CN109471196A - Millimeter wave terahertz imaging equipment and object identification classification method - Google Patents
Millimeter wave terahertz imaging equipment and object identification classification method Download PDFInfo
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- G—PHYSICS
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- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/005—Prospecting or detecting by optical means operating with millimetre waves, e.g. measuring the black losey radiation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/10—Detecting, e.g. by using light barriers
- G01V8/20—Detecting, e.g. by using light barriers using multiple transmitters or receivers
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Abstract
A kind of millimeter wave terahertz imaging equipment for checked object progress safety inspection comprising condenser lens, polarization piece turntable, detector and graphic processing facility.Polarization piece turntable is rotatable and is provided with multiple micropolar pieces, and it is arranged between checked object and condenser lens or is arranged between condenser lens and detector, and can be polarized by a micropolar piece in multiple micropolar pieces for being disposed thereon to checked object spontaneous radiation or reflected millimeter wave THz wave in a default particular moment of polarization piece turntable rotation；Condenser lens is configured to focus checked object spontaneous radiation or reflected millimeter wave THz wave on the detector；Detector is arranged on the focal plane of condenser lens and the millimeter wave THz wave that is configured to be focused on and be polarized is converted into the polarization image of checked object；And graphic processing facility is configured to processing polarization image to carry out identification classification to checked object.
Description
Technical field
This disclosure relates to which safety check technical field, more particularly to a kind of millimeter wave terahertz imaging equipment, and utilizes upper
It states millimeter wave terahertz imaging equipment and is detected method to carry out object identification classification to object.
Background technique
It is similar to optical camera in existing passive millimeter wave terahertz imaging, it is (every using a two two-dimensional fronts
A array element detector (perhaps radiometer or wave detector, can either direct detection be also possible to, indirect detection) it is right
Answer a pixel, a front be made of the array element of array format), to field of regard formation stare, do not need scanning, it can be achieved that
Real time imagery.
In view of the cost of millimeter wave terahertz detector, focal plane direct imaging mode is taken to will lead to completely whole
A system cost is sufficiently expensive.So in practical applications in order to combine the requirement of system cost and imaging rate, for
Two-dimensional imaging, current dominant systems are all made of a certain number of radiometers and realize plus the mode of mechanical scanning to entire visual field
Scanning covering, lower few demand to detector number by sacrificing imaging time, to reduce the cost of whole system.
The existing passive millimeter wave terahertz imaging safety check apparatus based on focal plane imaging either uses radiometer
Direct detection or heterodyne method indirect detection, can only all pass through suspicious item (such as mobile phone, banknote, cutter, pistol) and people
Temperature difference between body shows the image shape of suspicious item, and then determines whether human body carries suspicious item, and can not be to suspicious item
Carry out object identification.Usual body surface temperature is higher than suspicious item, shows that human body is white on imaging gray level image, and suspicious
Object is black.In general, either machine recognition or manual identified, can not by analogous shape and the belt fastener of size, mobile phone,
Metal block, medium block and bank note etc. carry out object identification.
In addition the resolution ratio (object space to) of current passive type human body safety check transposition generally only has 2-3cm, this resolution ratio pair
It is incomplete in carrying out object classification and object identification by size and shape.
Summary of the invention
The purpose of the disclosure is in terms of solving at least one of above-mentioned technical problem, provides a kind of millimeter wave Terahertz
Imaging device and its object identification and classification method carried out using the equipment.It can by the millimeter wave terahertz imaging equipment
On the basis of not generating harmful radiation to human body, object is identified to classify to object, and the object recognized is big
It is small to reach millimetre-sized structure.
According to one aspect of the disclosure, provide it is a kind of for checked object carry out safety inspection millimeter wave too
Hertz imaging device comprising condenser lens, polarization piece turntable, detector and graphic processing facility, wherein
The polarization piece turntable is rotatable and is provided with multiple micropolar pieces, and is arranged saturating in checked object and the focusing
Between mirror or be arranged between the condenser lens and the detector, and polarization piece turntable rotation one preset it is specific
Moment can be by a micropolar piece in multiple micropolar pieces for being disposed thereon to checked object spontaneous radiation or reflection
Millimeter wave THz wave back polarizes；
The condenser lens is configured to focus checked object spontaneous radiation or reflected millimeter wave THz wave
On the detector；
The detector is arranged on the focal plane of the condenser lens, and is configured to be focused on and be polarized
Millimeter wave THz wave be converted into the polarization image of checked object, thus in the default different moments of polarization piece turntable rotation
Each moment obtains the polarization image of the corresponding checked object of a width；And
The graphic processing facility is set to the side far from the polarization piece turntable of the detector, and is configured to
The polarization image is handled to carry out identification classification to checked object.
According to one embodiment of the disclosure, each micropolar piece in the multiple micropolar piece all polarized or by
Partial polarization.
According to another embodiment of the present disclosure, the quantity of the polarisation angles of the multiple micropolar piece is N, the multiple micro-
The quantity of polarization piece is M, and wherein N is the positive integer more than or equal to 3, and M is the integral multiple of N.
According to another embodiment of the present disclosure, the multiple micropolar piece along it is described polarization piece turntable circumferencial direction etc.
Angle it is arranged.
According to another embodiment of the present disclosure, a quilt in the default particular moment, the multiple micropolar piece
All the part that is polarized of polarized micropolar piece or a micropolar piece by partial polarization is directed at the detector, to obtain
Obtain the polarization image of checked object.
According to another embodiment of the present disclosure, in the default particular moment, the polarization piece turntable it is not set described
The part of micropolar piece is directed at a micropolar piece by partial polarization in the detector or the multiple micropolar piece
The part that is not polarized be directed at the device, to obtain the unpolarized image of checked object.
According to another embodiment of the present disclosure, when the piece turntable that polarizes rotates a circle, the detector obtains tested pair of M width
The polarization image of elephant, the polarization image of the M width checked object include N number of polarisation angles.
According to another embodiment of the present disclosure, when the piece turntable that polarizes rotates a circle, the detector obtains tested pair of M width
The unpolarized image of elephant.
According to another embodiment of the present disclosure, the multiple micropolar piece is made of multiple macro pixel units, each macro picture
Plain unit includes polarisation angles N number of micropolar piece different from each other.
According to another embodiment of the present disclosure, N number of micropolar piece of each macro pixel unit include as under type extremely
Few one kind: N number of linear polarization micropolar piece；N-1 linear polarization micropolar piece and a circular polarisation micropolar piece；N number of partial polarization
Micropolar piece.
According to another embodiment of the present disclosure, the polarisation angles of N number of linear polarization micropolar piece be respectively Deg1, Deg2,
Deg3 ... DegN, wherein
Wherein i is the positive integer less than or equal to N.
According to another embodiment of the present disclosure, the polarisation angles of N-1 linear polarization micropolar piece be respectively Deg1, Deg2,
Deg3 ... DegN-1, wherein
Wherein i is the positive integer less than or equal to N-1；Circular polarisation includes left-hand circular polarization
At least one of with right-handed circular polarization.
According to another embodiment of the present disclosure, polarisation angles are fixed or adjustable.
According to another embodiment of the present disclosure, millimeter wave terahertz imaging equipment further includes millimeter wave terahertz emission source,
It is used to radiate millimeter wave THz wave to checked object.
According to another aspect of the present disclosure, a kind of use millimeter wave terahertz according to any of the above-described embodiment is also provided
The hereby method that imaging device carries out object identification classification, comprising:
So that the polarization piece turntable rotation,
So that one that checked object spontaneous radiation or reflected millimeter wave THz wave are rotated in polarization piece turntable
Default particular moment is polarized and focused on the detector by the condenser lens by a micropolar piece；
By the detector, it converts the millimeter wave THz wave for being focused on and being polarized to the pole of checked object
Change image, to obtain the pole of the corresponding checked object of a width at each moment of the default different moments of polarization piece turntable rotation
Change image；
The polarization image is handled using described image processing unit to obtain high-resolution polarization image；
High-resolution polarization image based on acquisition, utilizes automatic identification algorithm to carry out object identification classification.
According to one embodiment of the disclosure, multiple micropolar pieces are provided on the polarization piece turntable, it is the multiple micro-
The quantity of the polarisation angles of polarization piece is N, and the quantity of the multiple micropolar piece is M, and wherein N is the positive integer more than or equal to 3,
M is the integral multiple of N, so that the detector obtains checked object in M different moments when the piece turntable that polarizes rotates a circle
M width polarization image, and M unpolarized image for obtaining checked object；
Wherein, the step of handling the polarization image using described image processing unit to obtain high-resolution polarization image
Include:
S1: N group low resolution polarization image is extracted from M width polarization image, every group of low resolution polarization image includes having
The M/N width polarization image of one identical polarisation angles；
S2: to include M width non-polarized image high-resolution non-polarized image be grouped, obtain N group low resolution without
Polarize image, and every group of low resolution non-polarized image includes M/N width non-polarized image；
S3: by the N group low resolution polarization image obtained by step S1 in the N group low resolution obtained by step S2
Under the guidance of non-polarized image, the intermediate image of the different polarisation angles of N group is obtained by interpolation, then again in obtained N group
Between non-polarized image be individually subtracted in image polarize difference image to get to N group low resolution, every group of low resolution polarization difference image
Including M/N width polarization difference image；
S4: at the N group polarization difference image obtained using bilinearity difference, the processing method of up-sampling to step S3
Reason, obtains N group high-resolution polarization difference image, and every group of high-resolution polarization difference image includes M width polarization difference image；And
S5: what N group high-resolution that step S4 is obtained polarization difference image was obtained with step S2 respectively includes M width non-polarized
The high-resolution non-polarized image of image is summed, and N group high-resolution polarization image, every group of high-resolution polarization are finally obtained
Image includes M width polarization image.
According to another embodiment of the present disclosure, multiple micropolar pieces are provided on the polarization piece turntable, it is the multiple micro-
The quantity of the polarisation angles of polarization piece is N, and the quantity of the multiple micropolar piece is M, and wherein N is the positive integer more than or equal to 3,
M is the integral multiple of N, so that the detector obtains checked object in M different moments when the piece turntable that polarizes rotates a circle
M width polarization image；
Wherein, the step of handling the polarization image using described image processing unit to obtain high-resolution polarization image
Include:
S1 ': N group low resolution polarization image is extracted from M width polarization image, every group of low resolution polarization image includes having
The M/N width polarization image of one identical polarisation angles；
S2 ': the non-polarized intensity data of M width polarization image is estimated, high-resolution non-polarized image, high-resolution are obtained
Non-polarized image includes M width non-polarized image, and
M width non-polarized image is grouped, N group low resolution non-polarized image, every group of low resolution non-polarized are obtained
Image includes M/N width non-polarized image；
S3 ': by the N group low resolution polarization image obtained by step S1 in the low resolution of N group obtained by step S2
Under the guidance of rate non-polarized image, the intermediate image of the different polarisation angles of N group is obtained by interpolation, then again in obtained N group
Non-polarized image is individually subtracted in intermediate image to get to N group low resolution polarization difference image, every group of low resolution polarization is poor to be schemed
As including M/N width polarization difference image；
S4 ': at the N group polarization difference image obtained using bilinearity difference, the processing method of up-sampling to step S3
Reason, obtains N group high-resolution polarization difference image, and every group of high-resolution polarization difference image includes M width polarization difference image；And
S5 ': the N group high-resolution polarization difference image that step S4 is obtained is obtained with step S2 respectively electrodeless including M
The high-resolution non-polarized image for changing image is summed, and N group high-resolution polarization image, every group of high resolution pole are finally obtained
Changing image includes M width polarization image.
According to another embodiment of the present disclosure, the polarization image is handled to obtain high score using described image processing unit
The step of resolution polarization image further include: S6: for the high-resolution polarization figure with polarization information obtained in step s 5
Resolution ratio is improved as carrying out super-resolution image Processing Algorithm.
According to the millimeter wave terahertz imaging equipment of the disclosure and the side of the object identification classification carried out using the equipment
In method, by be arranged include multiple micropolar pieces and can rotary polarization piece turntable, and polarization piece turntable rotation one
Default particular moment can be by a micropolar piece in multiple micropolar pieces for being disposed thereon to the spontaneous spoke of checked object
It penetrates or reflected millimeter wave THz wave polarizes, therefore in each of the default different moments of polarization piece turntable rotation
At the moment, detector obtains the polarization image of the corresponding checked object of a width, so as to obtain the polarization diagram of multiple checked objects
Picture.These polarization images are by that can obtain the high-resolution image with polarization information after image processing device processes.
Polarization imaging technique can not only detect the structural information of body surface, such as roughness and texture, additionally it is possible to detecting object table
The information such as conductivity, the refractive index in face, this scheme (can only detect body surface than existing passive type terahertz imaging instrument
Strength information) more information are provided, these information are highly useful to object classification and object identification.Pass through acquisition
Polarization information, such as material different surfaces texture, roughness, refractive index, conductivity etc., can to analogous shape and size can
Doubtful object is distinguished, that is, is identified and classified.In addition, can recognize according to the millimeter wave terahertz imaging equipment of the disclosure
Article size can narrow down to a millimeter rank.
Detailed description of the invention
Fig. 1 shows the passive millimeter wave terahertz imaging equipment according to one embodiment of the disclosure.
Fig. 2 shows the active millimeter wave terahertz imaging equipment according to one embodiment of the disclosure.
Fig. 3 shows the schematic diagram of the polarization piece turntable according to one embodiment of the disclosure.
Fig. 4 shows the rough schematic view of the macro pixel unit of the polarization piece turntable according to one embodiment of the disclosure.
Fig. 5 shows the rough schematic view of the macro pixel unit of the polarization piece turntable according to one embodiment of the disclosure.
Fig. 6 shows the rough schematic view of the macro pixel unit of the polarization piece turntable according to one embodiment of the disclosure.
Fig. 7 shows the M image obtained according to the detector of one embodiment of the disclosure.
Fig. 8 shows the 4 groups of low resolutions extracted in the image obtained according to the slave detector of one embodiment of the disclosure
Rate polarization image.
Specific embodiment
Although being answered the disclosure is fully described referring to the attached drawing of the preferred embodiment containing the disclosure before being described herein
Disclosure described herein can be modified by understanding those skilled in the art, while obtain the technical effect of the disclosure.Cause
This, it should be understood that above description is an extensive announcement for those of ordinary skill in the art, and its content does not lie in limit
Exemplary embodiment described in the disclosure processed.
In addition, in the following detailed description, to elaborate many concrete details to provide to present disclosure convenient for explaining
The comprehensive understanding of embodiment.It should be apparent, however, that one or more embodiments without these specific details can also be with
It is carried out.In other cases, well known construction and device is diagrammatically embodied to simplify attached drawing.
Fig. 1 shows the passive millimeter wave terahertz imaging equipment according to the disclosure.As shown in Figure 1, millimeter wave terahertz
Hereby imaging device is used to carry out checked object 1 the millimeter wave terahertz imaging equipment of safety inspection comprising condenser lens 3,
Polarize piece turntable 4, detector 5 and graphic processing facility 6.The polarization piece turntable 4 is rotatable and is provided with multiple micropolars
Piece 41 (as shown in Figure 3).As shown in Figure 1, the polarization piece turntable 4 setting the condenser lens 3 and the detector 5 it
Between, in this case it is desirable to will polarization piece turntable 4 make it is sufficiently small, condenser lens 3 and the detector can be arranged in
Between 5, and in the case, the polarization needs of piece turntable 4 be arranged as far as possible close to detector 5 and dimensionally with detector 5
Size is matched.In the embodiment shown in fig. 1, though it is shown that the polarization piece turntable 4 is arranged in the condenser lens 3
Between the detector 5, but as needed, checked object 1 and the condenser lens can also be arranged in polarization piece turntable 4
Between 3, in the case, because not needing to match with the size of detector 5, polarization piece turntable 4 can be designed larger.It should
Polarization piece turntable 4 can pass through one in multiple micropolar pieces 41 for being disposed thereon in a default particular moment of its rotation
A micropolar piece polarizes to checked object spontaneous radiation or reflected millimeter wave THz wave 2.The condenser lens 3
It is configured to focus on checked object spontaneous radiation or reflected millimeter wave THz wave 2 on the detector 5.It is described
Detector 5 is arranged on the focal plane of the condenser lens 3, and is configured to the micropolar piece that will be focused on and be polarized
Millimeter wave THz wave 2 be converted into the polarization image of checked object, thus the default different moments rotated in polarization piece turntable 4
Each moment obtain the polarization image of the corresponding checked object 1 of a width, if can be obtained at the time of default M difference
Obtain the polarization image of M width checked object 1.The graphic processing facility 6 is set to turning far from the polarization piece for the detector 5
The side of disk 4, and it is configured to handle the polarization image to carry out identification classification to checked object, in particular by the figure
As the processing of processing unit 6 can obtain high-resolution polarization image, thus based on high-resolution polarization image to tested pair
As carrying out identification classification.
In one embodiment according to the disclosure, described image processing unit 6 includes analogue signal processor 61, digital-to-analogue
Converter (D/A converter) 62, digital signal processor 63 and image display 64.Detector 5 by incident millimeter wave too
Hertz wave is converted into the electric signal on each pixel, and is sent to analogue signal processor 61；Analogue signal processor 61 is used
In the analog signal that pick-up probe transmits, and send it to digital analog converter 62；Digital analog converter 62 is for receiving through mould
The signal that quasi- signal processor transmission comes, and carry out digital-to-analogue conversion to it and retransmit to digital signal processor 63；Digital signal
Processor 63 is used to receive the information after converted device conversion, and carries out demosaicing processing to it, then demosaicing is handled
The image obtained afterwards shows that image display 64, wherein the method for demosaicing processing will hereinafter carry out specifically
It is bright.
In the disclosure, THz wave is the electromagnetic wave that frequency is, terahertz in 100GHz to 10THz (10000GHz) range
Hereby wave is overlapped with millimeter wave in long-wave band, is overlapped in short-wave band with infrared ray between microwave and visible light.The frequency of millimeter wave
Section is 26.5 to 300GHz, and millimeter wave THz wave described in the disclosure refers to that frequency range is located at 30GHz to the electricity between 1000GHz
Magnetic wave.In the technical field of millimeter wave terahertz imaging equipment, due to human body radiation or the millimeter wave THz wave of reflection
Energy is low-down, therefore millimeter wave THz wave is appropriate for safety inspection.
Fig. 2 shows the active millimeter wave terahertz imaging equipment according to the disclosure.As shown in Fig. 2, the active milli
Metric wave terahertz imaging equipment further includes millimeter wave terahertz emission source 7, is used to radiate millimeter wave Terahertz to checked object 1
Wave, so that checked object 1 reflects millimeter wave THz wave to condenser lens 3.
In one embodiment according to the disclosure, as shown in figure 3, the polarization piece turntable 4 includes multiple micropolar pieces
41, each micropolar piece in the multiple micropolar piece 41 is by perfact polarization or partial polarization.
In one embodiment according to the disclosure, the quantity of the polarisation angles of the multiple micropolar piece 41 is N, described
The quantity of multiple micropolar pieces is M, and wherein N is positive integer more than or equal to 3, and M is the integral multiple of N, such as N=4, M=16,
That is 16 micropolar pieces are arranged on the polarization piece turntable 4, and this 16 micropolar pieces have 4 polarization directions,
In every 4 micropolar pieces have an identical polarisation angles.As shown in figure 3, the quantity of the multiple micropolar piece 41 is 6,
But as needed, any number of micropolar piece can be set.Preferably, as shown in figure 3, the polarization setting of piece turntable 4 is existed
Between checked object 1 and condenser lens 3, thus in this case, it is possible to will polarization piece turntable 4 be made to it is larger, and being capable of root
Any position between checked object 1 and condenser lens 3 has been located according to needs.
In one embodiment according to the disclosure, as shown in figure 3, the multiple micropolar piece 41 is along the polarization piece
The circumferencial direction of turntable 4 is equiangularly disposed.But the multiple micropolar piece 41 can also be arranged in other ways
It polarizes on piece turntable 4, as long as one in these micropolar pieces 41 can be at the time of specific when the piece turntable 4 that polarizes rotates
Alignment detector 5.
In one embodiment according to the disclosure, one in default particular moment, the multiple micropolar piece 41
The detector 5 is directed at by the part that is polarized of all polarized micropolar pieces or a micropolar piece by partial polarization, from
And obtain the polarization image of checked object.In this embodiment, when the piece turntable 4 that polarizes rotates a circle, the detector 5 is obtained
The polarization image of M width checked object, the polarization image of the M width checked object include N number of polarisation angles.
In one embodiment according to the disclosure, in default particular moment, the polarization piece turntable 4 it is not set described
The part of micropolar piece 41 is directed at a micropolar by partial polarization in the detector 5 or the multiple micropolarization 41
The part that is not polarized for changing piece is directed at the device 5, to obtain the unpolarized image of checked object.In this embodiment, in pole
When change piece turntable 4 rotates a circle, the detector 5 obtains the unpolarized image of M width checked object.It is understood that can be with
On the basis of the piece turntable 4 that polarizes rotates a circle, detector 5 can obtain the polarization image and M width quilt of M width checked object simultaneously
The unpolarized image of object is examined, to handle in subsequent image processing apparatus 6 above-mentioned image, wherein at-group M
At each moment at moment, one in multiple micropolar pieces 41 is by all polarized micropolar pieces or one by the micro- of partial polarization
The part that is polarized of polarization piece is directed at the detector 5, at each moment at another group of M moment, the piece turntable 4 that polarizes
The part of the not set micropolar piece 41 or a micropolar piece by partial polarization in the multiple micropolarization 41
It is not polarized part and is directed at the device 5.
In the millimeter wave terahertz imaging equipment according to the disclosure, preferably along the circumferential direction set on polarization piece turntable
M micropolar piece 41 is set, these micropolar pieces have N number of different polarisation angles, and wherein M is the integral multiple of N.Turn in polarization piece
When disk 4 rotates a circle, M micropolar piece 41 can be respectively aligned to detector 5 in M different moments, so that detector 5 can obtain
Obtain the polarization image of M width checked object.In addition, when the piece turntable 4 that polarizes rotates, the not set micropolar piece for the piece turntable 4 that polarizes
41 part or the unpolarized part of micropolar piece 41 can also be respectively aligned to detector 5 in M other different moments, from
And the unpolarized image of M width checked object can be obtained.Therefore, according to the millimeter wave terahertz imaging equipment of the disclosure in pole
The unpolarized image of checked object can be obtained in different moments when rotating a circle and comprising different polarisation angles by changing piece turntable 4
Polarize image.
Two following aspects are mainly reflected in using the advantage of the millimeter wave terahertz imaging equipment according to the disclosure.
In a first aspect, the polarization information that can use the polarization image detected carries out object classification and object identification.This
It is because polarization imaging technique can not only detect the structural information of body surface, such as roughness and texture, additionally it is possible to detect
The information such as conductivity, the refractive index of body surface, this scheme (can only detect object than existing passive type terahertz imaging instrument
Body surface surface intensity information) more information are provided, these information are highly useful to object classification and object identification.Such as
The suspicious item carried using common passive millimeter wave Terahertz safety check instrument detection human body, such as mobile phone, banknote, cutter and pistol
Deng, since body surface temperature is higher than suspicious item, show that human body is white on imaging gray level image, and suspicious item is all black
Block.In general, either machine recognition or manual identified, can not analogous shape and the belt fastener of size, mobile phone, metal block,
Medium block and bank note distinguish.We are can not to differentiate suspicious item by the shape of black patch.Using polarization imaging technique, use
The polarization information (material different surfaces texture, roughness, refractive index, conductivity etc.) of acquisition is suspicious to analogous shape and size
Object is distinguished.
On the other hand, the imaging restructing algorithm that can be polarized by super-resolution realizes that super-resolution imaging, resolution ratio are existing
At least 4 times of the raising of image mode (cannot obtain polarization information), resolution ratio can achieve a millimeter rank, this is to identification milli
The suspicious item of rice level structures is very effective.
The polarization mode of the micropolar piece 41 on polarization piece turntable is described in detail below.The polarisation angles of polarization piece or pole
Changing angle is its transmission direction.Incidence wave can be analyzed to the direction of vibration wave parallel with transmission direction and direction of vibration and thoroughly
Penetrate the vertical wave in direction.The direction of vibration wave vertical with transmission direction can not penetrate, and direction of vibration and perspective direction are flat
Capable wave can be by.Thus we are available along the polarized line polarization wave of transmission direction.
In one embodiment according to the disclosure, the multiple micropolar piece 41 is made of multiple macro pixel units, often
A macro pixel unit includes polarisation angles N number of micropolar piece 41 different from each other.N number of micropolar piece packet of each macro pixel unit
It includes such as at least one of under type: N number of linear polarization micropolar piece；N-1 linear polarization micropolar piece and a circular polarisation micropolar
Change piece；N number of partial polarization micropolar piece.
Fig. 4 shows the rough schematic view of the macro pixel unit of the polarization piece turntable according to one embodiment of the disclosure.
In this embodiment, macro pixel unit includes the micropolar piece of N number of linearisation, their polarisation angles be respectively Degl, Deg2,
Deg3 ... DegN, whereinI is the positive integer less than or equal to N.As shown in figure 4, each macro picture
When the quantity N=3 of the micropolar piece of plain unit, the macro macro pixel arrangements of pixel unit are 0 °, 60 ° and 120 ° of line pole
Change.
Fig. 5 shows the rough schematic view of the macro pixel unit of the polarization piece turntable according to one embodiment of the disclosure.
In this embodiment, macro pixel unit includes N-1 linear polarization micropolar piece, and 1 circular polarisation micropolar piece, and circular polarisation can be with
It is that left-hand circular polarization is also possible to right-handed circular polarization, N-1 linear polarization angle is Deg1, Deg2, Deg3 ... Deg (N- respectively
1), whereinIn one embodiment, as shown in figure 5, the micropolar of a macro pixel unit
When piece quantity N=3, the macro macro pixel arrangements of pixel unit are 0 ° of linear polarization, 90 ° of linear polarizations and circular polarisation.
Fig. 6 shows the rough schematic view of the macro pixel unit of the polarization piece turntable according to one embodiment of the disclosure.
In this embodiment, in order to increase the transmissivity of polarization piece, can will polarization piece to be processed into partial region be polarized, partial region
It is non-polarized.According to demand, the size of polairzed area and the size in non-polarized region are adjusted by transmissivity.
In one embodiment, as shown in fig. 6, when the quantity N=3 of the micropolar piece of each macro pixel unit, 3 polarization
The polarisation angles of piece are 0 ° of part linear polarization, 60 ° of part linear polarization and 120 ° of part linear polarization.
In one embodiment according to the disclosure, the polarisation angles of each micropolar piece in the piece turntable that polarizes are being manufactured
It is fixed and invariable after good.Hereafter three kinds of modes of the polarisation angles to fixed micropolar piece are illustrated.
In the first way, the polarization piece that can be used for low frequency millimeter wave Polarization selection is the metal of sub-wavelength period distribution
Wiregrating.The direction of wiregrating is used to select may pass through the polarisation angles of its wave, the gold being parallel to each other on metal framework around a upper row
Belong to silk.The diameter of wire is 1-10 μm, is divided into 10 μm of -1mm between wire.The material of wire is usually aluminium and copper.This
Kind polarization piece has many advantages, such as that preparation process is simple, high without underlay substrate, transmitance.
In the second way, optional applicable wavelengths are that the polarization piece of 0.3mm-3mm is the gated chip base of metal grid lines
Plate, including wire grating and underlay substrate.Wherein, wire grating is made of a plurality of metal wire arranged in parallel, the wave hooked
Referred to as linearly polarized wave.One side surface of underlay substrate has multiple grooves.A plurality of metal linear resolution is set to underlay substrate
Multiple grooves in.The surface of a plurality of metal wire has a reeded side surface with underlay substrate and flushes.The material of wire grating
For aluminium, titanium or silver.
In the third mode, it is polyethylene polarization piece suitable for high frequency millimeter wave Terahertz polarization piece, utilizes diffracted wave
The transmitted wave principle of grid and design.Its manufacture craft are as follows: the period lines that triangle pattern is first engraved in substrate, then on surface
Upper plating layer of metal film (Al film).Polyethylene grid polarization piece is cheap, achievable relative to the advantages of grating polarization piece
Broadband applies (applicable wavelengths 0.3-3mm).
In one embodiment according to the disclosure, the polarisation angles of each micropolar piece in the piece turntable that polarizes are being manufactured
Being also after good can be changed as needed.The two ways that polarisation angles are adjusted will hereinafter carry out specifically
It is bright.
A kind of mode for realizing polarisation angles control is micropolar piece using programmable Meta Materials preparation, is compiled by computer
Journey mode adjusts its polarisation angles.
Alternatively possible embodiment is the form that tunable wave plate adds common polarization piece.Tunable slide can be certain
The preparation of kind functional material.Functional material refers to by having specific function after the effects of wave, electricity, magnetic, heat, chemistry, biochemistry
The material of energy.Functional material can be liquid crystal, vanadium oxide, graphene etc..For example one is designed with polarization asymmetry
Structure, millimeter wave THz wave through it can generate it is birefringent, pass through outfield regulation slide refractive index realization polarizing angle
The control of degree.
According to another aspect of the present disclosure, it also provides a kind of using above-mentioned millimeter wave terahertz imaging equipment progress object
The method for identifying classification.This method comprises the following steps that so that the polarization piece turntable 4 rotates；So that checked object 1 is spontaneous
Radiation or reflected millimeter wave THz wave 2 polarization piece turntable 4 rotate a default particular moment by a micropolar
Change the polarization of piece 41 and is focused on the detector 5 by the condenser lens 3；By the detector 5, will be focused on
And the millimeter wave THz wave 2 being polarized is converted into the polarization image of checked object, to be rotated in polarization piece turntable 4 default
Each moment of different moments obtains the polarization image of the corresponding checked object of a width；It is handled using described image processing unit 6
The polarization image is to obtain high-resolution polarization image；High-resolution polarization image based on acquisition, is calculated using automatic identification
Method carries out object identification classification.
In the one embodiment for the method classified according to the object identification of the disclosure, it is arranged on the polarization piece turntable 4
There are multiple micropolar pieces 41, the quantity of the polarisation angles of the multiple micropolar piece is N, and the quantity of the multiple micropolar piece is
M, wherein N is the positive integer more than or equal to 3, and M is the integral multiple of N, thus when the piece turntable 4 that polarizes rotates a circle, the detection
Device obtains the M width polarization image of checked object, and M unpolarized image for obtaining checked object in M different moments.Example
Such as N=4, M=16 such as, in one embodiment, that is to say, that 16 micropolar pieces are arranged on the polarization piece turntable 4,
And this 16 micropolar pieces have 4 polarization directions, wherein every 4 micropolar pieces have an identical polarisation angles, this four
A polarisation angles are respectively -45 °, 0 °, 45 ° and 90 °.Polarize piece turntable 4 rotate a circle when, the detector 5 at 16 not
The 16 width polarization image of checked object is obtained in the same time, and obtains 16 unpolarized images of checked object.
In this embodiment, the polarization image is handled using described image processing unit 6 to obtain high-resolution polarization
The step of image includes S1: N group low resolution polarization image, every group of low resolution polarization image packet are extracted from M width polarization image
Include the M/N width polarization image with an identical polarisation angles；In one embodiment, as shown in figure 8, passing through the step from figure
4 groups of low resolution polarization images are obtained in 7 16 width polarization image, wherein first group of low resolution polarization image includes 0 ° of polarizing angle
4 width polarization image under degree, as shown in (a) of Fig. 8；Second group of low polarization image of differentiating includes 4 width poles under 45 ° of polarisation angles
Change image, as shown in (b) of Fig. 8；The low polarization image of differentiating of third group includes the 4 width polarization image under 90 ° of polarisation angles, is such as schemed
Shown in 8 (c)；4th group of low polarization image of differentiating includes the 4 width polarization image under -45 ° of polarisation angles, such as (d) institute of Fig. 8
Show.
The polarization image, which is handled, using described image processing unit 6 is also wrapped the step of high-resolution polarization image with obtaining
It includes S2: the high-resolution non-polarized image for including M width non-polarized image being grouped, N group low resolution non-polarized figure is obtained
Picture, every group of low resolution non-polarized image include M/N width non-polarized image.In one embodiment, to including 16 width non-polarizeds
The high-resolution non-polarized image of image is grouped, and obtains 4 groups of low resolution non-polarized images, every group of low resolution non-polarized
Image includes 4 width non-polarized images.
The polarization image, which is handled, using described image processing unit 6 is also wrapped the step of high-resolution polarization image with obtaining
Include S3: by the N group low resolution polarization image obtained by step S1 in the N group low resolution non-polarized obtained by step S2
Under the guidance of image, the intermediate image of the different polarisation angles of N group is obtained by interpolation, then again in obtained N group intermediate image
In non-polarized image be individually subtracted polarize difference image to get to N group low resolution, every group of low resolution difference image that polarizes includes M/
N width polarization difference image.In one embodiment, 4 groups of low resolution polarization difference images, every group of low resolution are obtained by the step
The difference image that polarizes includes 4 width polarization difference image.
The polarization image, which is handled, using described image processing unit 6 is also wrapped the step of high-resolution polarization image with obtaining
It includes S4: the N group polarization difference image that step S3 is obtained being handled using bilinearity difference, the processing method of up-sampling, obtains N
Group high-resolution polarization difference image, every group of high-resolution polarization difference image include M width polarization difference image.In one embodiment,
4 groups of high-resolution polarization difference images are obtained by the step, every group of high-resolution polarization difference image includes 16 width polarization difference image.
The polarization image, which is handled, using described image processing unit 6 is also wrapped the step of high-resolution polarization image with obtaining
Include S5: what N group high-resolution that step S4 is obtained polarization difference image was obtained with step S2 respectively includes M width non-polarized image
High-resolution non-polarized image is summed, and N group high-resolution polarization image, every group of high-resolution polarization image packet are finally obtained
Include M width polarization image.In one embodiment, 4 groups of high-resolution polarization images, every group of high resolution pole are obtained by the step
Changing image includes 16 width polarization image.
In one embodiment according to the disclosure, when the piece turntable that polarizes rotates a circle, the detector is a not in M
The M width polarization image of checked object, the M unpolarized image without obtaining checked object simultaneously can be only obtained in the same time.?
In the embodiment, by algorithm the non-polarized intensity data of M width polarization image can be estimated, is obtained based on M width polarization image
High-resolution non-polarized image.That is, above-mentioned step S2 can be stated are as follows: estimate the non-polarized of M width polarization image
Intensity data obtains high-resolution non-polarized image, and high-resolution non-polarized image includes M width non-polarized image, electrodeless to M
Change image to be grouped, obtains N group low resolution non-polarized image, every group of low resolution non-polarized image includes M/N electrodeless
Change image.In this embodiment, for other steps S1 ', S3 ', S4 ' and S5 ' respectively with S1, S3, S4 are identical with S5.
It, can be to the high resolution pole with polarization information in order to further increase the resolution ratio of high-resolution polarization image
Change image and carries out super-resolution image Processing Algorithm raising resolution ratio.The imaging restructing algorithm that can be polarized by super-resolution is realized super
Resolution imaging, at least 4 times of the raising of the existing image mode of resolution ratio (cannot obtain polarization information), resolution ratio can be with
Reach a millimeter rank.This is very effective the suspicious item of identification millimeter level structures.
It will be understood to those skilled in the art that embodiment described above is all exemplary, and this field
Technical staff can make improvements, the rushing in terms of not recurring structure or principle of structure described in various embodiments
It can be freely combined in the case where prominent.
After the preferred embodiment that the disclosure is described in detail, those skilled in the art can be apparent from,
It does not depart from the protection scope of appended claims and spirit is lower can carry out various change and change, and the disclosure is also not only restricted to
The embodiment of examples cited embodiment in bright book.
Claims (18)
1. a kind of for carrying out the millimeter wave terahertz imaging equipment of safety inspection to checked object comprising condenser lens, pole
Change piece turntable, detector and graphic processing facility, wherein
The polarization piece turntable is rotatable and is provided with multiple micropolar pieces, and be arranged checked object and the condenser lens it
Between or be arranged between the condenser lens and the detector, and polarization piece turntable rotation a default particular moment
It to checked object spontaneous radiation or can be reflected by a micropolar piece in multiple micropolar pieces for being disposed thereon
Millimeter wave THz wave polarize；
The condenser lens is configured to checked object spontaneous radiation or reflected millimeter wave THz wave focusing on institute
It states on detector；
The detector is arranged on the focal plane of the condenser lens, and is configured to the milli that will be focused on and be polarized
Metric wave THz wave is converted into the polarization image of checked object, thus in each of the default different moments of polarization piece turntable rotation
The polarization image of the moment acquisition corresponding checked object of one width；And
The graphic processing facility is set to the side far from the polarization piece turntable of the detector, and is configured to handle
The polarization image is to carry out identification classification to checked object.
2. millimeter wave terahertz imaging equipment according to claim 1, wherein each of the multiple micropolar piece is micro-
Polarization piece is all polarized or by partial polarization.
3. millimeter wave terahertz imaging equipment according to claim 1, wherein the polarisation angles of the multiple micropolar piece
Quantity be N, the quantity of the multiple micropolar piece is M, and wherein N is the positive integer more than or equal to 3, and M is the integral multiple of N.
4. millimeter wave terahertz imaging equipment according to claim 1, wherein the multiple micropolar piece is along the pole
The circumferencial direction for changing piece turntable is equiangularly disposed.
5. millimeter wave terahertz imaging equipment according to claim 3, wherein described more in the default particular moment
One in a micropolar piece is polarized part by all polarized micropolar pieces or a micropolar piece by partial polarization
It is directed at the detector, to obtain the polarization image of checked object.
6. millimeter wave terahertz imaging equipment according to claim 3, wherein in the default particular moment, the pole
The part for changing the not set micropolar piece of piece turntable is directed at one in the detector or the multiple micropolar piece
The device is directed at by the part that is not polarized of the micropolar piece of partial polarization, to obtain the unpolarized image of checked object.
7. millimeter wave terahertz imaging equipment according to claim 5, wherein
When the piece turntable that polarizes rotates a circle, the polarization image of the detector acquisition M width checked object, tested pair of the M width
The polarization image of elephant includes N number of polarisation angles.
8. millimeter wave terahertz imaging equipment according to claim 6, wherein
When the piece turntable that polarizes rotates a circle, the detector obtains the unpolarized image of M width checked object.
9. millimeter wave terahertz imaging equipment according to claim 1, wherein the multiple micropolar piece is by multiple macro pictures
Plain unit composition, each macro pixel unit includes polarisation angles N number of micropolar piece different from each other.
10. millimeter wave terahertz imaging equipment according to claim 9, wherein N number of micropolar of each macro pixel unit
Piece includes such as at least one of under type: N number of linear polarization micropolar piece；N-1 linear polarization micropolar piece and a circular polarisation
Micropolar piece；N number of partial polarization micropolar piece.
11. millimeter wave terahertz imaging equipment according to claim 10, wherein the polarization of N number of linear polarization micropolar piece
Angle be respectively Deg1, Deg2, Deg3 ... DegN, wherein
Wherein i is the positive integer less than or equal to N.
12. millimeter wave terahertz imaging equipment according to claim 9, wherein the polarization of N-1 linear polarization micropolar piece
Angle be respectively Deg1, Deg2, Deg3 ... DegN-1, wherein
Wherein i is the positive integer less than or equal to N-1；
Wherein, circular polarisation includes at least one of left-hand circular polarization and right-handed circular polarization.
13. millimeter wave terahertz imaging equipment according to claim 3, wherein polarisation angles are fixed or adjustable.
14. millimeter wave terahertz imaging equipment according to claim 1 further includes millimeter wave terahertz emission source, use
In to checked object radiate millimeter wave THz wave.
15. a kind of method for carrying out object identification classification using millimeter wave terahertz imaging equipment according to claim 1,
Include:
So that the polarization piece turntable rotation,
So that checked object spontaneous radiation or reflected millimeter wave THz wave are default at one of polarization piece turntable rotation
Particular moment is polarized and focused on the detector by the condenser lens by a micropolar piece；
By the detector, it converts the millimeter wave THz wave for being focused on and being polarized to the polarization diagram of checked object
Picture, to obtain the polarization diagram of the corresponding checked object of a width at each moment of the default different moments of polarization piece turntable rotation
Picture；
The polarization image is handled using described image processing unit to obtain high-resolution polarization image；
High-resolution polarization image based on acquisition, utilizes automatic identification algorithm to carry out object identification classification.
16. the method for object identification classification according to claim 15, wherein
Multiple micropolar pieces are provided on the polarization piece turntable, the quantity of the polarisation angles of the multiple micropolar piece is N, institute
The quantity for stating multiple micropolar pieces is M, and wherein N is the positive integer more than or equal to 3, and M is the integral multiple of N, to turn in polarization piece
It spirals when circling, the detector polarizes image in the M width that M different moments obtain checked object, and obtains tested pair
The unpolarized image of M of elephant；
Wherein, the step of handling the polarization image using described image processing unit to obtain high-resolution polarization image packet
It includes:
S1: N group low resolution polarization image is extracted from M width polarization image, every group of low resolution polarization image includes having one
The M/N width polarization image of identical polarisation angles；
S2: the high-resolution non-polarized image for including M width non-polarized image is grouped, N group low resolution non-polarized is obtained
Image, every group of low resolution non-polarized image include M/N width non-polarized image；
S3: the N group low resolution polarization image obtained by step S1 is electrodeless in the N group low resolution obtained by step S2
Under the guidance for changing image, the intermediate image of the different polarisation angles of N group is obtained by interpolation, then again in obtained N group middle graph
Non-polarized image is individually subtracted as in get N group low resolution polarization difference image is arrived, every group of low resolution polarization difference image includes
M/N width polarization difference image；
S4: the N group polarization difference image that step S3 is obtained is handled using bilinearity difference, the processing method of up-sampling, is obtained
To N group high-resolution polarization difference image, every group of high-resolution polarization difference image includes M width polarization difference image；And
S5: what N group high-resolution that step S4 is obtained polarization difference image was obtained with step S2 respectively includes M width non-polarized image
High-resolution non-polarized image sum, finally obtain N group high-resolution polarization image, every group of high-resolution polarizes image
Including M width polarization image.
17. the method for object identification classification according to claim 15, wherein
Multiple micropolar pieces are provided on the polarization piece turntable, the quantity of the polarisation angles of the multiple micropolar piece is N, institute
The quantity for stating multiple micropolar pieces is M, and wherein N is the positive integer more than or equal to 3, and M is the integral multiple of N, to turn in polarization piece
It spirals when circling, the detector polarizes image in the M width that M different moments obtain checked object；
Wherein, the step of handling the polarization image using described image processing unit to obtain high-resolution polarization image packet
It includes:
S1 ': N group low resolution polarization image is extracted from M width polarization image, every group of low resolution polarization image includes having one
The M/N width polarization image of identical polarisation angles；
S2 ': the non-polarized intensity data of M width polarization image is estimated, obtains high-resolution non-polarized image, high-resolution is electrodeless
Changing image includes M width non-polarized image, and
M width non-polarized image is grouped, N group low resolution non-polarized image, every group of low resolution non-polarized image are obtained
Including M/N width non-polarized image；
S3 ': the N group low resolution that the N group low resolution polarization image that will be obtained by step S1 is obtained in process step S2 without
It polarizes under the guidance of image, the intermediate image of the different polarisation angles of N group is obtained by interpolation, then again among obtained N group
Non-polarized image is individually subtracted in image to get N group low resolution polarization difference image, every group of low resolution polarization difference image packet is arrived
Include M/N width polarization difference image；
S4 ': the N group polarization difference image that step S3 is obtained is handled using bilinearity difference, the processing method of up-sampling, is obtained
To N group high-resolution polarization difference image, every group of high-resolution polarization difference image includes M width polarization difference image；And
S5 ': what N group high-resolution that step S4 is obtained polarization difference image was obtained with step S2 respectively includes M width non-polarized figure
The high-resolution non-polarized image of picture is summed, and N group high-resolution polarization image, every group of high-resolution polarization figure are finally obtained
As including M width polarization image.
18. the method for object identification classification according to claim 16 or 17, wherein
The step of handling the polarization image using described image processing unit to obtain high-resolution polarization image further include:
S6: super-resolution image processing is carried out for the high-resolution polarization image with polarization information obtained in step s 5
Algorithm improves resolution ratio.
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120049072A1 (en) * | 2010-08-24 | 2012-03-01 | Canon Kabushiki Kaisha | Terahertz wave generation element, terahertz wave detection element, and terahertz time domain spectral device |
| US20150153234A1 (en) * | 2013-12-04 | 2015-06-04 | Microtech Instruments, Inc. | Systems and methods for high-contrast, near-real-time acquisition of terahertz images |
| CN104932029A (en) * | 2015-06-12 | 2015-09-23 | 上海理工大学 | Active terahertz human body security inspection system device and adjustment method |
| US20150285907A1 (en) * | 2013-05-03 | 2015-10-08 | Farrokh Mohamadi | Terahertz screening apparatus for detection of concealed weapons |
| CN105866771A (en) * | 2016-06-15 | 2016-08-17 | 合肥工业大学 | Hidden object detecting system and detecting method thereof |
| CN106918843A (en) * | 2017-01-23 | 2017-07-04 | 北京航天易联科技发展有限公司 | A kind of video speed scanning system based on passive type terahertz imaging |
| CN207426169U (en) * | 2017-10-20 | 2018-05-29 | 中国工程物理研究院电子工程研究所 | A kind of dual-polarized antenna array for being used for Terahertz and millimeter wave human body safety check instrument |
| CN209182525U (en) * | 2018-12-29 | 2019-07-30 | 同方威视技术股份有限公司 | Millimeter wave terahertz imaging equipment |
-
2018
- 2018-12-29 CN CN201811654195.6A patent/CN109471196B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120049072A1 (en) * | 2010-08-24 | 2012-03-01 | Canon Kabushiki Kaisha | Terahertz wave generation element, terahertz wave detection element, and terahertz time domain spectral device |
| US20150285907A1 (en) * | 2013-05-03 | 2015-10-08 | Farrokh Mohamadi | Terahertz screening apparatus for detection of concealed weapons |
| US20150153234A1 (en) * | 2013-12-04 | 2015-06-04 | Microtech Instruments, Inc. | Systems and methods for high-contrast, near-real-time acquisition of terahertz images |
| CN104932029A (en) * | 2015-06-12 | 2015-09-23 | 上海理工大学 | Active terahertz human body security inspection system device and adjustment method |
| CN105866771A (en) * | 2016-06-15 | 2016-08-17 | 合肥工业大学 | Hidden object detecting system and detecting method thereof |
| CN106918843A (en) * | 2017-01-23 | 2017-07-04 | 北京航天易联科技发展有限公司 | A kind of video speed scanning system based on passive type terahertz imaging |
| CN207426169U (en) * | 2017-10-20 | 2018-05-29 | 中国工程物理研究院电子工程研究所 | A kind of dual-polarized antenna array for being used for Terahertz and millimeter wave human body safety check instrument |
| CN209182525U (en) * | 2018-12-29 | 2019-07-30 | 同方威视技术股份有限公司 | Millimeter wave terahertz imaging equipment |
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