CN109547101A - The test macro of optical module - Google Patents
The test macro of optical module Download PDFInfo
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- CN109547101A CN109547101A CN201811530901.6A CN201811530901A CN109547101A CN 109547101 A CN109547101 A CN 109547101A CN 201811530901 A CN201811530901 A CN 201811530901A CN 109547101 A CN109547101 A CN 109547101A
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- 230000003287 optical effect Effects 0.000 title claims abstract description 252
- 238000012360 testing method Methods 0.000 title claims abstract description 184
- 238000001514 detection method Methods 0.000 claims description 26
- 238000011084 recovery Methods 0.000 claims description 23
- 238000011056 performance test Methods 0.000 claims description 11
- 238000002407 reforming Methods 0.000 claims description 10
- 238000012545 processing Methods 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 6
- 239000013307 optical fiber Substances 0.000 claims description 6
- 210000004209 hair Anatomy 0.000 claims description 5
- 230000008569 process Effects 0.000 claims description 5
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- 230000000149 penetrating effect Effects 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 7
- 238000012986 modification Methods 0.000 description 5
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- 238000006243 chemical reaction Methods 0.000 description 4
- 238000005538 encapsulation Methods 0.000 description 4
- 230000007717 exclusion Effects 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
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Abstract
The invention discloses a kind of test macros of optical module, wherein the test macro of optical module includes error code transmitting-receiving master chip, at least two optical interfaces, at least two electrical interfaces, test board, test equipment and single-chip microcontroller；The optical interface is connect with error code transmitting-receiving master chip, and the error code transmitting-receiving master chip, the test board and the test equipment are connect with the single-chip microcontroller.The present invention is used for grafting SFP/SFP+ optical transmitter module by the way that multiple optical interfaces and multiple electrical interfaces, optical interface is arranged, and electrical interface is for connecting RF cable, and then connecting test plate；Local reference clock, error code is given to receive and dispatch master chip and test equipment offer control instruction by single-chip microcontroller, realize the test simultaneously to more optical module/optical device light emitting performances or light-receiving performance, it realizes the testing scheme of diversification, effectively simplifies the device configuration of tester table, save the cost.
Description
Technical field
The present invention relates to optical module technical field more particularly to the test macros of optical module.
Background technique
Optical module is a kind of electronic device for photoelectric conversion, and the transmitting terminal of optical module converts the electric signal received
At optical signal, it is transmitted through the fiber to the receiving end of optical module, optical signal is converted into electric signal output again by receiving end.
The optical module test device of the prior art can not support the testing scheme of diversification, such as carry out the survey of multichannel
Examination, then need multiple devices, increase complexity and corresponding cost that tester table is built.
Summary of the invention
It is a primary object of the present invention to propose a kind of test macro of optical module, it is intended to realize diversification testing scheme,
Simplify the device configuration of tester table, and then save the cost.
To achieve the above object, the present invention provides a kind of test macro of optical module, including error code transmitting-receiving master chip, at least
Two optical interfaces, at least two electrical interfaces, test board, test equipment and single-chip microcontroller；The optical interface and error code transmitting-receiving are led
Chip connection, the error code transmitting-receiving master chip, the test board and the test equipment are connect with the single-chip microcontroller；
The error code receives and dispatches master chip, for receiving the required data rate and error code pattern that local reference clock provides,
And process of frequency multiplication is carried out to the required data rate and obtains specific data rate, and the error code pattern is configured to obtain
Specific pattern；The specific data rate collocation specific pattern is obtained into wave signal, and by wave signal through the optical interface
It exports to the first part to be measured, or export through the electrical interface to the second part to be measured；
The optical interface is used for the part to be measured of grafting first, wherein first part to be measured is SFP/SFP+ light emitting mould
Block；
The electrical interface for connecting RF cable, and then connects the test board；
The test board, for plugging the second part to be measured；Wherein, the described second part to be measured is non-SFP/SFP+ light emitting mould
Block or light emitting devices；
The test equipment, for testing the light emitting performance of the described first part to be measured or the second part to be measured；
The single-chip microcontroller, for being mentioned to the local reference clock, error code transmitting-receiving master chip and the test equipment
For control instruction；
The single-chip microcontroller is also used to the data of recording light emitting performance test.
Optionally, the error code transmitting-receiving master chip includes pseudorandom pattern generator, control unit, frequency multiplier circuit；It is multiple
The optical interface is connect with the pseudorandom pattern generator, the pseudorandom pattern generator and single-chip microcontroller with the control
Unit connection processed, the local reference clock are connect by frequency multiplier circuit with described control unit；
The frequency multiplier circuit, for being carried out after receiving the required data rate and error code pattern that local reference clock provides
Process of frequency multiplication obtains specific data rate and is sent to control unit processing；
Described control unit, for being sent to the pseudorandom pattern generator after receiving specific data rate；
The pseudorandom pattern generator obtains specific pattern for being handled the specific data rate, and will
The specific pattern collocation specific pattern obtains wave signal and is sent to the optical interface or the electrical interface.
Optionally, when testing the light emitting performance of first part to be measured, first part to be measured is plugged on the light
On interface；First part to be measured emits the first optical signal after passing through optical interface received wave signal, and first optical signal passes through
Optical fiber output is to the test equipment, to test the light emitting performance of the first part to be measured.
Optionally, when testing the light emitting performance of second part to be measured, second part to be measured is plugged on the survey
On test plate (panel), and the test board is plugged on the electrical interface by RF cable；Second part to be measured is connect by electrical interface
Emit the second optical signal after receiving the wave signal, second optical signal is by test equipment described in intelligent acess, to test
State the light emitting performance of the second part to be measured.
Optionally, the error code transmitting-receiving master chip further includes clock recovery unit and pseudo noise code detection unit, the light
Interface or electrical interface are connect with the clock recovery unit, and the clock recovery unit and the pseudo noise code detection unit connect
It connects, and the pseudo noise code detection unit is connect with described control unit；
The clock recovery unit, for obtaining reforming waveform after carrying out waveform reformation to the electric signal received, and will
The reformation waveform is sent to the pseudo noise code detection unit；
The pseudo noise code detection unit, for obtaining detection knot to the detection for reforming waveform progress error code and identification
Fruit, and will test result and be sent to described control unit；
The single-chip microcontroller is also used to record the testing result；
The optical interface is also used to grafting third part to be measured, wherein the third part to be measured is SFP/SFP+ light-receiving mould
Block；
The test board is also used to plug the 4th part to be measured, wherein the 4th part to be measured is non-SFP/SFP+ light-receiving
Module or light receiving element.
Optionally, when testing the light-receiving performance of the third part to be measured, the third part to be measured is plugged in the light
On interface；
First light source signal is converted to the first electric signal by the third part to be measured connecting with the optical interface, and described
One electric signal is sent to the clock recovery unit by optical interface.
Optionally, when testing the light-receiving performance of the 4th part to be measured, the 4th part to be measured is plugged in the survey
On test plate (panel), and the test board is plugged on the electrical interface by RF cable；
Second light source signal is converted to the second electric signal by the 4th part to be measured connecting with the test board, and described
Two electric signals are sent to the clock recovery unit by the test board and electrical interface.
Optionally, the first light source signal or the second light source signal are by error code transmitting-receiving master chip according to institute
It states after local reference clock obtains wave signal and is sent to the optical interface, and the SFP/SFP+ light emitting connected by the optical interface
Module receives the optical signal issued after the wave signal.
Optionally, when the part to be measured of the first part to be measured or third described in the optical interface grafting, the corresponding electricity of the optical interface
Interface forbids the second part to be measured or the 4th part to be measured described in grafting.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:
Compared with prior art, at least two optical interfaces and at least two are arranged in the test macro of optical module of the invention
Electrical interface, optical interface are used for grafting SFP/SFP+ optical transmitter module or SFP/SFP+ optical receiver module, and electrical interface is penetrated for connecting
Frequency cable, and then connecting test plate, and test board grafting is used for the non-SFP/SFP+ optical transmitter module of grafting or light emitting devices, or
Person is non-SFP/SFP+ optical receiver module or light receiving element, and cooperation error code transmitting-receiving master chip, test equipment and single-chip microcontroller are realized
At least two lane testings；Local reference clock, error code is given to receive and dispatch master chip and test equipment offer control instruction by single-chip microcontroller,
Realize the test simultaneously at least two optical modules/optical device light emitting performance or light-receiving performance；In the feelings of no external light source
Under condition, the test of 2 channel light-receiving performances can be carried out, can even test 4 SFP/ simultaneously in the case where no external light source
The emission rate of SFP+ optical module optical module identical with receiving velocity can only test a light with every equipment in the prior art
Module/optical device light emitting performance or light-receiving performance compare the first part to be measured, it can be achieved that four SFP/SFP+ optical modules
Either the second part to be measured in addition to SFP/SFP+ optical module while test, realize the testing scheme of diversification, effectively letter
Change the device configuration of tester table, save the cost.
Detailed description of the invention
In order to illustrate the technical solution of the embodiments of the present invention more clearly, below will be to needed in the embodiment attached
Figure is briefly described, it should be understood that the following drawings illustrates only certain embodiments of the present invention, therefore is not construed as pair
The restriction of range for those of ordinary skill in the art without creative efforts, can also be according to this
A little attached drawings obtain other relevant attached drawings.
Fig. 1 is the structural schematic diagram of the test macro of optical module of the present invention；
Fig. 2 is the structural schematic diagram of the light emitting performance test of the present invention the first part to be measured of test；
Fig. 3 is the structural schematic diagram of the light emitting performance test of the present invention the second part to be measured of test；
Fig. 4 is the structural schematic diagram of the light-receiving performance test of present invention test third part to be measured；
Fig. 5 is the structural schematic diagram of the light-receiving performance test of the present invention the 4th part to be measured of test；
Fig. 6 is the two of the first part to be measured of the invention test structure chart for receiving two hairs；
Fig. 7 is the two of the second part to be measured of the invention test structure chart for receiving two hairs.
Drawing reference numeral explanation:
| Label | Title | Label | Title |
| 10 | Error code receives and dispatches master chip | 20 | Optical interface |
| 30 | Electrical interface | 40 | Test board |
| 50 | Test equipment | 60 | Single-chip microcontroller |
| 100 | Pseudorandom pattern generator | 101 | Control unit |
| 102 | Frequency multiplier circuit | 103 | Pseudo noise code detection unit |
| 104 | Clock recovery unit |
The embodiments will be further described with reference to the accompanying drawings for the realization, the function and the advantages of the object of the present invention.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
In attached drawing, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described embodiment is
A part of the embodiment of the present invention, instead of all the embodiments.The present invention being usually described and illustrated herein in the accompanying drawings is implemented
The component of example can be arranged and be designed with a variety of different configurations.
Therefore, the detailed description of the embodiment of the present invention provided in the accompanying drawings is not intended to limit below claimed
The scope of the present invention, but be merely representative of selected embodiment of the invention.Based on the embodiments of the present invention, this field is common
Technical staff's every other embodiment obtained without creative efforts belongs to the model that the present invention protects
It encloses.
It should also be noted that similar label and letter indicate similar terms in following attached drawing, therefore, once a certain Xiang Yi
It is defined in a attached drawing, does not then need that it is further defined and explained in subsequent attached drawing.
Term " first ", " second ", " third ", " the 4th " etc. are only used for distinguishing description, and should not be understood as instruction or dark
Show relative importance.
In addition, term " parallel ", " vertical " etc. are not offered as requiring component absolute parallel or vertical, but can slightly incline
Tiltedly.It is not to indicate that the structure has to put down completely if " parallel " only refers to that its direction is more parallel with respect to for " vertical "
Row, but can be slightly tilted.
In the description of the present invention, it is also necessary to which explanation is unless specifically defined or limited otherwise, term " setting ",
" installation ", " connected ", " connection " shall be understood in a broad sense, for example, it may be fixedly connected, may be a detachable connection or one
Connect to body；It can be directly connected, the connection inside two elements can also be can be indirectly connected through an intermediary.
For the ordinary skill in the art, the concrete meaning of above-mentioned term in the present invention can be understood with concrete condition.
The present invention proposes a kind of test macro of optical module.
Referring to Fig.1, Fig. 1 is the structural schematic diagram of the test macro of optical module proposed by the present invention.
The test macro of optical module proposed by the present invention includes error code transmitting-receiving master chip 10, at least two optical interfaces 20, extremely
Few two electrical interfaces 30, test board 40, test equipment 50 and single-chip microcontroller 60；Optical interface 20 is connect with error code transmitting-receiving master chip 10,
Error code transmitting-receiving master chip 10, test board 40 and test equipment 50 are connect with single-chip microcontroller 60；
Error code receives and dispatches master chip 10, for receiving the required data rate and error code pattern that local reference clock provides, and
Process of frequency multiplication is carried out to required data rate and obtains specific data rate, and error code pattern is configured to obtain specific pattern；
Specific data rate specific pattern of arranging in pairs or groups is obtained into wave signal, and wave signal is exported through optical interface 20 to the first part to be measured, or
Through the output of electrical interface 30 to the second part to be measured；
Optical interface 20 is used for the part to be measured of grafting first；Wherein, the first part to be measured is SFP/SFP+ optical transmitter module；
Electrical interface 30, for connecting RF cable, and then connecting test plate 40；
Test board 40, for plugging the second part to be measured；Wherein, the second part to be measured includes for non-SFP/SFP+ optical transmitter module
Or light emitting devices；
Test equipment 50, for testing the light emitting performance of the described first part to be measured or the second part to be measured；
Single-chip microcontroller 60, for providing control instruction to local reference clock, error code transmitting-receiving master chip 10 and test equipment 50；
Single-chip microcontroller 60 is also used to the data of recording light emitting performance test.
The bit error rate refers to that for various reasons, digital signal inevitably results from mistake in transmission process, if
The signal of transmission is " 1 ", and the signal received is " 0 ", and here it is error codes, that is, a mistake has occurred.Certain
The bit number of mistake occurs in the digital signal received in time and the total bit number of digital signal that the same time is received it
Than being just called the bit error rate.The light-receiving performance test of this case, mainly test bit error rate problem.
Pseudo noise code is to be different from true random code, is that one kind can predefine and repeatedly can generate and answer
System, and the binary code sequence with random statistical characteristic, for assessing examining system under true environment to binary code sequence
The abilities such as generation, identification, the fidelity of column.
SFP/SFP+ module, SFP (SMALL FORM PLUGGABLE, small pluggable) module is the integrated module of optical transceiver
A kind of packing forms, SFP mainly for data rate be lower than 4.25Gbps optical module；SFP+ is then the upgrade version of SFP
This, mechanical dimension improves the design of electromagnetic shielding as SFP, changes interface definition, more mainly for data rate
High module, such as 10Gbps.The parameters such as the transmitting optical interface of the two, the size for receiving optical interface are consistent.
The test board of this case is the test board of the optical module test device of the prior art, and test board includes power supply, optical mode
Block electrical interface, RF cable electrical interface.
Test equipment is preferably oscillograph, the waveform diagram being related to for showing light-receiving performance or light emitting performance.
Light source, for providing light source to part to be measured when testing the light-receiving performance of third part to be measured or the 4th part to be measured,
It is also used to cascade with another system, light source can be provided by SFP/SFP+ optical module in its system, and its pseudorandom pattern occurs
Device, it is synchronous with local clock pulses.
In the prior art, the test macro of a set of optical module is all only one optical interface 20 and/or an electrical interface
30, channel all the way can only be tested every time, can only test an optical module or optical device every time, and testing efficiency is low, and this case is using more
The mode of a optical interface 20 and multiple electrical interfaces 30 is such as using light by the mutually exclusive operation between 60 control interface of single-chip microcontroller
When interface 20, the control of electrical interface 30 does not work；When using electrical interface 30, the control of optical interface 20 does not work, to reach simultaneously
Use multiple 20 grafting of optical interface, at least two SFP/SFP+ optical modules or at least two electrical interfaces, 30 connecting test plate
40, thus optical module and/or optical device of the grafting at least two in addition to SFP/SFP+ optical module.
Since error code transmitting-receiving master chip 10 is using the chip in the optical module test device of the prior art, the characteristics of the chip
It is at most to support four paths while being tested, therefore, the quantity of optical interface 20 and electrical interface 30 is at most four, passes through list
The control instruction of piece machine 60 cooperates, and single-chip microcontroller 60 mainly controls the mutually exclusive operation between optical interface 20 and corresponding electrical interface 30,
Therefore, test while realizing at most 4 paths of this system effectively avoids the optical module test device in the prior art direct
The interface of output error when increasing by four optical interfaces 20 or electrical interface 30, and cause the problem of test inaccuracy.
In the present embodiment, the quantity of optical interface 20 and electrical interface 30 is all four, and optical interface 20 is only used for grafting SFP/
SFP+ optical module, electrical interface 30 are used for optical module or optical device of the grafting other than SFP/SFP+.
Optical module inputs the light obtained after the electric signal and optical module electro-optic conversion of optical module and believes as Electrical-to-opticaconversion conversion component
It number is corresponding relationship, electric signal loss is converted into attenuated optical signal, believes from there through the different degrees of decaying simulated light of electric signal
Number decaying.
SFP optical module is a kind of packing forms of the integrated module of optical transceiver, and SFP is lower than mainly for data rate
4.25Gbps optical module；SFP+ is then the upgraded version of SFP, and mechanical dimension improves setting for electromagnetic shielding as SFP
Meter changes interface definition, mainly for the higher module of data rate, such as 10Gbps.The transmitting optical interface of the two receives light
The parameters such as the size of interface are consistent.Therefore, SFP optical module and SFP+ optical module are all plugged in optical interface 20.
Compared with prior art, multiple optical interfaces 20 and multiple electrical interfaces is arranged in the test macro of optical module of the invention
30, optical interface 20 is used for grafting SFP/SFP+ optical module, realizes that optical signal is converted into electric signal, electrical interface 30 is for connecting radio frequency
Cable, and then connecting test plate 40 realize electric signal conversion for second to be measured part of the grafting in addition to SFP/SFP+ optical module
For optical signal, to realize multiple channel test；Local reference clock, error code is given to receive and dispatch master chip 10 and test by single-chip microcontroller 60
Instrument 50 provides control instruction, realizes the test simultaneously to more optical module/optical device light emitting performances or light-receiving performance；
In the case where no external light source, the test of 2 channel light-receiving performances can be carried out, it even can be in the case where no external light source
The emission rate optical module identical with receiving velocity for testing 4 SFP/SFP+ optical modules simultaneously, sets with every in the prior art
Standby optical module/optical device light emitting performance or the light-receiving performance of can only testing is compared to, it can be achieved that four SFP/SFP+ light
The part to be measured of the first of module either the second part to be measured in addition to SFP/SFP+ optical module while test, realize diversification
Testing scheme effectively simplifies the device configuration of tester table, save the cost.
Further, error code transmitting-receiving master chip 10 includes pseudorandom pattern generator 100, control unit 101, frequency multiplier circuit
102；Multiple optical interfaces 20 are connect with pseudorandom pattern generator 100, pseudorandom pattern generator 100 and single-chip microcontroller 60 with
Control unit 101 connects, and local reference clock is connect by frequency multiplier circuit 102 with control unit 101；
Frequency multiplier circuit 102, for being carried out after receiving the required data rate and error code pattern that local reference clock provides
Process of frequency multiplication obtains specific data rate and is sent to the processing of control unit 101；
Control unit 101, for being sent to pseudorandom pattern generator 100 after receiving specific data rate；
Pseudorandom pattern generator 100, for being handled to obtain specific pattern for specific data rate, and by special code
The specific pattern of type collocation obtains wave signal and is sent to optical interface 20 or electrical interface 30.
Local reference clock is controlled for providing analog signal by single-chip microcontroller 60.The analog signal of local reference clock
Frequency multiplier circuit 102 is such as sent to according to the required data rate of customer demand and error code pattern, is mentioned by frequency multiplier circuit 102
Frequency processing is risen, the analog signal of such as local reference clock output 2.5K is handled to frequency multiplier circuit 102 by frequency multiplier circuit 102
The analog signal of the specific data rate of 10G is obtained afterwards；By treated, analog signal is sent to control unit to frequency multiplier circuit 102
101 processing, control unit 101 handle error code pattern and are sent to the processing of pseudorandom pattern generator 100, obtain specific pattern, and
And specific data rate specific pattern of arranging in pairs or groups is obtained wave signal and is sent to optical interface 20 or electrical interface 30.
Further, when testing the light emitting performance of the first part to be measured, the first part to be measured is plugged on optical interface 20；The
One part to be measured emits the first optical signal after passing through 20 received wave signal of optical interface, and the first optical signal passes through optical fiber output to tester
Device 50, to test the light emitting performance of the first part to be measured.
Referring to Fig. 2, such as the first part to be measured that module to be measured is SFP/SFP+ encapsulation, and data rate is less than 15Gbps,
The optical interface 20 that part to be measured can be then directly mounted to this equipment carries out corresponding light emitting performance test, at most supports 4 simultaneously
Optical module is tested.Optical interface A~D will be active at this time, and according to user demand, be controlled by single-chip microcontroller 60
Pseudorandom pattern generator 100 in error code transmitting-receiving master chip 10 generates corresponding data rate, pseudo noise code pattern；Electrical interface
1~4 can control error code transmitting-receiving master chip 10 by single-chip microcontroller 60 and carry out mutually exclusive operation, it is arranged according to user configuration situation
For battery saving mode, i.e. control electrical interface 1~4 stops working.
Further, when testing the light emitting performance of the second part to be measured, the second part to be measured is plugged on test board 40, and
Test board 40 is plugged on electrical interface 30 by RF cable；Second part to be measured emits the after passing through 30 received wave signal of electrical interface
Two optical signals, the second optical signal is by intelligent acess test equipment 50, to test the light emitting performance of the second part to be measured.
It, then can will referring to Fig. 3, the second part to be measured of the non-SFP/SFP+ optical transmitter module of module to be measured or light emitting devices
Second part to be measured is placed in external module test board 40, and the electric signal of electrical interface 1-4 is connected to module testing by RF cable
Plate 40 then carries out corresponding light-receiving parameter testing for receiving the reception electric signal of optical module.It could support up 4 at this time
Optical module is tested.Electrical interface 1-4 will be active at this time, and according to user demand, be controlled and missed by single-chip microcontroller 60
Pseudo noise code in code transmitting-receiving master chip 10 receives detector and generates corresponding data rate, pseudo noise code pattern；Optical interface A-D
Then error code transmitting-receiving 10 internal register of master chip can be controlled by single-chip microcontroller 60 and carry out mutually exclusive operation according to user configuration situation, it will
Be set as battery saving mode, i.e. optical interface A-D stops working.
Further, error code transmitting-receiving master chip 10 further includes clock recovery unit 104 and pseudo noise code detection unit 103,
Optical interface 20 or electrical interface 30 are connect with clock recovery unit 104, clock recovery unit 104 and pseudo noise code detection unit
103 connections, and pseudo noise code detection unit 103 is connect with control unit 101；
Clock recovery unit 104 for obtaining reforming waveform after carrying out waveform reformation to the electric signal received, and will weigh
Whole waveform is sent to pseudo noise code detection unit 103；
Pseudo noise code detection unit 103, for obtaining testing result to the detection and identification of reforming waveform progress error code, and
It will test result and be sent to control unit 101；
Single-chip microcontroller 60 is also used to record testing result；
Optical interface 20 is also used to grafting third part to be measured, wherein third part to be measured is SFP/SFP+ optical receiver module；
Test board 40 is also used to plug the 4th part to be measured, wherein the 4th part to be measured be non-SFP/SFP+ optical receiver module or
Light receiving element.
Further, when testing the light-receiving performance of third part to be measured, third part to be measured is plugged on optical interface 20；
First light source signal is converted to the first electric signal by the third connecting with optical interface 20 part to be measured, and the first electric signal is logical
It crosses optical interface and is sent to clock recovery unit 104.
Referring to Fig. 4,4 optical modules carry out light-receiving test, (light-receiving test mainly carries out sensitivity test, comments
Sentencing standard then is the size of the bit error rate), when needing while testing the light-receiving index of 4 optical modules, need 4 tunnels of external offer
The 4 tunnel first light source signals synchronous with this equipment clock；Wherein, 4 tunnel first light source signal is in another cascade system
The SFP/SFP+ optical transmitter module wave signal generated according to clock and the optical signal issued.
If module to be measured is the third part to be measured of SFP/SFP+ optical receiver module at this time, data rate is less than 15Gbps, and
The only light-receiving performance of test SFP/SFP+ encapsulation, then third part to be measured can be directly mounted at the optical interface A-D of this equipment into
The corresponding light-receiving performance test of row at most supports that 4 optical modules are tested simultaneously, and the third connecting with optical interface 20 is to be measured
First light source signal is converted to the first electric signal by part, and the first electric signal is sent to clock recovery unit 104 by optical interface, when
Clock recovery unit 104 obtains reforming waveform after carrying out waveform reformation to the first electric signal received, and will reform waveform and send
To pseudo noise code detection unit 103,103 pairs of the pseudo noise code detection unit detections for reforming waveform progress error code and identification are examined
Survey as a result, and will test result and be sent to control unit 101, and control unit 101 will test result and be sent to the note of single-chip microcontroller 60
Record and storage.Optical interface A-D will be active at this time, and according to user demand, control error code transmitting-receiving by single-chip microcontroller 60
Pseudo noise code in master chip 10 receives detector and generates corresponding data rate, pseudo noise code pattern；Electrical interface 1-4 then can be according to
According to user configuration situation, error code transmitting-receiving 10 internal register of master chip is controlled by single-chip microcontroller 60 and carries out mutually exclusive operation, it is arranged
For battery saving mode, i.e. electrical interface 1-4 is stopped working by the control of single-chip microcontroller 60.
Further, when testing the light-receiving performance of the 4th part to be measured, the 4th part to be measured is plugged on test board 40, and
Test board 40 is plugged on electrical interface 30 by RF cable；
Second light source signal is converted to the second electric signal by the 4th part to be measured connecting with electrical interface 30, and the second electric signal is logical
It crosses test board and electrical interface is sent to clock recovery unit 104.
Referring to Fig. 5, module to be measured is the 4th part to be measured of non-SFP/SFP+ optical receiver module or light receiving element, then may be used
4th part to be measured is placed in external module test board 40, the electric signal of electrical interface 1-4 is connected to module by RF cable and is surveyed
Test plate (panel) 40, at this time, it may be necessary to which external provide 4 tunnels the 4 road second light source signals synchronous with this system clock, wherein 4 road second light sources
Signal is the wave signal that the SFP/SFP+ optical transmitter module in another cascade system is generated according to clock and the light issued
Signal.
It could support up 4 optical modules at this time to be tested, the 4th part to be measured connecting with test board 40 believes second light source
The second electric signal number is converted to, the second electric signal is sent to clock recovery unit 104, clock by test board 40 and electrical interface 30
Recovery unit 104 obtains reforming waveform after carrying out waveform reformation to the second electric signal received, and is sent to waveform is reformed
Pseudo noise code detection unit 103,103 pairs of the pseudo noise code detection unit detections for reforming waveform progress error code and identification are detected
As a result, and will test result and be sent to control unit 101, and control unit 101 will test result and be sent to the record of single-chip microcontroller 60
And storage.Electrical interface 1-4 will be active at this time, and according to user demand, control error code transmitting-receiving master by single-chip microcontroller 60
Pseudorandom pattern generator 100 in chip 10 generates corresponding data rate, pseudo noise code pattern；Optical interface A-D then can be according to
According to user configuration situation, error code transmitting-receiving 10 internal register of master chip is controlled by single-chip microcontroller 60 and carries out mutually exclusive operation, it is arranged
For battery saving mode.
Further, first light source signal or second light source signal are by error code transmitting-receiving master chip according to local reference
Clock is sent to the optical interface after obtaining wave signal, and the SFP/SFP+ optical transmitter module connected by the optical interface receives
The optical signal issued after the wave signal.
In the present embodiment, first light source or second light source can be provided by local reference clock, can also be by cascade system
Reference clock provide, either, sent out for two time receivings when two, referring to Fig. 6, such as the equal grafting SFP/SFP+ of optical interface A and optical interface B
Optical receiver module, the standard optical module applicable of optical interface C and the equal grafting SFP/SFP+ optical transmitter module of optical interface D are corresponding by optical interface C
SFP/SFP+ optical transmitter module connected by corresponding with the optical interface B SFP/SFP+ optical receiver module of optical fiber, at this point, optical interface
The corresponding SFP/SFP+ optical receiver module of B provides light source by the corresponding SFP/SFP+ optical transmitter module of optical interface C；By optical interface
The corresponding SFP/SFP+ optical transmitter module of D is connected by optical fiber SFP/SFP+ optical receiver module corresponding with optical interface A, at this point,
The corresponding SFP/SFP+ optical receiver module of optical interface A provides light source by the corresponding SFP/SFP+ optical transmitter module of optical interface D, i.e.,
Two two time receivings of hair, first light source are provided by this system.The offer principle of second light source is similar, is not repeating.
Further, when the part to be measured of the first part to be measured or third described in the optical interface grafting, the optical interface is corresponding
Electrical interface forbids the second part to be measured or the 4th part to be measured described in grafting.
Further, light-receiving test is carried out for 2 optical modules, specific as follows:
Referring to Fig. 6, if module to be measured is the first part to be measured of SFP/SFP+ encapsulation, and data rate is less than 15Gbps,
The optical interface that part to be measured can be then directly mounted to this equipment carries out corresponding light-receiving performance test, and 2 thirds are to be measured at this time
Part will occupy two-way optical interface, temporarily be defined as optical interface A, B.Simultaneously by the mark of other two the first SFP/SFP+ optical transmitter modules
The case where quasi- product are inserted into optical interface C, D, use as testing light source, are not introducing external module test board at this time, external light source
Under, this equipment at most supports 2 optical modules to carry out receiving sensitivity (error code) test simultaneously.Optical interface A-D will be in sharp at this time
State living, and according to user demand, by single-chip microcontroller control error code receive and dispatch pseudorandom pattern generator in master chip and it is pseudo- with
Machine code receives detector and generates the data rate to match, pseudo noise code pattern；Electrical interface 1-4 then can be according to user configuration feelings
Condition carries out mutually exclusive operation by single-chip microcontroller control error code transmitting-receiving master chip internal register, sets battery saving mode for it.
It is understood that when the optical module that SFP/SFP+ is encapsulated, emission rate and equal receiving velocity, transmitting
The optical signal that optical port issues, which can be expired by optical fiber from ring, receives optical port, to test its bit error rate for receiving optical signal；It is this
In the case of, the reception bit error rate of 4 optical modules can be tested, and because optical module can provide light source without external with internal loopback.
Referring to Fig. 7, if the second part to be measured of the non-SFP/SFP+ encapsulation of module to be measured, can send out 2 SFP/SFP+ light
Module standard product insertion optical interface C, D to be penetrated, is used as testing light source, 2 the 4th parts to be measured are then placed in external module test board,
The electric signal of electrical interface 1,2 (tentative) is connected to module testing plate by RF cable, for receiving the reception electricity of optical module
Signal then carries out corresponding light-receiving parameter testing.It could support up 2 optical modules in the case of this while carrying out reception test.
Optical interface A at this time, B and electrical interface 1,2 will be active, and according to user demand, control error code transmitting-receiving by single-chip microcontroller
Pseudorandom pattern generator and pseudo noise code in master chip receive detector and generate corresponding data rate, pseudo noise code code
Type；Optical interface C, D and electrical interface 1,2 can be according to user configuration situations, by posting inside single-chip microcontroller control error code transmitting-receiving master chip
Storage carries out mutually exclusive operation, sets battery saving mode for it.
Since optical interface A is corresponding with electrical interface 1, optical interface B is corresponding with electrical interface 2, and optical interface C is corresponding with electrical interface 3, light
Interface D is corresponding with electrical interface 4, can be due to the self-excitation of reference clock if above-mentioned every group of optical electrical interface is active simultaneously
Phenomenon is encouraged, causes error code to receive test side and judges by accident, for the generation for avoiding this phenomenon, setting is write by the rule of single-chip microcontroller
Error code receives and dispatches the mutual exclusion rule of master chip internal register, will be in mutual exclusion state between optical interface A- electrical interface 1, it is above-mentioned remaining
Three groups of optical electrical interfaces make same mutual exclusion rule setting.
Mutual exclusion rule is arranged for every group of optical electrical interface in internal register, including, to the ground of each optical interface, electrical interface
T/F value is arranged in location, so that every group of optical electrical interface is when optical interface accesses, opposite electrical interface is disconnected；When electrical interface accesses, phase
Pair optical interface disconnect.
In the present invention, master chip scheme is received and dispatched using existing error code, its external high-speed interface has been maximally utilized, has been expanded
It opens up to the design of+4 optical interface of 4 electrical interface, by multichannel electrical interface, optical interface focuses on same test equipment, and reduction board is built
Complexity, save the cost.
It, will be multiple using reference clock input/output function provided by the invention when number of packages amount to be measured is greater than 4
Equipment is cascaded, and at this time due to being cascaded using unified clock, the data before distinct device will synchronize to unified
Phase will not have an impact the test of transmitting eye figure or receiving sensitivity test.
Although preferred embodiments of the present invention have been described, it is created once a person skilled in the art knows basic
Property concept, then additional changes and modifications may be made to these embodiments.So it includes excellent that the following claims are intended to be interpreted as
It selects embodiment and falls into all change and modification of the scope of the invention.
Obviously, various changes and modifications can be made to the invention without departing from essence of the invention by those skilled in the art
Mind and range.In this way, if these modifications and changes of the present invention belongs to the range of the claims in the present invention and its equivalent technologies
Within, then the present invention is also intended to include these modifications and variations.
Claims (9)
1. a kind of test macro of optical module, which is characterized in that including error code transmitting-receiving master chip, at least two optical interfaces, at least
Two electrical interfaces, test board, test equipment and single-chip microcontroller；The optical interface is connect with error code transmitting-receiving master chip, the mistake
Code transmitting-receiving master chip, the test board and the test equipment are connect with the single-chip microcontroller；
The error code receives and dispatches master chip, for receiving the required data rate and error code pattern that local reference clock provides, and it is right
Data rate needed for described carries out process of frequency multiplication and obtains specific data rate, and is configured to obtain to the error code pattern specific
Pattern；The specific data rate collocation specific pattern is obtained into wave signal, and wave signal is exported through the optical interface
It exports to the first part to be measured, or through the electrical interface to the second part to be measured；
The optical interface is used for the part to be measured of grafting first, wherein first part to be measured is SFP/SFP+ optical transmitter module；
The electrical interface for connecting RF cable, and then connects the test board；
The test board, for plugging the second part to be measured；Wherein, the described second part to be measured be non-SFP/SFP+ optical transmitter module or
Light emitting devices；
The test equipment, for testing the light emitting performance of the described first part to be measured or the second part to be measured；
The single-chip microcontroller, for providing control to the local reference clock, error code transmitting-receiving master chip and the test equipment
System instruction；
The single-chip microcontroller is also used to the data of recording light emitting performance test.
2. the test macro of optical module as described in claim 1, which is characterized in that error code transmitting-receiving master chip include it is pseudo- with
Machine pattern generator, control unit, frequency multiplier circuit；Multiple optical interfaces are connect with the pseudorandom pattern generator, institute
State pseudorandom pattern generator and single-chip microcontroller connect with described control unit, it is described local reference clock by frequency multiplier circuit with
Described control unit connection；
The frequency multiplier circuit, for carrying out frequency multiplication after receiving the required data rate and error code pattern that local reference clock provides
Processing obtains specific data rate and is sent to control unit processing；
Described control unit, for being sent to the pseudorandom pattern generator after receiving specific data rate；
The pseudorandom pattern generator obtains specific pattern for being handled the specific data rate, and will be described
The specific pattern collocation specific pattern obtains wave signal and is sent to the optical interface or the electrical interface.
3. the test macro of optical module as claimed in claim 2, which is characterized in that in the light hair for testing first part to be measured
When penetrating performance, first part to be measured is plugged on the optical interface；First part to be measured passes through optical interface received wave signal
After emit the first optical signal, first optical signal is by optical fiber output to the test equipment, to test the first part to be measured
Light emitting performance.
4. the test macro of optical module as claimed in claim 2, which is characterized in that in the light hair for testing second part to be measured
When penetrating performance, second part to be measured is plugged on the test board, and the test board be plugged on by RF cable it is described
On electrical interface；Second part to be measured emits the second optical signal, the second light letter after receiving the wave signal by electrical interface
Number by test equipment described in intelligent acess, to test the light emitting performance of the described second part to be measured.
5. the test macro of optical module as claimed in claim 2, which is characterized in that when the error code transmitting-receiving master chip further includes
Clock recovery unit and pseudo noise code detection unit, the optical interface or electrical interface are connect with the clock recovery unit, described
Clock recovery unit is connect with the pseudo noise code detection unit, and the pseudo noise code detection unit and described control unit connect
It connects；
The clock recovery unit, for obtaining reforming waveform after carrying out waveform reformation to the electric signal received, and will be described
It reforms waveform and is sent to the pseudo noise code detection unit；
The pseudo noise code detection unit, for obtaining testing result to the detection for reforming waveform progress error code and identification,
And it will test result and be sent to described control unit；
The single-chip microcontroller is also used to record the testing result；
The optical interface is also used to grafting third part to be measured, wherein the third part to be measured is SFP/SFP+ optical receiver module；
The test board is also used to plug the 4th part to be measured, wherein the 4th part to be measured is non-SFP/SFP+ optical receiver module
Or light receiving element.
6. the test macro of optical module as claimed in claim 5, which is characterized in that connect in the light for testing the third part to be measured
When receiving performance, the third part to be measured is plugged on the optical interface；
First light source signal is converted to the first electric signal, first electricity by the third part to be measured connecting with the optical interface
Signal is sent to the clock recovery unit by optical interface.
7. the test macro of optical module as claimed in claim 5, which is characterized in that connect in the light for testing the 4th part to be measured
When receiving performance, the 4th part to be measured is plugged on the test board, and described in the test board is plugged in by RF cable
On electrical interface；
Second light source signal is converted to the second electric signal, second electricity by the 4th part to be measured connecting with the test board
Signal is sent to the clock recovery unit by the test board and electrical interface.
8. the test macro of optical module as claimed in claims 6 or 7, which is characterized in that the first light source signal or described
Second light source signal is to be sent to institute after receiving and dispatching the wave signal that master chip is obtained according to the local reference clock by the error code
Optical interface is stated, and the SFP/SFP+ optical transmitter module by connecting with the optical interface receives the light letter issued after the wave signal
Number.
9. such as the test macro of optical module described in any item of the claim 1 to 8, which is characterized in that the optical interface grafting
When first part to be measured or third part to be measured, the corresponding electrical interface of the optical interface forbids the second part to be measured described in grafting or
Four parts to be measured.
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|---|---|---|---|
| CN201811530901.6A CN109547101A (en) | 2018-12-13 | 2018-12-13 | The test macro of optical module |
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|---|---|---|---|
| CN201811530901.6A CN109547101A (en) | 2018-12-13 | 2018-12-13 | The test macro of optical module |
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| CN110752872A (en) * | 2019-10-28 | 2020-02-04 | 深圳市欧深特信息技术有限公司 | SFP optical module debugging method and system |
| CN110784259A (en) * | 2019-11-05 | 2020-02-11 | 中电科仪器仪表有限公司 | PAM 4-based integrated optical module error code tester |
| CN110855353A (en) * | 2019-11-19 | 2020-02-28 | 中电科仪器仪表有限公司 | Error code tester and test system suitable for various types of optical modules |
| CN113824496A (en) * | 2021-11-24 | 2021-12-21 | 武汉普赛斯电子技术有限公司 | Test method and test device for Combo optical device |
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