CN109470181A - Method is determined based on the structural plane two dimension roughness value of progressive sampling - Google Patents
Method is determined based on the structural plane two dimension roughness value of progressive sampling Download PDFInfo
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- CN109470181A CN109470181A CN201811316484.5A CN201811316484A CN109470181A CN 109470181 A CN109470181 A CN 109470181A CN 201811316484 A CN201811316484 A CN 201811316484A CN 109470181 A CN109470181 A CN 109470181A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
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Abstract
A kind of structural plane two dimension roughness value based on progressive sampling determines method, the following steps are included: 1) utilize three-dimensional laser scanner rock structural face surface, obtain rock structural face 3 D laser scanning figure, intercepted length is the rock structural face contour curve of Dcm, and obtain its point cloud data, contour curve point cloud data is handled using MATALB, establishes rectangular coordinate system, and make the X-coordinate 0 of its left end point;2) contour line is sampled;3) it completes to structural plane contour line using dcm as sampling unit, it is Δ d's that single, which promotes length,Sub-sampling;4) Z of each sampling unit is found out2Value;5) the formula JRC=32.2+32.47logZ proposed using R.TSE2, find out each sampling unitValue, and find outIt is aAverage value JRC2dThe as two-dimentional roughness value value of the contour line.This invention ensures that asperity information is not lost between sampling unit, and increases sample size, the representativeness of sample set is improved, keeps calculated result more accurate, reasonable.
Description
Technical field
The present invention relates to a kind of determination methods that structural plane contour line JRC value is sought using Progressive sampling method.Pass through utilization
Progressive sampling method, samples contour curve, keeps the preferable representative structure face of the sample set obtained whole.Pass through later
The calculating to contour line entirety JRC value is realized in calculating to list of cells domain sample contour line JRC value.It is large-scale suitable for calculating
The occasion of rock structural face contour line JRC value.
Background technique
Studies have shown that the stability of rock mass is largely influenced by rock structural face.And the mechanical property of rock structural face
Matter and the surface roughness of rock structural face are closely related.Barton etc. proposes to utilize structural plane surface roughness values earliest
(JRC) carry out quantizing structure face surface roughness, and propose 10 standard roughness profile curves and JRC-JCS model.Hereafter, such as
What calculates JRC value and becomes the hot spot studied for domestic and foreign scholars.Calculating contour line JRC value method at present mainly has: empirical estimating
Method, statistical parameter method, straight flange method & correct straight flange method and fractal dimension method etc..But the above method is to calculate low profile line mostly
JRC value, directly contour line itself is handled.Large-scale rock structural face contour line is calculated to combination sampling method
The research of JRC value is less.But measured obtained contour line is often very big in practical projects, or even up to several meters long, and at this moment one
As scanner be unable to complete the scanning to contour line, thus can not to contour line carry out digitized processing, this is to next step
JRC evaluation causes certain difficulty, and also to scanning device, more stringent requirements are proposed.
Traditional sampling method has an accidental sampling and two kinds of uniform sampling method, accidental sampling be contour line surface with
Machine intercepts the contour line sample of a large amount of equal lengths.The sample size that the sampling method obtains is larger, but the uniformity of sample covering
It is not sufficiently good, and research of such sampling method in the sampling to structural plane contour line is rarely reported.Uniform sampling method be
After determining single sample contour line straight length, since former contour line one end, the sample wheel of same straight line length is successively intercepted
Profile.Sampling method sample size obtained is less, and will cause the loss of the asperity information of each sample boundary.In conjunction with above-mentioned
Two kinds of sampling methods calculate large-scale rock structural face contour line JRC, and certainly will will cause result and true value has relatively large deviation.
It is that can guarantee that the sample size of acquisition is sufficiently large, and can guarantee that the representativeness of sample of acquisition is sufficiently high therefore, it is necessary to combine a kind of
Novel sampling method calculate large scale structure facial contour line JRC value.
Summary of the invention
When seeking large-sized rock mass structural plane contour curve JRC value, due to that can not be scanned, count to super-huge contour line
Wordization processing, needs to be sampled contour line, whole using great quantity of small contour line sample representation contour line.And based on tradition
The calculation method of sampling, since the sample size of sampling is on the low side, sample set can not reflect the coarse letter of contour line entirety well
Breath, and the asperity information between sample boundary can lose.In order to improve this status, the present invention proposes a kind of progressive based on two dimension
The contour line JRC value of sampling determines method, realizes the processing that contour line itself is replaced by the processing to contour line sample set.
Simultaneously by overlapped between sample unit, it ensure that asperity information is not lost between sampling unit, and increase sample
Amount, improves the representativeness of sample set, keeps calculated result more accurate, reasonable.
The technical solution adopted by the present invention to solve the technical problems is:
A kind of structural plane two dimension roughness value based on progressive sampling determines method, comprising the following steps:
1) three-dimensional laser scanner rock structural face surface is utilized, rock structural face 3 D laser scanning figure is obtained, from three
It ties up intercepted length on laser scanning figure and is the rock structural face contour curve of Dcm, and obtain its point cloud data, at MATALB
Contour curve point cloud data is managed, establishes rectangular coordinate system, and make the X-coordinate 0 of its left end point;
2) be sampled to contour line: in sampling, using the line segment of dcm long as sampling unit, Δ dcm is that single promotes length
Degree, wherein Δ d < d < D, carries out progressive sampling, sampling method are as follows: enable sampling unit left and right ends point to structural plane contour line
Coordinate is respectively (xi, 0), (xi+ d, 0), wherein xi=Δ d*m,It is compiled using MATLAB
For journey on contouring line, the projection in X-axis falls in all point { (x in a sampling unitj, yj)|xj∈(xi, xi+
D) }, the coordinate information for recording these points, the Roughness Information of the contour line is indicated using the coordinate information of point set, and keep a record;
3) successively value is mIt can be completed to structural plane contour line using dcm as sampling unit, it is single
It is secondary to promote length for Δ d'sSub-sampling, if sampling unit last time moves out contour curve remainder
Point, using the two lap as sample;
4) it is programmed using MATLAB, by 3)In group sample, the coordinate set of the point of each sample into
Row processing obtains the Roughness Information of each sample, indicates position of this on contour line, Y-axis with the X axis coordinate of each point
The relative relief height of the coordinate representation point, utilizes formulaIt is single to find out each sampling
The Z of member2Value;
5) the formula JRC=32.2+32.47log Z proposed using R.TSE2, find out each sampling unitValue,
AltogetherIt is a, and find outIt is aAverage value JRC2dThe as two-dimentional roughness of the contour line
Coefficient value, it may be assumed that
Beneficial effects of the present invention are mainly manifested in: (1) it using progressive sampling method is sampled, it is acquired to obtain sample size more
Greatly, the rough features that can preferably characterize contour line entirety utilize the JRC for the contour line entirety that the sample set is calculated
Also more rationally (2) progressive sampling method not will cause coarse between sampling unit value due to there is the overlapping of certain length between sample
The JRC value for spending the contour line entirety that information is lost, therefore is calculated using this kind of sampling method sample obtained is more accurate.
Detailed description of the invention
Fig. 1 is the display structure facial contour line from rock structural face.
Fig. 2 is rock mass discontinuity line drawing.
Fig. 3 is progressive sampling method diagram (d=40cm, Δ d=20cm).
Fig. 4 is different d, Δ d value pairThe influence of result of evaluation
Specific embodiment
The invention will be further described below in conjunction with the accompanying drawings.
Referring to Fig.1~Fig. 4, a kind of structural plane two dimension roughness value based on progressive sampling determine method, including following
Step:
1) three-dimensional laser scanner rock structural face surface is utilized, rock structural face 3 D laser scanning figure is obtained, from three
The rock structural face contour curve (Fig. 1) that laser scanning intercepted length as above is D=100cm is tieed up, the contour line of interception is carried out
Processing, obtains the point cloud data of contour curve, and establish rectangular coordinate system (such as Fig. 3), and make the X-coordinate 0 of its left end point;
2) when being sampled to contour line, the unit sample unit that length is 40cm is initially set up, enables sampling single later
The length pushed ahead every time of member is 20cm (Fig. 3), and specific practice is: the coordinate for enabling sampling unit left and right ends point is respectively
(xi, 0), (xi+ 40,0), wherein xi=20*m, (m ∈ [0,3], m are integer).As m=0, the left end point of sampling unit is being sat
At the origin for marking system, at this point, the projection in X-axis of record contour line length falls in the seat of all pixels point in the sampling unit
Mark, and save as a coordinate data set;
3) make successively value 0,1,2,3 m, i.e., 4 sub-samplings have been carried out to contour curve, and obtain 4 sampling units
Corresponding points cloud data acquisition system, is saved as matrix;If sampling unit last time moves out contour curve remainder, with two
Person's lap is sample
4) its position on contour line is indicated using the X axis coordinate of each pixel on contour curve, Y axis coordinate indicates it
Relative relief height, and utilize formulaFind out the respective Z of 4 sampling units2
Value, such as table 1:
Sample | Sample 1 | Sample 2 | Sample 3 | Sample 4 |
Z2Value | 0.1961 | 0.2051 | 0.2018 | 0.1855 |
Table 1
5) the formula JRC=32.2+32.047log Z proposed using R.TSE2, find out 4 sampling unitsValue,
Such as table 2:
Table 2
It is corresponding to find out 4 samplesThe average value JRC of value2dThe as two-dimentional roughness value value of the contour line.
That is:
(6) formula is utilizedFind out the Z of every contour line entirety2Value are as follows: Z2=
0.2092, and the formula JRC=32.2+32.47log Z proposed using R.TSE2, the JRC value for finding out contour line entirety is JRC2d
=9.3362.
For the reasonability for verifying the method for the present invention evaluation, the value of d and Δ d are gradually changed, and in the method in (4) (5)
It finds out under different d, Δ d value, the average value of small sample two dimension roughness value valueAnd and JRC2dSize carry out pair
Than, it can be seen that the average value of small sample contour curve two dimension roughness value value acquired in the method for the present inventionWith wheel
The two-dimentional roughness value value JRC of wide curve entirety2dBetween error it is very small, to demonstrate the evaluation of the method for the present invention
Reasonability.
It can make the most accurate d of result of evaluation, Δ d value for determination, gradually change sampling unit length d and single promotes length
The size of Δ d carries out progressive sampling to contour curve.By comparing acquisition each sample of contour curveThe average value of valueWith the whole two-dimentional roughness value value JRC of contour curve2dSize relation, observation d, Δ d size to result of evaluation
Influence.As a result such as Fig. 4.
Fig. 4 and table 3 show that influence of the value of d and Δ d to two-dimentional Progressive sampling method sampling result is in following rule substantially
Rule: single is gradually increased in fixed sample element length d, length Δ d value and fixed single propulsion length d is promoted to be gradually reduced and adopt
When sample element length Δ d value,With JRC2dBetween error change present substantially " concave shape ", i.e., the value of d is excessive, mistake
When the value of hour or Δ d are excessive, too small, error is above the two and takes median.To sum up, in utilization the method for the present invention to profile
When curve samples and calculates contour curve JRC value, it is proposed that the value of d is near D/2 size, Δ d takes median in its codomain,
Such result of evaluation is best.
Claims (1)
1. a kind of structural plane two dimension roughness value based on progressive sampling determines method, which is characterized in that the method includes
Following steps:
1) three-dimensional laser scanner rock structural face surface is utilized, rock structural face 3 D laser scanning figure is obtained, is swashed from three-dimensional
Intercepted length is the rock structural face contour curve of Dcm on photoscan, and obtains its point cloud data, is handled and is taken turns using MATALB
Wide curve point cloud data, establishes rectangular coordinate system, and makes the X-coordinate 0 of its left end point;
2) be sampled to contour line: in sampling, using the line segment of dcm long as sampling unit, Δ dcm is that single promotes length,
Wherein Δ d < d < D carries out progressive sampling, sampling method are as follows: enable the seat of sampling unit left and right ends point to structural plane contour line
Mark is respectively (xi, 0), (xi+ d, 0), wherein xi=Δ d*m,M is integer), it is compiled using MATLAB
For journey on contouring line, the projection in X-axis falls in all point { (x in a sampling unitj, yj)|xj∈(xi, xi+
D) }, the coordinate information for recording these points, the Roughness Information of the contour line is indicated using the coordinate information of point set, and keep a record;
3) successively value is mIt can be completed to structural plane contour line using dcm as sampling unit, it is single
It is secondary to promote length for Δ d'sSub-sampling, if sampling unit last time moves out contour curve remainder
Point, using the two lap as sample;
4) it is programmed using MATLAB, by 3)In group sample, at the coordinate set of the point of each sample
Reason obtains the Roughness Information of each sample, indicates position of this on contour line, Y axis coordinate with the X axis coordinate of each point
The relative relief height for indicating the point, utilizes formulaFind out each sampling unit
Z2Value;
5) the formula JRC=32.2+32.47logZ proposed using R.TSE2, find out each sampling unitValue, altogetherIt is a, and find outIt is aAverage value JRC2dThe as two-dimentional roughness system of the contour line
Numerical value, it may be assumed that
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US20130236382A1 (en) * | 2010-08-27 | 2013-09-12 | Technical University Of Denmark | Zeolite scr catalysts with iron or copper |
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CN107656902A (en) * | 2017-09-13 | 2018-02-02 | 绍兴文理学院 | Structural plane roughness coefficient statistical method under different sampling intervals |
CN108509701A (en) * | 2018-03-21 | 2018-09-07 | 南京航空航天大学 | A kind of direct intelligent diagnosing method of rotating machinery fault based on vibration signal |
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Patent Citations (5)
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CN101825444A (en) * | 2010-04-09 | 2010-09-08 | 上海辉格科技发展有限公司 | Vehicle-mounted road spectrum testing system based on surface structured light |
US20130236382A1 (en) * | 2010-08-27 | 2013-09-12 | Technical University Of Denmark | Zeolite scr catalysts with iron or copper |
CN106769276A (en) * | 2016-11-14 | 2017-05-31 | 绍兴文理学院 | Three-dimensional structure face aliquot part choosing method based on Dice similarity measures |
CN107656902A (en) * | 2017-09-13 | 2018-02-02 | 绍兴文理学院 | Structural plane roughness coefficient statistical method under different sampling intervals |
CN108509701A (en) * | 2018-03-21 | 2018-09-07 | 南京航空航天大学 | A kind of direct intelligent diagnosing method of rotating machinery fault based on vibration signal |
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