CN109459678A - A kind of board testing system, board test machine - Google Patents
A kind of board testing system, board test machine Download PDFInfo
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- CN109459678A CN109459678A CN201811176654.4A CN201811176654A CN109459678A CN 109459678 A CN109459678 A CN 109459678A CN 201811176654 A CN201811176654 A CN 201811176654A CN 109459678 A CN109459678 A CN 109459678A
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- 238000012360 testing method Methods 0.000 title claims abstract description 135
- 238000003780 insertion Methods 0.000 claims abstract description 22
- 230000037431 insertion Effects 0.000 claims abstract description 22
- 238000004891 communication Methods 0.000 claims description 24
- 230000005540 biological transmission Effects 0.000 claims description 10
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 238000001514 detection method Methods 0.000 description 20
- 238000000034 method Methods 0.000 description 9
- 230000006870 function Effects 0.000 description 8
- 230000008569 process Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000011990 functional testing Methods 0.000 description 2
- 230000002787 reinforcement Effects 0.000 description 2
- 208000033748 Device issues Diseases 0.000 description 1
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- 238000013461 design Methods 0.000 description 1
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- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011551 heat transfer agent Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
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Abstract
The application discloses a kind of board testing system, comprising: the first module and the second module in test fixture main body, and the microprocessor connecting with test fixture main body by CPU board card is arranged in test fixture main body；When work, by tested board and survey card insertion is accompanied to enter in the first module and the corresponding card slot of the second module, microprocessor is connected to the first module by CPU board card；Input signal through tested board is transferred to according to signal path and accompanies survey card and output signal output by microprocessor；Microprocessor, which monitors respectively and judges whether the output signal of tested board determining tested board whether consistent with input signal tests, to be passed through.The application is based on tested board and survey card and CPU board card is accompanied to test mutually, by way of automation can the large batch of board to different types test, and improve the accuracy rate of test board, and improve the efficiency of test.
Description
Technical field
This application involves software testing technology fields, and in particular to a kind of board testing system further relates to a kind of board survey
Test-run a machine and another board testing system, a kind of board test machine.
Background technique
With the development of in-vehicle electronic system device and acquisition technique, vehicle-mounted reinforcement type modular control unit application is more next
It is more.The mobile unit of one class standard EMU is on a large scale using based on preceding outlet reinforcement type mode board and modularization
The design of case type key control unit.Wherein, vehicle-mounted input-output card and CPU card can be inserted on the bottom plate of modular chassis,
And pass through the communication in bottom plate and power bus formation key control unit, CPU card control input-output card works as requested,
Realize vehicle mounted communication, control and acquisition.In the production process of these input and output and CPU card, need to carry out function to every piece of card
Energy property test, to ensure that each channel of each board can work normally.Existing technological means is by manually side
Formula carries out functional test, manually low to the function progress testing efficiency of board, and because the yield of board is huge,
It just needs that biggish man power and material is lost.Even so, timely board can not be tested and is completed, therefore, it is necessary to adopt
With the batch testing of automation.
Summary of the invention
The application provides a kind of board testing system, is by carrying out board in a manner of manually to solve prior art means
Functional test, manual mode carries out the lower problem of testing efficiency to the function of board.Present invention also provides a kind of boards
Test machine.
The application provides a kind of board testing system, comprising: test fixture main body is arranged in the test fixture main body
The first module and the second module, and the microprocessor being connect with the test fixture main body；
It is correspondingly arranged in first module and the second module for grafting tested board and accompanies the card slot surveyed and blocked；
When work, by the tested board and survey card insertion is accompanied to enter in first module and the corresponding card slot of the second module,
First module and second module are staggered relatively；The microprocessor is connected to first module；The micro process
Device issues control signal, and by first module, second module, tested board and accompanies the signal surveying card connection and being formed
Input signal through the tested board is transferred to described accompany and surveys card and output signal output by channel；Pass through the micro process
Device monitors the input signal and the output signal respectively, and judge the tested board output signal whether with it is described defeated
Enter signal and unanimously determines whether tested board is tested and passed through.
Optionally, comprising: further include CPU board card, the CPU board card is arranged in the microprocessor and first module
Between；The microprocessor issues control signal by controlling the CPU board card.
Optionally, first module includes: the first signal plate, the first needle bed plate and the first spring needle, and described first
Spring needle is fixed on the first needle bed plate and is connected to first signal plate；And the CPU board card passes through plug-in unit grafting
In on first signal plate；Communication bus is provided in first signal plate, the communication bus is connected to described first
Spring needle.
Optionally, second module includes: second signal plate, the second needle bed plate and second spring needle；Described second
Spring needle is fixed on the second needle bed plate and is connected to the second signal plate；Signal is provided in the second signal plate
Line, the signal wire are connected to the second spring needle；
First module, second module, tested board and accompany survey card connection formed signal path specifically,
The tested board and it is described accompany survey card when being plugged in the corresponding card slot, the tested board described accompanies survey card difference
It is abutted with first spring needle and the second spring needle, the communication bus is connected to form the signal with the signal wire
Channel, the signal path are used for transmission the control signal, the input signal and the output signal.
Optionally, the tested board is DI board, correspondingly, described accompany drafting board card for DO board；
It is described by the tested board and accompanying survey card insertion enter in first module and the corresponding card slot of the second module it is specific
Are as follows:
Using one group of DO board as accompanying drafting board card, at least two groups DI board as tested board be inserted into first module and
Second module relative to card slot in；
Alternatively, the tested snap-gauge is AI board, correspondingly, described accompany surveys snap-gauge as AO board；
It is described by the tested board and accompanying survey card insertion enter in first module and the corresponding card slot of the second module it is specific
Are as follows:
Using one group of AO board as accompanying drafting board card, at least two groups AI board as tested board be inserted into first module and
Second module relative to card slot in.
Optionally, the tested board is DO board, correspondingly, described accompany surveys snap-gauge as DI board；
It is described by the tested board and accompanying survey card insertion enter in first module and the corresponding card slot of the second module it is specific
Are as follows:
Using DI board as accompanying, survey snap-gauge, DO board is inserted into first module as tested board and the second module is opposite
In card slot in as accompanying drafting board card, wherein the DI board is identical with the quantity of DO board, and corresponds；
Or
The tested board is AO board, correspondingly, described accompany surveys snap-gauge as AI board；
It is described by the tested board and accompanying survey card insertion enter in first module and the corresponding card slot of the second module it is specific
Are as follows:
Using AI board as accompanying, survey snap-gauge, AO board is inserted into first module as tested board and the second module is opposite
In card slot in as accompanying drafting board card, wherein the AI board is identical with the quantity of AO board, and corresponds.
Optionally, the tested board is DO board, correspondingly, described accompany surveys snap-gauge as DI board；
It is described by the tested board and accompanying survey card insertion enter in first module and the corresponding card slot of the second module it is specific
Are as follows:
Using one group of DI board as accompanying drafting board card, at least two groups DO board as tested board be inserted into first module and
Second module relative to card slot in；Wherein, further include selection circuit, the DI board by the selection circuit respectively with institute
It states every DO board to be connected, to realize that the piece to DO board selects；
Alternatively,
The tested board is AO board, correspondingly, described accompany surveys snap-gauge as AI board；
It is described by the tested board and accompanying survey card insertion enter in first module and the corresponding card slot of the second module it is specific
Are as follows:
Using one group of AI board as accompanying drafting board card, at least two groups AO board as tested board be inserted into first module and
Second module relative to card slot in；Wherein, further include selection circuit, the AI board by the selection circuit respectively with institute
It states every AO board to be connected, to realize that the piece to AO board selects；
Optionally, comprising: first module and second module are detachable structure, correspond to difference for replacing
The tested board, it is described accompany survey block type.
Present invention also provides a kind of board test machines, including board testing system as described above.
Present invention also provides a kind of board testing systems, comprising: test fixture main body is arranged in the test fixture master
The first module and the second module on body, and the microprocessor being connect with the test fixture main body；
The card slot for grafting tested board is correspondingly arranged in first module and the second module；It is described to accompany survey card insertion
It connects and is surveyed in the card slot of card in corresponding accompany of first module, and second module is connected to by signal wire；
When work, the tested board is inserted into first module and the corresponding card slot of the second module, described first
Module and second module are staggered relatively；The microprocessor accompanies survey card to be connected to first module by described；It is described
Microprocessor issues control signal, and connects the signal to be formed by first module, second module, tested board and lead to
Input signal through the tested board is transferred to described accompany and surveys card and output signal output by road；Pass through the microprocessor
Monitor the input signal and the output signal respectively, and judge the tested board output signal whether with the input
Signal unanimously determines whether tested board tests and passes through.
Optionally, first module includes: the first signal plate, the first needle bed plate and the first spring needle, and described first
Spring needle is fixed on the first needle bed plate and is connected to first signal plate；And described drafting board card is accompanied to be connected to described
One signal plate；Communication bus is provided in first signal plate, the communication bus is connected to first spring needle.
Optionally, second module includes: second signal plate, the second needle bed plate and second spring needle；Described second
Spring needle is fixed on the second needle bed plate and is connected to the second signal plate；Signal is provided in the second signal plate
Line, the signal wire are connected to the second spring needle；It is described that drafting board card is accompanied to connect with the second signal plate.
Present invention also provides a kind of board test machines, comprising: board testing system as described above.
Compared with prior art, the application has the following advantages: the application provides a kind of board testing system, comprising: survey
Trial work fills main body, is arranged in the first module and the second module in the test fixture main body, and with the test fixture master
The microprocessor that body is connected by CPU board card；When work, by the tested board and accompanies and survey card insertion and enter first module and the
In the corresponding card slot of two modules, first module and second module are staggered relatively；The microprocessor passes through CPU board card
It is connected to first module；The microprocessor issues control signal, and by first module, second module,
It tested board and accompanies and surveys the signal path that card connection is formed, the input signal through the tested board is transferred to and described survey is accompanied to block
And output signal output；The input signal and the output signal are monitored respectively by the microprocessor, and described in judgement
Whether the output signal of tested board determining tested board whether consistent with the input signal, which tests, passes through.The application is based on quilt
Drafting board card and accompany survey card and CPU board card test mutually, being capable of the large batch of plate to different types by way of automation
Card is tested, and improves the accuracy rate of test board, and improve the efficiency of test.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram for board testing system that the application first embodiment provides；
Fig. 2 is a kind of another structural schematic diagram for board testing system that the application second embodiment provides；
Fig. 3 is a kind of flow diagram for board testing system working principle that the application 3rd embodiment provides；
Fig. 4 is a kind of flow diagram for board testing system working principle that the another embodiment of the application provides.
Wherein, board testing system 1, test fixture main body 2, the first module 3, the first spring needle 31, the first signal plate 32,
First needle bed plate 33；Second module 4, second spring needle 41, second signal plate 42, the second needle bed plate 43；CPU board card 5, signal wire
6, communication bus 7, fieldbus 8；Tested board 9 accompanies survey card 10, microprocessor 11.
Specific embodiment
Many details are explained in the following description in order to fully understand the application.But the application can be with
Much it is different from other way described herein to implement, those skilled in the art can be without prejudice to the application intension the case where
Under do similar popularization, therefore the application is not limited by following public specific implementation.
The application first embodiment provides a kind of board testing system, and Fig. 1 is board test provided by the embodiments of the present application
The structural schematic diagram of system.
As shown in Figure 1, board testing system 1 provided by the embodiments of the present application, comprising: test fixture main body 2, setting are being surveyed
Trial work fills the first module 3 and the second module 4 in main body 2, and the microprocessor 11 connecting with test fixture main body 2.
Wherein, first mould of the test fixture main body 2 for carrying the first module 3 and the second module 4, in the embodiment of the present application
Block 3 and the second module 4 are moveable, and are respectively corresponded in test fixture main body 2 and are provided with movable axis, i.e., corresponding and the first mould
The first movable axis that block 3 connects, and the second movable axis being connect with the second module 4；And second movable axis be able to drive the second mould
Block 4 is mobile to 3 direction of the first module, and after test, the second movable axis is able to drive the reset of the second module 4.It needs to illustrate
, it is to cooperate the first module 3 to the tested board 9 being mounted in the first module 3 and survey card 10 is accompanied to carry out based on the second module 4
Displacement, so in order to realize accurate docking, then the second module 4 can also carry out movement in the lateral direction and (be based on
The movement of up and down direction, the second module 4 is defined in a space moves left and right direction).Similarly, the first module 3 also can
It is moved under the drive of the first movable axis on the four direction of upper and lower, left and right, it is contemplated that the first module 3 carries
Tested board 9 and accompany survey card 10, in order to enable more stable when test, under normal circumstances, the first module 3 do not make it is upper and lower,
Movement on direction can be adjusted according to practical situation, not make herein specifically defined.Certainly, implemented based on the application
Example is not singly the test just for a kind of board, so, in the embodiment of the present application, the first module 3 and the second module 4 are removable
Structure is unloaded, to replace the type for corresponding to different tested boards 9, accompanying survey card 10；That is, the first module 3 and the second mould
The corresponding component of block 4 can change, but as long as can carry and clamp tested board 9 and accompany survey card 10 is that the application is wanted
The range of protection.
Wherein, in the application first embodiment, the first spring needle 31, the first signal are specifically provided in the first module 3
Plate 32, the first needle bed plate 33；Correspondingly, second spring needle 41, second signal plate 42 are specifically provided in the second module 4, second
Needle bed plate 43.Specifically, test fixture main body 2 is such as flowering structure in the embodiment of the present application:
As shown in Figure 1, test fixture main body 2 includes the first module 3 and the second module 4, the first module 3 passes through CPU board card 5
It is connected to microprocessor 11；First module 3 and the second module 4 are oppositely arranged；It is correspondingly arranged in first module 3 and the second module 4
There is for grafting tested board 9 and accompanies the card slot of survey card 10.
Specifically, the first spring needle 31 is specifically provided in the first module 3, and the first signal plate 32, the first needle bed plate 33；The
It is provided with communication bus 7 in one signal plate 32, (i.e. bus, bus are transmission information between the various functional components of microprocessor
Common communication main line, the transmission harness that it is made of conducting wire, the information category transmitted according to microprocessor, microprocessor
Bus can be divided into data/address bus, address bus and control bus, be respectively intended to transmission data, data address and control letter
Number.Bus is a kind of internal structure, it be cpu, memory, Input/Output Device transmitting information highway, host it is each
Component is connected by bus, and external equipment is connected with bus again by corresponding interface circuit, so as to form micro process
Device hardware system), the first spring needle 31 is fixed on the first needle bed plate 33 and is connected to the first signal plate 32；And CPU board card 5 passes through
Plug-in unit is plugged on the first signal plate 32；Communication bus 7 is connected to the first spring needle 31.Correspondingly, specific in the second module 4
It is provided with second spring needle 41, second signal plate 42, the second needle bed plate 43, second spring needle 41 is fixed on the second needle bed plate 43 simultaneously
It is connected to second signal plate 42；Signal wire 6 is provided in second signal plate 42, signal wire 6 is connected to second spring needle 41.
Wherein, in this configuration, it is correspondingly arranged on for grafting tested board 9 and accompanies in the first module 3 and the second module 4
Survey the card slot of card 10；I.e. tested board 9, accompany survey card 10 can connect respectively with the first module 3 and the second module 4；That is,
The tested board 9 being arranged in first module 3, the first spring needle 31, Yi Jilian accompanied survey to block 10 while be connected in the first module 3
The second spring needle 41 being connected in the second module 4.It needs to illustrate, the quantity for surveying the card slot of card 10 is accompanied to be less than or equal to quilt
The quantity of the card slot of drafting board card 9, corresponding, quantity of the quantity of card 10 less than or equal to tested board 9 is surveyed in accompanying for detection.?
It is tested it should be noted that CPU board card 5 can also be used as tested board.
Further, in the embodiment of the present application, board testing system 1 is mainly used for tested board 9 and accompanies survey card 10
Between mutual detection.Specifically, in order to facilitate understanding and combining actual detection board situation, the board detected each other can be with
For DO (digital output, digital output signal) board and DI (digital input, digital input signals) board, with
And AO (Analog Out, analog output) board and AI (Analog In, analog input) board, then it tested board 9 and accompanies
The mutual detection surveyed between card 10 is specifically included such as under type:
Mode one: when DO board is as accompanying survey card 10, DI board to be used to detect as tested board 9, wherein survey is accompanied to block
10 quantity can be corresponded with the quantity of tested board 9, then what is be arranged in the first module 3 and the second module 4 corresponds to
Tested board 9 accompanies the pocket numbers for surveying card 10 to correspond；It can choose, one group of DO board can be corresponded to as survey card 10 is accompanied
Detect at least two groups DI board as tested board 9 insertion the first module 3 and the second module 4 relative to card slot in.
Likewise, when AO board is as accompanying survey card 10, AI board to be used to detect as tested board 9, wherein survey is accompanied to block
10 quantity can be corresponded with the quantity of tested board 9, then what is be arranged in the first module 3 and the second module 4 corresponds to
Tested board 9 accompanies the pocket numbers for surveying card 10 to correspond；It can choose, one group of AO board can be corresponded to as survey card 10 is accompanied
Detect at least two groups AI board as tested board 9 insertion the first module 3 and the second module 4 relative to card slot in；
Mode two: it when DI board is as accompanying survey card 10, DO board to be used to detect as tested board 9, accompanies and surveys card 10
The quantity of quantity and tested board 9 corresponds；What is be then arranged in the first module 3 and the second module 4 corresponds to tested board
9, the pocket numbers for surveying card 10 are accompanied to correspond.
Likewise, accompanying when AI board is as accompanying survey card 10, AO board to be used to detect as tested board 9 and surveying card 10
The quantity of quantity and tested board 9 corresponds；What is be then arranged in the first module 3 and the second module 4 corresponds to tested board
9, the pocket numbers for surveying card 10 are accompanied to correspond.
It should be noted that both the above is mutually measured mode, whether DO board surveys 10 detection tested boards 9 of card as accompanying
DI board or DI board survey the DO boards of 10 detection tested boards 9 of card as accompanying, detection be be that microprocessor 11 issues
It controls signal, tested board 9 and survey card 10 is accompanied (or to be inputted according to corresponding input signal (or output signal) and output signal
Signal) whether unanimously determine whether tested board 9 can pass through test.AI board and AO board are similarly.
It can be seen that tested board 9 and accompany survey card 10 between being mutually measured be according to microprocessor 11 control CPU board card 5 and
What the route of selection detection was completed.Certainly, tested board 9 and accompany survey card 10 between being mutually measured according to microprocessor 11 control
CPU board card 5 and while select the route of detection, tested board 9 can also be changed accordingly and accompanied and survey being plugged on pair for card 10
The position for the card slot answered, to realize test of the board testing system 1 for a large amount of different types of board.
The application first embodiment provides a kind of board testing system 1, comprising: test fixture main body 2, setting is in test work
The first module 3 and the second module 4 in main body 2 are filled, and passes through the microprocessor that CPU board card 5 is connect with test fixture main body 2
11；When work, by tested board 9 and accompany in 10 the first module 3 of insertion of survey card and the corresponding card slot of the second module 4, the first module 3
It is staggered relatively with the second module 4；Microprocessor 11 is connected to the first module 3 by CPU board card 5；Microprocessor 11 issues control
Signal, and by the first module 3, the second module 4, tested board 9 and the signal path surveying 10 connection of card and being formed is accompanied, it will be through tested
The input signal of board 9, which is transferred to, accompanies survey card 10 and output signal output；Monitored respectively by microprocessor 11 input signal and
Output signal, and it is logical to judge whether the output signal of tested board 9 determining tested board 9 whether consistent with input signal tests
It crosses.The application is based on tested board and survey card and CPU board card is accompanied to test mutually, can be large batch of right by way of automation
The board of different types is tested, and improves the accuracy rate of test board, and improves the efficiency of test.
The application first embodiment also provides a kind of board test machine, comprising: such as above-mentioned board testing system 1.The plate
Card test machine can be used for the batch jobs of assembly line.Based on the feature of board Measurer slave board card test system 1, so card is surveyed
Test-run a machine is based on tested board and survey card and CPU board card is accompanied to test mutually, can be large batch of to difference by way of automation
The board of type tested, and improve the accuracy rate of test board, and improve the efficiency of test.
The application second embodiment provides a kind of board testing system, and Fig. 2 is board test provided by the embodiments of the present application
The structural schematic diagram of system.
As shown in Fig. 2, test fixture main body 2 includes the first module 3 and the second module 4, the first module 3 is connected to micro process
Device 11；First module 3 and the second module 4 are oppositely arranged；It is correspondingly arranged in first module 3 and the second module 4 for grafting quilt
Drafting board card 9 and the card slot for accompanying survey card 10；
Specifically, the first spring needle 31 is specifically provided in the first module 3, and the first signal plate 32, the first needle bed plate 33；The
Communication bus 7 is provided in one signal plate 32, the first spring needle 31 is fixed on the first needle bed plate 33 and is connected to the first signal plate
32；And CPU board card 5 is plugged on the first signal plate 32 by plug-in unit；Communication bus 7 is connected to the first spring needle 31.
Correspondingly, second spring needle 41, second signal plate 42 are specifically provided in the second module 4, the second needle bed plate 43, the
Two spring needles 41 are fixed on the second needle bed plate 43 and are connected to second signal plate 42；Signal wire 6 is provided in second signal plate 42
(signal wire is primarily referred to as in electric control circuit for transmitting heat transfer agent and controlling the route of information), signal wire 6 connects
In second spring needle 41.
Wherein, in this configuration, it accompanies the card slot for surveying card 10 to be arranged in the first module 3, accompanies survey card 10 can be with the first mould
The first signal plate 32 connection on block 3, and accompanying the quantity for surveying the card slot of card 10 can be one or at least more than one；Accordingly
, the card slot for grafting tested board 9 is correspondingly arranged in the first module 3 and the second module 4, i.e., tested board 9 can
It is connect respectively with the first module 3 and the second module 4, and the quantity of the card slot of tested board 9 is at least one；That is, the
What is be arranged in one module 3 accompanies survey card 10 to be connected to the first spring needle 31, but does not connect with second spring needle 41 directly；First mould
The tested board 9 being arranged on block 3 while the first spring needle 31 being connected in the first module 3, and be connected in the second module 4
Second spring needle 41.
It should also be noted that, the test fixture main body 2 of that structure more than whether, the second module 4 is in test fixture
Can be mobile to 3 direction of the first module in main body 2, and the first module 3 is cooperated to be moved to and tested board 9 (or accompany and survey card 10)
Abutted position；The second spring needle 41 of second module 4 is abutted with the abutted position of tested board 9 (or accompany and survey card 10) upper end, the
First spring needle 31 of one module 3 is abutted with the abutted position of tested board 9 (or accompany and survey card 10) lower end；After test, the
One module 3 and the second module 4 reset.Wherein, abutted position be set according to practical situation, such as tested board 9 with accompany
It surveys the size of the volume of card 10 and quantity and the tested board 9 being connected in card slot (more than one) and accompanies survey card 10 specific
Position；And when the first module 3 and the second module 4 reach abutted position, the second module 4 needs to continue to 3 direction of the first module
It is mobile, 41 abutting part of second spring needle and the abutted position of 9 upper end of tested board can be made to abut, and survey card 10 with accompanying
The abutted position of upper end abuts；So that the abutting part of the first spring needle 31 is abutted with the abutted position of 9 lower end of tested board, and
It is abutted with the abutted position for surveying 10 lower ends of card is accompanied.
Again it should be noted that in the embodiment of the present application, accompanying survey card 10 as fault-free, the good board of function, i.e.,
Under the premise of accompanying survey card 10 normally functioning, whether the function for testing tested board 9 is normal.
Further, in the embodiment of the present application, board testing system 1 is mainly used for tested board 9 and accompanies survey card 10
Between mutual detection.Specifically, in order to facilitate understanding and combining actual detection board situation, the board detected each other can be with
For DO board and DI board and AO board and AI board, then tested board 9 and the mutual detection surveyed between card 10 is accompanied specifically to wrap
It includes such as under type:
Mode one: when DO board is as accompanying survey card 10, DI board to be used to detect as tested board 9, wherein survey is accompanied to block
10 quantity can be corresponded with the quantity of tested board 9, then what is be arranged in the first module 3 and the second module 4 corresponds to
Tested board 9 accompanies the pocket numbers for surveying card 10 to correspond；In it is preferred that, one group of DO board can be corresponded to as survey card 10 is accompanied
Detect at least two groups DI board as tested board 9 insertion the first module 3 and the second module 4 relative to card slot in；Pass through
One-to-many relational implementation DO board detects DI board, correspondingly, then only setting corresponds in the first module 3 and the second module 4
One group accompany the card slot for surveying card 10, and be correspondingly arranged the card slot of at least two groups tested board 9.Or it is set in the first module 3
It is equipped with one group and accompanies the card slot for surveying card 10, and survey card 10 will be accompanied to be connected to the first signal plate 32 and second signal plate 42, and
The card slot of multiple tested boards 9 is correspondingly arranged in first module 3 and the second module 4.
Likewise, when AO board is as accompanying survey card 10, AI board to be used to detect as tested board 9, wherein survey is accompanied to block
10 quantity can be corresponded with the quantity of tested board 9, then what is be arranged in the first module 3 and the second module 4 corresponds to
Tested board 9 accompanies the pocket numbers for surveying card 10 to correspond；In it is preferred that, one group of AO board can be corresponded to as survey card 10 is accompanied
Detect at least two groups AI board as tested board 9 insertion the first module 3 and the second module 4 relative to card slot in；Pass through
One-to-many relational implementation AO board detects AI board, correspondingly, then only setting corresponds in the first module 3 and the second module 4
One group accompany the card slot for surveying card 10, and be correspondingly arranged the card slot of at least two groups tested board 9.Or it is set in the first module 3
It is equipped with one group and accompanies the card slot for surveying card 10, and survey card will be accompanied 10 to be connected to the first signal plate 32 and second signal plate 42, the
The card slot of multiple tested boards 9 is correspondingly arranged in one module 3 and the second module 4.
Mode two: when DI board is as accompanying survey card 10, DO board to be used to detect as tested board 9, pass through micro process
Device controls CPU board card and carries out piece choosing, then one group of DI board is as drafting board card 10 is accompanied, and at least two groups DO board is as tested board 9
Be inserted into the first module 3 and the second module 4 relative to card slot in；It wherein, further include selection circuit (not shown), DI board passes through choosing
It selects circuit to be connected with every DO board respectively, to realize that the piece to DO board selects.Correspondingly, then in the first module 3 and the second mould
Corresponding one group is only arranged on block 4 and accompanies the card slot for surveying card 10, and corresponding setting is more in the first module 3 and the second module 4
The card slot of group tested board 9；Or it is provided with one in the first module 3 and accompanies the card slot for surveying card 10, and 10 difference of survey card will be accompanied
It is connected to the first signal plate 32 and second signal plate 42, is correspondingly arranged multiple tested boards in the first module 3 and the second module 4
9 card slot.
Likewise, passing through micro process when AI board is as accompanying survey card 10, AO board to be used to detect as tested board 9
Device controls CPU board card and carries out piece choosing, then one group of AI board is as drafting board card 10 is accompanied, and at least two groups AO board is as tested board 9
Be inserted into the first module 3 and the second module 4 relative to card slot in；It wherein, further include selection circuit (not shown), AI board passes through choosing
It selects circuit to be connected with every AO board respectively, to realize that the piece to AO board selects.Correspondingly, then in the first module 3 and the second mould
Corresponding one group is only arranged on block 4 and accompanies the card slot for surveying card 10, and corresponding setting is more in the first module 3 and the second module 4
The card slot of group tested board 9；Or it is provided with one in the first module 3 and accompanies the card slot for surveying card 10, and 10 difference of survey card will be accompanied
It is connected to the first signal plate 32 and second signal plate 42, is correspondingly arranged multiple tested boards in the first module 3 and the second module 4
9 card slot.
It should be noted that three of the above is mutually measured mode, whether DO board surveys 10 detection tested boards 9 of card as accompanying
DI board or DI board survey the DO boards of 10 detection tested boards 9 of card as accompanying, detection be be that microprocessor 11 issues
It controls signal, tested board 9 and survey card 10 is accompanied (or to be inputted according to corresponding input signal (or output signal) and output signal
Signal) whether unanimously determine whether tested board 9 can pass through test.AI board and AO board are similarly.
It can be seen that tested board 9 and accompany survey card 10 between being mutually measured be according to microprocessor 11 control CPU board card 5 and
What the route of selection detection was completed.Certainly, tested board 9 and accompany survey card 10 between being mutually measured according to microprocessor 11 control
CPU board card 5 and while select the route of detection, tested board 9 can also be changed accordingly and accompanied and survey being plugged on pair for card 10
The position for the card slot answered, to realize test of the board testing system 1 for a large amount of different types of board.
It is understood that with the tested board 9 in the test fixture main body 2 of first embodiment and accompanying between survey card 10
Mutually for detection:
Tested board 9 and survey card is accompanied 10 to be plugged between the first module 3 and the second module 4, and passes through the first spring needle 31
With the connection of second spring needle 41, microprocessor 11 is connected to the first module 3, communication bus 7 and signal wire 6 by CPU board card 5
Connection forms signal path and is connected to, and signal path is used for transmission control signal, input signal and output signal, i.e. microprocessor
11 issue control signal, and CPU board card 5 passes through communication bus 7 and 6 transmission of control signals of signal wire, input signal and output signal；
Input signal through tested board 9, which is transferred to, accompanies survey card 10 and output signal output；Microprocessor 11 reads input signal respectively
And output signal, and judging that input signal is consistent with output signal, then the test of tested board 9 passes through；Conversely, not passing through.
Wherein, in the embodiment of the present application, CPU board card 5 is arranged between microprocessor 11 and the first module 3.Wherein, micro-
It by fieldbus 8 (is with digital communication instead of traditional 4-20mA analog signal and general between processor 11 and CPU board card 5
The transmission of logical on-off model is digital, two-way, multistation the communication system for connecting smart devices and automated system
System) connection.Wherein, microprocessor 11 is connected to the first module 3 by CPU board card 5, and microprocessor 11 passes through control CPU board card 5
Issue control signal.It is tested it should be noted that CPU board card 5 can also be used as tested card.
Further, with the tested board 9 in the test fixture main body 2 of second embodiment and accompany survey card 10 between it is mutual
For detection:
It accompanies survey card 10 to be plugged in the first module 3, and is connected to the first signal plate 32, tested board 9 is by 3 He of the first module
Second module 4 is connected, so that communication bus 7 is connected to form signal path and be connected to signal wire 6, microprocessor 11 issues control
Signal passes through communication bus 7 and 6 transmission of control signals of signal wire, input signal and output signal；It will be through the defeated of tested board 9
Enter signal and be transferred to accompany survey card 10 and output signal output；Microprocessor 11 reads input signal and output signal respectively, and sentences
Disconnected input signal is consistent with output signal, then the test of tested board 9 passes through；Conversely, not passing through.
It should also be noted that, accompanying survey to block in order to identify which the input signal of which tested board 9 corresponds to
10 output signals, this just needs to realize based on the function of the control logic module of microprocessor 11, specifically, with tested board
9 quantity, which is greater than, accompanies the quantity for surveying card 10 to be explained, and microprocessor 11 issues control signal by control CPU board card 5,
The input signal of the feedback of each tested card 9 is read respectively, and reads one simultaneously and accompanies the output signal for surveying card 10, is compared
Whether input signal is consistent with output signal, to judge whether the function of tested board 9 is good；And based on each tested card
9 input signals have corresponding label, then it is that microprocessor 11 can will be apparent that tells for which tested 9 input letter of card
There are problems (to accompany survey 10 functions of card good, and preferably select and the same model of tested board 9 for number corresponding tested board 9 in channel
Board).
Similarly, it is also same principle when the quantity of tested board 9, which is equal to, accompanies the quantity for surveying card 10, is not repeated herein
Explanation.
In order to which further explanation microprocessor 11 is in the operation principles of board testing system 1, implement below in conjunction with third
Example carries out detailed explanation.
In the application 3rd embodiment, as shown in connection with fig. 3, step S301, batch scanning and read accompany survey card 10 and by
The two-dimensional barcode information of drafting board card 9；Microprocessor 11 knows that corresponding accompany surveys card 10 and tested board 9 according to two-dimensional barcode information.
Step S302 sends the instruction for reading and accompanying and surveying card 10 and 9 quantity of tested board；Wherein, based on accompany survey card 10 and by
Requirement of the drafting board card 9 in board testing system 1 is different, sends the instruction for reading and accompanying and surveying card 10 and 9 quantity of tested board
Also different.
After reading and accompanying survey card 10 and 9 quantity of tested board, then judge to accompany survey card 10 respectively according to step S303, is tested
Whether 9 quantity of board and actual installation accompany survey card 10, the quantity of tested board 9 consistent in board testing system 1；If one
It causes, thens follow the steps S304；If inconsistent, it can accompany whether survey the quantity for blocking 10, tested board 9 by artificial further judgement
Unanimously, this artificially judges merely to guaranteeing to accompany survey card 10, the quantity of tested board 9 consistent, raising accuracy.
Step S304, different according to tested board 9 send control instruction, wherein tested board 9 is not both according to it
The difference of type is then sent for example, tested board 9 can be DO board or DI board and AO board and AI board etc.
Control instruction is different.
Step S305 sends and reads instruction.Step S306 is decoded according to the requirement of tested board 9.
After completing decoding, then algorithm is judged according to step S307.Wherein, the algorithm of the step determines, mainly to letter
Number judgement；And if algorithm is correct, thens follow the steps S308；If algorithm is incorrect, S309 is thened follow the steps.
Step S308, tested board 9 pass through, and execute step S310.
Step S309 records problem channel, and executes step S310.It is that step S309 is apparent that for which quilt
Drafting board card 9 is out of joint, in order to repair in time to the problem tested board 9.
Step S310 forms report and records, and executes step S311, judges whether to the tested board 9 of next group
Test, and return to step S301.Wherein, include in the report by tested board 9 information and unsanctioned quilt
The information of drafting board card 9.
Further, in other embodiments, it is contemplated that the microprocessor 11 of board testing system 1 can also cooperate CPU
Board 5 tests tested board 9, then combines Fig. 4 specifically to be illustrated.
Step S401 reads corresponding accompany in bus and surveys card 10 and 9 information of tested board.
Step S402 receives the control instruction of the transmission of microprocessor 11.And execute step S403.
Step S403 judges whether to control output order, wherein control output mainly signal, i.e. control tested board 9
Input signal be transferred to and accompany survey card 10 and output signal output.If desired control output is issued, S404 is thened follow the steps, if not
It needs to issue control output, thens follow the steps S405.
Step S404 issues control output order.
Step S405 judges whether to read input instruction, if desired reads input, S406 is thened follow the steps, if not needing
Input is read, S408 is thened follow the steps, reads the instruction accompanied and survey card 10 and 9 information of tested board；And return to step S401.
Step S406 reads input.Step S407, and read the content of signal.
Above by elaboration microprocessor 11, CPU board card 5 in the operation principles of board testing system 1, clearly explain
The working principle of the detection tested board 9 of board testing system 1.
The application second embodiment provides a kind of board testing system 1, comprising: test fixture main body 2, setting is in test work
Fill the first module 3 and the second module 4 in main body 2, and the microprocessor 11 connecting with test fixture main body 2；First module 3
With the card slot for grafting tested board 9 is correspondingly arranged in the second module 4；Survey card 10 is accompanied to be plugged on the first module 3 corresponding
It accompanies and surveys in the card slot of card 10, and the second module 4 is connected to by signal wire；When work, tested board 9 is inserted into the first module 3
And in the corresponding card slot of the second module 4, the first module 3 and the second module 4 are staggered relatively；Microprocessor 11 is by accompanying survey card 10 to connect
It is connected to the first module 3；Microprocessor 11 issues control signal, and is connected by the first module 3, the second module 4, tested board 3
Input signal through tested board 3 is transferred to and accompanies survey card 10 and output signal output by the signal path of formation；Pass through micro process
Device 11 monitors input signal and output signal respectively, and judges that whether consistent with input signal the output signal of tested board 9 is true
Determine tested board 9 and whether test to pass through.
The application second embodiment also provides a kind of board test machine, comprising: such as above-mentioned board testing system 1.The plate
Card test machine can be used for the batch jobs of assembly line.It being capable of the large batch of board to different types by way of automation
It is tested, and improves the accuracy rate of test board, and improve the efficiency of test.
Although the application is disclosed with preferred embodiment such as second, it is not for limiting the application, any this field
Technical staff is not departing from spirit and scope, can make possible variation and modification, therefore the application
Protection scope should be subject to the range that the claim of this application is defined.
Claims (13)
1. a kind of board testing system characterized by comprising test fixture main body is arranged in the test fixture main body
The first module and the second module, and the microprocessor being connect with the test fixture main body；
It is correspondingly arranged in first module and the second module for grafting tested board and accompanies the card slot surveyed and blocked；
When work, by the tested board and survey card insertion is accompanied to enter in first module and the corresponding card slot of the second module, it is described
First module and second module are staggered relatively；The microprocessor is connected to first module；The microprocessor hair
Signal is controlled out, and by first module, second module, tested board and accompanies the signal for surveying card connection formation logical
Input signal through the tested board is transferred to described accompany and surveys card and output signal output by road；Pass through the microprocessor
Monitor the input signal and the output signal respectively, and judge the tested board output signal whether with the input
Signal unanimously determines whether tested board tests and passes through.
2. board testing system according to claim 1 characterized by comprising further include CPU board card, the CPU board
Card is arranged between the microprocessor and first module；The microprocessor issues control by controlling the CPU board card
Signal processed.
3. board testing system according to claim 2, which is characterized in that first module include: the first signal plate,
First needle bed plate and the first spring needle, first spring needle are fixed on the first needle bed plate and are connected to described first
Signal plate；And the CPU board card is plugged on first signal plate by plug-in unit；Communication is provided in first signal plate
Bus, the communication bus are connected to first spring needle.
4. board testing system according to claim 3, which is characterized in that second module include: second signal plate,
Second needle bed plate and second spring needle；The second spring needle is fixed on the second needle bed plate and is connected to second letter
Number plate；Signal wire is provided in the second signal plate, the signal wire is connected to the second spring needle；
First module, second module, tested board and the signal path for accompanying survey card connection to be formed are specifically, described
Tested board and it is described accompany survey card when being plugged in the corresponding card slot, the tested board, it is described accompany survey card respectively with institute
It states the first spring needle and the second spring needle to abut, the communication bus is connected to the signal wire to be formed the signal and lead to
Road, the signal path are used for transmission the control signal, the input signal and the output signal.
5. board testing system according to claim 4, which is characterized in that the tested board is DI board, correspondingly,
It is described to accompany drafting board card for DO board；
It is described by the tested board and accompany survey card insertion enter in first module and the corresponding card slot of the second module specifically:
Using one group of DO board as drafting board card is accompanied, at least two groups DI board is inserted into first module and second as tested board
Module relative to card slot in；
Alternatively, the tested snap-gauge is AI board, correspondingly, described accompany surveys snap-gauge as AO board；
It is described by the tested board and accompany survey card insertion enter in first module and the corresponding card slot of the second module specifically:
Using one group of AO board as drafting board card is accompanied, at least two groups AI board is inserted into first module and second as tested board
Module relative to card slot in.
6. board testing system according to claim 4, which is characterized in that the tested board is DO board, correspondingly,
Described accompany surveys snap-gauge as DI board；
It is described by the tested board and accompany survey card insertion enter in first module and the corresponding card slot of the second module specifically:
Using DI board as accompany survey snap-gauge, DO board as tested board be inserted into first module and the second module relative to
It is used as in card slot and accompanies drafting board card, wherein the DI board is identical with the quantity of DO board, and corresponds；
Or
The tested board is AO board, correspondingly, described accompany surveys snap-gauge as AI board；
It is described by the tested board and accompany survey card insertion enter in first module and the corresponding card slot of the second module specifically:
Using AI board as accompany survey snap-gauge, AO board as tested board be inserted into first module and the second module relative to
It is used as in card slot and accompanies drafting board card, wherein the AI board is identical with the quantity of AO board, and corresponds.
7. board testing system according to claim 4, which is characterized in that the tested board is DO board, correspondingly,
Described accompany surveys snap-gauge as DI board；
It is described by the tested board and accompany survey card insertion enter in first module and the corresponding card slot of the second module specifically:
Using one group of DI board as drafting board card is accompanied, at least two groups DO board is inserted into first module and second as tested board
Module relative to card slot in；Wherein, further include selection circuit, the DI board by the selection circuit respectively with it is described every
One DO board is connected, to realize that the piece to DO board selects；
Alternatively,
The tested board is AO board, correspondingly, described accompany surveys snap-gauge as AI board；
It is described by the tested board and accompany survey card insertion enter in first module and the corresponding card slot of the second module specifically:
Using one group of AI board as drafting board card is accompanied, at least two groups AO board is inserted into first module and second as tested board
Module relative to card slot in；Wherein, further include selection circuit, the AI board by the selection circuit respectively with it is described every
One AO board is connected, to realize that the piece to AO board selects.
8. board testing system according to claim 1 characterized by comprising first module and described second
Module is detachable structure, corresponds to the different tested boards, the type for accompanying survey to block for replacing.
9. a kind of board test machine characterized by comprising the board testing system as described in the claims 1-8.
10. a kind of board testing system characterized by comprising test fixture main body is arranged in the test fixture main body
The first module and the second module, and the microprocessor being connect with the test fixture main body；
The card slot for grafting tested board is correspondingly arranged in first module and the second module；It is described that survey card is accompanied to be plugged on
First module is corresponding to accompany in the card slot surveyed and blocked, and is connected to second module by signal wire；
When work, the tested board is inserted into first module and the corresponding card slot of the second module, first module
It is staggered relatively with second module；The microprocessor accompanies survey card to be connected to first module by described；Micro- place
It manages device and issues control signal, and the signal path to be formed is connected by first module, second module, tested board,
Input signal through the tested board is transferred to described accompany and surveys card and output signal output；Distinguished by the microprocessor
Monitor the input signal and the output signal, and judge the tested board output signal whether with the input signal
Whether consistent determining tested board, which tests, passes through.
11. board testing system according to claim 10, which is characterized in that first module includes: the first signal
Plate, the first needle bed plate and the first spring needle, first spring needle are fixed on the first needle bed plate and are connected to described
First signal plate；And described drafting board card is accompanied to be connected to first signal plate；It is provided with communication bus in first signal plate,
The communication bus is connected to first spring needle.
12. board testing system according to claim 11, which is characterized in that second module includes: second signal
Plate, the second needle bed plate and second spring needle；The second spring needle is fixed on the second needle bed plate and is connected to described
Binary signal plate；Signal wire is provided in the second signal plate, the signal wire is connected to the second spring needle；It is described to accompany survey
Board is connect with the second signal plate.
13. a kind of board test machine characterized by comprising the board testing system as described in the claims 10-12.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811176654.4A CN109459678B (en) | 2018-10-10 | 2018-10-10 | Board card testing system and board card testing machine |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811176654.4A CN109459678B (en) | 2018-10-10 | 2018-10-10 | Board card testing system and board card testing machine |
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| CN109459678A true CN109459678A (en) | 2019-03-12 |
| CN109459678B CN109459678B (en) | 2024-04-12 |
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| CN111239584A (en) * | 2019-12-31 | 2020-06-05 | 视航机器人（佛山）有限公司 | Mainboard testing device, system and method applied to unmanned forklift |
| WO2021134384A1 (en) * | 2019-12-31 | 2021-07-08 | 视航机器人（佛山）有限公司 | Main board test device, system and method applied to unmanned forklift |
| CN113391196A (en) * | 2021-06-15 | 2021-09-14 | 卡斯柯信号有限公司 | Self-checking method for train-mounted speed measurement positioning board card |
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