquely from guide-lighting microscope group (9)
On property crystal II (10), frequency conversion is carried out in the overlapping region of two light beams by nonlinear crystal II (10), generation
Frequency tripling light beam is emitted along nonlinear crystal II (10) surface normal direction；
Imaging len (11) and CCD (12) are provided on frequency tripling beam exit direction；From nonlinear crystal II
(10) the imaged lens of frequency tripling light beam (11) on surface normal direction are imaged onto CCD (12), and CCD (12) output is double
Postpone third-order correlation signal；CCD (12) external computer, double delay third-order correlation signals from CCD (12) enter computer
Data processing is carried out, laser pulse shape information is obtained.
2. a kind of device for the measurement of ultrashort pulse time waveform as described in claim 1, which is characterized in that from
It is additionally provided with absorbing sheet I (13) on the first basic frequency beam direction that nonlinear crystal I (3) penetrates, for absorbing remaining first
Basic frequency beam；It is additionally provided with absorbing sheet II (14) on the second basic frequency beam direction penetrated from nonlinear crystal I (3), is used for
Absorb remaining second basic frequency beam；Suction is additionally provided on the third basic frequency beam direction penetrated from nonlinear crystal II (10)
Take up III (15), for absorbing remaining third basic frequency beam.
3. a kind of device for the measurement of ultrashort pulse time waveform as claimed in claim 1 or 2, which is characterized in that
The nonlinear crystal I (3) and nonlinear crystal II (10) is matched using I saphe of non-colinear, the optical axis of crystal and crystal table
Face is parallel.
4. a kind of device for the measurement of ultrashort pulse time waveform as claimed in claim 1 or 2, which is characterized in that
The nonlinear crystal I (3) and nonlinear crystal II (10) are all mounted on along the rotation mirror holder of plane of crystal normal rotation.
5. a kind of device for the measurement of ultrashort pulse time waveform as claimed in claim 1 or 2, which is characterized in that
First fixed angle and the second fixed angle are all 15 ° of incident angle, and third fixed angle is 17 °, the 4th fixed angle
It is 10 °.
6. a kind of device for the measurement of ultrashort pulse time waveform as claimed in claim 1 or 2, which is characterized in that
The leaded light microscope group (9) is by upper and lower two pieces guide-lighting mirrors: guide-lighting mirror I (901) and guide-lighting mirror II (902) are constituted；In basic frequency laser arteries and veins
It rushes in transmission direction and is disposed with guide-lighting mirror I (901) and guide-lighting mirror II (902), project the horizontal light beam of guide-lighting microscope group (9)
It is reflected vertically upward by guide-lighting mirror I (901) first, it is then by guide-lighting mirror II (902) that the light beam reflected vertically upward is oblique
Lower reflection, and the outgoing beam direction of guide-lighting microscope group (9) is vertical with incoming Level beam direction.
7. a kind of device for the measurement of ultrashort pulse time waveform as claimed in claim 1 or 2, which is characterized in that
According to different incoming laser beam polarization state rotating crystal optical axises, so as to adjust nonlinear crystal I (3), nonlinear crystal II
(10) angle specifically includes: when incident laser pulse is horizontal polarization, rotating nonlinear crystal I (3) and nonlinear crystal
II (10) make the optical axis of nonlinear crystal I (3) be in vertical direction, and the optical axis of nonlinear crystal II (10) is horizontally oriented；
When incident laser pulse is vertical polarization, nonlinear crystal I (3) and nonlinear crystal II (10) are rotated, nonlinear crystal I is made
(3) optical axis is horizontally oriented, the optical axis of nonlinear crystal II (10) is in vertical direction；When incident laser pulse is non-hangs down
Directly, non-horizontal polarization rotates nonlinear crystal I (3) and nonlinear crystal II (10), makes two times that nonlinear crystal I (3) exports
Frequency light beam is most strong, the frequency tripling light beam of nonlinear crystal II (10) output is most strong.
8. a kind of method for the measurement of ultrashort pulse time waveform, which comprises the following steps:
Spectroscope I (1) is set up in ultrashort pulse parallel beam incident side, laser pulse is divided into after spectroscope I (1)
First transmitted light and the first reflected light；
Reflecting mirror I (2), nonlinear crystal I (3) are set gradually on the first reflected light path of spectroscope I (1)；In spectroscope I
(1) on the first transmitted light path be arranged spectroscope II (4), the first transmitted light of spectroscope I (1) after spectroscope II (4) again
It is divided into the second transmitted light and the second reflected light；Reflecting mirror II (5) are set on the second transmitted light path of spectroscope II (4), are prolonged
Slow adjuster I (6), reflecting mirror III (7), nonlinear crystal I (3)；Delay is set on the second reflected light path of spectroscope II (4)
Adjuster II (8), guide-lighting microscope group (9), nonlinear crystal II (10)；
The optical axis of crystal of nonlinear crystal I (3), nonlinear crystal II (10) is rotated according to different incoming laser beam polarization states,
So as to adjust the angle of nonlinear crystal I (3), nonlinear crystal II (10), so that:
(a) the first reflected light of spectroscope I (1) obtains the first basic frequency beam after reflecting mirror I (2) reflection, by first base
Frequency light beam projects nonlinear crystal I (3) with the first fixed angle；
(b) the second transmitted light of spectroscope II (4) projects delay modulator I (6) after reflecting mirror II (5) reflection and carries out waiting light
Journey is adjusted, and the light beam being emitted from delay modulator I (6) obtains corresponding second basic frequency beam after reflecting mirror III (7) reflection, will
Second basic frequency beam projects nonlinear crystal I (3) with the second fixed angle；
It (c) will be from the first basic frequency beam that reflecting mirror I (2) reflects and more than the second basic frequency beam that reflecting mirror III (7) reflects
It states fixed angle while symmetrically projecting and carry out frequency-doubled conversion on nonlinear crystal I (3), two frequency multiplication light beams of generation are along non-linear
The outgoing of crystal I (3) normal to a surface direction；
(d) the delayed adjuster II (8) of the second reflected light of spectroscope II (4) projects guide-lighting microscope group after carrying out aplanatism adjusting
(9) optical path-deflecting is carried out, the third basic frequency beam after guide-lighting microscope group (9) carries out optical path-deflecting is oblique with third fixed angle
It projects on nonlinear crystal II (10) downwards；
(e) will along the two frequency multiplication light beams that nonlinear crystal I (3) normal to a surface direction is emitted with the 4th fixed angle with from leaded light
The third basic frequency beam that microscope group (9) is emitted obliquely is carried out on nonlinear crystal II (10) with third fixed angle while projecting
The frequency tripling light beam of frequency conversion, generation is emitted along nonlinear crystal II (10) surface normal direction；
Imaging len (11) and CCD (12) are set on the frequency tripling beam exit direction；From nonlinear crystal II
(10) the imaged lens of frequency tripling light beam (11) on surface normal direction are imaged onto CCD (12), and CCD (12) output is double
Postpone third-order correlation signal；CCD (12) external computer, double delay third-order correlation signals from CCD (12) enter computer
Data processing is carried out, laser pulse shape information is obtained.
9. a kind of method for the measurement of ultrashort pulse time waveform as claimed in claim 8, which is characterized in that also wrap
It includes step: being provided with absorbing sheet I (13) on the first basic frequency beam direction penetrated from nonlinear crystal I (3), it is surplus for absorbing
The first remaining basic frequency beam；Absorbing sheet II is provided on the second basic frequency beam direction penetrated from nonlinear crystal I (3)
(14), for absorbing remaining second basic frequency beam；On the third basic frequency beam direction penetrated from nonlinear crystal II (10)
It is provided with absorbing sheet III (15), for absorbing remaining third basic frequency beam.
10. a kind of method for the measurement of ultrashort pulse time waveform as claimed in claim 8 or 9, which is characterized in that
The optical axis of crystal that nonlinear crystal I (3), nonlinear crystal II (10) are rotated according to different incoming laser beam polarization states,
Angle so as to adjust nonlinear crystal I (3), nonlinear crystal II (10) specifically includes: when incident laser pulse is horizontal inclined
When vibration, the optical axis of rotation nonlinear crystal I (3) is in vertical direction, and the optical axis of nonlinear crystal II (10) is horizontally oriented；
When incident laser pulse is vertical polarization, nonlinear crystal I (3) and nonlinear crystal II (10) are rotated, nonlinear crystal I is made
(3) optical axis is horizontally oriented, the optical axis of nonlinear crystal II (10) is in vertical direction；When incident laser pulse is non-hangs down
Directly, non-horizontal polarization rotates nonlinear crystal I (3) and nonlinear crystal II (10), makes two times that nonlinear crystal I (3) exports
Frequency light beam is most strong, the frequency tripling light beam of nonlinear crystal II (10) output is most strong.
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111693156A (en) * | 2020-05-22 | 2020-09-22 | 广州市固润光电科技有限公司 | Ultrafast laser pulse width measuring device and control method thereof |
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| CN104121995A (en) * | 2014-07-01 | 2014-10-29 | 华南师范大学 | Device and method for measuring time-domain width of femtosecond pulse |
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